KR102002384B1 - Apparatus and method for analysising laser speckle pattern - Google Patents

Abstract

According to an embodiment of the present invention, there is provided a laser processing apparatus including a laser unit for generating a laser through a laser light source and irradiating the generated laser to an object to be tested, a speckle pattern image of the object to be tested formed by the laser, And a communication unit for transmitting the speckle pattern image stored in the storage unit to the pattern analysis unit, wherein the communication unit includes a camera unit for taking an image at an imaging time and a number of frames per second, and a storage unit for storing the picked speckle pattern image, And a pattern analyzing unit for receiving the speckle pattern image transmitted by the communication unit and analyzing a speckle pattern change and a complexity of the speckle pattern image by controlling the operation of the laser unit and the camera unit, And a method for analyzing a laser speckle pattern.

Description

[0001] APPARATUS AND METHOD FOR ANALYSISING LASER SPECKLE PATTERN [0002]

 The present invention relates to a laser speckle pattern analyzing apparatus and method for analyzing a variation and complexity of a speckle pattern image generated as a laser is irradiated on an object to be tested.

 The laser speckle pattern analysis technique, which is a background technology of the present invention, has recently been evaluated as a technology having a great potential. The speckle pattern is a pattern of a grain pattern formed by the reflected light when a light or laser having coherence is irradiated on the object to be tested.

 The laser speckle pattern is imaged and the statistical characteristics of the pattern are analyzed to obtain various information about the object to be tested, and it is expected to be utilized in fields such as medical diagnostic apparatuses.

 Despite the prospect of this laser speckle pattern analysis technology, the actual use in the field is insufficient because the existing laser speckle pattern analyzer or system is mostly large-sized. Therefore, if the laser speckle pattern analyzer is aimed at commercialization, the miniaturization of the laser speckle pattern analyzer is a prerequisite.

 The background technology of the present invention is disclosed in Korean Patent Laid-Open Publication No. 10-2017-0099692.

 It is an object of the present invention to provide a laser speckle pattern analyzing apparatus and method for analyzing a variation and a complexity of a speckle pattern image generated as a laser is irradiated on an object to be tested do.

 In addition, the present invention intends to integrate components for analyzing a laser speckle pattern into a single apparatus, and accordingly, a laser speckle pattern analyzing apparatus and method capable of not only downsizing but also dramatically improving its utilization and functions And to provide the above objects.

 It should be understood, however, that the technical scope of the embodiments of the present invention is not limited to the above-described technical problems, and other technical problems may exist.

 According to an aspect of the present invention, there is provided an apparatus for analyzing a laser speckle pattern, comprising: a laser unit for generating a laser through a laser light source and irradiating the generated laser to an object to be tested; A camera unit for picking up a speckle pattern image of the test object formed by the irradiated laser at a predetermined imaging time and a frame rate per second; and a storage unit for storing the picked speckle pattern image, And a communication unit for transmitting the stored speckle pattern image to the pattern analysis unit, wherein the control unit controls the operation of the laser unit and the camera unit by generating a control signal, and receives the speckle pattern image transmitted by the communication unit A pattern analyzing unit for analyzing a speckle pattern change and a complexity of the speckle pattern image, It can be included.

 According to an embodiment of the present invention, the plurality of laser light sources may be provided, and the plurality of laser light sources may generate laser of different colors.

 According to an embodiment of the present invention, the plurality of laser light sources may include a first laser light source for generating a white laser, a second laser light source for generating a red laser, and a third laser light source for generating a blue laser have.

 According to an embodiment of the present invention, the second and third laser light sources may be arranged at an angle with respect to the first laser light source.

 According to an embodiment of the present invention, the predetermined angle may be 15 to 30 degrees.

 According to one embodiment of the present invention, the laser speckle pattern analyzing apparatus may further include a frame provided to surround the laser section, the camera section, and the control section.

 According to one embodiment of the present invention, the laser speckle pattern analyzing apparatus further includes a test object arrangement unit coupled to the frame, wherein the test object arrangement unit arranges the test object in an area irradiated with the laser and an imaging area of the camera unit can do.

 According to one embodiment of the present application, the frame may include an operation unit for generating the control signal, and a display unit for displaying the states of the laser unit, the camera unit, and the control unit.

 According to one embodiment of the invention, the laser may be at least one of a low power laser, a He-Ne laser, and a semiconductor laser.

 According to one embodiment of the invention, a laser may be used in which the imaging time is 2 seconds and the number of frames per second is 20 fps.

 According to an embodiment of the present invention, a method of analyzing a speckle pattern of an object to be tested using a laser generates a laser through a laser light source provided in a laser unit according to a control signal of a control unit, Capturing the speckle pattern image of the object to be tested formed by the irradiated laser with a predetermined imaging time and a frame rate per second by the camera, storing the captured speckle pattern image, Unit, the communication unit transmits the speckle pattern image stored in the storage unit to the pattern analysis unit, and the pattern analysis unit receives the speckle pattern image transmitted by the communication unit, And analyzing the speckle pattern variation and complexity of the image.

 According to an embodiment of the present invention, the plurality of laser light sources may be provided, and the plurality of laser light sources may generate laser of different colors.

According to an embodiment of the present invention, the step of capturing the speckle pattern image of the test object formed by the irradiated laser at the predetermined imaging time and the number of frames per second includes the step of irradiating the first region irradiated by the first laser light source Capturing an image of a second region, which is an internal region of the object to be examined which is irradiated by the second laser light source, and a second region, which is irradiated by the third laser light source, , And a third region, which is the first region.

 According to an embodiment of the present invention, there is provided a laser processing apparatus including a frame provided to surround the laser unit, a camera unit, and a control unit, and a frame provided to be inserted into or removed from the frame, Further comprising a test object arrangement unit for causing a target object to be disposed, wherein the frame includes an operation unit for generating the control signal, and a display unit for displaying the statuses of the laser unit, the camera unit, and the control unit, A method for analyzing a speckle pattern using a laser, the method comprising: arranging the object to be tested in the imaging area through the object arrangement unit to be tested, operating the operation unit to generate the control signal, And displaying the state of the laser unit, the camera unit, and the control unit.

The above-described task solution is merely exemplary and should not be construed as limiting the present disclosure. In addition to the exemplary embodiments described above, there may be additional embodiments in the drawings and the detailed description of the invention.

According to the present invention, it is possible to provide a laser speckle pattern analyzing apparatus and method for analyzing a variation and a complexity of a speckle pattern image generated as a laser is irradiated on an object to be tested.

In addition, it is possible to provide a device and a method for analyzing a laser speckle pattern by integrating components for analyzing a laser speckle pattern into a single device, thereby miniaturizing the device, and improving its utilization and function.

1 is a block diagram showing a configuration of an apparatus for analyzing a laser speckle according to an embodiment of the present invention.
2 is an enlarged view showing an enlarged configuration of the laser unit of the present invention.
FIG. 3 is a side view illustrating a side of a laser speckle pattern analyzing apparatus according to an embodiment of the present invention.
FIG. 4 is a view showing a schematic shape of a laser speckle pattern analyzing apparatus according to an embodiment of the present invention.
FIG. 5 is a block diagram showing a configuration of a laser speckle pattern analyzing apparatus according to an embodiment of the present invention.
6 is a flowchart illustrating a method of analyzing a laser speckle pattern according to an exemplary embodiment of the present invention.
7 is a flowchart illustrating a method of analyzing a laser speckle pattern according to an exemplary embodiment of the present invention.

 Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art can easily carry out the present invention. It should be understood, however, that the present invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. In the drawings, the same reference numbers are used throughout the specification to refer to the same or like parts.

 Throughout this specification, when a part is referred to as being "connected" to another part, it is not limited to a case where it is "directly connected" but also includes the case where it is "electrically connected" do.

 It will be appreciated that throughout the specification it will be understood that when a member is located on another member "top", "top", "under", "bottom" But also the case where there is another member between the two members as well as the case where they are in contact with each other.

 Throughout this specification, when an element is referred to as "including " an element, it is understood that the element may include other elements as well, without departing from the other elements unless specifically stated otherwise.

 FIG. 1 is a block diagram showing a configuration of an apparatus 1000 for analyzing a laser speckle according to an embodiment of the present invention, and FIG. 2 is an enlarged view of a configuration of a laser unit 100.

 Referring to FIG. 1, the laser speckle pattern analyzer 1000 may include a laser unit 100, a camera unit 200, a controller 300, and a pattern analyzer 400.

 The laser unit 100 has a function of projecting a coherent laser beam to the test object 650. The laser unit 100 generates a laser beam 150 through a laser beam source and outputs the generated laser beam 150 to a test object 650).

 Laser 150 refers to light amplified by inductive emission or a device emitting such light, which can be classified as a solid laser, a liquid laser, and a gas laser, depending on the active medium. Solid-state lasers include semiconductor lasers, Nd: YAG lasers, Ti: spphire lasers, and fiber optic lasers. Liquid lasers include dye lasers. Gas lasers include helium- A carbon dioxide laser, and an excimer laser.

 Depending on the wavelength band of light, it can be classified into an infrared laser, a visible laser, an ultraviolet laser, and an X-ray laser.

 The infrared laser includes an infrared fiber laser, a carbon dioxide laser, an endian-yag laser, a titanium-sapphire laser, and a semiconductor laser emitting infrared rays. The visible laser has a helium-neon laser, a semiconductor laser of red, green, blue, The laser is an excimer laser. There is also a pulsed laser with pulses of light, and a continuous wave (CW) laser. The present application can utilize various kinds of lasers as described above.

 A plurality of laser light sources of the laser unit 100 may be provided, and a plurality of laser light sources may generate laser of different colors.

 2, the plurality of laser light sources provided in the laser unit 100 includes a first laser light source 110 for generating a white laser 152, a second laser light source 120 for generating a red laser 154 ), And a third laser light source 130 for generating a blue laser 156.

 The second laser light source 120 and the third laser light source 130 may be arranged at an angle of 140 with the first laser light source 110 as a center. For example, if the first laser light source 110 irradiates the white laser 152 in a direction perpendicular to the object 650 to be tested, as shown in FIG. 2, The light source 130 may irradiate the red laser 154 and the blue laser 156, respectively, while being tilted at a predetermined angle with respect to the object 650 to be tested.

 The predetermined angle 140 of the second laser light source 120 and the third laser light source 130 disposed at the center of the first laser light source 110 may be 15 to 30 degrees.

 The white laser 152 generated by the first laser light source 110 is a laser for obtaining general image information of the object 650 to be tested and may be disposed in parallel with the camera unit 200 described below. Since the red laser 154 generated by the second laser light source 120 is a laser of a relatively longer wavelength band than the laser of the other color, it can be deeply penetrated into the object 650 to be tested, The image information inside the target object can be obtained. Since the blue laser 156 generated by the third laser light source 130 is a laser 150 of a relatively shorter wavelength range than the laser 150 of the other colors, Surface image information can be obtained. Accordingly, it may be possible to acquire all the image information on the inside and the surface of the test object by using the second laser light source 120 and the third laser light source 130 together.

 Referring to FIG. 1, the camera unit 200 can capture a speckle pattern image 900 of a test object formed by irradiated laser 150 at a predetermined imaging time and a frame rate per second. In other words, the camera unit 200 functions to collect the speckle signal reflected therefrom and convert it to an electrical signal after the test object is irradiated by the laser 150 generated from the laser unit 100 .

 The camera unit 200 may be a CCD camera and / or a color CCD camera. [0003] A charge-coupled device camera (CCD) is one type of digital camera, which uses a charge coupled device (CCD) to convert an image into an electrical signal and stores the digital data in a storage medium such as a flash memory.

 The camera unit 200 may be disposed so as to be spaced from the test object 650 by about 3 to 5 cm. The speckle pattern image 900 picked up by the camera unit 200 is stored in the storage unit 310 of the control unit 300 to be described below and transmitted to the communication unit 320 operating in accordance with the control signal of the control unit 300 To the pattern analyzer 400, which will be described below.

 Referring to FIG. 1, the controller 300 controls the operation of the laser unit 100 and the camera unit 200 by generating a control signal. For example, the controller 300 controls the position of the laser unit 100, (Number of images, number of images, exposure time control, etc.) of the camera unit 200 and / or position conversion operation (interval between the camera and the object to be tested) Control, etc.).

 The control unit 300 includes a storage unit 310 for storing a speckle pattern image 900 captured by the camera unit 200 and a speckle pattern image 900 stored in the storage unit 310 And a communication unit 320 for transmitting the pattern data to the pattern analyzing unit 400.

 5, the pattern analyzer 400 and the communication unit 320 may communicate with each other in a wired or wireless manner. Examples of the wireless communication scheme 322 include a 3rd Generation Partnership Project (3GPP) network, an LTE A Wide Area Network (WAN), a Personal Area Network (PAN), a Personal Area Network (LAN) network, a 5G network, a World Interoperability for Microwave Access (WIMAX) network, (Digital Multimedia Broadcasting), PCS (Personal Communication System), GSM (Global System for Mobile communication), PDC (Personal Digital Network), Bluetooth Cellular, PHS (Personal Handyphone System), PDA (Personal Digital Assistant), IMT (International Mobile Telecommunication) -2000, CDMA (Code Division Multiple Access) -2000, W-Code Division Multiple Access (W-CDMA) Wireless Broadband Internet) terminal, And may include any type of wireless communication 322 such as a smart phone, a smart pad, a tablet PC, a smart TV, and the like. In addition, the control unit 300 may further include a power connection port (for example, 5 V).

 1 and 5, the pattern analyzing unit 400 receives the speckle pattern image 900 transmitted by the communication unit 320, and detects a change in the speckle pattern of the speckle pattern image 900 The complexity can be analyzed. In other words, the pattern analyzing unit 400 performs a function of evaluating a change of the test object 650 by analyzing the speckle pattern image 900 transmitted through the communication unit 320, A laptop, a laptop, a desktop computer, and / or the like. The pattern analyzer 400 analyzes the speckle pattern image 900 according to a predetermined algorithm and / or mathematical expression to calculate a statistical result. The laser speckle pattern analyzer 1000 according to one embodiment of the present invention can be utilized for nondestructive analysis of materials, cell activity analysis, skin characteristic analysis, blood flow analysis, and non-destructive surface sugar content analysis.

 Hereinafter, a method of analyzing the speckle pattern image 900 by the pattern analyzing unit 400 will be described. First, the structure of the laser speckle pattern generated by the interference of light can be changed according to the space between the camera and the test object 650, the exposure time, the angle of light, the particle velocity, the surface roughness, and the structure of the material . This means that an analysis of the speckle pattern can provide much information about the object 650 to be tested.

The particle velocity, the vibration characteristic, and the dynamic information on the action element of the test object 650 may be provided according to a temporal-statistical analysis of the speckle pattern of the pattern analyzer 400. [ For example, in the blood flow test, blurring occurs in the speckle pattern image 900 according to the degree of blood movement in the imaging region. As the motion of the blood increases, the blurring increases. Conversely, The smaller the movement, the smaller the blurring. In addition, the blurring level of the speckle pattern can be quantified through the Speckle Contrast described below, thus allowing blood flow measurement.

According to one embodiment of the present invention, after the pattern analyzing unit 400 receives the speckle pattern images 900 captured by the camera unit 200 through the communication unit 320, the pattern analyzing unit 400 After arranging the received speckle pattern images 900, the speckle pattern image 900 may be analyzed through predetermined information processing processing. For example, Speckle Intensity of the speckle pattern image 900 acquired by the object to be tested 650 is extracted, and a Speckle Intensity of the speckle pattern image 900 is calculated using the Fourier Transform (FT) Density (PSD).

는 시험대상객체(650) 촬상영역의 스펙클 강도(Speckle Intensity)를 의미한다. 여기서, x는 촬상된 스펙클 패턴 이미지(900)의 제 1 방향에 배열된 시험대상객체의 픽셀의 수이며, y는 상기 제 1 방향의 수직한 방향인 제 2 방향에 배열된 시험대상객체의 픽셀의 수이다. 상술한 바와 같이 상기 스펙클 강도

를 푸리에 트랜스폼(Furier Transform, FT)하여 파워 스펙트럼 밀도 함수(Power Spectral Density, PSD)로 변환시킬 수 있다. 여기서 파워 스펙트럼 밀도 함수란 파형 분석에 있어서 분석 구간이 무한대인 경우, 푸리에 변환을 통하여 구한 단위 주파수 당 에너지 분포를 의미한다. 다시 말해, 어떤 주파수 변동이 강하고, 약한 지를 산출해낼 수 있는 함수인 것이다. 나아가 상기 파워 스펙트럼 밀도 함수(PSD)를 토대로 하기의 수학식 2에 따라 시험대상객체의 픽셀 간 자기상관함수(Auto-Correlation)를 산출해낼 수 있다.In Equation (1)

Refers to the Speckle Intensity of the imaging region of the object 650 to be tested. Where x is the number of pixels of the test object arranged in the first direction of the captured speckle pattern image 900 and y is the number of pixels of the test object arranged in the second direction which is the vertical direction of the first direction The number of pixels. As described above, the speckle strength

Can be converted into a power spectral density (PSD) by Fourier Transform (FT). Here, the power spectral density function means the energy distribution per unit frequency obtained by Fourier transform when the analysis interval is infinite in the waveform analysis. In other words, it is a function that can calculate some frequency fluctuations strong and weak. Furthermore, an auto-correlation function between pixels of the test object can be calculated based on the power spectral density function (PSD) according to the following equation (2).

은 시험대상객체의 픽셀 간 자기상관함수(Auto-Correlation)을 의미하며, 이는 확률적으로 변동하는 양인 스펙클 강도

에 대해서 시각 t1, t2에서의 관측값

,

의 곱의 평균값

을 말한다. 변동이 정상적이면 이것은 t=t1-t2만큼의 함수가 되며, 자기상관함수와 파워 스펙트럼 밀도 함수는 서로 푸리에 변환으로 맺어진다. here,

Correlation function (Auto-Correlation) between the pixels of the object under test, which is a stochastic fluctuating amount of speckle intensity

At time t1 and t2,

,

≪ / RTI >

. If the variation is normal, this is a function of t = t1-t2, and the autocorrelation function and the power spectral density function are formed by Fourier transform.

 Fractal refers to a geometric structure having a self-similarity in that a simple structure is repeatedly formed to form a complex and strange whole structure. The pattern analysis unit 400 has a self-similarity Various parameters can be extracted from the speckle pattern image 900 based on the characteristic of the speckle pattern having the shape of a decimal number and the size of the speckle is calculated in order to calculate the size Dx of the speckle. Difference-Autocorrelation function to Fractal theory may be used.

 Where x is the number of pixels of the test object arranged in the first direction of the captured speckle pattern image 900 and y is the number of pixels of the test object arranged in the second direction which is the vertical direction of the first direction The number of pixels. In addition, the function I for x, y means a Speckle Intensity function.

는 상관 길이(Correlation Length)를 의미하며, H는 허스트 계수(Hurst coefficient/exponent).Where x is the number of pixels of the test object arranged in the first direction of the captured speckle pattern image 900 and y is the number of pixels of the test object arranged in the second direction which is the vertical direction of the first direction The number of pixels. In addition, the function I for x and y means a Speckle Intensity function,

Denotes a correlation length, and H denotes a Hurst coefficient / exponent.

)를 수학식 5를 통하여 산출해낼 수 있다.In addition, the pattern analyzing unit 400 analyzes the surface structure of the speckle pattern (

) Can be calculated through Equation (5).

는 시험대상객체 표면에 있는 산란체의 크기(Size of surface scatterer)이고,

는 상관 길이(Correlation Length)를 의미하며, Z < Zc의 경우,(Z는 원 구조의 표면에 있는 산란체의 크기) 스펙클 패턴은 원 구조(source structure)에 대응하여 밀접한 연관성을 나타낸다고 판단할 수 있으며, 쌍상관함수(Pair correlation function)와 특성 크기(Characteristic size)는 스펙클 패턴에 의해 유도될 수 있다. Z > Zc의 경우, 원 구조와의 연관성에 관한 정보가 회복될 수 없음을 나타낸다고 판단할 수 있다.here,

Is the size of the surface scatterer on the object surface,

Is the correlation length, and Z <Zc, where Z is the size of the scattering body on the surface of the circular structure, and the speckle pattern is closely related to the source structure And the pair correlation function and the characteristic size can be derived by the speckle pattern. In the case of Z > Zc, it can be judged that the information on the association with the original structure can not be recovered.

을 활용하여 계산하여 하기의 수학식 6과 수학식 7을 통해 실효값(RMS, Root Mean Square)값과 평균치(Average)를 산출해내고, 이 값들을 수학식 8에 대입함으로써, 최종적으로 스펙클 콘트라스트(Speckle contrast)를 얻을 수 있다.The model of the movement of the speckle can be obtained by moving the pixel of the speckled pattern value in the first direction at the speed of v. The pattern intensity (MA) and the area 'i = Nu-DN, j = Nu-DN'

(Root Mean Square) value and an average value (Average) through the following Equations (6) and (7), and substituting these values into Equation (8) Speckle contrast can be obtained.

 The blurring level of the speckle pattern can be quantified through the speckle contrast. For example, because the specular contrast has a correlation with blood flow velocity, blood flow measurement may be possible.

 FIG. 3 is a side view of a laser speckle pattern analyzing apparatus 1000 according to an embodiment of the present invention. FIG. 4 is a side view of a laser speckle pattern analyzing apparatus 1000 according to an embodiment of the present invention. Fig.

 3 and 4, a laser speckle analyzer 1000 according to an exemplary embodiment of the present invention includes a laser unit 100, a camera unit 200, and a frame 500 ). &Lt; / RTI &gt; Accordingly, the laser unit 100, the camera unit 200, and the control unit 300 may be disposed inside the frame 500. The shape and material of the frame 500 are not limited, but a box-shaped frame, which is an example of the frame 500, will be described for the sake of specific description of the present invention.

 The frame 500 includes an operation unit 510 for causing the control unit 300 to generate a control signal and a display unit 520 for displaying the states of the laser unit 100, the camera unit 200, and the control unit 300 .

The operation unit 510 may be provided to allow the user of the laser speckle analysis apparatus 1000 to perform operations such as laser generation, acquisition and storage of the speckle pattern image 900, and transmission to the pattern analysis unit 400 The shape of the operation unit 510 may include a toggle switch, a slide switch, a push button switch, a rotary switch, a proximity switch, a temperature switch, and a joystick switch type, but is not limited thereto .

 The display unit 520 is for visually displaying the states of the laser unit 100, the camera unit 200 and the control unit 300. The display unit 520 may be a CRT, a PDP LED, an OLED, an AMOLED, a quantum dot, Nixie Tube) display or a light receiving type display such as an LCD and a projector, but the present invention is not limited thereto. For example, the display unit 520 is provided with a plurality of LED lamps, and the state of the laser unit 100, the camera unit 200, and the control unit 300 can be externally displayed by lighting / have.

Referring to FIGS. 3 and 4, for easy placement of the object 650 to be tested, the object to be tested 650 is coupled to the frame 500, And a test object arrangement unit 600 in which the test object arrangement unit 650 is disposed. The test object arrangement unit 600 includes a test object case 620 coupled to the frame 500, a test object insertion unit 610 that can be inserted or removed in the test object case 620, And a grip portion 630 for facilitating insertion and removal of the test object placing portion 600 into the frame 500 with the user's hand. At this time, the handle 630 is coupled to the test object insertion unit 610 and is formed in the shape of a normal handle so that the user grips the handle 630 and inserts the test object insertion unit 610 into the test object case 620 Or can be inserted / removed inside the object case 620 to be tested.

The test object case 620 may be provided in a hollow box shape coupled to a lower portion of the frame 500, but is not limited thereto. Although not shown in the figure, when the test object insertion portion 610 is inserted into the frame 500, the upper surface of the test object case 620, which is the surface facing the camera portion 200, An opening (not shown) for exposing the object 650 to the outside can be formed.

 The test object inserting unit 610 may be provided in a plate shape or may include a test object plate 640 on which the test object 650 is disposed. The test object insertion unit 610 may be inserted into the test object case 620 through a side end portion of the test object case 620 or may be inserted into the test object case 620 or may be inserted and removed from the test object case 620. For example, for easy insertion and removal, the object to be tested 610 may be provided with rails on the object case 620 to be inserted and / or inserted in a sliding manner, It is not limited.

 The laser 150 generated through the laser light source of the laser unit 100 may use at least one of a low power laser, a He-Ne laser, and a semiconductor laser. The He-Ne laser is a continuous oscillation laser which uses a glow discharge of a helium or neon mixed gas as an amplification medium. The He-Ne laser oscillates at the spectrum line of neon. The semiconductor laser is a semiconductor device that generates a laser. As a light source. The laser 150 that can be generated through the laser light source of the present invention is not limited thereto.

 The imaging time of the camera unit 300 may be adjusted to 2 seconds and the number of frames per second may be adjusted to 20 fps in accordance with the control signal of the control unit 300 in order to increase the reliability of the laser speckle pattern analysis process and /

 5 is a block diagram showing a configuration of an apparatus 1000 for analyzing a laser speckle pattern according to an embodiment of the present invention. 5, the pattern analyzer 400 may be remotely configured and receives the speckle pattern image 900 from the communication unit 320 of the controller 300 using a wireless communication method 322, Pattern changes and complexity can be analyzed. According to another embodiment of the present invention, the pattern analyzing unit 400 may be provided in a form enclosed in the frame 500, that is, in the frame 500. In this case, the pattern analyzing unit 400 may be a simple wired communication method The speckle pattern image 900 can be received from the communication unit 320 of the control unit 300 to analyze the change of the speckle pattern and the complexity.

 Hereinafter, a method of analyzing a laser speckle pattern according to an embodiment of the present invention will be described with reference to FIGS. 6 and 7. FIG.

FIG. 6 is a flowchart illustrating a method of analyzing a laser speckle pattern according to an exemplary embodiment of the present invention, and FIG. 7 is a flowchart illustrating a method of analyzing a laser speckle pattern according to another exemplary embodiment of the present invention.

 A method of analyzing a speckle pattern of an object to be tested using a laser according to an embodiment of the present invention is a method of analyzing a speckle pattern of a test object using a laser 150 through a laser light source provided in the laser unit 100, (S100) of irradiating the generated laser (150) to the test object (650), generating a speckle pattern image (900) of the test object (650) formed by the irradiated laser (150) (S300) of storing the captured speckle pattern image (900) in the storage unit (310), a step (S300) of taking the captured speckle pattern image (900) (S400) of transmitting the speckle pattern image 900 stored in the communication unit 320 to the pattern analyzing unit 400 and the pattern analyzing unit 400 transmitting the speckle pattern image 900 stored in the communication unit 320 Receiving the speckle pattern image 900 and generating a speckle of the speckle pattern image 900 The turn change and complexity may include a step (S500) of analyzing.

 According to another embodiment of the present invention, a plurality of the laser light sources may be provided, and the plurality of laser light sources may generate laser of different colors.

 According to another embodiment of the present invention, the plurality of laser light sources include a first laser light source 110 for generating a white laser 152, a second laser light source 120 for generating a red laser 154, And a third laser light source 130 for generating a laser 156.

The second laser light source 120 and the third laser light source 130 may be inclined at a predetermined angle 140 with the first laser light source 110 as a center. (140) may be formed at 15 to 30 degrees.

 In step S100, the test object 650 to which the laser 150 is irradiated is a sample used for cell activity, skin characteristics, blood flow characteristics, and epidermal saccharification, such as a human body part and / or an animal body part . It may also include, but is not limited to, a portion of the pressure pipe, a portion of the aircraft composite structural member, or a portion of the internal structural member of the tire, which may be subjected to nondestructive inspection.

 In step S100, the control unit 300 may generate a control signal to control the operation of the laser unit 100. [ For example, it is possible to control the position conversion control of the laser part 100, whether or not to emit light, the wavelength correction of the light source, and the degree of exposure.

 In step S200, the control unit 300 generates a control signal to control the operation of the camera unit 200. [ For example, it is possible to control the shooting format of the camera unit 200, the number of shot images, the exposure time, and the distance between the camera lens and the test object 650.

 A storage unit 310 for storing the speckle pattern image 900 captured by the camera unit 200 and a communication unit for transmitting the stored speckle pattern image 900 to the pattern analysis unit 400 in steps S300 and S400 The unit 320 is included in the control unit 300. The pattern analyzing unit 400 and the communication unit 320 can communicate in a wired or wireless manner, and examples of the wireless communication 322 method are as described above.

 According to an embodiment of the present invention, the step (S200) of capturing the speckle pattern image 900 of the test object formed by the irradiated laser 150 at a predetermined imaging time and frame number per second includes: Capturing a first region irradiated by the laser light source 110, imaging a second region, which is an internal region of the object to be tested, irradiated by the second laser light source 120, 3, which is a surface area of the object to be tested, which is irradiated by the laser light source 130. [

 According to an embodiment of the present invention, a frame 500 enclosing the laser unit 100, the camera unit 200, and the control unit 300 is provided. The frame 500 is inserted into or removed from the frame 500, Further comprising a test object arrangement unit (600) for arranging the test object (650) in an area irradiated with the laser (150) and an imaging area of the camera unit (200) An operation unit 510 for generating the control signal and a display unit 520 for displaying the states of the laser unit 100, the camera unit 200 and the control unit 300, The method for analyzing a speckle pattern includes the steps of disposing the test object 650 in the sensing area through the test object arrangement unit 600 in operation S600, (S700), and the display unit (520) 100, the camera unit 200, and the control unit 300 (S800).

  Hereinafter, the operation of the laser speckle pattern analyzing apparatus according to one embodiment of the present invention will be described.

 First, the test object 650 to be analyzed is placed on the test object plate 640. The test object 650 may be, for example, a living tissue as described above. Thereafter, the user can grip the grip 630 coupled to the test object inserting unit 610 and insert the test object inserting unit 610 into the test object case 620. When the test object insertion unit 610 is inserted into the test object case 620, the test object 650 can be exposed through an opening (not shown) formed in the upper portion of the test object case 620 .

The user may supply power to the laser unit 100 and / or the camera unit 200 and may drive the pattern analysis unit 400 through software installed in the frame 500 or installed in an external computer or the like . The display unit 520 of the frame 500 may be, for example, an LED lamp having three colors. In this embodiment, it is assumed that the display unit 520 is a red, a yellow, and a green lamp, respectively . In this case, when the user turns on the power of the laser unit 100 and / or the camera unit 200, the red lamp and the green lamp may be turned on together. The red lamp may indicate that the laser unit 100 is turned on, and the green lamp may indicate that the camera unit 200 is turned on.

 In addition, the user can drive the laser unit 100 and / or the camera unit 200 through the operation unit 510 of the frame 500. [ Furthermore, it is possible to remotely drive the laser unit 100 and / or the camera unit 200 through a user interface and / or software installed in the pattern analyzer 400. The laser unit 100 and the camera unit 200 are connected to the pattern analysis unit 400 through the wired / wireless communication of the communication unit 320 included in the control unit 300. Accordingly, the pattern analysis unit 400 The driving of the laser unit 100 and the camera unit 200 can be controlled.

 Accordingly, the user can change the position of the laser unit 100 and the laser oscillation condition using the operation unit 510 or the pattern analysis unit 400 according to the type and position of the test object 650, 200 can be changed.

 When the driving of the laser unit 100 and / or the camera unit 200 is started, the laser unit 100 irradiates the object 150 with the laser 150. For example, the white laser 152, the red laser 154, and the blue laser 156 can be irradiated with the laser in a time-wise manner. When the laser 150 is irradiated, a speckle pattern image 900 is obtained on the test object 650, and the image can be acquired through the camera unit 200 for a specific time. In the camera unit 200, the acquired speckle pattern image 900 may be subjected to image processing, and a known method may be utilized as the image processing method. Meanwhile, during the image acquisition, a yellow lamp may be turned on in the display unit 520 of the frame 500, and when the image acquisition is completed, the yellow lamp may be flashed and the green lamp may be turned on again.

 The obtained speckle pattern image 900 may be stored in the storage unit 310 included in the control unit 300 and transmitted to the pattern analysis unit 400 through the communication unit 320. The pattern analyzing unit 400 may receive the speckle pattern images 900 and perform an analysis operation. The analysis task may be to evaluate an object to be tested by calculating an autocorrelation function between speckle pattern images 900 and then calculating the change and complexity of the speckle pattern using fractal theory, May include a task of statistically quantifying the change and complexity of the speckle pattern and processing the data into the data desired by the user again.

It will be understood by those of ordinary skill in the art that the foregoing description of the embodiments is for illustrative purposes and that those skilled in the art can easily modify the invention without departing from the spirit or essential characteristics thereof. It is therefore to be understood that the above-described embodiments are illustrative in all aspects and not restrictive. For example, each component described as a single entity may be distributed and implemented, and components described as being distributed may also be implemented in a combined form.

The scope of the present invention is defined by the appended claims rather than the detailed description, and all changes or modifications derived from the meaning and scope of the claims and their equivalents should be interpreted as being included in the scope of the present invention.

100: laser part
200: camera unit
300:
400: pattern analysis unit
500: frame
600: Test object arrangement unit
650: object to be tested
1000: Laser speckle pattern analyzer

Claims (19)

A laser unit for generating a laser through a laser light source and irradiating the generated laser to the object to be tested;
A camera unit for picking up a speckle pattern image of the test object formed by the irradiated laser at a predetermined imaging time and a number of frames per second;
And a storage unit for storing the captured speckle pattern image,
And a communication unit for transmitting the speckle pattern image stored in the storage unit to the pattern analysis unit,
A control unit for generating a control signal and controlling operations of the laser unit and the camera unit; And
And a pattern analyzing unit receiving the speckle pattern image transmitted by the communication unit and analyzing a speckle pattern change and a complexity of the speckle pattern image,
Wherein the object to be tested includes a sample used for blood flow characteristic analysis,
Wherein the control unit controls the control unit in accordance with at least one of a control signal associated with at least one of a position change of the laser unit, a light emission state, a wavelength of a light source, and an exposure degree, a photographing format of the camera unit, And a control signal for an interval between the test object and the object to be tested,
The pattern analyzing unit may quantify a blurring level of a speckle pattern through Speckle Contrast for the speckle pattern image and calculate a blurring level of blood flow of the test object based on the quantified blurring level Wherein the speckle pattern analyzer is configured to measure the speckle pattern using the laser. The method according to claim 1,
A plurality of laser light sources are provided,
Wherein the plurality of laser light sources generate laser beams of different colors, respectively. 3. The method of claim 2,
Wherein the plurality of laser light sources comprises:
A first laser light source for generating a white laser,
A second laser light source for generating a red laser, and
And a third laser light source for generating a blue laser. The method of claim 3,
Wherein the second and third laser light sources are arranged while being inclined at a predetermined angle with the first laser light source as a center. 5. The method of claim 4,
Wherein the predetermined angle is 15 to 30 degrees. 6. The method according to any one of claims 1 to 5,
And a frame provided to surround the laser unit, the camera unit, and the control unit. The method according to claim 6,
And a test object arrangement unit coupled to the frame and configured to arrange the test object in an area irradiated with the laser and an image sensing area in the camera unit. 8. The method of claim 7,
The frame includes:
An operation unit for generating the control signal, and
And a display unit for displaying states of the laser unit, the camera unit, and the control unit. The method according to claim 6,
Wherein the laser is at least one of a low power laser, a He-Ne laser, and a semiconductor laser. The method according to claim 6,
Wherein the image capturing time is 2 seconds and the number of frames per second is 20 fps. A method for analyzing a speckle pattern of a test object using a laser,
Generating a laser through a laser light source provided in the laser unit according to a control signal of the control unit and irradiating the generated laser to the object to be tested;
Capturing a speckle pattern image of the test object formed by the irradiated laser at a predetermined imaging time and a number of frames per second by a camera;
Storing the captured speckle pattern image in a storage unit;
Transmitting a speckle pattern image stored in the storage unit to a pattern analyzer by a communication unit; And
The pattern analyzing unit receiving the speckle pattern image transmitted by the communication unit and analyzing a speckle pattern change and a complexity of the speckle pattern image,
Wherein the object to be tested includes a sample used for blood flow characteristic analysis,
Wherein the control unit controls the control unit in accordance with at least one of a control signal associated with at least one of a position change of the laser unit, a light emission state, a wavelength of a light source, and an exposure degree, a photographing format of the camera unit, And a control signal for an interval between the test object and the object to be tested,
The step of analyzing a speckle pattern change and a complexity of the speckle pattern image includes analyzing a blurring level of a speckle pattern through Speckle Contrast for the speckle pattern image, And the blood flow of the test object is measured based on the blurring level. 12. The method of claim 11,
A plurality of laser light sources are provided,
Wherein the plurality of laser light sources generate laser of different colors. 13. The method of claim 12,
Wherein the plurality of laser light sources comprises:
A first laser light source for generating a white laser,
A second laser light source for generating a red laser, and
And a third laser light source for generating a blue laser. 14. The method of claim 13,
Wherein the second and third laser light sources are arranged while being inclined at a predetermined angle with the first laser light source as a center. 15. The method of claim 14,
Wherein the step of capturing the speckle pattern image of the test object formed by the irradiated laser at the predetermined imaging time and the number of frames per second includes:
The first area being an area irradiated by the first laser light source, the area including at least a part of an inner area of the test object or at least a part of an outer area of the test object,
Imaging a second region, which is an interior region of the object to be tested, irradiated by the second laser light source; and
And a third region, which is a surface region of the test object, which is irradiated by the third laser light source. 15. The method of claim 14,
Wherein the predetermined angle is 15 to 30 degrees. 17. The method according to any one of claims 11 to 16,
A frame provided to surround the laser unit, the camera unit, and the control unit;
Further comprising a test object arrangement unit which is arranged to be inserted into or removed from the frame and in which the test object is arranged in an area irradiated with the laser and an image sensing area of the camera unit,
The frame comprising an operation unit for generating the control signal, and
And a display unit for displaying states of the laser unit, the camera unit, and the control unit,
The method of analyzing a speckle pattern using the laser,
Disposing the test object in the image sensing area through the test object arrangement unit;
Operating the operation unit to generate the control signal; And
And displaying the state of the laser unit, the camera unit, and the control unit, wherein the display unit displays the state of the laser unit, the camera unit, and the control unit. 18. The method of claim 17,
Wherein the laser is at least one of a low power laser, a He-Ne laser, and a semiconductor laser. 19. The method of claim 18,
Wherein the imaging time is 2 seconds and the number of frames per second is 20 fps.

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