KR101663075B1 - Method for conductivity measurement of conductive material at microwave frequencies using a planar microstrip resonator and device for performing the method - Google Patents

Method for conductivity measurement of conductive material at microwave frequencies using a planar microstrip resonator and device for performing the method Download PDF

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KR101663075B1
KR101663075B1 KR1020150104161A KR20150104161A KR101663075B1 KR 101663075 B1 KR101663075 B1 KR 101663075B1 KR 1020150104161 A KR1020150104161 A KR 1020150104161A KR 20150104161 A KR20150104161 A KR 20150104161A KR 101663075 B1 KR101663075 B1 KR 101663075B1
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conductive material
conductivity
transmission coefficient
error function
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정재영
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서울과학기술대학교 산학협력단
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/005—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing phase or frequency of 2 mutually independent oscillations in demodulators)
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    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
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Abstract

A method of measuring conductivity of a conductive material using a planar microstrip resonator includes the steps of measuring a transmission coefficient of the conductive material using a planar microstrip resonator formed of a conductive material for measuring conductivity; Recording the transmission coefficient of the conductive material measured through full-wave simulation; Generating an error function by comparing the measured transmission coefficient and the recorded transmission coefficient; And deriving a conductivity (?) Of the conductive material from a minimum value of the error function. Thus, the conductivity of a microwave communication frequency band of a thin conductive material can be accurately measured.

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of measuring a conductivity of a conductive material using a planar microstrip resonator and a device for performing the same. 2. Description of the Related Art [0002]

The present invention relates to a method of measuring conductivity of a conductive material using a planar microstrip resonator and an apparatus for performing the same. More specifically, the present invention is applicable to a conductive new material having a small thickness and measures the conductivity of a microwave communication frequency band And a device for carrying out the same.

With the development of wireless communication technology, wireless communication devices are being developed in a wearable form by utilizing wireless body area network (WBAN) communication and IoT (Internet of Things) applications beyond the trend of miniaturization. With the development of such wearable wireless communication devices, studies on RF devices of wearable wireless communication devices are actively under way.

BACKGROUND ART [0002] In recent years, a conductive new material has attracted attention as a material capable of realizing an RF element of such a wearable wireless communication device. Conductive new materials are lighter and more flexible than conventional conductors, and offer lower sheet resistance to deliver high-frequency currents efficiently without loss of resistance.

Such conductive materials include conductive textiles, carbon nanotubes, liquid metal alloys, silver nanowires, and electronic fibers (e-fibers). have.

On the other hand, the most important physical property in the application of the conductive new material is the conductivity. Thus, although a method for measuring the conductivity of conductive fibers and the like has been proposed, only a DC conductivity (or resistivity) can be measured, and an error occurs in measurement of conductivity using a closed resonator for high frequency resistivity measurement. In addition, there is a problem that the accuracy is lowered because the conductivity is calculated from the measurement data by using the equation accompanied by various approximations.

Accordingly, it is necessary to study a method for precisely measuring the conductivity of a thin conductive conductive material in a microwave frequency band.

US 0280871B1 JP 4628116B1 KR 2004-0006952A

SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a method of accurately measuring conductivity of a conductive material using a planar microstrip resonator.

It is another object of the present invention to provide an apparatus for performing an accurate conductivity measurement method of the conductive material.

In order to achieve the object of the present invention, an accurate conductivity measurement method of a conductive material according to an embodiment of the present invention includes: using a planar microstrip resonator formed of a conductive material for measuring an electrical conductivity, measuring a transmission coefficient; Recording the transmission coefficient of the conductive material measured through full-wave simulation; Generating an error function by comparing the measured transmission coefficient and the recorded transmission coefficient; And deriving a conductivity (?) Of the conductive material from a minimum value of the error function.

In an embodiment of the present invention, the step of generating the error function may form an error function using an average magnitude and an average phase in the respective observation bandwidths of the measured transmission coefficient and the recorded transmission coefficient as variables have.

In an embodiment of the present invention, the formulated error function EF is equal to the following equation,

EF =

Figure 112015071539072-pat00001

here,

Figure 112015071539072-pat00002
And
Figure 112015071539072-pat00003
Respectively,
Figure 112015071539072-pat00004
Wow
Figure 112015071539072-pat00005
H and l may represent the index number of the upper and lower bounds of the observation bandwidth, respectively.

In an embodiment of the present invention, the step of deriving the conductivity () of the conductive material may be such that the minimum value of the error function is estimated through a surrogate-based on optimization (SBO) algorithm.

In an embodiment of the present invention, deriving the conductivity () of the conductive material comprises the steps of: generating a kriging model based on a mapping between an error function and a variable of the error function; And estimating a minimum value of the error function using the kriging model.

A computer program for performing an accurate conductivity measurement method of a conductive material using a planar microstrip resonator is recorded in a computer-readable storage medium according to an embodiment of the present invention for realizing the above-described object of the present invention.

According to another aspect of the present invention, there is provided an apparatus for accurately measuring conductivity of a conductive material, including: a planar ring formed on a substrate, the planar ring being spaced from the ring by a predetermined distance, A planar microstrip resonator including two transmission lines formed of a first conductivity type; A measuring unit measuring a transmission coefficient of the conductive material using the planar microstrip resonator; A simulation unit for recording a propagation coefficient of the conductive material through a full-wave simulation; And a conductivity derivation unit for deriving a conductivity? Of the conductive material through an optimization algorithm for the transmission coefficient measured by the measuring unit and the transmission coefficient recorded in the simulation unit.

In an embodiment of the present invention, the transmission lines of the planar microstrip resonator may be formed of copper (Cu).

In an embodiment of the present invention, the conductive material may be a conductive textile, a carbon nanotube, a liquid metal alloy, a silver nanowire, an electronic fiber e- fiber, e-textiles), flexible films, synthetic materials, and plating materials.

In an embodiment of the present invention, the simulation unit may use a high frequency structural simulation program (HFSS).

In an embodiment of the present invention, the conductivity derivation unit may include an error function unit for generating an error function by comparing the measured transfer coefficient and the written transfer coefficient; An estimator for estimating a minimum value of the error function through a surrogate-based on optimization (SBO) algorithm; And an output unit for outputting the conductivity? Of the conductive material from the minimum value of the error function.

In an embodiment of the present invention, the estimator may generate and use a kriging model based on a mapping between an error function and a variable of the error function.

In an embodiment of the present invention, the error function unit may form an error function using the average size and the average phase in the observation bandwidth of each of the measured transmission coefficient and the recorded transmission coefficient as a variable.

In an embodiment of the present invention, the formulated error function EF is equal to the following equation,

EF =

Figure 112015071539072-pat00006

here,

Figure 112015071539072-pat00007
And
Figure 112015071539072-pat00008
Respectively,
Figure 112015071539072-pat00009
Wow
Figure 112015071539072-pat00010
H and l may represent the index number of the upper and lower bounds of the observation bandwidth, respectively.

According to the accurate conductivity measurement method of the conductive material, the transmission coefficient measured through the resonator having a planar microstrip type and the transmission coefficient recorded through the full-wave simulation are compared and analyzed, The conductivity of the material microwave communication frequency band can be accurately measured.

Also, since the surrogate-based on optimization (SBO) algorithm is used, it is possible to accurately measure the conductivity of the conductive material by maximizing the measurement environment without approximation. Further, by measuring the conductivity using a planar microstrip resonator, it is possible to improve the conductivity measurement sensitivity of the thin conductive material, and omitting the sample preparation step for conductivity measurement, thereby reducing the measurement time and the measurement cost.

1 is a block diagram of an apparatus for measuring conductivity of a conductive material according to an embodiment of the present invention.
2 is a configuration diagram of the planar microstrip resonator of FIG.
3 is a block diagram of the conductivity deriving part of FIG.
4 is a flowchart of a method of measuring conductivity of a conductive material according to an embodiment of the present invention.
5 is a graph showing a change in transmission coefficient with respect to a frequency in accordance with a change in conductivity.
FIG. 6 is a graph showing a kriging model generated by each error function.
7 is a graph showing a change in transmission coefficient with respect to a frequency according to a material of a conductive material for manufacturing a microstrip resonator.
8 shows the results of a kriging model according to an error function for each material of a conductive material for manufacturing a microstrip resonator.

The following detailed description of the invention refers to the accompanying drawings, which illustrate, by way of illustration, specific embodiments in which the invention may be practiced. These embodiments are described in sufficient detail to enable those skilled in the art to practice the invention. It should be understood that the various embodiments of the present invention are different, but need not be mutually exclusive. For example, certain features, structures, and characteristics described herein may be implemented in other embodiments without departing from the spirit and scope of the invention in connection with an embodiment. It is also to be understood that the position or arrangement of the individual components within each disclosed embodiment may be varied without departing from the spirit and scope of the invention. The following detailed description is, therefore, not to be taken in a limiting sense, and the scope of the present invention is to be limited only by the appended claims, along with the full scope of equivalents to which such claims are entitled, if properly explained. In the drawings, like reference numerals refer to the same or similar functions throughout the several views.

Hereinafter, preferred embodiments of the present invention will be described in more detail with reference to the drawings.

1 is a block diagram of an apparatus for measuring conductivity of a conductive material according to an embodiment of the present invention. 2 is a configuration diagram of the planar microstrip resonator of FIG. 3 is a block diagram of the conductivity deriving part of FIG.

An apparatus 10 for measuring conductivity of a conductive material according to the present invention is an apparatus for accurately measuring the conductivity of a microwave frequency band of a highly conductive material including a thin conductive material.

Referring to FIG. 1, a device 10 according to the present invention includes a planar microstrip resonator 100, a measurement unit 300, a simulation unit 500, and a conductivity derivation unit 700.

Hereinafter, each configuration of the apparatus 10 will be briefly described, and details of the method for measuring the conductivity of the conductive material according to the present invention will be described in detail with reference to FIG. 4 and the following figures.

2, the planar microstrip resonator 100 includes a planar ring 130 formed on a substrate 110 as a conductive material for measuring conductivity, and a planar ring 130 formed in a bi- And two transmission lines 150 formed.

The microstrip resonator 100 has a low reflection loss and a high quality factor (Q) as compared with a linear resonator. The microstrip resonator 100 applies a local oscillator (LO) signal, which is a microwave (for example, 700 MHz or more) Frequency band.

The substrate 110 may be an FR-4 substrate or a GaAs substrate, and has a predetermined height, width, and length. For example, the height H of the substrate 110 may be 1.6 mm, the width W may be 90 mm, and the length L may be 136 mm.

The ring 130 is comprised of a conductive material of interest. For example, the ring 130 may be a copper (Cu), aluminum (Al) foil, a conductive zelt fabric, or silver-coated e-textiles.

In addition, since the planar microstrip resonator 100 has a large resonance value and is easy to fabricate, the planar microstrip resonator 100 may be formed of a thin conductive fabric, a carbon nanotube, a liquid metal alloy, It is possible to apply various conductive new materials such as silver nanowire, e-fiber, e-textiles, flexible film, synthetic material and plating material.

The ring 130 has a radius R and is formed on the substrate 110. The ring 130 has a certain width, (w l) for having, a radius (R) is 25.9 mm, and the width (w l) of the ring portion 130 of the ring 130 in one example may be 3.2 mm.

The transfer lines 150 are formed on the substrate 110 between the ring 130 and a port (not shown). For example, the transfer lines 150 may be formed to a width formed from a same width as the (w l), copper (Cu) of the ring (130). One of the transmission lines 150 may be used as an input line to which a microwave is input, and the other may be used as an output line to be output.

The transfer lines 150 are spaced apart from the ring 130 by a predetermined distance. The distance between the ring 130 and the delivery lines 150 is the coupling gap, which determines the coupling efficiency. In one embodiment, the distance between the ring 130 and the delivery lines 150 may be 0.64 mm.

The materials and numerical values set forth in the description of the planar microstrip resonator 100 are merely examples, and design modifications are possible if necessary.

The measurement unit 300 measures the transmission coefficient of the conductive material using the planar microstrip resonator 100. Since the planar microstrip resonator 100 is usable in a microwave communication frequency band and is formed in a planar shape on the substrate 110, it is efficient in measuring the conductivity of thin conductive fibers. Therefore, in the present invention, Is used.

The simulation unit 500 records the transmission coefficient of the conductive material through a full-wave simulation. The simulation unit 500 can measure a propagation coefficient using a high frequency electromagnetic field analysis program, for example, a high frequency structural simulator (HFSS).

The conductivity deriving unit 700 derives the conductivity? Of the conductive material through an optimization algorithm with respect to the transmission coefficient measured by the measuring unit 300 and the transmission coefficient recorded in the simulation unit 500. [

3, the conductivity deriving unit 700 may include an error function unit 710, an estimating unit 730, and an output unit 750.

The error function unit 710 compares the transfer coefficient measured by the measurement unit 300 and the transfer coefficient stored in the simulation unit 500 to generate an error function. The error function can formulate an error function using the average size and the average phase in the respective observation bandwidths of the measured transmission coefficient and the recorded transmission coefficient as variables.

The estimator 730 may estimate the minimum value of the error function using a surrogate-based on optimization (SBO) algorithm. The estimator 730 can accurately measure the conductivity of the conductive material by maximally reflecting the measurement environment using an optimization algorithm.

Optimization algorithms are used to find solutions to nonlinear electromagnetic problems by intelligently selecting the best sampling and evaluation strategies to provide an efficient iterative scheme. For example, a Matlab toolbox can be used, which can generate a kriging model (i.e. a Gaussian regression model) based on an approximate mapping of error functions and variables.

The kriging model is based on information obtained from computer experiments as one of the interpolation techniques. The kriging model very well approximates a nonlinear system and optimizes the required parameters through the MLE process.

 The output unit 750 outputs the conductivity? Of the conductive material from the minimum value of the error function.

The device 10 may be a separate terminal or some module of the terminal. The configuration of the planar microstrip resonator 100, the measurement unit 300, the simulation unit 500, and the conductivity deriving unit 700 may be integrated or formed of one or more modules. However, conversely, each configuration may be a separate module.

The device 10 may be mobile or stationary. The device 10 may be in the form of a server or an engine and may be a device, an apparatus, a terminal, a user equipment (UE), a mobile station (MS) a wireless device, a handheld device, and the like.

4 is a flowchart illustrating a method of measuring conductivity of a conductive material using a planar microstrip resonator according to an embodiment of the present invention.

The conductivity measurement method of the conductive material using the planar microstrip resonator according to the present embodiment can be performed in substantially the same configuration as that of the device 10 of FIG. 1 and the planar microstrip resonator 100 of FIG. Therefore, the same components as those of the device 10 of Fig. 1 and the planar microstrip resonator 100 of Fig. 2 are denoted by the same reference numerals and repeated explanation is omitted.

In addition, the conductivity measurement method of the conductive material using the planar microstrip resonator according to the present embodiment can be implemented by software (application) for conducting the conductivity measurement of the conductive material using the planar microstrip resonator.

Referring to FIG. 4, a method of measuring conductivity of a conductive material using a planar microstrip resonator according to an embodiment of the present invention includes: using a microstrip resonator including a planar ring formed of a conductive material for measuring conductivity, The transmission coefficient of the material is measured (step S100).

The planar microstrip resonator has a low reflection loss and a high quality factor Q as compared with the linear resonator and applies LO (Local Oscillator) signal of microwave (for example, 700 MHz or more) Frequency band.

In addition, the planar ring is formed of a conductive material of interest, that is, a conductive material for which the conductivity is to be measured. Since the ring is formed flat on the substrate, it is preferable to use a thin conductive plastic material such as a conductive textile, a carbon nanotube, a liquid metal alloy, a silver nanowire, e-fiber, e-textiles), flexible films, synthetic materials, and plated materials.

Meanwhile, the transmission coefficient of the conductive material measured through full-wave simulation is recorded (step S300). At this time, the propagation coefficient can be measured using a high frequency electromagnetic field analysis program, for example, a high frequency structural simulator (HFSS) can be used.

In the simulation process, the transmission coefficients (S 21 ) change due to the change in conductivity () of the ring of the planar microstrip resonator.

FIG. 5 shows a change in the magnitude of the transmission coefficient S 21 with respect to the frequency conversion according to the change in conductivity (). The conductivity (sigma) changes from 10 5 to 10 8 S / m at intervals of 10 0.125 .

Referring to FIG. 5, as the conductivity () increases, the transmission coefficient S 21 also increases, indicating that there is a correlation between the conductivity () and the transmission coefficient S 21 . In addition, it can be seen that as the conductivity () increases, the peak sharper and the transmission coefficient S 21 increases (i.e., the quality factor Q increases).

On the other hand, recent studies have demonstrated a way to measure dielectric constants and loss tangents through comparison in optimized algorithms for measured data and simulated data.

Thus, in the present invention, the conductivity is measured through the transmission coefficient and the above-described method. The present invention measures the conductivity of a conductive material by comparing a transmission coefficient measured through a planar microstrip resonator with a simulated transmission coefficient.

The measured transmission factor is compared with the recorded transmission factor to generate an error function (step S500).

The step of generating the error function (step S500) may be formulated to obtain an accurate result. Equations (1) to (4) below are the first to fourth error functions according to the embodiments of the present invention.

[Equation 1]

EF 1 =

Figure 112015071539072-pat00011

&Quot; (2) "

EF 2 =

Figure 112015071539072-pat00012

&Quot; (3) "

EF 3 =

Figure 112015071539072-pat00013

&Quot; (4) "

EF 4 =

Figure 112015071539072-pat00014

here,

Figure 112015071539072-pat00015
Wow
Figure 112015071539072-pat00016
Quot; means a loaded quality factor,
Figure 112015071539072-pat00017
Wow
Figure 112015071539072-pat00018
Respectively,
Figure 112015071539072-pat00019
Wow
Figure 112015071539072-pat00020
The simulation transfer coefficient and the measured transfer coefficient.

In the case of the fourth error function ( EF 4 ), the magnitude and the arithmetic average value of the transfer coefficient (S 21 ) of the observation bandwidth are used as variables, and h and l indicate the index number of the upper limit and lower limit of the observation bandwidth, respectively. For example, for an observation bandwidth of 40 MHz, the frequency is set to 41 points, where h and l are the sample index numbers that are 20 Mhz higher and lower than the resonator frequency, respectively.

When the error function is generated, the conductivity? Of the conductive material is derived from the minimum value of the error function (step S700). At this time, the minimum value of the error function can be estimated through a surrogate-based on optimization (SBO) algorithm.

Optimization is a method of generating a kriging model from a small number of test points and calculating a kriging model every time a value of the original function is required according to an optimization algorithm. In the present invention, in order to efficiently find a conductivity value, The error function is designed by comparing the transmitted and simulated transfer coefficients, and the minimum value of the designed error function is measured.

6 is a graph showing a kriging model generated by the first through fourth error functions, respectively. In the simulation process, the conductivity (σ) of the microstrip ring finally expected in the optimization process is set to 10 5.6 = 3.98 · 10 5 S / m.

6A to 6D, the minimum value of each error function is 10 5.78 ( 6.10 5 S / m), 10 5.54 (3.47 10 5 S / m), 10 5.65 5 S / m), and 10 5.6 (3.98 · 10 5 S / m).

In the following, a fourth error function ( EF 4 ) is used to obtain the conductivity (?) Of the conductive material by using the magnitude and phase of the transmission coefficient (S 21 ).

In order to verify the effect of the present invention, a copper foil, an aluminum foil, a conductive zelt fabric, and silver-coated e-textiles were respectively laminated on the FR-4 substrate The conductivity was measured using a planar microstrip resonator constituted by a ring.

7 is a graph showing a change in transmission coefficient with respect to a frequency according to a material of a conductive material for manufacturing a microstrip resonator.

Referring to FIG. 7, copper (Cu) has the highest transmission coefficient (S 21 ), and copper (Cu) has a conductivity (sigma) of 5.8 · 10 7 S / it is possible to adjust the transmission coefficient (S 21) of another material in the measurement and simulation using the transmission coefficient (S 21) in the (Cu). The adjusted data can be processed by the SBO toolbox.

The results of the kriging model based on the fourth error function ( EF 4 ) are shown in FIG.

8A to 8C, the conductivity (σ) of a fourth error function ( EF 4 ) in an aluminum (Al) foil, a conductive zelt fabric, and a silver- ) Are located at 10 5.84 (6.92 · 10 5 S / m), 10 5.36 (2.29 · 10 5 S / m) and 10 5.54 (3.47 · 10 5 S / m), respectively. This indicates that the measured conductivity values of the conductive Zelt fabric and the silver-coated e-textiles are similar to those provided by the manufacturer and previously performed experiments have.

The present invention utilizes a microstrip resonator and an optimization algorithm to measure the conductivity of a conductive material, and can accurately predict the conductivity value by comparing and analyzing measurement data with simulation data.

In addition, the conductivity of the microwave communication frequency band can be measured, and the data can be efficiently compared and analyzed through optimization techniques involving iterative circulation algorithms. Furthermore, it is possible to save time and cost by using a planar microstrip resonator that is easy to fabricate and sample the material, and it is possible to improve the design efficiency of the antenna and the high frequency component by securing accurate information about the conductivity.

Such a conductive material conductivity measurement method using a planar microstrip resonator can be implemented in an application or can be implemented in the form of program instructions that can be executed through various computer components and recorded on a computer-readable recording medium. The computer-readable recording medium may include program commands, data files, data structures, and the like, alone or in combination.

The program instructions recorded on the computer-readable recording medium may be ones that are specially designed and configured for the present invention and are known and available to those skilled in the art of computer software.

Examples of computer-readable recording media include magnetic media such as hard disks, floppy disks and magnetic tape, optical recording media such as CD-ROMs and DVDs, magneto-optical media such as floptical disks, media, and hardware devices specifically configured to store and execute program instructions such as ROM, RAM, flash memory, and the like.

Examples of program instructions include machine language code such as those generated by a compiler, as well as high-level language code that can be executed by a computer using an interpreter or the like. The hardware device may be configured to operate as one or more software modules for performing the processing according to the present invention, and vice versa.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the present invention as defined by the following claims. You will understand.

The conductivity measurement method using the conventional resonator measures the conductivity of the dielectric material from the resonance frequency, the insertion loss, and the half power. However, the present invention can conduct the conductivity measurement quickly and accurately using the conductivity measurement method using the SBO. In addition, by measuring the conductivity using a planar microstrip resonator, it is possible to improve the conductivity measurement sensitivity of the thin conductive material, and the sample preparation step for conductivity measurement can be omitted.

In addition to RF devices, conductive materials are also being studied for electronic components, devices, multifunctional clothing, and interior products such as wearable computers, sensors, and batteries. Conductive material conductivity measurement methods Demand and market are expected to increase steadily.

Furthermore, it is expected that the conductivity can be accurately measured not only for the conductive fibers coated on the metal but also for the conductive new materials made of a variety of materials.

10: Conductivity measuring device of conductive material
100: planar microstrip resonator
300:
500: Simulation section
700: Conductivity deriving part
710: error function part
730:
750: Output section

Claims (5)

Measuring a transmission coefficient of the conductive material using a planar microstrip resonator formed of a conductive material for measuring conductivity;
Recording the transmission coefficient of the conductive material measured through full-wave simulation;
Generating an error function by comparing the measured transmission coefficient and the recorded transmission coefficient; And
And deriving a conductivity (?) Of the conductive material from a minimum value of the error function. A method for measuring conductivity of a conductive material using a planar microstrip resonator.
2. The method of claim 1, wherein generating the error function comprises:
Wherein the error function is formulated by using the average size and the average phase in the respective observation bandwidths of the measured transmission coefficient and the recorded transmission coefficient as variables.
The method of claim 1, wherein deriving the conductivity (?) Of the conductive material comprises:
Estimating a minimum value of an error function based on a mapping between an error function and a variable of the error function.
A microstrip resonator including a planar ring formed on a substrate as a conductive material for measuring a conductivity and two transmission lines spaced apart from the ring by a predetermined distance in both directions;
A measuring unit for measuring a transmission coefficient of the conductive material by using the microstrip resonator;
A simulation unit for recording a propagation coefficient of the conductive material through a full-wave simulation; And
And a conductivity derivation unit for deriving a conductivity? Of the conductive material through an optimization algorithm for the transmission coefficient measured by the measuring unit and the transmission coefficient recorded by the simulation unit.
5. The method of claim 4,
Wherein the conductive lines of the planar microstrip resonator are formed of copper and the conductive material is selected from the group consisting of conductive textiles, carbon nanotubes, liquid metal alloys, a conductive material conductivity measuring device, which is one of a silver nanowire, an e-fiber, a flexible film, a synthetic material, and a plating material.
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KR20140072827A (en) * 2012-12-05 2014-06-13 톰슨 라이센싱 Radio frequency device with compensation of permittivity dispersion of the substrate and adjustment method

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