KR101688810B1 - Arial X-ray imaging system by using linear X-ray detector - Google Patents

Arial X-ray imaging system by using linear X-ray detector Download PDF

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Publication number
KR101688810B1
KR101688810B1 KR1020150134228A KR20150134228A KR101688810B1 KR 101688810 B1 KR101688810 B1 KR 101688810B1 KR 1020150134228 A KR1020150134228 A KR 1020150134228A KR 20150134228 A KR20150134228 A KR 20150134228A KR 101688810 B1 KR101688810 B1 KR 101688810B1
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KR
South Korea
Prior art keywords
ray
plate
linear detector
detector
linear
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KR1020150134228A
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Korean (ko)
Inventor
윤귀영
Original Assignee
주식회사 메디코어스
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • G01T1/362—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/413—Imaging sensor array [CCD]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/42—Imaging image digitised, -enhanced in an image processor
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image
    • G06T2207/10128—Scintigraphy

Abstract

Disclosed is an X-ray imaging system. Provided is the X-ray imaging system, comprising: an X-ray generator; a plate placed on a route of an X-ray generated in the X-ray generator, wherein the X-ray passes through the plate; a linear detector placed on a lower portion of the plate; a drive module moving the linear detector from one end to the other end on the lower portion of the plate; and a control unit processing data which the linear detector acquires to form a plane X-ray imaging screen.

Description

[0001] The present invention relates to an X-ray imaging apparatus using a linear detector,

The present invention relates to a planar X-ray imaging apparatus using a linear detector.

Conventional medical or industrial X-ray imaging devices are being converted to digital by the development of digital sensor technology from conventional analog methods. In this process, we started to digitize X-ray data of a large area using a small CCD sensor by using an optical lens corresponding to a size to photograph a large X-ray detection area with a CCD sensor using a CCD sensor. 1, an X-ray photographing apparatus using a so-called flat panel detector 10, in which a large-sized optical device is directly used and a plurality of sensors are provided in the entire X-ray detecting area, is rapidly spreading.

The X-ray photographing apparatus using the flat panel detector 10 is advantageous in that it is small in size and light in weight, and has a structure in which sensors are distributed over the entire measurement area. Due to this structure, the number of sensors is increased and the price is increased.

Patent No. 10-0953434 (bone density meter)

The present invention provides a planar X-ray imaging apparatus using a linear detector.

According to an aspect of the present invention,

An x-ray generator;

A plate positioned on the path of the x-ray generated by the x-ray generator and passing the x-ray;

A linear detector positioned below the plate;

A drive module for moving the linear detector from one end to the other end of the lower plate;

And a controller for processing the data acquired by the linear detector to construct an X-ray imaging plane on the surface.

Also,

Wherein the linear detector comprises a combination of a plurality of detector units,

And the plurality of detector units are connected to each other in a stepped manner so that the sensor units can overlap with each other in the moving direction.

The present invention provides a planar X-ray imaging apparatus using a linear detector.

1 is a configuration diagram of an X-ray photographing apparatus according to the prior art.
2 is a block diagram of an X-ray photographing apparatus according to an embodiment of the present invention;
3 is a block diagram of an X-ray photographing apparatus according to another embodiment of the present invention.
4 is a perspective view of an X-ray photographing apparatus according to another embodiment of the present invention (a perspective view with the plate removed).
FIG. 5 shows X-ray data photographed using the X-ray photographing apparatus of FIG.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Reference will now be made in detail to the preferred embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the like elements throughout. And this does not mean that the spirit and scope of the present invention are limited.

2 is a configuration diagram of an X-ray photographing apparatus according to an embodiment of the present invention.

In the X-ray photographing apparatus 20 of this embodiment,

An X-ray generator 21;

A plate 22 positioned on the path of the x-ray generated by the x-ray generator 21 and passing the x-ray;

A linear detector 23 located below the plate 22;

A driving module (not shown) for moving the linear detector 23 from one end to the other end of the lower portion of the plate 22;

And a control unit (not shown) for processing the data acquired by the linear detector 23 to construct an X-ray imaging plane on the surface.

The X-ray generator 21 of this embodiment is the same as the known X-ray generator, and a detailed description thereof will be omitted.

Any material may be used as long as the plate 22 allows the loss of the X-rays to be minimized. In this embodiment, a plate 22 of a carbon material is used.

The linear detector 23 is located at the bottom of the plate 22. The linear detector 23 detects the X-ray passing through the sample while moving under the plate 22 while the X-ray is being irradiated in the X-ray generator 21. [

A driving device (not shown) moves along the rail coupled to the plate 22 and moves the linear detector 23 from one end of the lower portion of the plate 22 to the other end.

The control unit processes the X-ray information acquired by the linear detector 23 to obtain an X-ray imaging plane on the surface. The linear detector 23 moves while acquiring x-ray information with a time lag, and the control unit generates a planar x-ray photographing screen of the same type as that taken at the same time.

As described above, the X-ray photographing apparatus 20 of the present embodiment is different from the conventional X-ray photographing apparatus in which the sensor is attached to the entire surface by using the linear detector 23. As a result, X-ray imaging can be performed using a small amount of sensors, and the cost of the entire apparatus can be reduced.

On the other hand, if the linear detector 23 is formed as long as the length of the plate 22, the price is increased because it has to be customized separately. There is a need for a method of manufacturing a linear detector 23 using a sensor of a length that can be easily obtained on the market.

FIG. 3 is a configuration diagram of an X-ray photographing apparatus according to another embodiment of the present invention, and FIG. 4 is a perspective view (a perspective view with the plate removed) of an X-ray photographing apparatus according to another embodiment of the present invention.

In the X-ray photographing apparatus 30 of this embodiment,

An X-ray generator (not shown);

A plate 32 positioned on the path of the x-ray generated by the x-ray generator and passing the x-ray;

A linear detector 33 positioned below the plate 32;

A driving module (34) for moving the linear detector (33) from one end to the other end of the lower part of the plate (32);

And a control unit (not shown) for processing the data acquired by the linear detector 33 to construct an X-ray imaging plane on the surface.

The X-ray generator 31 of this embodiment is the same as the known X-ray generator, and a detailed description thereof will be omitted.

Any material may be used as long as the plate 32 allows the loss of the X-rays to be minimized. In this embodiment, a plate-like plate 32 made of carbon is used.

The linear detector 33 is located at the bottom of the plate 32. The linear detector 33 detects the X-ray passing through the sample while moving under the plate 32 while the X-ray is irradiated by the X-ray generator 31.

4 is a perspective view in which the plate 32 is omitted. A rail is coupled to the upper portion of the support plate 35. The drive unit 34 is configured such that the linear detector 33 is moved along the rail from one end of the lower portion of the support plate 35 .

The linear detector 33 is constituted by a combination of a plurality of detector units 331 and 332. The plurality of detector units 331 and 332 are arranged in a region overlapping with the sensor units 3311 and 3321, (C).

The detector units 331 and 332 are configured such that the sensor units 3311 and 3321 are coupled to the frame. If the detector units 331 and 332 are coupled in a straight line, the sensor units 3311 and 3321 coupled to the respective detector units 331 and 332 can not be completely coupled without a gap. That is, since the detector unit 331.332 has a structure in which the sensor units 3311 and 3321 are coupled to the frame, when the detector units 331 and 332 are coupled in a straight line, the edges of the frames of the detector units 331 and 332, A gap is generated between the portions 3311 and 3321. [ If a gap is generated between the sensor units 3311 and 3321, the X-ray of this section is not photographed. Therefore, in this embodiment, the detector units 331 and 332 are coupled with a step difference. As a result, if the X-ray is detected while the sensor units 3311 and 3321 move, the X-ray of the entire area of the plate 32 can be sensed.

When the sensor units 3311 and 3321 move while sensing the X-ray, an overlapped area S occurs as shown in FIG. This is because the sensor units 3311 and 3321 overlap and detect the X-rays redundantly. The control unit discards any one of the X-ray data of the sensor units 3311 and 3321 photographed in the overlapped area S and selects the other one to implement the X-ray imaging of the flat plate.

On the other hand, as shown in FIG. 5, the X-ray data of the redundant portions A and B are obtained at the starting point and the last point by the combination of the detector units 331 and 332 constituted by the stepped portions. The control unit removes the region photographed with the redundancy (A, B), and selects the rectangular imaging region to secure it as data.

The control unit processes the x-ray information obtained by the linear detector 33 to acquire an x-ray image of a plane shape (rectangular shape). The linear detector 33 moves while acquiring x-ray information with a time lag, and the control unit generates a planar x-ray photographing screen of the same type as that taken at the same time.

It is possible to complete the linear detector 33 inexpensively even by using a sensor of a short length sold on the market by covering the entire plate 32 by combining a plurality of detector units 331 and 332 as in this embodiment .

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments. Modifications and additions by those skilled in the art to an equivalent range based on the embodiments will also fall within the scope of the present invention.

X-ray equipment (20) X-ray generators (21)
Plates (22) Linear Detectors (23)

Claims (2)

An x-ray generator;
A plate positioned on the path of the x-ray generated by the x-ray generator and passing the x-ray;
A linear detector positioned below the plate;
A drive module for moving the linear detector from one end to the other end of the lower plate;
And a controller for processing the data acquired by the linear detector to construct an X-ray imaging plane on the surface,
Wherein the linear detector comprises a combination of a plurality of detector units,
The plurality of detector units are connected in a stepped manner so that the sensor unit can overlap with the moving direction,
Wherein the control unit discards any one of the X-ray data of the sensor unit photographed in the overlapped area and selects the other X-ray imaging scene when the sensor unit detects the X-ray while moving. X-ray imaging system


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KR1020150134228A 2015-09-22 2015-09-22 Arial X-ray imaging system by using linear X-ray detector KR101688810B1 (en)

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006250739A (en) * 2005-03-11 2006-09-21 Hitachi High-Technologies Corp Foreign substance defect inspection method and its device
KR100953434B1 (en) 2009-12-22 2010-04-20 주식회사 제이엠텍 Apparatus of measuring bone mineral density
KR20130010952A (en) * 2011-07-20 2013-01-30 삼성전자주식회사 Dual-energy x-ray imaging apparatus and control method for the same
KR101268180B1 (en) * 2012-09-05 2013-05-27 원광대학교산학협력단 Apparatus for measuring bone density using dual energy monochromatic x-ray
KR101521837B1 (en) * 2013-12-09 2015-05-26 주식회사 메디코어스 System for acquisition of X-ray data

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006250739A (en) * 2005-03-11 2006-09-21 Hitachi High-Technologies Corp Foreign substance defect inspection method and its device
KR100953434B1 (en) 2009-12-22 2010-04-20 주식회사 제이엠텍 Apparatus of measuring bone mineral density
KR20130010952A (en) * 2011-07-20 2013-01-30 삼성전자주식회사 Dual-energy x-ray imaging apparatus and control method for the same
KR101268180B1 (en) * 2012-09-05 2013-05-27 원광대학교산학협력단 Apparatus for measuring bone density using dual energy monochromatic x-ray
KR101521837B1 (en) * 2013-12-09 2015-05-26 주식회사 메디코어스 System for acquisition of X-ray data

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