KR101719574B1 - Passivated quantum dot and method for manufacturing the same - Google Patents
Passivated quantum dot and method for manufacturing the same Download PDFInfo
- Publication number
- KR101719574B1 KR101719574B1 KR1020150084388A KR20150084388A KR101719574B1 KR 101719574 B1 KR101719574 B1 KR 101719574B1 KR 1020150084388 A KR1020150084388 A KR 1020150084388A KR 20150084388 A KR20150084388 A KR 20150084388A KR 101719574 B1 KR101719574 B1 KR 101719574B1
- Authority
- KR
- South Korea
- Prior art keywords
- quantum dot
- group
- zinc
- cadmium
- mercury
- Prior art date
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- 239000002096 quantum dot Substances 0.000 title claims abstract description 126
- 238000000034 method Methods 0.000 title claims abstract description 26
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 14
- -1 halogen salt Chemical class 0.000 claims abstract description 37
- 239000013110 organic ligand Substances 0.000 claims abstract description 26
- 229910052736 halogen Inorganic materials 0.000 claims abstract description 24
- 239000012454 non-polar solvent Substances 0.000 claims abstract description 21
- 150000002366 halogen compounds Chemical class 0.000 claims abstract description 20
- 238000002161 passivation Methods 0.000 claims abstract description 20
- 239000002798 polar solvent Substances 0.000 claims abstract description 20
- 239000002243 precursor Substances 0.000 claims description 34
- 150000007524 organic acids Chemical class 0.000 claims description 29
- ZQPPMHVWECSIRJ-KTKRTIGZSA-N oleic acid Chemical compound CCCCCCCC\C=C/CCCCCCCC(O)=O ZQPPMHVWECSIRJ-KTKRTIGZSA-N 0.000 claims description 21
- WRIDQFICGBMAFQ-UHFFFAOYSA-N (E)-8-Octadecenoic acid Natural products CCCCCCCCCC=CCCCCCCC(O)=O WRIDQFICGBMAFQ-UHFFFAOYSA-N 0.000 claims description 20
- LQJBNNIYVWPHFW-UHFFFAOYSA-N 20:1omega9c fatty acid Natural products CCCCCCCCCCC=CCCCCCCCC(O)=O LQJBNNIYVWPHFW-UHFFFAOYSA-N 0.000 claims description 20
- QSBYPNXLFMSGKH-UHFFFAOYSA-N 9-Heptadecensaeure Natural products CCCCCCCC=CCCCCCCCC(O)=O QSBYPNXLFMSGKH-UHFFFAOYSA-N 0.000 claims description 20
- 239000005642 Oleic acid Substances 0.000 claims description 20
- ZQPPMHVWECSIRJ-UHFFFAOYSA-N Oleic acid Natural products CCCCCCCCC=CCCCCCCCC(O)=O ZQPPMHVWECSIRJ-UHFFFAOYSA-N 0.000 claims description 20
- QXJSBBXBKPUZAA-UHFFFAOYSA-N isooleic acid Natural products CCCCCCCC=CCCCCCCCCC(O)=O QXJSBBXBKPUZAA-UHFFFAOYSA-N 0.000 claims description 20
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 8
- 229910052740 iodine Inorganic materials 0.000 claims description 6
- 239000011630 iodine Substances 0.000 claims description 6
- 239000004215 Carbon black (E152) Substances 0.000 claims description 5
- 229930195733 hydrocarbon Natural products 0.000 claims description 5
- 150000002430 hydrocarbons Chemical class 0.000 claims description 5
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 claims description 4
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical compound [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052795 boron group element Inorganic materials 0.000 claims description 4
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 claims description 4
- 229910052794 bromium Inorganic materials 0.000 claims description 4
- 229910052800 carbon group element Inorganic materials 0.000 claims description 4
- 229910001849 group 12 element Inorganic materials 0.000 claims description 4
- 229910052798 chalcogen Inorganic materials 0.000 claims description 3
- 229910052696 pnictogen Inorganic materials 0.000 claims description 3
- 239000000376 reactant Substances 0.000 claims description 2
- 239000003446 ligand Substances 0.000 abstract description 18
- 239000010409 thin film Substances 0.000 abstract description 11
- 238000006467 substitution reaction Methods 0.000 abstract 1
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 45
- 239000000243 solution Substances 0.000 description 20
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 18
- 229910052733 gallium Inorganic materials 0.000 description 18
- 239000010410 layer Substances 0.000 description 17
- 238000006243 chemical reaction Methods 0.000 description 16
- 230000000052 comparative effect Effects 0.000 description 16
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 14
- 150000002367 halogens Chemical class 0.000 description 10
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 9
- 150000001875 compounds Chemical class 0.000 description 9
- 239000002245 particle Substances 0.000 description 9
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 8
- 229910052738 indium Inorganic materials 0.000 description 8
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 8
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000002184 metal Substances 0.000 description 8
- XZXYQEHISUMZAT-UHFFFAOYSA-N 2-[(2-hydroxy-5-methylphenyl)methyl]-4-methylphenol Chemical compound CC1=CC=C(O)C(CC=2C(=CC=C(C)C=2)O)=C1 XZXYQEHISUMZAT-UHFFFAOYSA-N 0.000 description 7
- 229940107816 ammonium iodide Drugs 0.000 description 7
- 229910052793 cadmium Inorganic materials 0.000 description 7
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 6
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 6
- FTWRSWRBSVXQPI-UHFFFAOYSA-N alumanylidynearsane;gallanylidynearsane Chemical compound [As]#[Al].[As]#[Ga] FTWRSWRBSVXQPI-UHFFFAOYSA-N 0.000 description 6
- 229910052787 antimony Inorganic materials 0.000 description 6
- 239000000203 mixture Substances 0.000 description 6
- 238000001228 spectrum Methods 0.000 description 6
- 229910052782 aluminium Inorganic materials 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 5
- RLECCBFNWDXKPK-UHFFFAOYSA-N bis(trimethylsilyl)sulfide Chemical compound C[Si](C)(C)S[Si](C)(C)C RLECCBFNWDXKPK-UHFFFAOYSA-N 0.000 description 5
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 5
- 229910052980 cadmium sulfide Inorganic materials 0.000 description 5
- 239000002244 precipitate Substances 0.000 description 5
- 238000000926 separation method Methods 0.000 description 5
- PFNQVRZLDWYSCW-UHFFFAOYSA-N (fluoren-9-ylideneamino) n-naphthalen-1-ylcarbamate Chemical compound C12=CC=CC=C2C2=CC=CC=C2C1=NOC(=O)NC1=CC=CC2=CC=CC=C12 PFNQVRZLDWYSCW-UHFFFAOYSA-N 0.000 description 4
- POILWHVDKZOXJZ-ARJAWSKDSA-M (z)-4-oxopent-2-en-2-olate Chemical compound C\C([O-])=C\C(C)=O POILWHVDKZOXJZ-ARJAWSKDSA-M 0.000 description 4
- WUPHOULIZUERAE-UHFFFAOYSA-N 3-(oxolan-2-yl)propanoic acid Chemical compound OC(=O)CCC1CCCO1 WUPHOULIZUERAE-UHFFFAOYSA-N 0.000 description 4
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 4
- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 4
- 238000001157 Fourier transform infrared spectrum Methods 0.000 description 4
- 238000005481 NMR spectroscopy Methods 0.000 description 4
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 4
- 239000005083 Zinc sulfide Substances 0.000 description 4
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 4
- CHPZKNULDCNCBW-UHFFFAOYSA-N gallium nitrate Chemical compound [Ga+3].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O CHPZKNULDCNCBW-UHFFFAOYSA-N 0.000 description 4
- 239000005457 ice water Substances 0.000 description 4
- HTUMBQDCCIXGCV-UHFFFAOYSA-N lead oxide Chemical compound [O-2].[Pb+2] HTUMBQDCCIXGCV-UHFFFAOYSA-N 0.000 description 4
- 238000000425 proton nuclear magnetic resonance spectrum Methods 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- 229910052984 zinc sulfide Inorganic materials 0.000 description 4
- UQMZPFKLYHOJDL-UHFFFAOYSA-N zinc;cadmium(2+);disulfide Chemical compound [S-2].[S-2].[Zn+2].[Cd+2] UQMZPFKLYHOJDL-UHFFFAOYSA-N 0.000 description 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- WWZKQHOCKIZLMA-UHFFFAOYSA-N Caprylic acid Natural products CCCCCCCC(O)=O WWZKQHOCKIZLMA-UHFFFAOYSA-N 0.000 description 3
- 229910002601 GaN Inorganic materials 0.000 description 3
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 3
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 3
- MKGLIVUQXQRAHU-UHFFFAOYSA-N P([O-])[O-].[Al+3].[In+3].P([O-])[O-].P([O-])[O-] Chemical compound P([O-])[O-].[Al+3].[In+3].P([O-])[O-].P([O-])[O-] MKGLIVUQXQRAHU-UHFFFAOYSA-N 0.000 description 3
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 3
- AUCDRFABNLOFRE-UHFFFAOYSA-N alumane;indium Chemical compound [AlH3].[In] AUCDRFABNLOFRE-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- CXKCTMHTOKXKQT-UHFFFAOYSA-N cadmium oxide Inorganic materials [Cd]=O CXKCTMHTOKXKQT-UHFFFAOYSA-N 0.000 description 3
- CFEAAQFZALKQPA-UHFFFAOYSA-N cadmium(2+);oxygen(2-) Chemical compound [O-2].[Cd+2] CFEAAQFZALKQPA-UHFFFAOYSA-N 0.000 description 3
- 239000007795 chemical reaction product Substances 0.000 description 3
- 238000007872 degassing Methods 0.000 description 3
- 239000011259 mixed solution Substances 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- 239000012299 nitrogen atmosphere Substances 0.000 description 3
- CCCMONHAUSKTEQ-UHFFFAOYSA-N octadecene Natural products CCCCCCCCCCCCCCCCC=C CCCMONHAUSKTEQ-UHFFFAOYSA-N 0.000 description 3
- NLKNQRATVPKPDG-UHFFFAOYSA-M potassium iodide Chemical compound [K+].[I-] NLKNQRATVPKPDG-UHFFFAOYSA-M 0.000 description 3
- FVAUCKIRQBBSSJ-UHFFFAOYSA-M sodium iodide Chemical compound [Na+].[I-] FVAUCKIRQBBSSJ-UHFFFAOYSA-M 0.000 description 3
- 238000003786 synthesis reaction Methods 0.000 description 3
- XSOKHXFFCGXDJZ-UHFFFAOYSA-N telluride(2-) Chemical compound [Te-2] XSOKHXFFCGXDJZ-UHFFFAOYSA-N 0.000 description 3
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 3
- 229910001887 tin oxide Inorganic materials 0.000 description 3
- 238000004627 transmission electron microscopy Methods 0.000 description 3
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Substances C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 3
- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 description 3
- DOBUSJIVSSJEDA-UHFFFAOYSA-L 1,3-dioxa-2$l^{6}-thia-4-mercuracyclobutane 2,2-dioxide Chemical compound [Hg+2].[O-]S([O-])(=O)=O DOBUSJIVSSJEDA-UHFFFAOYSA-L 0.000 description 2
- XIOUDVJTOYVRTB-UHFFFAOYSA-N 1-(1-adamantyl)-3-aminothiourea Chemical compound C1C(C2)CC3CC2CC1(NC(=S)NN)C3 XIOUDVJTOYVRTB-UHFFFAOYSA-N 0.000 description 2
- QIHHYQWNYKOHEV-UHFFFAOYSA-N 4-tert-butyl-3-nitrobenzoic acid Chemical compound CC(C)(C)C1=CC=C(C(O)=O)C=C1[N+]([O-])=O QIHHYQWNYKOHEV-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- FERIUCNNQQJTOY-UHFFFAOYSA-N Butyric acid Chemical compound CCCC(O)=O FERIUCNNQQJTOY-UHFFFAOYSA-N 0.000 description 2
- 229910000673 Indium arsenide Inorganic materials 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- 238000000026 X-ray photoelectron spectrum Methods 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- URRHWTYOQNLUKY-UHFFFAOYSA-N [AlH3].[P] Chemical compound [AlH3].[P] URRHWTYOQNLUKY-UHFFFAOYSA-N 0.000 description 2
- KXNLCSXBJCPWGL-UHFFFAOYSA-N [Ga].[As].[In] Chemical compound [Ga].[As].[In] KXNLCSXBJCPWGL-UHFFFAOYSA-N 0.000 description 2
- CHQKVCSVJIMMRE-UHFFFAOYSA-N [Pb]=S.[Sn] Chemical compound [Pb]=S.[Sn] CHQKVCSVJIMMRE-UHFFFAOYSA-N 0.000 description 2
- XIHUOOUEROSTGL-UHFFFAOYSA-N [Pb]=[Se].[Sn] Chemical compound [Pb]=[Se].[Sn] XIHUOOUEROSTGL-UHFFFAOYSA-N 0.000 description 2
- IPBWGTSZTNICPQ-UHFFFAOYSA-N [Se].[Cd].[Hg] Chemical compound [Se].[Cd].[Hg] IPBWGTSZTNICPQ-UHFFFAOYSA-N 0.000 description 2
- VSCWAEJMTAWNJL-UHFFFAOYSA-K aluminium trichloride Chemical compound Cl[Al](Cl)Cl VSCWAEJMTAWNJL-UHFFFAOYSA-K 0.000 description 2
- RNQKDQAVIXDKAG-UHFFFAOYSA-N aluminum gallium Chemical compound [Al].[Ga] RNQKDQAVIXDKAG-UHFFFAOYSA-N 0.000 description 2
- AJGDITRVXRPLBY-UHFFFAOYSA-N aluminum indium Chemical compound [Al].[In] AJGDITRVXRPLBY-UHFFFAOYSA-N 0.000 description 2
- 150000001412 amines Chemical class 0.000 description 2
- KPWJBEFBFLRCLH-UHFFFAOYSA-L cadmium bromide Chemical compound Br[Cd]Br KPWJBEFBFLRCLH-UHFFFAOYSA-L 0.000 description 2
- YKYOUMDCQGMQQO-UHFFFAOYSA-L cadmium dichloride Chemical compound Cl[Cd]Cl YKYOUMDCQGMQQO-UHFFFAOYSA-L 0.000 description 2
- OKIIEJOIXGHUKX-UHFFFAOYSA-L cadmium iodide Chemical compound [Cd+2].[I-].[I-] OKIIEJOIXGHUKX-UHFFFAOYSA-L 0.000 description 2
- AQCDIIAORKRFCD-UHFFFAOYSA-N cadmium selenide Chemical compound [Cd]=[Se] AQCDIIAORKRFCD-UHFFFAOYSA-N 0.000 description 2
- QCUOBSQYDGUHHT-UHFFFAOYSA-L cadmium sulfate Chemical compound [Cd+2].[O-]S([O-])(=O)=O QCUOBSQYDGUHHT-UHFFFAOYSA-L 0.000 description 2
- 229910000331 cadmium sulfate Inorganic materials 0.000 description 2
- CEKJAYFBQARQNG-UHFFFAOYSA-N cadmium zinc Chemical compound [Zn].[Cd] CEKJAYFBQARQNG-UHFFFAOYSA-N 0.000 description 2
- PSIBWKDABMPMJN-UHFFFAOYSA-L cadmium(2+);diperchlorate Chemical compound [Cd+2].[O-]Cl(=O)(=O)=O.[O-]Cl(=O)(=O)=O PSIBWKDABMPMJN-UHFFFAOYSA-L 0.000 description 2
- AWGTVRDHKJQFAX-UHFFFAOYSA-M chloro(phenyl)mercury Chemical compound Cl[Hg]C1=CC=CC=C1 AWGTVRDHKJQFAX-UHFFFAOYSA-M 0.000 description 2
- 239000000084 colloidal system Substances 0.000 description 2
- DIOQZVSQGTUSAI-UHFFFAOYSA-N decane Chemical compound CCCCCCCCCC DIOQZVSQGTUSAI-UHFFFAOYSA-N 0.000 description 2
- GHVNFZFCNZKVNT-UHFFFAOYSA-N decanoic acid Chemical compound CCCCCCCCCC(O)=O GHVNFZFCNZKVNT-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- ZASWJUOMEGBQCQ-UHFFFAOYSA-L dibromolead Chemical compound Br[Pb]Br ZASWJUOMEGBQCQ-UHFFFAOYSA-L 0.000 description 2
- RVIXKDRPFPUUOO-UHFFFAOYSA-N dimethylselenide Chemical compound C[Se]C RVIXKDRPFPUUOO-UHFFFAOYSA-N 0.000 description 2
- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 description 2
- LAWOZCWGWDVVSG-UHFFFAOYSA-N dioctylamine Chemical compound CCCCCCCCNCCCCCCCC LAWOZCWGWDVVSG-UHFFFAOYSA-N 0.000 description 2
- USIUVYZYUHIAEV-UHFFFAOYSA-N diphenyl ether Chemical compound C=1C=CC=CC=1OC1=CC=CC=C1 USIUVYZYUHIAEV-UHFFFAOYSA-N 0.000 description 2
- 239000002612 dispersion medium Substances 0.000 description 2
- SNRUBQQJIBEYMU-UHFFFAOYSA-N dodecane Chemical compound CCCCCCCCCCCC SNRUBQQJIBEYMU-UHFFFAOYSA-N 0.000 description 2
- POULHZVOKOAJMA-UHFFFAOYSA-N dodecanoic acid Chemical compound CCCCCCCCCCCC(O)=O POULHZVOKOAJMA-UHFFFAOYSA-N 0.000 description 2
- JRBPAEWTRLWTQC-UHFFFAOYSA-N dodecylamine Chemical compound CCCCCCCCCCCCN JRBPAEWTRLWTQC-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229940044658 gallium nitrate Drugs 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- YBMRDBCBODYGJE-UHFFFAOYSA-N germanium oxide Inorganic materials O=[Ge]=O YBMRDBCBODYGJE-UHFFFAOYSA-N 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- DCAYPVUWAIABOU-UHFFFAOYSA-N hexadecane Chemical compound CCCCCCCCCCCCCCCC DCAYPVUWAIABOU-UHFFFAOYSA-N 0.000 description 2
- BHEPBYXIRTUNPN-UHFFFAOYSA-N hydridophosphorus(.) (triplet) Chemical compound [PH] BHEPBYXIRTUNPN-UHFFFAOYSA-N 0.000 description 2
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 2
- XUVCWJBXGHOWID-UHFFFAOYSA-H indium(3+);trisulfate;hydrate Chemical compound O.[In+3].[In+3].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O XUVCWJBXGHOWID-UHFFFAOYSA-H 0.000 description 2
- 229940046892 lead acetate Drugs 0.000 description 2
- 229910052981 lead sulfide Inorganic materials 0.000 description 2
- 229940056932 lead sulfide Drugs 0.000 description 2
- YAFKGUAJYKXPDI-UHFFFAOYSA-J lead tetrafluoride Chemical compound F[Pb](F)(F)F YAFKGUAJYKXPDI-UHFFFAOYSA-J 0.000 description 2
- XCAUINMIESBTBL-UHFFFAOYSA-N lead(ii) sulfide Chemical compound [Pb]=S XCAUINMIESBTBL-UHFFFAOYSA-N 0.000 description 2
- 229910000474 mercury oxide Inorganic materials 0.000 description 2
- 229910000370 mercury sulfate Inorganic materials 0.000 description 2
- KVICROHOONHSRH-UHFFFAOYSA-N mercury(2+);dinitrate;hydrate Chemical compound O.[Hg+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O KVICROHOONHSRH-UHFFFAOYSA-N 0.000 description 2
- UKWHYYKOEPRTIC-UHFFFAOYSA-N mercury(ii) oxide Chemical compound [Hg]=O UKWHYYKOEPRTIC-UHFFFAOYSA-N 0.000 description 2
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 2
- BABMCXWQNSQAOC-UHFFFAOYSA-M methylmercury chloride Chemical compound C[Hg]Cl BABMCXWQNSQAOC-UHFFFAOYSA-M 0.000 description 2
- JVDIOYBHEYUIBM-UHFFFAOYSA-M methylmercury(1+);iodide Chemical compound C[Hg]I JVDIOYBHEYUIBM-UHFFFAOYSA-M 0.000 description 2
- 235000005985 organic acids Nutrition 0.000 description 2
- 150000002894 organic compounds Chemical class 0.000 description 2
- PVADDRMAFCOOPC-UHFFFAOYSA-N oxogermanium Chemical compound [Ge]=O PVADDRMAFCOOPC-UHFFFAOYSA-N 0.000 description 2
- ZNUYDEXSFWFCNG-UHFFFAOYSA-N oxotin;selenium Chemical compound O=[Sn]=[Se] ZNUYDEXSFWFCNG-UHFFFAOYSA-N 0.000 description 2
- XEBWQGVWTUSTLN-UHFFFAOYSA-M phenylmercury acetate Chemical compound CC(=O)O[Hg]C1=CC=CC=C1 XEBWQGVWTUSTLN-UHFFFAOYSA-M 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- 239000011574 phosphorus Substances 0.000 description 2
- IOLCXVTUBQKXJR-UHFFFAOYSA-M potassium bromide Chemical compound [K+].[Br-] IOLCXVTUBQKXJR-UHFFFAOYSA-M 0.000 description 2
- GGYFMLJDMAMTAB-UHFFFAOYSA-N selanylidenelead Chemical compound [Pb]=[Se] GGYFMLJDMAMTAB-UHFFFAOYSA-N 0.000 description 2
- MFIWAIVSOUGHLI-UHFFFAOYSA-N selenium;tin Chemical compound [Sn]=[Se] MFIWAIVSOUGHLI-UHFFFAOYSA-N 0.000 description 2
- JHJLBTNAGRQEKS-UHFFFAOYSA-M sodium bromide Chemical compound [Na+].[Br-] JHJLBTNAGRQEKS-UHFFFAOYSA-M 0.000 description 2
- UQMCSSLUTFUDSN-UHFFFAOYSA-N sulfanylidenegermane Chemical compound [GeH2]=S UQMCSSLUTFUDSN-UHFFFAOYSA-N 0.000 description 2
- VJHDVMPJLLGYBL-UHFFFAOYSA-N tetrabromogermane Chemical compound Br[Ge](Br)(Br)Br VJHDVMPJLLGYBL-UHFFFAOYSA-N 0.000 description 2
- BGHCVCJVXZWKCC-UHFFFAOYSA-N tetradecane Chemical compound CCCCCCCCCCCCCC BGHCVCJVXZWKCC-UHFFFAOYSA-N 0.000 description 2
- AUTOISGCBLBLBA-UHFFFAOYSA-N trizinc;diphosphite Chemical compound [Zn+2].[Zn+2].[Zn+2].[O-]P([O-])[O-].[O-]P([O-])[O-] AUTOISGCBLBLBA-UHFFFAOYSA-N 0.000 description 2
- RSJKGSCJYJTIGS-UHFFFAOYSA-N undecane Chemical compound CCCCCCCCCCC RSJKGSCJYJTIGS-UHFFFAOYSA-N 0.000 description 2
- NQPDZGIKBAWPEJ-UHFFFAOYSA-N valeric acid Chemical compound CCCCC(O)=O NQPDZGIKBAWPEJ-UHFFFAOYSA-N 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- VNDYJBBGRKZCSX-UHFFFAOYSA-L zinc bromide Chemical compound Br[Zn]Br VNDYJBBGRKZCSX-UHFFFAOYSA-L 0.000 description 2
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- BHHYHSUAOQUXJK-UHFFFAOYSA-L zinc fluoride Chemical compound F[Zn]F BHHYHSUAOQUXJK-UHFFFAOYSA-L 0.000 description 2
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- VLUFTYZGQQRZCU-UHFFFAOYSA-L indium(3+);dichloride Chemical compound [Cl-].[Cl-].[In+3].[In+3] VLUFTYZGQQRZCU-UHFFFAOYSA-L 0.000 description 1
- UKCIUOYPDVLQFW-UHFFFAOYSA-K indium(3+);trichloride;tetrahydrate Chemical compound O.O.O.O.Cl[In](Cl)Cl UKCIUOYPDVLQFW-UHFFFAOYSA-K 0.000 description 1
- 229910000337 indium(III) sulfate Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- XGCKLPDYTQRDTR-UHFFFAOYSA-H indium(iii) sulfate Chemical compound [In+3].[In+3].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O XGCKLPDYTQRDTR-UHFFFAOYSA-H 0.000 description 1
- PNDPGZBMCMUPRI-UHFFFAOYSA-N iodine Chemical compound II PNDPGZBMCMUPRI-UHFFFAOYSA-N 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
- RLJMLMKIBZAXJO-UHFFFAOYSA-N lead nitrate Chemical compound [O-][N+](=O)O[Pb]O[N+]([O-])=O RLJMLMKIBZAXJO-UHFFFAOYSA-N 0.000 description 1
- 229910000464 lead oxide Inorganic materials 0.000 description 1
- PIJPYDMVFNTHIP-UHFFFAOYSA-L lead sulfate Chemical compound [PbH4+2].[O-]S([O-])(=O)=O PIJPYDMVFNTHIP-UHFFFAOYSA-L 0.000 description 1
- LQBJWKCYZGMFEV-UHFFFAOYSA-N lead tin Chemical compound [Sn].[Pb] LQBJWKCYZGMFEV-UHFFFAOYSA-N 0.000 description 1
- GIWKOZXJDKMGQC-UHFFFAOYSA-L lead(2+);naphthalene-2-carboxylate Chemical compound [Pb+2].C1=CC=CC2=CC(C(=O)[O-])=CC=C21.C1=CC=CC2=CC(C(=O)[O-])=CC=C21 GIWKOZXJDKMGQC-UHFFFAOYSA-L 0.000 description 1
- HWSZZLVAJGOAAY-UHFFFAOYSA-L lead(II) chloride Chemical compound Cl[Pb]Cl HWSZZLVAJGOAAY-UHFFFAOYSA-L 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- NGYIMTKLQULBOO-UHFFFAOYSA-L mercury dibromide Chemical compound Br[Hg]Br NGYIMTKLQULBOO-UHFFFAOYSA-L 0.000 description 1
- FQGYCXFLEQVDJQ-UHFFFAOYSA-N mercury dicyanide Chemical compound N#C[Hg]C#N FQGYCXFLEQVDJQ-UHFFFAOYSA-N 0.000 description 1
- 229910001987 mercury nitrate Inorganic materials 0.000 description 1
- YVUZUKYBUMROPQ-UHFFFAOYSA-N mercury zinc Chemical compound [Zn].[Hg] YVUZUKYBUMROPQ-UHFFFAOYSA-N 0.000 description 1
- SCTINZGZNJKWBN-UHFFFAOYSA-M mercury(1+);fluoride Chemical compound [Hg]F SCTINZGZNJKWBN-UHFFFAOYSA-M 0.000 description 1
- QKEOZZYXWAIQFO-UHFFFAOYSA-M mercury(1+);iodide Chemical compound [Hg]I QKEOZZYXWAIQFO-UHFFFAOYSA-M 0.000 description 1
- VFNKCFNGWTUDLN-UHFFFAOYSA-M mercury(1+);perchlorate;tetrahydrate Chemical compound O.O.O.O.[Hg]OCl(=O)(=O)=O VFNKCFNGWTUDLN-UHFFFAOYSA-M 0.000 description 1
- 229910001507 metal halide Inorganic materials 0.000 description 1
- 150000005309 metal halides Chemical class 0.000 description 1
- MBBQAVVBESBLGH-UHFFFAOYSA-N methyl 4-bromo-3-hydroxybutanoate Chemical compound COC(=O)CC(O)CBr MBBQAVVBESBLGH-UHFFFAOYSA-N 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- XTAZYLNFDRKIHJ-UHFFFAOYSA-N n,n-dioctyloctan-1-amine Chemical compound CCCCCCCCN(CCCCCCCC)CCCCCCCC XTAZYLNFDRKIHJ-UHFFFAOYSA-N 0.000 description 1
- FUZZWVXGSFPDMH-UHFFFAOYSA-N n-hexanoic acid Natural products CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- DRXYRSRECMWYAV-UHFFFAOYSA-N nitrooxymercury Chemical compound [Hg+].[O-][N+]([O-])=O DRXYRSRECMWYAV-UHFFFAOYSA-N 0.000 description 1
- 229910052755 nonmetal Inorganic materials 0.000 description 1
- IOQPZZOEVPZRBK-UHFFFAOYSA-N octan-1-amine Chemical compound CCCCCCCCN IOQPZZOEVPZRBK-UHFFFAOYSA-N 0.000 description 1
- 229960002446 octanoic acid Drugs 0.000 description 1
- SWMBQMGPRYJSCI-UHFFFAOYSA-N octylphosphane Chemical compound CCCCCCCCP SWMBQMGPRYJSCI-UHFFFAOYSA-N 0.000 description 1
- 229940049964 oleate Drugs 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- SOQBSQLGTKQSGQ-UHFFFAOYSA-N oxo(oxostannanylidene)tin Chemical compound O=[Sn]=[Sn]=O SOQBSQLGTKQSGQ-UHFFFAOYSA-N 0.000 description 1
- NULFSOYLHLHSCQ-UHFFFAOYSA-N oxo(selanylidene)germane Chemical compound [Ge](=O)=[Se] NULFSOYLHLHSCQ-UHFFFAOYSA-N 0.000 description 1
- GSIRWRLSQJMZSC-UHFFFAOYSA-N oxo(sulfanylidene)germane Chemical compound [Ge](=O)=S GSIRWRLSQJMZSC-UHFFFAOYSA-N 0.000 description 1
- KUYVYOGFOZGGKU-UHFFFAOYSA-N oxo(sulfanylidene)tin Chemical compound [O].[S].[Sn] KUYVYOGFOZGGKU-UHFFFAOYSA-N 0.000 description 1
- DFIYWQBRYUCBMH-UHFFFAOYSA-N oxogermane Chemical compound [GeH2]=O DFIYWQBRYUCBMH-UHFFFAOYSA-N 0.000 description 1
- SJEFKIVIMJHMLR-UHFFFAOYSA-N oxomercury;zinc Chemical compound [Zn].[Hg]=O SJEFKIVIMJHMLR-UHFFFAOYSA-N 0.000 description 1
- HSAJRDKFYZAGLU-UHFFFAOYSA-M perchloryloxymercury Chemical compound [Hg+].[O-]Cl(=O)(=O)=O HSAJRDKFYZAGLU-UHFFFAOYSA-M 0.000 description 1
- NMHMNPHRMNGLLB-UHFFFAOYSA-N phloretic acid Chemical compound OC(=O)CCC1=CC=C(O)C=C1 NMHMNPHRMNGLLB-UHFFFAOYSA-N 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 1
- 235000019260 propionic acid Nutrition 0.000 description 1
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 1
- YQMLDSWXEQOSPP-UHFFFAOYSA-N selanylidenemercury Chemical compound [Hg]=[Se] YQMLDSWXEQOSPP-UHFFFAOYSA-N 0.000 description 1
- SCTHSTKLCPJKPF-UHFFFAOYSA-N selenium;triphenylphosphane Chemical compound [Se].C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 SCTHSTKLCPJKPF-UHFFFAOYSA-N 0.000 description 1
- 150000003346 selenoethers Chemical class 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 235000009518 sodium iodide Nutrition 0.000 description 1
- WSFQLUVWDKCYSW-UHFFFAOYSA-M sodium;2-hydroxy-3-morpholin-4-ylpropane-1-sulfonate Chemical compound [Na+].[O-]S(=O)(=O)CC(O)CN1CCOCC1 WSFQLUVWDKCYSW-UHFFFAOYSA-M 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- QXKXDIKCIPXUPL-UHFFFAOYSA-N sulfanylidenemercury Chemical compound [Hg]=S QXKXDIKCIPXUPL-UHFFFAOYSA-N 0.000 description 1
- BVJAAVMKGRODCT-UHFFFAOYSA-N sulfanylidenerhodium Chemical compound [Rh]=S BVJAAVMKGRODCT-UHFFFAOYSA-N 0.000 description 1
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- OCGWQDWYSQAFTO-UHFFFAOYSA-N tellanylidenelead Chemical compound [Pb]=[Te] OCGWQDWYSQAFTO-UHFFFAOYSA-N 0.000 description 1
- PUGUQINMNYINPK-UHFFFAOYSA-N tert-butyl 4-(2-chloroacetyl)piperazine-1-carboxylate Chemical compound CC(C)(C)OC(=O)N1CCN(C(=O)CCl)CC1 PUGUQINMNYINPK-UHFFFAOYSA-N 0.000 description 1
- JRMUNVKIHCOMHV-UHFFFAOYSA-M tetrabutylammonium bromide Chemical compound [Br-].CCCC[N+](CCCC)(CCCC)CCCC JRMUNVKIHCOMHV-UHFFFAOYSA-M 0.000 description 1
- IEXRMSFAVATTJX-UHFFFAOYSA-N tetrachlorogermane Chemical compound Cl[Ge](Cl)(Cl)Cl IEXRMSFAVATTJX-UHFFFAOYSA-N 0.000 description 1
- ANJSMIBRYVQYQS-UHFFFAOYSA-F tetrachlorostannane Chemical compound Cl[Sn](Cl)(Cl)Cl.Cl[Sn](Cl)(Cl)Cl ANJSMIBRYVQYQS-UHFFFAOYSA-F 0.000 description 1
- YJBKVPRVZAQTPY-UHFFFAOYSA-J tetrachlorostannane;dihydrate Chemical compound O.O.Cl[Sn](Cl)(Cl)Cl YJBKVPRVZAQTPY-UHFFFAOYSA-J 0.000 description 1
- GXMNGLIMQIPFEB-UHFFFAOYSA-N tetraethoxygermane Chemical compound CCO[Ge](OCC)(OCC)OCC GXMNGLIMQIPFEB-UHFFFAOYSA-N 0.000 description 1
- CUDGTZJYMWAJFV-UHFFFAOYSA-N tetraiodogermane Chemical compound I[Ge](I)(I)I CUDGTZJYMWAJFV-UHFFFAOYSA-N 0.000 description 1
- ZRLCXMPFXYVHGS-UHFFFAOYSA-N tetramethylgermane Chemical compound C[Ge](C)(C)C ZRLCXMPFXYVHGS-UHFFFAOYSA-N 0.000 description 1
- FAKFSJNVVCGEEI-UHFFFAOYSA-J tin(4+);disulfate Chemical compound [Sn+4].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O FAKFSJNVVCGEEI-UHFFFAOYSA-J 0.000 description 1
- KHMOASUYFVRATF-UHFFFAOYSA-J tin(4+);tetrachloride;pentahydrate Chemical compound O.O.O.O.O.Cl[Sn](Cl)(Cl)Cl KHMOASUYFVRATF-UHFFFAOYSA-J 0.000 description 1
- AFNRRBXCCXDRPS-UHFFFAOYSA-N tin(ii) sulfide Chemical compound [Sn]=S AFNRRBXCCXDRPS-UHFFFAOYSA-N 0.000 description 1
- LTSUHJWLSNQKIP-UHFFFAOYSA-J tin(iv) bromide Chemical compound Br[Sn](Br)(Br)Br LTSUHJWLSNQKIP-UHFFFAOYSA-J 0.000 description 1
- YUOWTJMRMWQJDA-UHFFFAOYSA-J tin(iv) fluoride Chemical compound [F-].[F-].[F-].[F-].[Sn+4] YUOWTJMRMWQJDA-UHFFFAOYSA-J 0.000 description 1
- QPBYLOWPSRZOFX-UHFFFAOYSA-J tin(iv) iodide Chemical compound I[Sn](I)(I)I QPBYLOWPSRZOFX-UHFFFAOYSA-J 0.000 description 1
- YJGJRYWNNHUESM-UHFFFAOYSA-J triacetyloxystannyl acetate Chemical compound [Sn+4].CC([O-])=O.CC([O-])=O.CC([O-])=O.CC([O-])=O YJGJRYWNNHUESM-UHFFFAOYSA-J 0.000 description 1
- JKNHZOAONLKYQL-UHFFFAOYSA-K tribromoindigane Chemical compound Br[In](Br)Br JKNHZOAONLKYQL-UHFFFAOYSA-K 0.000 description 1
- IYMHCKVVJXJPDB-UHFFFAOYSA-N tributyl(selanylidene)-$l^{5}-phosphane Chemical compound CCCCP(=[Se])(CCCC)CCCC IYMHCKVVJXJPDB-UHFFFAOYSA-N 0.000 description 1
- SQMCXYZBYPDEMT-UHFFFAOYSA-N triethylalumane Chemical compound CC[Al](CC)CC.CC[Al](CC)CC SQMCXYZBYPDEMT-UHFFFAOYSA-N 0.000 description 1
- RGGPNXQUMRMPRA-UHFFFAOYSA-N triethylgallium Chemical compound CC[Ga](CC)CC RGGPNXQUMRMPRA-UHFFFAOYSA-N 0.000 description 1
- FRJQEDQNNQVYRT-UHFFFAOYSA-K trifluoroindigane;trihydrate Chemical compound O.O.O.[F-].[F-].[F-].[In+3] FRJQEDQNNQVYRT-UHFFFAOYSA-K 0.000 description 1
- QPQQLRNDVVPMES-UHFFFAOYSA-M trifluoromethylsulfonyloxymercury Chemical compound [Hg+].[O-]S(=O)(=O)C(F)(F)F QPQQLRNDVVPMES-UHFFFAOYSA-M 0.000 description 1
- VTDQBKLDBJKTMS-UHFFFAOYSA-N trihydrate;hydrofluoride Chemical compound O.O.O.F VTDQBKLDBJKTMS-UHFFFAOYSA-N 0.000 description 1
- MCULRUJILOGHCJ-UHFFFAOYSA-N triisobutylaluminium Chemical compound CC(C)C[Al](CC(C)C)CC(C)C MCULRUJILOGHCJ-UHFFFAOYSA-N 0.000 description 1
- FKIZDWBGWFWWOV-UHFFFAOYSA-N trimethyl(trimethylsilylselanyl)silane Chemical compound C[Si](C)(C)[Se][Si](C)(C)C FKIZDWBGWFWWOV-UHFFFAOYSA-N 0.000 description 1
- VMDCDZDSJKQVBK-UHFFFAOYSA-N trimethyl(trimethylsilyltellanyl)silane Chemical compound C[Si](C)(C)[Te][Si](C)(C)C VMDCDZDSJKQVBK-UHFFFAOYSA-N 0.000 description 1
- XCZXGTMEAKBVPV-UHFFFAOYSA-N trimethylgallium Chemical compound C[Ga](C)C XCZXGTMEAKBVPV-UHFFFAOYSA-N 0.000 description 1
- IBEFSUTVZWZJEL-UHFFFAOYSA-N trimethylindium Chemical compound C[In](C)C IBEFSUTVZWZJEL-UHFFFAOYSA-N 0.000 description 1
- 125000000026 trimethylsilyl group Chemical group [H]C([H])([H])[Si]([*])(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- ZAKSIRCIOXDVPT-UHFFFAOYSA-N trioctyl(selanylidene)-$l^{5}-phosphane Chemical compound CCCCCCCCP(=[Se])(CCCCCCCC)CCCCCCCC ZAKSIRCIOXDVPT-UHFFFAOYSA-N 0.000 description 1
- RMZAYIKUYWXQPB-UHFFFAOYSA-N trioctylphosphane Chemical compound CCCCCCCCP(CCCCCCCC)CCCCCCCC RMZAYIKUYWXQPB-UHFFFAOYSA-N 0.000 description 1
- 229940005605 valeric acid Drugs 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- YZYKBQUWMPUVEN-UHFFFAOYSA-N zafuleptine Chemical compound OC(=O)CCCCCC(C(C)C)NCC1=CC=C(F)C=C1 YZYKBQUWMPUVEN-UHFFFAOYSA-N 0.000 description 1
- 239000004246 zinc acetate Substances 0.000 description 1
- 229940102001 zinc bromide Drugs 0.000 description 1
- NWJUKFMMXJODIL-UHFFFAOYSA-N zinc cadmium(2+) selenium(2-) Chemical compound [Zn+2].[Se-2].[Se-2].[Cd+2] NWJUKFMMXJODIL-UHFFFAOYSA-N 0.000 description 1
- 239000011667 zinc carbonate Substances 0.000 description 1
- 235000004416 zinc carbonate Nutrition 0.000 description 1
- 229910000010 zinc carbonate Inorganic materials 0.000 description 1
- 239000011592 zinc chloride Substances 0.000 description 1
- 235000005074 zinc chloride Nutrition 0.000 description 1
- GTLDTDOJJJZVBW-UHFFFAOYSA-N zinc cyanide Chemical compound [Zn+2].N#[C-].N#[C-] GTLDTDOJJJZVBW-UHFFFAOYSA-N 0.000 description 1
- HWLMPLVKPZILMO-UHFFFAOYSA-N zinc mercury(1+) selenium(2-) Chemical compound [Zn+2].[Se-2].[Hg+] HWLMPLVKPZILMO-UHFFFAOYSA-N 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
- 229940105296 zinc peroxide Drugs 0.000 description 1
- XOOUIPVCVHRTMJ-UHFFFAOYSA-L zinc stearate Chemical compound [Zn+2].CCCCCCCCCCCCCCCCCC([O-])=O.CCCCCCCCCCCCCCCCCC([O-])=O XOOUIPVCVHRTMJ-UHFFFAOYSA-L 0.000 description 1
- NWONKYPBYAMBJT-UHFFFAOYSA-L zinc sulfate Chemical compound [Zn+2].[O-]S([O-])(=O)=O NWONKYPBYAMBJT-UHFFFAOYSA-L 0.000 description 1
- 229910000368 zinc sulfate Inorganic materials 0.000 description 1
- 229960001763 zinc sulfate Drugs 0.000 description 1
- UMJICYDOGPFMOB-UHFFFAOYSA-N zinc;cadmium(2+);oxygen(2-) Chemical compound [O-2].[O-2].[Zn+2].[Cd+2] UMJICYDOGPFMOB-UHFFFAOYSA-N 0.000 description 1
- PADPILQDYPIHQQ-UHFFFAOYSA-L zinc;diperchlorate;hexahydrate Chemical compound O.O.O.O.O.O.[Zn+2].[O-]Cl(=O)(=O)=O.[O-]Cl(=O)(=O)=O PADPILQDYPIHQQ-UHFFFAOYSA-L 0.000 description 1
- NHXVNEDMKGDNPR-UHFFFAOYSA-N zinc;pentane-2,4-dione Chemical compound [Zn+2].CC(=O)[CH-]C(C)=O.CC(=O)[CH-]C(C)=O NHXVNEDMKGDNPR-UHFFFAOYSA-N 0.000 description 1
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- H01L51/502—
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/122—Single quantum well structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0352—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
- H01L31/035209—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions comprising a quantum structures
- H01L31/035218—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions comprising a quantum structures the quantum structure being quantum dots
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/04—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
-
- H01L51/0085—
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- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Electromagnetism (AREA)
- Ceramic Engineering (AREA)
- Luminescent Compositions (AREA)
Abstract
개시된 패시베이션된 양자점의 제조방법은, 표면에 유기 리간드가 결합된 양자점 및 상기 양자점을 분산하는 비극성 용매를 포함하는 제1 용액을 준비하는 단계; 및 상기 제1 용액에, 할로겐 염 및 극성 용매를 포함하는 제2 용액을 가하여, 상기 유기 리간드를 제거하고, 상기 양자점의 표면에 할로겐 염을 포함하는 패시베이션층을 형성하는 단계를 포함한다. 상기 할로겐 화합물의 함량이, 상기 양자점 1g에 대하여 0.001몰 이상이다. 상기 방법에 따르면, 안정성이 높은 양자점을 얻을 수 있으며, 리간드 치환 공정 없이 양자점 박막을 형성할 수 있다. The disclosed passivated quantum dot manufacturing method includes the steps of: preparing a first solution including a quantum dot having an organic ligand bound to its surface and a nonpolar solvent dispersing the quantum dot; And adding a second solution containing a halogen salt and a polar solvent to the first solution to remove the organic ligand and forming a passivation layer including a halogen salt on the surface of the quantum dots. The content of the halogen compound is 0.001 mol or more based on 1 g of the quantum dot. According to the above method, a highly stable quantum dot can be obtained, and a quantum dot thin film can be formed without a ligand substitution process.
Description
본 발명은 양자점에 관한 것이며, 보다 자세하게는 패시베이션된 양자점 및 그 제조방법에 관한 것이다.The present invention relates to quantum dots, and more particularly to passivation quantum dots and a method of manufacturing the same.
양자점은 반도체 특성을 가지고 있는 수십 나노미터 이하의 크기를 갖는 나노 입자로서, 양자 제한 효과에 의해 벌크 입자와는 다른 특성을 갖는다. 구체적으로, 양자점의 크기에 따라 밴드갭이 달라지게 되어 흡수하는 파장을 변화시킬 수 있고, 작은 크기로 인한 양자 제한 효과는 벌크 물질에서 볼 수 없는 새로운 광학적, 전기적, 물리적 특성을 보인다. 따라서 이러한 양자점을 이용하여 솔라셀(태양전지), 발광 다이오드와 같은 광전 변환 소자를 제조하는 기술에 대한 연구가 활발히 이루어지고 있다.Quantum dots are nanoparticles having a size of several tens of nanometers or less, which have semiconductor characteristics, and have properties different from those of bulk particles due to the quantum confinement effect. Specifically, the bandgap varies according to the size of the quantum dot, and the wavelength to be absorbed can be changed. The quantum confinement effect due to the small size exhibits new optical, electrical, and physical characteristics not seen in bulk materials. Therefore, studies have been actively made on a technique for manufacturing photoelectric conversion elements such as solar cells and light emitting diodes using such quantum dots.
최근 양자점의 양자점의 사이즈 및 모양 조절을 위하여 콜로이드 화학 합성 방법이 사용되고 있는데, 이러한 콜로이드 화학 합성 방법으로 합성된 양자점은 공기 노출에 대한 안정성을 확보하기 어려우며, 두꺼운 스킨을 갖는 코어-쉘 구조의 양자점은 공기 노출에 대하여 안정하나, 광전 변환 소자 등에 이용하기 어렵고 공정이 매우 복잡하다는 문제점이 있다.Recently, a colloid chemical synthesis method has been used for controlling the size and shape of a quantum dot in a quantum dot. It is difficult to secure the stability of the quantum dot synthesized by such a colloid chemical synthesis method with respect to air exposure, and the quantum dot of a core- It is stable against air exposure, but it is difficult to use for photoelectric conversion elements and the like, and the process is very complicated.
이러한 양자점의 안정성을 확보하기 위하여, 올레산 등의 유기 화합물을 이용하여, 양자점 표면에 리간드를 형성하는 방법이 알려져 있다. 그러나, 이러한 경우, 상기 양자점을 (도전성을 갖는) 박막 형태로 형성하기 위하여, 양자점 입자를 기판 위에 코팅한 후에, 상대적으로 길이가 짧은 리간드로 교환하는 과정을 거치는 과정이 필수적이다.In order to secure the stability of such a quantum dot, a method of forming a ligand on the surface of a quantum dot using an organic compound such as oleic acid is known. However, in this case, in order to form the quantum dot in the form of a thin film (having conductivity), it is necessary to process the step of exchanging the quantum dot particle with a ligand having a relatively short length after coating it on the substrate.
이러한 리간드 교환 과정은, 공정 효율을 저하시키고, 양자점의 애플리케이션을 제한하는 요인일 뿐만 아니라, 리간드 교환 과정에서 박막 부피 수축으로 인해 내부에 발생한 크랙은, 양자점 박막의 품질을 저하시킬 수 있다.Such a ligand exchange process degrades process efficiency and limits application of quantum dots. In addition, cracks generated internally due to thin film volume shrinkage during ligand exchange can degrade the quality of quantum dot thin films.
본 발명의 기술적 과제는 이러한 점에서 착안된 것으로, 공기 노출에 대한 안정성을 확보할 수 있을 뿐만 아니라, 리간드 교환 과정 없이, 박막 형성 공정에 적용될 수 있는 양자점을 제공하는 것이다.The technical object of the present invention is to provide a quantum dot that can be applied to a thin film forming process without a ligand exchange process as well as securing stability against air exposure.
본 발명의 다른 기술적 과제는, 상기 양자점의 제조 방법을 제공하는 것이다.Another technical problem of the present invention is to provide a method of manufacturing the quantum dot.
상기한 본 발명의 목적을 실현하기 위한 실시예에 따른, 패시베이션된 양자점의 제조방법은, 표면에 유기 리간드가 결합된 양자점 및 상기 양자점을 분산하는 비극성 용매를 포함하는 제1 용액을 준비하는 단계; 및 상기 제1 용액에, 할로겐 염 및 극성 용매를 포함하는 제2 용액을 가하여, 상기 유기 리간드를 제거하고, 상기 양자점의 표면에 할로겐 염을 포함하는 패시베이션층을 형성하는 단계를 포함한다. 상기 할로겐 화합물의 함량이, 상기 양자점 1g에 대하여 0.001몰 이상이다.According to another aspect of the present invention, there is provided a method of fabricating a passivated quantum dot comprising: preparing a first solution including a quantum dot having an organic ligand bound to its surface and a nonpolar solvent dispersing the quantum dot; And adding a second solution containing a halogen salt and a polar solvent to the first solution to remove the organic ligand and forming a passivation layer including a halogen salt on the surface of the quantum dots. The content of the halogen compound is 0.001 mol or more based on 1 g of the quantum dot.
일 실시예에 있어서, 상기 제1 용액을 준비하는 단계는, 제1 전구체와 유기산을 반응시키는 단계 및 상기 제1 전구체와 유기산의 반응물을 제2 전구체와 반응시키는 단계를 포함한다.In one embodiment, the step of preparing the first solution comprises reacting the first precursor with an organic acid and reacting the reactant of the first precursor and the organic acid with the second precursor.
일 실시예에 있어서, 상기 제1 전구체는, 12족 원소, 13족 원소 및 14족 원소 중 적어도 하나를 포함한다.In one embodiment, the first precursor comprises at least one of a Group 12 element, a Group 13 element, and a Group 14 element.
일 실시예에 있어서, 상기 제2 전구체는, 15족 원소 및 16족 원소 중 적어도 하나를 포함한다.In one embodiment, the second precursor comprises at least one of a Group 15 element and a Group 16 element.
일 실시예에 있어서, 상기 유기산은 올레산을 포함한다.In one embodiment, the organic acid comprises oleic acid.
일 실시예에 있어서, 상기 할로겐 염은 브롬 및 요오드 중 적어도 하나를 포함한다.In one embodiment, the halogen salt comprises at least one of bromine and iodine.
일 실시예에 있어서, 상기 비극성 용매에 대한 상기 극성 용매의 부피비는 0.3:1 이상이다.In one embodiment, the volume ratio of the polar solvent to the non-polar solvent is 0.3: 1 or greater.
일 실시예에 있어서, 상기 비극성 용매는 하이드로 카본을 포함한다.In one embodiment, the nonpolar solvent comprises a hydrocarbon.
일 실시예에 있어서, 상기 극성 용매는 알코올을 포함한다.In one embodiment, the polar solvent comprises an alcohol.
상기한 본 발명의 다른 목적을 실현하기 위한 실시예에 따른 양자점은, 13족-15족계 화합물, 12족-16족계 화합물 또는 14족-16족계 화합물을 포함하며, 결정 구조를 가지며, {100}면과 {111}면이 할로겐염에 의해 패시베이션된다.The quantum dot according to an embodiment for realizing another object of the present invention includes a group 13-group-15 group compound, a group 12 -16 group compound or a group 14 -16 group compound, Plane and the {111} plane are passivated by the halogen salt.
일 실시예에 있어서, 상기 양자점의 직경은 1 내지 20 nm이다.In one embodiment, the diameter of the quantum dot is 1 to 20 nm.
일 실시예에 있어서, 상기 할로겐염은, 요오드 또는 브롬을 포함한다.In one embodiment, the halogen salt comprises iodine or bromine.
본 발명에 따르면, 양자점 입자의 표면을 전체적으로 패시베이션시킬 수 있으며, 이는 양자점 입자의 안정성, 특히 대기 안정성을 크게 개선할 수 있다.According to the present invention, the surface of the quantum dot particles can be entirely passivated, which can greatly improve the stability of the quantum dot particles, especially the atmospheric stability.
또한, 상기 양자점은 유기 리간드가 제거된 상태이므로, 양자점 박막을 형성하는 과정에서, 리간드 치환 공정을 거칠 필요가 없으므로, 공정을 간소화할 수 있을 뿐만 아니라, 리간드 치환 과정에서 발생하는 박막 내 응력 등으로 인한 결함이 방지/감소될 수 있다.In addition, since the quantum dots are in a state in which the organic ligands are removed, there is no need to undergo a ligand replacement process in the course of forming the quantum dot thin film, so that not only the process can be simplified but also the stress due to the thin film generated in the ligand replacement process Can be prevented / reduced.
도 1은 본 발명의 일 실시예에 따른 양자점 제조방법을 도시한 순서도이다.
도 2는 본 발명의 일 실시예에 따른 양자점 제조방법에서, 유기 리간드를 제거하고 할로겐 패시베이션층을 형성하는 단계를 도시한 개념도이다.
도 3a는 실시예 1의 양자점과 비교예 1의 양자점의 FTIR(Fourier Transform Infrared Spectroscopy) 스펙트럼을 도시한 그래프이다.
도 3b는 실시예 1의 양자점과 비교예 1의 양자점의 XPS(X-ray Photoelectron Spectroscopy) 스펙트럼(Pb 4f)을 도시한 그래프이다.
도 4는 비교예 1 및 2의 1H-NMR(Nuclear Magnetic Resonance) 스펙트럼을 도시한 그래프이다. FIG. 1 is a flowchart illustrating a method of manufacturing a quantum dot according to an embodiment of the present invention.
FIG. 2 is a conceptual diagram showing a step of removing an organic ligand and forming a halogen passivation layer in the method of manufacturing a quantum dot according to an embodiment of the present invention.
FIG. 3A is a graph showing FTIR (Fourier Transform Infrared Spectroscopy) spectra of the quantum dots of Example 1 and Comparative Example 1. FIG.
FIG. 3B is a graph showing an XPS (X-ray photoelectron spectroscopy) spectrum (
4 is a graph showing 1 H-NMR (Nuclear Magnetic Resonance) spectra of Comparative Examples 1 and 2.
이하, 도면들을 참조하여 본 발명의 바람직한 실시예들을 보다 상세하게 설명하기로 한다. 본 발명은 다양한 변경을 가할 수 있고 여러 가지 형태를 가질 수 있는 바, 특정 실시예들을 도면에 예시하고 본문에 상세하게 설명하고자 한다. 그러나, 이는 본 발명을 특정한 개시 형태에 대해 한정하려는 것이 아니며, 본 발명의 사상 및 기술 범위에 포함되는 모든 변경, 균등물 내지 대체물을 포함하는 것으로 이해되어야 한다. 각 도면을 설명하면서 유사한 참조부호를 유사한 구성요소에 대해 사용하였다. 첨부된 도면에 있어서, 구조물들의 치수는 본 발명의 명확성을 기하기 위하여 실제보다 확대하여 도시한 것이다. 제1, 제2 등의 용어는 다양한 구성요소들을 설명하는데 사용될 수 있지만, 상기 구성요소들은 상기 용어들에 의해 한정되어서는 안 된다. 상기 용어들은 하나의 구성요소를 다른 구성요소로부터 구별하는 목적으로만 사용된다. 예를 들어, 본 발명의 권리 범위를 벗어나지 않으면서 제1 구성요소는 제2 구성요소로 명명될 수 있고, 유사하게 제2 구성요소도 제1 구성요소로 명명될 수 있다. 단수의 표현은 문맥상 명백하게 다르게 뜻하지 않는 한, 복수의 표현을 포함한다.Hereinafter, preferred embodiments of the present invention will be described in more detail with reference to the drawings. The present invention is capable of various modifications and various forms, and specific embodiments are illustrated in the drawings and described in detail in the text. It should be understood, however, that the invention is not intended to be limited to the particular forms disclosed, but includes all modifications, equivalents, and alternatives falling within the spirit and scope of the invention. Like reference numerals are used for like elements in describing each drawing. In the accompanying drawings, the dimensions of the structures are enlarged to illustrate the present invention in order to clarify the present invention. The terms first, second, etc. may be used to describe various components, but the components should not be limited by the terms. The terms are used only for the purpose of distinguishing one component from another. For example, without departing from the scope of the present invention, the first component may be referred to as a second component, and similarly, the second component may also be referred to as a first component. The singular expressions include plural expressions unless the context clearly dictates otherwise.
본 출원에서, "포함하다" 또는 "가지다" 등의 용어는 명세서 상에 기재된 특징, 숫자, 단계, 동작, 구성요소, 부분품 또는 이들을 조합한 것이 존재함을 지정하려는 것이지, 하나 또는 그 이상의 다른 특징들이나 숫자, 단계, 동작, 구성요소, 부분품 또는 이들을 조합한 것들의 존재 또는 부가 가능성을 미리 배제하지 않는 것으로 이해되어야 한다. In this application, the terms "comprises", "having", and the like are used to specify that a feature, a number, a step, an operation, an element, a part or a combination thereof is described in the specification, But do not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof.
본 발명의 일 실시예에 따른 양자점 제조 방법은, 유기 리간드와 결합된 양자점을 형성하는 단계 및 극성 용매와 할로겐 화합물을 제공하여, 상기 리간드를 제거하고, 상기 양자점의 표면에 할로겐 패시베이션층을 형성하는 단계를 포함한다.A method of fabricating a quantum dot according to an embodiment of the present invention includes forming a quantum dot coupled with an organic ligand and providing a polar solvent and a halogen compound to remove the ligand and form a halogen passivation layer on the surface of the quantum dot .
도 1은 본 발명의 일 실시예에 따른 양자점 제조방법을 도시한 순서도이다. 도 2는 본 발명의 일 실시예에 따른 양자점 제조방법에서, 유기 리간드를 제거하고 할로겐 패시베이션층을 형성하는 단계를 도시한 개념도이다.FIG. 1 is a flowchart illustrating a method of manufacturing a quantum dot according to an embodiment of the present invention. FIG. 2 is a conceptual diagram showing a step of removing an organic ligand and forming a halogen passivation layer in the method of manufacturing a quantum dot according to an embodiment of the present invention.
도 1을 참조하면, 제1 전구체와 유기산을 반응시킨다(S10). 구체적으로, 상기 제1 전구체 및 상기 유기산을 용매에 분산시킨다. 예를 들어, 상기 제1 전구체는 12족 원소, 13족 원소 또는 14족 원소를 포함할 수 있다.Referring to FIG. 1, the first precursor is reacted with an organic acid (S10). Specifically, the first precursor and the organic acid are dispersed in a solvent. For example, the first precursor may comprise a Group 12 element, a Group 13 element, or a Group 14 element.
예를 들어, 12족 원소를 포함하는 제1 전구체는, 카드뮴 아세테이트 이수화물(cadmium acetate dihydrate), 디메틸 카드뮴(dimethyl cadmium), 디에틸 카드뮴(diethyl cadmium), 카드뮴 아세테이트(Cadmium acetate), 카드뮴 아세틸아세토네이트(Cadmium acetylacetonate), 카드뮴 아세틸아세토네이트 수화물(Cadmium acetylacetonate hydrate), 카드뮴 아이오다이드(Cadmium iodide), 카드뮴 브로마이드(Cadmium bromide), 카드뮴 클로라이드(Cadmium chloride), 카드뮴 클로라이드 수화물(Cadmium chloride hydrate), 카드뮴 플루오라이드(Cadmium fluoride), 카드뮴 카보네이트(Cadmium carbonate), 카드뮴 니트레이트(Cadmium nitrate), 카드뮴 니트레이트 사수화물(Cadmium nitrate tetrahydrate), 카드뮴 옥사이드(Cadmium oxide), 카드뮴 퍼클로레이트(Cadmium perchlorate), 카드뮴 퍼클로레이트 육수화물(Cadmium perchlorate hexahydrate), 카드뮴 포스파이드(Cadmium phosphide), 카드뮴 설페이트(Cadmium sulfate), 카드뮴 나프탈레이트 (Cadmium naphthenate), 카드뮴 스테아레이트(Cadmium stearate), 디메틸 아연(dimethyl zinc), 디에틸 아연(diethyl zinc), 아연 아세테이트(Zinc acetate), 아연 아세테이트 이수화물(Zinc acetate dihydrate), 아연 아세틸아세토네이트 (Zinc acetylacetonate), 아연 아세틸아세토네이트 수화물 (Zinc acetylacetonate hydrate), 아연 아이오다이드(Zinc iodide), 아연 브로마이드(Zinc bromide), 아연 클로라이드(Zinc chloride), 아연 플루오라이드(Zinc fluoride), 아연 플루오라이드 사수화물(Zinc fluoride tetrahydrate), 아연 카보네이트(Zinc carbonate), 아연 시아나이드(Zinc cyanide), 아연 니트레이트(Zinc nitrate), 아연 니트레이트 육수화물(Zinc nitrate hexahydrate), 아연 옥사이드(Zinc oxide), 아연 퍼옥사이드(Zinc peroxide), 아연 퍼클로레이트(Zinc perchlorate), 아연 퍼클로레이트 육수화물(Zinc perchlorate hexahydrate), 아연 설페이트(Zinc sulfate), 디페닐 아연(Diphenyl zinc), 아연 나프테네이트 (Zinc naphthenate), 아연 스테아레이트(Zinc stearate), 수은 아세테이트(Mercury acetate), 수은 아이오다이드(Mercury iodide), 수은 브로마이드(Mercury bromide), 수은 클로라이드(Mercury chloride), 수은 플루오라이드(Mercury fluoride), 수은 시아나이드(Mercury cyanide), 수은 니트레이트(Mercury nitrate), 수은 니트레이트 일수화물(Mercury nitrate monohydrate), 수은 옥사이드(Mercury oxide), 수은 퍼클로레이트(Mercury perchlorate), 수은 퍼클로레이트 사수화물(Mercury perchlorate tetrahydrate), 수은 퍼클로레이트 삼수화물(Mercury perchlorate trihydrate), 수은 설페이트(Mercury sulfate), 디메틸 수은 (Dimethyl mercury), 디에틸 수은(Diethyl mercury), 디페닐 수은(Diphenyl mercury), 수은 설페이트 (Mercury sulfate), 수은 트리플로로메텐설포네이트(Mercury trifluoromethanesulfonate), 메틸 수은 클로라이드 (Methylmercury chloride), 메틸 수은 아이오다이드 (Methylmercury iodide), 페닐 수은 아세테이트(Phenylmercury acetate), 페닐 수은 클로라이드(Phenylmercury chloride) 등을 포함할 수 있다. 이들은 각각 단독으로 또는 혼합되어 사용될 수 있다.For example, a first precursor comprising a Group 12 element may be selected from the group consisting of cadmium acetate dihydrate, dimethyl cadmium, diethyl cadmium, cadmium acetate, Cadmium acetylacetonate, Cadmium acetylacetonate hydrate, Cadmium iodide, Cadmium bromide, Cadmium chloride, Cadmium chloride hydrate, Cadmium acetylacetonate hydrate, Cadmium acetylacetonate hydrate, Cadmium fluoride, cadmium carbonate, cadmium nitrate, cadmium nitrate tetrahydrate, cadmium oxide, cadmium perchlorate, cadmium perchlorate, Cargo (Cadmium perchlorate hexahydrate), Cadmium phosphide (Cadmi cadmium naphthenate, cadmium stearate, dimethyl zinc, diethyl zinc, zinc acetate, zinc phosphite, zinc phosphite, cadmium sulfate, Cadmium sulfate, Cadmium naphthenate, Zinc acetate dihydrate, Zinc acetylacetonate, Zinc acetylacetonate hydrate, Zinc iodide, Zinc bromide, Zinc chloride, ), Zinc fluoride, zinc fluoride tetrahydrate, zinc carbonate, zinc cyanide, zinc nitrate, zinc nitrate hexahydrate ( Zinc nitrate hexahydrate, zinc oxide, zinc peroxide, zinc perchlorate, zinc perchlorate, Zinc perchlorate hexahydrate, Zinc sulfate, Diphenyl zinc, Zinc naphthenate, Zinc stearate, Mercury acetate, Mercury iodide, mercury bromide, mercury chloride, mercury fluoride, mercury cyanide, mercury nitrate, mercury nitrate monohydrate, Mercury nitrate monohydrate, mercury oxide, mercury perchlorate, mercury perchlorate tetrahydrate, mercury perchlorate trihydrate, mercury sulfate, dimethyl mercury Dimethyl mercury, diethyl mercury, diphenyl mercury, mercury sulfate, mercury triflate, And the like meten sulfonate (Mercury trifluoromethanesulfonate), methylmercury chloride (Methylmercury chloride), methylmercury iodide (Methylmercury iodide), phenyl mercury acetate (Phenylmercury acetate), phenyl mercury chloride (Phenylmercury chloride). These may be used alone or in combination.
예를 들어, 13족 원소를 포함하는 제1 전구체는, 알루미늄 아세테이트(aluminum acetate), 알루미늄 아이오다이드(aluminum iodide), 알루미늄 브로마이드(aluminum bromide), 알루미늄 클로라이드(aluminum chloride), 알루미늄 클로라이드 육수화물(aluminum chloride hexahydrate), 알루미늄 플루오라이드(aluminum fluoride), 알루미늄 니트레이트(aluminum nitrate), 알루미늄 옥사이드(aluminum oxide), 알루미늄 퍼클로레이트(aluminum perchlorate), 알루미늄 카바이드(aluminum carbide), 알루미늄 스테아레이트(aluminum stearate), 알루미늄 설페이트(aluminum sulfate), 디-i-부틸알루미늄 클로라이드(Di-i-butylaluminum chloride), 디에틸알루미늄 클로라이드(Diethylaluminum chloride), 트리-i-부틸알루미늄 (Tri-i-butylaluminum), 트리에틸알루미늄 (Triethylaluminum), 트리에틸(트리-sec-부톡시)디알루미늄 (Triethyl(tri-sec-butoxy)dialuminum), 트리메틸 알루미늄 (Trimethylaluminum), 갈륨 아세틸아세토네이트(Gallium acetylacetonate), 갈륨 클로라이드(Gallium chloride), 갈륨 플루오라이드(Gallium fluoride), 갈륨 플루오라이드 삼수화물(Gallium fluoride trihydrate), 갈륨 옥사이드(Gallium oxide), 갈륨 니트레이트(Gallium nitrate), 갈륨 니트레이트 수화물(Gallium nitrate hydrate), 갈륨 설페이트(Gallium sulfate), 갈륨 아이오다이드(Gallium iodide), 트리에틸 갈륨 (Triethyl gallium), 트리메틸 갈륨 (Trimethyl gallium), 인듐 클로라이드(Indium chloride), 인듐 클로라이드 사수화물(Indium chloride tetrahydrate), 인듐 옥사이드(Indium oxide), 인듐 니트레이트(Indium nitrate), 인듐 니트레이트 수화물(Indium nitrate hydrate), 인듐 설페이트(Indium sulfate), 인듐 설페이트 수화물(Indium sulfate hydrate), 인듐 아세테이트(Indium acetate), 인듐 아세틸아세토네이트(Indium acetylacetonate), 인듐 브로마이드(Indium bromide), 인듐 플로라이드(Indium fluoride), 인듐 플로라이드 삼수화물(Indium fluoride trihydrate), 트리메틸 인듐 (Trimethyl indium) 등을 포함할 수 있다. 이들은 각각 단독으로 또는 혼합되어 사용될 수 있다.For example, a first precursor comprising a Group 13 element may be selected from the group consisting of aluminum acetate, aluminum iodide, aluminum bromide, aluminum chloride, aluminum chloride hexahydrate aluminum chloride hexahydrate, aluminum fluoride, aluminum nitrate, aluminum oxide, aluminum perchlorate, aluminum carbide, aluminum stearate, Aluminum sulfate, di-i-butylaluminum chloride, diethylaluminum chloride, tri-i-butylaluminum, triethyl aluminum Triethylaluminum), triethyl (tri-sec-butoxy) dialuminium, tri Gallium arsenate, gallium acetylacetonate, gallium chloride, gallium fluoride, gallium fluoride trihydrate, gallium oxide, gallium nitride, gallium arsenide, gallium arsenide, Gallium nitrate, Gallium nitrate hydrate, Gallium sulfate, Gallium iodide, Triethyl gallium, Trimethyl gallium, Indium chloride Indium chloride, indium chloride tetrahydrate, indium oxide, indium nitrate, indium nitrate hydrate, indium sulfate, indium sulfate hydrate, Indium sulfate hydrate, indium acetate, indium acetylacetonate, Te, indium bromide, indium fluoride, indium fluoride trihydrate, trimethyl indium, and the like. These may be used alone or in combination.
예를 들어, 14족 원소를 포함하는 제1 전구체는, 납 아세테이트(Lead acetate), 납 아세테이트 삼수화물(Lead acetate trihydrate), 납 브로마이드(Lead bromide), 납 클로라이드(Lead chloride), 납 플루오라이드(Lead fluoride), 납 옥사이드(Lead oxide), 납 퍼클로레이트(Lead perchlorate), 납 니트레이트(Lead nitrate), 납 설페이트(Lead sulfate), 납 카보네이트(Lead carbonate), 납 아세틸아세토네이트(Lead acethylacetonate), 납 시트레이트(Lead citrate), 납 브로마이드(Lead bromide), 납 나프탈레네이트(Lead naphthenate), 주석 아세테이트(Tin acetate), 주석 비스아세틸아세토네이트(Tin bisacetylacetonate), 주석 브로마이드(Tin bromide), 주석 클로라이드(Tin chloride), 주석 클로라이드 이수화물(Tin chloride dihydrate), 주석 클로라이드 오수화물(Tin chloride pentahydrate), 주석 플루오라이드(Tin fluoride), 주석 옥사이드(Tin oxide), 주석 설페이트(Tin sulfate), 주석 아이오다이드(Tin iodide), 디페닐 주석 디클로라이드(Diphenyltin dichloride), 게르마늄 테트라클로라이드(Germanium tetrachloride), 게르마늄 옥사이드(Germanium oxide), 게르마늄 에톡사이드(Germanium ethoxide), 게르마늄 브로마이드(Germanium bromide), 게르마늄 아이오다이드(Germanium iodide), 테트라메틸 게르마늄(Tetramethyl germanium), 트리메틸 게르마늄 클로라이드(Trimethyl germanium chloride), 트리메틸 게르마늄 브로마이드(Trimethyl germanium bromide) 및 트리에틸 게르마늄 클로라이드(Triethyl germanium chloride) 등을 포함할 수 있다. 이들은 각각 단독으로 또는 혼합되어 사용될 수 있다.For example, a first precursor comprising a Group 14 element may be selected from the group consisting of lead acetate, lead acetate trihydrate, lead bromide, lead chloride, lead fluoride Lead fluoride, lead oxide, lead perchlorate, lead nitrate, lead sulfate, lead carbonate, lead acethylacetonate, lead Lead citrate, lead bromide, lead naphthenate, tin acetate, tin bisacetylacetonate, tin bromide, tin chloride Tin chloride, tin chloride dihydrate, tin chloride pentahydrate, tin fluoride, tin oxide, tin oxide, But are not limited to, tin sulfate, tin iodide, diphenyltin dichloride, germanium tetrachloride, germanium oxide, germanium ethoxide, germanium bromide, Germanium bromide, germanium iodide, tetramethyl germanium, trimethyl germanium chloride, trimethyl germanium bromide and triethyl germanium chloride, etc. . ≪ / RTI > These may be used alone or in combination.
일 실시예에서, 상기 유기산은 올레인산(oleic acid)을 포함할 수 있다.In one embodiment, the organic acid may comprise oleic acid.
다른 실시예에서, 상기 유기산은 저분자량 유기산을 포함한다. 상기 저분자량 유기산은 탄소수가 12 이하인 유기산일 수 있다. 예를 들어, 상기 저분자량 유기산으로는 포름산(formic acid), 아세트산(acetic acid), 프로피온산(propionic acid), 발레릭산(valeric acid), 부티르산(butyric acid), 헥사노익산(hexanoic acid), 카프릴산(caprylic acid), 카프릭산(capric acid), 라우릭산(lauric acid) 등이 사용될 수 있으며, 이들은 각각 단독으로 또는 혼합되어 사용될 수 있다.In another embodiment, the organic acid comprises a low molecular weight organic acid. The low molecular weight organic acid may be an organic acid having 12 or less carbon atoms. For example, the low molecular weight organic acids may include formic acid, acetic acid, propionic acid, valeric acid, butyric acid, hexanoic acid, Caprylic acid, capric acid, lauric acid and the like may be used. These may be used alone or in combination.
다른 실시예에서, 상기 유기산은 저분자량 유기산 및 올레인산의 혼합물을 포함할 수 있다. 상기 유기산으로서, 상기 저분자량 유기산만을 사용하거나, 상기 올레인산에 대한 상기 저분자량 유기산의 몰비가 과도하게 클 경우, 양자점 입자의 직경이 증가하여 광전 특성이 저하될 수 있으며, 상기 올레인산에 대한 유기산의 몰비가 과소할 경우, 공기 노출에 대한 안정성이 저하될 수 있다.In another embodiment, the organic acid may comprise a mixture of low molecular weight organic acids and oleic acid. When the molar ratio of the low molecular weight organic acid to the oleic acid is excessively large or only the low molecular weight organic acid is used as the organic acid, the diameter of the quantum dot particles may increase and the photoelectric property may be deteriorated. The stability against air exposure may be deteriorated.
또한, 상기와 같이 저분자량 유기산 및 올레인산의 혼합물을 이용할 경우, 저분자량 유기산 및 올레인산의 비율을 조절하여, 양자점의 크기 및 형상을 조절하는 것이 용이하다.In addition, when the mixture of low molecular weight organic acid and oleic acid is used as described above, it is easy to control the size and shape of the quantum dots by controlling the ratio of low molecular weight organic acid and oleic acid.
상기 유기산은 양자점 표면에 유기 리간드를 형성하여 양자점의 분산성을 개선함으로써, 용액반응 공정에서 양자점 성장에 중요한 역할을 한다.The organic acid plays an important role in quantum dot growth in the solution reaction process by improving the dispersibility of quantum dots by forming organic ligands on the surface of the quantum dots.
상기 용매는 유기 용매이다. 구체적으로, 상기 용매는 하이드로카본을 포함할 수 있다. The solvent is an organic solvent. Specifically, the solvent may include a hydrocarbon.
예를 들어, 상기 하이드로카본으로는 헥산, 도데칸, 데칸, 언데칸, 테트라데칸, 헥사데칸, 1-헥사데신, 옥타데신, 디페닐에테르 등이 사용될 수 있다. 이들은 각각 단독으로 또는 혼합되어 사용될 수 있다.For example, as the hydrocarbon, hexane, dodecane, decane, undecane, tetradecane, hexadecane, 1-hexadecyne, octadecine, diphenyl ether and the like can be used. These may be used alone or in combination.
예를 들어, 상기 아민으로는, 올레일 아민(oleyl amine), 도데실 아민(dodecyl amine), 라우릴 아민(lauryl amine), 옥틸 아민(octyl amine), 트리옥틸 아민(trioctyl amine), 다이옥틸 아민(dioctyl amine), 헥사데실 아민(hexadecyl amine) 등이 사용될 수 있다. 이들은 각각 단독으로 또는 혼합되어 사용될 수 있다.Examples of the amine include oleyl amine, dodecyl amine, lauryl amine, octyl amine, trioctyl amine, dioctyl amine, Dioctyl amine, hexadecyl amine and the like can be used. These may be used alone or in combination.
바람직하게, 상기 용매는 하이드로카본과 같은 비극성 용매를 사용한다.Preferably, the solvent uses a non-polar solvent such as hydrocarbon.
상기 제1 전구체와 상기 유기산의 반응은 가열에 의해 진행될 수 있다. 예를 들어, 상기 제1 전구체와 상기 유기산의 혼합물은 약 80℃ 내지 약 150℃에서 진행될 수 있다. 바람직하게, 상기 반응은 진공에서 진행되거나, 질소 가스, 아르곤 가스 등을 포함하는 불활성 분위기에서 진행된다.The reaction of the first precursor and the organic acid may proceed by heating. For example, the mixture of the first precursor and the organic acid may be conducted at about 80 ° C to about 150 ° C. Preferably, the reaction proceeds in a vacuum or in an inert atmosphere including nitrogen gas, argon gas, and the like.
상기 제1 전구체와 상기 유기산의 반응을 촉진하기 위하여 디개싱(degassing)을 수행할 수 있다. 상기 디개싱은, 반응의 부산물을 제거함으로써, 상기 제1 전구체와 상기 유기산 반응 평형을 이동시켜, 반응을 촉진한다. 상기 디개싱은 약 1시간 내지 5시간 동안 수행될 수 있다.Degassing may be performed to promote the reaction between the first precursor and the organic acid. The degassing moves the organic acid reaction equilibrium with the first precursor by removing by-products of the reaction, thereby promoting the reaction. The degassing may be carried out for about 1 to 5 hours.
다음으로, 상기 제1 전구체와 상기 유기산의 반응 생성물과 제2 전구체를 반응시켜 유기 리간드를 갖는 양자점을 형성한다(S20). 상기 제2 전구체는 15족 원소 또는 16족 원소를 포함할 수 있다.Next, a reaction product of the first precursor and the organic acid is reacted with a second precursor to form a quantum dot having an organic ligand (S20). The second precursor may comprise a Group 15 element or a Group 16 element.
예를 들어, 상기 제2 전구체는, 트리-n-옥틸포스핀 셀레나이드(tri-n-octylphosphine selenide), 트리-n-부틸포스핀 셀레나이드(tri-nbutylphosphine selenide), 디에틸 디셀레나이드(Diethyl diselenide), 디메틸 셀레나이드(Dimethylselenide), 비스(트리메틸실리) 셀레나이드(bis(trimethylsilyl)selenide), 셀렌-트리페닐포스핀(Se-TPP), 트리-n-옥틸포스핀 텔루라이드(tri-n-octylphosphine telluride), 트리-n-부틸포스핀 텔루라이드(tri-nbutylphosphine telluride), 비스(트리메틸실리) 텔루라이드(bis(trimethylsilyl) telluride), 텔루르-트리페닐포스핀(Te-TPP), 설퍼-트리옥틸포스핀(S-TOP), 설퍼-트리부틸포스핀(S-TBP), 설퍼-트리페닐포스핀(S-TPP), 설퍼-트리옥틸아민(S-TOA), 비스(트리메틸실릴)설파이드(bis(trimethylsilyl) sulfide), 트리메틸실릴설파이드(trimethylsilyl sulfide), 트리메틸실릴 설퍼(trimethylsilyl sulfur), 암모늄 설파이드, 소듐 설파이드 등을 포함할 수 있다. 이들은 각각 단독으로 또는 혼합되어 사용될 수 있다.For example, the second precursor may be selected from the group consisting of tri-n-octylphosphine selenide, tri-n-butylphosphine selenide, diethyl diesteranide Diethyl diselenide, dimethylselenide, bis (trimethylsilyl) selenide, selenium-triphenylphosphine (Se-TPP), tri-n-octylphosphine telluride, n-octylphosphine telluride, tri-nbutylphosphine telluride, bis (trimethylsilyl) telluride, tellurium-triphenylphosphine (Te-TPP) Triphenylphosphine (S-TPP), sulfur-trioctylamine (S-TOA), bis (trimethylsilyl) ), Bis (trimethylsilyl) sulfide, trimethylsilyl sulfide, trimethylsilyl sulfur, ammonium sulfide, It may include a rhodium sulfide. These may be used alone or in combination.
상기 제1 전구체와 상기 유기산의 반응 생성물과 제2 전구체와의 반응은 가열에 의해 진행될 수 있다. 예를 들어, 상기 반응은 약 80℃ 내지 약 350℃에서 진행될 수 있으며, 바람직하게는 약 120℃ 내지 약 300℃에서 진행될 수 있다.The reaction between the reaction product of the first precursor and the organic acid and the second precursor can be carried out by heating. For example, the reaction may be run at about 80 ° C to about 350 ° C, preferably at about 120 ° C to about 300 ° C.
상기 제1 전구체와 상기 유기산의 반응 생성물과 제2 전구체와의 반응은 ??칭에 의해 빠르게 종료되는 것이 바람직하다. 상기 반응 종료를 위해 헥산 및 얼음물 등이 이용될 수 있다.The reaction between the reaction product of the first precursor and the organic acid and the second precursor is preferably terminated rapidly by crystallization. Hexane and ice water may be used for the completion of the reaction.
예를 들어, 상기 양자점은, 14족-16족계 화합물, 12족-16족계 화합물, 13족-15족계 화합물 등을 포함할 수 있다.For example, the quantum dot may include a Group 14-16 group compound, a Group 12-16 group compound, a Group 13-15 group compound, and the like.
예를 들어, 상기 14족-16족계 화합물은 주석 옥사이드(SnO), 주석 설파이드(SnS), 주석 셀레나이드(SnSe), 주석 텔레나이드(SnTe), 납 설파이드(PbS), 납 셀레나이드(PbSe), 납 텔레나이드(PbTe), 게르마늄 옥사이드(GeO), 게르마늄 설파이드(GeS), 게르마늄 셀레나이드(GeSe), 게르마늄 텔레나이드(GeTe), 주석 셀레늄 설파이드(SnSeS), 주석 셀레늄 텔레나이드(SnSeTe), 주석 설파이드 텔레나이드(SnSTe), 납 셀레늄 설파이드(PbSeS), 납 셀레늄 텔레나이드(PbSeTe), 납 설파이드 텔레나이드(PbSTe), 주석 납 설파이드(SnPbS), 주석 납 셀레나이드(SnPbSe), 주석 납 텔레나이드(SnPbTe), 주석 옥사이드설파이드(SnOS), 주석 옥사이드 셀레나이드(SnOSe), 주석 옥사이드텔레나이드(SnOTe), 게르마늄 옥사이드설파이드(GeOS), 게르마늄 옥사이드셀레나이드(GeOSe), 게르마늄 옥사이드 텔레나이드(GeOTe), 주석 납 설파이드 셀레나이드(SnPbSSe), 주석 납 셀레늄 텔레나이드(SnPbSeTe), 주석 납 설파이드 텔레나이드(SnPbSTe) 등을 포함할 수 있다. For example, the Group 14 to Group 16 compounds may be selected from the group consisting of tin oxide (SnO), tin sulfide (SnS), tin selenide (SnSe), tin tin (SnTe), lead sulfide (PbS), lead selenide (PbSe) (PbTe), germanium oxide (GeO), germanium sulphide (GeS), germanium selenide (GeSe), germanium telenide (GeTe), tin selenium sulfide (SnSeS), tin selenide (SnSeTe) (PbSeTe), lead sulfide (PbSTe), tin lead sulfide (SnPbS), tin lead selenide (SnPbSe), tin lead tinide (PbSe), lead selenide Tin oxide selenide (SnPbTe), tin oxide sulphide (SnOS), tin oxide selenide (SnOSe), tin oxide tin oxide (SnOTe), germanium oxide sulphide (GeOS), germanium oxide selenide (GeOSe), germanium oxide telenide Lead Sulfide selenide may include (SnPbSSe), tin-lead selenium arsenide telephone (SnPbSeTe), tin-lead sulfide telephone arsenide (SnPbSTe) and the like.
예를 들어, 상기 12족-16족계 화합물은 카드뮴 설파이드(CdS), 카드뮴 셀레나이드(CdSe), 카드뮴 텔레나이드(CdTe), 아연 설파이드(ZnS), 아연 셀레나이드(ZnSe), 아연 텔레나이드(ZnTe), 수은 설파이드(HgS), 수은 셀레나이드(HgSe), 수은 텔레나이드(HgTe), 아연 옥사이드(ZnO), 카드뮴 옥사이드(CdO), 수은 옥사이드(HgO), 카드뮴 셀레늄 설파이드(CdSeS), 카드뮴 셀레늄 텔레나이드(CdSeTe), 카드뮴 설파이드텔레나이드(CdSTe), 카드뮴 아연 설파이드(CdZnS), 카드뮴 아연 셀레나이드(CdZnSe), 카드뮴 설파이드셀레나이드(CdSSe), 카드뮴 아연 텔레나이드(CdZnTe), 카드뮴 수은 설파이드(CdHgS), 카드뮴 수은 셀레나이드(CdHgSe), 카드뮴 수은 텔레나이드(CdHgTe), 아연 셀레늄 설파이드(ZnSeS), 아연 셀레늄 텔레나이드(ZnSeTe), 아연 설파이드텔레나이드(ZnSTe), 수은 셀레늄 설파이드(HgSeS), 수은 셀레늄 텔레나이드(HgSeTe), 수은 설파이드 텔레나이드(HgSTe), 수은 아연 설파이드(HgZnS), 수은 아연 셀레나이드(HgZnSe), 카드뮴 아연 옥사이드(CdZnO), 카드뮴 수은 옥사이드(CdHgO), 아연 수은 옥사이드(ZnHgO), 아연 셀레늄 옥사이드(ZnSeO), 아연 텔레늄 옥사이드(ZnTeO), 아연 설파이드옥사이드(ZnSO), 카드뮴 셀레늄 옥사이드(CdSeO), 카드뮴 텔레늄옥사이드(CdTeO), 카드뮴 설파이드옥사이드(CdSO), 수은 셀레늄 옥사이드(HgSeO), 수은 텔레늄 옥사이드(HgTeO), 수은 설파이드옥사이드(HgSO), 카드뮴 아연 셀레늄 설파이드(CdZnSeS), 카드뮴 아연 셀레늄 텔레나이드(CdZnSeTe), 카드뮴 아연 설파이드텔레나이드(CdZnSTe), 카드뮴 수은 셀레늄 설파이드(CdHgSeS), 카드뮴 수은 셀레늄 텔레나이드(CdHgSeTe), 카드뮴 수은 설파이드텔레나이드(CdHgSTe), 수은 아연 셀레늄 설파이드(HgZnSeS), 수은 아연 셀레늄 텔레나이드(HgZnSeTe), 수은 아연 설파이드 텔레나이드(HgZnSTe), 카드뮴 아연 셀레늄 옥사이드(CdZnSeO), 카드뮴 아연 텔레늄 옥사이드(CdZnTeO), 카드뮴 아연 설파이드옥사이드(CdZnSO), 카드뮴 수은 셀레늄 옥사이드(CdHgSeO), 카드뮴 수은 텔레늄옥사이드(CdHgTeO), 카드뮴 수은 설파이드옥사이드(CdHgSO), 아연 수은 셀레늄 옥사이드(ZnHgSeO), 아연 수은 텔레늄 옥사이드(ZnHgTeO), 아연 수은 설파이드 옥사이드(ZnHgSO) 등을 포함할 수 있다. For example, the Group 12-Group 16 compounds may be cadmium sulfide (CdS), cadmium selenide (CdSe), cadmium teleonide (CdTe), zinc sulfide (ZnS), zinc selenide (ZnSe), zinc telenide Mercury selenide (HgSe), mercury tinide (HgTe), zinc oxide (ZnO), cadmium oxide (CdO), mercury oxide (HgO), cadmium selenium sulfide (CdSeS), cadmium selenium tele (CdSeTe), cadmium sulfide telenide (CdSTe), cadmium zinc sulfide (CdZnS), cadmium zinc selenide (CdZnSe), cadmium sulfide selenide (CdSSe), cadmium zinc telenide (CdZnTe) , Cadmium mercury selenide (CdHgSe), cadmium mercury telenide (CdHgTe), zinc selenium sulfide (ZnSeS), zinc selenide telenide (ZnSeTe), zinc sulfide telenide (ZnSTe), mercury selenium sulfide (HgSeS) (HgSeTe), mercury sulfide telenide (HgSTe), mercury zinc sulfide (HgZnS), mercury zinc selenide (HgZnSe), cadmium zinc oxide (CdZnO), cadmium mercury oxide (CdHgO), zinc mercury oxide (CdSeO), cadmium sulfide oxide (CdSO), mercury selenium oxide (HgSeO), zinc selenide oxide (ZnSeO), zinc telenium oxide (ZnTeO), zinc sulfide oxide (ZnSO), cadmium selenium oxide (HgTeO), mercury sulfide oxide (HgSO), cadmium zinc selenium sulfide (CdZnSeS), cadmium zinc selenium telenide (CdZnSeTe), cadmium zinc sulfide telenide (CdZnSTe), cadmium mercury selenium sulfide (CdHgSeS) Cadmium mercury selenide telenide (CdHgSeTe), cadmium mercury sulfide telenide (CdHgSTe), mercury zinc selenium sulfide (HgZnSeS), mercury zinc selenium tele (HgZnSeTe), mercury zinc sulfide telenide (HgZnSTe), cadmium zinc selenium oxide (CdZnSeO), cadmium zinc telenium oxide (CdZnTeO), cadmium zinc sulfide oxide (CdZnSO), cadmium mercury selenium oxide (CdHgSeO) (CdHgTeO), cadmium mercury sulfide oxide (CdHgSO), zinc mercury selenium oxide (ZnHgSeO), zinc mercury telemonium oxide (ZnHgTeO), zinc mercury sulfide oxide (ZnHgSO), and the like.
예를 들어, 상기 13족-15족계 화합물은 갈륨 포스포러스 (GaP), 갈륨 아세나이드(GaAs), 갈륨 안티모니(GaSb), 갈륨 니트라이드(GaN), 알루미늄 포스포러스 (AlP), 알루미늄 아세나이드(AlAs), 알루미늄 안티모니(AlSb), 알루미늄 니트라이드(AlN), 인듐 포스포러스 (InP), 인듐 아세나이드(InAs), 인듐 안티모니(InSb), 인듐 니트라이드(InN), 갈륨 포스포러스 아세나이드(GaPAs), 갈륨 포스포러스 안티모니(GaPSb), 갈륨 포스포러스 니트라이드(GaPN), 갈륨 아세나이드니트라이드(GaAsN), 갈륨 안티모니니트라이드(GaSbN), 알루미늄 포스포러스 아세나이드(AlPAs), 알루미늄 포스포러스 안티모니(AlPSb), 알루미늄 포스포러스 니트라이드(AlPN), 알루미늄 아세나이드니트라이드(AlAsN), 알루미늄 안티모니니트라이드(AlSbN), 인듐 포스포러스 아세나이드(InPAs), 인듐 포스포러스 안티모니(InPSb), 인듐 포스포러스 니트라이드(InPN), 인듐 아세나이드니트라이드(InAsN), 인듐 안티모니 니트라이드(InSbN), 알루미늄 갈륨 포스포러스 (AlGaP), 알루미늄 갈륨 아세나이드(AlGaAs), 알루미늄 갈륨 안티모니(AlGaSb), 알루미늄 갈륨 니트라이드(AlGaN), 알루미늄 아세나이드 니트라이드(AlAsN), 알루미늄 안티모니 니트라이드(AlSbN), 인듐 갈륨 포스포러스 (InGaP), 인듐 갈륨 아세나이드(InGaAs), 인듐 갈륨 안티모니(InGaSb), 인듐 갈륨 니트라이드(InGaN), 인듐 아세나이드니트라이드(InAsN), 인듐 안티모니 니트라이드(InSbN), 알루미늄 인듐 포스포러스 (AlInP), 알루미늄 인듐 아세나이드(AlInAs), 알루미늄 인듐 안티모니(AlInSb), 알루미늄 인듐 니트라이드(AlInN), 알루미늄 아세나이드 니트라이드(AlAsN), 알루미늄 안티모니 니트라이드(AlSbN), 알루미늄 포스포러스 니트라이드(AlPN), 갈륨 알루미늄 포스포러스 아세나이드(GaAlPAs), 갈륨 알루미늄 포스포러스 안티모니(GaAlPSb), 갈륨 인듐 포스포러스 아세나이드(GaInPAs), 갈륨 인듐 알루미늄 아세나이드(GaInAlAs), 갈륨 알루미늄 포스포러스 니트라이드(GaAlPN), 갈륨 알루미늄 아세나이드 니트라이드(GaAlAsN), 갈륨 알루미늄 안티모니 니트라이드(GaAlSbN), 갈륨 인듐 포스포러스 니트라이드(GaInPN), 갈륨 인듐 아세나이드 니트라이드(GaInAsN), 갈륨 인듐 알루미늄 니트라이드(GaInAlN), 갈륨 안티모니포스포러스 니트라이드(GaSbPN), 갈륨 아세나이드포스포러스 니트라이드(GaAsPN), 갈륨 아세나이드안티모니니트라이드(GaAsSbN), 갈륨 인듐 포스포러스 안티모니(GaInPSb), 갈륨 인듐 포스포러스 니트라이드(GaInPN), 갈륨 인듐 안티모니 니트라이드(GaInSbN), 갈륨 포스포러스 안티모니 니트라이드(GaPSbN), 인듐 알루미늄 포스포러스 아세나이드(InAlPAs), 인듐 알루미늄 포스포러스 니트라이드(InAlPN), 인듐 포스포러스 아세나이드 니트라이드(InPAsN), 인듐 알루미늄 안티모니 니트라이드(InAlSbN), 인듐 포스포러스 안티모니 니트라이드(InPSbN), 인듐 아세나이드 안티모니 니트라이드(InAsSbN) 및 인듐 알루미늄 포스포러스 안티모니(InAlPSb) 등을 포함할 수 있다. For example, the Group 13-Group 15 compound may be selected from the group consisting of gallium phosphorus (GaP), gallium arsenide (GaAs), gallium antimony (GaSb), gallium nitride (GaN), aluminum phosphorus (AlN), aluminum antimony (AlSb), aluminum nitride (AlN), indium phosphosphorus (InP), indium arsenide (InAs), indium antimony (InSb), indium nitride Gallium arsenide nitrides (GaAsN), gallium antimonitride (GaSbN), aluminum phosphorescent arsenide (AlPAs), gallium arsenide nitride (GaN), gallium arsenide nitride (AlP), aluminum phosphorus antimony (AlPSb), aluminum phosphorus nitrides (AlPN), aluminum arsenide nitrides (AlAsN), aluminum antimony nitrides (AlSbN), indium phosphorous arsenide (InPSb), phosphorus Aluminum gallium arsenide (AlGaAs), aluminum gallium antimony (AlGaSb), aluminum gallium arsenide (AlGaAs), aluminum gallium arsenide (AlGaAs), aluminum gallium arsenide Aluminum gallium nitride (AlGaN), aluminum arsenide nitride (AlAsN), aluminum antimonitride (AlSbN), indium gallium phosphide (InGaP), indium gallium arsenide (InGaAs), indium gallium antimony (InGaSb) (InAsN), indium antimony nitrides (InSbN), aluminum indium phosphors (AlInP), aluminum indium arsenide (AlInAs), aluminum indium antimony (AlInSb), indium gallium nitride (InGaN), indium arsenide nitride (AlInN), aluminum arsenide nitrides (AlAsN), aluminum antimony nitrides (AlSbN), aluminum phosphorus nitrides (AlPN), gallium aluminum (GaAlPAs), gallium aluminum phosphorescent antimony (GaAlPSb), gallium indium phosphorous arsenide (GaInPAs), gallium indium aluminum arsenide (GaInAlAs), gallium aluminum phosphorus nitride (GaAlPN) (GaAlAsN), gallium aluminum antimonitride (GaAlSbN), gallium indium phosphorus nitride (GaInPN), gallium indium arsenide nitride (GaInAsN), gallium indium aluminum nitride (GaInAlN), gallium antimony Gallium arsenide phosphorous nitrides (GaAsPPN), gallium arsenide antimony nitrides (GaAsSbN), gallium indium phosphorescent antimony (GaInPSb), gallium indium phosphosulfide nitrides (GaInPN), gallium arsenide phosphide nitrides Indium antimonitride (GaInSbN), gallium phosphorus antimonitride (GaPSbN), indium aluminum phosphors (InAlSiO3), indium aluminum phosphonite (InAlSiO3), indium aluminum phosphonite (InAlN), indium aluminum phosphonite (InAlN), indium aluminum phosphite nitride Niobium antimonitride (InAsSbN), indium aluminum phosphorus antimony (InAlPSb), and the like.
상기 양자점의 표면에는 유기 화합물이 리간드로 결합된다. 본 실시예에서, 상기 양자점은 올레산과 결합된 납 설파이드(PbS) 양자점일 수 있다.An organic compound is bound to the surface of the quantum dot as a ligand. In this embodiment, the quantum dots may be lead sulfide (PbS) quantum dots combined with oleic acid.
상기 양자점은 약 1 내지 100nm의 직경을 가질 수 있으며, 바람직하게는 약 1 내지 20nm의 직경을 가질 수 있다. The quantum dot may have a diameter of about 1 to 100 nm, and preferably a diameter of about 1 to 20 nm.
상기 양자점 입자는 결정 구조를 가지며, {100}면과 {111}면을 갖는다. 상기 {100}면과 {111}면은 다른 원자 배열을 갖는다. 예를 들어, {100}면은 동일한 금속 원소로 이루어져 극성을 가지고, {111}면은 금속 원소 및 비금속 원소로 이루어져 중성일 수 있다. 상기 유기 리간드는 {100}면의 금속 원소와 결합한다.The quantum dot particles have a crystal structure and have a {100} plane and a {111} plane. The {100} and {111} planes have different atomic arrangements. For example, the {100} plane is made of the same metal element and has a polarity, and the {111} plane is made of a metal element and a nonmetal element and can be neutral. The organic ligand binds to a metal element on the {100} plane.
다음으로, 상기 양자점에 극성 용매 및 할로겐 화합물을 제공하여, 상기 유기 리간드를 제거하고, 상기 양자점의 표면에 할로겐 패시베이션층을 형성한다(S30). 상기 할로겐 패시베이션층은 상기 양자점의 표면 전체에 형성된다. 즉, 상기 유기 리간드의 제거(실질적으로 완전히)가 일어난다. Next, a polar solvent and a halogen compound are provided to the quantum dot to remove the organic ligand, and a halogen passivation layer is formed on the surface of the quantum dot (S30). The halogen passivation layer is formed on the entire surface of the quantum dot. That is, the removal (substantially completely) of the organic ligand occurs.
상기 할로겐 화합물의 할로겐 원소는, 양자점의 금속 원소와 반응하여 할로겐 염(M-X, M:양자점의 금속 원소, X: 할로겐 원소)으로 구성된 패시베이션층을 형성한다. 상기 패시베이션층은 모노레이어 또는 멀티레이어로 형성될 수 있다. The halogen element of the halogen compound reacts with the metal element of the quantum dot to form a passivation layer composed of a halogen salt (M-X, M: a metal element of a quantum dot, and X: a halogen element). The passivation layer may be formed of a monolayer or a multilayer.
예를 들어, 유기 리간드가 결합되지 않은 {100}면의 금속 원소가 할로겐 화합물과 반응하여, {100}면에 할로겐 염으로 구성된 패시베이션층이 형성될 수 있다. 또한, {111}면에 결합된 유기 리간드는 상기 극성 용매에 의해 제거되고, {111}면의 금속 원소가 할로겐 화합물과 반응하여, {111}면에 할로겐 염으로 구성된 패시베이션층이 형성될 수 있다. For example, a metal element of the {100} plane to which the organic ligand is not bonded may react with a halogen compound to form a passivation layer composed of a halogen salt on the {100} plane. Further, the organic ligand bonded to the {111} plane is removed by the polar solvent, and the metal element of the {111} plane reacts with the halogen compound to form a passivation layer composed of a halogen salt on the {111} plane .
상기 극성 용매는 양자성(protic) 아민 또는 알코올을 포함할 수 있다. 예를 들어, 메탄올, 에탄올, 프로판올, 부탄올 등이 사용될 수 있으며, 이들은 각각 단독으로 또는 혼합되어 사용될 수 있다. 바람직하게는 메탄올, 에탄올 등과 같은 저분자 알코올이 사용되며, 보다 바람직하게는 메탄올이 사용될 수 있다.The polar solvent may comprise a protic amine or an alcohol. For example, methanol, ethanol, propanol, butanol and the like may be used, and these may be used singly or in combination. Preferably, a low-molecular alcohol such as methanol, ethanol or the like is used, and more preferably methanol can be used.
상기 할로겐 화합물은 할로겐 이온을 생성할 수 있는 것이면 특별히 제한되지 않으나, 결합 에너지를 고려하였을 때, 브롬 또는 요오드를 포함하는 것이 바람직하며, 보다 바람직하게는 요오드를 포함하는 것이 바람직하다. 상기 할로겐 원소가 양자점의 금속 원소와 약한 결합을 형성할 경우, 분산매 내에서의 분산성이 낮아져 공정 적용성이 저하된다.The halogen compound is not particularly limited as long as it is capable of generating a halogen ion. However, when considering binding energy, it is preferable that the halogen compound includes bromine or iodine, more preferably iodine. When the halogen element forms a weak bond with the metal element of the quantum dot, the dispersibility in the dispersion medium is lowered and the process applicability is lowered.
예를 들어, 상기 할로겐 화합물은, 할로겐화 금속, 유기할로겐화물 등과 같은 할로겐 염을 포함할 수 있다. 구체적으로, 테트라부틸암모늄 브로마이드, 세틸트리메틸암모늄 브로마이드, 암암모늄 브로마이드, 암모늄 아이오다이드, 포타슘 브로마이드, 포타슘 아이오다이드, 소듐 브로마이드, 소듐 아이오다이드, 인듐 브로마이드 인듐 아이오다이드 등이 사용될 수 있다. 이들은 각각 단독으로 또는 혼합되어 사용될 수 있다. For example, the halogen compound may include a halogen salt such as a metal halide, an organic halide and the like. Specifically, tetrabutylammonium bromide, cetyltrimethylammonium bromide, ammonium ammonium bromide, ammonium iodide, potassium bromide, potassium iodide, sodium bromide, sodium iodide, indium bromide indium iodide, and the like can be used. These may be used alone or in combination.
도 2는 본 발명의 일 실시예에 따른 양자점 제조 방법에서, 유기 리간드를 제거하고 할로겐 패시베이션층을 형성하는 단계를, 올레산 리간드와 결합된 PbS 양자점을 예시로 설명한 것이다.FIG. 2 illustrates a step of removing an organic ligand and forming a halogen passivation layer in a method of manufacturing a quantum dot according to an embodiment of the present invention by exemplifying a PbS quantum dot coupled with an oleic acid ligand.
도 2를 참조하면, PbS 양자점은 Pb가 연속적으로 배열된 {111}면과, Pb 및 S가 연속적으로 배열된 {111}면을 갖는다. 올레산 리간드(올레이트)는 {111}면의 Pb와 결합한다. 상기 양자점에 메탄올(극성 용매)과 암모늄 아이오다이드(할로겐 화합물)이 가해지면, 상기 올레산 리간드가 제거되어, {111}면의 Pb가 노출되고, 이는 암모늄 아이오다이드와 반응하여, PbI 결합으로 구성된 패시베이션층을 형성한다.Referring to FIG. 2, a PbS quantum dot has a {111} plane in which Pb is continuously arranged and a {111} plane in which Pb and S are continuously arranged. The oleic acid ligand (oleate) binds to the {111} plane of Pb. When methanol (polar solvent) and ammonium iodide (halogen compound) are added to the quantum dots, the oleic acid ligand is removed to expose Pb on the {111} plane, which reacts with ammonium iodide to form PbI bonds To form a configured passivation layer.
상기 유기 리간드의 제거 및 할로겐 패시베이션층 형성은, 극성 용매 및 할로겐 화합물의 함량에 의해 결정될 수 있다. Removal of the organic ligand and formation of a halogen passivation layer can be determined by the content of the polar solvent and the halogen compound.
상기 양자점이 비극성 용매에 분산되어 있는 경우, 상기 비극성 용매에 대한 상기 양자점에 가해지는 상기 극성 용매의 부피비는 0.3:1 이상일 필요가 있으며, 바람직하게는 0.3:1 내지 5:1일 수 있다. 상기 비극성 용매에 대한 상기 양자점에 가해지는 상기 극성 용매의 부피비는 0.3:1 보다 작은 경우, 유기 리간드의 제거가 완전히 이루어지지 않는다. 상기 유기 리간드의 제거가 완전히 이루어지지 않을 경우, 분산성의 균일도가 커져 양자점 입자의 분리 및 후공정 적용이 어려울 뿐만 아니라, 박막 형성시 리간드 공정이 필요하게 되어, 본 발명의 목적을 달성할 수 없다. 또한, 상기 비극성 용매에 대한 상기 양자점에 가해지는 상기 극성 용매의 부피비가 5:1을 초과하는 경우, 할로겐 화합물의 농도가 저하되어, 패시베이션층 형성이 어려울 수 있다.When the quantum dots are dispersed in a non-polar solvent, the volume ratio of the polar solvent to the quantum dots relative to the non-polar solvent should be 0.3: 1 or more, preferably 0.3: 1 to 5: 1. When the volume ratio of the polar solvent to the quantum dots of the nonpolar solvent is less than 0.3: 1, the removal of the organic ligand is not completely achieved. If the removal of the organic ligand is not completely performed, the uniformity of dispersion becomes large, so that the separation of the quantum dot particles and the application to a later process are difficult, and a ligand process is required in forming a thin film, and the object of the present invention can not be achieved. When the volume ratio of the polar solvent to the quantum dots of the nonpolar solvent is more than 5: 1, the concentration of the halogen compound may be lowered and the formation of the passivation layer may be difficult.
또한, 상기 할로겐 화합물의 함량은, 양자점 1g에 대하여 0.001몰(mol) 이상인 것이 바람직하다. 상기 할로겐 화합물의 함량이 양자점 1g에 대하여 0.001몰 미만인 경우, 패시베이션층이 완전히 형성되지 않고, 올레산의 재결합 등이 일어난다. 예를 들어, 상기 할로겐 화합물의 함량은, 양자점 1g에 대하여 0.001몰 내지 0.1몰일 수 있다.The content of the halogen compound is preferably 0.001 mol or more with respect to 1 g of the quantum dot. When the content of the halogen compound is less than 0.001 mol per 1 g of the quantum dots, the passivation layer is not completely formed and oleic acid is recombined. For example, the content of the halogen compound may be 0.001 mol to 0.1 mol based on 1 g of the quantum dot.
다음으로, 상기 양자점을 침전시키기 위하여, 상기 양자점을 포함하는 용액에 비극성 용매를 가한다(S40).Next, to precipitate the quantum dots, a nonpolar solvent is added to the solution containing the quantum dots (S40).
상기에서 설명한 바와 같이, 유기 리간드를 갖는 양자점을 분산하는 비극성 용매(제1 비극성 용매)에 대한, 상기 극성 용매의 부피비가 0.3:1 이상인 경우, 상기 비극성 용매와 상기 극성 용매의 층분리가 일어나 패시베이션된 양자점의 침전이 일어나지 않는다.As described above, when the volume ratio of the polar solvent to the nonpolar solvent (first nonpolar solvent) for dispersing the quantum dot having the organic ligand is 0.3: 1 or more, the separation of the nonpolar solvent and the polar solvent occurs, So that the precipitation of the quantum dots does not occur.
따라서, 상기 비극성 용매와 상기 극성 용매의 혼합을 유도하기 위하여, 비극성 용매(제2 비극성 용매)를 추가한다. 바람직하게, 상기 제2 비극성 용매는 톨루엔이 사용될 수 있다.Therefore, in order to induce mixing of the non-polar solvent and the polar solvent, a non-polar solvent (a second non-polar solvent) is added. Preferably, the second non-polar solvent may be toluene.
상기 제2 비극성 용매를 가한 후에, 상기 양자점은 원심분리를 통해 분리될 수 있으며, 이를 분산할 수 있는 적절한 분산매, 예를 들어, 디메틸포름아미드와 같은 극성 용매에 분산되어 사용될 수 있다.After the second nonpolar solvent is added, the quantum dots can be separated by centrifugation, and they can be dispersed in a polar solvent such as a suitable dispersion medium capable of dispersing it, for example, dimethylformamide.
예를 들어, 상기 패시베이션된 양자점을 포함한 용액은 스핀 코팅, 스프레이코팅, 드롭 캐스팅 등과 같은 종래의 방법을 이용하여 양자점 박막을 형성하는데 이용될 수 있다.For example, the solution containing the passivated quantum dot can be used to form a quantum dot thin film using conventional methods such as spin coating, spray coating, drop casting, and the like.
상기 본 발명의 실시예에 따르면, 양자점 입자의 표면을 전체적으로 패시베이션시킬 수 있으며, 이는 양자점 입자의 안정성, 특히 대기 안정성을 크게 개선할 수 있다.According to the embodiment of the present invention, the surface of the quantum dot particles can be entirely passivated, which can greatly improve stability of the quantum dot particles, particularly atmospheric stability.
또한, 상기 양자점은 유기 리간드가 제거된 상태이므로, 양자점 박막을 형성하는 과정에서, 리간드 치환 공정을 거칠 필요가 없으므로, 공정을 간소화할 수 있을 뿐만 아니라, 리간드 치환 과정에서 발생하는 박막 내 응력 등으로 인한 결함(크랙 등)이 방지/감소될 수 있다.In addition, since the quantum dots are in a state in which the organic ligands are removed, there is no need to undergo a ligand replacement process in the course of forming the quantum dot thin film, so that not only the process can be simplified but also the stress due to the thin film generated in the ligand replacement process Defects (cracks, etc.) caused by the heat can be prevented / reduced.
이하에서는 구체적인 양자점 합성예를 통하여, 본 발명의 실시예를 설명하기로 한다.Hereinafter, embodiments of the present invention will be described with reference to concrete quantum dot synthesis examples.
실시예 1Example 1
1.4 ml의 올레인산, 및 10 ml의 옥타데신(octadecene) 혼합액에 PbO 0.46 g을 주입한 후 110 ℃의 온도로 녹이고, 디개싱하여 전구체 용액을 제조하였다. 그리고 전구체 용액을 95 ℃로 낮춘 후, 6 ml의 비스(트리메틸실릴)설파이드 210㎕ 와 옥타데신 4ml의 혼합 용액을 질소 분위기에서 주입하였다. 다음으로, 헥산과 얼음물을 이용하여 반응을 종료(quenching)시켜 양자점을 형성하였다. 1.4 ml of oleic acid, and 10 ml of octadecene, 0.46 g of PbO was injected, and the mixture was dissolved at a temperature of 110 ° C and degassed to prepare a precursor solution. After the precursor solution was lowered to 95 ° C, a mixed solution of 210 ml of 6 ml of bis (trimethylsilyl) sulfide and 4 ml of octadecin was introduced in a nitrogen atmosphere. Next, the reaction was quenched using hexane and ice water to form quantum dots.
다음으로, 상기 용액에 헥산과 아세톤을 중량비 1:2로 투입하고, 원심분리하는 단계를 3회 반복하여 PbS 양자점 침전물을 수득하였다. 얻어진 양자점은 100mg/ml가 되도록 헥산에 재분산하였다.Subsequently, the step of adding hexane and acetone at a weight ratio of 1: 2 to the solution and centrifugal separation was repeated three times to obtain a PbS quantum dot precipitate. The obtained quantum dots were redispersed in hexane so as to have a concentration of 100 mg / ml.
다음으로, 상기 PbS 양자점/헥산 용액(100mg/ml) 1ml를 암모늄 아이오다이드 0.072g/메탄올 3ml의 혼합 용액과 혼합하여 30초 동안 교반하였다. 상기 교반된 용액에 톨루엔 8ml를 가하고, 원심분리하여 얻어진 침전물을 디메틸포름아미드에 재분산하였다.Subsequently, 1 ml of the PbS quantum dot / hexane solution (100 mg / ml) was mixed with 0.072 g of ammonium iodide / 3 ml of methanol and stirred for 30 seconds. To the stirred solution was added 8 ml of toluene, and the resulting precipitate was redispersed in dimethylformamide.
TEM(transmission electron microscopy)을 통해 측정된 상기 양자점의 직경은 약 3 nm였다. The diameter of the quantum dots measured by transmission electron microscopy (TEM) was about 3 nm.
비교예 1Comparative Example 1
1.4 ml의 올레인산, 및 10 ml의 옥타데신(octadecene) 혼합액에 PbO 0.46 g을 주입한 후 110 ℃의 온도로 녹이고, 디개싱하여 전구체 용액을 제조하였다. 그리고 전구체 용액을 95 ℃로 낮춘 후, 6 ml의 비스(트리메틸실릴)설파이드 210㎕ 와 옥타데신 4ml의 혼합 용액을 질소 분위기에서 주입하였다. 다음으로, 헥산과 얼음물을 이용하여 반응을 종료(quenching)시켜 양자점을 형성하였다. 1.4 ml of oleic acid, and 10 ml of octadecene, 0.46 g of PbO was injected, and the mixture was dissolved at a temperature of 110 ° C and degassed to prepare a precursor solution. After the precursor solution was lowered to 95 ° C, a mixed solution of 210 ml of 6 ml of bis (trimethylsilyl) sulfide and 4 ml of octadecin was introduced in a nitrogen atmosphere. Next, the reaction was quenched using hexane and ice water to form quantum dots.
다음으로, 상기 용액에 헥산과 아세톤을 중량비 1:2로 투입하고, 원심분리하는 단계를 3회 반복하여 PbS 양자점 침전물을 수득하였다. 얻어진 양자점은 100mg/ml가 되도록 헥산에 재분산하였다.Subsequently, the step of adding hexane and acetone at a weight ratio of 1: 2 to the solution and centrifugal separation was repeated three times to obtain a PbS quantum dot precipitate. The obtained quantum dots were redispersed in hexane so as to have a concentration of 100 mg / ml.
TEM(transmission electron microscopy)을 통해 측정된 상기 양자점의 직경은 약 3 nm였다. The diameter of the quantum dots measured by transmission electron microscopy (TEM) was about 3 nm.
비교예 2Comparative Example 2
1.4 ml의 올레인산, 및 10 ml의 옥타데신(octadecene) 혼합액에 PbO 0.46 g을 주입한 후 110 ℃의 온도로 녹이고, 디개싱하여 전구체 용액을 제조하였다. 그리고 전구체 용액을 95 ℃로 낮춘 후, 6 ml의 비스(트리메틸실릴)설파이드 210㎕ 와 옥타데신 4ml의 혼합 용액을 질소 분위기에서 주입하였다. 다음으로, 헥산과 얼음물을 이용하여 반응을 종료(quenching)시켜 양자점을 형성하였다. 1.4 ml of oleic acid, and 10 ml of octadecene, 0.46 g of PbO was injected, and the mixture was dissolved at a temperature of 110 ° C and degassed to prepare a precursor solution. After the precursor solution was lowered to 95 ° C, a mixed solution of 210 ml of 6 ml of bis (trimethylsilyl) sulfide and 4 ml of octadecin was introduced in a nitrogen atmosphere. Next, the reaction was quenched using hexane and ice water to form quantum dots.
다음으로, 상기 용액에 헥산과 아세톤을 중량비 1:2로 투입하고, 원심분리하는 단계를 3회 반복하여 PbS 양자점 침전물을 수득하였다. 얻어진 양자점은 100mg/ml가 되도록 헥산에 재분산하였다.Subsequently, the step of adding hexane and acetone at a weight ratio of 1: 2 to the solution and centrifugal separation was repeated three times to obtain a PbS quantum dot precipitate. The obtained quantum dots were redispersed in hexane so as to have a concentration of 100 mg / ml.
다음으로, 상기 PbS 양자점/헥산 용액(100mg/ml) 1ml를 암모늄 아이오다이드 0.0055g/메탄올 0.25ml의 혼합 용액과 혼합하여 30초 동안 교반하였다. 상기 교반된 용액에 헥산과 아세톤을 중량비 1:2로 투입하고, 원심분리하여 얻어진 침전물을 헥산에 재분산하였다.Subsequently, 1 ml of the PbS quantum dot / hexane solution (100 mg / ml) was mixed with 0.0055 g of ammonium iodide / 0.25 ml of methanol and stirred for 30 seconds. To the stirred solution was added hexane and acetone at a weight ratio of 1: 2, centrifuged and the resulting precipitate was re-dispersed in hexane.
TEM(transmission electron microscopy)을 통해 측정된 상기 양자점의 직경은 약 3 nm였다. The diameter of the quantum dots measured by transmission electron microscopy (TEM) was about 3 nm.
도 3a는 실시예 1의 양자점과 비교예 1의 양자점의 FTIR(Fourier Transform Infrared Spectroscopy) 스펙트럼을 도시한 그래프이다. 도 3b는 실시예 1의 양자점과 비교예 1의 양자점의 XPS(X-ray Photoelectron Spectroscopy) 스펙트럼(Pb 4f)을 도시한 그래프이다. 구체적으로, 도 3a에서 PbS-Iodine은 암모늄 아이오다이드로 처리된 실시예 1의 양자점의 FTIR 스펙트럼을 나타내며, PbS-OA는 올레산과 결합된 비교예 1의 양자점의 FTIR 스펙트럼을 나타낸다. 또한, 도 3b에서, 3a에서 PbS-Iodine은 암모늄 아이오다이드로 처리된 실시예 1의 양자점의 Pb 4f XPS 스펙트럼을 나타내며, PbS-OA는 올레산과 결합된 비교예 1의 양자점의 Pb 4f XPS 스펙트럼을 나타낸다. FIG. 3A is a graph showing FTIR (Fourier Transform Infrared Spectroscopy) spectra of the quantum dots of Example 1 and Comparative Example 1. FIG. FIG. 3B is a graph showing an XPS (X-ray photoelectron spectroscopy) spectrum (
도 3a를 참조하면, 비교예 1의 양자점의 FTIR 스펙트럼은 올레산이 결합되어 있음을 보여주는 피크들이 발견되나, 실시예 1의 양자점의 FTIR 스펙트럼은 이러한 피크들이 발견되지 않음을 확인할 수 있다. 또한, 도 3b를 참조하면, 실시예 1의 양자점의 Pb 4f가 비교예 1의 양자점의 Pb 4f보다 더 큰 결합 에너지를 가짐을 알 수 있으며, 이는 패시베이션층을 형성하는 Pb-I결합이, 유기 리간드와의 결합인 Pb-O 보다 큰 결합 에너지를 갖는 것에서 기인한다. 이러한 실험 결과를 통하여, 본 발명의 실시예에 따라, 양자점의 유기 리간드를 제거하고, 패시베이션층을 형성할 수 있음을 확인할 수 있다.Referring to FIG. 3A, the FTIR spectrum of the quantum dot of Comparative Example 1 shows peaks showing the binding of oleic acid, but the FTIR spectrum of the quantum dot of Example 1 shows that no such peaks are found. 3B,
도 4는 비교예 1 및 2의 1H-NMR(Nuclear Magnetic Resonance) 스펙트럼을 도시한 그래프이다. 구체적으로, 왼편의 그래프 A는 비교예 1의 양자점의 1H-NMR 스펙트럼을 도시하며, 오른편의 그래프 B는 비교예 2의 양자점의 1H-NMR 스펙트럼을 도시한다. 4 is a graph showing 1 H-NMR (Nuclear Magnetic Resonance) spectra of Comparative Examples 1 and 2. Specifically, a graph A on the left side shows a 1 H-NMR spectrum of a quantum dot of Comparative Example 1, and a graph B on the right side shows a 1 H-NMR spectrum of a quantum dot of Comparative Example 2.
도 4를 참조하면, 비교예 1의 양자점의 1H-NMR 스펙트럼 및 비교예 2의 양자점의 1H-NMR 스펙트럼에서 모두 5와 6 사이에서 피크가 관찰되는데, 이는 올레산 리간드의 바이닐 그룹에 해당되는 피크이다. 따라서, 유기 리간드와 결합된 양자점에 할로겐 화합물을 제공하더라도, 특정 농도, 예를 들어, 할로겐 화합물의 함량이, 양자점 1g에 대하여 0.001몰(mol) 미만인 경우, 유기 리간드를 제거할 수 없음을 알 수 있다.Referring to Fig. 4, in both 1H-NMR spectra of the quantum dots of Comparative Example 1 and 1H-NMR spectra of the quantum dots of Comparative Example 2, peaks were observed between 5 and 6, which is a peak corresponding to the vinyl group of the oleic acid ligand . Therefore, even if a halogen compound is provided to the quantum dot bound to the organic ligand, it can be understood that the organic ligand can not be removed when the specific concentration, for example, the content of the halogen compound is less than 0.001 mol (mol) have.
본 발명은 양자점을 이용하는 각종 전자 소자, 태양 전지 트랜지스터, 표시 장치, 광원 등에 이용될 수 있다. INDUSTRIAL APPLICABILITY The present invention can be applied to various electronic devices using quantum dots, solar cell transistors, display devices, light sources, and the like.
이상에서는 실시예들을 참조하여 설명하였지만, 해당 기술 분야의 숙련된 당업자는 하기의 특허 청구의 범위에 기재된 본 발명의 사상 및 영역으로부터 벗어나지 않는 범위 내에서 본 발명을 다양하게 수정 및 변경시킬 수 있음을 이해할 수 있을 것이다.It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the present invention as defined by the following claims. You will understand.
Claims (12)
상기 제1 용액에, 할로겐 화합물 및 극성 용매를 포함하는 제2 용액을 가하여, 상기 유기 리간드를 제거하고, 상기 양자점의 {100}면과 {111}면에 할로겐 염을 포함하는 패시베이션층을 형성하는 단계를 포함하고,
상기 할로겐 화합물의 함량이, 상기 양자점 1g에 대하여 0.001몰 이상이고, 상기 비극성 용매에 대한 상기 극성 용매의 부피비는 0.3:1 내지 5:1인 것을 특징으로 하는 패시베이션된 양자점의 제조방법.Preparing a first solution comprising a quantum dot having an organic ligand bound to its surface and a nonpolar solvent dispersing the quantum dot; And
A second solution containing a halogen compound and a polar solvent is added to the first solution to remove the organic ligand to form a passivation layer containing a halogen salt on {100} and {111} planes of the quantum dots ≪ / RTI >
Wherein the content of the halogen compound is 0.001 mol or more based on 1 g of the quantum dots and the volume ratio of the polar solvent to the non-polar solvent is 0.3: 1 to 5: 1.
제1 전구체와 유기산을 반응시키는 단계; 및
상기 제1 전구체와 유기산의 반응물을 제2 전구체와 반응시키는 단계를 포함하는 것을 특징으로 하는 패시베이션된 양자점의 제조방법.2. The method of claim 1, wherein preparing the first solution comprises:
Reacting the first precursor with an organic acid; And
Reacting a reactant of said first precursor and an organic acid with a second precursor. ≪ RTI ID = 0.0 > 11. < / RTI >
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Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
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Non-Patent Citations (2)
Title |
---|
Woo, J. Y., "Ultrastable PbSe Nanocrystal Quantum Dots via in Situ Formation of Atomically Thin Halide Adlayers on PbSe(100)," J. Am. Chem. Soc., 2014, Vo1. 136, No. 25, pp. 8883-8886. |
최민재 및 정연식, 콜로이드 양자점 태양전지의 최근 발전 동향: 양자점 합성과 소자 구조에서의 다양한 접근 방법, Current Photovoltaic Research, 2014, Vol. 2(4), pp. 157-167.* |
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US11050033B2 (en) | 2018-04-24 | 2021-06-29 | Samsung Electronics Co., Ltd. | Light-emitting film, production method thereof, and a light emitting device including the same |
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