KR101938695B1 - Method for detection of short defects region of organic light emitting device - Google Patents

Abstract

The present invention provides a method of detecting a short-circuit defect region of an organic light-emitting device.

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a method of detecting short-

The present invention provides a method of detecting a short-circuit defect region of an organic light-emitting device.

An organic light emitting phenomenon is a phenomenon that converts electric energy into light energy by using an organic material. That is, when a suitable organic compound layer is placed between the anode and the cathode, when a voltage is applied between the two electrodes, holes are injected in the anode and electrons are injected into the organic compound layer in the cathode. When the injected holes and electrons meet, an exciton is formed, and when the exciton falls back to the ground state, it generates light.

Since the distance between the anode and the cathode is small, the organic light emitting element tends to have short-circuit defects. The anode and the cathode may be in direct contact with each other by pinholes, cracks, step in the structure of the organic light emitting device, and roughness of the coating, or the organic layer thickness may be made thinner in these defect regions. These defective regions provide a low-resistance path to allow current to flow, so that no current flows through the organic light emitting element at all or in extreme cases. As a result, the light emission output of the organic light emitting element is reduced or eliminated. In multi-pixel display devices, shorted defects do not emit light or produce dead pixels that emit light below average light intensity, thereby reducing display quality. For illumination or other low-resolution applications, a significant fraction of the area may not work due to short-circuit faults. Because of concerns about short-circuit defects, the fabrication of organic light-emitting devices is typically performed in a clean room. However, even a clean environment can not be effective in eliminating short circuit faults. In many cases, the thickness of the organic layer is increased more than is actually necessary to operate the device, in order to increase the spacing between the two electrodes to reduce the number of short-circuit defects. This method adds cost to the fabrication of the organic light emitting device, and even such a method can not completely eliminate short circuit defects.

The present invention provides a method of detecting a short-circuit defect region of an organic light-emitting device.

One embodiment of the present disclosure relates to an organic light emitting diode display comprising a first electrode including at least two conductive units, a second electrode facing the first electrode, at least one organic layer provided between the first electrode and the second electrode, An auxiliary electrode electrically connected to each of the plurality of conductive units, and a short-circuit prevention unit provided between the auxiliary electrode and each of the plurality of conductive units to electrically connect the auxiliary electrode and each of the conductive units. ;

Applying a voltage to the organic light emitting element from an external power source;

Detecting a white-spot region or a dark-spot region of the organic light emitting device, or detecting an area that is 30% or more higher than the operating temperature of the organic light emitting device when a short circuit defect does not occur Detecting a defective conductive unit; And

And detecting a short-circuit defective region in the short-circuit-defective conductive unit. The present invention also provides a method of detecting a short-circuit defect region in an organic light-emitting device.

The method of detecting a short-circuit defect region of an organic light emitting diode according to an embodiment of the present invention has an advantage that it is possible to easily detect a short-circuit occurrence region requiring repair in a conductive unit in which a short circuit defect occurs.

BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 shows one example of length and width for the conductive connections of the present disclosure.
FIG. 2 and FIG. 3 show images driven by the organic light emitting device manufactured in the embodiment.
4 is an enlarged view of a conductive unit in which a short circuit defect occurs in the organic light emitting device manufactured according to the embodiment.

Hereinafter, the present invention will be described in more detail.

When a member is referred to herein as being "on " another member, it includes not only a member in contact with another member but also another member between the two members.

Whenever a component is referred to as "comprising ", it is understood that it may include other components as well, without departing from the other components unless specifically stated otherwise.

One embodiment of the present disclosure relates to an organic light emitting diode display comprising a first electrode including at least two conductive units, a second electrode facing the first electrode, at least one organic layer provided between the first electrode and the second electrode, An auxiliary electrode electrically connected to each of the plurality of conductive units, and a short-circuit prevention unit provided between the auxiliary electrode and each of the plurality of conductive units to electrically connect the auxiliary electrode and each of the conductive units. ;

Applying a voltage to the organic light emitting element from an external power source;

Detecting a white-spot region or a dark-spot region of the organic light emitting device, or detecting an area that is 30% or more higher than the operating temperature of the organic light emitting device when a short circuit defect does not occur Detecting a defective conductive unit; And

And detecting a short-circuit defective region in the short-circuit-defective conductive unit. The present invention also provides a method of detecting a short-circuit defect region in an organic light-emitting device.

The short-circuit prevention portion in this specification may have a relatively high resistance as compared with the conductive unit. Furthermore, the short-circuit prevention portion of the present invention can perform a short-circuit prevention function in the organic light emitting device. That is, the short-circuit prevention portion of the present invention plays a role in enabling the operation of the device despite short-circuit defects when short-circuit defects occur in the organic light-emitting device.

In the case of an organic light emitting device that does not include the short-circuit prevention portion, if a short circuit defect occurs in one of the conductive units, the entire organic light emitting device does not operate and it is almost impossible to detect a short-circuiting region. That is, in an organic light emitting device including tens or hundreds of pixels, it was impossible to find one conductive unit having a short-circuit defect region.

However, the organic light emitting device according to one embodiment of the present invention includes a short-circuit prevention portion, so that even if there is a conductive unit in which short-circuiting occurs, it is possible to prevent the entire device from operating, It can be confirmed as a white point area or a black point area. Therefore, according to one embodiment of the present invention, it is possible to easily find a conductive unit corresponding to the white spot region or the black dot region, that is, a conductive unit in which a short circuit fault has occurred, It is possible to easily detect a fine short-circuit defective area in the substrate.

A short circuit fault may occur when the second electrode directly contacts the first electrode. Alternatively, the first electrode and the second electrode may be brought into contact with each other because the function of the organic material layer is lost due to the reduction or modification of the thickness of the organic material layer located between the first electrode and the second electrode. When a short circuit defect occurs, a low path is provided for the current of the organic light emitting element, thereby making it impossible for the organic light emitting element to operate normally. The current of the organic light emitting diode can flow through the defective region due to a leakage current that causes a current to flow directly from the first electrode to the second electrode due to a short circuit defect. This may reduce the emission output of the organic light emitting device, and in some cases the organic light emitting device may not operate. Also, when the current that is dispersed in a large area of organic matter flows in a concentrated state at a short circuit occurrence point, locally high heat is generated, and there is a risk of breakage of the device or fire.

However, even if a short circuit defect occurs in any one or more of the conductive units of the organic light emitting device of the present specification, all the working currents can be prevented from flowing to the short circuit defect portion by the short circuit prevention portion. That is, the short-circuit prevention unit can control the amount of the leakage current so as not to increase infinitely. Therefore, the organic light-emitting device of the present invention can normally operate the remaining conductive units that do not have a short-circuit defect even if a short-circuit defect occurs in some of the conductive units.

According to an embodiment of the present invention, the step of applying the voltage may further include preventing all the current from being concentrated in the conductive unit in which the short-circuit defect occurs due to the short-circuit prevention portion. Specifically, according to one embodiment of the present invention, when a voltage is applied to the organic light emitting element, the short circuit preventing portion can prevent the entire organic light emitting element from being inoperable due to a short circuit defect, A low resistance is formed compared to the normal region, and a large amount of current flows, which can be 30% higher than the operating temperature in the case where short-circuit defects do not occur.

According to one embodiment of the present invention, when the leakage current flowing to the short-circuit-connecting region is cut off by only a certain level or less by the short-circuit prevention portion, the conductive unit region in which the short-circuit defect occurs causes the over- It is possible to form a white spot region that emits brighter light.

According to an embodiment of the present invention, when the leakage current flowing to the short-circuit-connecting region is blocked by the short-circuit prevention portion by more than a certain level, the conductive unit region in which the short- A black spot region can not be formed.

According to an embodiment of the present invention, in the case of the white point region, an overcurrent flows as compared with a normal operation, so that the operating temperature can be increased by 30% or more in the case where a short circuit fault does not occur.

According to one embodiment of the present invention, even in the case of the black dot region, current flows to the short-circuit defect region and flows, so that it can be increased by 30% or more from the operating temperature in the case where short-circuit defect does not occur.

That is, the white point region and / or the black point region exhibit a higher temperature than a normally operating conductive unit by flowing a large amount of current into the short circuit defect region. The normal operating conductive unit may mean a conductive unit excluding a conductive unit including a short-circuit defect region and a conductive unit in which an overcurrent flows around the conductive unit including the short-circuit defect region.

According to an embodiment of the present disclosure, the step of applying the voltage may further include emitting light above the normal brightness in the conductive unit in which the short-circuit defect occurs, or the conductive unit in which the short-circuit defect has occurred does not operate.

Further, when there is no short-circuit defect region in the organic light-emitting device, the variation of the luminance and the operating temperature of the entire light-emitting region becomes negligible.

According to an embodiment of the present invention, the step of detecting the conductive unit in which the short-circuit defect occurs may be performed by detecting a white-spot region or a dark-spot region with the naked eye and detecting a conductive unit having the short- . In addition, the detecting step may be to detect a conductive unit having a short-circuit defect region that forms a temperature higher by 30% or more as compared with a normal operation region using an infrared camera or the like capable of detecting a temperature difference.

Furthermore, according to one embodiment of the present invention, it is possible to detect a short-circuit defect region in a conductive unit that can not emit light by the short-circuit defect region and to detect an accurate short-circuit defect region.

Specifically, according to an embodiment of the present disclosure, the step of detecting the short-circuit defect region may include enlarging the short-circuit-fault conductive unit to detect the short-circuit defect region. The short-circuit defect region can be observed as an opaque region or a black region in the conductive unit. According to an embodiment of the present invention, the conductive unit may be transparent, and the short-circuit occurrence region may be opaque and can be observed as a black region.

According to one embodiment of the present invention, the resistance from the region of the short-circuit prevention portion adjacent to the auxiliary electrode to the adjacent region of each of the conductive units may be 40 Ω or more and 300,000 Ω or less.

When the short-circuit prevention portion has the resistance in the above-mentioned range, it is possible to prevent the entire organic light-emitting element from operating due to the short-circuit defective region. In addition, a white point region or a black point region may be generated in the organic light emitting element so that a conductive unit including a short circuit defect can be detected.

One embodiment of the present disclosure includes a first electrode comprising at least two conductive units; A second electrode facing the first electrode; At least one organic layer provided between the first electrode and the second electrode; An auxiliary electrode electrically connected to each of the conductive units; And a short-circuit prevention unit provided between the auxiliary electrode and each of the conductive units to electrically connect the auxiliary electrode and each of the conductive units,

And a resistance from the region of the short-circuit prevention portion adjacent to the auxiliary electrode to the adjacent region of each of the conductive units is in a range of 40 to 300,000 OMEGA.

Each of the conductive units in this specification can be supplied with electric current through a region having a short-circuit prevention function. Specifically, according to one embodiment of the present invention, the organic light emitting diode may be electrically connected to the auxiliary electrode through at least one short-circuit prevention unit provided between the conductive unit and the auxiliary electrode. Specifically, according to an embodiment of the present invention, each of the conductive units may be electrically connected to the auxiliary electrode through at least one short-circuit preventing portion. When there is a plurality of short-circuit-proof portions electrically connected to any one of the conductive units, it is possible to perform another short-circuit-proof function without any one of the anti-cracking portions, thereby enhancing the stability of the organic light-

According to one embodiment of the present invention, the resistance from the auxiliary electrode to each of the conductive units may be a resistance of the short-circuit prevention portion. Specifically, since the resistance of the auxiliary electrode is so small as to be negligible, most of the resistance from the auxiliary electrode to the conductive unit can be the resistance of the short-circuit prevention portion.

The conductive unit may be included in the light emitting region of the organic light emitting device. Specifically, according to one embodiment of the present invention, at least one region of each of the conductive units may be located in a light emitting region of the organic light emitting device. That is, according to one embodiment of the present invention, a light emission phenomenon occurs in an organic material layer including a light emitting layer formed on a region constituting the conductive unit, and light can be emitted through the conductive unit.

According to one embodiment of the present invention, the current flow of the organic light emitting diode can flow to the auxiliary electrode, the short-circuit prevention layer, the conductive unit, the organic layer, the second electrode, and flow in the opposite direction. Alternatively, the current flow of the organic light emitting diode can flow to the auxiliary electrode, the conductive connection, the conductive unit, the organic layer, the second electrode, and flow in the opposite direction.

According to one embodiment of the present invention, each of the conductive units can receive current from the auxiliary electrode through the short-circuit prevention portion.

The light emitting region in this specification means a region where light emitted from the light emitting layer of the organic layer is emitted through the first electrode and / or the second electrode. For example, in the organic light emitting device according to one embodiment of the present invention, the light emitting region may include at least a portion of a region of the first electrode on which the first electrode is formed and / As shown in FIG. In addition, the non-emission region in this specification may refer to a region other than the emission region.

According to one embodiment of the present invention, the short-circuit prevention portion may be located in the non-emission region of the organic light emitting device.

According to one embodiment of the present disclosure, the conductive units may be electrically connected in parallel. The conductive units in the present specification may be disposed apart from each other. The resistance between the conductive units described above can be confirmed with respect to the configuration in which the conductive units are arranged apart from each other.

Specifically, according to one embodiment of the present disclosure, the resistance from the one conductive unit to another neighboring conductive unit may be at least twice as large as the short-circuit prevention resistance. For example, when the conduction path between any one conductive unit and another adjacent conductive unit is made solely through the short-circuit prevention portion and the auxiliary electrode, the conductive unit and the conductive unit adjacent to the conductive unit are electrically connected to the auxiliary electrode and the short- . Therefore, even if the resistance value of the auxiliary electrode is neglected, the resistance between the conductive units can have a resistance value at least twice that of the short-circuit prevention portion.

The conductive units in the present specification may be separated from each other and electrically separated, and each of the conductive units may receive current from the auxiliary electrode through the short-circuit prevention portion. This is because, when a short circuit occurs in any one of the conductive units, a current that flows to another conductive unit in which a short circuit does not occur flows into the short-circuited conductive unit, thereby preventing the entire organic light emitting device from operating.

According to an embodiment of the present invention, the first electrode may include two or more conductive units, and the two or more conductive units may be physically spaced from each other. According to an embodiment of the present disclosure, the two or more conductive units may be physically connected to each other, and in this case, two or more conductive units may be connected to each other through a region of the first electrode which does not form a conductive unit.

According to an embodiment of the present invention, the sheet resistance of the auxiliary electrode may be 3? /? Or less. Specifically, the sheet resistance may be 1? /? Or less.

When the sheet resistance of any one of the first electrode and the second electrode having a large area is higher than a necessary level, the voltage may be changed according to the position of the electrode. Therefore, if the potential difference between the first electrode and the second electrode sandwiching the organic material layer varies depending on the position, the luminance uniformity of the organic light emitting device may be deteriorated. Therefore, an auxiliary electrode can be used to lower the sheet resistance of the first electrode or the second electrode having a high sheet resistance above the required level. The sheet resistance of the auxiliary electrode in the present specification may be 3 Ω / □ or less, specifically, 1 Ω / □ or less, and the luminance uniformity of the organic light emitting device may be kept high in the above range.

According to an embodiment of the present invention, the first electrode may be formed as a transparent electrode. In this case, the sheet resistance of the first electrode may be higher than the sheet resistance required to drive the organic light emitting diode. Therefore, in order to lower the sheet resistance of the first electrode, the auxiliary electrode may be electrically connected to the first electrode to lower the sheet resistance of the first electrode to the sheet resistance of the auxiliary electrode.

According to an embodiment of the present invention, the auxiliary electrode may be provided in an area other than the light emitting area.

According to an embodiment of the present invention, the auxiliary electrodes may be formed of conductive lines electrically connected to each other. Specifically, the conductive line may be formed of a conductive unit. Specifically, a voltage may be applied to at least one portion of the auxiliary electrode in the present specification to drive the entire auxiliary electrode.

According to one embodiment of the present disclosure, the organic light emitting diode can be used in OLED illumination. In the case of the OLED illumination, it is important to emit uniform brightness in the entire light emitting region, i.e., all the organic light emitting elements. Specifically, in order to realize uniform brightness in the OLED illumination, it is preferable that a voltage formed between the first electrode and the second electrode of all organic light emitting devices included in the OLED illumination is maintained to be the same.

In the case where the first electrode is a transparent electrode and the second electrode is a metal electrode, the second electrode of each organic light emitting device is sufficiently low in sheet resistance so that there is almost no difference in voltage between the second electrode of each organic light emitting device, In the case of one electrode, there may be a voltage difference between the organic light emitting elements. According to an embodiment of the present invention, the auxiliary electrode, specifically, the metal auxiliary electrode may be used to compensate the first electrode voltage difference of each organic light emitting device. Further, the metal auxiliary electrodes may be formed of conductive lines electrically connected to each other, so that the first electrode voltage difference of each organic light emitting device may be substantially eliminated.

According to one embodiment of the present invention, the sheet resistance of the conductive unit may be 1 Ω / □ or more, or 3 Ω / □ or more, specifically, 10 Ω / □ or more. Also, the sheet resistance of the conductive unit may be 10,000? /? Or 1,000? /? Or less. That is, the sheet resistance of the conductive unit of the present specification may be 1? /? To 10,000? /? Or 10? /? To 1,000? /?.

Since the conductive unit and the conductive connection unit herein are formed by patterning the first electrode, the sheet resistance of the conductive unit may be the same as the sheet resistance of the first electrode or the conductive connection unit.

According to one embodiment of the present invention, the sheet resistance level required for the conductive unit can be controlled to be in inverse proportion to the area of the conductive unit corresponding to the light emitting area. For example, when the conductive unit has a light emitting area of 100 cm 2, the required sheet resistance of the conductive unit may be around 1 Ω / □. Further, when the area of each of the conductive units is made small, the required sheet resistance of the conductive unit may be 1 Ω / □ or more.

The sheet resistance of the conductive unit in this specification may be determined by the material forming the conductive unit and may also be electrically connected to the auxiliary electrode to be lowered to the sheet resistance of the auxiliary electrode. Therefore, the sheet resistance value of the conductive unit required in the organic light emitting device in the present specification can be controlled by the material of the auxiliary electrode and the conductive unit.

According to one embodiment of the present disclosure, the first electrode may include at least 1,000 conductive units spaced from each other. Specifically, the first electrode may include 1,000 to 1,000,000 of the conductive units spaced apart from each other.

According to an embodiment of the present invention, the first electrode may be formed in a pattern of two or more conductive units. Specifically, the conductive unit may be formed in a pattern in which regions except for the conductive connection portions are spaced apart from each other.

The pattern herein may have the form of a closed graphic. Specifically, the pattern may be a polygon such as a triangle, a rectangle, a hexagon, or the like, and may be an amorphous shape.

When the number of the conductive units in the present specification is 1000 or more, the organic light emitting device may have an effect of minimizing the amount of leakage current during short-circuiting while minimizing the voltage rising width in normal operation. Further, as the number of the conductive units in the present specification increases to 1,000,000 or less, the aperture ratio can be maintained and the above effect can be maintained. That is, when the number of the conductive units exceeds 1,000,000, the aperture ratio may decrease due to an increase in the number of auxiliary electrodes.

According to an embodiment of the present invention, the area occupied by the conductive units in the organic light emitting device may be 50% or more and 90% or less based on the plan view of the organic light emitting device. Specifically, the conductive unit is included in the light emitting region, and the area occupied by the conductive units may be the same as or similar to the aperture ratio of the organic light emitting device, with reference to a surface on which the entire organic light emitting device emits light.

The first electrode of the present invention is electrically connected to each of the conductive units by the conductive connection portion and / or the short-circuit prevention layer, so that the driving voltage of the device is increased. Therefore, according to one embodiment of the present invention, in order to compensate for the driving voltage rise by the conductive connection portion, the first electrode includes at least 1,000 conductive units, thereby lowering the driving voltage of the device, It is possible to have a short-circuit prevention function.

According to one embodiment of the present invention, the area of each of the conductive units may be 0.01 mm ² or more and 25 mm ² or less.

When the area of each of the conductive units is reduced, there is an advantage that the operating voltage increase ratio and the leakage current with respect to the operating current according to the short-circuit prevention unit introduced for short circuit prevention can be lowered at the same time. Further, when a short circuit occurs and a conductive unit that does not emit light is generated, there is an advantage that the non-emission region can be minimized and the drop in product quality can be minimized. However, when the area of the conductive unit is made too small, the ratio of the light emitting region in the entire device region is greatly reduced, and the efficiency of the organic light emitting device is deteriorated due to the decrease of the aperture ratio. Therefore, when the organic light emitting device is manufactured with the area of the conductive unit, the above-described advantages can be maximized while minimizing the above-described disadvantages.

According to the organic light emitting device of the present invention, the organic layer including the short-circuit prevention portion, the conductive unit, and the light-emitting layer may be electrically connected in series with each other. The light emitting layer may be disposed between the first electrode and the second electrode, and two or more light emitting layers may be electrically connected in parallel.

According to an embodiment of the present invention, the light emitting layer is disposed between the conductive unit and the second electrode, and each of the light emitting layers may be electrically connected in parallel with each other. That is, the light emitting layer in the present specification may be positioned corresponding to a region corresponding to the conductive unit.

When the light emitting layer of the present specification operates at the same current density, the resistance value increases inversely with decreasing the area of the light emitting layer. According to one embodiment of the present invention, when the area of each of the conductive units becomes smaller and the number thereof increases, the area of each of the light emitting layers becomes smaller. In this case, the ratio of the voltage of the conductive connection part connected in series to the organic material layer is reduced compared to the voltage applied to the organic material layer including the light emitting layer in the operation of the organic light emitting device.

In the case where a short circuit occurs in the organic light emitting element of this specification, the amount of leakage current can be determined by the resistance value from the auxiliary electrode to the conductive unit and the operating voltage regardless of the number of the conductive units. Therefore, when the number of the conductive units is increased, the voltage rising due to the conductive connecting portion during normal operation can be minimized, and the amount of leakage current at the time of short circuit can be minimized.

According to one embodiment of the present invention, the material of the short-circuit prevention portion may be the same or different from the material of the conductive unit. According to one embodiment of the present invention, when the material of the short-circuit prevention portion is the same as the material of the conductive unit, the shape of the short-circuit prevention portion can be adjusted to form the high resistance region necessary for short- When the material of the short-circuit prevention portion is different from that of the conductive unit, a material having a resistance higher than that of the conductive unit can be used to obtain a high resistance necessary for short-circuit prevention.

According to one embodiment of the present disclosure, the short-circuit prevention portion includes a short-circuit prevention layer including a material different from that of the first electrode; Or a conductive connection portion including a material which is the same as or different from the first electrode and which has a length in a direction in which a current flows is longer than a width in a direction perpendicular thereto.

According to one embodiment of the present disclosure, the short-circuit prevention portion may be a conductive connection portion.

Specifically, according to an embodiment of the present invention, the first electrode may further include at least two conductive connecting portions including a region where a length in a direction of current flow is longer than a width in a direction perpendicular thereto, One end of which is electrically connected to the conductive unit, and the other end of which is electrically connected to the auxiliary electrode.

According to one embodiment of the present disclosure, the material of the conductive connection portion may be the same as the material of the conductive unit. Specifically, the conductive connection portion and the conductive unit are included in the first electrode, and may be formed of the same material.

According to an embodiment of the present invention, the material of the conductive connection portion may be different from the material of the first electrode, and the length of the direction in which the current flows may be longer than the width in the direction perpendicular thereto, Lt; / RTI >

Specifically, according to one embodiment of the present disclosure, the conductive connection portion may include a region having a length-to-width ratio of 10: 1 or more.

The conductive connection portion in this specification may be an end portion of the conductive unit at the first electrode, and its shape and position are not particularly limited. For example, if the conductive unit is formed in a C shape or a B shape, it may be at its distal end. Alternatively, the conductive connection portion may have a shape protruding from one vertex, a corner, or an intermediate portion of one side of the polygonal conductive unit including the square.

According to an embodiment of the present invention, the conductive connection portion may have a resistance value to prevent a short-circuit defect, including a portion having a length-width ratio of 10: 1 or more. Further, according to an embodiment of the present invention, a portion having a length-to-width ratio of 10: 1 or more may be the entire conductive connecting portion. Alternatively, a portion having a length-to-width ratio of 10: 1 or more may be a portion of the conductive connection portion.

The length and width of the present specification are relative concepts, which may refer to the spatial distance from one end of the conductive connection to the other end when viewed from the top. That is, even if the conductive connection portion includes a combination of straight lines or a curve, it may mean a value obtained by assuming a straight line and measuring the length. The width in this specification may mean the distance from the center of the conductive connection in the longitudinal direction to both ends in the vertical direction when viewed from above. Further, in the case where the width is changed in this specification, it may be an average value of the width of any one of the conductive connecting portions. One example of the length and width is shown in Fig.

The length in this specification may mean the dimension in the direction in which the current flows. In addition, the width of the present specification may mean a dimension in a direction perpendicular to a direction in which a current flows.

In addition, the length of the present specification may mean a distance through which the current from the auxiliary electrode to the conductive unit moves, and the width may mean a distance perpendicular to the longitudinal direction.

In FIG. 1, the length may be the sum of a and b, and the width may be c.

According to one embodiment of the present invention, the resistance between the different conductive units is different from that between the conductive unit and the short-circuit prevention unit in contact with the one conductive unit, the short-circuit prevention unit in contact with the other conductive unit, It can mean resistance up to.

Equation 3 in the present specification may mean a lower limit value of a resistance at which the conductive connection unit can perform the short-circuit prevention function when the conductive unit is supplied with current through the conductive connection unit.

According to one embodiment of the present disclosure, the short-circuit prevention portion may be a short-circuit prevention layer.

According to one embodiment of the present disclosure, the short-circuit prevention layer may include a material different from the first electrode, and specifically, the short-circuit prevention layer may include a material having a higher resistance than the first electrode.

According to one embodiment of the present invention, the short-circuit prevention layer may be provided in a laminated state on any member, or may be provided in parallel with any member.

According to an embodiment of the present invention, a short-circuiting layer is provided between the first electrode and the auxiliary electrode, and the auxiliary electrode may be electrically connected to the conductive unit via the short-circuit prevention layer. That is, the auxiliary electrode in this specification can electrically connect the conductive unit via the short-circuit prevention layer. The short-circuit prevention layer in the present specification can perform a short-circuit prevention function of the organic light emitting element.

According to one embodiment of the present invention, the thickness of the short-circuit prevention layer may be 1 nm or more and 10 占 퐉 or less.

The short-circuiting layer within the thickness range and / or the thickness direction resistance range can maintain a normal operating voltage when the organic light emitting element does not cause a short circuit. In addition, the organic light emitting diode can operate within a normal range even when the organic light emitting diode is short-circuited within the thickness range and / or the resistance range.

Specifically, according to one embodiment of the present invention, the resistance of the short-circuiting layer may mean a resistance from the auxiliary electrode to the conductive connection portion or the conductive unit. That is, the resistance of the short- It may be a resistance depending on the electrical distance for electrically connecting to the connection or conductive unit.

According to one embodiment of the present disclosure, the short-circuit protection layer comprises carbon powder; Carbon coating; Conductive polymer; Organic polymers; metal; Metal oxides; Inorganic oxides; Metal sulfides; And an insulating material. [0033] The term " insulating material " Specifically, a mixture of two or more selected from the group consisting of zirconium oxide (ZrO ₂ ), nichrome, indium tin oxide (ITO) and zinc sulfide (ZnS) silicon dioxide (SiO ₂ ) can be used.

According to one embodiment of the present invention, one end of the short-circuit prevention portion is provided on at least one of the upper surface, the lower surface and the side surface of the conductive unit, and the other end portion of the short- Or the like.

According to an embodiment of the present invention, the conductive unit, the auxiliary electrode, and the short-circuit prevention portion may be provided on the same plane of the substrate.

According to one embodiment of the present invention, one end of the short-circuit prevention portion is provided on the side surface and the upper surface of the conductive unit or on the side surface and the bottom surface of the conductive unit, and the other end of the short- And may be provided on a side surface and a bottom surface of the auxiliary electrode.

According to one embodiment of the present invention, the short-circuit prevention layer is provided on at least one of the upper surface and the side surface of the conductive unit, and the auxiliary electrode may be provided on at least one of the upper surface and the side surface of the short- .

According to an embodiment of the present invention, the short-circuit prevention layer is provided on at least one of the lower surface and the side surface of the conductive unit, and the auxiliary electrode may be provided on at least one of the lower surface and the side surface of the short- .

According to an embodiment of the present invention, the auxiliary electrode may be provided in a mesh structure spaced apart from each of the conductive units and surrounding at least one of the conductive units.

The auxiliary electrode in this specification may be a structure including two or more branch points. The branch points herein may comprise three or more branches. The auxiliary electrode is not formed as a conductive line which is not electrically connected to each other, and the auxiliary electrode may be provided in a form in which at least two conductive lines are in contact with each other. That is, the auxiliary electrode in the present specification is not provided in a stripe shape but may be provided in a form including at least two conductive lines intersecting each other.

In this specification, the break point may refer to a region where the auxiliary electrodes contact with each other to form three or more branches, through which the current of the auxiliary electrode can be dispersed and flowed into the branch.

According to an embodiment of the present invention, the auxiliary electrode includes the conductive unit; And a region except for a distal end of the conductive connection portion that is in contact with the auxiliary electrode. Specifically, the auxiliary electrode can not be provided on a region of the conductive connection portion that is capable of preventing a short circuit. That is, the auxiliary electrode should be spaced apart from a region where the length of the conductive connection in the direction of current flow is longer than the width in the vertical direction. This is because, when the auxiliary electrode having a low resistance value is touched in a region where the resistance value is high, the resistance value becomes low and the short-circuit prevention function is deteriorated.

According to an embodiment of the present invention, the first electrode may be a transparent electrode.

When the first electrode is a transparent electrode, the first electrode may be a conductive oxide such as indium tin oxide (ITO), indium zinc oxide (IZO), or the like. Furthermore, the first electrode may be a translucent electrode. When the first electrode is a translucent electrode, the first electrode may be made of a semi-transparent metal such as Ag, Au, Mg, Ca, or an alloy thereof. When a semitransparent metal is used as the first electrode, the organic light emitting element may have a microcavity structure.

According to an embodiment of the present invention, the auxiliary electrode may be made of a metal material. That is, the auxiliary electrode may be a metal electrode.

The auxiliary electrode can generally be made of any metal. Specifically, it may include aluminum, copper and / or silver having high conductivity. The auxiliary electrode may be a molybdenum / aluminum / molybdenum layer when aluminum is used for adhesion to the transparent electrode and stability in the photolithography process.

According to an embodiment of the present invention, the organic material layer includes at least one light emitting layer, and the hole injection layer; A hole transport layer; A hole blocking layer; A charge generation layer; An electron blocking layer; An electron transport layer; And an electron injection layer may be further included.

The charge generating layer refers to a layer in which holes and electrons are generated when a voltage is applied.

The substrate may be a substrate having excellent transparency, surface smoothness, ease of handling, and waterproofness. Specifically, a glass substrate, a thin film glass substrate, or a transparent plastic substrate can be used. The plastic substrate may include films such as PET (polyethylene terephthalate), PEN (polyethylene naphthalate), PEEK (polyether ether ketone) and PI (polyimide) in a single layer or a multilayer. In addition, the substrate may have a light scattering function in the substrate itself. However, the substrate is not limited thereto, and a substrate commonly used in an organic light emitting device can be used.

According to one embodiment of the present disclosure, the first electrode may be an anode, and the second electrode may be a cathode. Also, the first electrode may be a cathode, and the second electrode may be an anode.

As the anode, a material having a large work function is preferably used so that injection of holes into the organic material layer is smooth. Specific examples of the anode material that can be used in the present invention include metals such as vanadium, chromium, copper, zinc, and gold, or alloys thereof; Metal oxides such as zinc oxide, indium oxide, indium tin oxide (ITO), and indium zinc oxide (IZO); ZnO: Al or SnO _2: a combination of a metal and an oxide such as Sb; Conductive polymers such as poly (3-methylthiophene), poly [3,4- (ethylene-1,2-dioxy) thiophene] (PEDT), polypyrrole and polyaniline.

The anode material is not limited to the anode but can be used as a material for the cathode.

The cathode preferably has a low work function to facilitate electron injection into the organic material layer. Specific examples of the cathode material include metals such as magnesium, calcium, sodium, potassium, titanium, indium, yttrium, lithium, gadolinium, aluminum, silver, tin and lead or alloys thereof; Layer structure materials such as LiF / Al or LiO ₂ / Al, but are not limited thereto.

The material of the cathode is not limited to the cathode, but can be used as the material of the anode.

As the hole transporting layer material according to the present invention, a material capable of transporting holes from the anode or the hole injecting layer to the light emitting layer and having high mobility to holes is suitable. Specific examples include arylamine-based organic materials, conductive polymers, and block copolymers having a conjugated portion and a non-conjugated portion together, but are not limited thereto.

The light emitting layer material according to the present invention is preferably a material capable of emitting light in the visible light region by transporting and combining holes and electrons from the hole transporting layer and the electron transporting layer, respectively, and having good quantum efficiency for fluorescence or phosphorescence. Specific examples include 8-hydroxy-quinoline aluminum complex (Alq ₃ ); Carbazole-based compounds; Dimerized styryl compounds; BAlq; 10-hydroxybenzoquinoline-metal compounds; Compounds of the benzoxazole, benzothiazole and benzimidazole series; Polymers of poly (p-phenylenevinylene) (PPV) series; Spiro compounds; Polyfluorene; Rubrene, and the like, but are not limited thereto.

The electron transporting layer material according to the present invention is a material capable of transferring electrons from the cathode well into the light emitting layer, and a material having high mobility to electrons is suitable. Specific examples include an Al complex of 8-hydroxyquinoline; Complexes containing Alq ₃ ; Organic radical compounds; Hydroxyflavone-metal complexes, and the like, but are not limited thereto.

According to an embodiment of the present invention, the auxiliary electrode may be located in a non-emission region of the organic light emitting diode.

According to an embodiment of the present invention, the organic light emitting diode may further include an insulating layer provided in a non-emitting region.

According to an embodiment of the present invention, the insulating layer may be formed to insulate the short-circuit prevention portion and the auxiliary electrode from the organic layer.

According to an embodiment of the present invention, the organic light emitting diode may be sealed with an encapsulation layer.

The sealing layer may be formed of a transparent resin layer. The sealing layer protects the organic light emitting device from oxygen and contaminants and may be transparent to prevent light emission of the organic light emitting device. The transparency may mean that light is transmitted at 60% or more. Specifically, it may mean that light is transmitted at 75% or more.

According to an embodiment of the present invention, the organic light emitting diode may include a light scattering layer. According to an embodiment of the present invention, the organic light emitting diode further includes a substrate on a surface of the first electrode opposite to a surface on which the organic material layer is provided, and the light scattering provided between the substrate and the first electrode Layer. ≪ / RTI > According to one embodiment of the present disclosure, the light scattering layer may include a flat layer. According to an embodiment of the present invention, the flat layer may be provided between the first electrode and the light scattering layer.

According to an embodiment of the present invention, the organic light emitting diode further includes a substrate on a surface of the first electrode opposite to a surface on which the organic material layer is provided, A light scattering layer may be further included in the surface.

According to one embodiment of the present invention, the light scattering layer or the light scattering layer is not particularly limited as long as it can induce light scattering and improve the light detection efficiency of the organic light emitting device. Specifically, according to one embodiment of the present disclosure, the light scattering layer may be a structure in which scattering particles are dispersed in a binder, a film having irregularities, and / or a film having haze.

According to one embodiment of the present invention, the light scattering layer may be formed directly on the substrate by spin coating, bar coating, slit coating, or the like, or may be formed in a film form and attached.

According to an embodiment of the present invention, the organic light emitting element may be a flexible organic light emitting element. In this case, the substrate may comprise a flexible material. Specifically, the substrate may be a glass, a plastic substrate, or a film-like substrate in the form of a thin film which can be bent.

Although the material of the plastic substrate is not particularly limited, it may be a single layer or a multilayer film such as PET (polyethylene terephthalate), PEN (polyethylene naphthalate), PEEK (polyether ether ketone) have.

The present invention provides a display device including the organic light emitting device. In the display device, the organic light emitting diode may serve as a pixel or a backlight. Besides, the configuration of the display device may be applied to those known in the art.

The present specification provides a lighting apparatus including the organic light emitting element. In the illumination device, the organic light emitting element plays a role of a light emitting portion. In addition, configurations necessary for the illumination device can be applied to those known in the art.

One embodiment of the present invention provides a method of manufacturing the organic light emitting device. Specifically, one embodiment of the present disclosure provides a method of manufacturing a semiconductor device, comprising: preparing a substrate; Forming a first electrode comprising at least two conductive units on the substrate; Forming an auxiliary electrode spaced apart from the conductive unit and including at least two branch points having three or more branches; Forming at least one organic layer on the first electrode; And forming a second electrode on the organic material layer.

According to one embodiment of the present disclosure, the step of forming the first electrode may be to form the first electrode so as to include at least two conductive units and a conductive connection connected to each of the conductive units.

According to an embodiment of the present disclosure, the step of forming the auxiliary electrode may include forming an auxiliary electrode on one end of each conductive connection.

According to another aspect of the present invention, there is provided a method of manufacturing an organic light emitting diode, comprising the steps of: forming the first electrode and forming the auxiliary electrode; And forming a short-circuit prevention layer.

According to an embodiment of the present invention, the organic light emitting diode may emit white light having a color temperature of 2,000 K or more and 12,000 K or less.

Hereinafter, the present invention will be described in detail by way of examples with reference to the drawings. However, the embodiments according to the present disclosure can be modified in various other forms, and the scope of the present specification is not construed as being limited to the embodiments described below. Embodiments of the present disclosure are provided to more fully describe the present disclosure to those of ordinary skill in the art.

[Example]

After forming a short-circuiting layer on the substrate, a first electrode including a plurality of conductive units was formed using ITO, and aluminum (Al) was formed as a mesh as an auxiliary electrode. The area where the auxiliary electrode was exposed was insulated with a photosensitive insulating material, and an organic material layer including a light emitting layer and a second electrode were sequentially laminated to prepare an organic light emitting device.

Artificial pressure was applied to form a short-circuit defect in a part of the organic light-emitting device fabricated so that a short-circuit defect area was generated in a part of the conductive unit. Hereinafter, a method of detecting the short-cut defective area will be described with reference to the drawings.

FIG. 2 and FIG. 3 show images driven by the organic light emitting device manufactured in the embodiment.

Specifically, FIG. 2 illustrates a white-spot region of an organic light emitting device manufactured according to an embodiment. As shown in FIG. 2, the white point region is a pixel including a conductive unit in which a short circuit defect occurs, and is formed to have a higher luminance than surrounding pixels.

3 shows a dark-spot region of an organic light emitting device manufactured according to an embodiment. As can be seen from Fig. 2, the black spot phenomenon is a pixel including a conductive unit in which a short circuit defect occurs, and it can be seen that the short circuit defect does not cause light emission.

More specifically, Figs. 2 and 3 can refer to the step of detecting a conductive unit in which a short circuit fault has occurred.

4 is an enlarged view of a conductive unit in which a short circuit defect occurs in the organic light emitting device manufactured according to the embodiment. Specifically, FIG. 2 or FIG. 3 further enlarges a pixel including a conductive unit which is not operated due to a short-circuit defect, thereby finding a short-circuit defect region in the conductive unit, May be detected. The black dot in the circle shown in Fig. 4 represents a short-circuit defect region in which the conductive unit and the second electrode are in contact with each other.

Claims (8)

A first electrode including at least two conductive units, a second electrode opposed to the first electrode, at least one organic layer provided between the first electrode and the second electrode, And a short-circuit prevention part provided between the auxiliary electrode and each of the conductive units to electrically connect the auxiliary electrode and each of the conductive units.
Applying a voltage to the organic light emitting element from an external power source;
Detecting a white-spot region or a dark-spot region of the organic light emitting device, or detecting an area that is 30% or more higher than the operating temperature of the organic light emitting device when a short circuit defect does not occur Detecting a defective conductive unit; And
And detecting a short-circuit defect region in the conductive unit in which the short-circuit defect has occurred
A method of detecting a short-circuit defect region of an organic light-emitting device. The method according to claim 1,
Wherein a resistance from a region of the short-circuit prevention portion adjacent to the auxiliary electrode to an adjacent region of each of the conductive units is not less than 40 OMEGA and not more than 300,000 OMEGA. The method according to claim 1,
Wherein the step of applying the voltage further comprises preventing all the current from being concentrated in the conductive unit in which the short-circuit defect occurs due to the short-circuit prevention unit. The method according to claim 1,
Wherein the step of applying the voltage further comprises the step of emitting light above the normal luminance in the conductive unit in which the short-circuit defect has occurred, or the conductive unit in which the short-circuit defect has occurred does not operate. The method according to claim 1,
Wherein the material of the short-circuit prevention portion is the same or different from the material of the conductive unit. The method according to claim 1,
Wherein the short-circuit prevention portion includes a material different from the first electrode; Or a conductive connecting portion including a material which is the same as or different from the first electrode and has a length in a direction in which a current flows is longer than a width in a direction perpendicular thereto. The method according to claim 1,
One end of the short-circuit prevention portion is provided on at least one of the upper surface, the lower surface, and the side surface of the conductive unit,
And the other end of the short-circuit prevention portion is provided on at least one of an upper surface, a lower surface, and a side surface of the auxiliary electrode. The method according to claim 1,
Wherein the step of detecting the short-circuit defect region further includes the step of detecting the short-circuit defect region by enlarging the short-circuit-defective conductive unit.

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