KR101647352B1 - Paint for measuring deformation of structure, tape comprising the same and deformation measuring method of structure using the same - Google Patents
Paint for measuring deformation of structure, tape comprising the same and deformation measuring method of structure using the same Download PDFInfo
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- KR101647352B1 KR101647352B1 KR1020090017317A KR20090017317A KR101647352B1 KR 101647352 B1 KR101647352 B1 KR 101647352B1 KR 1020090017317 A KR1020090017317 A KR 1020090017317A KR 20090017317 A KR20090017317 A KR 20090017317A KR 101647352 B1 KR101647352 B1 KR 101647352B1
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- H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
- H01F1/0036—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties showing low dimensional magnetism, i.e. spin rearrangements due to a restriction of dimensions, e.g. showing giant magnetoresistivity
- H01F1/0045—Zero dimensional, e.g. nanoparticles, soft nanoparticles for medical/biological use
- H01F1/0063—Zero dimensional, e.g. nanoparticles, soft nanoparticles for medical/biological use in a non-magnetic matrix, e.g. granular solids
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Abstract
The present invention relates to a paint for deformation measurement of a structure, a tape including the same, and a method for measuring a deformation of a structure using the same. More specifically, the paint for deformation measurement of a structure according to the present invention facilitates deformation and degree of deformation It can be usefully used for measuring deformation of a structure by containing a magnetic photonic crystal.
Further, according to the present invention, the deformation and deformation degree of a structure caused by a working load and the like can be easily measured, so that occurrence of a safety accident due to excessive deformation of the structure can be prevented in advance.
Magnetic photonic crystal cluster, structure color, magnetic flux, structure, measurement method of strain
Description
The present invention relates to a coating material for deformation measurement, a tape including the same, and a method for measuring deformation of a structure using the same.
The structure is deformed due to the use load during public use. Such deformation is caused by a combination of various loads and loads. Measuring the deformation due to the load, which has been received by the structure, is a very important basis for judging the condition of the structure.
Recently, the development of a method for measuring the deformation of such a structure has been continuously studied. However, a method of measuring the deformation of such a structure has been conducted by using an electric device, It is difficult to immediately respond to the deformation of the structure, which is troublesome.
On the other hand, in the case of structures related to construction, civil engineering, or mechanical structures such as aircraft and ships, it is necessary to periodically measure deformation to prevent safety accidents that may be caused by excessive deformation of the fragile portion by the use load, There is a problem that it is difficult to measure the replacement or repair time by measuring the degree of deformation.
Therefore, there is an increasing need to estimate the replacement period or the repair period of the structure by measuring the degree of deformation as well as the deformation by a more convenient method.
That is, in the past, since deformation of a structure was measured by using a foil-type deformation measuring apparatus which mainly uses a change in electric resistance, it was difficult to identify the deformation immediately when deformation occurred. In order to measure the degree of deformation accurately, There has been a problem in preventing safety accidents due to the deformation of the structure because it is necessary to measure the deformation of the structure using an electric device.
The present invention has been made to satisfy the above-mentioned technical development necessity, and it is an object of the present invention to make it possible to visually check whether a deformation occurs in the outside in response to a deformation of a structure, It is an object of the present invention to provide a paint for measuring the deformation of a structure.
Another object of the present invention is to provide a method of measuring the degree of deformation and deformation of a structure by simply attaching the same to a surface of a structure to be measured, And a tape for measuring the deformation of the structure.
It is still another object of the present invention to provide a method of measuring deformation of a structure that measures deformation and degree of deformation of a structure using the paint.
Means for Solving the Problems The present invention provides, as means for solving the above-mentioned problems, a magnetic recording medium comprising: a first dielectric containing a magnetic material; And a second dielectric material having a dielectric constant different from that of the first dielectric material is uniformly arranged in a lattice pattern.
The present invention also provides, as another means for solving the above problems, a substrate comprising: a substrate; And a structure deformation measuring tape, which is formed on the surface of the substrate and includes a coating layer containing the coating material according to the present invention
According to another aspect of the present invention, there is provided a method for manufacturing a semiconductor device, comprising: a first step of forming a coating material according to the present invention on a surface of a substrate; A second step of placing the base material on which the painted material is formed on the surface of the deformation target structure; And a third step of measuring a structural color change or magnetic flux change of the paint.
According to the present invention,
First, it is possible to visually confirm the deformation of various industrial structures easily and easily without using complicated electric devices, and it is possible to accurately measure the strain of the structure by measuring the magnetic flux change with a simple method.
Secondly, it is possible to accurately measure the deformation of the structure and the deformation degree of the structure through the change of the structural color and the magnetic flux as described above, so that it is possible to easily confirm the deformation and furthermore, Therefore, it is possible to prevent the occurrence of safety accidents due to excessive deformation of the structure.
Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. Prior to this, terms and words used in the present specification and claims should not be construed as limited to ordinary or dictionary terms, and the inventor should appropriately interpret the concepts of the terms appropriately It should be interpreted in accordance with the meaning and concept consistent with the technical idea of the present invention based on the principle that it can be defined.
Therefore, the embodiments described in the present specification and the configurations shown in the drawings are merely the most preferred embodiments of the present invention and are not intended to represent all of the technical ideas of the present invention. Therefore, various equivalents It should be understood that water and variations may be present.
Hereinafter, a paint for deformation measurement of a structure according to an embodiment of the present invention and a method for measuring deformation of a structure using the same will be described with reference to FIG. 1 to FIG.
The structure deformation measuring paint according to the present invention comprises a first dielectric containing a magnetic material; And a second dielectric material having a dielectric constant different from that of the first dielectric material is uniformly arranged in a lattice pattern.
Here, the photonic crystal refers to a material having a structure capable of utilizing the optical properties of the material or having a structure. That is, the photonic crystal forms a lattice structure composed of two or more dielectrics spatially repeating with a periodicity of about half a wavelength of light.
Hereinafter, the photonic crystal used in the present invention will be described in more detail.
In general, the color of an object is the color of the wavelength of the light reflected in the visible light reaching the object. When all the wavelengths of light are together, the visible light is a bright and transparent color, and the reason for this interference is that the light is a particle as well as a wave nature.
At this time, the light of the wavelength causing the destructive interference is extinguished and the light of the wavelength causing the constructive interference is reflected. If the reflected light is blue, it appears blue even though there is no blue.
In this way, the color that is colored by physical phenomena such as light diffraction, interference, scattering phenomenon is called structure color. Such a structure color is not caused by actual pigment, but color appears due to interference due to thin film reflection of soap bubble .
Among the materials with structural color, when they are enlarged by an electron microscope, regular arrangement appears. When light is shined on this material, only light of a specific wavelength is reflected and the rest passes through. Such a geometric structure is called a photonic structure, and a photonic crystal in which the optical structure is laid out in three dimensions with regular arrangement is called a photonic crystal.
In the present invention, the photonic crystal is formed by uniformly arranging a first dielectric containing a magnetic substance and a second dielectric having a different relative dielectric constant from the first dielectric, according to a lattice pattern.
Referring to FIG. 1, the first dielectric and the second dielectric are arranged in a regular pattern according to a lattice pattern. The magnetic photonic crystal according to the present invention includes a first dielectric and a second dielectric, Means that the dielectric and the second dielectric are regularly arranged at intervals of D1.
Therefore, when the particle interval between the first dielectric material and the second dielectric material is changed to D2 due to the deformation at a specific portion of the coating material as shown in FIG. 1 (b), the uniformly arranged photonic crystal structure is deformed, The reflected light of the portion where the deformation of the photonic crystal structure occurs is affected.
Therefore, the arrangement interval of the photonic crystal structure is changed, so that the gap between the first and second dielectric materials constituting the photonic crystal structure is changed, so that an optical change occurs. Thus, the reflection light of a specific wavelength And reflects light of other wavelengths.
Therefore, in the portion where the deformation occurs, light of a different wavelength is reflected according to the characteristics of the photonic crystal, and thus a color different from that of the former structure color is displayed.
The structure deformation measuring paint according to the present invention makes use of the characteristics of the photonic crystal. More specifically, the principle of the photonic crystal is as follows. An electromagnetic wave (or light) has an angular frequency (ω = 2π f ) (wave number, k = 2 pi [lambda] 0 ) can be given by the following equation (1), which is referred to as a "photon dispersion relation" in the present invention.
Where c is the speed of light.
2, since (c / n) is used in place of the velocity c of the light of the formula (1) in the substance (A) having the refractive index n, the frequency (f) I have.
However, the linear function relation is broken in the material (B) having a non-uniform refractive index according to the deformation of the gap. When the dielectric constant or the refractive index of the material periodically changes as shown in FIG. 2, It can not be maintained and changed into a nonlinear function relation.
Here, the specific angular velocity region (G) is a discontinuous function because it does not have a one-to-one correspondence with the wave number, and the light in the frequency region of such discontinuity is not in a functional relationship with any wave number of the x-axis in the material of the corresponding structure.
Therefore, when the light having the frequency corresponding to the discontinuous region is incident on the plate having the constant refractive index in the vertical direction, no wave number can exist, and therefore, the light does not enter the inside and is completely reflected. This angular velocity (or frequency) region is called a photonic band gap (photonic band gap), and the photonic crystal has a photonic band gap like this.
The position of the photonic bandgap changes depending on the refractive index difference or the period of the photonic crystal.
That is, if the period of the photonic crystal is repeated even in the case of finding a photonic band gap or a light dispersion relation for a material having a complicated structure, the solution of the Maxwell equation explaining the macroscopic behavior of the electromagnetic wave is obtained, The optical dispersion of a given material can be obtained by calculating the frequency of the eigenmode obtained as a function of the wavenumber vector in the propagation direction.
Therefore, the structure deformation measuring paint of the present invention includes a photonic crystal having a first dielectric and a second dielectric arranged in a lattice pattern in a predetermined period so as to reflect light of a specific wavelength, When deformation occurs in a part of the structure, since the structural color is different depending on the characteristics of the photonic crystal, it is possible to visually confirm the deformation of the structure immediately.
On the other hand, the magnetic substance contained in the first dielectric refers to a substance through which a magnetic flux representing a magnetic flow flows, and a ferromagnetic substance refers to an object through which such magnetic flux flows more easily.
When a defect occurs in the path (magnetic path) through which the magnetic flux flows, deformation of the magnetic flux occurs to avoid defects. As shown in FIG. 3, deformation of the surface of the ferromagnetic material uniformly arranged at regular intervals The magnetic flux in the shallow surface layer leaks into the space above the surface of the ferromagnetic body.
Therefore, in the case of measuring the magnetic flux leaking into the space of the defective portion where the deformation occurs, the amount of change of the magnetic flux can be confirmed. That is, when the magnetic material arranged at regular intervals changes in spacing due to a certain deformation, the degree of deformation can be accurately measured by measuring the amount of change of the magnetic flux at the corresponding portion.
Accordingly, in the case of measuring the strain of a structure using a coating material including magnetic materials arranged at regular intervals as in the present invention, the degree of deformation of the structure can be easily and accurately measured by using a simple magnetic force detector or the like.
Therefore, in the case of measuring the deformation of the structure including the magnetic photonic crystal having both the characteristics of the photonic crystal and the characteristics of the magnetic body, the coating material deformation measuring paint according to one embodiment of the present invention is characterized in that, Not only can we measure qualitative results, but we can also use magnetic materials to measure both quantitative results for exact strain.
That is, the magnetic photonic crystal is included in the composition for deformation measurement of the structure, and when the gap between the particles is changed, the magnetic photonic crystal is arranged at regular intervals so as to change the structure color and magnetic flux, thereby exhibiting both advantages of the photonic crystal and the magnetic body.
The size of the first dielectric material is not particularly limited and may be a particle size that can be conventionally applied to form a photonic crystal in this field depending on the use purpose and is not particularly limited. For example, May be 80 to 200 nm.
If the average diameter of the first dielectric material is less than 80 nm, it may be difficult to observe the degree of deformation in the naked eye, and if the average diameter exceeds 200 nm, it enters the IR area. It may be difficult to observe changes in light with the naked eye.
Also, the interval between the first dielectric and the second dielectric is not particularly limited, but may be, for example, 1 nm to 2 nm.
When the distance between the particles is out of the numerical range, it may become difficult to fill the magnetic material between the magnetic material (eg, polydimethylsiloxane) and the degree of change of the structure.
The material used for the first dielectric material may include any material capable of forming photonic crystals as described above, and the kind thereof is not particularly limited. For example, styrene, (meth) acrylic acid ester And (meth) acrylamide can be used as the polymer or polysiloxane.
More specifically, for example, the first dielectric material may be at least one selected from the group consisting of polystyrene, polyalpha methyl styrene, polyacrylate, polymethyl methacrylate, polybenzyl methacrylate, polyphenyl methacrylate, poly-1-methacyclohexyl methacrylate , Polycyclohexyl methacrylate, polychlorobenzyl methacrylate, poly-1-phenylethyl methacrylate, poly-1,2-diphenylethyl methacrylate, polydiphenylmethyl methacrylate, At least one member selected from the group consisting of acrylate, methacrylate, acrylate, acrylate, acrylate, acrylate, acrylate, acrylate, And preferably polystyrene.
Since polystyrene has a glass transition temperature of 95 占 폚 at which the physical properties of the polymer are changed, it can be used universally without being influenced by changes in the ambient temperature and has an advantage of being durable because it has resolution at 320 to 330 占 폚 or more. Can be preferably used as a substance contained in a coating material to be coated for measuring deformation.
Furthermore, more preferably, the first dielectric may be an amphipathic polystyrene / alkyl acrylate block copolymer.
For example, a polystyrene / alkyl acrylate block copolymer synthesized by reacting polystyrene with an alkyl acrylate is excellent in strength and can be provided with excellent durability when applied on the surface of a structure in the form of a paint or an adhesive And an amphipathic polystyrene / alkyl acrylate block copolymer can be obtained by subjecting the polystyrene / alkyl acrylate block copolymer synthesized by the atom transfer radical polymerization to a hydrolysis reaction.
The amphipathic polystyrene / alkyl acrylate block copolymer may contain 5 to 50 parts by weight of methyl acrylate per 100 parts by weight of polystyrene, preferably 10 parts by weight of methyl acrylate per 100 parts by weight of polystyrene By weight to 12 parts by weight.
When the methyl acrylate is contained in an amount of less than 5 parts by weight based on 100 parts by weight of the polystyrene, repulsion of the surface of the negatively charged particles may be reduced and the arrangement may be difficult in a photonic crystal form. If the methyl acrylate is contained in an amount exceeding 50 parts by weight , The chains may become too long to cause entanglement.
On the other hand, the molecular weight of the polystyrene / alkyl acrylate block copolymer is not particularly limited, but is preferably 20,000 to 30,000.
When the molecular weight is less than 20,000, it may be difficult to make nanoparticles having an average particle diameter of 80 nm or more, which may deteriorate its usefulness. When the molecular weight exceeds 30,000, nanoparticles having an average particle diameter of 300 nm or more are produced, have.
In addition, the magnetic material contained in the first dielectric material may include all of the particles exhibiting magnetism and is not particularly limited. For example, the magnetic material may be at least one selected from a magnetic material or a magnetic alloy.
The magnetic material or magnetic alloy is if the material exhibiting magnetism that kind is not particularly limited, for example, as the magnetic material is Co, Mn, Fe, Ni, Gd, Mo, MM '2 O 4, and M x O y wherein M and M 'each independently represent Co, Fe, Ni, Mn, Zn, Gd or Cr and 0 <x? 3, 0 <y? Lt; / RTI >
Examples of the magnetic alloy include at least one selected from the group consisting of CoCu, CoPt, FePt, CoSm, NiFe, and NiFeCo
In addition, the magnetic body may be formed by coating a cluster-type ferromagnetic nanoparticle with a hydrophilic material.
When the magnetic body is formed of a cluster-like aggregate, the magnetic efficiency can be further improved and the change of the magnetic flux can be made easier than the measurement. When the hydrophilic substance is coated on the cluster type ferromagnetic nanoparticles, It may be easy to arrange them at regular intervals.
On the other hand, the ferromagnetic nanoparticles may include at least one selected from the group consisting of iron, manganese, and cobalt, although the ferromagnetic nanoparticles may include any magnetic material particularly strong among the magnetic materials and are not particularly limited.
The ferromagnetic nanoparticles are obtained by thermally decomposing the initial magnetic nanoparticle seeds using a solvent having a high boiling point, and can exhibit high crystallinity and magnetic properties.
The ferromagnetic nanoparticles may be obtained by mixing a magnetic nanoparticle seed and a nanoparticle precursor in a solvent.
Here, the solvent is not particularly limited, and solvents known in this field can include all solvents that can be used for preparing the ferromagnetic nanoparticles, and include, but are not limited to, organic surface stabilizers The nanoparticle precursor may be injected to coordinate the organic surface stabilizer on the surface of the nanoparticles and may have a high boiling point close to the pyrolysis temperature of the complex having the organic surface stabilizer coordinated on the surface of the nanoparticles.
As the organic surface stabilizer, various materials known in this field can be used, and examples thereof include alkyl trimethyl halide and the like.
More specifically, the solvent may be an ether compound such as octyl ether, butyl ether, hexyl ether, decyl ether or phenyl ether, a heterocyclic compound such as pyridine or tetrahydrofuran (THF), a toluene, xylene, mesitylene , Or aromatic compounds such as benzene: sulfoxide compounds such as dimethylsulfoxide (DMSO); Amide compounds such as dimethylformamide (DMF); Octyl alcohol, or an alcohol such as decanol; Hydrocarbons having 1 to 20 carbon atoms such as pentane, hexane, heptane, octane, nonane, decane, dodecane, tridecane, tetradecane, pentadecane or hexadecane, Dimethylformamide, tetrahydrofuran, and the like.
For example, the magnetic nanoparticle seeds may include FePt (an alloy of iron and platinum), Co, and the like. The magnetic nanoparticle seed may include any material that can be used as a magnetic nanoparticle seed, Mn, Fe, Ni, Gd and Mo may be used.
In addition, the nanoparticle precursor may include any material that can be used as a precursor of the nanoparticles, and the kind thereof is not particularly limited, but may be selected from the group consisting of a metal, -CO, -NO, -C 5 H 5 , an alkoxide or a ligand And a metal carbonyl compound such as iron pentacarbonyl, Fe (CO) 5 , ferrocene or manganese carbonyl (Mn 2 (CO) 10 ) , Metal acetylacetonate compounds such as iron acetylacetonate (Fe (acac) 3 ), metal salts containing metals and metal ions combined with anions such as Cl - or NO 3 - .
Preferably, the nanoparticle precursor is selected from the group consisting of iron pentacarbonyl, ferrocene, manganese carbonyl, iron acetylacetonate, iron trihydrochloride (FeCl 3 ), iron chloride (FeCl 2 ), iron nitrate NO 3 ) 3 ).
The ferromagnetic nanoparticles as described above can be synthesized through various methods known in the art and are not particularly limited. For example, the ferromagnetic nanoparticles can be synthesized by thermal decomposition.
In addition, the hydrophilic material may include any substance that is negatively charged or positively charged and can generate a repulsive force between the particles, and the kind thereof is not particularly limited. For example, silica, polyalkylene glycol, polyetherimide , Polyvinyl pyrrolidone, hydrophilic polyamino acid, and hydrophilic vinyl-based polymer resin.
When such a hydrophilic substance is coated on the ferromagnetic nanoparticles, the arrangement of the magnetic substances can be made easier.
On the other hand, the second dielectric material may have a dielectric constant different from that of the first dielectric material, and may include all the particles capable of forming a photonic crystal structure like the first dielectric material described above. no.
The content, the molecular weight, and the average particle diameter of the material used as the second dielectric material can be appropriately selected and exemplified for the first dielectric material, and are not particularly limited.
The present invention also relates to a substrate; And a coating layer formed on the surface of the substrate and containing the coating material of the present invention.
The tape may include any conventional tape that can be used for structure measurement, and is not particularly limited, but preferably a stress-sensitive tape may be used.
That is, when the tape sensitive to stress is used as described above, the paint is uniformly applied to one surface and the other surface is attached to the surface of the structure. Therefore, when the structure is deformed, The first dielectric and the second dielectric included in the paint change the inter-particle spacing, thereby changing the structural color and flux of the deformed portion.
When the tape for measuring the deformation of the structure is attached to the structures of various industrial fields and used for measuring the deformation of the structure, deformation and deformation degree of the structure can be easily and easily measured.
Here, the thickness of the coating layer formed on the surface of the substrate is not particularly limited, and may be formed to various thicknesses within a range in which the structural color can be confirmed, but may preferably be formed to a thickness of 5 to 10 탆.
If the thickness of the coating layer is less than 5 탆, the intensity of the photonic crystal may not be observed. If the thickness exceeds 10 탆, the sensitivity of the photonic crystal may be affected and the photonic crystal characteristic may not be exhibited .
In addition, the present invention relates to a method for manufacturing a semiconductor device, comprising: a first step of forming a coating material on a surface of a substrate; A second step of placing the base material on which the painted material is formed on the surface of the deformation target structure; And a third step of measuring a structural color change or magnetic flux change of the coating material.
According to the method for measuring deformation of a structure according to an embodiment of the present invention, first, a paint containing the magnetic photonic crystal as described above is prepared, and the paint is formed on the surface of the base material.
The magnetic photonic crystal can be produced by arranging the particles constituting the magnetic photonic crystal through a method known in the art at regular intervals, and the method for manufacturing the magnetic photonic crystal is not particularly limited.
For example, in the case of a one-dimensional photonic crystal structure, a first dielectric and a second dielectric having different relative dielectric constants can be easily formed by layering in a lattice pattern (refer to Korean Patent Laid-open Publication No. 10-2005-0082790) Other methods for forming two-dimensional and three-dimensional photonic crystal structures can also be realized by appropriately employing methods known in the art (see Korean Patent Laid-open Nos. 10-2005-0070002 and 10-2006-0092396). In particular, a silica sphere method can be used as an example of a method of fabricating a three-dimensional photonic crystal structure. Specifically, the photonic crystal lattice pattern can be formed using a known self-assembly method (Korean Patent Laid-Open Nos. 10-2003-0083913, 10-2005-0082515, 10-2007-0044623, 10- 2007-0049548, No. 10-2008-0109229), or by aligning the magnetic field by transmitting a magnetic field at a certain distance using the magnetic field alignment characteristic of a known magnetic body (refer to Korean Patent Open No. 10-2005-0007731, No. 10-2006-0054115, No. 10-2006-0107325, No. 10-2007-0112429, No. 10-2008-0006478, No. 10-2008-0013366) , Intergranular spacing (e.g., 1 to 2 nm) can be easily controlled by adjusting the particle size or controlling the intensity of the magnetic field.
On the other hand, the type of the substrate is not particularly limited, and may be various materials that can be attached to a structure such as a tape. Therefore, in the first step of the present invention, the coating material can be applied uniformly on the substrate.
Then, the second step can adhere the substrate to the surface of the structure to be measured.
Here, the deformation measurement target structure means a target structure to be deformed.
Thus, when the base material is attached to the surface of the structure, the change of the structural color and the magnetic flux of the paint vary depending on the deformation of the structure, and the deformation and degree of deformation of the structure can be measured.
Hereinafter, a method of manufacturing a first dielectric material that can be used as a magnetic photonic crystal included in a coating material for measurement of strain deformation of the present invention will be described in detail with reference to the following examples.
Production Example 1 Production of first dielectric
10.46 ml of polystyrene and 0.07 ml of methyl acrylate were reacted in 20 ml of tetrahydrofuran (THF) solvent while maintaining the temperature at 85 占 폚 in a reactor in which nitrogen gas was refluxed and stirring for 6 hours with a magnetic stirrer. Then, the resulting polymer was precipitated in an excess amount of methanol, filtered and dried to synthesize a polystyrene / alkyl acrylate block copolymer.
The synthesized polystyrene / alkyl acrylate block copolymer was dissolved in 20 ml of methylene chloride, and 10 ml of trifluoroacetic acid (TFA) was added thereto while maintaining the temperature at 0 ° C, followed by reaction for 24 hours .
Thereafter, an amphipathic polystyrene / alkyl acrylate block copolymer was synthesized by precipitating the obtained block copolymer in 500 ml of n-hexane with vigorous stirring.
Production Example 2 Production of magnetic material
10.8 g of iron chloride (Sigma-Aldrich) and 36.5 g of sodium oleate (Sigma-Aldrich) were dissolved in a mixed solvent (80 mL of ethanol, 60 mL of distilled water and 140 mL of hexane). The mixture was then heated to 70 DEG C and allowed to react for 4 hours to produce an iron-oleate complex.
After completion of the reaction, the upper organic layer containing the iron-olate complex was washed three times with distilled water (30 mL) in a separating funnel. After washing, the hexane was evaporated to give the iron-olate complex as a waxy solid form.
Then, 36 g of the synthesized complex and 5.7 g of oleic acid (Sigma-Aldrich) were dissolved in 1-octadecene at room temperature. The mixture was then heated to 320 DEG C at a constant heating rate (3.3 DEG C / min) and held for 30 minutes.
Then, the solution containing the magnetic nanoparticles was cooled to room temperature, and ethanol (500 mL) was added. The prepared magnetic nanoparticles were purified through centrifugation (15,000 rpm).
Accordingly, iron oxide (Fe 3 O 4 ) magnetic nanoparticles were synthesized.
Production Example 3 Production of first dielectric used for magnetic photonic crystal
10 μl of the block copolymer synthesized in Preparation Example 1 (PS 200 -b-PAA 13 10 mg / ml in DMF) and the solution were mixed with 490 μl of dimethylformamide.
Then, the mixture was mixed with 100 μl of a dispersion (Fe 3 O 4 1.0 mg / ml in THF) of iron oxide (Fe 3 O 4 ) magnetic nanoparticles synthesized in Preparation Example 2 dispersed in tetrahydrofuran, And mixed with 400 μl of freshly prepared tetrahydrofuran.
Thereafter, 4 ml of distilled water was dropped over 30 minutes to gradually form my cells, thereby preparing a super-magnetic nano cluster.
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic view showing a state in which a gap between particles changes as a strain is applied to a tape coated with a paint for deformation measurement of a structure according to an embodiment of the present invention,
Fig. 2 is a graph showing the light dispersion relationship of the material (A) and the photonic crystal material (B) each having a uniform refractive index,
3 is a graph showing optical wavelengths according to a change in inter-particle distance of a magnetic material included in a coating material for strain measurement of a structure according to an embodiment of the present invention.
Claims (17)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020090017317A KR101647352B1 (en) | 2009-02-27 | 2009-02-27 | Paint for measuring deformation of structure, tape comprising the same and deformation measuring method of structure using the same |
| PCT/KR2010/001299 WO2010098647A2 (en) | 2009-02-27 | 2010-03-02 | Device for measuring deformation of structures and a deformation-measuring method for structures employing the same |
| JP2011551993A JP5468091B2 (en) | 2009-02-27 | 2010-03-02 | Device for measuring deformation of structure and method for measuring deformation of structure using the same |
| US13/203,217 US8671769B2 (en) | 2009-02-27 | 2010-03-02 | Device for measuring deformation of a structure and a method for measuring deformation of a structure using the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020090017317A KR101647352B1 (en) | 2009-02-27 | 2009-02-27 | Paint for measuring deformation of structure, tape comprising the same and deformation measuring method of structure using the same |
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| Publication Number | Publication Date |
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| KR20100098251A KR20100098251A (en) | 2010-09-06 |
| KR101647352B1 true KR101647352B1 (en) | 2016-08-11 |
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| JP2004503641A (en) | 2000-06-16 | 2004-02-05 | エムテック、マグネティックス、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツング | Magnetic or magnetizable binder composition |
| JP2006070064A (en) | 2004-08-31 | 2006-03-16 | Jsr Corp | Magnetic particle and method for producing the same |
| JP2006328309A (en) | 2005-05-30 | 2006-12-07 | Canon Inc | Magnetic polymer particle and its manufacturing method |
| JP2008045024A (en) | 2006-08-15 | 2008-02-28 | Dainippon Ink & Chem Inc | Molded processed product obtained by using metal nanoparticle dispersion, metal laminate and coating film |
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| KR20100098251A (en) | 2010-09-06 |
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