KR101909368B1 - Method for producing graphene - Google Patents
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- KR101909368B1 KR101909368B1 KR1020167034576A KR20167034576A KR101909368B1 KR 101909368 B1 KR101909368 B1 KR 101909368B1 KR 1020167034576 A KR1020167034576 A KR 1020167034576A KR 20167034576 A KR20167034576 A KR 20167034576A KR 101909368 B1 KR101909368 B1 KR 101909368B1
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B32/00—Carbon; Compounds thereof
- C01B32/15—Nano-sized carbon materials
- C01B32/182—Graphene
- C01B32/184—Preparation
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B32/00—Carbon; Compounds thereof
- C01B32/05—Preparation or purification of carbon not covered by groups C01B32/15, C01B32/20, C01B32/25, C01B32/30
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45553—Atomic layer deposition [ALD] characterized by the use of precursors specially adapted for ALD
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45555—Atomic layer deposition [ALD] applied in non-semiconductor technology
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/02—Amorphous compounds
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/80—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70
- C01P2002/82—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70 by IR- or Raman-data
Abstract
The graphene manufacturing method includes a carbon-containing layer forming step of forming a carbon-containing layer 7 on the base layer 1 by atomic layer deposition, a first heat-treating step of forming an amorphous carbon layer 9 from the carbon- And a second heat treatment step of forming graphenes 11 from the amorphous carbon layer. The temperature in the first heat treatment step is preferably 600 ° C or lower. When the carbon-containing layer contains a polymer, it is preferable that the number of aromatic rings contained in the monomer constituting the polymer is 1 or less.
Description
This application is based on Japanese Patent Application No. 2014-221380, filed on October 30, 2014, the content of which is incorporated herein by reference.
This disclosure relates to a method of making graphene.
Since graphene has excellent properties, its use for various purposes has been studied. As a manufacturing method of graphene, there has been proposed a method of forming an organic polymer film by spin coating and then heat-treating the organic polymer film (see Patent Document 1).
In the technique described in
According to an aspect of the present disclosure, a method of manufacturing graphene includes a carbon-containing layer formation step of forming a carbon-containing layer on an underlayer by atomic layer deposition, a first heat treatment step of forming an amorphous carbon layer as the carbon- And a second heat treatment step of forming graphene with the amorphous carbon layer. According to the method for producing graphene according to an aspect of the present disclosure, graphene having a uniform film thickness can be produced.
The above and other objects, features and advantages of the present disclosure will become more apparent from the following detailed description with reference to the accompanying drawings.
1A is a cross-sectional view showing a configuration of a sapphire substrate having a base layer.
1B is a cross-sectional view showing a self-assembled monolayer formation process.
1C is a cross-sectional view showing a step of forming a carbon-containing layer.
1D is a cross-sectional view showing a first heat treatment process.
1E is a cross-sectional view showing a second heat treatment process.
Fig. 2 is an explanatory diagram showing the results of analysis of graphene produced in Example 1 by Raman spectroscopy. Fig.
3 is an explanatory view showing the result of analysis of the amorphous carbon layer formed by the first heat treatment step by Raman spectroscopy.
4 is an explanatory diagram showing the results of analysis of graphene produced in the comparative example by Raman spectroscopy.
Embodiments of the present disclosure will be described. In the carbon-containing layer formation step, a carbon-containing layer is formed on the base layer by atomic layer deposition (ALD). The conditions in the step of forming the carbon-containing layer can be, for example, as follows.
Substrate temperature: 50 to 500 占 폚.
Pressure: 0.1 Pa to atmospheric pressure.
Materials used to form carbon-containing layers: terephthalic acid dichloride, ethylenediamine.
As a material used for forming the carbon-containing layer, it is preferable to use two or more kinds (for example, terephthalic acid dichloride and ethylenediamine) in combination.
Examples of the material of the carbon-containing layer include polyamide (PA), polyimide (PI), polyethylene terephthalate (PET), acrylic resin (PMMA) and polycarbonate (PC). The material of the carbon-containing layer may be a compound of a metal and carbon (for example, AlCHO). The film thickness of the carbon-containing layer may be, for example, from several nm to several hundreds nm. In the present specification, the film thickness means a value measured by using an apparatus of ellipsometry.
The carbon-containing layer may comprise, for example, a polymer. In this case, the number of aromatic rings (for example, benzene ring, naphthalene ring, anthracene ring, etc.) contained in the monomers constituting the polymer is preferably 1 or less. When the number of aromatic rings contained in the monomer constituting the polymer is 1 or less, the carbon amount per unit area in the carbon-containing layer becomes more uniform. As a result, uniformity of film thickness of graphene is further improved.
The carbon-containing layer may be formed directly on the base layer, or may be formed on the self-assembled monolayer when the base layer has a self-organizing monolayer.
As the material of the underlayer, for example, at least two kinds of alloys of Co, Fe, Ni, Cu, Ru, Rh, Pd, Pt, Au, Ir, Sc, Ti, Al, Ag, Mn, Cr, . The film thickness of the base layer can be, for example, several nm to several hundreds nm. The underlayer can be formed by, for example, a vapor deposition method, a sputtering method, a CVD method, or an atomic layer deposition (ALD) method.
The base layer can be formed, for example, on a substrate. As the material of the substrate, for example, sapphire, magnesium oxide, quartz, Si and the like can be given. In the case of a Si substrate, an SiO 2 film may be provided on the surface.
In the first heat treatment step, an amorphous carbon layer is formed from the carbon-containing layer. The amorphous carbon layer is a layer at least a part of which is amorphous carbon. The temperature in the first heat treatment step is preferably 600 占 폚 or lower, more preferably 50 占 폚 to 600 占 폚. Within this range, the amount of impurities (O, N, H, etc.) derived from the carbon-containing layer remaining in graphene can be further reduced.
The time of the first heat treatment step may be, for example, 0.1 to 100 hours. Within this range, the film quality of graphene is further improved. The atmospheric gas in the first heat treatment step may be, for example, an inert gas (e.g., N 2 , Ar, etc.). When the atmospheric gas is an inert gas, the film quality of the graphene is further improved. The pressure in the first heat treatment step may be, for example, atmospheric pressure or reduced pressure (for example, 10 -6 to 10 5 Pa). In this case, the film quality of graphene is further improved.
It is preferable that at least the carbon-containing layer formation step and the first heat treatment step are continuously performed in vacuum in the production process of graphene. In this case, unnecessary mixing of the carbon source can be suppressed, so that the film thickness of the graphene can be more accurately controlled. In this specification, the term " continuous " means treatment without being exposed to the atmosphere.
In the second heat treatment step, graphene is formed by an amorphous carbon layer. The graphene may be a carbon crystal structure of a monoatomic layer or a carbon crystal structure of a plurality of atomic layers. The plurality of atomic layers are, for example, nine or less atomic layers. The carbon crystal structure of a plurality of atomic layers may be referred to as a multi-layer graphene or a stacked graphene.
The temperature in the second heat treatment step is preferably higher than 600 ° C and not higher than 1200 ° C. Within this range, the film quality of graphene is further improved.
The time of the second heat treatment step may be, for example, 0.1 to 100 hours. Within this range, the film quality of graphene is further improved. The second heat treatment step may be performed in a vacuum or in an atmospheric gas. As the atmospheric gas, for example, an inert gas (for example, N 2 , Ar, etc.) can be mentioned. When the second heat treatment step is performed in vacuum or in the atmosphere gas described above, the film quality of the graphene is further improved. The pressure in the second heat treatment step may be, for example, atmospheric pressure or reduced pressure (for example, 10 -6 to 10 5 Pa). In this case, the film quality of graphene is further improved.
It is preferable that at least the steps from the first heat treatment step to the second heat treatment step are continuously performed in vacuum in the manufacturing process of graphene. In this case, unnecessary mixing of the carbon source can be suppressed, so that the film thickness of the graphene can be more accurately controlled.
A self-organizing monolayer may be formed between the base layer and the carbon-containing layer. The self-organizing monolayer promotes bonding between the material used to form the carbon-containing layer and the ground layer. As a result, the film thickness of the carbon-containing layer hardly changes in the initial stage of formation of the carbon-containing layer. As a result, variation in the film thickness of graphene can be suppressed.
Examples of the material of the self-organizing monolayer include APS (3-aminopropyltriethoxysilane) and AEAPS (3- (2-aminoethyl) -aminopropyltrimethoxysilane). The thickness of the self-assembled monolayer may be, for example, 0.01 to 100 nm.
As a method of forming the self-assembled monolayer, for example, there are a dry system in which monomolecular monomolecules (molecules constituting a self-organizing monolayer) are vapor-fed into a substrate, a wet system in which the substrate is immersed in a liquid containing a self- .
It is preferable that the functional group contained in the self-organizing monolayer is combined with a functional group contained in the carbon-containing layer. In this case, fluctuations in the film thickness of graphene can be further suppressed.
It is preferable to form a self-organizing monolayer in a vacuum, to form a self-organizing monolayer, and to carry out a carbon-containing layer forming process continuously. In this case, unnecessary mixing of the carbon source can be suppressed, so that the film thickness of the graphene can be more accurately controlled.
(Example 1)
1. Manufacturing method of graphene
First, as shown in Fig. 1A, a
Then, as shown in Fig. 1B, a self-organizing
Then, as shown in Fig. 1C, a carbon-containing
Substrate temperature: 120 占 폚.
Pressure: 133 Pa.
Materials used to form carbon-containing layer (7): terephthalic acid dichloride and ethylenediamine.
The material of the carbon-containing
Subsequently, the first heat treatment step was carried out in succession to the carbon-containing layer formation step. The conditions of the first heat treatment step are as follows.
Temperature: 600 ° C
Time: 10 minutes
Atmosphere gas: Vacuum
Pressure: less than 1 x 10-3 Pa
As a result, as shown in Fig. 1D, the
Subsequently, a second heat treatment step was performed in succession to the first heat treatment step. The conditions of the second heat treatment step are as follows.
Temperature: 800 ° C
Time: 20 minutes
Atmosphere gas: Vacuum
Pressure: less than 1 x 10-3 Pa
As a result, as shown in FIG. 1E, the
2. Evaluation of graphene
The graphene thus prepared was analyzed by Raman spectroscopy. The results are shown in Fig. The waveform shown in Fig. 2 was specific to graphene. Thus, it was confirmed that graphene could be produced by the above-described production method.
Further, in the waveform of FIG. 2, the ratio of G band that appears in the 2D band 1580㎝ -1 vicinity appear at -1 2700㎝ was 2D / G = 2.5. From this, it was confirmed that the film thickness of graphene was uniform.
Further, in the waveform of FIG. 2, the ratio of D band to G band that appears near the 1300㎝ -1 appears at 1580㎝ -1 was a G / D = 26. From this, it was confirmed that the film quality of graphene was good.
Further, the layer generated by the first heat treatment step was analyzed by Raman spectroscopy. The results are shown in Fig. The waveform shown in Fig. 3 was specific to amorphous carbon. Therefore, it was confirmed that the amorphous carbon layer was formed by the first heat treatment step.
3. Effect of manufacturing method of graphene
According to the method for producing graphene of this embodiment, graphene having uniform film thickness and good film quality can be produced. Further, according to the graphene manufacturing method of this embodiment, the film thickness of the graphene can be precisely controlled.
(Comparative Example)
1. How to deposit
Basically, it is the same as that of Example 1, but the second heat treatment step was carried out immediately after the carbon-containing layer forming step and without carrying out the first heat treatment step.
2. Evaluation of membrane
The formed film was analyzed by Raman spectroscopy. The results are shown in Fig. The waveform shown in Fig. 4 has a feature that the intensity of the D band with respect to the G band is high. From this, it can be seen that graphene, which is very poor in film quality, is generated in this comparative example.
(Example 2)
Basically, graphene is produced in the same manner as in Example 1 above. However, in this embodiment, the material of the carbon-containing
(Example 3)
Basically, graphene is produced in the same manner as in Example 1 above. However, in this embodiment, the temperature in the first heat treatment step was set to 500 캜. Also in this embodiment, it is possible to manufacture graphene substantially the same as in the first embodiment.
(Example 4)
Basically, graphene is produced in the same manner as in Example 1 above. However, in this embodiment, the temperature in the second heat treatment step was set at 750 캜. Also in this embodiment, it is possible to manufacture graphene substantially the same as in the first embodiment.
(Example 5)
Basically, graphene is produced in the same manner as in Example 1 above. However, in this embodiment, formation of the self-organizing
(Example 6)
Basically, graphene is produced in the same manner as in Example 1 above. However, in this embodiment, the
Although the embodiment of the present disclosure has been described above, the present invention is not limited to the above embodiment, and various forms can be employed.
For example, in Examples 1 to 6, the film thickness of the carbon-containing
The functions of one component in the above embodiment may be dispersed as a plurality of components or the functions of a plurality of components may be integrated into one component. Note that a part of the configuration of the above embodiment may be replaced with a known configuration having the same function. Further, a part of the configuration of the embodiment may be omitted. Note that at least a part of the configuration of the above embodiment may be added or substituted for the configuration of another embodiment. In addition, all the forms included in the technical idea specified only by the words in the claims are embodiments of the present disclosure.
In addition to the above-described method for producing graphene, the present disclosure can be realized in various forms such as graphene and graphene production apparatuses.
Claims (8)
A first heat treatment step of forming an amorphous carbon layer 9 as the carbon-containing layer,
And a second heat treatment step of forming a graphene (11) with the amorphous carbon layer,
And a self-organizing monolayer (5) is formed between the base layer and the carbon-containing layer.
Wherein the step of forming the self-assembled monolayer and the step of forming the carbon-containing layer are continuously performed.
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PCT/JP2015/005393 WO2016067597A1 (en) | 2014-10-30 | 2015-10-27 | Method for producing graphene |
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