KR101817332B1 - Measurement Method of Time-Information using Digital oscilloscope In Pulsed Laser Optical System - Google Patents

Measurement Method of Time-Information using Digital oscilloscope In Pulsed Laser Optical System Download PDF

Info

Publication number
KR101817332B1
KR101817332B1 KR1020150129895A KR20150129895A KR101817332B1 KR 101817332 B1 KR101817332 B1 KR 101817332B1 KR 1020150129895 A KR1020150129895 A KR 1020150129895A KR 20150129895 A KR20150129895 A KR 20150129895A KR 101817332 B1 KR101817332 B1 KR 101817332B1
Authority
KR
South Korea
Prior art keywords
time information
laser beam
measurement value
signal
digital signal
Prior art date
Application number
KR1020150129895A
Other languages
Korean (ko)
Other versions
KR20170032092A (en
Inventor
박노철
최국종
문형배
이원섭
임건
전성빈
Original Assignee
연세대학교 산학협력단
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 연세대학교 산학협력단 filed Critical 연세대학교 산학협력단
Priority to KR1020150129895A priority Critical patent/KR101817332B1/en
Publication of KR20170032092A publication Critical patent/KR20170032092A/en
Application granted granted Critical
Publication of KR101817332B1 publication Critical patent/KR101817332B1/en

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/0014Monitoring arrangements not otherwise provided for

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

One aspect of the present invention relates to a time information measurement method using a digital oscilloscope, and more particularly, to a time information measurement method having a resolution in units of picoseconds using a digital oscilloscope in a pulse laser optical system.
According to the embodiment of the present invention, since a digital oscilloscope, which is a general-purpose instrument, is used instead of the existing expensive time resolution measuring instrument, it is possible to construct a low-cost system and improve mobility.

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a time information measurement method using a digital oscilloscope in a pulse laser optical system,

One aspect of the present invention relates to a time information measurement method using a digital oscilloscope, and more particularly, to a time information measurement method having a resolution in units of picoseconds using a digital oscilloscope in a pulse laser optical system.

The contents described in this section merely provide background information on the embodiment of the present invention and do not constitute the prior art.

In recent years, advances in measurement technology have been made in various fields, and pulsed lasers can be used to observe the characteristics of a wider range of samples. These techniques are able to obtain various information of the object by appropriately tuning or measuring the light which is maintained for a short time in time.

Representative examples of this technique include lifetime measurement of fluorescent dyes, pump-probe spectroscopy, and stimulation emission-diffusion microscopy. The unit of time distribution used here is typically as varied as several hundred picoseconds to several hundred nano-seconds.

Typical equipment used to measure this time distribution is the Sampling Oscilloscope, the Ultrafast Oscilloscope, and the Time-Correlated Single Photon Counting module (TCSPC).

In the case of the two oscilloscopes, the analog signal is measured, and the signal of the optical detector in the form of an analog output with a very fast response is measured.

However, there is a disadvantage that an analog type optical detector contains a lot of noise in a measurement signal as compared with a digital type (photon counting) detector. Therefore, although the measurement method using TCSPC is mainly used, there is a problem that it is a very expensive equipment having a minimum of ten million won or more, a built-in hardware is poor, and the equipment is usable only for periodic pulses.

Accordingly, it is an aspect of the present invention to provide a method of measuring time information in a pulse laser system using a digital oscilloscope.

The technical object of the present invention is not limited to the above-mentioned technical objects and other technical objects which are not mentioned can be clearly understood by those skilled in the art from the following description will be.

A signal generating step of generating a plurality of electrical signals and a plurality of pulse laser beams corresponding thereto at regular intervals in order to achieve the above object; A signal receiving step of receiving the pulse laser beam after passing through various optical elements; A first measurement value generation step of converting the received pulsed laser beam into a digital signal to generate a first measurement value; A second measurement value generation step of removing noise included in the received pulsed laser beam and processing the first measurement value through an interpolation method so that the converted digital signal can be triggered to a constant reference point to generate a second measurement value; And a time information measurement step of measuring time information by comparing the second measurement value and the electrical signal; Wherein in the signal receiving step, the pulse laser beam is received using one optical measuring instrument having a photon counting function, the time information measuring step measures the time information more than once by using the digital oscilloscope, And the time information is measured in units of picoseconds (ps) by confirming the distribution of the time information by making the time information into a histogram.
A light emitting unit for generating a plurality of electrical signals and a plurality of pulsed laser beams corresponding thereto at regular intervals; A light receiving unit for receiving the pulse laser beam and converting the received pulse laser beam into a digital signal; And a controller for receiving the digital signal from the light receiving unit and removing the noise included in the received pulsed laser beam, processing the digital signal through an interpolation method so that the converted digital signal can be triggered to a constant reference point, A measuring unit for comparing time information with the electrical signal to measure time information; Wherein the light receiving unit receives a pulsed laser beam using one optical measuring instrument having a photon counting function, and the measuring unit includes an output terminal of a light receiving unit for outputting a digital signal and an output terminal of a light measuring unit having a photon counting function And a digital oscilloscope connected to each of the plurality of digital oscilloscopes and measuring time information more than a plurality of times and making the measured time information into a histogram to allow time information measurement in units of picoseconds (ps) An information measuring apparatus can be provided.

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

As described above, according to one embodiment of the present invention, the temporal distribution of light to be measured can be represented by the resolution in units of picoseconds, which can contribute to setting up a lifetime or a time-resolved microscope or spectroscopy.

In addition, since a conventional digital oscilloscope is used in place of the conventional expensive time resolution measuring device, a low-cost system can be constructed and mobility is improved.

In addition, the effect of the present invention has various effects such as excellent general versatility and economical efficiency according to the embodiments, and such effects can be clearly confirmed in the description of the embodiments described later.

1 shows a method of measuring time information according to an embodiment of the present invention.
2 shows an apparatus for measuring time information according to an embodiment of the present invention.
3 shows an interpolation method using a first-order interpolation method.

Hereinafter, an embodiment of the present invention will be described in detail with reference to exemplary drawings.

It should be noted that, in adding reference numerals to the constituent elements of the drawings, the same constituent elements are denoted by the same reference symbols as possible even if they are shown in different drawings. In the following description of the present invention, a detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear.

In addition, the size and shape of the components shown in the drawings may be exaggerated for clarity and convenience of explanation. In addition, terms specifically defined in consideration of the constitution and operation of the present invention are only for explaining the embodiments of the present invention, and do not limit the scope of the present invention.

1 shows a method of measuring time information according to an embodiment of the present invention. A method of measuring time information according to an exemplary embodiment of the present invention includes generating a plurality of electrical signals and a plurality of pulsed laser beams corresponding thereto at regular intervals (S100); A signal reception step (S110) of receiving the pulse laser beam after passing through various optical elements; A first measurement value generation step (S120) of converting the received pulsed laser beam into a digital signal to generate a first measurement value; A second measurement value generation step (S130) of processing the first measurement value to generate a second measurement value; And

And a time information measurement step (S140) of measuring time information by comparing the second measurement value and the electrical signal.

In the signal generation step S100, an electrical signal and a pulse laser beam corresponding to the electrical signal can be simultaneously generated and output.

In the signal receiving step (S110), the pulsed laser beam can be received after passing through various optical elements. Although the electrical signal is generated simultaneously with the pulse laser beam, the pulsed laser beam is received after passing through the various optical elements, so that it can be received with a time delay rather than the electrical signal. Where the optical element may comprise, for example, various lenses, mirrors or microscope devices.

The first measurement value generation step (S120) may convert the received pulsed laser beam into a digital signal to generate a first measurement value. Here, the received pulsed laser beam is difficult to store, process, or transmit as an analog signal. Therefore, it is possible to convert the digital signal into a digital signal and generate a first measurement value for processing. The received pulsed laser beam has a wave shape. In other words, the intensity of the light gradually becomes weaker. The width of this pulsed laser beam is very short at the picosecond level. Therefore, when receiving a pulsed laser beam and converting it into a digital signal, it is difficult to distinguish which part of the wave form of the pulsed laser beam is received. Therefore, it is necessary to secure a measurement at a certain point by using a method of triggering the pulsed laser beam at a certain reference point and securing a digital signal for the reference point.

In a second measurement value generation step (S130), a first measurement value is generated to generate a second measurement value, and in a time information measurement step (S140), the second measurement value is compared with an electrical signal to obtain time information Can be measured.

Measuring the time information may mean measuring the time interval between the electrical signal and the second measurement according to an embodiment.

The electrical signal can serve as a kind of reference beam. In other words, since the electrical signal is generated simultaneously with the pulse laser beam, and the pulse laser beam is received through the various optical devices and received with a time delay, the delay time of the second measurement value is measured by comparing the reference electrical signal with the second measurement value .

According to another embodiment, the second measurement may be used as the reference beam and the second measurement may be compared with the electrical signal to determine the time difference. That is, the reference signal may be an electrical signal or may be a second measurement value. Since only the time difference between the electrical signal and the second measurement value can be measured.

The second measurement value generation step (S130) may generate the second measurement value through the interpolation method. On the other hand, there may be various methods of interpolation, but one of them may be to measure at least three points in the first measurement and then generate a second measurement through interpolation based on the three points.

The width of the pulse shape of the pulse laser beam is very small. Therefore, the measurement part of the pulse laser beam in the waveform form is not constant. Therefore, it is necessary to keep the measured part of the waveform form constant. The first measurement value is processed through the interpolation method to generate the second measurement value, so that the predetermined point can be continuously measured.

That is, a point of 30% of the maximum point in the waveform form of the pulsed laser beam is set as the triggered point, three points of the waveform form of the pulsed laser beam are measured, and then, using the interpolation method, A point can be determined, and this triggered point can be regarded as a second measurement. Such an interpolation method can be automatically carried out by a computer program.

2 shows an apparatus for measuring time information according to an embodiment of the present invention.

Another embodiment of the present invention can provide a time information measurement apparatus. The apparatus for measuring time information according to the present embodiment may include a light emitting unit 100 for generating a plurality of electrical signals and a plurality of pulsed laser beams corresponding thereto at regular intervals.

Further, it may include a light receiving unit 300 that receives the pulse laser beam and converts the received pulse laser beam into a digital signal.

And a measuring unit 400 receiving the digital signal from the light receiving unit 300, processing the digital signal to generate a measurement value, and then measuring the time information by comparing the measured value with the electrical signal.

Here, the measurement unit 400 may include a digital oscilloscope. In addition, the measuring unit 400 may generate a measurement value by interpolation of the digital signal.

The light emitting unit 100 can simultaneously generate and irradiate an electrical signal and a pulse rareer beam corresponding to the electrical signal. That is, when irradiating a plurality of pulse laser beams and irradiating a pulse laser low beam, electrical signals can be generated together and output.

Here, the pulsed laser beam can be received by the light receiving unit 300 after passing through the various optical devices 200. [ The light receiving unit 300 may receive the pulse laser beam and then output a corresponding digital signal.

The measuring unit 400 receives the digital signal transmitted from the light receiving unit 300 and the electrical signal transmitted from the light emitting unit 100 and processes the digital signal to generate a measurement value and then compares the measurement value with an electrical signal, Can be measured.

The measured value may be obtained by interpolating the digital signal.

More specifically, the measuring apparatus can be configured by connecting a TTL output terminal of a pulse laser to channel 1 of a digital oscilloscope and connecting an output terminal of an optical measuring instrument such as APD or PMT having a photon counting function to channel 2 .

The periodic pulsed laser beam can be measured using a light meter. The pulse signal from the photometer is received by a digital oscilloscope and adjusted to the appropriate time scale and voltage scale. The time scale is adjusted to the time resolution to be measured and the voltage scale is measured The slope of the pulse signal is adjusted to have a slope of about 30 degrees.

Set the trigger mode of the digital oscilloscope to Normal and set it to Trigger on Channel 2 edge so that it triggers every time the beam comes in. At this time, if the trigger level is about 30% of the pulse peak point, the influence of noise can be minimized.

At this time, the pulse laser TTL output signal on channel 1 is stored more than 3000 times. The more storage times, the more accurate. The time value data is recorded by capturing a point at which about 3,000 or more pulse waveforms stored are about 30% of the peak value. Since the sampled signal may not be at 30% of the peak, we estimate the measured position based on the nearest measured value.

3 shows an interpolation method using a first-order interpolation method. It is possible to confirm the distribution of the time information of the light measured by the optical measuring instrument by making the histogram of more than 3000 time information thus obtained. This method allows more precise measurements because the oscilloscope's jitter flow is lower and the noise reduction in the setup configuration for measurement allows more accurate triggering.

The present invention can be applied to measurement of lifetime of fluorescent dyes and applicable to various pulse laser application systems such as STED Microscopy and Pump Probe Spectroscopy. For example, when the STED beam and the excitation beam are measured by the proposed method, the time difference between the two beams can be set to an optimized value of several tens of ps.

The present invention is also applicable to RIDAR technology, which is a distance measurement technique. For example, with the Time of Flight method of light, it is possible to measure distances with a resolution of less than a millimeter.

The present invention can replace or partially complement the TCSPC, which is an existing measurement apparatus, as a method that can be utilized in an uncomplicated time-resolved optical system. In particular, since the measuring device uses a digital oscilloscope, it is excellent in versatility and portability.

The present invention can be applied to various applications as a pico second unit time analysis means in optical research using pulsed laser, and it is possible to use TCSPC equipment as a general purpose measuring instrument as a digital oscilloscope, Respectively. To do this, we implement the hardware histogramming method of TCSPC by software and propose a mechanism and equipment setup for it. Interpolation method is used to compensate insufficient sampling of the measured signal.

The above description is only illustrative of the technical idea of the present invention, and various changes and modifications may be made by those skilled in the art without departing from the essential characteristics of the present invention.

The embodiments disclosed in the present invention are not intended to limit the scope of the present invention and are not intended to limit the scope of the present invention.

The scope of protection of the present invention should be construed according to the following claims, and all technical ideas within the scope of equivalents should be construed as falling within the scope of the present invention.

100:
200: Various optical devices
300:
400:

Claims (7)

A signal generating step of generating a plurality of electrical signals and a plurality of pulse laser beams corresponding thereto at regular intervals;
A signal receiving step of receiving the pulse laser beam after passing through various optical elements;
A first measurement value generation step of converting the received pulsed laser beam into a digital signal to generate a first measurement value;
A second measurement value generation step of removing noise included in the received pulsed laser beam and processing the first measurement value through an interpolation method so that the converted digital signal can be triggered to a constant reference point to generate a second measurement value; And
A time information measurement step of measuring time information by comparing the second measurement value and the electrical signal;
Wherein in the signal receiving step, the pulse laser beam is received using one optical measuring instrument having a photon counting function, the time information measuring step measures the time information more than once by using the digital oscilloscope, Wherein the time information is made into a histogram to confirm the distribution of time information, thereby enabling time information measurement in units of picoseconds (ps).
delete delete delete A light emitting unit for generating a plurality of electrical signals and a plurality of pulsed laser beams corresponding thereto at regular intervals;
A light receiving unit for receiving the pulse laser beam and converting the received pulse laser beam into a digital signal; And
A digital signal is received from the light-receiving unit, the noise included in the received pulsed laser beam is removed, and the digital signal is processed through an interpolation method so that the converted digital signal can be triggered to a constant reference point, A measuring unit for measuring time information in comparison with the electrical signal;
, ≪ / RTI &
The light receiving unit receives a pulsed laser beam using one optical measuring instrument having a photon counting function. The measuring unit is connected to an output terminal of a light receiving unit that outputs a digital signal and a digital oscilloscope Wherein a plurality of times of time information are measured, and the measured time information is converted into a histogram to confirm the distribution of time information, thereby enabling time information measurement in units of picoseconds (ps).
delete delete
KR1020150129895A 2015-09-14 2015-09-14 Measurement Method of Time-Information using Digital oscilloscope In Pulsed Laser Optical System KR101817332B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020150129895A KR101817332B1 (en) 2015-09-14 2015-09-14 Measurement Method of Time-Information using Digital oscilloscope In Pulsed Laser Optical System

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020150129895A KR101817332B1 (en) 2015-09-14 2015-09-14 Measurement Method of Time-Information using Digital oscilloscope In Pulsed Laser Optical System

Publications (2)

Publication Number Publication Date
KR20170032092A KR20170032092A (en) 2017-03-22
KR101817332B1 true KR101817332B1 (en) 2018-01-10

Family

ID=58497528

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020150129895A KR101817332B1 (en) 2015-09-14 2015-09-14 Measurement Method of Time-Information using Digital oscilloscope In Pulsed Laser Optical System

Country Status (1)

Country Link
KR (1) KR101817332B1 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003014585A (en) * 2001-06-07 2003-01-15 Agilent Technol Inc Judgment of characteristic of optical device
KR100483147B1 (en) * 2004-10-13 2005-04-14 한국표준과학연구원 System and method for measuring length of optical fiber

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003014585A (en) * 2001-06-07 2003-01-15 Agilent Technol Inc Judgment of characteristic of optical device
KR100483147B1 (en) * 2004-10-13 2005-04-14 한국표준과학연구원 System and method for measuring length of optical fiber

Also Published As

Publication number Publication date
KR20170032092A (en) 2017-03-22

Similar Documents

Publication Publication Date Title
US9709497B2 (en) Transient absorption measurement method and transient absorption measurement apparatus
KR102239319B1 (en) Time-resolved single-photon counting apparatus
CN106442378B (en) The device of spectral absorption accurate testing degree is improved based on Terahertz light comb
Lang et al. Broadband ultraviolet-visible transient absorption spectroscopy in the nanosecond to microsecond time domain with sub-nanosecond time resolution
WO2012011095A1 (en) Linear optical characterization of ultrashort optical pulses
Hou et al. Fast terahertz continuous-wave detector based on weakly ionized plasma
CN102929123B (en) Measurement system for start time difference between high-speed light signal acquisition equipment and high-speed electric signal acquisition equipment
CN103592277A (en) High-precision fluorescent lifetime measuring device
CN111289497A (en) Transient-stable state laser-induced breakdown spectroscopy detection system
KR101817332B1 (en) Measurement Method of Time-Information using Digital oscilloscope In Pulsed Laser Optical System
CN112903123A (en) Method and device for measuring single signal-to-noise ratio boost degree of plasma mirror based on synchronous chirp probe pulse
CN116859372A (en) APD focal plane device timing precision test system for active three-dimensional imaging
CN104913853B (en) Method and system for measuring ultra-short intense laser prepulsing
Jovanovic et al. High-dynamic-range, 200-ps window, single-shot cross-correlator for ultrahigh intensity laser characterization
CN104538829A (en) Short-pulse laser coherent combining system
Krstajić et al. Improving TCSPC data acquisition from CMOS SPAD arrays
JP5461079B2 (en) Light measuring device
Gruber et al. Recovery time measurements of silicon photomultipliers using a pulsed laser
DE102018130006A1 (en) Device and method for measuring semiconductor-based light sources
WO2022030063A1 (en) Time measurement device, fluorescence lifetime measurement device, and time measurement method
Li et al. Research of range resolution of streak tube imaging system
US20230314216A1 (en) Pulsed-light spectroscopic device
DE102011112893A1 (en) Method for time-resolved measurement of measurement signals generated in examination unit after stimulation by pulses and after scanning with temporally successive pulses, involves forming and digitalizing narrowband signals from pulses
Liu et al. A Single-Shot Electro-Optic Pulse Shape Acquisition System for OMEGA Laser Applications
CN108333161A (en) A kind of pulse laser based on optical fiber repeatedly utilizes device and fluorescence signal detection method back and forth

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant