KR101629934B1 - X-ray scattering measurement system, Method thereof and Saving device saving that method - Google Patents

Abstract

A scattering line distribution measuring system for an X-ray apparatus for measuring a scattering line distribution of radiation radiated from an X-ray apparatus and a method for measuring scattering line distribution thereof.
In the present invention, the shape parameters related to the X-ray irradiation (the distance (FOD) between the focus point where the X-ray is generated in the X-ray tube of the X-ray apparatus and the point where the beam stop array is placed, (OID) between the beam stop and the beam stop (A) and the distance (d) between the beam stop (A) and the adjacent beam stop (B) in the beam stop array. Next, the control unit stores the shape parameters in a memory, and displays image information to be photographed on the display unit. Thereafter, when the user selects X-ray irradiation and is irradiated by the X-ray apparatus, the image detector acquires and outputs a beam stop image, and the control unit receives the beam stop image, And displays it on the display unit.

Description

TECHNICAL FIELD [0001] The present invention relates to an X-ray scattering measurement system, an X-ray scattering measurement system, a recording method,

The present invention relates to a system and a method for measuring a scattered line distribution of an X-ray apparatus, and more particularly to a recording medium on which a scattering line distribution measuring method and a method thereof are recorded. Ray scattering line distribution measurement system and method for facilitating the measurement of scattered line values by applying a scattering line to a sample, and a recording medium on which the method is recorded.

Generally, for medical imaging using X-rays, X-ray energies of 10 keV to 200 keV are used, in which only a part of the energy of an X-ray photon is transmitted as an electron, or a Compton effect, Is electronically transmitted and the object material is imaged through the photoelectric effect in which the X-ray is completely absorbed.

In a digital X-ray imaging apparatus for obtaining an X-ray image, an X-ray passing through a subject impinges on a scintillator to produce a visible ray, which is converted into a CCD (Charge Coupled Device) or a TFT Thin Film Transistor), and direct-type equipment that acquires images by irradiating X-rays passing through the subject directly to a TFT equipped with a Photoconductor (or Photoresistor) Respectively.

Such an X-ray imaging apparatus is irradiated at a large area in a conical shape of an X-ray emitted from an X-ray tube at a time, so that image distortion due to scattering of X-rays becomes a problem. Therefore, it is necessary to correct or remove such distortion.

For this purpose, it is essential to measure the scattering line distribution.

Conventionally, a beam stop array is used to measure the scatter component distribution of an X-ray apparatus.

However, since the X-ray incident on the detector is in the form of a fan beam, the incident angle varies depending on the position, and the position completely blocked by the beam stop also varies depending on parameters such as the distance between the X-ray source and the detection period.

Therefore, it takes a lot of time to check the distribution of the scattered line after acquiring the images using the beam stop array.

In addition, since the conventional beam stop is cylindrical, the accurate scattering line value can be measured only for the vertically incident X-rays. However, in the case of the fan beam, since the beam stop is incident on the detector at a certain angle from the center, There is a problem with the value.

SUMMARY OF THE INVENTION An object of the present invention is to solve the conventional problems and to provide an X-ray apparatus which can easily measure a scattered ray value by accurately finding a position and a distribution of a scattered ray in consideration of a distance between a source and a subject, And a recording medium on which the method is recorded.

According to an aspect of the present invention, there is provided a system for measuring a scattered line distribution of an X-

A scattering line distribution measuring system for an X-ray apparatus for measuring a scattering line distribution of radiation radiated from an X-ray apparatus,

A beam stop array in which beam stops for shielding X-rays emitted from the X-ray apparatus are regularly arranged;

An image detector positioned at a lower end of the beam stop array to acquire a beam stop image;

A display unit for displaying information;

An input unit for inputting shape parameter information;

And a control unit for calculating a scattering line distribution using the beam stop image and the shape variable information and displaying the scattering line distribution on the display unit.

Wherein the shape parameter information includes at least one of a distance (FOD) between a focus (Focus) at which an X-ray is generated in the X-ray tube of the X-ray apparatus and a position at which the beam stop array is placed, a distance between the beam stop array and the image detector (OID) and the distance d between any beam stop A and the adjacent beam stop B in the beam stop array.

Further comprising a memory for storing information,

The control unit stores the shape parameters in a memory, displays image information to be photographed on the display unit,

When the user selects X-ray irradiation and is irradiated by the X-ray apparatus, the image detector acquires and outputs a beam stop image, and the control unit receives the beam stop image,

And the control unit calculates the expected center point on the beam stop image and displays it on the display unit.

Wherein,

The control unit may store the measured values at the respective positions of the beam stops of the beam stop array in the form of a number in the memory when the user presses the measurement button after finally correcting the position of the center point using the graphic through the input unit, And the distribution is displayed on the display unit.

And the control unit calculates a distance between the beam stops shown on the image detector by the following equation.

Here, FOD is the distance between the focus point of the X-ray source at the X-ray tube of the X-ray apparatus and the point at which the beam stop array is placed, OID is the distance between the beam stop array and the image detector , And distance d comprises the distance d between any beam stop A and the adjacent beam stop B in the beam stop array.

In order to solve the above problems, a method of measuring scattered line distribution of an X-ray apparatus,

A scattering line distribution measuring method of a scattering line distribution measuring system of an X-ray apparatus which measures a scattering line distribution of radiation radiated from an X-ray apparatus,

(FOD) between the focus point where the X-ray is generated in the X-ray tube of the X-ray apparatus and the point where the beam stop array is placed, the beam stop array and the image detector (OID) between a beam stop (A) and an adjacent beam stop (B) in the beam stop array);

The control unit stores the shape parameter in a memory and displays image information to be photographed on a display unit;

When the user selects X-ray irradiation and is irradiated by the X-ray apparatus, the image detector acquires and outputs a beam stop image, and the control unit receives the beam stop image;

And the control unit calculates an expected center point on the beam stop image and displays it on the display unit.

The method comprises:

The control unit may store the measured values at the respective positions of the beam stops of the beam stop array in numerical form in the memory when the user presses the measurement button after the user finally corrects the position of the center point using the graphic through the input unit, And displaying the distribution on the display unit.

A recording medium on which a scattering line distribution measuring method of an X-ray apparatus according to an aspect of the present invention for solving such problems is recorded,

1. A recording medium recording a scattering line distribution measuring method of a scattering line distribution measuring system of an X-ray apparatus which measures a scattering ray distribution of radiation radiated from an X-ray apparatus,

(FOD) between the focus point where the X-ray is generated in the X-ray tube of the X-ray apparatus and the point where the beam stop array is placed, the beam stop array and the image detector A distance (d) between a beam stop (A) and an adjacent beam stop (B) in the beam stop array);

A function for the control unit to store the shape parameter in a memory and display image information to be photographed on the display unit;

When the user selects X-ray irradiation and is irradiated by the X-ray apparatus, the image detector acquires and outputs a beam stop image, and the control unit receives the beam stop image;

And the control unit calculates a predicted center point on the beam stop image and displays the expected center point on the display unit.

In the embodiment of the present invention, a scattering line distribution measurement system, a method and a method thereof of an X-ray apparatus facilitating the measurement of a scattering line value by accurately finding a position or a distribution of a scattering line in consideration of a distance between a source and a subject or a detection period Can be provided.

1 is a configuration diagram of a scattering line distribution measuring system of an X-ray apparatus according to an embodiment of the present invention.
2 is a flowchart illustrating a method of measuring a scattering line distribution of an X-ray apparatus according to an embodiment of the present invention.
FIG. 3 is a view showing a state in which an X-ray is passed through a beam stop array when a distance between the X-ray source and the position of the source varies. FIG.
FIG. 4 is a view showing shape parameters in a scattering line distribution measuring system of an X-ray apparatus according to an embodiment of the present invention.
5 is a view showing a beam stop array of a scattering line distribution measuring system of an X-ray apparatus according to an embodiment of the present invention.
6 is a view showing an example of shape parameters changed in the scattering line distribution measuring system of the X-ray apparatus according to the embodiment of the present invention.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art can easily carry out the present invention. The present invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. In order to clearly illustrate the present invention, parts not related to the description are omitted, and similar parts are denoted by like reference characters throughout the specification.

Throughout the specification, when an element is referred to as "comprising ", it means that it can include other elements as well, without excluding other elements unless specifically stated otherwise. Also, the terms " part, "" module," and " module ", etc. in the specification mean a unit for processing at least one function or operation and may be implemented by hardware or software or a combination of hardware and software have.

FIG. 1 is a diagram illustrating a scattering line distribution measuring system of an X-ray apparatus according to an embodiment of the present invention.

1. A scattering line distribution measuring system of an X-ray apparatus for measuring a scattering line distribution of radiation radiated from an X-ray apparatus, the system comprising: a beam stop array (110) for regularly arranging beam stops for shielding X- ); An image detector 120 positioned at the lower end of the beam stop array 110 to obtain a beam stop image; A display unit 140 for displaying information; An input unit 160 for inputting shape parameter information; And a control unit 130 for calculating the scattered line distribution using the beam stop image and the shape variable information and displaying the scattered line distribution on the display unit 140.

The shape parameter information includes a distance (FOD) between a focus (Focus) at which an X-ray is generated in the X-ray tube of the X-ray apparatus and a point at which the beam stop array 110 is placed, (OID) between the beam stop (s) and the beam stop (B) adjacent to the beam stop (A) in the beam stop array (110).

Further comprising a memory (150) for storing information,

The control unit 130 stores the shape parameters in the memory 150 and displays image information to be photographed on the display unit 140. When the user selects X-ray irradiation and is irradiated by the X-ray apparatus, The control unit 130 receives the beam stop image and the control unit 130 calculates the expected center point on the beam stop image and displays the expected center point on the display unit 140 .

The control unit 130,

When the user finally controls the position of the center point using the graphic through the input unit 160 and then presses the measurement button, the controller 130 displays the measured values at the positions of the beam stops of the beam stop array 110 in numerical form In the memory 150, and displays the distribution of the scattered rays on the display unit 140. FIG.

In the beam stop array 110, a plurality of beam stops are arranged at predetermined intervals. A lead stopper having a diameter of 6 mm is used as the beam stop. An array is formed by arranging solder balls on an acrylic plate at regular intervals.

The operation of the scattering line distribution measuring system of the X-ray apparatus having the above-described configuration according to the embodiment of the present invention will now be described.

FIG. 2 is a flowchart illustrating a method of measuring a scattering line distribution of an X-ray apparatus according to an embodiment of the present invention. FIG. 3 is a flowchart illustrating a method of measuring an X- FIG. 4 is a view showing shape parameters in a scattering line distribution measuring system of an X-ray apparatus according to an embodiment of the present invention. FIG. FIG. 6 is a view showing an example of shape parameters changed in the scattering line distribution measuring system of the X-ray apparatus according to the embodiment of the present invention. FIG. 6 is a view showing a beam stop array 110 of the scattering line distribution measuring system of the X-ray apparatus.

First, when the beam stop array 110 is placed on or below a subject and photographed using a digital radiation device, i.e., an X-ray apparatus, a projected image of the beam stop is obtained on the acquired image.

If you measure the value of the center (1mm diameter) in the part where the beam stop is located, you can measure the scattered line value of that part.

In this case, the position at which the primary X-ray passes through the center of the beam stop and reaches the detector depends on the distance between the source and the image detector 120, the distance between the subject and the beam stop array 110, And the distance between the image detector 120 and the image sensor 120. Particularly, in the case of a tomographic image synthesis system, the variable becomes more variable depending on the angle at which the image is acquired. Therefore, for the measurement, the values at different positions must be measured according to the aforementioned variables.

As a means for facilitating this, a program of the embodiment of the present invention, which designates an appropriate position by inputting these parameters, is read and recorded on a medium such as a PC, and an image to be measured is read to show a scattering line distribution .

In FIG. 3, (1) shows a state where the X-ray passing through the center of the lead-ball-type beam stop reaches the image detector 120 when the distance between the source and the detection period is different.

And (2) shows an example of a tomographic image synthesizer, which is changed in position when the position of the source changes.

 Therefore, in the case of the beam stop array 110, since these results are accumulated and the shape of the array is changed when each variable is changed, it is necessary to sufficiently measure the scattering line and to measure the scattering line value.

Hereinafter, the scattering line measuring process will be described in detail.

Referring to FIG. 2, the user determines a distance between a focus parameter (focus) at which X-rays are generated in the X-ray tube of the X-ray apparatus and a point at which the beam stop array 110 is placed, (OID) between the beam stop array 110 and the image detector and the distance d between the beam stop A and the adjacent beam stop B in the beam stop array 110, To the input unit 160 (S210).

Then, the control unit 130 stores the shape parameter in the memory 150 and displays the image information to be photographed on the display unit 140 (S220).

At this time, when the user selects X-ray irradiation and is irradiated by the X-ray apparatus (S230), the image detector 120 acquires and outputs the beam stop image, and the controller 130 receives the beam stop image (S240 ).

At this time, the controller 130 calculates an expected center point on the beam stop image and displays it on the display unit 140 (S250).

If the user presses the measurement button of the input unit 160 after finishing the positional correction of the center point using the graphic through the input unit 160 in step S260, the controller 130 controls the beam stop array 110 The measured values at the respective positions of the beam stops may be stored in the memory 150 in numerical form and the distribution of scattered rays may be displayed on the display unit 140 at step S270.

Hereinafter, the process of calculating the expected center point (S250) by the controller 130 in the above process will be described in more detail.

Referring to FIG. 4, a distance between a focus point at which an X-ray is generated in the X-ray tube and a point at which the object is placed is called a focus-object distance (FOD), and the distance between the subject and the image detector The distance is called an object-image distance (OID).

The total distance of the image detection period at the focal point of the FOD and the OID is called an FID (focus-image distance).

In the beam stop array of FIG. 4, the beam stop A and the adjacent beam stop B maintain a constant distance, and this distance is referred to as d. Generally, d is kept constant at about 20 mm in the beam stop array 110.

D measured on the image detector is also the same as that of the beam stop array 110 if a parallel X-ray beam is irradiated. However, the X-rays generated from the source do not extend in parallel to each other but in the form of a fan beam.

Therefore, the position of the beam stop seen on the actual image detector differs from A 'and B' as shown in the figure. This distance is called d ', and this value varies linearly with FOD or OID.

In FIG. 4, it is assumed that the position of the beam stop A is on the same line (the center of the image) as the focus. Therefore, the position of A 'is the same as that of A, but the position is different because it is formed at B' in the case of B at a point off the center.

In order to predict the distance between the projected beam stops as described above, the following Equation 1 can be applied.

In Equation (1), d 'represents the distance between the beam stops shown on the image detector, and it is predictable to know d, FOD and OID on the original beam stop array 110 in order to find out. In other words, it is not necessary to know where the center of the image is in actual prediction, because only these three parameters affect it. However, even if d 'is constant, the position where the image is formed can be changed if the center point is changed. Therefore, the precondition is that the center direction of the X-ray irradiated from the focus is directed toward the center of the image detector for accurate measurement.

The above-described example is described as a case where a fan beam is irradiated on a one-dimensional line. However, the actually obtained image is a case in which the fan beam is irradiated on the two-dimensional plane. 5, it is assumed that the center of focus is in a red circle.

The beam stops on the X and Y axes indicated by the solid lines are displayed only by the distance between the beam stops as in the case of the one-dimensional line. (ex 20mm) However, the distance from the center point indicated by the dashed line to the beam stop on the diagonal line can be calculated by Pythagorean theorem.

mm로 계산할 수 있다. For example, assuming that the distance between the beam stops is constant at 20 mm, if we calculate the distance to the point A in the X-axis direction and the point A in the Y-axis direction two spaces apart,

mm.

Assuming here that the FOD is 1800 mm and the OID is 70 mm, the distance from the center point measured by the image detector is about 46.46 mm.

The shape of the beam stop array 110 is arranged in a checkerboard shape maintaining a constant interval in both the X and Y axis directions. Therefore, even if we do not calculate as complicated as the previous method, we can find the corrected position directly if we can calculate only d '.

For example, in the case of having the same FOD and OID as in the previous method, it can be seen that d 'is 20.78 mm according to the calculation formula shown in Equation (1).

Even if the scattering line measurement in the single layer composite imaging apparatus or the X-ray such as angle photographing (ex. Pelvis inlet, outlet ..) is not vertically incident on the image detector, the fan beam is radially extending from the focal point It can be considered that only the position of the center point is changed.

In this case, as shown in FIG. 6, the OID is assumed to be the same as the general case, and the FID needs to be newly calculated, and is expressed by the following equation (2).

FID 'is the height at which the X-ray source is located. If you know the height, you do not have to calculate it separately.

In the above process, the scattering line value can be easily measured by accurately finding the position or the distribution of the scattering line in consideration of the distance between the source and the object or the detection period.

The embodiments of the present invention described above are not only implemented by the apparatus and method but may be implemented through a program for realizing the function corresponding to the configuration of the embodiment of the present invention or a recording medium on which the program is recorded, The embodiments can be easily implemented by those skilled in the art from the description of the embodiments described above.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, It belongs to the scope of right.

Claims (8)

A scattering line distribution measuring system for an X-ray apparatus for measuring a scattering line distribution of radiation radiated from an X-ray apparatus,
A beam stop array in which beam stops for shielding X-rays emitted from the X-ray apparatus are regularly arranged;
An image detector positioned at a lower end of the beam stop array to acquire a beam stop image;
A display unit for displaying information;
A distance (FOD) between a focus point at which X-rays are generated in the X-ray tube of the X-ray apparatus and a point at which the beam stop array is placed, a distance (OID) between the beam stop array and the image detector, An input for inputting shape parameter information including a distance d between an arbitrary beam stop A and an adjacent beam stop B in a beam stop array;
A control unit for calculating a scattering line distribution using the beam stop image and the shape variable information and displaying the scattering line distribution on the display unit; And
And a memory (150) for storing information,
The control unit stores the shape parameters in a memory, displays image information to be photographed on the display unit,
When the user selects X-ray irradiation and is irradiated by the X-ray apparatus, the image detector acquires and outputs a beam stop image, and the control unit receives the beam stop image,
Wherein the controller calculates a predicted center point on the beam stop image and displays it on the display unit. delete delete The method according to claim 1,
Wherein,
The control unit may store the measured values at the respective positions of the beam stops of the beam stop array in numerical form in the memory when the user presses the measurement button after the user finally corrects the position of the center point using the graphic through the input unit, And the distribution is displayed on the display unit. The method according to claim 1,
Wherein the control unit calculates the distance between the beam stops shown on the image detector by the following equation.

Here, FOD is the distance between the focus point of the X-ray source at the X-ray tube of the X-ray apparatus and the point at which the beam stop array is placed, OID is the distance between the beam stop array and the image detector , Distance d is the distance d between any beam stop A and the adjacent beam stop B in the beam stop array A scattering line distribution measuring method of a scattering line distribution measuring system of an X-ray apparatus which measures a scattering line distribution of radiation radiated from an X-ray apparatus,
(FOD) between the focus point where the X-ray is generated in the X-ray tube of the X-ray apparatus and the point where the beam stop array is placed, the beam stop array and the image detector (OID) between the beam stop (A) and the beam stop (B) adjacent to the beam stop (A) in the beam stop array);
The control unit stores the shape parameter in a memory and displays image information to be photographed on a display unit;
When the user selects X-ray irradiation and is irradiated by the X-ray apparatus, the image detector acquires and outputs a beam stop image, and the control unit receives the beam stop image;
Wherein the control unit calculates an expected center point on the beam stop image and displays it on the display unit. The method according to claim 6,
When the user presses the measurement button after the user finally corrects the position of the center point using the graphic through the input unit, the control unit stores the measured values at the respective positions of the beam stops of the beam stop array in the memory in numerical form And displaying a distribution of the scattered rays on the display unit. 1. A recording medium recording a scattering line distribution measuring method of a scattering line distribution measuring system of an X-ray apparatus which measures a scattering ray distribution of radiation radiated from an X-ray apparatus,
(FOD) between the focus point where the X-ray is generated in the X-ray tube of the X-ray apparatus and the point where the beam stop array is placed, the beam stop array and the image detector A distance (d) between a beam stop (A) and an adjacent beam stop (B) in the beam stop array);
A function for the control unit to store the shape parameter in a memory and display image information to be photographed on the display unit;
When the user selects X-ray irradiation and is irradiated by the X-ray apparatus, the image detector acquires and outputs a beam stop image, and the control unit receives the beam stop image;
Wherein the control unit calculates a predicted center point on the beam stop image and displays it on the display unit.

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