KR101910468B1 - System and the method for producing vertical profile of atmospheric trace gas using multiple wavelength - Google Patents

Abstract

The present invention relates to a multi-wavelength, multi-wavelength, multi-wavelength, multi-wavelength, multi-wavelength, multi- The present invention relates to a system for calculating a vertical profile of an in-atmosphere micro-gas using the method of the present invention.
The atmospheric trace gas vertical profile calculation system using the multiple wavelengths generates simulated radiant luminance data by applying simulated trace gas vertical profiles and environment information on a pre-stored trace gas to the atmospheric radiation model, A simulated SCD-LUT generator 100 for deriving a simulated SCD from the data and generating a simulated SCD-LUT that matches a simulated SCD for each simulated trace gas vertical profiles; A multi-wavelength SCD measuring unit for deriving an observation SCD for a trace gas to be measured by measuring and adding the SCDs to the observed trace gas at different wavelengths by the DOAS using a fitting window of different wavelengths (200); And extracting a simulated SCD value coinciding with the observation SCD in a predetermined error range from the SCD-LUT and deriving a corresponding simulated trace gas vertical profile as a trajectory vertical profile of a target gas to be measured, (300). ≪ / RTI >

Description

TECHNICAL FIELD [0001] The present invention relates to a system and a method for calculating a vertical profile of an atmospheric trace gas using multiple wavelengths, and a method thereof. BACKGROUND ART < RTI ID = 0.0 >

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for calculating a vertical profile of an atmospheric trace gas present in the atmosphere and, more particularly, And more particularly, to a system and method for calculating an atmospheric trace gas vertical profile using multiple wavelengths, which enables to derive an actual atmospheric trace gas vertical profile for a standby state forecast from a vertical profile.

The Spectrum Fitting method is a technique for calculating the concentration of specific trace gases from the amount of radiant luminance dissipated by a specific absorption line of trace gases, air molecules or aerosols at ultraviolet or visible wavelengths, Satellite telemetry equipment such as OBS (Ozone Monitoring Instrument), SCHIAMACHY (Scanning Imaging Spectrometer for Atomspheric Chartography) and GOME-2 (Global Ozone Monitoring Experiment-2), and MAX-DOAS (Multi Axis Differential Optical Absorption Spectroscopy ), PANDORA, and Geostationary Environment Monitoring Sensor (GEMS), which will be launched in future, and Tempo (Tropospheric Emission: Monitoring pollution), Sentinel-4 It is one.

Using the above-described spectrum fitting method, the SCD error is relatively small, less than about 10%, when calculating the concentrations of trace gases (NO2, ozone, SO2, HCHO, etc.) The air mass factor (AMF) error exceeds 100%. The cause of the AMF error is largely due to the inaccuracy of the input data used in the AMF calculation. These model inputs are mostly obtained from the chemical transport model and include aerosol information such as aerosol optical depth (AOD) and single scattering albedo (SSA), geometric information such as solar zenith angle (SZA), viewing zenith angle (VZA) And vertical profiles of trace gases. Therefore, calculating accurate vertical profile information of trace gases is very important in increasing accuracy of trace gas calculation using DOAS method. Therefore, there is a need for a technique that can accurately calculate the vertical profiles of trace gases in order to increase the accuracy of the observation of trace gases.

SUMMARY OF THE INVENTION Accordingly, the present invention has been made keeping in mind the above problems occurring in the prior art, and it is an object of the present invention to provide an apparatus and method for estimating a temperature of a micro- After deriving the simulated slope integral concentration (SCD), an SCD look-up table (SCD-LUT: SCD-LUT) corresponding to each simulated trace gas vertical profile is generated and a multi- To obtain a simulated trace vertical profile with a simulated SCD value consistent with the observed SCD in the SCD look-up table from the SCD look-up table using a multi-wavelength, And to provide a profile calculation system and a method thereof.

In order to achieve the above object, the present invention provides a multi-wavelength atmospheric trace vertical profile calculating system (1)

The simulated trace vertical profiles and the environmental information of the preliminarily stored trace gas are applied to an RTM (Radiation Transfer Model) to generate simulated radiation luminance data, and the generated simulated radiation luminance (Hereinafter, referred to as 'SCD', hereinafter referred to as 'SCD') derived from the data of the simulated slope layer integral density lookup table (hereinafter, referred to as 'SCD') obtained by matching the simulated SCDs of the respective simulated trace gas vertical profiles A SCD-LUT generation unit 100 for generating a look-up table (LUT) called an 'SCD-LUT';

A multi-wavelength SCD measuring unit for deriving an observation SCD for a trace gas to be measured by measuring and adding the SCDs to the observed trace gas at different wavelengths by the DOAS using a fitting window of different wavelengths (200); And

A tracer vertical profile deriving unit for deriving a simulated SCD value consistent with the observation SCD from the SCD-LUT and deriving a corresponding simulated trajectory vertical profile as a trajectory vertical profile for the subject trajectory 300). ≪ / RTI >

The simulated SCD-LUT generator (100)

A simulated trace gas vertical profile DB portion 110 for storing simulated trace gas vertical profiles;

An environment information DB unit 120 for storing environmental information including aerosols, geometry, and topographical information;

A simulated radiant luminance data generator 130 for generating the simulated radiant luminance data by applying the simulated gas vertical profile and the environment information to the RTM;

A simulated SCD derivation unit (140) for extracting SCDs having a minimum difference in solar radiation absorbed by the model equation for simulated radiance data to derive a simulated SCD for the simulated trace gas vertical profiles; And

And a simulated SCD-LUT unit 150 for generating an SCD-LUT that matches the simulated trace gas vertical profiles with the simulated SCDs.

The simulated trace gas vertical profile,

Can be configured to reflect the shape of the vertical profiles that can come from different VCD (Vertical Column Density) conditions.

The simulated SCD deriving unit (140)

And the SCD value that minimizes the SCD value is derived as a simulated SCD.

는 파장 λ의 태양으로부터 관측된 태양 복사 조도,

는 지구에서 반사되는(매질을 통과한) 파장 λ의 대기상한에서의 태양 복사 조도 (irradiance),

는 λ의 보정 값, offset(λ)는 광학기기에서 발생하는 미광(stray light)와 암전류(dark current)에 의해 발생하는 시그널을 나타내는 항, Sj(λ)는 파장 λ에서 물질 j의 흡수 단면적, Cj는 물질 j의 경사 층적분농도 (SCD),

는 미량 기체들에 발생하는 파장에 따른 빠른 흡수 (narrow band)에 의한 빛의 소멸,

는 에어로졸 및 대기물질 (N2, O2)에 의한 느린 흡수 (broad band)에 의한 빛의 소멸.here,

≪ / RTI > is the solar irradiance observed from the < RTI ID = 0.0 >

Is the irradiance of the solar radiation at the upper atmosphere limit of the wavelength λ reflected through the medium (through the medium)

(Λ) is a correction value of λ, offset (λ) is a term indicating a signal generated by stray light and dark current generated in an optical device, Sj (λ) is an absorption cross- Cj is the slope layer integral concentration (SCD) of material j,

Is the extinction of light due to the narrow band due to the wavelengths generated in the trace gases,

Is the disappearance of light by a broad band due to aerosols and atmospheric substances (N2, O2).

According to another aspect of the present invention, there is provided a method for calculating an atmospheric trace gas vertical profile using multiple wavelengths,

The method for calculating the atmospheric trace gas vertical profile by the atmospheric trace gas vertical profile calculating system including the simulated SCD-LUT generating unit 100, the multi-wavelength SCD measuring unit 200 and the trace gas profile extracting unit 300 As a result,

The simulated SCD-LUT generation unit 100 applies simulated trace vertical profiles and environment information of a pre-stored trace gas to an RTM (Radiative Transfer Model) And generates a luminance data and derives a simulated slant layer density (SCD) from the generated simulated radiant luminance data to match a simulated SCD for each simulated trace gas vertical profiles A simulated SCD-LUT generation process S100 for generating a simulated gradient layer integral concentration lookup table (hereinafter referred to as 'SCD-LUT', LUT: Look Up Table);

The multi-wavelength SCD measuring unit 200 measures the SCDs of the trace target gas at different wavelengths by the DOAS applying the fitting window of different wavelengths, and then sums the SCDs for the trace target gas, A multi-wavelength SCD measurement process (S200) for deriving an observation SCD; And

After the trace vertical profile deriving unit 300 extracts a simulated SCD value coinciding with the observed SCD within a certain error range from the SCD-LUT, the corresponding simulated trace gas vertical profile is compared with the tracer gas vertical profile And deriving a trace vertical profile based on the profile (S300).

The simulated SCD-LUT generation process (SlOO)

A simulated radiant luminance data generation step (S110) of generating simulated radiant luminance data by applying the simulated gas vertical profile and the environment information to the RTM;

A simulated SCD derivation step (S120) of extracting SCDs having a minimum difference in solar radiation absorbed by the model equation for simulated radiance data to derive a simulated SCD for the simulated trace gas vertical profiles; And

And a simulated SCD-LUT generation process (S130) for generating an SCD-LUT that matches the simulated trace gas vertical profiles with the simulated SCDs.

The simulated SCD derivation process (S120)

And the SCD value that minimizes the SCD value is derived as a simulated SCD.

는 파장 λ의 태양으로부터 관측된 태양 복사 조도,

는 지구에서 반사되는(매질을 통과한) 파장 λ의 대기상한에서의 태양 복사 조도 (irradiance),

는 λ의 보정 값, offset(λ)는 광학기기에서 발생하는 미광(stray light)와 암전류(dark current)에 의해 발생하는 시그널을 나타내는 항, Sj(λ)는 파장 λ에서 물질 j의 흡수 단면적, Cj는 물질 j의 경사 층적분농도(SCD),

는 미량 기체들에 발생하는 파장에 따른 빠른 흡수 (narrow band)에 의한 빛의 소멸,

는 에어로졸 및 대기물질 (N2, O2)에 의한 느린 흡수 (broad band)에 의한 빛의 소멸.here,

≪ / RTI > is the solar irradiance observed from the < RTI ID = 0.0 >

Is the irradiance of the solar radiation at the upper atmosphere limit of the wavelength λ reflected through the medium (through the medium)

(Λ) is a correction value of λ, offset (λ) is a term indicating a signal generated by stray light and dark current generated in an optical device, Sj (λ) is an absorption cross- Cj is the slope layer integral concentration (SCD) of material j,

Is the extinction of light due to the narrow band due to the wavelengths generated in the trace gases,

Is the disappearance of light by a broad band due to aerosols and atmospheric substances (N2, O2).

The present invention having the above-described structure enables accurate trace gas vertical profiles for atmospheric trace gases such as NO2 to be calculated using wavelength sensitivity characteristics based on ultraspectral observation at multiple wavelengths in satellites, The NO2 and other trace gas vertical profiles can be re-analyzed to produce a more reliable trace gas vertical profile. By this means, it is possible to obtain more accurate micro gas vertical layer profiles such as NO2 through satellites Thereby providing an effect of enabling the calculation of the concentration.

In addition, the present invention can calculate the accurate trajectory vertical profile, so that the mixing ratio of the surface trace gas of interest in the atmospheric pollutant prediction can be calculated from the satellites, so that the geostationary satellite can be used And provides an effect of enabling high temporal and spatial atmospheric environment prediction.

1 is a block diagram of an airborne trace gas vertical profile calculating system 1 using multiple wavelengths according to an embodiment of the present invention.
2 is a diagrammatic representation of a narrow band due to wavelengths occurring in trace gases and a broad band due to aerosols and atmospheric substances;
Fig. 3 is a view showing the transmittance of light according to the wavelengths of ultraviolet (UV) and visible light and the observed values of NO2 concentration in trace gases calculated at respective wavelengths. Fig.
4 is a flow chart illustrating a process of calculating a vertical profile of atmospheric trace gases using multiple wavelengths according to an embodiment of the present invention.
FIG. 5 is a flowchart illustrating a detailed process of a simulated SCD-LUT generation process (S100) in the process of FIG.

In the following description of the present invention, detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear.

The embodiments according to the concept of the present invention can be variously modified and can take various forms, so that specific embodiments are illustrated in the drawings and described in detail in the specification or the application. It is to be understood, however, that the intention is not to limit the embodiments according to the concepts of the invention to the specific forms of disclosure, and that the invention includes all modifications, equivalents and alternatives falling within the spirit and scope of the invention. Also, the word "exemplary" is used herein to mean "serving as an example, instance, or illustration." Any aspect described herein as "exemplary " is not necessarily to be construed as preferred or advantageous over other aspects.

It is to be understood that when an element is referred to as being "connected" or "connected" to another element, it may be directly connected or connected to the other element, . On the other hand, when an element is referred to as being "directly connected" or "directly connected" to another element, it should be understood that there are no other elements in between. Other expressions that describe the relationship between components, such as "between" and "between" or "neighboring to" and "directly adjacent to" should be interpreted as well.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The singular expressions include plural expressions unless the context clearly dictates otherwise. In this specification, the terms "comprises ", or" having ", or the like, specify that there is a stated feature, number, step, operation, , Steps, operations, components, parts, or combinations thereof, as a matter of principle.

Hereinafter, the present invention will be described in more detail with reference to the accompanying drawings showing embodiments of the present invention.

1 is a block diagram of an airborne trace gas vertical profile calculating system 1 (hereinafter referred to as a profile calculating system 1) using multiple wavelengths according to an embodiment of the present invention.

1, the profile calculation system 1 includes a simulated SCD-LUT generation unit 100, a multi-wavelength SCD measurement unit 200, and a trace vertical profile deriving unit 300.

The simulated SCD-LUT generation unit 100 applies simulated trace vertical profiles and environment information of a pre-stored trace gas to an RTM (Radiative Transfer Model) And generates a luminance data and derives a simulated slant layer density (SCD) from the generated simulated radiant luminance data to match a simulated SCD for each simulated trace gas vertical profiles (Hereinafter, referred to as 'SCD-LUT', Look Up Table).

The simulated SCD-LUT generator 100 includes a simulated trace vertical profile DB 110, an environment information DB 120, a simulated radiance data generator 130, a simulated SCD deriving unit 140, And a simulated SCD-LUT unit 150.

The simulated trace gas vertical profile DB portion 110 stores pre-calculated simulated trace gas vertical profiles by applying a chemical transport model (CTM). The simulated trace gas vertical profile reflects the shape of all vertical profiles that can come from various VCD (Vertical Column Density) conditions. At this time, refer to the trace gas profile of the chemical transport model (CTM). The trace gases include NO2, ozone, SO2, HCHO, and the like.

SZA (solar optical depth), VZA (SZA), and the like, which are input to the RTM together with the simulated trace vertical profile to generate simulated radiation luminance data for the simulated trace gas vertical profiles, viewing zenith angle, etc., and environmental information including topographic information.

The simulated radiant luminance data generator 130 is configured to generate the simulated radiant luminance data by applying the simulated trace gas vertical profile and the environment information to the RTM.

The simulated SCD derivation unit 140 extracts SCDs having a minimum difference (?) Of the solar radiation absorbed by the model equation for simulated radiant luminance data to derive simulated SCDs for the simulated trace gas vertical profiles do.

에 의해 도출된다. 여기서, χ는 최소자승법에 의해 얻어질 수 있다.≪ RTI ID = 0.0 &

Lt; / RTI > Here,? Can be obtained by the least squares method.

는 복사 조도,

는 파장 λ의 태양으로부터 관측된 태양 복사 조도,

는 지구에서 반사되는(매질을 통과한) 파장 λ의 대기상한에서의 태양 복사 조도 (irradiance),

는 λ의 보정 값(실제로 분광기(spectrometer)로 빛을 측정할 시 파장이 틀어지는 현상(shift)을 보정하는 항), offset(λ)는 광학기기에서 발생하는 미광(stray light)와 암전류(dark current)에 의해 발생하는 시그널을 나타내는 항, Sj(λ)는 파장 λ에서 물질 j의 흡수 단면적, Cj는 물질 j의 경사 층적분농도 (SCD),

는 미량 기체들에 발생하는 파장에 따른 빠른 흡수 (narrow band)에 의한 빛의 소멸,

는 에어로졸 및 대기물질 (N2, O2 등)에 의한 느린 흡수 (broad band)에 의한 빛의 소멸을 나타내는 다항식이다.here,

Is a radiance,

≪ / RTI > is the solar irradiance observed from the < RTI ID = 0.0 >

Is the irradiance of the solar radiation at the upper atmosphere limit of the wavelength λ reflected through the medium (through the medium)

(Λ) is the correction value of λ (the term correcting the shift in wavelength when measuring light with a spectrometer), offset (λ) is the stray light and dark current ), Sj (λ) is the absorption cross-sectional area of substance j at wavelength λ, Cj is the slope layer integral density (SCD) of substance j,

Is the extinction of light due to the narrow band due to the wavelengths generated in the trace gases,

Is a polynomial representing the extinction of light by a broad band caused by aerosols and atmospheric substances (N2, O2, etc.).

는 에어로졸 및 대기물질 (N2, O2 등)에 의한 느린 흡수 (broad band)에 의한 빛의 소멸(흡수)을 나타내는 것으로, 도 2와 같이, 파장 변화에 따라서 느리게 변하기 때문에 저차원 다항식(예, 2차원으로 표현되는 경우 ax²+bx+c)으로 표현된다.remind

(Absorption) of light by a broad band caused by an aerosol and an atmospheric substance (N2, O2, etc.). As shown in Fig. 2, Ax ² + bx + c).

2 is a diagram schematically showing a narrow band due to a wavelength generated in a trace gas and a broad band due to an aerosol and an atmospheric substance.

Referring again to FIG. 1, the SCD-LUT unit 150 is configured to store the SCD-LUT that matches the simulated gas vertical profiles of the simulated SCD-LUT unit 150 with the simulated SCD derived from the simulated SCD deriving unit 140.

The multi-wavelength SCD measuring unit 200 is configured to measure the observation SCD by applying a plurality of fitting windows for the multi-wavelengths to the observed trace gas in the satellite in order to derive the trace gas vertical profile.

FIG. 3 is a graph showing the transmittance of light according to the ultraviolet (UV) and visible light wavelengths and the observed values of NO2 concentration in the trace gas calculated at each wavelength.

As shown in FIG. 3, in the case of the visible region, the photons of the sun can reach the surface of the earth, so that the NO 2 SCD of the entire atmosphere can be calculated. However, in the ultraviolet region, the amount of sunlight reaching the surface of the earth is very small due to the influence of ozone, which exists in the stratosphere in large quantities. Furthermore, as the wavelength becomes shorter, the amount of reaching the ground surface decreases as the wavelength becomes shorter, and as the wavelength becomes shorter, only the influence of NO2 present in the upper layer is received. That is, it is possible to calculate the SCD of trace gases such as NO2 present in the stratosphere or in the upper troposphere by measuring the trace gases in the atmosphere using different wavelengths.

That is, the multi-wavelength SCD measuring unit 200 of FIG. 1 calculates the SCD values corresponding to the respective wavelengths by applying the DOAS using the fitting windows having different wavelengths to measure the concentration of the trace gas to be observed And then calculates the observed SCD value by summing them.

The trace vertical profile deriving unit 300 extracts the SCD value that coincides with the observed SCD value in the error range from the simulated SCD-LUT unit 150, and subtracts the corresponding simulated trace vertical profile from the observed SCD value in a minute amount corresponding to the observed SCD value And extracts it as a gas vertical profile.

That is, the observation SCD has an SCD value for a trace gas measured in an oblique direction on a satellite, and the extracted trace gas vertical profile has a concentration distribution of a trace gas distributed vertically on the surface of the earth.

4 is a flowchart illustrating a process of calculating a vertical profile of atmospheric trace gas using multiple wavelengths according to an embodiment of the present invention.

4, the atmospheric trace gas vertical profile calculation method using the multiple wavelengths includes a simulated SCD-LUT generation unit 100, a multi-wavelength SCD measurement unit 200, and a trace vertical profile deriving unit 300 (S100), a multi-wavelength SCD measurement process (S200), and a trace gas vertical profile deriving process (S300) are performed by the atmospheric trace gas vertical profile calculating system. .

The simulated SCD-LUT generation unit 100 applies simulated trace vertical profiles and environment information of a pre-stored trace gas to an RTM (Radiative Transfer Model) And generates a luminance data and derives a simulated slant layer density (SCD) from the generated simulated radiant luminance data to match a simulated SCD for each simulated trace gas vertical profiles And performs a simulated SCD-LUT generation process (S100) for generating a simulated gradient layer integral concentration lookup table (hereinafter, referred to as 'SCD-LUT').

FIG. 5 is a flowchart illustrating a detailed process of a simulated SCD-LUT generation process (S100) in the process of FIG.

Referring to FIG. 5, the simulated SCD-LUT generation process (S100) will be described in detail. First, the simulation radiance data generation unit 130 applies the simulated trace vertical profile and the environment information to the RTM to generate simulation radiance data And performs a simulated radiant brightness data generation process (S110).

Next, the simulated SCD deriving unit 140 extracts the SCDs having the minimum difference of the solar radiation absorbed by the model equation with respect to the simulated radiance data, and derives a simulated SCD for the simulated trace gas vertical profiles A simulated SCD derivation process (S120) is performed. In this case, as described above, the simulated SCD value that minimizes the radiant luminance value derived from the simulated trace gas vertical profiles and the absorption radiance calculated from the model equation is as described above.

Thereafter, the simulated SCD-LUT unit 150 performs a simulated SCD-LUT generation process (S130) for generating an SCD-LUT that matches the simulated gas vertical profiles with the simulated SCDs.

1, after the simulated SCD-LUT is generated, the multi-wavelength SCD measuring unit 200 performs a DOA by applying fitting windows of different wavelengths to each other A multi-wavelength SCD measurement process (S200) is performed in which the SCDs for the observed trace gases at different wavelengths are measured and summed to derive the observed SCD for the target trace gas. This process is actually a process of observing the Earth's atmosphere in a satellite by spectroscopic techniques.

Thereafter, the micro-scale vertical profile deriving unit 300 extracts a simulated SCD value that coincides with the observed SCD within a certain error range from the SCD-LUT, and then extracts a corresponding simulated micro-gas vertical profile from the measured micro- The microgass vertical profile deriving step (S300) is performed to derive the microgass vertical profile. In this process, the trace gas vertical profile corresponding to the observed SCD value is derived.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments. It will be apparent to those skilled in the art that various modifications may be made without departing from the scope of the present invention. Accordingly, the true scope of the present invention should be determined by the technical idea of the appended claims.

1: Profile calculation system

Claims (8)

The simulated trace vertical profiles and the environmental information of the preliminarily stored trace gas are applied to an RTM (Radiation Transfer Model) to generate simulated radiation luminance data, and the generated simulated radiation luminance (Hereinafter, referred to as 'SCD', hereinafter referred to as 'SCD') derived from the data of the simulated slope layer integral density lookup table (hereinafter, referred to as 'SCD') obtained by matching the simulated SCDs of the respective simulated trace gas vertical profiles A SCD-LUT generation unit 100 for generating a look-up table (LUT) called an 'SCD-LUT';
A multi-wavelength SCD measuring unit for deriving an observation SCD for a trace gas to be measured by measuring and adding the SCDs to the observed trace gas at different wavelengths by the DOAS using a fitting window of different wavelengths (200); And
A tracer vertical profile deriving unit for deriving a simulated SCD value consistent with the observation SCD from the SCD-LUT and deriving a corresponding simulated trajectory vertical profile as a trajectory vertical profile for the subject trajectory 300) comprising a plurality of wavelengths.
The method of claim 1, wherein the simulated trace gas vertical profile
A system for calculating an atmospheric trace gas vertical profile using multiple wavelengths that is configured to reflect shapes of vertical profiles that can come from different VCD (Vertical Column Density) conditions.
2. The apparatus of claim 1, wherein the simulated SCD-LUT generator (100)
A simulated trace gas vertical profile DB portion 110 for storing simulated trace gas vertical profiles;
An environment information DB unit 120 for storing environmental information including aerosols, geometry, and terrain information;
A simulated radiant luminance data generator 130 for generating the simulated radiant luminance data by applying the simulated gas vertical profile and the environment information to the RTM;
A simulated SCD derivation unit (140) for extracting SCDs having a minimum difference in solar radiation absorbed by the model equation for simulated radiance data to derive a simulated SCD for the simulated trace gas vertical profiles; And
And a simulated SCD-LUT unit (150) for generating an SCD-LUT that matches the simulated trace gas vertical profiles with the simulated SCDs.
4. The method of claim 3, wherein the simulated SCD derivation unit (140)

Is derived to the simulated SCD,
here,

≪ / RTI > is the solar irradiance observed from the < RTI ID = 0.0 >

Is the irradiance of the solar radiation at the upper atmosphere limit of the wavelength λ reflected through the medium (through the medium)

(Λ) is a correction value of λ, offset (λ) is a term indicating a signal generated by stray light and dark current generated in an optical device, Sj (λ) is an absorption cross- Cj is the slope layer integral concentration (SCD) of material j,

Is the extinction of light due to the narrow band due to the wavelengths generated in the trace gases,

Is an airborne trace gas vertical profile computation system using multiple wavelengths, the disappearance of light by a broad band caused by aerosols and atmospheric substances (N2, O2).
The method for calculating the atmospheric trace gas vertical profile by the atmospheric trace gas vertical profile calculating system including the simulated SCD-LUT generating unit 100, the multi-wavelength SCD measuring unit 200 and the trace gas profile extracting unit 300 As a result,
The simulated SCD-LUT generation unit 100 applies simulated trace vertical profiles and environment information of a pre-stored trace gas to an RTM (Radiative Transfer Model) And generates a luminance data and derives a simulated slant layer density (SCD) from the generated simulated radiant luminance data to match a simulated SCD for each simulated trace gas vertical profiles A simulated SCD-LUT generation process S100 for generating a simulated gradient layer integral concentration lookup table (hereinafter referred to as 'SCD-LUT', LUT: Look Up Table);
The multi-wavelength SCD measuring unit 200 measures the SCDs of the trace target gas at different wavelengths by the DOAS applying the fitting window of different wavelengths, and then sums the SCDs for the trace target gas, A multi-wavelength SCD measurement process (S200) for deriving an observation SCD; And
After the trace vertical profile deriving unit 300 extracts a simulated SCD value coinciding with the observed SCD within a certain error range from the SCD-LUT, the corresponding simulated trace gas vertical profile is compared with the tracer gas vertical profile Calculating a vertical profile of the micro-gas using the multi-wavelength including the step of deriving the profile of the micro-gas vertical profile (S300).
The method of claim 5, wherein the simulated trace gas vertical profile
A method for calculating an atmospheric trace gas vertical profile using multiple wavelengths that is configured to reflect shapes of vertical profiles that can come from different VCD (Vertical Column Density) conditions.
6. The method of claim 5, wherein the simulated SCD-LUT generation process (SlOO)
A simulated radiant luminance data generation step (S110) of generating simulated radiant luminance data by applying the simulated gas vertical profile and the environment information to the RTM;
A simulated SCD derivation step (S120) of extracting SCDs having a minimum difference in solar radiation absorbed by the model equation for simulated radiance data to derive a simulated SCD for the simulated trace gas vertical profiles; And
And generating a SCD-LUT that matches the simulated trace gas vertical profiles with the simulated SCDs (S130); and generating a simulated SCD-LUT using the multiple wavelengths.
8. The method of claim 7, wherein the simulated SCD derivation step (S120)

0.0 > SCD < / RTI > value that minimizes < RTI ID =

≪ / RTI > is the solar irradiance observed from the < RTI ID = 0.0 >

Is the irradiance of the solar radiation at the upper atmosphere limit of the wavelength λ reflected through the medium (through the medium)

(Λ) is a correction value of λ, offset (λ) is a term indicating a signal generated by stray light and dark current generated in an optical device, Sj (λ) is an absorption cross- Cj is the slope layer integral concentration (SCD) of material j,

Is the extinction of light due to the narrow band due to the wavelengths generated in the trace gases,

Is a method for calculating the atmospheric trace gas vertical profile using multiple wavelengths, which is extinction of light by a broad band by aerosols and atmospheric substances (N2, O2).

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