KR102075513B1 - Smartcard test system - Google Patents

Abstract

According to one embodiment of the present invention, provided is a smart card test system which allows an operator who tests whether a smart card is defective to more easily perform an NFC function test for a plurality of smart cards through a multi-smart card providing device capable of being mounted on a plurality of different smart cards and selectively connecting each smart card to a test terminal and a smart card test application mounted on the test terminal to select each smart card in the multi-smart card providing device, performing an NFC operation test, and outputting the test result.

Description

Smart card test system {SMARTCARD TEST SYSTEM}

The present invention relates to a smart card test system, and in particular, it is possible to install a plurality of different smart card (smartcard) and each smart card can be selectively connected to the test terminal is possible NFC (Near Field Communication) operation test for each smart card To a smart card test system.

In general, smart cards such as Universal Subscriber Identify Module (USIM) cards are also referred to as Universal Integrated Circuit Cards (UICCs), and include microprocessors, memory, card operation systems (COS), security algorithms, and EEPROMs (Electronically). Erasable Programmable Read Only Memory).

Such smart cards are used for subscriber authentication, billing, global roaming, e-commerce, etc., and initially used only as a means for authenticating subscribers in mobile communication systems. have. For example, it provides various functions such as storing phone numbers, mobile banking, payment through short-range communication, and functions as mass storage.

On the other hand, as these smart cards are equipped with the various functions described above, it is necessary to test whether the various functions work normally before mass production of the product.

In this case, in the functional test of NFC mounted on the smart card during the test of the smart card as described above, the produced smart card is mounted in the smart card slot of the test terminal for one day, and then moved to the vicinity of the NFC reader through NFC on the smart card. We are testing whether data read, write, etc. are working properly.

However, in the NFC function test of the smart card as described above, the user has to attach the test smart card to the test terminal every time, and when there are many types of smart cards to test, it is not only cumbersome to attach the smart card to the test terminal. There was also a problem that takes a lot of time to test.

Republic of Korea Patent No. 10-0959555 (Registration date May 17, 2010)

Accordingly, an object of the present invention is to provide a smart card test system, which is capable of mounting a plurality of different smart cards and selectively connecting each smart card to a test terminal to enable NFC operation test for each smart card.

The objects of the present invention are not limited to the above-mentioned objects, and other objects and advantages of the present invention which are not mentioned above can be understood by the following description, and will be more clearly understood by the embodiments of the present invention. Also, it will be readily appreciated that the objects and advantages of the present invention may be realized by the means and combinations thereof indicated in the claims.

Multi-smart card supply apparatus according to the present invention is a smart card mounting portion that is equipped with a plurality of the smart card to be tested, a connecting portion connected to the smart card slot of the test terminal, located between the connecting portion and the smart card mounting portion of the plurality of It may include a relay unit for electrically connecting one target smart card of the test target smart card to the smart card slot to transmit data stored in the target smart card to the test terminal.

In addition, when the relay unit receives a card selection signal from the smart card test app mounted on the test terminal to test the operation of the test target smart card through the connection unit, the card selection among the test target smart card The target smart card corresponding to the signal may be selected and electrically connected to the smart card slot.

The connection unit may include a first line for transmitting the data stored in the test target smart card, a second line for receiving the card selection signal, and a third line for receiving operation power of the relay unit. The first terminal is connected to the smart card slot of the test terminal, and the relay unit includes a first terminal connected to the first line, and a plurality of second terminals connecting each of the plurality of test target smart cards. Switching according to the card selection signal received through a second line may selectively connect the first terminal to a second terminal connected to the target smart card corresponding to the card selection signal.

In addition, the relay unit, when the smart card test app is running on the test terminal may be operated by receiving the power of the battery mounted on the test terminal via the third line.

In addition, the multi-smart card supply device, the test terminal and the holding part of the NFC inspection robot that is implemented to test the NFC function of the target smart card while holding the test terminal to move to any space above the NFC reader and It can be manufactured to a size that can be gripped together.

In addition, the data may be user identification information and a USIM ID.

In addition, the smart card test system according to the present invention, a smart card test that is connected to the multi smart card supply device, the multi smart card supply device and test the operation of each test target smart card mounted on the multi smart card supply device. Including a test terminal equipped with an app, The multi-smart card supply device, a smart card mounting unit that is equipped with a plurality of test target smart card, a connection portion connected to the smart card slot of the test terminal, the connection unit and the smart Located between the card mounting portion, and in response to the card selection signal applied from the smart card test app, one of the target smart card of the plurality of test target smart card is electrically connected to the smart card slot selectively by the target smart The data stored on the card It may include a relay unit to be transmitted to the host terminal.

The connection unit may include a first line for transmitting the data stored in the test target smart card, a second line for receiving the card selection signal, and a third line for receiving operation power of the relay unit. It is connected to the smart card slot of the test terminal, The relay unit has a first terminal connected to the first line, and a plurality of second terminals for connecting each of the plurality of test target smart card, The second terminal may be switched according to the card selection signal received through the second line to selectively connect the first terminal to a second terminal connected to the target smart card corresponding to the card selection signal.

The smart card test app may include: a target smart card selection unit configured to transmit the card selection signal to the relay unit through the connection unit connected to the smart card slot when a selection number of the target smart card to be tested is input; A relay power supply unit supplying power of a battery mounted to the test terminal to the relay unit through a third line, and resetting the test terminal when the target smart card is electrically connected through the first line, A terminal driver for receiving the USIM ID information and the user identification information of the target smart card to operate the test terminal as the target smart card, and after the test terminal is driven, through the NFC reader period wireless communication adjacent to the target smart card. By controlling data read and write operations It may include a test for testing the presence or absence of the above NFC operation target group smart card and displays the test results.

The system may further include a plurality of different NFC readers to which the target smart card is to be tested, and the plurality of NFC readers may include an adjacent NFC reader and an adjacent NFC reader when testing an NFC operation between the adjacent NFC reader and the target smart card. The target smart cards may be spaced apart from each other at a predetermined distance without affecting wireless communication.

In addition, the terminal driver determines whether an ACK signal indicating that the connection is successful is normally received from the target smart card connected through the smart card slot, resets the test terminal if normally received, and then reset signal. Transmit to the target smart card to execute the target smart card and receive the USIM ID information and the user identification information from the target smart card.

In addition, the smart card test system according to the present invention, a smart card test that is connected to the multi smart card supply device, the multi smart card supply device and test the operation of each test target smart card mounted on the multi smart card supply device. Including a test terminal equipped with an app, and a PC device linked to the smart card test app, The multi-smart card supply device, Smart card mounting unit is mounted with a plurality of test target smart card, Smart card of the test terminal A connection part connected to a slot, and positioned between the connection part and the smart card mounting part, and selectively selecting one target smart card among the plurality of test target smart cards in response to a card selection signal applied from the smart card test app Electrically connected to the smart card slot It may include a relay unit for transmitting the data stored in the target smart card to the test terminal.

The connection unit may include a first line for transmitting the data stored in the test target smart card, a second line for receiving the card selection signal, and a third line for receiving operation power of the relay unit. It is connected to the smart card slot of the test terminal, The relay unit has a first terminal connected to the first line, and a plurality of second terminals for connecting each of the plurality of test target smart card, The second terminal may be switched according to the card selection signal received through the second line to selectively connect the first terminal to a second terminal connected to the target smart card corresponding to the card selection signal.

The smart card test app may include: a target smart card selection unit configured to transmit the card selection signal to the relay unit through the connection unit connected to the smart card slot when a selection number of the target smart card to be tested is input; A relay power supply unit supplying power of a battery mounted to the test terminal to the relay unit through a third line, and resetting the test terminal when the target smart card is electrically connected through the first line; A terminal driver for receiving the USIM ID information and the user identification information of the smart card to operate the test terminal as the target smart card, and performing data reading and writing through wireless communication with an adjacent NFC reader under the control of the PC device. Communication unit for providing the result data to the PC And including, the PC device may test the results to analyze the motion of the target data over NFC smart card provided by the communication unit whether or not to output the test results.

In addition, the multi-smart card supply apparatus according to the present invention, a smart card mounting portion to which a plurality of test target smart card is mounted, a connecting portion connected to the smart card slot of the test terminal, located between the connection portion and the smart card mounting portion A relay unit for electrically connecting one target smart card of the plurality of test target smart cards to the smart card slot to transmit data stored in the target smart card to the test terminal; And a controller configured to receive a selection signal and control the relay unit to correspond to the card selection signal to control the target smart card to be connected to the test terminal.

In addition, when the relay unit receives a card selection signal from the smart card test app mounted on the test terminal to test the operation of the test target smart card through the connection unit, the card selection among the test target smart card The target smart card corresponding to the signal may be selected and electrically connected to the smart card slot.

In addition, the supply device, according to the control of the controller to display whether or not the normal operation of each test target smart card, the mounting failure or the test progress status for the target smart card currently under test in a predetermined color or flashing pattern The display unit may further include a display unit. The controller may display whether the target smart card is normally operated on the display unit based on the information on whether the target smart card is normally operated by the smart card test app.

The connection unit may be connected to the smart card slot of the test terminal including a first line for transmitting the data stored in the test target smart card and a second line for receiving the card selection signal. The relay unit includes a first terminal connected to the first line and a plurality of second terminals connecting each of the plurality of test target smart cards, and the control unit includes the card received through the second line. The relay unit may be controlled according to a selection signal to control the first terminal to be selectively connected to a second terminal connected to the target smart card corresponding to the card selection signal.

The supply apparatus may further include a power supply unit for supplying operation power to each unit of the supply apparatus, and the control unit communicates with the smart card test app through the connection unit. When executed in the test terminal, the power of the power supply unit may be supplied to the operating power of the relay unit to drive the relay unit.

In addition, the multi-smart card supply device, the test terminal and the holding part of the NFC inspection robot that is implemented to test the NFC function of the target smart card while holding the test terminal to move to any space above the NFC reader and It can be manufactured to a size that can be gripped together.

According to an embodiment of the present invention, a multi-smart card supply apparatus capable of mounting a plurality of different smart cards and selectively connecting each smart card to a test terminal, and mounted in the test terminal each of the multi smart card supply apparatus The smart card test app that selects a smart card to perform NFC operation test and outputs the test result makes it easier for an operator who tests a smart card to perform an NFC function test on a plurality of smart cards.

In addition, according to an embodiment of the present invention, the multi-smart card supply apparatus is manufactured in a size capable of being gripped by a gripping part such as a robot arm while being connected with a test terminal, and tested by being held by a robot arm or the like while being connected with the test terminal. By allowing the test to be close to the various locations of the target NFC reader, it is possible to perform a test on a plurality of smart cards more quickly, greatly improving the convenience of the operator.

 In addition to the effects described above, the specific effects of the present invention will be described together with the following description of specifics for carrying out the invention.

1 is a detailed block diagram of a multi-smart card supply apparatus according to an embodiment of the present invention.
2 is a functional block diagram of a smart card test app according to an embodiment of the present invention.
3 is a perspective view of a connection between the test terminal and the multi smart card supply apparatus according to an embodiment of the present invention.
4 is a diagram illustrating a state in which a multi-smart card supplying device manufactured in a compact form according to an embodiment of the present invention is held in a robot arm together with a test terminal.
5 is a conceptual view of the NFC operation test between the NFC reader and the test terminal according to an embodiment of the present invention.
6 is a conceptual diagram of NFC operation test between a plurality of NFC readers and a test terminal according to an exemplary embodiment of the present invention.
7 is a signal processing flowchart between a test terminal and a multi smart card supply apparatus according to an embodiment of the present invention.
8 is a detailed block diagram of a multi-smart card supply apparatus according to another embodiment of the present invention.
9 is a detailed block diagram of a smart card test system according to another embodiment of the present invention.
10 is a functional block diagram of a smart card test app according to another embodiment of the present invention.

Hereinafter, with reference to the accompanying drawings will be described in detail the operating principle of the present invention. In the following description of the present invention, detailed descriptions of well-known functions or configurations will be omitted when it is determined that the detailed description of the present invention may unnecessarily obscure the subject matter of the present invention. Terms to be described later are terms defined in consideration of functions in the present invention, and may be changed according to intentions or customs of users or operators. Therefore, the definition should be made based on the contents throughout the specification.

Figure 1 shows a detailed block diagram of a multi smart card supply apparatus according to an embodiment of the present invention.

Hereinafter, the operation of each component of the multi smart card supply apparatus 100 will be described in more detail with reference to FIG. 1.

The smart card mounting unit 102 is mounted with a plurality of test target smart cards. The smart card mounting unit 102 may be provided with a plurality of smart card slots (slot) that can be mounted smart card. At this time, the smart card may be a USIM card, the smart card slot may be a USIM card slot, but is not limited thereto. In addition, the smart card mounting unit 102 may be manufactured to have a smart card slot of about 20 or less so that the smart card mounting unit 102 may be manufactured to be gripped in a grip unit such as a robot arm while being connected to the test terminal 150, but is not limited thereto. no.

The connector 104 is electrically connected to the smart card slot of the test terminal 150. The line 160 connected between the connection unit 104 and the smart card slot 152 of the test terminal 150 is configured to transmit data stored in the test target smart card inserted into the smart card slot on the smart card mounting unit 102. The first line and the second line for receiving the card selection signal from the smartcard test app 154 of the test terminal 150 and the battery power of the test terminal 150 are connected to the relay unit 106. And a third line for supplying the operating power.

The relay unit 106 is located between the connection unit 104 and the smart card mounting unit 102, the target smart card of one of the plurality of test target smart card corresponding to the card selection signal received from the smart card test app 154 Select.

Subsequently, the relay unit 106 electrically connects the selected target smart card to the smart card slot 152 of the test terminal 150 through the connection unit 104 to transmit data stored in the target smart card to the test terminal 150. Be sure to At this time, the data stored in the target smart card may be, for example, USIM ID, user identification information, but is not limited thereto. The USIM ID and the user identification information may be the minimum information necessary for the test terminal 150 to operate as the target smart card is mounted.

The relay unit 106 includes a first terminal (not shown) connected to the first line on the line 160 connected between the connection unit 104 and the smart card slot 152 of the test terminal 150, and a smart card mounting unit. A plurality of second terminals (not shown) for connecting each of the plurality of test target smart cards in the 102 may be provided. In addition, the relay unit 106 receives a card selection signal received through the second line as a switching control signal, and is switched according to the card selection signal, so that the first terminal is placed on the smart card mounting unit 102 corresponding to the card selection signal. The second terminal connected to the target smart card may be selectively connected.

In addition, the relay unit 106 may be implemented to receive operating power from the test terminal 150 without having a separate battery in the multi smart card supply device 100. That is, for example, the relay unit 106 may operate by receiving power of a battery mounted in the test terminal 150 through the third line when the smart card test app 154 is executed in the test terminal 150. However, the present invention is not limited thereto.

The test terminal 150 may be connected to the multi smart card supply device 100 through the smart card slot 152, and selectively connected to a plurality of test smart cards through the smart card slot 152 to the corresponding smart card. Means a terminal such as a test smart phone to operate as a corresponding terminal.

The test terminal 150 may be equipped with a smart card test app 154 programmed to test the normal operation of the smart card.

Figure 2 illustrates a functional block of the smart card test app 154 according to an embodiment of the present invention.

2, the smart card test app 154 may include a smart card selector 200, a relay power supply 202, a terminal driver 204, a test unit 206, and the like. At this time, each component of the smart card test app 154 may be implemented as a computer program such as an embedded program or a software module, but is not limited thereto.

The smart card selection unit 200 selects a card through the connection unit 104 of the multi smart card supply device 100 connected to the smart card slot 152 when a selection number of a target smart card to be tested is input from a user or the like. Send a signal. The card selection signal may be transmitted to the relay unit 106 of the multi smart card supply device 100 through the connection unit 104. On the other hand, the card selection signal in the smart card selection unit 200 may be implemented in various ways in addition to being selected by the user. That is, for example, when the smart card test app 154 is driven, the smart card selection unit 200 automatically checks the smart card that has not been tested among the test target smart cards mounted on the multi smart card supply device 100. The test may be implemented by selecting one by one sequentially or randomly.

The relay power supply unit 202 supplies the power of the battery mounted on the test terminal 150 to the operating power of the relay unit 106 through the third line on the connection unit 104.

The terminal driving unit 204 resets the test terminal 150 when the target smart card is electrically connected to the smart card slot 152 of the test terminal 150 through the first line, and thus the test terminal 150. Is restarted, and thus the restarted test terminal 150 recognizes USIM ID information and user identification information of the target smart card to operate as a terminal equipped with the target smart card.

The test unit 206 performs various operation tests on the target smart card when the test terminal 150 is driven using the USIM ID and the user identification information of the target smart card. In this case, for example, one of various operation tests may be a NFC (near field communication) operation test of the smart card. In the NFC operation test, for example, the test unit 206 reads and writes data through wireless communication between the target smart card and the NFC reader period when the test terminal 150 approaches the NFC reader located nearby. (write) Controls the operation to be performed to test whether the NFC operation of the target smart card is abnormal and displays the test result. In this case, when an error occurs in the data read and write operation, for example, the test unit 206 may display that the target smart card is defective through the display unit of the test terminal 150 as a test result. Accordingly, the worker who is conducting the test can easily check whether the target smart card is defective.

3 is a perspective view of a connection between the test terminal 150 and the multi smart card supply apparatus 100 according to an embodiment of the present invention.

As shown in FIG. 3, the multi smart card supply device 100 may have a smart card slot 302 that can be equipped with a plurality of test target smart cards 300 on an upper surface thereof, and a test terminal ( It may include a configuration of the connecting portion 104 for electrical connection with 150, but is not limited thereto.

Since the multi-smart card supply apparatus 100 needs to be gripped by a gripping part such as a robot arm that is movable in the upper part of the NFC reader in a wired state with the test terminal 150 according to an embodiment of the present invention, FIG. As shown in 3 it is preferable to be manufactured in a size similar to the size of the test terminal 150 that can be a general smart phone, etc., but is not limited thereto.

4 illustrates a state in which a multi-smart card supplying device 100 made compact according to an embodiment of the present invention is held in a robot arm together with a test terminal 150.

The smart card supply unit 100 including the smart card mounting unit 102, the connection unit 104, the relay unit 106 and the test terminal 150 as shown in Figure 3 according to an embodiment of the present invention As shown in FIG. 4 in a wired state, various positions (A1, A2, on the top of the NFC reader 450 by the robot arm 400 in a state of being gripped by the gripper 410 of the robot arm 400). While moving to A3), a test for the NFC function of the target smart card connected to the test terminal 150 may be performed.

In this test process, as shown in FIG. 5, a test terminal 150 equipped with a test target target smart card is generally gripped by the gripper 410 of the robot arm 400, and then communicated with the NFC reader 450. The NFC function of the target smart card is normally operated by repeatedly performing an operation of approaching the NFC reader 450 within a predetermined distance while moving freely in the front, rear, left, and right directions within the range of the predetermined distance d1. Done.

Therefore, in the exemplary embodiment of the present invention, when the NFC function test of the smart card is performed while the multi smart card supply device 100 is connected to the test terminal 150, the smart card test mounted on the test terminal 150 is performed. App 154 automatically connects each test target smart card 300 mounted on the multi smart card supply apparatus 100 to the test terminal 150 to test the NFC function of all the test target smart card. Accordingly, it is possible to prevent the hassle in the conventional smart card test process to repeat the mounting and detachment of the test target smart card 300 to the test terminal 150 one by one, it is possible to significantly reduce the test time.

That is, in the related art, the smart card required for the test is repeatedly mounted on the test terminal 150 every time, and only the test terminal 150 needs to be repeated on the gripping portion 410 of the robot arm 400. In one embodiment, the multi-smart card supply apparatus 100 equipped with a plurality of test target smart cards 300 is held together with the test terminal 150 in the holding unit 410 of the robot arm 400, and the smart card test. By connecting the plurality of test target smart cards 300 to the test terminal 150 one by one through the app 154, the tests can be performed sequentially, thereby preventing the hassle in the smart card test process and greatly reducing the test time. It will be possible.

In addition, in one embodiment of the invention illustrated a test method for one NFC reader 450, as shown in Figure 6, a plurality of different types of NFC readers 450, 452, 454, which need to be tested, 456, 458, and 459 may be disposed at regular intervals, and then a test may be performed on whether or not wireless communication with each NFC reader is normally performed on the test smart card.

That is, NFC readers may be provided with various types of NFC readers, for example, readers installed on public transportation to deduct usage fees, and readers that allow food prices to be subtracted from restaurants. For the smart card under test, it is necessary to test again that it works in various NFC readers. Therefore, the test terminal 150 to which the various types of test target smart cards are sequentially connected using a robot arm or the like at a place where NFC readers 450, 452, 454, 456, 458, and 459 are arranged at regular intervals. When the test of the NFC reader is completed, if you proceed with the test to other NFC readers can reduce the NFC function test time of the smart card even more.

In this case, each NFC reader period distance d2 may be set to a preset distance that does not affect the NFC operation test between the adjacent NFC reader and the test terminal, but is not limited thereto.

7 illustrates a signal processing flow between a test terminal and a multi smart card supply apparatus according to an embodiment of the present invention.

Hereinafter, a signal processing flow according to an embodiment of the present invention will be described in more detail with reference to FIGS. 1 to 7.

First, when the smart card test app 154 mounted on the test terminal 150 is executed, and there is a selection input for one test target smart card mounted on the multi smart card supply device 100 from a user or the like, the smart card The test app 154 transmits a card selection signal for selecting the target smart card (S700). In this case, the card selection signal may be transmitted to the multi smart card supply apparatus 100 through the smart card slot 152 of the test terminal 150.

Then, the multi smart card supply apparatus 100 selects one target smart card corresponding to the card selection signal received from the smart card test app 154 among the plurality of test target smart cards mounted on the smart card mounting unit 102. Then, the selected target smart card is electrically connected to the smart card slot 152 of the test terminal 150 through the connection unit 104 so that data stored in the target smart card is transmitted to the test terminal 150.

As described above, when the target smart card is electrically connected to the smart card slot 152 of the test terminal 150, the target smart card transmits an Ack signal indicating that the target smart card is normally connected to the smart card test app 154 (S702).

Then, when the smart card test app 154 receives the Ack signal from the target smart card mounted on the multi smart card supply apparatus 100 as described above, the target smart card is the smart card slot 152 of the test terminal 150. It is determined that the connection to the normal, and reset the test terminal 150 (S704), so that the test terminal 150 is restarted.

Accordingly, the test terminal 150 restarts to recognize the target smart card through the smart card slot 152 (S706). In this case, the test terminal 150 may be, for example, a smartphone, but is not limited thereto.

Subsequently, when the test terminal 150 is restarted as described above and recognizes the target smart card, the test terminal 150 requests USIM information from the target smart card (S708). In the target smart card, the test terminal 150 is stored in the memory of the target smart card. The USIM ID and the user identification information for driving) are extracted and transmitted to the test terminal 150 (S710).

Accordingly, the test terminal 150 receives the USIM ID and the user identification information from the target smart card so that the test terminal 150 can normally operate as a terminal equipped with the target smart card (S712).

When the test terminal 150 is normally operated as a terminal equipped with a target smart card as described above, the smart card test app 154 performs various operation tests on the target smart card (S714). At this time, for example, one of various operation tests may be an NFC operation test of a smart card. In the NFC operation test, for example, the smart card test app 154 reads data through the wireless communication between the target smart card and the NFC reader period when the test terminal 150 approaches the NFC reader 450 located nearby. And the write operation is controlled to test whether the NFC operation of the target smart card abnormal.

Subsequently, the smart card test app 154 checks whether the test is completed (S714), and displays a test result when the test is completed (S716). In this case, for example, when an error occurs in the data reading and writing operation, the smart card test app 154 may display that the target smart card is defective through the display unit of the test terminal 150 as a test result. . Accordingly, the worker who is conducting the test can easily check whether the target smart card is defective.

At this time, the test for determining the normal operation of NFC as described above may include, for example, a tag read, tag write, Multi OTP, Anti Collision test. Tag read may refer to a test that reads a specific key word a predetermined number of times within a predetermined time. Tag write may mean a test that writes a key word specified by the tester, reads it again, and checks it. At this time, the tester may be a smart card test app, and the NFC reader in which the target smart card is close by the smart card test app. This can mean a test that writes a particular key word and then reads it again.

Multi OTP can refer to a test that writes a specific key word several times and checks it again.Anti Collision checks whether NFC is normal in a predetermined way based on ISO when attempting to connect to an initial smart card. It can mean testing.

8 is a detailed block diagram of a multi smart card supply apparatus according to another embodiment of the present invention.

According to another embodiment of the present invention, the multi smart card supply apparatus 800 of FIG. 8 is different from the multi smart card supply apparatus 300 illustrated in FIG. 1, and includes a control unit 808, a power supply unit 810, and a display unit 812. ) May be further included.

Hereinafter, the operation of each component of the multi smart card supply apparatus 800 according to another embodiment of the present invention will be described in more detail with reference to FIG. 8.

The smart card mounting unit 802 is equipped with a plurality of test target smart card. The smart card mounting unit 802 may be provided with a plurality of smart card slots that can be mounted smart card. At this time, the smart card may be a USIM card, the smart card slot may be a USIM card slot, but is not limited thereto. In addition, the smart card mounting unit 802 may be manufactured to have a smart card slot of about 20 or less so that the smart card mounting unit 802 may be manufactured to be gripped in a grip unit such as a robot arm while being connected to the test terminal 850. no.

The connector 804 is electrically connected to the smart card slot 854 of the test terminal 850. The line 860 connected between the connection unit 804 and the smart card slot 852 of the test terminal 850 is configured to transmit data stored in the test target smart card inserted into the smart card slot on the smart card mounting unit 802. One line and a second line for receiving a card selection signal from the smartcard test app 854 of the test terminal 850 may be included.

The relay unit 806 is positioned between the connection unit 804 and the smart card mounting unit 802, and selectively selects one target smart card from among a plurality of test target smart cards under the control of the control unit 808. ) Is electrically connected to the data stored in the target smart card to be transmitted to the test terminal 850.

The controller 808 receives the card selection signal through the connection unit 804 and controls the relay unit 806 according to the card selection signal so that the target smart card corresponding to the card selection signal is connected to the test terminal 850. .

At this time, the data stored in the target smart card may be, for example, USIM ID, user identification information, but is not limited thereto. The USIM ID and the user identification information may be the minimum information necessary for the test terminal 850 to operate as a target smart card.

In addition, the relay unit 806 may include a first terminal connected to the first line of the connection unit 804 and a plurality of second terminals connecting each of the plurality of test target smart cards in the smart card mounting unit 802. have.

The controller 808 controls the relay unit 806 according to the card selection signal received through the second line so that the first terminal is selectively connected to the second terminal connected to the target smart card corresponding to the card selection signal. .

The power supply unit 810 supplies operating power to each component of the multi smart card supply device 800 including the relay unit 806.

The display unit 812 may display, depending on the control of the controller 808, whether each test target smart card is in normal operation, a bad mounting state, or a test progress state on the target smart card currently under test in a predetermined color or blinking pattern. have.

That is, the controller 808 controls the display unit 812 based on the information on whether the target smart card is normally operated by the smart card test app 854 to display whether the target smart card is normally operated.

The test terminal 850 may be connected to the multi smart card supply device 800 through the smart card slot 852, and selectively connected to the plurality of test smart cards through the smart card slot 852 to the corresponding smart card. It means a test terminal operating as a corresponding terminal.

The test terminal 850 may be equipped with a smart card test app 854 programmed to test the normal operation of the smart card.

In addition, the smart card test app 854 may include a target smart card selection unit, a terminal driver, a test unit, and the like as shown in FIG. 2, and performs the same operation as described in FIG. 2.

9 is a detailed block diagram of a smart card test system according to another embodiment of the present invention.

Hereinafter, an operation of each component of the smart card test system according to an embodiment of the present invention will be described in detail with reference to FIG. 9.

The multi smart card supply device 100 is connected to the test terminal 150 in a state in which a plurality of test target smart cards, such as a USIM card, is mounted, from the smart card test app 154 'mounted on the test terminal 150. The target smart card corresponding to the card selection signal may be electrically connected to the test terminal 150 selectively so that the test on the target smart card may be performed.

The multi smart card supply device 100 may include a connection unit 104, a relay unit 106, a smart card mounting unit 102, such a connection unit 104, relay unit 106, smart card mounting unit The operation of 102 is as described in FIG.

The test terminal 150 may be connected to the multi smart card supply device 100 through the smart card slot 152, and selectively connected to a plurality of test smart cards through the smart card slot 152 to the corresponding smart card. It means a test terminal operating as a corresponding terminal.

The test terminal 150 may be equipped with a smart card test app 154 'programmed to test whether the smart card operates normally.

10 illustrates functional blocks of the smart card test app 154 ′ according to another embodiment of the present invention.

In this case, the smart card test app 154 ′ may include a target smart card selecting unit 902, a relay power supply unit 904, a terminal driving unit 906, and a communication unit 908. The test app 206 for testing the operation of the target smart card is excluded. That is, in another embodiment of the present invention, the test of the target smart card is implemented to be performed in the PC device 900 connected to the test terminal 150 by wire or wirelessly.

The smart card selection unit 902 transmits a card selection signal through the connection unit 104 of the multi smart card supply apparatus 100 connected to the smart card slot when a selection number of a target smart card to be tested is input from a user or the like. do. The card selection signal may be transmitted to the relay unit 106 of the multi smart card supply device 100 through the connection unit 104.

The relay power supply unit 904 receives the power of the battery mounted on the test terminal 150 through the third line on the connection unit 104 and supplies the power to the operating power of the relay unit 106.

The terminal driver 906 resets the test terminal 150 when the target smart card is electrically connected to the smart card slot 152 of the test terminal 150 through the first line, so that the test terminal 150 is restarted. Then, the restarted test terminal 150 recognizes the USIM ID information and the user identification information of the target smart card to operate as a terminal equipped with the target smart card.

The communication unit 908 communicates with the PC device 900 to enable data transmission and reception between the PC device 900 and the smart card test app 154.

When the test terminal 150 is driven using the USIM ID and the user identification information of the target smart card as described above, the PC device 900 interworks with the smart card test app 54 'through the communication unit 908 to target smart. Perform various operational tests on the card.

At this time, for example, one of the various operation tests may be an NFC operation test of the smart card. In this NFC operation test, for example, when the PC device 900 approaches the NFC reader 450 located near the test terminal 150, the target smart card through linkage with the smart card test app 154 '. By controlling the data read and write operation of the NFC reader period adjacent to and to test the NFC operation of the target smart card and display the test results. As a result of such a test, for example, when an error occurs in data read and write operations, the PC device 900 may display as a test result that the corresponding target smart card is defective through a display unit such as a monitor connected to the PC device 900. Can be. Accordingly, the worker who is conducting the test can easily check whether the target smart card is defective.

As described above, according to an embodiment of the present invention, it is possible to mount a plurality of different smart card and is equipped in a multi smart card supply device and a test terminal capable of selectively connecting each smart card to a test terminal, The smart card test app that selects each smart card in the smart card supply unit to perform NFC operation test and outputs the test result makes it easier for the operator who tests the smart card for NFC function test on multiple smart cards. Make it work. In addition, the multi-smart card supply device is produced in a size that can be gripped by a gripping part such as a robot arm while being connected to a test terminal, and is held by a robot arm while being connected to the test terminal to approach various locations of the NFC reader under test. By making it possible to test, multiple smart cards can be tested more quickly and operator convenience can be greatly improved.

Although the present invention has been described with reference to the drawings exemplified as above, the present invention is not limited to the embodiments and drawings disclosed herein, and various modifications may be made by those skilled in the art within the scope of the technical idea of the present invention. It is obvious that modifications can be made. In addition, even if the above described embodiments of the present invention while not explicitly described and described the effect of the effect of the configuration of the present invention, it is obvious that the effect predictable by the configuration is also to be recognized.

102: smart card mounting portion 104: connection portion
106: relay unit 152: smart card slot
154: smart card test app 200: smart card selector
202: relay power supply unit 204: terminal drive unit
206: test unit

Claims (20)

delete delete delete delete delete delete delete delete delete delete delete Multi smart card feeder,
A test terminal connected to the multi smart card supplier and equipped with a smart card test app for testing the operation of each test target smart card mounted in the multi smart card supplier;
PC device that works with the smart card test app,
The test target smart card includes a plurality of different NFC reader to be tested,
The multi-smart card supply apparatus includes a smart card mounting unit in which a plurality of test target smart cards are mounted, a connection unit connected to a smart card slot of a test terminal, and positioned between the connection unit and the smart card mounting unit. A relay unit electrically connecting one target smart card of the smart cards to the smart card slot to transmit data stored in the target smart card to the test terminal, and receiving a card selection signal through the connection unit, A control unit for controlling the relay unit to be connected to the test terminal by controlling the relay unit in response to the card selection signal, and whether the test target smart card is normally operated, a mounting failure or a current test is performed according to the control of the control unit; The target being And a display for displaying the test whether the status of the smart card group to the set color or blinking pattern, and a power supply for supplying the operation power to the respective units,
The data consists of user identification information and USIM ID,
The connection unit is connected to the smart card slot of the test terminal, including a first line for transmitting the data stored in the test target smart card, and a second line for receiving the card selection signal.
The relay unit includes a first terminal connected to the first line and a plurality of second terminals connecting each of the plurality of test target smart cards,
The relay unit, when receiving the card selection signal from the smart card test app mounted on the test terminal to test the operation of the test target smart card through the connection unit, to the card selection signal of the test target smart card Selecting the corresponding target smart card to electrically connect to the smart card slot,
The controller controls the relay unit according to the card selection signal received through the second line so that the first terminal is selectively connected to a second terminal connected to the target smart card corresponding to the card selection signal. ,
The controller is configured to display whether the target smart card is normally operated on the display unit based on the information on whether the target smart card is normally operated by the smart card test app.
The control unit communicates with the smart card test app through the connection unit, and when the smart card test app is executed in the test terminal, the power of the power supply unit is supplied to the operating power of the relay unit to drive the relay unit. And
The smart card test app, a target smart card selection unit for transmitting a card selection signal to the relay unit through the connection unit connected to the smart card slot when the selection number of the target smart card to be tested is input, and the relay And a relay power supply unit supplying power of a battery mounted to the test terminal through a third line, and resets the test terminal when the target smart card is electrically connected through the first line and resets the target smart card. A terminal driver for receiving the USIM ID information and the user identification information and operating the test terminal as the target smart card, and performing data reading and writing through wireless communication with an adjacent NFC reader under control of the PC device. A communication unit for providing the result data to the PC; ,
The terminal driver determines whether an ACK signal indicating that the connection is successful is normally received from the target smart card connected through the smart card slot, resets the test terminal if normally received, and then resets the reset signal. Transmitting to the target smart card to execute the target smart card and receiving the USIM ID information and the user identification information from the target smart card,
The PC device analyzes the result data provided from the communication unit to test the NFC operation abnormality of the target smart card and output a test result,
The plurality of NFC reader is smart, characterized in that spaced at a predetermined distance that does not affect wireless communication between the adjacent NFC reader and the target smart card when the NFC operation test between the adjacent NFC reader and the target smart card. Card testing system. delete delete delete delete delete delete delete The method of claim 12,
The multi smart card supply device,
The smart card test is made of a size that can be held together with the test terminal by holding the test terminal and the holding part of the NFC inspection robot that is implemented to test the NFC function of the target smart card while moving to an arbitrary space above the NFC reader. system..

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