KR102024809B1 - Method and its apparatus for impedance matching - Google Patents

Method and its apparatus for impedance matching Download PDF

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KR102024809B1
KR102024809B1 KR1020130075902A KR20130075902A KR102024809B1 KR 102024809 B1 KR102024809 B1 KR 102024809B1 KR 1020130075902 A KR1020130075902 A KR 1020130075902A KR 20130075902 A KR20130075902 A KR 20130075902A KR 102024809 B1 KR102024809 B1 KR 102024809B1
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South Korea
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value
port
parameter
electronic device
impedance
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KR1020130075902A
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Korean (ko)
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KR20150002277A (en
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김유진
이상호
전신형
심종완
천정남
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삼성전자주식회사
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/38—Impedance-matching networks
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/01—Frequency selective two-port networks
    • H03H7/17—Structural details of sub-circuits of frequency selective networks
    • H03H7/1741—Comprising typical LC combinations, irrespective of presence and location of additional resistors
    • H03H7/175—Series LC in series path
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/38—Impedance-matching networks
    • H03H7/383—Impedance-matching networks comprising distributed impedance elements together with lumped impedance elements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/42—Networks for transforming balanced signals into unbalanced signals and vice versa, e.g. baluns

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Abstract

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a technique for matching impedance in a tram device, the impedance matching method of an electronic device comprising: determining an impedance value for a target; The method may include determining an S parameter for the at least one set port and determining a value of the LC device based on the determined S parameter.

Description

METHOD AND ITS APPARATUS FOR IMPEDANCE MATCHING}

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to electronic devices, and more particularly, to a method and apparatus for searching for an optimal LC element value through impedance matching in an electronic device.

Conventionally, various methods for impedance matching have been provided. For example, in the case of power amplifier matching, the terminal is connected to 50 ohms, the components of the power amplifier are removed from the printed circuit board (PCB), and a network analyzer is connected to the output terminal of the power amplifier. Thus, while comparing with the load-pull data provided by the power amplifier manufacturer, by moving to the desired impedance point, it is possible to determine the value of the LC element for impedance matching. As another example, the impedance of the Smith chart can be checked using a network analyzer on a PCB RF line and moved to a desired impedance point to determine the LC device value for impedance matching. In another example, a developer may use a CAD tool to design a RF line, and after PCB ordering, impedance matching may be performed using a received PCB.

However, when the impedance is matched by the above-described methods, since the matching is performed depending on the subjective experience of the engineers, a deviation may be generated. For example, in the case of the power AMP matching method, as shown in FIG. 1A, since a difference occurs between a position where an actual LC element is mounted and an observation point (PAM output pin position), an accurate value cannot be predicted. . For another example, in the case of a method of matching by moving Load Impedance and Source Impedance to the position where the matching element is mounted, as shown in FIG. Since additional deviation occurs due to capacitance, the exact value cannot be predicted. As another example, as shown in Fig. 1C, since there is an error between the ideal value and the LC element value actually used, an accurate value cannot be predicted.

Accordingly, there is a need to provide a method for finding an optimized value of an LC device having a small influence due to the PCB pattern and the parastic component of the LC device and an observation point.

Accordingly, an embodiment of the present invention is to provide a method and apparatus for searching for an optimal LC element value through impedance matching in an electronic device.

Another embodiment of the present invention provides a method and apparatus for setting a port at a location where an LC element is to be installed in an electronic device and performing impedance matching through the set port.

Another embodiment of the present invention provides a method and apparatus for determining a value of an LC element using a target impedance and an impedance calculated by a predetermined algorithm in an electronic device.

Another embodiment of the present invention is to provide a method and apparatus for providing component information corresponding to a value of an LC element determined in an electronic device.

According to an embodiment of the present disclosure, a method of an electronic device for impedance matching may include: determining an impedance value for a target, setting a port at a location where at least one LC element is to be installed, and Determining an S parameter for at least one port; and determining a value of the LC device based on the determined S parameter.

According to an embodiment of the present disclosure, in an electronic device for impedance matching, a target impedance input unit configured to determine an impedance value for a target, a port is set at a position where at least one LC element is to be installed, and the at least one set And a multi-port analyzer configured to determine an S parameter for a port of and determine a value of the LC device based on the determined S parameter.

In an embodiment of the present invention, by setting a port at a location where an LC device is to be installed, extracting an S parameter, and determining an LC device value based on the corresponding S parameter, an error between an actual value and a measured value of the LC device, PCB The error due to the pattern can be reduced, and the time required for impedance matching can be shortened. In addition, by providing the user with information on the actual part corresponding to the LC element value, it is possible to provide the user with the convenience of part selection.

1A is a diagram showing an example of an impedance matching method of a conventional Power AMP;
1B is a diagram showing an example of an impedance matching method for moving a conventional impedance to a matching element position;
1C is a diagram showing an example showing an error value between a conventional ideal value and an actual LC element value;
2 is a diagram illustrating a configuration of an electronic device for deriving an optimal LC element value by setting a port at a position of an LC element according to an embodiment of the present disclosure;
3A illustrates a procedure of estimating an LC element value by setting a port at a position of an LC element in an electronic device according to an embodiment of the present disclosure;
3B illustrates a means for estimating an LC element value by setting a port at a position of an LC element in an electronic device according to an embodiment of the present disclosure;
4 is a diagram illustrating a procedure for deriving an optimal LC element value by setting a port at a position of an LC element in an electronic device according to an embodiment of the present disclosure;
5 is a diagram illustrating an example of setting a port at a position of an LC element in an electronic device according to an embodiment of the present disclosure.

Hereinafter, exemplary embodiments of the present invention will be described with reference to the accompanying drawings. In the following description of the present invention, detailed descriptions of related well-known functions or configurations will be omitted if it is determined that the detailed description of the present invention may unnecessarily obscure the subject matter of the present invention. In addition, terms to be described below are terms defined in consideration of functions in the present invention, which may vary according to intention or custom of a user or an operator. Therefore, the definition should be made based on the contents throughout the specification.

In the following description, the electronic device may include a measuring tool and a simulation tool for estimating an LC device value to be installed on a PCB.

Hereinafter, the present specification describes a method for matching impedance of an RF circuit on a PCB. Particularly, in the present specification, a method of determining a location in which an LC device is to be installed in an RF circuit, setting a port at a location in which a LC device is not installed at a determined location, and then matching RF impedance using the set port Use According to another exemplary embodiment, after removing an LC device pre-installed in an RF circuit on a PCB, impedance matching may be performed by setting a port at a location where the LC device is removed. In the following specification, for convenience of description, as illustrated in FIG. 5, a port is set at three positions where an input terminal, an output terminal, and an LC element are to be installed, and it is assumed that the LC element value for impedance matching is derived. do. However, the present specification may be applied in the same manner when there is more than one LC element between the input terminal and the output terminal.

2 illustrates a configuration of an electronic device for deriving an optimization value of an LC device by setting a port at a position of the LC device according to an embodiment of the present disclosure.

Referring to FIG. 2, the electronic device includes a target impedance input unit 201, a multi-port analyzer 203, an LC device value derivator 205, and an optimization value derivator 207.

The target impedance input unit 201 may receive an impedance value for the target. When the impedance value for the target is input, the target impedance input unit 201 may transmit the impedance value to the multi-port analyzer 203.

The multi-port analyzer 203 extracts the S parameter from the LC device position by using the port analysis set in the LC device of the PCB, and converts the extracted S parameter into a port having the same shape as the target impedance (for example, S2P type). Can be. In detail, the multi-port analyzer 203 may extract an S parameter for the entire RF line using a port set at an input terminal, an output terminal, and a position of the LC device. Thereafter, the multi-port analyzer 203 may derive the Z parameter equation, as shown in Equation 1 below, using the extracted S parameter to derive the LC device value.

Figure 112013058505551-pat00001

Then, the multi-port analyzer 203 is V 3 , V 4 at the position of the LC device according to the S parameter definition And The value described in Equation 2 below is substituted into V 5 .

Figure 112013058505551-pat00002

Thereafter, the multi-port analyzer 203 calculates Z 11 , Z 12 , Z 21 , and Z 22 values by using the inverse of 3 rows, 4 rows, and 5 rows described in Equation 1 below. Can be summed up as I 3 , I 4 , and I 5 .

Figure 112013058505551-pat00003

Thereafter, the multi-port analyzer 203 may reorganize V 1 and V 2 by substituting I 3 , I 4 , and I 5 in rows 1 and 2 described in Equation 1 as shown in Equation 4 below. have.

Figure 112013058505551-pat00004

Thereafter, the multi-port analyzer 203 may derive X3, X4, and X5 values by comparing the Z 'impedance shown in Equation 4 with the target impedance Ztarget.

The LC element value deriving unit 205 determines the LC element value by using the derived X3, X4, X5 values, compares the parts list corresponding to the determined LC element value, and uses the component corresponding to the LC element value. You can let them know. The LC element value deriving unit 205 may include a list indicating an LC element value corresponding to the values of X3, X4, and X5 or component information corresponding to the LC element value in advance.

FIG. 3A illustrates a procedure of extracting an LC element value by setting a port at a position of an LC element in an electronic device according to an embodiment of the present disclosure.

Referring to FIG. 3A, the electronic device determines an impedance value for the target in step 301. In this case, the electronic device may receive an impedance value for a specific target according to user control. In detail, the user of the electronic device may input an impedance value for a target that the user wants to know.

In operation 303, the electronic device may set a port at a location where at least one LC element is to be installed. For example, the electronic device may determine a location where the LC device is to be installed and set a port at the location where the LC device is not installed at the determined location. As another example, the electronic device may remove the LC element pre-installed in the RF circuit, and then set the port at the position where the LC element is removed. In this case, the number of ports may be changed according to the number of LC elements. In addition, the electronic device may set ports in addition to the input terminal and the output terminal.

In operation 305, the electronic device may determine an S parameter for at least one port set. In other words, the electronic device extracts the S parameter at the position of the LC device using the configured multiport. In this case, the S parameter means a circuit result value used in RF, and represents the ratio of input voltage to output voltage on the frequency distribution. For example, S21 represents the ratio of the input voltage of port 1 to the output voltage of port 2. That is, it means a value indicating how much power input to port 1 is output to port 2. Thereafter, the electronic device may convert the S parameter of the multi-port into S2P having the same form as the target impedance.

In operation 307, the electronic device determines an LC device value based on the determined S parameter. In other words, the electronic device may extract the LC device value from the S parameter based on a preset matching value optimization algorithm.

FIG. 3B illustrates a means for extracting LC element values by setting ports at positions of LC elements in an electronic device according to an embodiment of the present disclosure.

Referring to FIG. 3B, the electronic device may include means 311 for determining an impedance value for the target. For example, the electronic device may include a simulation tool for receiving an impedance value for the target.

In addition, the electronic device may include means 313 for setting a port at a position where at least one LC element is to be installed. In this case, the electronic device may include means for removing a component installed at the position of the LC element and setting a port at the position. In addition, the electronic device may include means for setting a port at an input terminal and an output terminal.

Thereafter, the electronic device may include means 315 for determining an S parameter for at least one configured port.

In addition, the electronic device includes means 317 for determining the LC element value based on the determined S parameter. In this case, the electronic device may include a means for searching for and informing an optimized part corresponding to a frequency based on the determined device value.

4 illustrates a procedure of deriving an optimization value of an LC element by setting a port at a position of the LC element in an electronic device according to an embodiment of the present disclosure.

Referring to FIG. 4, in operation 401, the electronic device may receive an impedance value of a target. For example, the electronic device may receive an impedance value for the target through a simulation tool.

In operation 403, the electronic device may set a port at an input terminal, an output terminal, and a position of the LC device. For example, as shown in FIG. 5, the electronic device may set a port at an input terminal and an output terminal, and may set a port at a corresponding position by removing a component installed at a position of the LC element. In this case, the number of ports may be changed according to the number of LC elements.

In operation 405, the electronic device may extract S parameters for the entire RF line. In other words, the electronic device may extract the S parameter for the entire RF line using the configured port.

Thereafter, in step 407, the electronic device converts SnP into S2P, and then proceeds to step 409 to compare the target with the Z parameter. In detail, the electronic device may convert SnP consisting of n ports into S2P consisting of two ports. First, as shown in Equation 1, the electronic device may induce a Z parameter by using an S parameter. The electronic device then determines V 3 , V 4 according to the S parameter definition at the position of the LC element. And In order to substitute the value described in Equation 2 into V 5 and to obtain the values of Z 11 , Z 12 , Z 21 , and Z 22 , Equation 3 using the inverse of 3 rows, 4 rows, and 5 rows described in Equation 1 It can be summarized as I 3 , I 4 , and I 5 values as follows. Subsequently, the electronic device may rearrange V 1 and V 2 as shown in Equation 4 by substituting I 3 , I 4 , and I 5 in rows 1 and 2 described in Equation 1. Thereafter, the electronic device may derive the X3, X4, and X5 values by comparing the impedance of Equation 4 with the target impedance Ztarget.

Accordingly, the electronic device may derive each LC device value in step 411.

In operation 413, the electronic device may search for the corresponding LC device value in a list representing the characteristic at the corresponding frequency of the actual part and inform the user of the found part. In this case, the electronic device may store in advance a list in which the LC device values and the parts corresponding to the LC device values are mapped, and when the LC device values are derived, search for the parts corresponding to the LC device values in the prestored list and notify the user. have. Thereafter, the electronic device terminates the procedure according to the embodiment of the present disclosure.

Embodiments of the invention and all functional operations described herein may be implemented in computer software, firmware, or hardware, including the structures disclosed herein and equivalent structures thereof, or in one or more combinations thereof. . In addition, embodiments of the invention described herein may be embodied in one or more computer program products, i.e., one or more modules of computer program instructions encoded on a computer readable medium executed by or for controlling the operation of the data processing device. Can be implemented.

The computer readable medium can be a machine readable storage medium, a machine readable storage substrate, a memory device, a composition of materials affecting a machine readable propagation stream, or a combination of one or more thereof. The term data processing apparatus includes, by way of example, all devices, apparatus, and machines for processing data, including programmable processors, computers, or multiple processors or computers. The device may include, in addition to hardware, code that creates an execution environment for the computer program, such as processor firmware, protocol stacks, database management systems, operating systems, or combinations of one or more thereof.

Meanwhile, in the detailed description of the present invention, specific embodiments have been described, but various modifications may be made without departing from the scope of the present invention. Therefore, the scope of the present invention should not be limited to the described embodiments, but should be determined not only by the scope of the following claims, but also by those equivalent to the scope of the claims.

Claims (8)

In the method of the electronic device for impedance matching,
Determining an impedance value for the target,
Setting a port at a position where at least one LC element is to be installed;
Determining an S parameter for the set port;
Determining the value of the at least one LC device based on the determined S parameter.
The method of claim 1,
The process of setting a port at a position where the at least one LC element is to be installed,
Determining a position at which the at least one LC element is to be installed on a printed circuit board (PCB);
And setting a port in a state in which the at least one LC element is not installed at the determined position.
The method of claim 1,
Determining a value of the at least one LC device based on the determined S parameter,
Converting an S parameter of a number of ports corresponding to the number of at least one LC element into a Z parameter of two ports;
Determining a value of the at least one LC device based on the transformed Z parameter.
The method of claim 3, wherein
Comparing the determined values of the at least one LC device with device values in a pre-stored parts list;
And outputting information about a part corresponding to an element value of the parts list according to a result of the comparison.
An electronic device for impedance matching,
A target impedance input unit for determining an impedance value for the target,
A multi-port analyzer configured to set a port at a position where at least one LC element is to be installed, determine an S parameter for the set port, and determine a value of the at least one LC element based on the determined S parameter; Device.
The method of claim 5,
The multi-port analyzer is configured to determine a position on which the at least one LC element is to be installed on a printed circuit board (PCB), and to set a port without the at least one LC element installed at the determined position.
The method of claim 5,
The multi-port analyzer converts an S parameter composed of a number of ports corresponding to the number of the at least one LC element into a Z parameter composed of two ports,
The electronic device further includes an LC device value deriving unit configured to determine a value of the at least one LC device based on the converted Z parameter.
The method of claim 7, wherein
An LC element value deriving unit configured to compare the determined value of the at least one LC element with an element value of a pre-stored parts list, and output information on a part corresponding to the element value of the parts list according to a result of the comparison; Containing device.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11411656B2 (en) 2019-11-05 2022-08-09 Electronics And Telecommunications Research Institute Impedance correcting method and apparatus, and impedance-corrected signal line for optical transceiver

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009543499A (en) 2006-07-12 2009-12-03 エヌエックスピー ビー ヴィ Adaptation of load line

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JPH07141414A (en) * 1993-11-15 1995-06-02 Fujitsu Ltd Method for deciding parameter of equivalent circuit of active element
KR20040037674A (en) * 2002-10-29 2004-05-07 엘지전자 주식회사 Impedance matching method of rf apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009543499A (en) 2006-07-12 2009-12-03 エヌエックスピー ビー ヴィ Adaptation of load line

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11411656B2 (en) 2019-11-05 2022-08-09 Electronics And Telecommunications Research Institute Impedance correcting method and apparatus, and impedance-corrected signal line for optical transceiver

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