KR101955766B1 - Composition for antireflection film, antireflection film prepared from the same, polarizing plate comprising the same and optical display apparatus comprising the same - Google Patents

Composition for antireflection film, antireflection film prepared from the same, polarizing plate comprising the same and optical display apparatus comprising the same Download PDF

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KR101955766B1
KR101955766B1 KR1020160125152A KR20160125152A KR101955766B1 KR 101955766 B1 KR101955766 B1 KR 101955766B1 KR 1020160125152 A KR1020160125152 A KR 1020160125152A KR 20160125152 A KR20160125152 A KR 20160125152A KR 101955766 B1 KR101955766 B1 KR 101955766B1
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refractive index
antireflection film
layer
compound
composition
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조성흔
박세현
오부근
임형태
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삼성에스디아이 주식회사
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    • G02F1/1335Structural association of cells with optical devices, e.g. polarisers or reflectors
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    • G02OPTICS
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    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1335Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133528Polarisers
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Abstract

There is provided a composition for an antireflection film comprising a compound of the general formula (1), a compound of the general formula (2), a UV curable compound, an antistatic agent, an initiator and zirconia, an antireflection film formed therefrom, a polarizing plate comprising the same, and an optical display device .

Description

TECHNICAL FIELD [0001] The present invention relates to a composition for an antireflection film, an antireflection film formed therefrom, a polarizing plate comprising the same, and an optical display device including the same. BACKGROUND ART [0002]

The present invention relates to a composition for an antireflection film, an antireflection film formed therefrom, a polarizing plate including the antireflection film, and an optical display device including the same.

The optical display device is used under an environment in which external light is incident. The incidence of external light may deteriorate the screen display quality of the optical display device. Therefore, an anti-reflection film is generally used in an optical display device.

The antireflection film usually has a structure in which a high refractive index layer and a low refractive index layer are repeated on a substrate layer. The antireflection film generally lowers the refractive index of the low refractive layer to lower the reflectance.

On the other hand, since the antireflection film is located outside the optical display device, it preferably has a hard coat function and an antistatic function. Therefore, in recent years, techniques for producing an antireflection film by laminating a high refractive index layer and a low refractive index layer having a hard coat function and an antistatic function on a substrate layer have been developed. However, even if it has a hard coat function and an antistatic function, there is a limit to lowering the reflectance of the antireflection film. There is a method of reducing the reflectance by increasing the refractive index of the high refractive index layer by including inorganic particles in the high refractive index layer. However, there is a limit to lowering the reflectance of the antireflection film, and when the refractive index is lowered by using inorganic hollow particles in the low refractive layer, the refractive index can be sufficiently lowered, but there may be a problem of lowering the surface physical property and increasing the material cost.

The background art of the present invention is disclosed in Korean Patent Publication No. 2015-0135662.

An object of the present invention is to provide a composition for an antireflection film capable of remarkably lowering the minimum reflectance of an antireflection film because of its excellent hard coat function and antistatic function and high refractive index.

Another object of the present invention is to provide a composition for an antireflection film capable of realizing an antireflection film excellent in optical characteristics and excellent in scratch resistance.

Another object of the present invention is to provide an antireflection film excellent in antireflection function, low in reflectance, and excellent in hardness and antistatic function.

The composition for an antireflection film of the present invention may comprise a compound of the following formula 1, a compound of the following formula 2, a UV curable compound, an antistatic agent, an initiator and zirconia:

≪ Formula 1 >

Figure 112016094362779-pat00001

(Wherein m, n and R are as defined in the detailed description of the present invention)

(2)

Figure 112016094362779-pat00002

(Wherein n and R are as defined in the detailed description of the present invention).

In the antireflection film of the present invention, the substrate layer, the high refractive index layer and the low refractive index layer are sequentially laminated, the high refractive index layer has a refractive index higher than that of the low refractive index layer, the antireflection film has a lowest reflectance of 0.5% And the refractive index difference between the low refractive index layer and the low refractive index layer may be 0.26 or more.

The polarizing plate of the present invention may include a polarizer and an antireflection film of the present invention formed on at least one side of the polarizer.

The optical display device of the present invention may include the antireflection film or the polarizing plate of the present invention.

The present invention provides a composition for an antireflection film capable of remarkably lowering the minimum reflectance of an antireflection film because of its excellent hard coat function and antistatic function and high refractive index.

The present invention provides a composition for an antireflection film capable of realizing an antireflection film having excellent optical characteristics and excellent scratch resistance.

The present invention provides an antireflection film excellent in antireflection function and excellent in hardness and antistatic function due to its low reflectance.

1 is a cross-sectional view of an antireflection film according to an embodiment of the present invention.

The present invention will now be described more fully hereinafter with reference to the accompanying drawings, in which preferred embodiments of the invention are shown. The present invention may be embodied in many different forms and is not limited to the embodiments described herein. In order to clearly illustrate the present invention, parts not related to the description are omitted, and the same names are used for the same or similar components throughout the specification.

The terms "upper" and "lower" in this specification are defined with reference to the drawings, wherein "upper" may be changed to "lower", "lower" What is referred to as "on" may include not only superposition, but also intervening other structures in the middle. On the other hand, what is referred to as "directly on" or "directly above"

As used herein, "(meth) acrylic" means acrylic and / or methacrylic.

As used herein, the term "minimum reflectance" refers to a specimen prepared by laminating a CL-885 black acrylic sheet of Nitto resin having a refractive index of 1.46 to 1.50 with a laminate (a pressure-sensitive adhesive and a substrate layer laminated) Means a reflectance meter that measures the wavelength in the range of 320 nm to 800 nm in the reflection mode, and the lowest reflectance measured at a wavelength of 440 nm to 550 nm.

In the present specification, "average reflectance" means that CL-885 black acrylic sheet of Nitto resin having a refractive index of 1.46 to 1.50 is laminated on a base layer side of a laminate of a high refractive index layer and a base layer (laminated with a pressure- The specimen is measured with a reflectance meter in the reflection mode at a wavelength of 320 to 800 nm, and is an average value of the reflectance at a wavelength of 380 nm to 780 nm.

In the present specification, "composition for an antireflection film" may mean "composition for high refractive index layer ".

Hereinafter, the composition for an antireflection film according to an embodiment of the present invention may include a compound represented by the following Chemical Formula 1, a compound represented by Chemical Formula 2, a UV curable compound, an antistatic agent, an initiator, and zirconia.

The composition for an antireflection film of this example can form a high-refraction layer in an antireflection film in which a base layer, a high refractive index layer and a low refractive index layer are sequentially laminated. The refractive index of the high refractive index layer is higher than that of the low refractive index layer. The composition of this embodiment includes the compound of the following formula (1), the compound of the following formula (2), the zirconia and the UV curable compound so as to increase the refractive index of the high refractive index layer and the refractive index difference of the high refractive index layer and the low refractive index to 0.26 or more The lowest reflectance of the antireflection film can be remarkably lowered.

The composition for an antireflection film may have a refractive index of 1.530 to 1.700, specifically 1.550 to 1.650. In this range, the refractive index of the high refractive index layer can be increased.

The laminate of the cured product (high refractive index layer) and the base layer of the composition for an antireflection film may have an average reflectance of 5% or more, for example, 5.3% or more and 10% or less. In the above range, the lowest reflectance may be 0.5% or less when the low refraction layer is laminated on the laminate. In particular, when the low refraction layer formed of the composition containing the hollow particles, the fluorine-containing monomer, is laminated on the cured product, the lowest reflectance can be lowered in particular.

The laminate of the cured product of the antireflection film composition and the base layer may have a pencil hardness in the cured product of 2H or more, for example, 2H to 3H. Within the above range, the hardness of the antireflection film can be increased. In particular, the composition of the present invention can prevent the decrease in hardness even when a low refractive index layer is further laminated on the high refractive index layer.

Hereinafter, the composition for an antireflection film will be described in detail.

The compound of formula (1) has a higher refractive index than the UV curable compound. Therefore, the refractive index of the cured product (high refractive index layer) formed of the composition for an anti-reflection film can be increased. The refractive index of the compound of the following formula (1) may be 1.6 or more, specifically 1.615 to 1.635 or more specifically 1.62 to 1.63. Within this range, the refractive index of the cured product can be increased to lower the lowest reflectance of the antireflection film:

≪ Formula 1 >

Figure 112016094362779-pat00003

(Wherein m and n are each an integer of 1 or more, m + n is an integer of 2 to 8, and R is hydrogen or a methyl group).

Preferably, m + n may be four. In this case, the refractive index and hardness of the cured product can be increased when used together with the UV curable compound, particularly the urethane (meth) acrylate described below, and the lowest reflectance can be lowered to 0.5% or less have.

The compound of formula (2) has a higher refractive index than the UV curable compound. Therefore, the refractive index of the cured product (high refractive index layer) formed of the composition for anti-reflection film can be increased. The refractive index of the compound of the following formula (2) may be 1.55 or more, specifically 1.56 to 1.59, more specifically 1.57 to 1.58. Within this range, the refractive index of the cured product can be increased to lower the lowest reflectance of the antireflection film:

(2)

Figure 112016094362779-pat00004

(Wherein n is an integer of 1 to 4, and R is hydrogen or a methyl group).

The compounds of formulas (1) and (2) may be synthesized by a conventional method or commercially available products may be used.

The compound of Formula 1 and the compound of Formula 2 may be contained in an amount of 5 wt% to 60 wt% based on the solid content in the composition for an anti-reflection film. Within this range, the refractive index of the high-refraction layer can be sufficiently increased. By weight, preferably 10% by weight to 45% by weight. In the above range, the lowest reflectance can be sufficiently lowered when laminated with the low refractive index layer, and the hardness of the antireflection film can be sufficiently increased. As used herein, the term "solid content " means the entirety of the composition except for the solvent, and is not limited to the shape of a liquid phase, a solid phase, and the like.

The refractive index of the UV curable compound is lower than that of the compound of the formula (1) and the compound of the formula (2). However, the UV curable compound can form a matrix of a high refractive index layer and can increase the hardness of the high refractive index layer. When only the compound of Formula 1 and the compound of Formula 2 are included, the refractive index of the high refractive index layer can be increased to lower the lowest reflectance, but the hardness of the antireflection film is low and can not be used in an optical display device.

The UV curable compound may be preferably a compound having a UV curable group such as a (meth) acrylate group or an epoxy group. The UV curable compound may include at least one of a bifunctional or higher polyfunctional (meth) acrylate-based monomer, an oligomer formed therefrom, and a resin formed therefrom. For example, the UV curable compound may be a bifunctional to 10-functional (meth) acrylate compound.

The UV curable compound is a polyfunctional urethane (meth) acrylate synthesized from a polyfunctional (meth) acrylate such as a polyhydric alcohol and an ester of (meth) acrylic acid, or a polyhydric alcohol, an isocyanate compound, or a hydroxy ester of (meth) Acrylate. ≪ / RTI > Preferably, by using a polyfunctional urethane (meth) acrylate, the combination of the compound of Formula 1 and the compound of Formula 2 increases the refractive index and hardness, and the lowest reflectance can be lowered when the low refraction layer is laminated.

Examples of the bifunctional (meth) acrylate compound include ethylene glycol di (meth) acrylate, diethylene glycol di (meth) acrylate, butanediol di (meth) acrylate, hexanediol di (Meth) acrylate, nonane diol di (meth) acrylate, ethoxylated hexanediol di (meth) acrylate, propoxylated hexanediol di (meth) acrylate, diethylene glycol di Acrylate, neopentyl glycol di (meth) acrylate, ethoxylated neopentyl glycol di (meth) acrylate, tripropylene glycol di (meth) acrylate, tripropylene glycol di ) Acrylate, and di (meth) acrylate such as hydroxypivalic acid neopentyl glycol di (meth) acrylate.

Examples of trifunctional or more (meth) acrylate compounds include trimethylolpropane tri (meth) acrylate, ethoxylated trimethylolpropane tri (meth) acrylate, propoxylated trimethylolpropane tri (meth) Tri (meth) acrylate such as tris (2-hydroxyethyl) isocyanurate tri (meth) acrylate and glycerin tri (meth) acrylate, pentaerythritol tri (meth) acrylate, dipentaerythritol tri (Meth) acrylate compounds such as ditrimethylolpropane tri (meth) acrylate and ditrimethylolpropane tri (meth) acrylate, and trifunctional (meth) acrylate compounds such as pentaerythritol tetra (meth) acrylate, ditrimethylolpropane tetra (meth) acrylate, dipentaerythritol tetra (Meth) acrylate, dipentaerythritol penta (meth) acrylate, ditrimethylolpropane penta (meth) acrylate, (Meth) acrylate compounds such as dipentaerythritol hexa (meth) acrylate and ditrimethylol propane hexa (meth) acrylate, and polyfunctional (meth) acrylate compounds having a part of these (meth) And a polyfunctional (meth) acrylate compound substituted with a lactone.

Among the UV curable compounds, polyfunctional urethane (meth) acrylates can be preferably used because they can design a desired molecular weight and molecular structure and can easily balance the physical properties of the formed high refractive index layer . The polyfunctional urethane (meth) acrylate is synthesized from a polyol, an isocyanate compound, and a hydroxy ester of (meth) acrylic acid. The polyol may include at least one of an aromatic polyol, an aliphatic polyol, and an alicyclic polyol. Preferably, it may be at least one of an aliphatic polyol and an alicyclic polyol. In such a case, the occurrence of yellowing of the antireflection film may be small. The polyol may include, but is not limited to, one or more of a polyester diol, a polycarbonate diol, a polyolefin diol, a polyether diol, a polythioether diol, a polysiloxane diol, a polyacetal diol, and a polyester amide diol. The isocyanate compound may be any aliphatic, alicyclic or aromatic polyfunctional isocyanate compound.

The UV curable compound may be contained in an amount of 20% by weight to 60% by weight based on the solid content in the composition for an antireflection film. In this range, the matrix of the high-refraction layer may have a high hardness. Preferably from 35% by weight to 50% by weight. In the above range, the lowest reflectance can be sufficiently lowered when laminated with the low refractive index layer, and the hardness of the antireflection film can be sufficiently increased.

The antistatic agent may include a material having a quaternary ammonium cation and an anion to lower the surface resistance of the antireflection film. The anion may be a halogen ion, HSO 4 - , SO 4 2- , NO 3 - , PO 4 3-, and the like. The antistatic agent may include a quaternary ammonium cation, but may include an acrylic material containing a quaternary ammonium cation as a functional group in the molecule.

The antistatic agent may be contained in an amount of 2% by weight to 10% by weight, preferably 3% by weight to 7% by weight, based on the solid content in the antireflection film composition. Within the above range, antistatic effect can be obtained and the hardness of the antireflection film and the like can be prevented from affecting, property deterioration such as hardness can be prevented, and migration of the antistatic agent can be prevented.

The initiator can form a high-refraction layer by curing the compound of Formula 1, the compound of Formula 2, and the UV-curable compound. The initiator may comprise one or more of the usual photoradical initiators, photon ionic initiators known to those skilled in the art. Although not particularly limited, by using an initiator having an absorption wavelength of 400 nm or less, it is possible to produce a high-refraction layer by photocuring only when the compound of formula (1) or the UV-curable compound is cured.

The photoradical initiator is a catalyst which generates radicals by light irradiation to catalyze curing and includes at least one of phosphorous, triazine, acetophenone, benzophenone, thioxanthone, benzoin, oxime, and phenylketone can do. Photo cationic initiators may include salts of cations and anions. Specific examples of the cation include diphenyliodonium, 4-methoxydiphenyliodonium, bis (4-methylphenyl) iodonium, (4-methylphenyl) Triarylsulfonium such as triphenylsulfonium, diphenyl-4-thiophenoxyphenylsulfonium and the like, bis [4- (diphenylsulfonyl) phenyl] (Diphenylsulfonyl) -phenyl] sulfide, bis [4- (di (4- (2-hydroxyethyl) phenyl) Dien-1-yl) [(1,2,3,4,5,6-η) - (1-methylethyl) benzene] iron (1+). Specific examples of the anion include tetrafluoroborate (BF 4 - ), hexafluorophosphate (PF 6 - ), hexafluoroantimonate (SbF 6 - ), hexafluoroarsenate (AsF 6 - And chlorantimonate (SbCl 6 - ).

The initiator may be contained in an amount of 2 wt% to 5 wt% based on the solid content in the composition for an antireflection film. In this range, the composition can be sufficiently cured and the light transmittance of the antireflection film can be prevented from being lowered due to the residual amount of the initiator. By weight, preferably 2% by weight to 4% by weight. Within the above range, it is possible to manufacture a high-refraction layer with only light curing.

Zirconia can add a function of increasing the refractive index and increasing the hardness of the coating film in the high refractive index layer. Zirconia may not be surface treated but may be surface treated (e.g., (meth) acrylate groups) to improve compatibility with other components in the composition and further increase the hardness of the high refractive index layer. The surface treatment can be from 5% to 50% of the total surface area of the zirconia. Within this range, it is possible to have a hardness increasing effect through bonding with the UV curable compound, the compound of the formula 1, and the compound of the formula 2. The zirconia may have an average particle diameter (D50) of 1 nm to 50 nm, specifically 5 nm to 20 nm. Within the above range, the antireflection film may have an effect of increasing hardness without deterioration of optical properties.

The zirconia may be contained in an amount of 2 to 35% by weight based on the solid content in the composition for an antireflection film. Within this range, there may be an effect of increasing the hardness without deteriorating the optical characteristics of the antireflection film. By weight, preferably 5% by weight to 30% by weight. Within this range, there may be an effect of increasing the hardness without deteriorating optical properties.

The composition for an antireflection film may further comprise conventional additives known to those skilled in the art. For example, it may include, but is not limited to, antifoaming agents, antioxidants, ultraviolet absorbers, light stabilizers, leveling agents and the like.

The composition for an antireflection film may further comprise a solvent to improve the coating property of the antireflection film composition. The solvent may include at least one of propylene glycol monomethyl ether and methyl ethyl ketone.

Hereinafter, an antireflection film according to an embodiment of the present invention will be described with reference to FIG. 1 is a cross-sectional view of an antireflection film according to an embodiment of the present invention.

Referring to FIG. 1, the antireflection film 100 according to the present embodiment may include a base layer 110, a high refractive index layer 120, and a low refractive index layer 130 sequentially stacked. The low refractive index layer 130 may have a lower refractive index than the high refractive index layer 120 and the high refractive index layer 120 may be formed of the composition for an anti-reflection film according to an embodiment of the present invention. Therefore, the antireflection film 100 of this embodiment has a minimum reflectance of 0.5% or less, for example, 0% or more and 0.5% or less, and a pencil hardness of 2H or more, for example 2H or more and 3H or less, The surface resistivity at the surface of the substrate may be 9 x 10 10 Ω / □ or less, for example, 1 × 10 10 Ω / □ or less.

The base layer 110 can support the antireflection film 100 and increase the mechanical strength of the antireflection film 100.

The base layer 110 may have a refractive index of 1.40 to 1.80, for example, 1.45 to 1.70. When the high refractive index layer and the low refractive index layer are sequentially laminated in this range, the lowest reflectance can be lowered. The base layer 110 may be formed of an optically transparent resin. Specifically, the resin is selected from the group consisting of a polyester resin including a cellulose ester resin including triacetyl cellulose and the like, polyethylene terephthalate, polyethylene naphthalate, polybutylene terephthalate, polybutylene naphthalate and the like, polycarbonate resin, polymethylmethacrylate A poly (meth) acrylate resin, a polystyrene resin, a polyamide resin, and a polyimide resin. Preferably a cellulose ester resin including triacetyl cellulose and the like. The base layer 110 may have a thickness of 10 占 퐉 to 150 占 퐉, specifically 30 占 퐉 to 100 占 퐉, more specifically, 40 占 퐉 to 90 占 퐉. Can be used for the antireflection film in the above range.

The high refractive index layer 120 may be formed on the substrate layer 110 to increase the hardness of the antireflection film, lower the lowest reflectance, and reduce surface resistance. The high refractive index layer 120 is formed directly on the substrate layer 110. This "directly formed" means that no other adhesive layer, optical layer, is formed between the high refractive index layer 120 and the substrate layer 110.

The refractive index of the high refractive index layer 120 may be 1.53 to 1.70, e.g., 1.56 to 1.65. Within this range, the lowest reflectance can be lowered when the low refraction layer is laminated. The high refractive index layer 120 may have an average reflectance of 5% or more, for example, 5.3% or more and 10% or less. Within this range, the lowest reflectance can be lowered when the low refraction layer is laminated.

The refractive index of the high refractive index layer 120 is higher than that of the substrate layer 110. The refractive index difference between the high refractive index layer and the substrate layer may be 0.03 or more and 0.15 or less, for example, 0.05 or more and 0.15 or less. Within this range, there may be a minimum reflectance reduction effect in the final product.

The high refractive index layer 120 may have a thickness of 1 占 퐉 to 50 占 퐉, specifically 1 占 퐉 to 30 占 퐉, more specifically 5 占 퐉 to 10 占 퐉. Can be used for the antireflection film in the above range, and the hardness can be secured.

The low refractive index layer 130 is formed on the high refractive index layer 120 to lower the lowest reflectance of the antireflection film. The low refractive index layer 130 is formed directly on the high refractive index layer 120. This "directly formed" means that no other adhesive layer or optical layer is formed between the low refractive index layer 130 and the high refractive index layer 120.

The refractive index of the low refractive index layer 130 is lower than that of the high refractive index layer 120, so that the lowest reflectance of the antireflection film can be lowered. The refractive index difference between the high refractive index layer 130 and the low refractive index layer 120 may be 0.26 or more, for example, 0.26 or more and 0.30 or less. The refractive index of the antireflection film can be lowered within the above range and the optical characteristics such as haze can be improved. Refractive index layer 130 may have a refractive index of 1.35 or less, for example, 1.25 or more and 1.32 or less.

The refractive index layer 130 may have a thickness of 50 nm to 300 nm, specifically 80 nm to 200 nm, more specifically 80 nm to 150 nm. Can be used for the antireflection film in the above range.

The low refraction layer 130 may be formed of a composition for a low refractive layer. The composition for the low refractive layer may include inorganic particles, a fluorine-containing monomer or oligomer thereof, a fluorine-free monomer or oligomer thereof, an initiator, and a fluorine-containing additive.

The inorganic particles have a hollow structure, and the refractive index of the low refractive layer can be lowered by lowering the refractive index. The refractive index of the inorganic particles may be 1.4 or less, for example, 1.2 to 1.38. The inorganic particles may be hollow silica. The inorganic particles may be untreated untreated hollow particles or surface treated with UV curable functional groups. The average particle diameter (D50) of the inorganic particles is equal to or less than the thickness of the low refractive index layer, and may be 30 nm to 150 nm, for example, 50 nm to 100 nm. In the above range, it can be included in the low refractive index layer, and optical properties such as haze and transmittance can be improved.

The fluorine-containing monomer or oligomer thereof together with the inorganic particles lowers the refractive index of the low refractive layer and forms a matrix of the low refractive layer together with the fluorine-free monomer or oligomer thereof. The fluorine-containing monomer may include a fluorine-containing (meth) acrylate-based compound. The fluorine-containing monomers may comprise conventional compounds known to those skilled in the art.

The fluorine-free monomer or oligomer thereof forms a matrix of the low refractive layer and may comprise a UV curable compound. The fluorine-free monomer or oligomer thereof may be a bifunctional or more (e.g., bifunctional to 10-functional) (meth) acrylate compound. Specifically, the fluorine-free monomer may include a polyfunctional (meth) acrylate such as the above-described polyhydric alcohol and an ester of (meth) acrylic acid.

The initiator may be the same as or different from those described above in the composition for a high refractive index layer.

The additive adds antifouling property and slimness to the low refraction layer, and conventional additives known to those skilled in the art can be used. The additive may include at least one of a fluorine-containing additive and a silicon-based additive. The fluorine-containing additive may be a UV-curable fluorinated acrylic compound. For example, a KY-1200 series (KY-1203) including KY-1203 can be used.

The composition for a low refractive layer comprises 20% by weight to 70% by weight of solid inorganic particles, 10% to 50% by weight of a fluorine-containing monomer or oligomer thereof, 5% to 25% by weight of a fluorine- To 5 wt%, and 1 wt% to 10 wt% of an additive. Within the above range, a pencil hardness of 2H or more can obtain a fingerprint prevention effect. Preferably, the composition for a low refractive layer comprises 40% by weight to 60% by weight of solid inorganic particles, 20% to 40% by weight of a fluorine-containing monomer or oligomer thereof, 5% to 15% From 2 wt% to 4 wt% of an initiator, and from 2 wt% to 7 wt% of an additive.

The composition for the low refractive layer may further include conventional additives known to those skilled in the art. For example, it may include, but is not limited to, antifoaming agents, antioxidants, ultraviolet absorbers, light stabilizers, leveling agents and the like.

The composition for the low refractive layer may further include a solvent to improve the coating property. The solvent may include at least one of methyl ethyl ketone, methyl isobutyl ketone, and ethylene glycol dimethyl ether.

Hereinafter, a polarizing plate according to an embodiment of the present invention will be described.

The polarizing plate according to the present embodiment may include an antireflection film according to an embodiment of the present invention. The polarizing plate includes a polarizer and an antireflection film formed on at least one side of the polarizer, and the antireflection film may include the antireflection film according to the present embodiment. In addition to the antireflection film, the polarizing plate may further include a conventional optical compensation film, a protective film, and the like.

Hereinafter, an optical display device according to an embodiment of the present invention will be described.

The optical display device according to the present embodiment may include an antireflection film or a polarizing plate according to the present embodiment. The optical display device may include, but is not limited to, a liquid crystal display device, an organic light emitting display device, and the like.

Hereinafter, the configuration and operation of the present invention will be described in more detail with reference to preferred embodiments of the present invention. It is to be understood, however, that the same is by way of illustration and example only and is not to be construed in a limiting sense.

Manufacturing example  One: For low refractive layer  Composition manufacturing

2.75 g of a fluorine-free monomer, M306 (TOAGOSEI), was added to 61.3 g of THRULYA 5320 (JGC Catalyst and chemicals LTD) which is a hollow silica-containing sol and completely dissolved to obtain a mixture. 5.17 g of a fluorine-containing monomer AR-110 (DAIKIN) was added to the mixture, followed by stirring for 5 minutes. 3.75 g of a fluorine-containing additive KY-1203 (Shinetsu) was added to the mixture, followed by stirring for 5 minutes. 0.75 g of Irgacure 127 (BASF) as an initiator was added to the mixture and completely dissolved. To the mixture was added 585 g of methyl ethyl ketone (Samseon Chemical), 197 g of methyl isobutyl ketone (Samseon Chemical), and 97.5 g of ethylene glycol dimethyl ether (Samcheon Chemical), followed by stirring for 30 minutes to prepare a composition for a low refractive layer.

The composition for the low refractive layer includes 50 wt% of solid silica based on the solid basis, 32 wt% of the fluorine-containing monomer, 10 wt% of the fluorine-free monomer, 3 wt% of the initiator and 5 wt% of the additive.

Example  One

13 g of UV-curable compound UP111 (Entis, polyfunctional urethane acrylate), 14 g of BPS022S (enrichment solvent), which is a solution containing a mixture of the compound of Formula 1 and the compound of Formula 2, 14 g of surface treated zirconia- , 30 g of propylene glycol monomethyl ether (Samseon Chemical Co., Ltd.) and 25 g of methyl ethyl ketone (Samcheon Chemical Co., Ltd.) were added and completely dissolved. 1.25 g of Irgacure 184 (BASF) as an initiator was added thereto, followed by stirring for 5 minutes. 9.4 g of an antistatic agent-containing solution TBAS-2 (ARAKAWA) was added and stirred for 20 minutes to prepare a composition for a high-refractive-index layer.

The composition for the high refractive index layer contains 45% by weight of the compound of the formula (1) and the compound of the formula (2), 41% by weight of the UV curable compound, 5% by weight of the antistatic agent, 4% by weight of the initiator and 5% by weight of zirconia.

The thus prepared composition for a high refractive index layer was coated on a triacetyl cellulose film (FUJI, TG60UL) as a base layer using a Meyer bar 14. After drying at 80 DEG C for 2 minutes, the substrate was dried at 100 mJ / cm < 2 > Or more. The obtained coating layer was coated with the composition for a low refractive index of Production Example 1 using a Meyer bar 4, dried at 80 DEG C for 2 minutes, and then exposed to 250 mJ / cm < 2 > (Thickness: 7 nm, refractive index is shown in Table 1 below), a low refraction layer (thickness: 130 nm, refractive index: 1.30) was formed on the base layer (thickness: 60 m, refractive index: 1.485) Thereby sequentially fabricating an antireflection film having a three-layer structure.

Example  2

17 g of UV-curing compound UP111 (Entis, polyfunctional urethane acrylate), 5 g of BPS022S (a concentrating agent) solution containing a mixture of the compound of Formula 1 and the compound of Formula 2, the surface-treated zirconia- , 15 g of propylene glycol monomethyl ether (Samseon Chemical Co., Ltd.) and 20 g of methyl ethyl ketone (Samseon Chemical Co., Ltd.) were added and completely dissolved. 1.25 g of Irgacure 184 (BASF) as an initiator was added thereto, followed by stirring for 5 minutes. 9.4 g of an antistatic agent-containing solution TBAS-2 (ARAKAWA) was added and stirred for 20 minutes to prepare a composition for a high-refractive-index layer.

The composition for the high refractive index layer contains 15% by weight of the compound of the formula 1 and the compound of the formula 2, 50% by weight of the UV curable compound, 5% by weight of the antistatic agent, 4% by weight of the initiator and 26% by weight of the zirconia.

The above-prepared composition for a high refractive index layer was coated on a triacetyl cellulose film (FUJI, TG60UL) as a base layer using a No. 14 Meyer bar. After drying at 80 DEG C for 2 minutes, the substrate was dried at 100 mJ / cm < 2 > Or more. The obtained coating layer was coated with the composition for a low refractive index of Production Example 1 using a Meyer bar 4, dried at 80 DEG C for 2 minutes, and then exposed to 250 mJ / cm < 2 > (Thickness: 7 nm, refractive index is shown in Table 1 below), a low refraction layer (thickness: 130 nm, refractive index: 1.30) was formed on the base layer (thickness: 60 m, refractive index: 1.485) Thereby sequentially fabricating an antireflection film having a three-layer structure.

Comparative Example  One

31 g of UV curable compound UP111 (Entis), 30 g of propylene glycol monomethyl ether (Samseon Chemical) and 30 g of methyl ethyl ketone (Samseon Chemical Co., Ltd.) were added and completely dissolved. 1.25 g of Irgacure 184 (BASF) as an initiator was added thereto, followed by stirring for 5 minutes. 9.4 g of an antistatic agent-containing solution TBAS-2 (ARAKAWA) was added and stirred for 20 minutes to prepare a composition for a high-refractive-index layer. An antireflection film was prepared in the same manner as in Example 1 using the above-prepared composition.

Comparative Example  2

31 g of CN120C80 (Sartomer), which is a mixture of bisphenol A epoxy acrylate (refractive index: 1.541) and trimethylpropane triacrylate, 30 g of propylene glycol monomethyl ether (Samseon Chemical) and 30 g of methyl ethyl ketone . 1.25 g of Irgacure 184 (BASF) as an initiator was added thereto, followed by stirring for 5 minutes. 9.4 g of an antistatic agent-containing solution TBAS-2 (ARAKAWA) was added and stirred for 20 minutes to prepare a composition for a high-refractive-index layer. An antireflection film was prepared in the same manner as in Example 1 using the above-prepared composition.

Comparative Example  3

23 g of UV-curable compound UP111 (Entis, polyfunctional urethane acrylate), 5 g of BPSO22S (concentrating agent) solution containing a mixture of the compound of Formula 1 and the compound of Formula 2, 5 g of surface treated TiO 2 nanoparticles , 30 g of propylene glycol monomethyl ether (Samseon Chemical Co., Ltd.), and 30 g of methyl ethyl ketone (Samseon Chemical Co., Ltd.) were added and completely dissolved. 1.25 g of Irgacure 184 (BASF) as an initiator was added thereto, followed by stirring for 5 minutes. 9.4 g of an antistatic agent-containing solution TBAS-2 (ARAKAWA) was added and stirred for 20 minutes to prepare a composition for a high-refractive-index layer.

The high refractive index layer composition comprises a total compound with a compound of formula 2 of the formula (1) based on solids 13 wt%, 59 wt% UV-curable compound, antistatic agent 5% by weight, initiator 3 wt%, TiO 2 20% by weight.

The following properties of the composition for the high refractive index layer of Examples and Comparative Examples were evaluated, and the results are shown in Table 1 below.

(1) Refractive index of high refractive index layer composition and refractive index of high refractive index layer: For the composition of the examples and comparative examples and for the high refractive index layer as a cured product thereof, the liquid refractive index was measured with an Abbe's refractive index measuring device. In the case of a high refractive index layer, The CL-885 black acrylic sheet of Nitto resin having a refractive index of 1.46 to 1.50 was coated on a coating layer composed of 100% of the composition, and the reflectance was measured with a UV-spectrometer to fit the graph and the result was interpolated or extrapolated Respectively.

(2) Average reflectance: The composition for a high refractive index layer in Examples and Comparative Examples was coated on a triacetyl cellulose film (FUJI, TG60UL, thickness: 60 탆) as a base layer using a Meyer bar 14 and dried at 80 캜 for 2 minutes , And cured at a light amount of 150 mJ / cm 2 in a nitrogen atmosphere to prepare a specimen (high refractive index layer thickness: 7 μm).

A CL-885 black acrylic sheet of Nitto resin having a refractive index of 1.46 to 1.50 on the base layer side of the specimen was laminated at 70 DEG C (laminated with a pressure-sensitive adhesive and a substrate layer) at 70 DEG C, VIS spectrometer Lambda 1050. The reflection mode was measured in a range of 320 nm to 800 nm, and the average value of the reflectance at 380 nm to 780 nm was the average reflectance.

(3) Pencil hardness: Measured using a HEIDON instrument and measured using a Mitsubishi pencil having a speed of 0.5 mm / sec, a weight of 500 g, and a hardness of 1, 2H or the like. If the surface of the film is not scratched after a test using a Mitsubishi pencil of 2H, it is considered to have a hardness of 2H. Measure 5 times each. If not scratched 5 times, mark 5/5. If scratched 5 times, mark 0/5.

The refractive index of the composition for a high- Refractive index of high refractive index layer Average reflectance
(%)
Pencil hardness
(2H)
Example 1 1.562 1.583 5.542 4/5 Example 2 1.575 1.592 5.840 5/5 Comparative Example 1 1.510 1.530 4.820 5/5 Comparative Example 2 1.530 1.550 4.832 5/5 Comparative Example 3 1.602 - - -

In Comparative Example 3, the haze was increased due to the TiO 2 dispersion problem, and the low refractive index layer was not coated.

The following properties of the antireflection films of Examples and Comparative Examples were evaluated, and the results are shown in Table 2 below.

(1) Haze and transmittance: The NDH 2000 (NIPPON DENSHOKU), which is a haze meter, was measured for the antireflection films of Examples and Comparative Examples in a wavelength range from 400 nm to 700 nm in visible light range.

(2) CL-885 black acrylic sheet of Nitto resin having a minimum reflectance of 1.46 to 1.50 with a refractive index of 1.46 to 1.50 was laminated on the base layer side of the antireflection films of Examples and Comparative Examples at 70 DEG C (laminated with a pressure- And the prepared specimens were measured with a UV / VIS spectrometer Lambda 1050 of a reflectance meter Perkin Elmer. The reflection was measured in the range of 320 nm to 800 nm in the reflection mode, and the lowest value among the reflectance at wavelengths of 440 nm to 550 nm was determined.

(3) Surface resistance: In the antireflection films of Examples and Comparative Examples, a surface resistance meter MCP-HT450 (MITSUBICHI) was used to measure the surface of the low refraction layer at a pressure of 100 V and a thickness of 10 m.

(4) Pencil hardness: Measured using a HEIDON machine and measured using a Mitsubishi pencil having a hardness of 0.5 mm / sec, a weight of 500 g, and a hardness of 2H. If the surface of the film is not scratched after a test using a Mitsubishi pencil of 2H, it is considered to have a hardness of 2H. Measure 5 times each. If not scratched 5 times, mark 5/5. If scratched 5 times, mark 0/5.

(5) Scratch resistance: HEIDON 14F equipment and steel wool are manufactured by LIBERON Company 0000. Place the antireflection film flat on a flat glass plate with tape. The area of contact with the film is circular and shall be 10 ± 2 mm in diameter. The speed is 4000mm / min, the moving distance is 50mm, the number of movements is 10, and the load is given by using 1kg weight. After 10 repetitions, check if scratches have occurred with naked eyes. If no scratches are found, it is evaluated as excellent, less than 10 is good, and 10 is evaluated as NG.

Hayes
(%)
Permeability
(%)
Average reflectance
(%)
lowest
reflectivity
(%)
surface
resistance
(Ω / □)
Pencil hardness Scratch resistance Difference in refractive index between high refractive index layer and substrate layer Refractive index difference between high and low refractive layers
Example 1 0.42 95.53 5.542 0.493 5.78x10 9 4/5 Good 0.098 0.283 Example 2 0.39 95.41 5.840 0.431 5.5x10 9 5/5 Good 0.107 0.292 Comparative Example 1 0.34 95.82 4.820 0.964 1.81x10 9 5/5 Great 0.045  0.230 Comparative Example 2 0.44 95.66 4.832 0.911 over 5/5 Good   0.065  0.250 Comparative Example 3 63.12 80.27 - - Over - NG - -

As shown in Tables 1 and 2, the composition for an antireflection film of the present invention is excellent in hard coat function and antistatic function and has a high refractive index, so that the lowest reflectance of the antireflection film can be remarkably lowered. In addition, the antireflection film composition of the present invention can realize an antireflection film having excellent optical characteristics and good scratch resistance.

On the other hand, in Comparative Examples 1 and 2 which were outside the composition of the present invention, the average reflectance and the lowest reflectance were higher than those of the present invention, so that the lowest reflectance of the present invention could not be obtained.

In Comparative Example 3 containing titania particles in the range of the present invention instead of zirconia particles, the dispersibility of TiO 2 was poor and the haze was high, so that it could not be used as an antireflection film.

It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.

Claims (14)

An antireflection film comprising a substrate layer, a high-refraction layer, and a low refractive layer sequentially laminated,
The refractive index of the high refractive index layer is higher than that of the low refractive index layer,
The antireflection film has a minimum reflectance of 0.5% or less,
Wherein the refractive index difference between the high refractive index layer and the low refractive index layer is 0.26 or more,
The high refractive index layer is formed of a composition for a high refractive index layer comprising a compound of the following formula 1, a compound of the following formula 2, a UV curable compound, an antistatic agent, an initiator and zirconia,
≪ Formula 1 >
Figure 112018109628908-pat00008

(Wherein m and n are each an integer of 1 or more, m + n is an integer of 2 to 8, and R is hydrogen or a methyl group)
(2)
Figure 112018109628908-pat00009

(Wherein n is an integer of 1 to 4 and R is hydrogen or a methyl group)
The UV curable compound has a refractive index lower than that of the compound of Formula 1 and the compound of Formula 2,
Wherein the composition for high refractive index layer comprises 5 to 60% by weight of the total amount of the compound represented by Formula 1 and the compound represented by Formula 2, 20 to 60% by weight of the UV curable compound, 2 to 10% 2 wt% to 5 wt% of the initiator, and 2 wt% to 35 wt% of zirconia,
Wherein the low refraction layer is formed of a composition for a low refractive layer comprising inorganic particles, a fluorine-containing monomer or oligomer thereof, a fluorine-free monomer or oligomer thereof, an initiator, and a fluorine-containing additive.
The antireflective film of claim 1, wherein the UV curable compound comprises a polyfunctional urethane (meth) acrylate.
The antireflection film according to claim 1, wherein the zirconia is surface-treated.
The antireflection film according to claim 1, wherein the zirconia has an average particle diameter (D50) of 5 nm to 20 nm.
The composition for a low refractive index layer according to claim 1, wherein the composition for a low refractive layer comprises 20% by weight to 70% by weight of the inorganic particles based on a solid content, 10% by weight to 50% by weight of the fluorine-containing monomer or oligomer thereof, % To 25% by weight of said initiator, 2% to 5% by weight of said initiator, and 1% to 10% by weight of said fluorine-containing additive.
The antireflection film according to claim 1, wherein the inorganic particles comprise hollow silica.
The antireflection film according to claim 6, wherein the hollow silica has an average particle diameter (D50) of 30 nm to 150 nm.
The antireflection film according to claim 1, wherein the fluorine-containing additive comprises a UV-curable fluorinated acrylic compound.
The antireflection film according to claim 1, wherein the antireflection film has a pencil hardness of 2H or more and a surface resistance of 9 x 10 < 10 > / square or less in the low refractive layer.
A polarizing plate comprising the antireflection film according to any one of claims 1 to 9.
An optical display device comprising the antireflection film according to any one of claims 1 to 9.
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JP2012189802A (en) * 2011-03-10 2012-10-04 Asahi Kasei Chemicals Corp Antireflection film, polarizer and display device

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US20100028660A1 (en) * 2008-08-01 2010-02-04 Chemical Co., Ltd. Polymerizable composition and its uses
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