KR102139477B1 - Sample sensing and analyzing method using sample analyzing apparatus based on image processing using characteristic difference of medium - Google Patents

Abstract

The present invention relates to a sample analysis device of a direct contact method, the light source irradiating light of different wavelengths to the sample at a time; A sensor unit for sensing data on the sample according to light irradiation by wavelength of the light source, wherein the sample is located in contact with the sensor unit; And a control unit that acquires image data for the components included in the sample by using the sensing data for each wavelength of the sensor unit according to light irradiation by wavelength of the light source.

Description

How to measure and analyze a sample using an image-based sample analysis device using difference in media characteristics {SAMPLE SENSING AND ANALYZING METHOD USING SAMPLE ANALYZING APPARATUS BASED ON IMAGE PROCESSING USING CHARACTERISTIC DIFFERENCE OF MEDIUM}

The present invention relates to an image-based sample analysis apparatus using differences in media characteristics and a method of measuring and analyzing a sample using the same.

In general, it is difficult to analyze components of a sample based on an image using an optical microscope. For this reason, in order to analyze the components of the sample on the basis of the image, a dyeing process of the sample is performed, and a process of checking the dyed sample with an optical microscope is being performed. In this case, there was a hassle of going through the process of dyeing the sample.

In addition, in order to accurately identify a specific stained portion of the sample, a process of firstly using a large area image with a low magnification and subsequently using a small area image with a high magnification is additionally used. For this reason, in order to obtain a low magnification image and a high magnification image, an optical microscope having lenses of various magnifications is required, and there is a hassle of additionally acquiring a partially enlarged sample image.

In addition, in the existing optical microscope, since the sample and the sensor part are spaced apart at predetermined intervals, it is impossible to accurately grasp the difference in the medium between the fine samples with an image.

The present invention for solving the above-described problems can provide a sample analysis device capable of accurately analyzing a sample even without using a plurality of optical lenses.

In addition, the present invention for solving the problems as described above can provide a sample analysis device that can identify the components of the sample even if the sample is not dyed using the difference in the characteristics of the medium. In addition, the present invention can provide a sample analysis device that irradiates light of a plurality of wavelengths and acquires image data for cells included in a sample using sensing data sensed for each wavelength.

In addition, the present invention can provide a sample analysis device capable of precisely analyzing a sample by moving a light source.

In addition, the present invention can provide a sample analysis device capable of accurately analyzing a sample by focusing light of a light source using a focusing lens.

In addition, the present invention can provide a method of measuring and analyzing a sample using a sample analysis device capable of distinguishing minute characteristics differences of samples through calibration.

The problems to be solved by the present invention are not limited to the problems mentioned above, and other problems not mentioned will be clearly understood by those skilled in the art from the following description.

A sample analysis device according to an exemplary embodiment of the present invention for solving the above-described problem includes: a light source irradiating light of different wavelengths to a sample at a time; A sensor unit for sensing data on the sample according to light irradiation by wavelength of the light source, wherein the sample is located in contact with the sensor unit; And a control unit that acquires image data for the components included in the sample by using the sensing data for each wavelength of the sensor unit according to light irradiation by wavelength of the light source.

A sample measurement and analysis method using a sample analysis device according to an embodiment of the present invention for solving the above-described problems includes: calibrating a sensor unit of the sample analysis device; Constructing a database for a standard characteristic image of the sample; Measuring a sample using the sample analysis device; And analyzing the sample using the measured image data and making a judgment on the sample.

According to the present invention as described above, by providing a sample analysis device that can confirm the components of the sample even if the sample is not dyed as well as the use of an optical lens, there is an effect capable of accurate and rapid sample analysis.

In addition, according to the present invention, a plurality of image data is acquired and reconstructed using differences in optical characteristics of a medium for each wavelength, so that component analysis of a sample can be analyzed.

In addition, the present invention can effectively analyze the components of the sample by changing the light incident angle through horizontal movement of the light source.

In addition, since the present invention analyzes a sample by adjusting a focusing point using a focusing lens, there is an effect of minimizing errors and accurately analyzing the sample.

In addition, the present invention has an effect capable of distinguishing fine characteristic differences of samples through calibration.

The effects of the present invention are not limited to the effects mentioned above, and other effects not mentioned will be clearly understood by those skilled in the art from the following description.

1 is a front view of a sample analysis device according to an embodiment of the present invention.
2 is a front view of a sample analysis device according to another embodiment of the present invention.
3 is an exemplary view illustrating cells included in a sample according to an embodiment of the present invention.
4 is an exemplary diagram illustrating image data sensed by a plurality of wavelengths according to an embodiment of the present invention.
FIG. 5 is an exemplary view illustrating that the controller generates a final image by adding image data sensed in FIG. 4.
6 is an exemplary view illustrating matching of the cell images sensed in FIGS. 4 and 5 with a database according to an embodiment of the present invention.
7 is an exemplary view illustrating that a color filter is included in a sample analysis device according to an embodiment of the present invention.
8 is an exemplary view illustrating that a focusing lens is included in a sample analysis device according to an embodiment of the present invention.
9 is a flow chart of a sample measurement and analysis method using a sample analysis device according to an embodiment of the present invention.
10 is a detailed flowchart of step S100 of FIG. 9;
11 is an exemplary view for explaining the measurement of step S110 of FIG.
12 is an exemplary view for explaining the measurement of step S120 of FIG.
13 is a detailed flowchart of step S110 of FIG. 10;
14 is an example of (a) measurement of spatial uniformity of each pixel of photoreactivity, (b) an illustration of measurement of spatial linearity of each pixel of photoreactivity, and (c) an illustration of calibration of each pixel spatial linearity of photoreactivity.
15 is a detailed flowchart of step S120 of FIG. 10;
16 is a measurement example of step S120 of FIG. 10.
17 is a detailed flowchart of step S300 of FIG. 9;
18 is an exemplary view of step S300 of FIG. 9.

Advantages and features of the present invention, and methods for achieving them will be clarified with reference to embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but may be implemented in various different forms, and only the present embodiments allow the disclosure of the present invention to be complete, and are common in the technical field to which the present invention pertains. It is provided to fully inform the skilled person of the scope of the present invention, and the present invention is only defined by the scope of the claims.

The terminology used herein is for describing the embodiments and is not intended to limit the present invention. In the present specification, the singular form also includes the plural form unless otherwise specified in the phrase. As used herein, “comprises” and/or “comprising” does not exclude the presence or addition of one or more other components other than the components mentioned. Throughout the specification, the same reference numerals refer to the same components, and “and/or” includes each and every combination of one or more of the components mentioned. Although "first", "second", etc. are used to describe various components, it goes without saying that these components are not limited by these terms. These terms are only used to distinguish one component from another component. Therefore, it goes without saying that the first component mentioned below may be the second component within the technical spirit of the present invention.

Unless otherwise defined, all terms (including technical and scientific terms) used in this specification may be used in a sense that can be commonly understood by those skilled in the art to which the present invention pertains. In addition, terms that are defined in a commonly used dictionary are not ideally or excessively interpreted unless specifically defined.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

Hereinafter, an image-based sample analysis device 1 using a difference in media characteristics will be described.

1 is a front view of a sample analysis device 1 according to an embodiment of the present invention.

A sample analysis device 1 according to an embodiment of the present invention will be described with reference to FIG. 1.

The sample analysis device 1 includes a light source support 10, a sensor support 15, a light source 20, a sensor unit 30, and a control unit 40.

The light source 20 is supported by the light source support 10 and irradiates light of a plurality of wavelengths having different wavelengths to the sample 100. Here, the light source 20 does not illuminate the sample 100 at a time, such as white light, but irradiates the sample 100 with a plurality of lights having different wavelengths at different times. .

In one embodiment, the light source 20 is disposed on the light source support 10 which is the upper portion of the sample analysis device 1, and irradiates light in the direction of the sample 100 and the sensor unit 30 disposed on the lower side.

In the embodiment of the present invention, it is illustrated that light of the first wavelength, the second wavelength, and the third wavelength is irradiated, wherein the first to third wavelengths have wavelengths of different bands.

At this time, the type of wavelength and the number of wavelengths are easily selected by the practitioner of the invention.

The sensor unit 30 senses data on the sample 100 according to light irradiation by wavelength of the light source 20. Here, the sensor unit 30 is defined as including a sensor package in addition to the sensor, and the sensor unit 30 may include a plurality of sensors, and sense image data in units of each pixel (P). have.

The control unit 40 acquires image data for cells included in the sample 100 by using the sensing data for each wavelength of the sensor unit 30 according to light irradiation by wavelength of the light source 20.

For example, when light is irradiated in the absence of the sample 100, data is sensed by the sensor unit 30 as it is irradiated from the light source 20. However, when the sample 100 is disposed and specific cells are included in the sample 100, data different from other regions is sensed in a region where the cells exist due to a difference in optical characteristics of the medium.

Depending on the characteristics of the internal components included in the sample (cell), the degree of response to the wavelength of light is different, which causes the intensity of light falling on the pixels of the sensor unit 30 to be different. Sensing that the intensity of light changes. Then, the control unit 40 acquires image data for the cells included in the sample 100 using the sensing data of the sensor unit 30 as described above.

At this time, the control unit 40 sums the image data for the cells for each wavelength obtained by using the sensing data for each wavelength of the sensor unit 30 according to the light irradiation for each wavelength, to the cells included in the sample 100 To create the final image.

In one embodiment, the sensor unit 30 is disposed on the lower surface of the sample analysis device 1, and the light source 20 is disposed such that the optical axis is perpendicular to the surface of the sensor unit 30. In addition, the optical axis of the light source 20 is directed toward the center of the sensor unit 30.

In addition, the sample analysis device 1 according to an embodiment of the present invention is a sample analysis device 1 of a direct contact method, and the sample 100 may be positioned to directly contact the upper surface of the sensor unit 30.

In the sample analysis device 1 according to the present embodiment, since the sensor unit 30 directly contacts the sample 100 as a direct contact method, the sample 100 in which each pixel of the sensor unit 30 directly contacts the corresponding pixel ), it is possible to receive the optical data passing through a specific portion, and in this process, it is possible to minimize the influence of the optical data passing through the other specific portion of the sample 100 contacting the other pixel. When the sample analysis device 1 according to the present embodiment is used, it is thus possible to accurately grasp the difference in the medium between the fine samples 100 with an image.

However, referring to FIG. 2 in some embodiments, the sample holder 50 may be positioned between the sample 100 and the sensor unit 30. Since the thickness of the sample holder 50 is fine, the sample analysis device 2 shown in FIG. 2 is also a direct contact method, and it is possible to accurately grasp the difference in the medium of the fine sample 100 through an image.

Using the above-described configuration, the present invention can analyze a sample without the need for a separate staining process, which will be described later in detail.

When the cells included in the sample 100 are irradiated with light and visualized through the sensor unit 30, for example, the leukocytes do not see the line itself. Therefore, when giving light, it is necessary to irradiate light for each wavelength of RGB rather than white light, and when irradiating wavelengths of different bands, the sensor unit 30 passes through the blood cell due to the difference in the media characteristics of the components constituting the blood cell. ), a difference in data values detected occurs. Since the image of the components constituting the blood cells can be drawn using this difference value, the components of the blood cells can be identified even if a separate staining process is not required.

An embodiment of the present invention will be described with reference to FIGS. 3 to 5. 3 to 5 are diagrams illustrating in detail the acquisition of a cell image using sensing data according to light irradiation for each wavelength described through FIG. 1, and FIG. 3 is a sample 100 according to an embodiment of the present invention 4 is an exemplary view illustrating cells included in the image, and FIG. 4 is an exemplary view illustrating image data sensed by a plurality of wavelengths according to an embodiment of the present invention, and FIG. 5 is an image in which the controller 40 is sensed in FIG. 4 It is an example diagram illustrating that the final image is generated by adding data.

3, it is assumed that the sample 100 includes components such as n1, n2, m1, and p1.

In addition, n1 and n2 are components having a relatively high reactivity to the first wavelength of the light source 20, m1 is a component having a relatively high reactivity to the second wavelength of the light source 20, and p1 is a light source ( It is a component that has a relatively high reactivity to the third wavelength of 20).

Therefore, when the first wavelength is irradiated from the light source 20, the components according to the first wavelength (n1, n2, m1, p1) as shown in FIG. 4(a) through the sensor unit 30 You can get the data for Here, it can be seen that the images for n1 and n2 cells are relatively clear compared to m1 and p1, and the light intensity transmitted through the control unit 40 n1 and n2 components is compared to the light intensity transmitted through the m1 and p1 components. Is relatively large.

Here, the reason why the images for the n1 and n2 cells are relatively clear compared to the images for the m1 and the p1 is due to the difference in media characteristics, and specifically, the transmittance/absorption rate of the first wavelength for each of the media n1, n2, m1, p1 is Because they are different.

And, when the second wavelength is irradiated from the light source 20, the components according to the second wavelength (n1, n2, m1, p1) as shown in Figure 4 (b) through the sensor unit 30 The data for the sensor was sensed, and the control unit 40 acquired image data for the m1 cell.

And, when the third wavelength is irradiated from the light source 20, the components according to the third wavelength (n1, n2, m1, p1) as shown in Figure 4 (c) through the sensor unit 30 The data for was sensed, and the control unit 40 acquired image data for p1 cells.

Referring to FIG. 5, the control unit 40 sums the acquired image data to generate a final image of cells included in the sample 100. That is, the control unit 40 reconstructs image data according to different wavelengths.

Therefore, the user can analyze the cells included in the sample 100 through the final image.

6 is an exemplary diagram illustrating matching the cell images sensed in FIGS. 4 and 5 with the database 60 according to an embodiment of the present invention.

Referring to FIG. 6, the control unit 40 analyzes the components included in the sample 100 by matching the acquired image data with data for a plurality of samples previously stored in the database 60, Information about the image data input from the user is stored in the database 60 to accumulate the data.

Accordingly, it is checked whether the image data of n1, n2, m1, and p1 collected through FIGS. 3 to 5 matches media characteristics (for example, transmittance, absorption, refraction angle, etc. of media for each wavelength) stored in the database 60. Is done.

To this end, it is preferable that data about the medium characteristics (eg, transmittance, absorption rate, refractive angle, etc. of the medium for each wavelength) is stored in the database 60.

In addition, since the matching may fail for the image data that does not match, or the data may not exist, the result data directly analyzed by the user is input, and the result data is stored so that it can be used again later.

7 is an exemplary view illustrating that the color filter 70 is included in the sample analysis device 3 according to the embodiment of the present invention.

Referring to FIG. 7, the sample analysis device 3 according to the embodiment of the present invention further includes a color filter 70.

In more detail, the holder of the sensor unit 30 or the sample 100 further includes a color filter 70. In this case, the sensor unit 30 may be provided with a color filter 70 on the upper surface of the sensor unit 30. Here, the color filter 70 may function as a sample holder.

Since the sample analysis device 1 includes color in the image data sensed by the sensor unit 30 as the color filter 70 is included, the same effect can be obtained without dyeing the sample 100.

8 is an exemplary view illustrating that the focusing lens 80 is included in the sample analysis device 4 according to the embodiment of the present invention.

Referring to FIG. 8, the sample analysis device 4 according to the embodiment of the present invention further includes a focusing lens 80 that focuses light irradiated from the light source 20 to the sample 100 or the sensor unit 30. Includes.

At this time, the focusing lens 80 is disposed under the light source 20.

Since the optical axis of the light source 20 is perpendicular to the surface of the sensor unit 30 of the sensor unit 30 and is arranged to face the center of the sensor unit 30, the farther from the center of the sensor unit 30 the density A problem that may spread while the resolution for the may decrease may occur.

And, the above problem may cause an error in sensing data about the cell.

Therefore, by moving the focusing point through the focusing lens 80 and sensing data around the point where the light is focused, it is possible to prevent such a problem from occurring.

More specifically, the focusing lens 80 moves the focusing point from one side of the sample 100 to the other side, and the sensor unit 30 senses data around the focusing point, but continuously data according to the movement of the focusing point. To sense.

In addition, the focusing lens 80 moves the X, Y, and Z coordinates of the focusing point, and the control unit 40 synthesizes data sensed by the sensor unit 30 according to the movement of the focusing point, and 2 of the sample 100. Create dimensional or three dimensional images.

Accordingly, the user can analyze the sample 100 by acquiring a 2D image or a 3D image of cells included in the sample 100.

In addition, according to another embodiment of the present invention, the sample analysis device 4 may be configured to include the color filter 70 and the focusing lens 80 together.

Here, referring to FIG. 8, the horizontal movement of the light source 20 is possible, and the vertical movement of the focusing lens 80 is possible.

When there is a horizontal movement of the light source 20, since the incident angle and the incident distance of light passing through the medium of the sample 100 are changed according to the horizontal movement of the light source 20, the sharpness of the image can be increased. .

In addition, when there is a horizontal movement of the light source 20, since the refraction angle is changed according to the position change of the light source 20, it is possible to easily analyze constituent materials overlapping each other in the sample 100 due to the change in the sensing position. have. Therefore, three-dimensional observation of the sample 100 may be possible.

When there is a vertical movement of the focusing lens 80, the image of the sample 100 can be realized in three dimensions.

In some embodiments, the focusing lens 80 may be a liquid lens with variable curvature. In this case, although the position of the focusing lens 80 is fixed, the position of the focal point can be arbitrarily changed through variable curvature, and it can be advantageous for product compaction compared to adjusting the height.

Accordingly, according to the sample analysis device 4 according to the present embodiment, it is possible to analyze a three-dimensional (3D) sample through a change in the position of the light source 20 as well as a difference in optical density according to a difference in a medium.

Hereinafter, a method of measuring and analyzing a sample using a sample analysis device according to an embodiment of the present invention will be described with reference to FIGS. 9 to 18. Here, a method of measuring and analyzing a sample using a sample analysis device may be performed or controlled by the control unit 40.

Referring to FIG. 9, a method of measuring and analyzing a sample using a sample analysis device according to an embodiment of the present invention includes: calibrating the sensor unit 30 of the sample analysis device 1 (S100); Building a database for the standard characteristic image of (S200), measuring the sample using the sample analysis device (S300) and analyzing the sample using the measured image data and making a judgment on the sample Step S400 is included. However, a method of measuring and analyzing a sample using a sample analysis device according to some embodiments may include relatively fewer or more steps than those shown in FIG. 9.

Specifically, referring to FIG. 9, the sensor unit 30 of the sample analysis device 1 is calibrated (S100).

In the direct contact method, since the sample 100 directly contacted the surface of the sensor unit 30 is measured, the transmission characteristics such as wavelength and incident angle of light passing through the sample 100 and the sample 100 through which light passes are configured. It must be able to accurately sense the difference in minute characteristics according to the type/component of the medium to be made. For this reason, by calibrating each pixel constituting the sensor unit 30 under the standard parallel light source 120, it is possible to increase the accuracy of measurement and analysis of the sample analysis device 1.

In order to calibrate the sensor unit 30 of the sample analysis device 1 (S100), the sensor unit 30 is calibrated based on the measurement result in the standard parallel light source 120 with reference to FIGS. 10 and 11 (S110) ), the sensor unit 30 may be calibrated based on the measurement result while the structure is included in the sample analysis device 1 in the applied light source 20 with reference to FIGS. 10 and 12 (S120 ). On the other hand, the measurement is performed using the sensor unit 30 for calibration in a state in which the sample 100 is not placed on the sensor unit 30.

Here, the standard parallel light source 120 is a predetermined type of light source, and a selected wavelength may be applied as needed. The applied light source 20 is a light source that is employed in the sample analysis device 1 and is actually used for measurement of a sample. In addition, the structure is located on the sensor unit 30 during the measurement process, and may influence the measurement, and may include a sample holder 50, a color filter 70, or a cartridge.

Calibration in the standard parallel light source 120 will be described.

In order to calibrate the sensor unit 30 based on the measurement result in the standard parallel light source 120 (S110), referring to FIG. 13, the light intensity of the standard parallel light source 120 of a predetermined wavelength is set to a predetermined saturation region from 0. While increasing to, each N times (where N is a natural number) is measured to collect data (S111).

Subsequently, referring to FIGS. 13, 14(a), and 14(b), each pixel P of the statistical box plot of the N measurement value of each pixel P of the sensor unit 30 is referenced. Spatial uniformity and linearity of light source responsiveness are calculated (S112).

Next, referring to FIGS. 13 and 14(c), spatial uniformity and linearity of light source responsiveness are calibrated by creating a first calibration lookup table of each pixel P corresponding to the standard parallel light source 120 (S113).

Calibration in the applied light source 20 will be described. Here, the wavelength of the standard parallel light source 120 and the wavelength of the applied light source 20 may be the same, but is not limited thereto.

In order to calibrate the sensor unit 30 based on the measurement result while the structure is included in the sample analysis device 1 in the applied light source 20 (S120), the light source intensity of the applied light source 20 with reference to FIG. 15 While increasing from 0 to a predetermined saturation region, data is collected by measuring N times each (S121).

Subsequently, referring to FIGS. 14(a) and 15, spatial uniformity of light source responsiveness of each pixel P based on the representative value of the statistical box plot of the N measurement value of each pixel P of the sensor unit 30 And linearity is calculated (S122).

Subsequently, referring to FIGS. 14(b) and 15, a second calibration lookup table of each pixel P corresponding to the applied light source 20 is created to calibrate spatial uniformity and linearity of light source responsiveness (S123).

Subsequently, referring to FIGS. 9 and 16, a database for a standard characteristic image of the sample 100 is constructed (S200 ).

In this step, the standard parallel light source 120 is used to build a database of standard characteristic images of the sample 100 for each wavelength for various wavelengths. Wavelengths of various sizes may be used at various intensities to construct a detailed database of standard characteristic images.

For example, a sample 100 to be measured, such as cancer cells, red blood cells, or white blood cells, is placed on the sensor unit 30, and for each wavelength, the light intensity of the standard parallel light source 120 is increased from 0 to a predetermined saturation area, respectively, N Collect data by measuring each time, and calculate the spatial uniformity and linearity of the light source responsiveness of each pixel P based on the representative value of the statistical box plot of the N measurement value of each pixel P of the sensor unit 30 Then, by repeating the process of calibrating the spatial uniformity and linearity of the light source responsiveness by making the first calibration lookup table of each pixel P corresponding to the standard parallel light source 120, the first and second calibration lookup tables are created and sampled. A standard characteristic image database for 100 can be constructed.

Subsequently, referring to FIG. 9, a sample is measured using the sample analysis device 1 (S300).

To this end, with reference to FIGS. 4 and 17, the wavelength and the intensity of the light source that best represent the characteristics of the sample 100 to be measured in the standard characteristic image database are derived (S310 ). Here, when the sample 100 includes several components, a suitable wavelength and intensity of a light source may be derived for each component of each sample 100, and the wavelength and light source that best represent the characteristics of the sample 100 may be derived. The intensity may be the wavelength and intensity of the light source when the matching/similarity probability represents the largest value. For example, the image pattern matching method used for calculating the matching/similarity probability is a well-known Harris corner detector, Shi-Tomasi feature point extraction method, Scale Invariant Feature Transform (SIFT), Features from Accelerated Segment Test (FAST), AGAST method, and Local invariant feature descriptor methods such as SIFT, SURF, BRIEF, ORB, FREAK, and deep learning techniques can be applied, but are not limited to the above-mentioned techniques.

Subsequently, the sample 100 is placed on the sensor unit 30 with reference to FIGS. 5, 17, and 18, and the wavelengths that best represent the characteristics of the sample 100 (eg, the first wavelength, the second wavelength, and the third wavelength) Etc.) and each image data obtained by measuring under the intensity of the light source or integrated image data is obtained (S320). That is, it is possible to obtain well-consolidated image data for the entire sample 100 through image data obtained by measuring under various wavelengths and intensity of light sources.

Finally, referring to FIG. 9, a sample is analyzed using the measured image data and a judgment is made on the sample (S400).

The image data of the sample 100 obtained from the measurement is compared with the standard characteristic image database of the sample 100 (for example, a standard characteristic image filter operation of the sample 100) to find a match. By applying the matching accuracy probability, it can be expressed as x%, and the target sample can be counted and displayed.

The embodiments of the present invention have been described above with reference to the accompanying drawings, but those skilled in the art to which the present invention pertains may be implemented in other specific forms without changing the technical spirit or essential features of the present invention. You will understand. Therefore, it should be understood that the above-described embodiments are illustrative in all respects and not restrictive.

1: Sample analysis device 10: Light source support
15: sensor support 20: light source
30: sensor unit 40: control unit
100: sample

Claims (14)

A light source that irradiates light of different wavelengths with a sample at a time, and a sensor unit that senses data on the sample according to light irradiation by wavelength of the light source, wherein the sample is located in contact with the sensor unit A direct contact-type sample analysis device comprising a phosphorus sensor unit and a control unit that acquires image data for components included in a sample using sensing data for each wavelength of the sensor unit according to light irradiation by wavelength of the light source In the sample measurement and analysis method using,
Calibrating the sensor unit of the sample analysis device;
Constructing a database for a standard characteristic image of the sample;
Measuring a sample using the sample analysis device; And
Analyzing the sample using the measured image data and determining the sample,
The step of calibrating the sensor part of the sample analysis device may include:
Calibrating the sensor unit based on a measurement result in a standard parallel light source, and calibrating the sensor unit based on a measurement result while a structure is included in the sample analysis device in an applied light source,
The structure includes at least one of a sample holder, a color filter and a cartridge,
The step of calibrating the sensor unit based on the measurement result in the standard parallel light source,
Collecting data by measuring N times (where N is a natural number) each while increasing the light intensity of the standard parallel light source having a predetermined wavelength to a predetermined saturation region;
Calculating a spatial uniformity and linearity of light source responsiveness of each pixel based on a representative value of a statistical box plot of N measurement values of each pixel of the sensor unit;
And calibrating spatial uniformity and linearity of light source responsiveness by creating a first calibration lookup table for each pixel (P) corresponding to the standard parallel light source, and measuring and analyzing a sample using a sample analysis device. According to claim 1,
The sensor unit includes a plurality of pixels,
Each pixel receives light passing through a portion of the sample contacting the upper surface of the sensor part overlapping with the corresponding pixel, and generates sensing data for each wavelength using the received data. And analytical methods. According to claim 1,
The control unit,
A method of measuring and analyzing a sample using a sample analysis device, which combines the acquired image data to generate a final image of the components included in the sample. According to claim 1,
Characterized in that it further comprises a color filter located on the sensor unit, the sample measurement and analysis method using a sample analysis device. According to claim 1,
The control unit,
A method of measuring and analyzing a sample using a sample analysis device, characterized in that the acquired image data is matched with data for a medium previously stored in a database, and the components included in the sample are analyzed. The method of claim 5,
The control unit,
A method of measuring and analyzing a sample using a sample analysis device that stores information on the image data received from a user in the database. According to claim 1,
Further comprising a focusing lens for focusing the light irradiated from the light source to the sample or sensor unit, the sample measurement and analysis method using a sample analysis device. The method of claim 7,
The focusing lens moves the focusing point from one side of the sample to the other side,
The sensor unit,
A method of measuring and analyzing a sample using a sample analysis device, which senses data around the focusing point and continuously senses data according to the movement of the focusing point. The method of claim 7,
The focusing lens moves the X, Y, and Z coordinates of the focusing point,
The control unit generates a two-dimensional or three-dimensional image of a sample by synthesizing data sensed by the sensor according to the movement of the focusing point, a sample measurement and analysis method using a sample analysis device. According to claim 1,
The light source is movable in the horizontal direction, a sample measurement and analysis method using a sample analysis device. In the sample measurement and analysis method using the direct contact method of the sample analysis device,
Calibrating the sensor part of the sample analysis device;
Constructing a database for a standard characteristic image of the sample;
Measuring a sample using the sample analysis device; And
Analyzing the sample using the measured image data and determining the sample,
The step of calibrating the sensor part of the sample analysis device may include:
Calibrating the sensor unit based on a measurement result in a standard parallel light source, and calibrating the sensor unit based on a measurement result while a structure is included in the sample analysis device in an applied light source,
The structure includes at least one of a sample holder, a color filter and a cartridge,
The step of calibrating the sensor unit based on the measurement result in the standard parallel light source,
Collecting data by measuring N times (where N is a natural number) each while increasing the light intensity of the standard parallel light source having a predetermined wavelength to a predetermined saturation region;
Calculating a spatial uniformity and linearity of light source responsiveness of each pixel based on a representative value of a statistical box plot of N measurement values of each pixel of the sensor unit;
And calibrating spatial uniformity and linearity of light source responsiveness by creating a first calibration lookup table for each pixel (P) corresponding to the standard parallel light source, and measuring and analyzing a sample using a sample analysis device. delete delete The method of claim 11,
Step of measuring a sample using the sample analysis device,
Deriving a wavelength and an intensity of the light source for measuring the sample to be measured in the database for the standard characteristic image,
Obtaining respective image data obtained by measuring under the derived wavelength and the intensity of the light source
That includes, a sample measurement and analysis method using a sample analysis device.

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