KR101880305B1 - Cleaning composition using electronic material - Google Patents
Cleaning composition using electronic material Download PDFInfo
- Publication number
- KR101880305B1 KR101880305B1 KR1020110136350A KR20110136350A KR101880305B1 KR 101880305 B1 KR101880305 B1 KR 101880305B1 KR 1020110136350 A KR1020110136350 A KR 1020110136350A KR 20110136350 A KR20110136350 A KR 20110136350A KR 101880305 B1 KR101880305 B1 KR 101880305B1
- Authority
- KR
- South Korea
- Prior art keywords
- group
- acid
- aluminum
- cleaning liquid
- liquid composition
- Prior art date
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- 238000004140 cleaning Methods 0.000 title claims abstract description 64
- 239000000203 mixture Substances 0.000 title claims abstract description 40
- 239000012776 electronic material Substances 0.000 title claims abstract description 22
- 239000007788 liquid Substances 0.000 claims abstract description 48
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 24
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 23
- 150000001412 amines Chemical class 0.000 claims abstract description 20
- 150000007524 organic acids Chemical class 0.000 claims abstract description 15
- 238000005536 corrosion prevention Methods 0.000 claims abstract description 5
- 125000004432 carbon atom Chemical group C* 0.000 claims description 22
- 238000005260 corrosion Methods 0.000 claims description 22
- 230000007797 corrosion Effects 0.000 claims description 22
- 125000000217 alkyl group Chemical group 0.000 claims description 19
- -1 carboxylic acid compound Chemical class 0.000 claims description 19
- 239000002253 acid Substances 0.000 claims description 17
- 229910000838 Al alloy Inorganic materials 0.000 claims description 14
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 14
- 229920001577 copolymer Polymers 0.000 claims description 13
- 239000003960 organic solvent Substances 0.000 claims description 13
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 12
- DBVJJBKOTRCVKF-UHFFFAOYSA-N Etidronic acid Chemical compound OP(=O)(O)C(O)(C)P(O)(O)=O DBVJJBKOTRCVKF-UHFFFAOYSA-N 0.000 claims description 11
- 229920002125 Sokalan® Polymers 0.000 claims description 11
- 229910052739 hydrogen Inorganic materials 0.000 claims description 10
- 239000001257 hydrogen Substances 0.000 claims description 10
- OFOBLEOULBTSOW-UHFFFAOYSA-N Propanedioic acid Natural products OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 claims description 9
- 239000011976 maleic acid Substances 0.000 claims description 9
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 claims description 9
- 229940028356 diethylene glycol monobutyl ether Drugs 0.000 claims description 8
- TXXWBTOATXBWDR-UHFFFAOYSA-N n,n,n',n'-tetramethylhexane-1,6-diamine Chemical compound CN(C)CCCCCCN(C)C TXXWBTOATXBWDR-UHFFFAOYSA-N 0.000 claims description 8
- JCGNDDUYTRNOFT-UHFFFAOYSA-N oxolane-2,4-dione Chemical compound O=C1COC(=O)C1 JCGNDDUYTRNOFT-UHFFFAOYSA-N 0.000 claims description 8
- 239000002798 polar solvent Substances 0.000 claims description 8
- 125000002947 alkylene group Chemical group 0.000 claims description 7
- 239000004584 polyacrylic acid Substances 0.000 claims description 7
- 239000000126 substance Substances 0.000 claims description 7
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 claims description 6
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 claims description 6
- 125000003277 amino group Chemical group 0.000 claims description 6
- QGZKDVFQNNGYKY-UHFFFAOYSA-O ammonium group Chemical group [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 claims description 6
- UAOMVDZJSHZZME-UHFFFAOYSA-N diisopropylamine Chemical compound CC(C)NC(C)C UAOMVDZJSHZZME-UHFFFAOYSA-N 0.000 claims description 6
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 claims description 5
- HPNMFZURTQLUMO-UHFFFAOYSA-N diethylamine Chemical compound CCNCC HPNMFZURTQLUMO-UHFFFAOYSA-N 0.000 claims description 5
- KDSNLYIMUZNERS-UHFFFAOYSA-N 2-methylpropanamine Chemical compound CC(C)CN KDSNLYIMUZNERS-UHFFFAOYSA-N 0.000 claims description 4
- DLFVBJFMPXGRIB-UHFFFAOYSA-N Acetamide Chemical compound CC(N)=O DLFVBJFMPXGRIB-UHFFFAOYSA-N 0.000 claims description 4
- ROSDSFDQCJNGOL-UHFFFAOYSA-N Dimethylamine Chemical compound CNC ROSDSFDQCJNGOL-UHFFFAOYSA-N 0.000 claims description 4
- QUSNBJAOOMFDIB-UHFFFAOYSA-N Ethylamine Chemical compound CCN QUSNBJAOOMFDIB-UHFFFAOYSA-N 0.000 claims description 4
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 claims description 4
- BAVYZALUXZFZLV-UHFFFAOYSA-N Methylamine Chemical compound NC BAVYZALUXZFZLV-UHFFFAOYSA-N 0.000 claims description 4
- QCOGKXLOEWLIDC-UHFFFAOYSA-N N-methylbutylamine Chemical compound CCCCNC QCOGKXLOEWLIDC-UHFFFAOYSA-N 0.000 claims description 4
- 239000008367 deionised water Substances 0.000 claims description 4
- 229910021641 deionized water Inorganic materials 0.000 claims description 4
- JQVDAXLFBXTEQA-UHFFFAOYSA-N dibutylamine Chemical compound CCCCNCCCC JQVDAXLFBXTEQA-UHFFFAOYSA-N 0.000 claims description 4
- LIWAQLJGPBVORC-UHFFFAOYSA-N ethylmethylamine Chemical compound CCNC LIWAQLJGPBVORC-UHFFFAOYSA-N 0.000 claims description 4
- GVWISOJSERXQBM-UHFFFAOYSA-N n-methylpropan-1-amine Chemical compound CCCNC GVWISOJSERXQBM-UHFFFAOYSA-N 0.000 claims description 4
- XHFGWHUWQXTGAT-UHFFFAOYSA-N n-methylpropan-2-amine Chemical compound CNC(C)C XHFGWHUWQXTGAT-UHFFFAOYSA-N 0.000 claims description 4
- DPBLXKKOBLCELK-UHFFFAOYSA-N pentan-1-amine Chemical compound CCCCCN DPBLXKKOBLCELK-UHFFFAOYSA-N 0.000 claims description 4
- MWWATHDPGQKSAR-UHFFFAOYSA-N propyne Chemical group CC#C MWWATHDPGQKSAR-UHFFFAOYSA-N 0.000 claims description 4
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 claims description 4
- YFTNTMQKPLVKFQ-UHFFFAOYSA-N 1-methoxy-n,n-dimethylmethanamine Chemical compound COCN(C)C YFTNTMQKPLVKFQ-UHFFFAOYSA-N 0.000 claims description 3
- BFSVOASYOCHEOV-UHFFFAOYSA-N 2-diethylaminoethanol Chemical compound CCN(CC)CCO BFSVOASYOCHEOV-UHFFFAOYSA-N 0.000 claims description 3
- HCGFUIQPSOCUHI-UHFFFAOYSA-N 2-propan-2-yloxyethanol Chemical compound CC(C)OCCO HCGFUIQPSOCUHI-UHFFFAOYSA-N 0.000 claims description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 3
- 239000002202 Polyethylene glycol Substances 0.000 claims description 3
- 229910052783 alkali metal Inorganic materials 0.000 claims description 3
- 150000001340 alkali metals Chemical class 0.000 claims description 3
- 229910052784 alkaline earth metal Inorganic materials 0.000 claims description 3
- 150000001342 alkaline earth metals Chemical class 0.000 claims description 3
- ZBCBWPMODOFKDW-UHFFFAOYSA-N diethanolamine Chemical compound OCCNCCO ZBCBWPMODOFKDW-UHFFFAOYSA-N 0.000 claims description 3
- 229920001223 polyethylene glycol Polymers 0.000 claims description 3
- CYSGHNMQYZDMIA-UHFFFAOYSA-N 1,3-Dimethyl-2-imidazolidinon Chemical compound CN1CCN(C)C1=O CYSGHNMQYZDMIA-UHFFFAOYSA-N 0.000 claims description 2
- NFJSYLMJBNUDNG-UHFFFAOYSA-N 1,3-dipropylimidazolidin-2-one Chemical compound CCCN1CCN(CCC)C1=O NFJSYLMJBNUDNG-UHFFFAOYSA-N 0.000 claims description 2
- ZFPGARUNNKGOBB-UHFFFAOYSA-N 1-Ethyl-2-pyrrolidinone Chemical compound CCN1CCCC1=O ZFPGARUNNKGOBB-UHFFFAOYSA-N 0.000 claims description 2
- IQXXEPZFOOTTBA-UHFFFAOYSA-N 1-benzylpiperazine Chemical compound C=1C=CC=CC=1CN1CCNCC1 IQXXEPZFOOTTBA-UHFFFAOYSA-N 0.000 claims description 2
- MXYOPVWZZKEAGX-UHFFFAOYSA-N 1-phosphonoethylphosphonic acid Chemical compound OP(=O)(O)C(C)P(O)(O)=O MXYOPVWZZKEAGX-UHFFFAOYSA-N 0.000 claims description 2
- SBASXUCJHJRPEV-UHFFFAOYSA-N 2-(2-methoxyethoxy)ethanol Chemical compound COCCOCCO SBASXUCJHJRPEV-UHFFFAOYSA-N 0.000 claims description 2
- COBPKKZHLDDMTB-UHFFFAOYSA-N 2-[2-(2-butoxyethoxy)ethoxy]ethanol Chemical compound CCCCOCCOCCOCCO COBPKKZHLDDMTB-UHFFFAOYSA-N 0.000 claims description 2
- WFSMVVDJSNMRAR-UHFFFAOYSA-N 2-[2-(2-ethoxyethoxy)ethoxy]ethanol Chemical compound CCOCCOCCOCCO WFSMVVDJSNMRAR-UHFFFAOYSA-N 0.000 claims description 2
- FETMDPWILVCFLL-UHFFFAOYSA-N 2-[2-(2-propan-2-yloxyethoxy)ethoxy]ethanol Chemical compound CC(C)OCCOCCOCCO FETMDPWILVCFLL-UHFFFAOYSA-N 0.000 claims description 2
- IQEKRNXJPCBUAT-UHFFFAOYSA-N 2-[hydroperoxy(hydroxy)phosphoryl]acetic acid Chemical compound OOP(O)(=O)CC(O)=O IQEKRNXJPCBUAT-UHFFFAOYSA-N 0.000 claims description 2
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 claims description 2
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 claims description 2
- NJBCRXCAPCODGX-UHFFFAOYSA-N 2-methyl-n-(2-methylpropyl)propan-1-amine Chemical compound CC(C)CNCC(C)C NJBCRXCAPCODGX-UHFFFAOYSA-N 0.000 claims description 2
- PKZCRWFNSBIBEW-UHFFFAOYSA-N 2-n,2-n,2-trimethylpropane-1,2-diamine Chemical compound CN(C)C(C)(C)CN PKZCRWFNSBIBEW-UHFFFAOYSA-N 0.000 claims description 2
- RJWLLQWLBMJCFD-UHFFFAOYSA-N 4-methylpiperazin-1-amine Chemical compound CN1CCN(N)CC1 RJWLLQWLBMJCFD-UHFFFAOYSA-N 0.000 claims description 2
- 229920002126 Acrylic acid copolymer Polymers 0.000 claims description 2
- PIICEJLVQHRZGT-UHFFFAOYSA-N Ethylenediamine Chemical compound NCCN PIICEJLVQHRZGT-UHFFFAOYSA-N 0.000 claims description 2
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 claims description 2
- UEEJHVSXFDXPFK-UHFFFAOYSA-N N-dimethylaminoethanol Chemical compound CN(C)CCO UEEJHVSXFDXPFK-UHFFFAOYSA-N 0.000 claims description 2
- OHLUUHNLEMFGTQ-UHFFFAOYSA-N N-methylacetamide Chemical compound CNC(C)=O OHLUUHNLEMFGTQ-UHFFFAOYSA-N 0.000 claims description 2
- GSEJCLTVZPLZKY-UHFFFAOYSA-N Triethanolamine Chemical compound OCCN(CCO)CCO GSEJCLTVZPLZKY-UHFFFAOYSA-N 0.000 claims description 2
- YDONNITUKPKTIG-UHFFFAOYSA-N [Nitrilotris(methylene)]trisphosphonic acid Chemical compound OP(O)(=O)CN(CP(O)(O)=O)CP(O)(O)=O YDONNITUKPKTIG-UHFFFAOYSA-N 0.000 claims description 2
- 125000003342 alkenyl group Chemical group 0.000 claims description 2
- 125000003545 alkoxy group Chemical group 0.000 claims description 2
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 claims description 2
- HQABUPZFAYXKJW-UHFFFAOYSA-N butan-1-amine Chemical compound CCCCN HQABUPZFAYXKJW-UHFFFAOYSA-N 0.000 claims description 2
- LOGBRYZYTBQBTB-UHFFFAOYSA-N butane-1,2,4-tricarboxylic acid Chemical compound OC(=O)CCC(C(O)=O)CC(O)=O LOGBRYZYTBQBTB-UHFFFAOYSA-N 0.000 claims description 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims description 2
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 claims description 2
- 229940075557 diethylene glycol monoethyl ether Drugs 0.000 claims description 2
- 229940043279 diisopropylamine Drugs 0.000 claims description 2
- DUYCTCQXNHFCSJ-UHFFFAOYSA-N dtpmp Chemical compound OP(=O)(O)CN(CP(O)(O)=O)CCN(CP(O)(=O)O)CCN(CP(O)(O)=O)CP(O)(O)=O DUYCTCQXNHFCSJ-UHFFFAOYSA-N 0.000 claims description 2
- NFDRPXJGHKJRLJ-UHFFFAOYSA-N edtmp Chemical compound OP(O)(=O)CN(CP(O)(O)=O)CCN(CP(O)(O)=O)CP(O)(O)=O NFDRPXJGHKJRLJ-UHFFFAOYSA-N 0.000 claims description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 claims description 2
- QBSHRXWEGICOTJ-UHFFFAOYSA-N hex-1-ene-1,1-diamine Chemical compound CCCCC=C(N)N QBSHRXWEGICOTJ-UHFFFAOYSA-N 0.000 claims description 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 2
- 125000002768 hydroxyalkyl group Chemical group 0.000 claims description 2
- JJWLVOIRVHMVIS-UHFFFAOYSA-N isopropylamine Chemical compound CC(C)N JJWLVOIRVHMVIS-UHFFFAOYSA-N 0.000 claims description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 2
- QKYWADPCTHTJHQ-UHFFFAOYSA-N n,2-dimethylpropan-1-amine Chemical compound CNCC(C)C QKYWADPCTHTJHQ-UHFFFAOYSA-N 0.000 claims description 2
- 229940100684 pentylamine Drugs 0.000 claims description 2
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 2
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 claims description 2
- AOHJOMMDDJHIJH-UHFFFAOYSA-N propylenediamine Chemical compound CC(N)CN AOHJOMMDDJHIJH-UHFFFAOYSA-N 0.000 claims description 2
- 150000003839 salts Chemical class 0.000 claims description 2
- BHRZNVHARXXAHW-UHFFFAOYSA-N sec-butylamine Chemical compound CCC(C)N BHRZNVHARXXAHW-UHFFFAOYSA-N 0.000 claims description 2
- YBRBMKDOPFTVDT-UHFFFAOYSA-N tert-butylamine Chemical compound CC(C)(C)N YBRBMKDOPFTVDT-UHFFFAOYSA-N 0.000 claims description 2
- JLGLQAWTXXGVEM-UHFFFAOYSA-N triethylene glycol monomethyl ether Chemical compound COCCOCCOCCO JLGLQAWTXXGVEM-UHFFFAOYSA-N 0.000 claims description 2
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 claims 4
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 claims 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 claims 3
- 150000002431 hydrogen Chemical class 0.000 claims 3
- 229920000642 polymer Polymers 0.000 claims 3
- WGYKZJWCGVVSQN-UHFFFAOYSA-N propylamine Chemical compound CCCN WGYKZJWCGVVSQN-UHFFFAOYSA-N 0.000 claims 2
- JPIGSMKDJQPHJC-UHFFFAOYSA-N 1-(2-aminoethoxy)ethanol Chemical compound CC(O)OCCN JPIGSMKDJQPHJC-UHFFFAOYSA-N 0.000 claims 1
- PVOAHINGSUIXLS-UHFFFAOYSA-N 1-Methylpiperazine Chemical compound CN1CCNCC1 PVOAHINGSUIXLS-UHFFFAOYSA-N 0.000 claims 1
- MGHDRBZKYYDONO-UHFFFAOYSA-N 1-amino-2-(2-aminoethylamino)propan-2-ol Chemical compound NCCNC(CN)(C)O MGHDRBZKYYDONO-UHFFFAOYSA-N 0.000 claims 1
- CMZQPQQRGBOLHN-UHFFFAOYSA-N 1-methoxy-2-methylpropan-2-amine Chemical compound COCC(C)(C)N CMZQPQQRGBOLHN-UHFFFAOYSA-N 0.000 claims 1
- YINZGXSSYYFXEY-UHFFFAOYSA-N 2-(diethylaminomethoxy)ethanol Chemical compound CCN(CC)COCCO YINZGXSSYYFXEY-UHFFFAOYSA-N 0.000 claims 1
- YENSVULFMBQEHJ-UHFFFAOYSA-N 2-[2-hydroxyethyl(methoxymethyl)amino]ethanol Chemical compound COCN(CCO)CCO YENSVULFMBQEHJ-UHFFFAOYSA-N 0.000 claims 1
- LVYXPOCADCXMLP-UHFFFAOYSA-N 3-butoxy-n,n-dimethylpropanamide Chemical compound CCCCOCCC(=O)N(C)C LVYXPOCADCXMLP-UHFFFAOYSA-N 0.000 claims 1
- XLZXDUHBKXNKSK-UHFFFAOYSA-N CC1(N(CCNC1)CCN)COC Chemical compound CC1(N(CCNC1)CCN)COC XLZXDUHBKXNKSK-UHFFFAOYSA-N 0.000 claims 1
- YMHQVDAATAEZLO-UHFFFAOYSA-N cyclohexane-1,1-diamine Chemical compound NC1(N)CCCCC1 YMHQVDAATAEZLO-UHFFFAOYSA-N 0.000 claims 1
- 230000002401 inhibitory effect Effects 0.000 claims 1
- SCZVXVGZMZRGRU-UHFFFAOYSA-N n'-ethylethane-1,2-diamine Chemical compound CCNCCN SCZVXVGZMZRGRU-UHFFFAOYSA-N 0.000 claims 1
- QGRBGPKKFIYPSW-UHFFFAOYSA-N n-ethyl-n-(methoxymethyl)ethanamine Chemical compound CCN(CC)COC QGRBGPKKFIYPSW-UHFFFAOYSA-N 0.000 claims 1
- 125000000547 substituted alkyl group Chemical group 0.000 claims 1
- HXJUTPCZVOIRIF-UHFFFAOYSA-N sulfolane Chemical compound O=S1(=O)CCCC1 HXJUTPCZVOIRIF-UHFFFAOYSA-N 0.000 claims 1
- STCOOQWBFONSKY-UHFFFAOYSA-N tributyl phosphate Chemical compound CCCCOP(=O)(OCCCC)OCCCC STCOOQWBFONSKY-UHFFFAOYSA-N 0.000 claims 1
- DQWPFSLDHJDLRL-UHFFFAOYSA-N triethyl phosphate Chemical compound CCOP(=O)(OCC)OCC DQWPFSLDHJDLRL-UHFFFAOYSA-N 0.000 claims 1
- 239000000356 contaminant Substances 0.000 abstract description 19
- 239000000758 substrate Substances 0.000 abstract description 19
- 239000011521 glass Substances 0.000 abstract description 13
- 229910052751 metal Inorganic materials 0.000 abstract description 13
- 239000002184 metal Substances 0.000 abstract description 13
- 230000000694 effects Effects 0.000 abstract description 10
- 239000002245 particle Substances 0.000 abstract description 8
- 229910052757 nitrogen Inorganic materials 0.000 description 30
- OXHNLMTVIGZXSG-UHFFFAOYSA-N 1-Methylpyrrole Chemical compound CN1C=CC=C1 OXHNLMTVIGZXSG-UHFFFAOYSA-N 0.000 description 12
- 230000000052 comparative effect Effects 0.000 description 8
- 239000003599 detergent Substances 0.000 description 6
- 150000004985 diamines Chemical class 0.000 description 5
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 238000005530 etching Methods 0.000 description 4
- UNEXJVCWJSHFNN-UHFFFAOYSA-N n,n,n',n'-tetraethylmethanediamine Chemical compound CCN(CC)CN(CC)CC UNEXJVCWJSHFNN-UHFFFAOYSA-N 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 229910021642 ultra pure water Inorganic materials 0.000 description 3
- 239000012498 ultrapure water Substances 0.000 description 3
- NLCWFPMDXYWDOQ-UHFFFAOYSA-N 2-amino-1-methoxybutan-2-ol Chemical compound CCC(O)(N)COC NLCWFPMDXYWDOQ-UHFFFAOYSA-N 0.000 description 2
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 2
- OPKOKAMJFNKNAS-UHFFFAOYSA-N N-methylethanolamine Chemical compound CNCCO OPKOKAMJFNKNAS-UHFFFAOYSA-N 0.000 description 2
- 239000013522 chelant Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- CRVGTESFCCXCTH-UHFFFAOYSA-N methyl diethanolamine Chemical compound OCCN(C)CCO CRVGTESFCCXCTH-UHFFFAOYSA-N 0.000 description 2
- DMQSHEKGGUOYJS-UHFFFAOYSA-N n,n,n',n'-tetramethylpropane-1,3-diamine Chemical compound CN(C)CCCN(C)C DMQSHEKGGUOYJS-UHFFFAOYSA-N 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- HPUIQFXZXVKZBN-UHFFFAOYSA-N 1-butoxy-n,n-dimethylmethanamine Chemical compound CCCCOCN(C)C HPUIQFXZXVKZBN-UHFFFAOYSA-N 0.000 description 1
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 1
- KGTKCYPWFGFSAH-UHFFFAOYSA-N 1-n,1-n,2-n-trimethylpropane-1,2-diamine Chemical compound CNC(C)CN(C)C KGTKCYPWFGFSAH-UHFFFAOYSA-N 0.000 description 1
- SDMNEUXIWBRMPK-UHFFFAOYSA-N 2-(2-methylpiperazin-1-yl)ethanol Chemical compound CC1CNCCN1CCO SDMNEUXIWBRMPK-UHFFFAOYSA-N 0.000 description 1
- MIJDSYMOBYNHOT-UHFFFAOYSA-N 2-(ethylamino)ethanol Chemical compound CCNCCO MIJDSYMOBYNHOT-UHFFFAOYSA-N 0.000 description 1
- WAEVWDZKMBQDEJ-UHFFFAOYSA-N 2-[2-(2-methoxypropoxy)propoxy]propan-1-ol Chemical compound COC(C)COC(C)COC(C)CO WAEVWDZKMBQDEJ-UHFFFAOYSA-N 0.000 description 1
- BKMMTJMQCTUHRP-UHFFFAOYSA-N 2-aminopropan-1-ol Chemical compound CC(N)CO BKMMTJMQCTUHRP-UHFFFAOYSA-N 0.000 description 1
- QZXIXSZVEYUCGM-UHFFFAOYSA-N 2-aminopropan-2-ol Chemical compound CC(C)(N)O QZXIXSZVEYUCGM-UHFFFAOYSA-N 0.000 description 1
- LTHNHFOGQMKPOV-UHFFFAOYSA-N 2-ethylhexan-1-amine Chemical compound CCCCC(CC)CN LTHNHFOGQMKPOV-UHFFFAOYSA-N 0.000 description 1
- WFCSWCVEJLETKA-UHFFFAOYSA-N 2-piperazin-1-ylethanol Chemical compound OCCN1CCNCC1 WFCSWCVEJLETKA-UHFFFAOYSA-N 0.000 description 1
- QCAHUFWKIQLBNB-UHFFFAOYSA-N 3-(3-methoxypropoxy)propan-1-ol Chemical compound COCCCOCCCO QCAHUFWKIQLBNB-UHFFFAOYSA-N 0.000 description 1
- LBVMWHCOFMFPEG-UHFFFAOYSA-N 3-methoxy-n,n-dimethylpropanamide Chemical compound COCCC(=O)N(C)C LBVMWHCOFMFPEG-UHFFFAOYSA-N 0.000 description 1
- UIKUBYKUYUSRSM-UHFFFAOYSA-N 3-morpholinopropylamine Chemical compound NCCCN1CCOCC1 UIKUBYKUYUSRSM-UHFFFAOYSA-N 0.000 description 1
- JTNWYRNWUCWREI-UHFFFAOYSA-N COCC(C)(O)N Chemical compound COCC(C)(O)N JTNWYRNWUCWREI-UHFFFAOYSA-N 0.000 description 1
- ZAFNJMIOTHYJRJ-UHFFFAOYSA-N Diisopropyl ether Chemical compound CC(C)OC(C)C ZAFNJMIOTHYJRJ-UHFFFAOYSA-N 0.000 description 1
- PVCJKHHOXFKFRP-UHFFFAOYSA-N N-acetylethanolamine Chemical compound CC(=O)NCCO PVCJKHHOXFKFRP-UHFFFAOYSA-N 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 125000005210 alkyl ammonium group Chemical group 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 150000001408 amides Chemical class 0.000 description 1
- IMUDHTPIFIBORV-UHFFFAOYSA-N aminoethylpiperazine Chemical compound NCCN1CCNCC1 IMUDHTPIFIBORV-UHFFFAOYSA-N 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- 150000007514 bases Chemical class 0.000 description 1
- 229910052792 caesium Inorganic materials 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- WUUZKBJEUBFVMV-UHFFFAOYSA-N copper molybdenum Chemical compound [Cu].[Mo] WUUZKBJEUBFVMV-UHFFFAOYSA-N 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- WEHWNAOGRSTTBQ-UHFFFAOYSA-N dipropylamine Chemical compound CCCNCCC WEHWNAOGRSTTBQ-UHFFFAOYSA-N 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- DLRBRCFDAZXTMW-UHFFFAOYSA-N ethene;2-methoxyethanol Chemical compound C=C.C=C.COCCO DLRBRCFDAZXTMW-UHFFFAOYSA-N 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 229910052730 francium Inorganic materials 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 229910003471 inorganic composite material Inorganic materials 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- GINQYTLDMNFGQP-UHFFFAOYSA-N n,n-dimethylformamide;methylsulfinylmethane Chemical compound CS(C)=O.CN(C)C=O GINQYTLDMNFGQP-UHFFFAOYSA-N 0.000 description 1
- 230000003472 neutralizing effect Effects 0.000 description 1
- 125000004433 nitrogen atom Chemical group N* 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- 150000002903 organophosphorus compounds Chemical class 0.000 description 1
- YZTJYBJCZXZGCT-UHFFFAOYSA-N phenylpiperazine Chemical compound C1CNCCN1C1=CC=CC=C1 YZTJYBJCZXZGCT-UHFFFAOYSA-N 0.000 description 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-N phosphoric acid Substances OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 1
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 1
- 229920001444 polymaleic acid Polymers 0.000 description 1
- 239000004926 polymethyl methacrylate Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 229910052701 rubidium Inorganic materials 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/26—Organic compounds containing oxygen
- C11D7/267—Heterocyclic compounds
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/50—Solvents
- C11D7/5004—Organic solvents
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Organic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Emergency Medicine (AREA)
- Detergent Compositions (AREA)
Abstract
본 발명은 전자재료용 세정액 조성물에 관한 것으로, 구체적으로 실세스퀴옥산, 유기산 및 유기 아민을 포함하여, 유리 기판 또는 금속막질 표면에 존재하는 유기 오염물 및 파티클의 제거력이 우수하고, 기판상에 형성되어 있는 알루미늄 등의 금속배선에 대한 부식 방지 효과가 우수한 전자재료용 세정액 조성물에 관한 것이다.More particularly, the present invention relates to a cleaning liquid composition for electronic materials, which comprises silsesquioxane, an organic acid and an organic amine and is excellent in removing organic contaminants and particles present on the surface of a glass substrate or a metal film, The present invention relates to a cleaning liquid composition for electronic materials, which is excellent in corrosion prevention effect against metal wiring such as aluminum.
Description
본 발명은 전자재료용 세정액 조성물에 관한 것이다.The present invention relates to a cleaning liquid composition for electronic materials.
반도체 디바이스, FPD와 같은 액정디스플레이 등에 사용되는 전자재료는 다양한 공정을 거쳐 제작되며, 구체적인 예로서, 성막, 노광, 배선 에칭 등의 공정을 거쳐 제조되며, 이러한 공정 중, 기판 표면에 각종의 유기물이나 무기물 등의 크기가 1㎛ 이하인 파티클(Particle)이 부착되어 기판의 오염을 야기한다. 이러한 오염물이 부착한 채로, 다음의 공정 처리를 실시했을 경우, 막의 핀홀이나 피트, 배선의 단선이나 브릿지(Bridge)가 발생하여, 제품의 제조 수율을 크게 저하시킨다. 따라서 이러한 오염물을 제거하기 위한 세정이 각 공정간에 행해지고 있으며, 이를 위한 다양한 세정액이 소개되고 있다.An electronic material used for a semiconductor device, a liquid crystal display such as a FPD, etc. is manufactured through various processes, and specific examples thereof include a film forming process, an exposure process, a wiring etching process, and the like. Particles having a size of 1 탆 or less are adhered to cause contamination of the substrate. When the following process steps are carried out with such contaminants adhering to the substrate, pinholes, pits, wirings, and bridges of the film are generated, thereby significantly decreasing the production yield of products. Therefore, cleaning for removing such contaminants is carried out between respective processes, and various cleaning liquids have been introduced for this purpose.
대한민국 등록특허 제10-0503231호에서는 특정의 알칸올아민 화합물, 유기용매, 킬레이트 화합물, 비이온계 계면활성제 및 물을 포함하는 반도체 및 TFT-LCD용 세정제 조성물을 개시하고 있다. 그러나, 색변화를 유발시키는 킬레이트 화합물을 포함하고 있어, 세정제의 색변화 및 장기간 사용시 석출이 발생되며, 알루미늄 방식이 어려운 문제점이 있다.Korean Patent Registration No. 10-0503231 discloses a semiconductor and TFT-LCD detergent composition comprising a specific alkanolamine compound, an organic solvent, a chelate compound, a nonionic surfactant, and water. However, since it contains a chelate compound that causes color change, color change of the detergent and precipitation during long-term use occur, and there is a problem that aluminum method is difficult.
대한민국 공개특허 제2007-0107242호에서는 구리 몰리브덴 세정제에 관한 것으로, 알루미늄에 대한 방식 효과가 없어 사용이 제한적이며, 중성 또는 약산성의 세정제로서, 알칼리계 세정제 보다 파티클 제거력이 낮은 문제점이 있다.Korean Patent Publication No. 2007-0107242 relates to a copper molybdenum detergent which is limited in its use due to no effect on aluminum and has a problem of low neutralizing or weakly acidic detergency as compared with an alkaline detergent.
본 발명은, 상기와 같은 종래기술의 문제점을 해결하기 위한 것으로서, 전자재료 등을 제작하는 공정에서 유리기판 또는 금속막질을 오염시키는 유기 오염물이나 파티클의 제거력이 우수하며, FPD 기판상에 형성되어 있는 알루미늄 등의 금속배선에 대한 부식방지력이 우수한 세정액 조성물을 제공하는 것을 목적으로 한다.Disclosure of Invention Technical Problem [8] The present invention has been made to solve the above-mentioned problems of the prior art, and it is an object of the present invention to provide a method of manufacturing a semiconductor device, which is excellent in removing organic contaminants or particles that contaminate a glass substrate or a metal film in a process of manufacturing an electronic material, It is an object of the present invention to provide a cleaning liquid composition which is excellent in corrosion resistance against metal wiring such as aluminum.
상기의 목적을 달성하기 위하여, 본 발명은 하기 화학식 1로 표시되는 실세스퀴옥산, 유기산 및 유기 아민을 포함하는 전자재료용 세정액 조성물을 제공한다.In order to achieve the above object, the present invention provides a cleaning liquid composition for electronic materials comprising silsesquioxane, an organic acid and an organic amine represented by the following general formula (1).
[화학식 1][Chemical Formula 1]
(R1SiO3 /2)n (R 1 SiO 3/2) n
상기 화학식 1에서, n은 8 내지 100의 정수이고, R1은 서로 독립적으로 수소, 알킬, 알킬렌, 알릴, 알릴렌 또는 기능성을 가지는 알킬, 알킬렌, 알릴, 알린렌 유도체이다.In Formula 1, n is an integer of 8 to 100, and R 1 is independently of each other hydrogen, alkyl, alkylene, allyl, allylene or functional alkyl, alkylene, allyl,
본 발명의 전자재료용 세정액 조성물은 전자재료 등의 유리기판 또는 금속막질 표면에 존재하는 유기 오염물 및 파티클의 제거력이 우수하고, 기판상에 형성되어 있는 알루미늄, 알루미늄합금 등의 금속배선에 대한 부식 방지 효과가 우수하다. 또한, 다량의 물을 포함하고 있어서 취급이 용이하며 환경적으로도 유리하다.INDUSTRIAL APPLICABILITY The cleaning liquid composition for an electronic material of the present invention is excellent in the ability to remove organic contaminants and particles present on the surface of a glass substrate such as an electronic material or a metal film surface and is excellent in corrosion resistance against metal wirings such as aluminum and aluminum alloy The effect is excellent. In addition, since it contains a large amount of water, handling is easy and environmentally advantageous.
이하, 본 발명을 상세하게 설명한다.Hereinafter, the present invention will be described in detail.
본 발명은 하기 화학식 1로 표시되는 실세스퀴옥산, 유기산 및 유기 아민을 포함하는 전자재료용 세정액 조성물을 제공한다.The present invention provides a cleaning liquid composition for electronic materials comprising silsesquioxane represented by the following general formula (1), an organic acid and an organic amine.
[화학식 1][Chemical Formula 1]
(R1SiO3 /2)n (R 1 SiO 3/2) n
상기 화학식 1에서, n은 8 내지 100의 정수이고, R1은 서로 독립적으로 수소, 알킬, 알킬렌, 알릴, 알릴렌 또는 기능성을 가지는 알킬, 알킬렌, 알릴, 알린렌 유도체이다.In Formula 1, n is an integer of 8 to 100, and R 1 is independently of each other hydrogen, alkyl, alkylene, allyl, allylene or functional alkyl, alkylene, allyl,
또한, 상기 전자재료용 세정액 조성물은 세정액 조성물 총 중량에 대하여, 실세스퀴옥산 0.001중량% 내지 5중량%, 유기산 0.01 내지 10중량%, 유기 아민 0.05 내지 10중량% 및 잔량의 물을 포함하는 것이 바람직하다.Further, the cleaning liquid composition for electronic materials preferably contains 0.001 to 5% by weight of silsesquioxane, 0.01 to 10% by weight of organic acid, 0.05 to 10% by weight of organic amine, and the balance of water, based on the total weight of the cleaning liquid composition desirable.
또한, 상기 전자재료용 세정액 조성물은 수용성 유기 용매를 추가로 포함하는 것이 바람직하며, 상기 세정액 조성물 총 중량에 대하여 수용성 유기 용매는 0.05 내지 40중량%로 포함하는 것이 바람직하다.In addition, the cleaning liquid composition for electronic materials preferably further comprises a water-soluble organic solvent, and the water-soluble organic solvent is preferably contained in an amount of 0.05 to 40% by weight based on the total weight of the cleaning composition.
구체적으로, 상기 화학식 1로 표시되는 실세스퀴옥산(Silsesquioxanes)은 열적 안정성, 내구성 및 부식 방지성의 특성을 가지며, 일반적으로 코팅 충전제 및 유-무기 복합재료 개발에 사용되고 있으나, 본 발명에서 포토레지스트 박리제 조성물에 첨가 됨으로써 금속 배선의 방식 효과가 우수하다. Specifically, the silsesquioxanes represented by Formula 1 have thermal stability, durability and corrosion inhibition properties and are generally used for the development of coating fillers and organic-inorganic composite materials. However, in the present invention, By adding it to the composition, the system effect of the metal wiring is excellent.
상기 실세스퀴옥산은 상기 세정제 조성물 총 중량에 대하여 0.001중량% 내지 5중량%로 포함하는 것이 바람직하고, 상기 실세스퀴옥산의 함량이 0.001중량% 미만인 경우 금속 방식 능력 저하가 발생하고, 5중량%를 초과하는 경우 금속 배선 표면에 코팅 잔류하는 문제점이 있다.It is preferable that the silsesquioxane is contained in an amount of 0.001 wt% to 5 wt% with respect to the total weight of the detergent composition, and when the content of the silsesquioxane is less than 0.001 wt% %, The coating remains on the surface of the metal wiring.
이때, 상기 실세스퀴옥산(Silsesquioxanes)은 랜덤형, 사다리형, 케이지(Cage)형, 부분적 케이지(Cage)형 등의 다양한 구조를 가질 수 있으며, 그 구조는 특별히 제한되지 않는다.At this time, the silsesquioxanes may have various structures such as a random type, a ladder type, a cage type, and a partial cage type, and the structure thereof is not particularly limited.
본 발명의 경우 유기산은 오염물 제거 및 방식효과를 갖는 것으로 유기인산 화합물 또는 폴리카르복실산 공중합체를 포함하는 것이 바람직하다. In the case of the present invention, the organic acid preferably has an organic phosphoric acid compound or a polycarboxylic acid copolymer and has a contaminant removal and system effect.
상기 유기인산 화합물은 특히 유리 기판 상에 위치하는 유기 오염물 혹은 파티클 제거에 우수한 효과를 나타내며 금속 부식 방지 효과가 있다.The organophosphorus compound exhibits an excellent effect for removing organic contaminants or particles located on a glass substrate and has a metal corrosion prevention effect.
구체적으로 상기 유기산은 아미노트리(메틸렌포스폰산), 에틸리덴디포스폰산, 1-히드록시에틸리덴-1,1-디포스폰산, 1-히드록시프로필리덴-1,1-디포스폰산, 1-히드록시부틸리덴-1,1-디포스폰산, 에틸아미노비스(메틸렌포스폰산), 1,2-프로필렌디아민테트라(메틸렌포스폰산), 도데실아미노비스(메틸렌포스폰산), 니트로트리스(메틸렌포스폰산), 에틸렌디아민비스(메틸렌포스폰산), 에틸렌디아민테트라(메틸렌포스폰산), 헥센디아민테트라(메틸렌포스폰산), 디에틸렌트리아민펜타(메틸렌포스폰산), 시클로헥산디아민테트라(메틸렌포스폰산), 히드록시포스포노아세트산 및 2-포스핀산 부탄-1,2,4-트리카르복실산으로 이루어진 군에서 선택되는 하나 이상인 것이 바람직하다.Specifically, the organic acid is selected from the group consisting of aminotri (methylenephosphonic acid), ethylidene diphosphonic acid, 1-hydroxyethylidene-1,1-diphosphonic acid, 1-hydroxypropylidene- (Methylenephosphonic acid), 1,2-propylene diamine tetra (methylenephosphonic acid), dodecylaminbis (methylenephosphonic acid), nitrotris (Methylenephosphonic acid), ethylenediamine bis (methylenephosphonic acid), ethylenediamine tetra (methylenephosphonic acid), hexenediamine tetra (methylenephosphonic acid), diethylenetriaminepenta (methylenephosphonic acid), cyclohexanediamine tetra Phosphonic acid), hydroxyphosphonoacetic acid, and 2-phosphinic acid butane-1,2,4-tricarboxylic acid.
또한, 상기 폴리카르복실산 공중합체는 금속의 표면에 보호막층을 형성하여 금속과 알칼리 이온의 과도한 반응을 억제하여 금속의 부식을 방지하는 역할을 한다.In addition, the polycarboxylic acid copolymer serves to prevent corrosion of the metal by forming an overcoat layer on the surface of the metal to suppress excessive reaction between the metal and the alkali ion.
구체적으로, 상기 유기산은 하기 화학식 2로 표시되는 폴리카르복실산 공중합체를 포함하는 것이 바람직하다.Specifically, the organic acid preferably includes a polycarboxylic acid copolymer represented by the following formula (2).
[화학식 2](2)
상기 화학식 2에서, 상기 R2 내지 R4는 서로 독립적으로 수소, 메틸기, 에틸기 또는 -(CH2)m2COOM2이고, 상기 M1 및 M2는 서로 독립적으로 수소, 알칼리 금속, 알칼리 토금속 또는 암모늄기이고, 상기 m1 및 m2는 서로 독립적으로 0 내지 2의 정수이다.Wherein R 2 to R 4 independently represent hydrogen, methyl group, ethyl group or - (CH 2 ) m COOM 2 , and M 1 and M 2 independently represent hydrogen, an alkali metal, an alkaline earth metal or an ammonium group And m 1 and m 2 are independently an integer of 0 to 2.
이때, 상기 암모늄기는 암모늄(NH4 +)뿐만 아니라, 질소원자에 결합된 수소원자 중 하나 이상이 다른 치환기로 치환된 암모늄도 포함하는 것을 의미하며, 예컨대, 상기 암모늄기는 알킬암모늄 등을 포함한다.At this time, the ammonium group is an ammonium (NH 4 +), but also meant to include also ammonium, one or more of the hydrogen atoms bonded to the nitrogen atom is substituted by other substituents, and, for example, the ammonium group may include alkyl ammonium.
또한, 상기 알칼리 금속은 Li, Na, K, Rb, Cs 또는 Fr 등이고, 알칼리 토금속은 Ca, Sr, Ba 또는 Ra 등인 것이 바람직하다.The alkali metal is preferably Li, Na, K, Rb, Cs or Fr, and the alkaline earth metal is preferably Ca, Sr, Ba, or Ra.
상기 폴리카르복실산 공중합체의 구체적인 예로는 폴리아크릴산 중합체(PAA), 폴리메틸(메타)아크릴산 공중합체(PMAA), 폴리아크릴산말레산 공중합체(PAMA), 폴리아크릴산메틸(메타)아크릴산 공중합체(PAMAA), 폴리말레산 공중합체(PMA), 폴리메틸(메타)아크릴산말레산 공중합체(PMAMA) 및 이들의 염으로 이루어진 군에서 선택되는 하나 이상인 것이 바람직하다.Specific examples of the polycarboxylic acid copolymer include polyacrylic acid polymer (PAA), polymethyl (meth) acrylic acid copolymer (PMAA), polyacrylic acid maleic acid copolymer (PAMA), poly (methyl methacrylate) PAMAA), a polymaleic acid copolymer (PMA), a polymethyl (meth) acrylic acid maleic acid copolymer (PMAMA), and salts thereof.
상기 유기산은 세정액 조성물 총 중량에 대하여 0.01 내지 10중량%로 포함되는 것이 바람직하며, 상기 유기산의 함량이 0.01중량% 미만이면 금속배선에 대한 부식방지력이 부족해질 뿐만 아니라 유기오염물에 대한 제거력이 저하되고, 10중량%를 초과하면 pH저하로 인해 파티클 세정력이 저하되고 세정액의 점도 상승으로 인한 린스력 저하가 발생하는 문제점이 있다.The organic acid is preferably contained in an amount of 0.01 to 10% by weight based on the total weight of the cleaning liquid composition. If the content of the organic acid is less than 0.01% by weight, not only the corrosion resistance against the metal wiring becomes insufficient, If it is more than 10% by weight, the particle detergency is lowered due to a decrease in pH, and the rinse force is lowered due to an increase in the viscosity of the cleaning liquid.
상기 유기 아민은 하기 화학식 3 또는 화학식 4로 표시되는 것이 바람직하다.The organic amine is preferably represented by the following formula (3) or (4).
[화학식 3](3)
[화학식 4][Chemical Formula 4]
상기 화학식 3 또는 4에서, R5 내지 R11은 서로 독립적으로 수소; 아미노기로 치환 또는 비치환된 탄소수 1 내지 10의 알킬기; 탄소수 1 내지 4의 알킬기로 치환된 아미노기로 치환된 탄소수 1 내지 10의 알킬기; 탄소수 2 내지 10의 알케닐기; 탄소수 1 내지 10의 히드록시알킬기; 카르복실기 또는 히드록시기로 치환 또는 비치환된 탄소수 1 내지 10의 알콕시기로 치환된 탄소수 1 내지 10의 알킬기; 탄소수 1 내지 4의 알킬기로 치환 또는 비치환된 아미노기; 탄소수 1 내지 4의 알킬기로 치환 또는 비치환된 페닐기; 또는 탄소수 1 내지 4의 알킬기로 치환 또는 비치환된 벤질기이고, R5 내지 R11에서 이웃한 두개의 기는 서로 결합하여 환을 형성할 수 있다. 상기 화학식 4에서 R12는 비치환된 탄소수 1 내지 10의 알킬렌기이다. In the above formula (3) or (4), R 5 to R 11 independently represent hydrogen; An alkyl group having 1 to 10 carbon atoms which is unsubstituted or substituted with an amino group; An alkyl group having 1 to 10 carbon atoms substituted with an amino group substituted with an alkyl group having 1 to 4 carbon atoms; An alkenyl group having 2 to 10 carbon atoms; A hydroxyalkyl group having 1 to 10 carbon atoms; An alkyl group having 1 to 10 carbon atoms which is substituted with a carboxyl group or a hydroxy group and is substituted with an alkoxy group having 1 to 10 carbon atoms; An amino group substituted or unsubstituted with an alkyl group having 1 to 4 carbon atoms; A phenyl group substituted or unsubstituted with an alkyl group having 1 to 4 carbon atoms; Or a benzyl group substituted or unsubstituted with an alkyl group having 1 to 4 carbon atoms, and two adjacent groups in R 5 to R 11 may be bonded to each other to form a ring. In Formula 4, R 12 is an unsubstituted alkylene group having 1 to 10 carbon atoms.
이때, 상기 유기 아민은 메틸아민, 에틸아민, 모노이소프로필아민, n-부틸아민, sec-부틸아민, 이소부틸아민, t-부틸아민, 펜틸아민, 디메틸아민, 디에틸아민, 디프로필아민, 디이소프로필아민, 디부틸아민, 디이소부틸아민, 메틸에틸아민, 메틸프로필아민, 메틸이소프로필아민, 메틸부틸아민, 메틸이소부틸아민, 트리메틸아민, 트리에틸아민, 트리프로필아민, 트리부틸아민, 트리펜틸아민, 디메틸에틸아민, 메틸디에틸아민, 메틸디프로필아민, 콜린, 모노에탄올아민, 디에탄올아민, 트리에탄올아민, 모노프로판올아민, 2-아미노에탄올, 2-(에틸아미노)에탄올, 2-(메틸아미노)에탄올, N-메틸에탄올아민, N-메틸디에탄올아민, N,N-디메틸에탄올아민, N,N-디에틸아미노에탄올, 2-(2-아미노에틸아미노)-1-에탄올, 1-아미노-2-프로판올, 2-아미노-1-프로판올, 3-아미노-1-프로판올, 4-아미노-1-부탄올, 디부탄올아민, (부톡시메틸)디에틸아민, (메톡시메틸)디에틸아민, (메톡시메틸)디메틸아민, (부톡시메틸)디메틸아민, (이소부톡시메틸)디메틸아민, (메톡시메틸)디에탄올아민, (히드록시에틸옥시메틸)디에틸아민, 메틸(메톡시메틸)아미노에탄, 메틸(메톡시메틸)아미노에탄올, 메틸(부톡시메틸)아미노에탄올, 2-(2-아미노에톡시)에탄올, 1-(2-히드록시에틸)피페라진, 1-(2-아미노에틸)피페라진, 1-(2-히드록시에틸)메틸피페라진, N-(3-아미노프로필)모폴린, 2-메틸피페라진, 1-메틸피페라진, 1-아미노-4-메틸피페라진, 1-벤질 피페라진, 1-페닐 피페라진, N,N,N',N'-테트라메틸프로판디아민, N,N,N',N'-테트라메틸헥산디아민, N,N,N',N'-테트라에틸메탄디아민 및 N,N,N',N'-테트라메틸에틸렌디아민으로 이루어진 군에서 선택되는 하나 이상인 것이 바람직하고, 보다 바람직하게는 모노에탄올아민, 트리에탄올아민, 1-아미노-2-프로판올, 2-(2-아미노에톡시)에탄올, N-메틸에탄올아민, N-메틸디에탄올아민, N,N-디메틸에탄올 아민, N,N-디에틸아미노에탄올 및 2-(2-아미노에틸아미노)-1-에탄올로 이루어진 군에서 선택되는 하나 이상인 것이 좋고, 보다 바람직하게는 N,N,N',N'-테트라메틸프로판디아민, N,N,N',N'-테트라메틸헥산디아민, N,N,N',N'-테트라에틸메탄디아민 및 N,N,N',N'-테트라메틸에틸렌디아민으로 이루어진 군에서 선택되는 하나 이상인 것이 좋다.The organic amine may be selected from the group consisting of methylamine, ethylamine, monoisopropylamine, n-butylamine, sec-butylamine, isobutylamine, t-butylamine, pentylamine, dimethylamine, diethylamine, dipropylamine, But are not limited to, aliphatic amines such as diethylamine, diisopropylamine, dibutylamine, diisobutylamine, methylethylamine, methylpropylamine, methylisopropylamine, methylbutylamine, methylisobutylamine, trimethylamine, , 2-aminoethanol, 2- (ethylamino) ethanol, 2-ethylhexylamine, diethanolamine, triethanolamine, monopropanolamine, - (methylamino) ethanol, N-methylethanolamine, N-methyldiethanolamine, N, N-dimethylethanolamine, N, N-diethylaminoethanol, 2- Amino-2-propanol, 2-amino-1-propanol, 3- (Butoxymethyl) dimethylamine, (methoxymethyl) dimethylamine, (methoxymethyl) dimethylamine, butoxymethyldimethylamine, (Methoxymethyl) aminoethanol, methyl (methoxymethyl) aminoethanol, methyl (methoxymethyl) aminoethanol, and the like. (2-hydroxyethyl) piperazine, 1- (2-aminoethyl) piperazine, 1- (2-hydroxyethyl) Methylpiperazine, 1-amino-4-methylpiperazine, 1-benzylpiperazine, 1-phenylpiperazine, N (3-aminopropyl) morpholine, , N, N ', N'-tetramethylpropanediamine, N, N, N', N'-tetramethylhexanediamine, , N'-tetramethylethylenediamine, and at least one selected from the group consisting of Aminoethanol), N-methylethanolamine, N-methyldiethanolamine, N, N-diethanolamine, N, N ', N', N'-tetramethylethylenediamine, N, N-diethylaminoethanol and 2- N ', N'-tetramethylhexanediamine, N, N, N', N'-tetraethylmethanediamine and N, N ', N'-tetramethylethylene Diamine. ≪ / RTI >
상기 유기 아민은 세정액 조성물 총 중량에 대하여 0.05 내지 10중량%인 것이 바람직하고, 보다 바람직하게는 0.1 내지 5중량%인 것이 좋다. 또한, 상기 유기 아민을 포함하는 세정액 조성물의 pH는 pH 7 내지 pH 13, 보다 바람직하게는 pH 8 내지 pH 11인 것이 좋다.The amount of the organic amine is preferably 0.05 to 10% by weight, more preferably 0.1 to 5% by weight based on the total weight of the cleaning liquid composition. The pH of the cleaning liquid composition containing the organic amine is preferably pH 7 to pH 13, more preferably pH 8 to pH 11.
상기 유기 아민의 함량이 0.05중량% 미만이면 충분한 세정효과를 달성할 수 없고, 10중량%를 초과하면 pH가 높아져 알루미늄 혹은 알루미늄 합금 배선에 대한 부식이 증가하기 때문에 액정표시소자 기판 등의 제조 수율을 떨어뜨리는 문제점이 있다.If the content of the organic amine is less than 0.05% by weight, a satisfactory cleaning effect can not be attained. If the content of the organic amine exceeds 10% by weight, the pH is increased and the corrosion to aluminum or aluminum alloy wiring increases. There is a problem to drop.
상기 실세스퀴옥산, 유기산 및 유기 아민이 포함된 세정액 조성물에 수용성 유기 용매가 추가로 포함될 수 있다. 이때 상기 수용성 유기 용매는 유기 오염물을 용해시키는 용제 역할을 하고, 세정액의 표면장력을 저하시켜 유리 기판에 대한 습윤성을 증가시키므로 세정력을 향상시키는 역할을 한다. A water-soluble organic solvent may be further included in the cleaning liquid composition containing the silsesquioxane, the organic acid, and the organic amine. At this time, the water-soluble organic solvent serves to dissolve organic contaminants and lowers the surface tension of the cleaning liquid to increase the wettability to the glass substrate, thereby improving the cleaning power.
상기 수용성 유기 용매는 양자성 극성 용매 및 비양자성 극성 용매로 이루어진 군에서 선택되는 하나 이상인 것이 바람직하다. 구체적으로 상기 양자성 극성 용매로, 에틸렌글리콜 모노메틸 에테르, 에틸렌글리콜 모노에틸 에테르, 에틸렌글리콜 모노이소프로필 에테르, 에틸렌글리콜 모노부틸 에테르, 디에틸렌글리콜 모노메틸 에테르, 디에틸렌글리콜 모노에틸 에테르, 디에틸렌글리콜 모노이소프로필 에테르, 디에틸렌글리콜 모노부틸 에테르, 트리에틸렌글리콜 모노메틸 에테르, 트리에틸렌글리콜 모노에틸 에테르, 트리에틸렌글리콜 모노이소프로필 에테르, 트리에틸렌글리콜 모노부틸 에테르, 폴리에틸렌글리콜 모노메틸 에테르, 폴리에틸렌글리콜 모노부틸 에테르, 프로필렌글리콜 모노메틸 에테르, 디프로필렌글리콜 모노메틸 에테르, 트리프로필렌글리콜 모노메틸 에테르 및 프로필렌글리콜 모노메틸 에테르 아세테이트, 상기 비양자성 극성 용매로, N-메틸 피롤리돈(NMP), N-에틸 피롤리돈, 1,3-디메틸-2-이미다졸리디논, 1,3-디프로필-2-이미다졸리디논, γ-부티로락톤, 디메틸술폭사이드(DMSO), 술폴란, 트리에틸포스페이트, 트리부틸포스페이트, 디메틸카보네이트, 에틸렌카보네이트, 포름아미드, N-메틸포름아미드, N,N-디메틸포름아미드, 아세트아미드, N-메틸아세트아미드, N,N-디메틸아세트아미드, N-(2-히드록시에틸)아세트아미드, 3-메톡시-N,N-디메틸프로피온아미드, 3-(2-에틸헥실옥시)-N,N-디메틸프로피온아미드 및 3-부톡시-N,N-디메틸프로피온아미드로 이루어진 군에서 선택되는 하나 이상인 것이 바람직하다.The water-soluble organic solvent is preferably at least one selected from the group consisting of a proton-polar solvent and an aprotic polar solvent. Specifically, as the protonic polar solvent, at least one solvent selected from the group consisting of ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol monoisopropyl ether, ethylene glycol monobutyl ether, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene Ethylene glycol monomethyl ether, glycol monoisopropyl ether, diethylene glycol monobutyl ether, triethylene glycol monomethyl ether, triethylene glycol monoethyl ether, triethylene glycol monoisopropyl ether, triethylene glycol monobutyl ether, polyethylene glycol monomethyl ether, polyethylene glycol Propylene glycol monomethyl ether, dipropylene glycol monomethyl ether, tripropylene glycol monomethyl ether and propylene glycol monomethyl ether acetate, with the aprotic polar solvent, N-methylpyrrole (NMP), N-ethylpyrrolidone, 1,3-dimethyl-2-imidazolidinone, 1,3-dipropyl-2-imidazolidinone,? -Butyrolactone, dimethylsulfoxide N, N-dimethylformamide, acetamide, N-methylacetamide, N, N-dimethylacetate, N, N-dimethylacetamide, Amide, N- (2-hydroxyethyl) acetamide, 3-methoxy-N, N-dimethylpropionamide, 3- (2-ethylhexyloxy) -N, N- -N, N-dimethylpropionamide, and the like.
상기 양자성 극성 용매 함량 증가는 물에 의한 세정제의 제거력을 향상 시켜 표면에 오염물이 잔류하는 문제를 해결할 수 있으며, 비양자성 극성 용매는 유기 오염물 제거를 향상시킬 수 있어 2종을 함께 사용하는 것이 더욱 바람직하다.The increase in the amount of the protonic polar solvent improves the removal performance of the detergent by water, thereby solving the problem that the contaminants remain on the surface, and since the aprotic polar solvent can improve the removal of organic contaminants, desirable.
상기 수용성 유기 용매가 세정액 조성물에 포함될 경우, 세정액 조성물 총 중량에 대하여 0.05 내지 40중량%로 포함하는 것이 바람직하고, 보다 바람직하게는 0.5 내지 20중량%인 것이 좋다. 상기 수용성 유기 용매의 함량이 0.05중량% 미만이면 세정액 조성물의 유기 오염물에 대한 용해력 증가를 기대할 수 없고, 40중량%를 초과하면 세정액으로서 성능이 저하되고 가격 상승으로 경제성이 떨어지는 문제점이 있다.When the water-soluble organic solvent is contained in the cleaning liquid composition, it is preferably contained in an amount of 0.05 to 40% by weight, more preferably 0.5 to 20% by weight based on the total weight of the cleaning liquid composition. If the content of the water-soluble organic solvent is less than 0.05% by weight, an increase in the solubility of the cleaning liquid composition to organic contaminants can not be expected. If it exceeds 40% by weight, the performance of the cleaning liquid deteriorates.
또한, 상기 세정액 조성물에 탈이온수를 추가로 포함할 수 있다. 본 발명의 세정액 조성물에 포함되는 탈이온수는 염기성 화합물의 활성을 향상시켜 유기오염물 및 파티클의 세정속도를 증가시키며, 수용성 극성용매에 혼합되어 탈이온수에 의한 린스 공정시 기판상에 잔존하는 유기 오염물 및 파티클을 빠르고 완전하게 제거시킬 수 있다.
Further, the cleaning liquid composition may further include deionized water. The deionized water contained in the cleaning liquid composition of the present invention improves the activity of the basic compound to increase the cleaning speed of the organic contaminants and particles. The organic contaminants remaining on the substrate during the rinsing process with the deionized water, Particles can be removed quickly and completely.
이하, 본 발명을 실시예에 의해 상세히 설명한다.Hereinafter, the present invention will be described in detail by way of examples.
단, 하기 실시예는 본 발명을 예시하는 것일 뿐, 본 발명의 내용이 하기 실시예에 한정되는 것은 아니다.However, the following examples are illustrative of the present invention, and the present invention is not limited to the following examples.
<실시예 1>≪ Example 1 >
실세스퀴옥산으로 (3-(2-아미노에틸)아미노프로필)메톡시터미네이티드 실세스퀴옥산 0.5중량%, 유기산으로 1-히드록시에틸리덴-1,1-디포스폰산(HEDP) 2.0중량%, 유기 아민으로 N,N,N',N'-테트라메틸프로판디아민 0.5중량%, 수용성 유기용매로 N-메틸피롤리돈(NMP) 10.0중량% 및 잔량의 물을 혼합하고 교반하여 세정액을 제조하였다.0.5 weight% of (3- (2-aminoethyl) aminopropyl) methoxytriminated silsesquioxane as the silsesquioxane, 1-hydroxyethylidene-1,1-diphosphonic acid (HEDP) 2.0% by weight of water, 0.5% by weight of N, N, N ', N'-tetramethylpropanediamine as an organic amine, 10.0% by weight of N-methylpyrrolidone (NMP) To prepare a cleaning liquid.
<실시예 2>≪ Example 2 >
상기 실시예 1에서, 상기 (3-(2-아미노에틸)아미노프로필)메톡시터미네이티드 실세스퀴옥산 0.5중량% 대신에 1.0중량%, 1-히드록시에틸리덴-1,1-디포스폰산(HEDP) 2.0중량% 대신에 1.0중량%, N-메틸피롤리돈(NMP) 10.0중량% 대신에 20.0중량%인 것을 제외하고 상기 실시예 1과 동일하게 실시하여 세정액을 제조하였다.In Example 1, 1.0 wt% of (3- (2-aminoethyl) aminopropyl) methoxytriminated silsesquioxane was used instead of 0.5 wt% of 1-hydroxyethylidene- A cleaning solution was prepared in the same manner as in Example 1 except that 1.0% by weight was used instead of 2.0% by weight of HEDP, and 20.0% by weight was used instead of 10.0% by weight of N-methylpyrrolidone (NMP).
<실시예 3>≪ Example 3 >
상기 실시예 1에서, 상기 (3-(2-아미노에틸)아미노프로필)메톡시터미네이티드 실세스퀴옥산 0.5중량% 대신에 1.0중량%, N,N,N',N'-테트라메틸프로판디아민 0.5중량% 대신에 1.0중량%, N-메틸피롤리돈(NMP) 10.0중량% 대신에 디에틸렌글리콜 모노부틸 에테르(BDG) 10.0중량%인 것을 제외하고 상기 실시예 1과 동일하게 실시하여 세정액을 제조하였다.In Example 1, 1.0 wt% of N, N, N ', N'-tetramethylpropane (1.0 wt%) was added instead of 0.5 wt% of (3- Except that diethylene glycol monobutyl ether (BDG) 10.0% by weight was used in place of 0.5% by weight of diamine and 10.0% by weight of N-methylpyrrolidone (NMP) instead of 0.5% by weight of diamine. .
<실시예 4><Example 4>
상기 실시예 1에서, 상기 (3-(2-아미노에틸)아미노프로필)메톡시터미네이티드 실세스퀴옥산 0.5중량% 대신에 1.0중량%, N,N,N',N'-테트라메틸프로판디아민 0.5중량% 대신에 N,N,N',N'-테트라메틸헥산디아민 0.5중량%, N-메틸피롤리돈(NMP) 10.0중량% 대신에 디에틸렌글리콜 모노부틸 에테르(BDG) 15.0중량%인 것을 제외하고 상기 실시예 1과 동일하게 실시하여 세정액을 제조하였다.In Example 1, 1.0 wt% of N, N, N ', N'-tetramethylpropane (1.0 wt%) was added instead of 0.5 wt% of (3- Instead of 0.5% by weight of diamine, 15.0% by weight of diethylene glycol monobutyl ether (BDG) was used instead of 0.5% by weight of N, N, N ', N'-tetramethylhexanediamine and 10.0% To prepare a cleaning liquid. ≪ tb > < TABLE >
<실시예 5>≪ Example 5 >
실시예 1에 있어서, 상기 (3-(2-아미노에틸)아미노프로필)메톡시터미네이티드 실세스퀴옥산 0.5중량% 대신에 2.0중량%, 1-히드록시에틸리덴-1,1-디포스폰산(HEDP) 2.0중량% 대신에 폴리아크릴산말레산 공중합체(PAMA) 1.0중량%, N,N,N',N'-테트라메틸프로판디아민 0.5중량% 대신에 N,N,N',N'-테트라메틸헥산디아민 1.0중량%인 것을 제외하고 상기 실시에 1과 동일하게 실시하여 세정액을 제조하였다.In the same manner as in Example 1 except that 2.0 wt% of (3- (2-aminoethyl) aminopropyl) methoxytriminated silsesquioxane was used instead of 0.5 wt% of 1-hydroxyethylidene- 1.0% by weight of a polyacrylic acid maleic acid copolymer (PAMA) and 0.5% by weight of N, N, N ', N', N'-tetramethylpropanediamine instead of 2.0% -Tetramethylhexanediamine in an amount of 1.0% by weight based on the weight of the cleaning solution.
<실시예 6>≪ Example 6 >
실시예 1에 있어서, 상기 (3-(2-아미노에틸)아미노프로필)메톡시터미네이티드 실세스퀴옥산 0.5중량% 대신에 2.0중량%, 1-히드록시에틸리덴-1,1-디포스폰산(HEDP) 2.0중량% 대신에 폴리아크릴산말레산 공중합체(PAMA) 3.0중량%, N,N,N',N'-테트라메틸프로판디아민 0.5중량% 대신에 N,N,N',N'-테트라메틸헥산디아민 2.0중량%, N-메틸피롤리돈(NMP) 10.0중량% 대신에 15.0중량%인 것을 제외하고 상기 실시예 1과 동일하게 실시하여 세정액을 제조하였다.In the same manner as in Example 1 except that 2.0 wt% of (3- (2-aminoethyl) aminopropyl) methoxytriminated silsesquioxane was used instead of 0.5 wt% of 1-hydroxyethylidene- N, N ', N', N'-tetramethylpropane diamine was used instead of 3.0 wt% of polyacrylic acid maleic acid copolymer (PAMA) and 0.5 wt% of N, N, -Tetramethylhexanediamine (2.0% by weight), and N-methylpyrrolidone (NMP) (10.0% by weight) instead of 15.0% by weight.
<실시예 7>≪ Example 7 >
실시예 1에 있어서, 상기 (3-(2-아미노에틸)아미노프로필)메톡시터미네이티드 실세스퀴옥산 0.5중량% 대신에 2.0중량%, 1-히드록시에틸리덴-1,1-디포스폰산(HEDP) 2.0중량% 대신에 폴리아크릴산말레산 공중합체(PAMA) 1.0중량%, N,N,N',N'-테트라메틸프로판디아민 0.5중량% 대신에 N,N,N',N'-테트라에틸메탄디아민 1.0중량%, N-메틸피롤리돈(NMP) 10.0중량% 대신에 디에틸렌글리콜 모노부틸 에테르(BDG) 10.0중량%인 것을 제외하고 상기 실시예 1과 동일하게 실시하여 세정액을 제조하였다.In the same manner as in Example 1 except that 2.0 wt% of (3- (2-aminoethyl) aminopropyl) methoxytriminated silsesquioxane was used instead of 0.5 wt% of 1-hydroxyethylidene- 1.0% by weight of a polyacrylic acid maleic acid copolymer (PAMA) and 0.5% by weight of N, N, N ', N', N'-tetramethylpropanediamine instead of 2.0% Except that diethylene glycol monobutyl ether (BDG) 10.0% by weight was used instead of 1.0% by weight of tetraethylmethanediamine and 10.0% by weight of N-methylpyrrolidone (NMP) .
<실시예 8>≪ Example 8 >
실시예 1에 있어서, 상기 (3-(2-아미노에틸)아미노프로필)메톡시터미네이티드 실세스퀴옥산 0.5중량% 대신에 2.0중량%, 1-히드록시에틸리덴-1,1-디포스폰산(HEDP) 2.0중량% 대신에 폴리아크릴산말레산 공중합체(PAMA) 3.0중량%, N,N,N',N'-테트라메틸프로판디아민 0.5중량% 대신에 N,N,N',N'-테트라에틸메탄디아민 1.0중량%, N-메틸피롤리돈(NMP) 10.0중량% 대신에 디에틸렌글리콜 모노부틸 에테르(BDG) 15.0중량%인 것을 제외하고 상기 실시예 1과 동일하게 실시하여 세정액을 제조하였다.In the same manner as in Example 1 except that 2.0 wt% of (3- (2-aminoethyl) aminopropyl) methoxytriminated silsesquioxane was used instead of 0.5 wt% of 1-hydroxyethylidene- N, N ', N', N'-tetramethylpropane diamine was used instead of 3.0 wt% of polyacrylic acid maleic acid copolymer (PAMA) and 0.5 wt% of N, N, Except that diethylene glycol monobutyl ether (BDG) 15.0% by weight was used instead of 1.0% by weight of tetraethylmethanediamine and 10.0% by weight of N-methylpyrrolidone (NMP) .
<실시예 9>≪ Example 9 >
실시예 1에 있어서, 상기 (3-(2-아미노에틸)아미노프로필)메톡시터미네이티드 실세스퀴옥산 0.5중량% 대신에 2.0중량%, N,N,N',N'-테트라메틸프로판디아민 0.5중량% 대신에 N,N,N',N'-테트라메틸헥산디아민 2.0중량%, N-메틸피롤리돈(NMP) 10.0중량% 대신에 디에틸렌글리콜 모노부틸 에테르(BDG) 10.0중량%인 것을 제외하고 상기 실시예 1과 동일하게 실시하여 세정액을 제조하였다.Except that 2.0% by weight of N, N, N ', N'-tetramethylpropane (NMP) was used in place of 0.5% by weight of the above (3- (2-aminoethyl) aminopropyl) methoxytriminated silsesquioxane. 10.0 wt.% Of diethylene glycol monobutyl ether (BDG) was used instead of 2.0 wt.% Of N, N, N ', N'-tetramethylhexanediamine and 10.0 wt.% Of N-methylpyrrolidone (NMP) instead of 0.5 wt. To prepare a cleaning liquid. ≪ tb > < TABLE >
<실시예 10>≪ Example 10 >
실세스퀴옥산으로 (3-(2-아미노에틸)아미노프로필)메톡시터미네이티드 실세스퀴옥산 1.0중량%, 유기산으로 1-히드록시에틸리덴-1,1-디포스폰산(HEDP) 2.0중량%, 유기 아민으로 N,N,N',N'-테트라메틸헥산디아민 2.0중량% 및 잔량의 물을 혼합하고 교반하여 세정액을 제조하였다.1.0% by weight of (3- (2-aminoethyl) aminopropyl) methoxytriminated silsesquioxane as the silsesquioxane, 1-hydroxyethylidene-1,1-diphosphonic acid (HEDP) 2.0% by weight of water, 2.0% by weight of N, N, N ', N'-tetramethylhexanediamine and an amount of water as organic amine were mixed and stirred to prepare a cleaning liquid.
<비교예 1>≪ Comparative Example 1 &
1-히드록시에틸리덴-1,1-디포스폰산(HEDP) 2.0중량%, N,N,N',N'-테트라메틸헥산디아민 1.0중량%, N-메틸피롤리돈(NMP) 10.0중량% 및 잔량의 물을 혼합하고 교반하여 세정액을 제조하였다.2.0 wt% of 1-hydroxyethylidene-1,1-diphosphonic acid (HEDP), 1.0 wt% of N, N, N ', N'-tetramethylhexanediamine, N-methylpyrrolidone % By weight and the remaining amount of water were mixed and stirred to prepare a cleaning liquid.
<비교예 2>≪ Comparative Example 2 &
(3-(2-아미노에틸)아미노프로필)메톡시터미네이티드 실세스퀴옥산 1.0중량%, N,N,N',N'-테트라메틸헥산디아민 0.5중량%, N-메틸피롤리돈(NMP) 15.0중량% 및 잔량의 물을 혼합하고 교반하여 세정액을 제조하였다.1.0% by weight of (3- (2-aminoethyl) aminopropyl) methoxytriminated silsesquioxane, 0.5% by weight of N, N, N ', N'-tetramethylhexanediamine, NMP) and the remaining amount of water were mixed and stirred to prepare a cleaning liquid.
b-1 : 1-히드록시에틸리덴-1,1-디포스폰산(HEDP)
b-2 : 폴리아크릴산말레산 공중합체(PAMA)
c-1 : N,N,N',N'-테트라메틸프로판디아민
c-2 : N,N,N',N'-테트라메틸헥산디아민
c-3 : N,N,N',N'-테트라에틸메탄디아민
d-1 : N-메틸피롤리돈(NMP)
d-2 : 디에틸렌글리콜 모노부틸 에테르(BDG)a-1: (3- (2-aminoethyl) aminopropyl) methoxytriminated silsesquioxane
b-1: 1-Hydroxyethylidene-1,1-diphosphonic acid (HEDP)
b-2: Polyacrylic acid maleic acid copolymer (PAMA)
c-1: N, N, N ', N'-tetramethylpropanediamine
c-2: N, N, N ', N'-tetramethylhexanediamine
c-3: N, N, N ', N'-tetraethylmethanediamine
d-1: N-methylpyrrolidone (NMP)
d-2: Diethylene glycol monobutyl ether (BDG)
<실험예 1><Experimental Example 1>
알루미늄이 2000Å 두께로 도포된 유리 기판을 상기 실시예 1 내지 10 및 비교예 1 내지 2에서 제조한 세정액에 각각 30분간 디핑(dipping)시켰다. 이때, 상기 세정액의 온도는 40℃이고, 상기 유리 기판에 도포된 알루미늄 막의 두께를 디핑 전후로 측정하고, 각각의 용해속도를 두께 변화로부터 계산하여 측정하고, 그에 대한 평가를 하기 표 2에 나타내었다. A glass substrate coated with aluminum to a thickness of 2000 占 was dipped in the cleaning liquids prepared in Examples 1 to 10 and Comparative Examples 1 and 2 for 30 minutes, respectively. At this time, the temperature of the cleaning liquid was 40 DEG C, and the thickness of the aluminum film applied to the glass substrate was measured before and after dipping, and the respective dissolution rates were measured from the change in thickness, and the evaluation thereof is shown in Table 2 below.
◎ :우수(2Å/분 미만)
○ :양호(5Å/분 미만)
△ :미흡(10Å/분 미만)
X :불량(10Å/분 이상)Aluminum corrosion
⊚: excellent (less than 2 Å / minute)
Good: Good (less than 5 A / min)
DELTA: insufficient (less than 10 ANGSTROM / minute)
X: poor (10 Å / min or more)
상기 표 2에 나타낸 바와 같이, 실시예 1 내지 10의 세정액은 알루미늄에 대한 에칭 속도가 5Å/분 미만으로 부식방지에 효과가 있지만, 비교예 1 내지 2의 세정액은 알루미늄에 대한 에칭 속도가 실시예 1 내지 10의 세정액에 비하여 높고, 부식방지에 대한 효과가 낮은 것을 알 수 있다.As shown in Table 2, the cleaning liquids of Examples 1 to 10 had an etching speed of less than 5 ANGSTROM / min, which was effective in preventing corrosion. However, the cleaning liquids of Comparative Examples 1 and 2 had an etching rate 1 to 10, and the effect on corrosion prevention is low.
<실험예 2><Experimental Example 2>
유기 오염물의 제거력 평가를 위해 5cm x 5cm 크기로 형성된 유리기판 위에 사람의 지문 자국으로 오염시키고, 오염된 기판을 스프레이식 유리 기판 세정장치를 이용하여 2분동안 40℃에서 상기 실시예 1 및 3 내지 6의 세정액으로 세정하고, 초순수에 30초 세척한 후 질소로 건조하였다. 이후, 유기 오염물의 제거 유무를 평가하고, 그 결과를 하기 표 3에 나타내었다.To evaluate the removability of the organic contaminants, the glass substrate was scratched with a fingerprint of human on a 5 cm x 5 cm glass substrate, and the contaminated substrate was cleaned with the spray type glass substrate cleaner for 2 minutes at 40 ° C in Examples 1, 6, washed with ultrapure water for 30 seconds, and then dried with nitrogen. Thereafter, the presence or absence of removal of organic contaminants was evaluated, and the results are shown in Table 3 below.
또한, 오염물의 제거력 평가를 위해 5cm x 5cm 크기로 형성된 유리 기판을 대기중에 3일간 방치시켜 오염시키고, 오염된 기판을 스프레이식 유리 기판 세정장치를 이용하여 1분 동안 40℃에서 상기 실시예 1 및 3 내지 6의 세정액으로 세정하고, 초순수에 30초 세척한 후 질소로 건조하였다. 이후, 오염물의 제거 정도는 접촉각 측정장치를 이용하여 세정전과 세정후의 접촉각 감소량으로 평가하고, 그 결과를 하기 표 3에 나타내었다.In order to evaluate the removability of the contaminants, a glass substrate formed to a size of 5 cm x 5 cm was allowed to stand in the air for 3 days for contaminating, and the contaminated substrate was cleaned using a spray type glass substrate cleaner for 1 minute at 40 ° C, 3 to 6 cleaning liquids, washed with ultrapure water for 30 seconds, and then dried with nitrogen. Then, the degree of removal of contaminants was evaluated by the contact angle reduction amount before cleaning and after cleaning using a contact angle measuring apparatus, and the results are shown in Table 3 below.
접촉각 40° 이상감소(◎), 40~30°감소(○), 30~20° 감소(△), 20° 미만감소(X)When the organic fingerprint is removed (○), when the fingerprint is not removed (x)
Decrease in contact angle by 40 ° or more (⊚), decrease in 40 ° to 30 ° (◯), decrease in 30 ° to 20 ° (Δ)
상기 표 3에서 나타낸 바와 같이, 실시예 1 및 3 내지 6의 세정액은 모두 유기 오염물의 제거력이 있음을 알 수 있으며, 접촉각이 30°이상 감소되어 오염물의 제거능력을 나타냄을 알 수 있다.As shown in Table 3, it can be seen that all the cleaning solutions of Examples 1 and 3 to 6 have the ability to remove organic contaminants, and that the contact angle is reduced by 30 ° or more, indicating the ability to remove contaminants.
<실험예 3><Experimental Example 3>
알루미늄의 패턴이 형성된 5cm x 5cm 크기의 유리 기판 위에 스프레이식 유리 기판 세정장치를 이용하여 40℃에서 2분 동안 실시예 1, 3 내지 6의 세정액으로 세정하고, 초순수에 30초 간 세척한 후 질소로 건조하였다.The substrate was cleaned with the cleaning liquids of Examples 1 and 3 to 6 using a spray-type glass substrate cleaning apparatus at 40 DEG C for 2 minutes, cleaned for 30 seconds in ultrapure water, Lt; / RTI >
세정 후의 알루미늄 패턴 내의 부식 발생 정도를 평가하여 표 4에 나타내었다. Table 4 shows the degree of occurrence of corrosion in the aluminum pattern after cleaning.
부식 없음(○), 부식 약간 발생(△), 다량 부식 발생(X)Aluminum pattern corrosion:
No corrosion (∘), slight corrosion (△), large amount of corrosion (X)
상기 표 4에 나타낸 바와 같이, 본 발명의 실시예 1 및 3 내지 6의 세정액은 알루미늄 패턴에 대한 부식 방지력이 우수하다는 것을 확인할 수 있다.As shown in Table 4, it can be confirmed that the cleaning liquids of Examples 1 and 3 to 6 of the present invention are excellent in corrosion resistance against an aluminum pattern.
Claims (12)
[화학식 1]
(R1SiO3/2)n
상기 화학식 1에서, n은 8 내지 100의 정수이고, R1은 서로 독립적으로 수소, 알킬, 알킬렌, 알릴, 알릴렌, 치환된 알킬, 알킬렌, 알릴, 알릴렌으로부터 선택된다.1. A cleaning liquid composition for aluminum and aluminum alloy corrosion inhibiting and electronic materials, comprising silsesquioxane, organic acid and organic amine represented by the following formula (1).
[Chemical Formula 1]
(R 1 SiO 3/2 ) n
In Formula 1, n is an integer of 8 to 100, and R 1 is independently selected from hydrogen, alkyl, alkylene, allyl, allylene, substituted alkyl, alkylene, allyl, and allylene.
[화학식 2]
상기 화학식 2에서, 상기 R2 내지 R4는 서로 독립적으로 수소, 메틸기, 에틸기 또는 -(CH2)m2COOM2이고, 상기 M1 및 M2는 서로 독립적으로 수소, 알칼리 금속, 알칼리 토금속 또는 암모늄기이고, 상기 m1 및 m2는 서로 독립적으로 0 내지 2의 정수이다.The cleaning liquid composition for an aluminum and aluminum alloy corrosion preventing and electronic material according to claim 1, wherein the organic acid is a polymer of a carboxylic acid compound represented by the following formula (2).
(2)
Wherein R 2 to R 4 independently represent hydrogen, methyl group, ethyl group or - (CH 2 ) m COOM 2 , and M 1 and M 2 independently represent hydrogen, an alkali metal, an alkaline earth metal or an ammonium group And m 1 and m 2 are independently an integer of 0 to 2.
[화학식 3]
[화학식 4]
상기 화학식 3 및 4에서, R5 내지 R11은 서로 독립적으로 수소 (단, R5 내지 R7이 모두 수소일 수 없다.); 아미노기로 치환 또는 비치환된 탄소수 1 내지 10의 알킬기; 탄소수 1 내지 4의 알킬기로 치환된 아미노기로 치환된 탄소수 1 내지 10의 알킬기; 탄소수 2 내지 10의 알케닐기; 탄소수 1 내지 10의 히드록시알킬기; 카르복실기 또는 히드록시기로 치환 또는 비치환된 탄소수 1 내지 10의 알콕시기로 치환된 탄소수 1 내지 10의 알킬기; 탄소수 1 내지 4의 알킬기로 치환 또는 비치환된 아미노기; 탄소수 1 내지 4의 알킬기로 치환 또는 비치환된 페닐기; 또는 탄소수 1 내지 4의 알킬기로 치환 또는 비치환된 벤질기이고, R5 내지 R11에서 이웃한 두개의 기는 서로 결합하여 환을 형성할 수 있고, 상기 화학식 4에서 R12는 비치환된 탄소수 1 내지 10의 알킬렌기이다.The cleaning liquid composition for an aluminum and aluminum alloy corrosion preventing and electronic material according to claim 1, wherein the organic amine is represented by the following Chemical Formula 3 or Chemical Formula 4.
(3)
[Chemical Formula 4]
In the general formulas (3) and (4), R 5 to R 11 independently of one another are hydrogen (provided that R 5 to R 7 can not all be hydrogen); An alkyl group having 1 to 10 carbon atoms which is unsubstituted or substituted with an amino group; An alkyl group having 1 to 10 carbon atoms substituted with an amino group substituted with an alkyl group having 1 to 4 carbon atoms; An alkenyl group having 2 to 10 carbon atoms; A hydroxyalkyl group having 1 to 10 carbon atoms; An alkyl group having 1 to 10 carbon atoms which is substituted with a carboxyl group or a hydroxy group and is substituted with an alkoxy group having 1 to 10 carbon atoms; An amino group substituted or unsubstituted with an alkyl group having 1 to 4 carbon atoms; A phenyl group substituted or unsubstituted with an alkyl group having 1 to 4 carbon atoms; Or a benzyl group substituted or unsubstituted with an alkyl group having 1 to 4 carbon atoms, two adjacent groups in R 5 to R 11 may be bonded to each other to form a ring, and R 12 in the formula (4) To 10 carbon atoms.
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