KR101678491B1 - Measuring apparatus of MOS - Google Patents

Measuring apparatus of MOS Download PDF

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Publication number
KR101678491B1
KR101678491B1 KR1020150149864A KR20150149864A KR101678491B1 KR 101678491 B1 KR101678491 B1 KR 101678491B1 KR 1020150149864 A KR1020150149864 A KR 1020150149864A KR 20150149864 A KR20150149864 A KR 20150149864A KR 101678491 B1 KR101678491 B1 KR 101678491B1
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KR
South Korea
Prior art keywords
equipment
inner chamber
unit
standard
sample
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Application number
KR1020150149864A
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Korean (ko)
Inventor
임창근
Original Assignee
한국산업기술시험원
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Priority to KR1020150149864A priority Critical patent/KR101678491B1/en
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Publication of KR101678491B1 publication Critical patent/KR101678491B1/en

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R29/00—Monitoring arrangements; Testing arrangements
    • G—PHYSICS
    • G10—MUSICAL INSTRUMENTS; ACOUSTICS
    • G10L—SPEECH ANALYSIS OR SYNTHESIS; SPEECH RECOGNITION; SPEECH OR VOICE PROCESSING; SPEECH OR AUDIO CODING OR DECODING
    • G10L25/00—Speech or voice analysis techniques not restricted to a single one of groups G10L15/00 - G10L21/00
    • G10L25/48—Speech or voice analysis techniques not restricted to a single one of groups G10L15/00 - G10L21/00 specially adapted for particular use
    • G10L25/51—Speech or voice analysis techniques not restricted to a single one of groups G10L15/00 - G10L21/00 specially adapted for particular use for comparison or discrimination
    • G10L25/60—Speech or voice analysis techniques not restricted to a single one of groups G10L15/00 - G10L21/00 specially adapted for particular use for comparison or discrimination for measuring the quality of voice signals

Abstract

The present invention relates to an MOS measuring device capable of precisely measuring an accurate MOS of a sample equipment such as a speaker and a microphone by minimizing noise and vibration transmitted from the ground and originally blocking external noise and vibration.
An MOS measuring apparatus according to the present invention includes: an outer chamber (100) spaced a predetermined distance from the ground; An inner chamber 200 located inside the outer chamber 100 and having standard equipment and sample equipment built therein; And a control unit 300 electrically connected to the standard equipment and the sample equipment located in the inner chamber 200 through a cable to control the degree of sound generated in the standard equipment and the sample equipment, .

Description

Measuring apparatus of MOS

More particularly, the present invention relates to a MOS measuring device, which can precisely measure an accurate MOS of a sample equipment such as a speaker and a microphone by minimizing external noises and vibrations and minimizing noise and vibration transmitted from the ground MOS measuring device.

In general, the sound quality of a voice is calculated and used as a measured value converted to a quantitative value called a MOS (Mean Opinion Score). MOS measurements can be used by users to directly listen to the voice and evaluate the quality of the voice.

Currently, due to the development of technology, devices such as a speaker, a microphone, or the like are being developed. Therefore, it is necessary to check and measure the correct performance or condition and to perform standardized quality control.

Generally, in order to measure the quality of the developed speaker and microphone, it is measured in the area where the sound-absorbing plate is installed, but the influence on the quality is influenced by the external noise and vibration.

Therefore, it is necessary to measure the accurate MOS of the sample equipment such as the speaker and the microphone while minimizing the noise and vibration generated from the outside.

A problem to be solved by the present invention is to provide a MOS measuring device capable of precisely measuring an accurate MOS of a sample equipment such as a speaker and a microphone by minimizing noise and vibration transmitted from the ground, .

An MOS measuring apparatus according to the present invention includes: an outer chamber (100) spaced a predetermined distance from the ground; An inner chamber 200 located inside the outer chamber 100 and having standard equipment and sample equipment built therein; And a control unit 300 electrically connected to the standard equipment and the sample equipment located in the inner chamber 200 through a cable to control the degree of sound generated in the standard equipment and the sample equipment, The outer chamber 100 includes a body 110 having a predetermined shape opened to the inside and a lid 120 for sealing the body 110. The outer body 100 is formed on the inner surface of the body 110 and the lid 120, A power supply line connected to the standard equipment and the sample equipment, a through hole 140 through which the communication line passes, and a bottom edge area of the body 110 spaced a predetermined distance from the ground, The inner chamber 200 includes a body 210 having a predetermined shape placed on the upper portion of the sound absorbing plate of the outer chamber 100 and a cover 210 for sealing the body 210. [ (220), a body (210), and a cover (220) A power supply line connected to the standard equipment and the sample equipment through the body 210, a through hole 240 through which the communication line passes, and a standard equipment And an equipment mounting part (250) on which the sample equipment is mounted.

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Preferably, the support chamber 150 of the outer chamber 100 further includes a pedestal 160 on which the control device 300 is placed.

Preferably, the equipment mounting part 250 includes a guide rod 251 located in the longitudinal or transverse direction inside the body 210, a lower part of the guide rod 251 movably connected along the guide rod 251, A standard equipment support 252 and a sample equipment support 253 connected to the lower portion of the standard equipment support 252 so as to be movable along the guide bar 251 and having a sample equipment installed thereon, And a distance confirming unit 254 for confirming the distance.

Preferably, the inner chamber 200 further includes a noise measurement unit 260 for measuring an inner noise of the inner chamber 200.

Preferably, the darkness measuring unit 260 includes an insertion groove 261 passing through the inner chamber 200, a dark noise measuring unit 262 inserted into the insertion groove 261 to measure darkness of the inner chamber 200, And a fixing jig 263 for fixing the sound level meter 262 while being positioned outside the inner chamber 200 where the insertion groove 261 is located.

Preferably, the fixing jig 263 includes a first support portion 264 and a second support portion 265 that support the outer surface of the sound level meter 262 from one side and the other side while moving in the back and forth direction in a semicircular shape .

Preferably, the control device 300 includes a speaker control unit 310 for controlling sounds output from the standard speaker and the experimental speaker, a microphone control unit 320 for confirming sounds received from the standard microphone and the experimental microphone, A comparison unit 340 for comparing the sound input from the sound source 320 with the sound input from the sound source 320, and a display unit 350 for displaying a test result.

The control unit 300 further includes a dark noise management unit 330 that receives the dark noise of the inner chamber 200 measured by the dark noise measurement unit and the comparison unit 340 detects dark noise measured by the dark noise measurement unit 262 And the correction is performed.

According to the MOS measuring apparatus of the present invention, the chamber in which the sample equipment is built up is doubly configured so that the external noise is originally blocked, and the noise transmitted through the ground is also minimized without fixing the inner chamber, thereby accurately measuring the MOS of the sample equipment There is an effect that can be.

Also, it is possible to accurately measure the dark noise existing in the inner chamber, and to reflect the MOS noise of the sample equipment to measure the MOS of the accurate sample equipment.

1 is a schematic diagram of a MOS measuring apparatus according to the present invention;
2 is a schematic illustration of the outer chamber of the MOS measuring device according to the invention.
3 is a schematic view of an inner chamber of an MOS measuring apparatus according to the present invention.
Fig. 4 is an installation view of the equipment mounting portion according to the present invention; Fig.
5 is a schematic view of a dark noise measurement unit installed in the inner chamber according to the present invention.
6 is a block diagram of a control device according to the present invention;

For a better understanding of the present invention, a preferred embodiment of the present invention will be described with reference to the accompanying drawings. The embodiments of the present invention may be modified into various forms, and the scope of the present invention should not be construed as being limited to the embodiments described in detail below. The present embodiments are provided to enable those skilled in the art to more fully understand the present invention. Therefore, the shapes and the like of the elements in the drawings can be exaggeratedly expressed to emphasize a clearer description. It should be noted that in the drawings, the same members are denoted by the same reference numerals. Further, detailed descriptions of well-known functions and configurations that may be unnecessarily obscured by the gist of the present invention are omitted.

DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a MOS measuring apparatus of the present invention will be described in detail with reference to the preferred embodiments of the present invention with reference to the accompanying drawings.

3 and 4, the MOS measuring apparatus of the present invention includes an outer chamber 100 spaced a predetermined distance from the ground, an inner chamber 200 and an inner chamber 200 located inside the outer chamber 100, And a control device (300) for testing the sample equipment.

4, the outer chamber 100 includes a body 110 having a predetermined shape opened to the inside, a lid 120 for sealing the body 110, a body 110 and a lid 120 A through hole 140 through which a power supply line and a communication line connected to the standard equipment and the sample equipment are passed and a through hole 140 through which the lower edge of the body 110 passes, And a support 150 for minimizing noise and vibration transmitted from the ground by a predetermined distance from the ground. Between the supports 150, there is a pedestal 160 on which the control device 300 is placed.

Since the outer chamber 100 blocks the noise from the outside through the sound-absorbing plate 130 of the body, only the support 150 is brought into close contact with the ground, so that direct transmission of vibration transmitted from the ground can be minimized.

4, the inner chamber 200 includes a body 210 having a predetermined shape placed on the upper portion of the sound absorption plate of the outer chamber 100, a lid 220 for sealing the body 210, A sound absorbing plate 230 formed on an inner surface of the lid 220 and shielding noise from the outside and a power supply line and a communication line connected to the standard equipment and the sample equipment through the body 210, A hole 240 and an instrument mounting part 250 for mounting standard equipment and sample equipment on the inside of the body and a noise measurement part 260 for measuring an inner noise of the inner chamber 200. Since the inner chamber 200 is placed on the sound absorbing plate 130 of the outer chamber 100 in an unfixed state inside the outer chamber 100, the influence of the vibration transmitted to the inner side of the outer chamber 100 through the ground And the outer noise can be minimized by the sound absorption plate 130 of the outer chamber 100 and the sound absorption plate 230 of the inner chamber 200. [

The apparatus mounting part 250 includes a guide rod 251 positioned in the longitudinal or transverse direction inside the body 210 and a guide rod 251 movably connected to the guide rod 251 at a lower portion thereof, A sample equipment support 253 which is movably connected to the lower portion of the guide rod 251 and on which a sample equipment is placed and a sample equipment support 253 which is connected between the standard equipment support 252 and the sample equipment support 253 And a distance confirming unit 254 for confirming the distance while being positioned. In addition, stoppers 255 and 256 for fixing to the guide rods are disposed on one side of the standard equipment support 252 or the sample equipment support 253.

The dark noise measuring unit 260 includes an insertion groove 261 penetrating the inner chamber 200 and a dark noise measuring unit 262 inserted into the insertion groove 261 to measure the dark noise of the inner chamber 200, And a fixing jig 263 which is located outside the inner chamber 200 where the groove 261 is located and fixes the sound-noise measuring device 262. At this time, the insertion groove 261 is located in the lid 220 of the inner chamber 200, and the fixing jig 263 is moved in the back and forth direction in a semicircular shape so that the outer surface of the sound- It is preferable that the first support portion 264 and the second support portion 265 are made of a metal.

The darkness measuring unit 260 can measure the darkness of the inner chamber 200 before or during the measurement of the sample equipment.

As shown in FIG. 5, the control device 300 is electrically connected to the standard equipment and the sample equipment through a cable to control the degree of sound generated from the standard equipment and the sample equipment, and confirms the input sound. The control device 300 includes a speaker control unit 310 for controlling the sound output from the standard speaker and the experimental speaker, a microphone control unit 320 for confirming the sound received from the standard microphone and the experimental microphone, A comparison unit 340 comparing the sound input from the microphone control unit 320 to determine whether the sample equipment is abnormal, a display unit 330 for displaying a test result, (350). At this time, the comparing unit 340 can compare the information about the sound input from the test microphone with the information set to be output from the standard speaker to check whether the test microphone is abnormal, Can be confirmed by comparing the information with the information set to be output from the experimental speaker. Also, the comparison unit 340 corrects the dark noise measured by the dark noise measuring unit 262. [

The control device 300 can control the sound output from the standard equipment and the sample equipment, thereby accurately checking the performance of the experimental microphone or the experimental speaker.

The operating state of the MOS measuring apparatus according to the present invention will be described below.

A standard speaker or a standard microphone to which a power line and a communication line are connected is fixed to a standard equipment supporter 252 of the equipment mounting part 250 located inside the body 210 of the inner chamber 200 and a sample equipment supporter 253 ) To the power line, the sample speaker to which the communication line is connected, or the sample microphone. Then, the sample equipment pedestal 253 is moved along the guide rods 251 in the forward and backward directions to match the measured distance. At this time, the position of the sample equipment pedestal 253 is confirmed through the distance check unit 254 provided adjacent to the guide rod 251.

Thereafter, the lid 220 of the inner chamber 200 covers the body 210 to block the noise flowing into the inner chamber 200. At this time, the inner noise measuring device 262 ) To check the darkness of the inner chamber (200) before or during the measurement of the sample equipment.

The inner chamber 200 is placed on the body of the outer chamber 100 and the body 110 is covered with the lid 120 of the outer chamber 100 to seal the outer chamber 100. Accordingly, it is possible to prevent the outside noise and vibration from being transmitted to the inside of the inner chamber 200.

When the performance of the test speaker is checked in such a state, the controller 300 outputs sound set by the test speaker and receives a standard micro-output sound. Then, the comparator 340 checks whether the sound input from the standard microphone matches the set sound, and confirms the performance of the test speaker. In addition, when checking the performance of the test microphone, the controller 300 outputs the sound set by the standard speaker and receives the test micro-output sound. The comparator 340 confirms whether the sound input from the test microphone matches the sound output from the standard speaker to check the performance of the test microphone. At this time, if the dark noise measured by the dark noise measurer 262 is corrected to a correction value, the performance of the test speaker or the test microphone can be accurately confirmed.

The embodiments of the MOS measuring apparatus of the present invention described above are merely illustrative and those skilled in the art will appreciate that various modifications and equivalent embodiments are possible without departing from the scope of the present invention. It will be possible. Therefore, it is to be understood that the present invention is not limited to the above-described embodiments. Accordingly, the true scope of the present invention should be determined by the technical idea of the appended claims. It is also to be understood that the invention includes all modifications, equivalents, and alternatives falling within the spirit and scope of the invention as defined by the appended claims.

100: outer chamber 110: body
120: lid 130: sound absorbing plate
140: Through hole 150: Support
160: pedestal 200: inner chamber
210: body 220: cover
230: Sound absorption plate 240: Through hole
250: Equipment mounting part 251: Guide rod
252: Standard equipment stand 253: Sample equipment stand
254: distance checking unit 260: dark noise measuring unit
261: insertion groove 262: dark tone measuring instrument
263: Fixing jig 264: First supporting part
265: second support part 300: control device
310: speaker control unit 320: microphone control unit
330: Noise management unit 340:
350:

Claims (9)

An outer chamber 100 spaced a predetermined distance from the ground;
An inner chamber 200 located inside the outer chamber 100 and having standard equipment and sample equipment built therein;
And a control unit 300 electrically connected to the standard equipment and the sample equipment located in the inner chamber 200 through a cable to control the degree of sound generated in the standard equipment and the sample equipment, ,
The outer chamber 100 includes a body 110 having a predetermined shape opened inside and a lid 120 for sealing the body 110. The outer chamber 100 is formed on the inner surface of the body 110 and the lid 120, A power supply line connected to the standard equipment and the sample equipment, a through hole 140 through which the communication line passes, and a lower edge area of the body 110, And a support 150 for minimizing noise and vibration,
The inner chamber 200 includes a body 210 having a predetermined shape placed on the upper portion of the sound absorbing plate of the outer chamber 100 and a lid 220 for sealing the body 210. The body 210 and the inner surface of the lid 220 A power supply line which is connected to the standard equipment and the sample equipment through the body 210, a through hole 240 through which the communication line passes, and a standard And an equipment mounting part (250) on which the equipment and the sample equipment are mounted. delete The apparatus of claim 1, further comprising a pedestal (160) between the supports (150) of the outer chamber (100) on which the control device (300) is placed. The apparatus according to claim 1, wherein the equipment mounting part (250) comprises a guide rod (251) positioned in the longitudinal or transverse direction inside the body (210), a lower part movably connected along the guide rod (251) A sample equipment pedestal 253 having a lower portion movably connected along the guide rod 251 and having a sample equipment placed thereon, a standard equipment unit 252 and a sample equipment unit 253 And a distance confirming unit (254) for confirming the distance while being positioned between the first and second electrodes. The MOS measurement apparatus according to claim 1, wherein the inner chamber (200) further comprises a dark noise measurement unit (260) for measuring an inner noise of the inner chamber (200). The noise measuring unit 260 includes an insertion groove 261 passing through the inner chamber 200 and a noise measuring unit 262 inserted into the insertion groove 261 to measure the darkness of the inner chamber 200. [ And a fixing jig (263) for fixing the sound level meter (262) while being positioned outside the inner chamber (200) where the insertion groove (261) is located. The stationary jig 263 includes a first support portion 264 and a second support portion 265 that support the outer surface of the sound level meter 262 at one side and the other side while moving in the back and forth direction in a semi- And a MOS transistor. The control unit 300 includes a speaker control unit 310 for controlling sounds output from the standard speaker and the experimental speaker, a microphone control unit 320 for confirming sounds received from the standard microphone and the experimental microphone, A comparator (340) comparing the sound input from the controller (320) to determine whether the sample equipment is abnormal, and a display unit (350) for displaying a test result. The control unit 300 further includes a dark noise management unit 330 that receives the dark noise of the inner chamber 200 measured by the dark noise measurement unit and the comparison unit 340 detects the dark noise of the inner chamber 200 measured by the dark noise measurement unit 262, And the dark noise is corrected.
KR1020150149864A 2015-10-28 2015-10-28 Measuring apparatus of MOS KR101678491B1 (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030069255A (en) * 2002-02-19 2003-08-27 삼성전자주식회사 Checking sound quality and characcteristic of speaker system and method therefor
KR100868972B1 (en) * 2008-04-25 2008-11-17 주식회사 소비코 Portable micro speaker test box
US20100054487A1 (en) * 2008-08-29 2010-03-04 Chi Mei Communication Systems, Inc. Sound insulating device
KR20140126505A (en) * 2013-04-23 2014-10-31 시그마엘텍(주) Speaker test box with hood

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030069255A (en) * 2002-02-19 2003-08-27 삼성전자주식회사 Checking sound quality and characcteristic of speaker system and method therefor
KR100868972B1 (en) * 2008-04-25 2008-11-17 주식회사 소비코 Portable micro speaker test box
US20100054487A1 (en) * 2008-08-29 2010-03-04 Chi Mei Communication Systems, Inc. Sound insulating device
KR20140126505A (en) * 2013-04-23 2014-10-31 시그마엘텍(주) Speaker test box with hood

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