KR101767724B1 - X-Ray Detector - Google Patents
X-Ray Detector Download PDFInfo
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- KR101767724B1 KR101767724B1 KR1020150072790A KR20150072790A KR101767724B1 KR 101767724 B1 KR101767724 B1 KR 101767724B1 KR 1020150072790 A KR1020150072790 A KR 1020150072790A KR 20150072790 A KR20150072790 A KR 20150072790A KR 101767724 B1 KR101767724 B1 KR 101767724B1
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- electrode
- negative electrode
- positive electrode
- protrusion
- ray detector
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/28—Measuring radiation intensity with secondary-emission detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/185—Measuring radiation intensity with ionisation chamber arrangements
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- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
Abstract
Disclosed is an electrode structure of a plasma display panel-based X-ray detector for detecting an X-ray as an electrical signal to increase the acquisition efficiency. In this case, four electrode structures including one electrode on the upper substrate and three electrodes on which the negative electrode is added to the lower substrate are applied, and protrusions on both sides of the positive electrode are provided, An X-ray detector capable of enhancing the signal acquisition efficiency by enhancing the electric field around and increasing the electron amplification.
Description
The present invention relates to an X-ray detector, and more particularly, to an electrode structure of an X-ray detector based on a plasma display panel capable of detecting an X-ray by an electrical signal to improve the acquisition efficiency.
Generally, a digital X-ray imaging apparatus, which is frequently used, includes a direct conversion system that directly receives an electrical signal of a photoconductor and generates an image, and an indirect conversion system that converts an induced phosphor light into an electrical signal by using a light- There is a conversion method. However, in general semiconductor-based detectors, it is not easy to increase the size, and it has disadvantages such as high cost per unit area and durability in which pixels are easily damaged due to radiation.
In order to overcome the above-mentioned problems, development of a different type of digital image device has been demanded. In this case, a PDP (Plasma Display Panel) method has been suggested as a detector of an X-ray image device.
An apparatus based on a plasma display panel has a structure in which a discharge voltage is applied after sealing a penning gas such as Xe or Ne on two substrates coated with a plurality of electrodes and by ultraviolet rays generated in a plasma generated by the discharge voltage, Refers to an image device that implements numbers, characters, or images by utilizing visible light generated by exciting phosphors formed in a predetermined pattern.
Such a plasma display panel-based X-ray detector has advantages such as low cost, large size, less damage by radiation, simple manufacturing process and long lifetime compared to a semiconductor-based detector.
1 is a schematic diagram of a conventional X-ray detector.
Referring to FIG. 1, a
Initial charges are generated in the
The
The present invention relates to an electrode structure of a plasma display panel-based X-ray detector capable of improving signal acquisition efficiency. That is, it is an object of the present invention to provide an X-ray detector capable of increasing the acquisition efficiency detected by an electrical signal of an X-ray by applying four electrode structures including one electrode on the upper substrate and three electrodes on the lower substrate.
According to an aspect of the present invention, there is provided a plasma display panel comprising: an upper electrode formed on an upper substrate; a plurality of lower electrodes formed on a lower substrate facing the upper substrate; and a lower electrode formed between the upper electrode and the plurality of lower electrodes And a gas layer filled with a mixed gas, and formed on at least one electrode of the plurality of lower electrodes, and at least one protrusion for strengthening an electric field between the plurality of lower electrodes.
The plurality of lower electrodes may include a positive electrode and a first negative electrode and a second negative electrode disposed adjacent to the positive electrode.
The positive electrode may be disposed between the first negative electrode and the second negative electrode.
The protrusion may be formed on both sides of the positive electrode.
The protrusion may be triangular.
The protrusion may be made of the same material as the positive electrode.
The width of the positive electrode may be equal to or smaller than the width of the first negative electrode or the width of the second negative electrode.
The first negative electrode and the second negative electrode may be respectively bent to be spaced apart from the protrusion by a predetermined distance.
According to the present invention, a total of four electrode structures including one electrode on the upper substrate and three electrodes on the lower substrate are applied, and a triangular protrusion is formed on the positive electrode formed on the lower substrate, And the electric field around the negative electrode can be enhanced to improve the signal acquisition efficiency.
In addition, an X-ray detector based on a plasma display panel has many advantages such as a low price, a large size, a low radiation damage, a simple manufacturing process and a low defect rate compared to a semiconductor-based detector Which has the potential to replace semiconductor-based detectors in the future.
The technical effects of the present invention are not limited to those mentioned above, and other technical effects not mentioned can be clearly understood by those skilled in the art from the following description.
1 is a schematic diagram of a conventional X-ray detector.
2 is a schematic diagram of an X-ray detector according to a preferred embodiment of the present invention.
3 (a) to 3 (c) are views for explaining the electrode structures of Example 1, Example 2 and Comparative Example of the present invention.
Figs. 4 (a) to 4 (c) are diagrams showing simulation results of an electronic drift line according to the electrode structures of Example 1, Example 2 and Comparative Example of the present invention.
5 (a) to 5 (c) are diagrams showing the results of the equal-potential simulation according to the electrode structures of the first, second and comparative examples of the present invention.
6 is a diagram showing the results of charge multiplication simulation according to the electrode structures of Examples 1, 2 and Comparative Example of the present invention.
7 is a view showing an electrode structure for an experimental example according to an embodiment of the present invention.
8 and 9 are graphs showing test results according to an experimental example of the present invention.
BRIEF DESCRIPTION OF THE DRAWINGS The present invention is capable of various modifications and various embodiments, and specific embodiments are illustrated in the drawings and described in detail in the detailed description. It is to be understood, however, that the invention is not to be limited to the specific embodiments, but includes all modifications, equivalents, and alternatives falling within the spirit and scope of the invention. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. Referring to the accompanying drawings, the same or corresponding components are denoted by the same reference numerals, .
FIG. 2 is a schematic view of an X-ray detector according to a preferred embodiment of the present invention, and FIGS. 3A to 3C are views for explaining the electrode structures of Examples 1, 2 and Comparative Example of the present invention to be.
2, an
The outside of the
The conventional electrode structure of a conventional X-ray detector has a three-electrode structure including one upper electrode on the lower surface of the upper substrate and a negative electrode and a positive electrode on the upper surface of the lower substrate. The electrode structure of the
The
The space between the
The
The
The
The first
As described above, the electrode of the
3 (a) to 3 (c), a detailed description of the first embodiment, the second embodiment and the comparative example of the present invention and the result of the simulation according to the first embodiment, the second embodiment and the comparative example will be described in detail below.
Example 1
3 (a), the lower electrode structure of the first embodiment includes a first
The width Wa of the
Example 2
3 (b), the lower electrode structure of the second embodiment includes a first
The width Wa of the
In Examples 1 and 2, one or two
Comparative Example
Referring to FIG. 3C, the lower electrode structure of the comparative example includes a conventional lower electrode structure, in which the lower electrode includes a
The width Wa of the
The sizes of the electrodes and
Width Wa (μm)
Width Wc (μm)
Height Hr (μm)
Length Br (μm)
4 (a) to 4 (c) are graphs showing simulation results of an electronic drift line according to the electrode structures of Example 1, Example 2 and Comparative Example of the present invention, and Figs. 5 (c) are graphs showing the results of an equal-potential simulation according to the electrode structures of Examples 1, 2 and Comparative Example of the present invention.
Referring to Figures 4 (a) -4 (c) and 5 (a) -5 (c), Figures 4 (a) (b) is a simulation result for each of the comparative examples, and FIG. 4 (c) and FIG. 5 (c) are simulation results for the case where the same voltage is applied to each electrode structure, The results of the simulation are compared. The simulated result view shows simulation results for an electron drift line and an equal-potential distribution in a plane located 0.1 mm above the upper surface of the lower electrode.
The increase in the electron drift line indicates that the multiplication of electrons in the region is further increased. As shown in Figs. 4 (a) to 4 (c), it is confirmed that the largest electron multiplication in the electrode structure of Example 1 is activated And it can be confirmed that the smallest electron multiplication is activated in the electrode structure of the comparative example.
This means that, at the same applied voltage, the number of electrons in Example 1 and Example 2, which are four electrode structures according to the present invention, is larger than that of the conventional three electrode structure, which is the electrode structure of the comparative example. That is, it can be confirmed that a strong electric field due to the edge effect is formed around the protruding
5 (a) to 5 (c), it can be seen that a stronger electric field is formed around the protruding
6 is a diagram showing the results of charge multiplication simulation according to the electrode structures of Examples 1, 2 and Comparative Example of the present invention.
Referring to FIG. 6, simulation results of FIG. 6 show simulation results of charge multiplication according to Example 1, Example 2, and Comparative Example. As a result, the initial charges generated by the incident X- To increase the charge in the
Simulation results for the average multiplication calculated by
Experimental Example
In order to evaluate the performance of the electrode structure according to Example 1 and Example 2 of the present invention, the electrode structure of Example 1 and the electrode structure of Example 2 were designed and tested.
FIG. 7 is a view showing an electrode structure for an experimental example according to an embodiment of the present invention, and FIGS. 8 to 9 are graphs showing test results according to an experimental example of the present invention.
7, the width of the electrodes of the
The mixed gas of Xe 80% + He 20% was used as the gas of the
8 (a) and 8 (b) show the results of the charge amount measurement according to Example 1 and Example 2, respectively, when X-ray is irradiated in the
Further, a formula for calculating the detection sensitivity of X-ray through the measured amount of charge is shown in Equation (1).
Here, Sensitivity is the detection sensitivity of the X-ray, Exposed Dose is the dose at the X-ray exposure, Exposed Detection Area is the irradiation area of the X-ray, and Charges during X-ray ON is the amount of charge when the X-ray is irradiated.
9 shows the detection sensitivity of X-rays calculated using Equation (1) as a comparative example of a conventional three-electrode structure and the calculation results of the four-electrode structure of the first and second embodiments of the present invention.
9, the X-ray detection sensitivity according to the electrode structure of Example 2 is 1.5 times higher than that of the electrode structure of the comparative example. In Example 1, the X- It can be confirmed that the line detection sensitivity has an improved detection performance of 3.8 times as compared with the electrode structure of the comparative example and 2.5 times as much as that of the electrode structure of the second embodiment.
As described above, the electrode structure of the
It should be noted that the embodiments of the present invention disclosed in the present specification and drawings are only illustrative of specific examples for the purpose of understanding and are not intended to limit the scope of the present invention. It will be apparent to those skilled in the art that other modifications based on the technical idea of the present invention are possible in addition to the embodiments disclosed herein.
201: upper substrate 202: lower substrate
203: upper electrode 204: first negative electrode
205: Positive electrode 206: Second negative electrode
207: gas layer 208:
Claims (8)
A plurality of lower electrodes formed on a lower substrate facing the upper substrate; And
And a gas layer formed between the upper electrode and the plurality of lower electrodes and filled with a mixed gas,
The plurality of lower electrodes may include a plurality of lower electrodes,
A positive electrode including at least one protrusion on each side thereof for enhancing an electric field between the plurality of lower electrodes; And
And a first negative electrode and a second negative electrode arranged to be spaced apart from each other by a predetermined distance about the positive electrode,
Wherein the first negative electrode and the second negative electrode each have a bent shape so as to be spaced apart from the protruding portion.
Wherein the protrusion is triangular in shape.
Wherein the protrusion is made of the same material as the positive electrode.
Wherein the width of the positive electrode is equal to or smaller than the width of the first negative electrode or the width of the second negative electrode.
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2002042666A (en) | 2000-07-27 | 2002-02-08 | Matsushita Electric Ind Co Ltd | Gas discharge display device |
JP2005260008A (en) * | 2004-03-11 | 2005-09-22 | Japan Science & Technology Agency | Radiation detector and its manufacturing method |
US20060113912A1 (en) | 2004-11-30 | 2006-06-01 | Tae-Woo Kim | Plasma display panel |
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KR101515130B1 (en) | 2008-11-10 | 2015-04-27 | 엘지이노텍 주식회사 | X-ray detector of line type within multiplication laye |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2002042666A (en) | 2000-07-27 | 2002-02-08 | Matsushita Electric Ind Co Ltd | Gas discharge display device |
JP2005260008A (en) * | 2004-03-11 | 2005-09-22 | Japan Science & Technology Agency | Radiation detector and its manufacturing method |
US20060113912A1 (en) | 2004-11-30 | 2006-06-01 | Tae-Woo Kim | Plasma display panel |
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