KR101543828B1 - An apparatus and method for managing a performance indicator - Google Patents

An apparatus and method for managing a performance indicator Download PDF

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KR101543828B1
KR101543828B1 KR1020120091410A KR20120091410A KR101543828B1 KR 101543828 B1 KR101543828 B1 KR 101543828B1 KR 1020120091410 A KR1020120091410 A KR 1020120091410A KR 20120091410 A KR20120091410 A KR 20120091410A KR 101543828 B1 KR101543828 B1 KR 101543828B1
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origin
descriptive
index
indicator
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KR20140025136A (en
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박성호
이승재
김기수
노우진
전순호
김동휘
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주식회사 포스코
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Abstract

The present invention discloses an apparatus and method for managing process indicators. An apparatus for managing a process indicator of the present invention includes an input unit for inputting data including a descriptive indicator, an average and standard deviation of the descriptive indicator based on the descriptive indicator, And a display unit for receiving the process index and displaying the process index in the form of a chart or a graph, and a display unit for displaying the process index in the form of a graph or a graph do.

Description

[0001] The present invention relates to an apparatus and method for managing a process index,

The present invention relates to an apparatus and a method for generating and managing an index (process index) on the status of a process based on one or more technical indicators used for process management.

Process management is generally carried out through the continuous monitoring of various technical indicators (eg, indicators of the percentage of defects or quality of the product), evaluating performance and determining whether the target is achieved. In the process management, not only the past evaluation (that is, the evaluation of the performance or the achievement of the goal), but also the prediction of the future performance and the problems that may occur at the same time, There is also a need to take a preemptive approach.

In the conventional case, simply monitoring the technical indicators without processing them, or monitoring achievement ratios with respect to each of the technical indicators. However, according to this conventional method, it is possible to evaluate the past to some extent, but it is very difficult to predict future performance.

In addition, recent industry trends are becoming more sophisticated, complex, and automated. Therefore, the kinds of technical indices to be managed for the above-described process management have also increased. However, according to the conventional management method of using the above described technical indices without processing or monitoring the achievement ratio with respect to each of the technical indices, since the deviation among the technical indices is large, It is difficult not only to compare the results with each other but also to check whether the entire process is improved in a comprehensive manner. In particular, in the case of using the achievement ratio as a process index, the process index for the net index (for example, a defective rate) that approaches the target as the value of the technical index decreases becomes a wide range of values On the other hand, as the value increases, the process indicator for the tower indices (eg, the calorific value of the product) approaching the desired target has a relatively narrow range of values. In other words, if the achievement ratio relative to the target is used as the process index, there is a problem that mutual index and tower index can not be compared with each other. In addition, there is a problem that it is not possible to calculate a comprehensive process index for the whole process by combining various technical indicators. In addition, even when a technical index indicating the same content has been used, there has been a problem in that, when the method of measuring the technical index changes (for example, when the defective rate is changed to the good yield rate), the achievement rate relative to the target also changes.

It is an object of the present invention to provide a process indicator management apparatus which can easily compare various technical indicators and can easily calculate a management indicator for an entire process by synthesizing various technical indicators.

Another object of the present invention is to provide a process index management method for achieving the above object.

According to an aspect of the present invention, there is provided an apparatus for managing a process indicator, including an input unit for inputting past data including a technical indicator, an average and standard deviation of the technical indicator based on the technical indicator, A calculation section for calculating an origin of the technical index based on the standard deviation and calculating a present value of the process index based on the origin of the technical index and the data; And a display unit for displaying the data in the form of a graph.

In order to achieve the above object, the data of the process index management apparatus of the present invention further includes a target value of the descriptive index,

Figure 112012067130059-pat00001
The process index can be calculated.

In order to achieve the above object, the technical index of the process index management apparatus of the present invention is a plurality of different types, and the calculation section calculates the process index for each of the plurality of technical indicators,

Figure 112012067130059-pat00002
The total process index can be calculated in accordance with

In order to achieve the above object, the calculation unit of the process index management apparatus of the present invention determines the origin of the descriptive index as "average + n × standard deviation" (n is a real number greater than 0) , And if the technical index is a tower index, the origin of the technical index can be determined as "average-n x standard deviation ".

In order to achieve the above object, the calculation unit of the process index management apparatus of the present invention calculates the origin of the descriptive index by substituting n1 for n (real number greater than n1) and calculating the origin of the descriptive index, If the origin of the indicator deviates from the threshold value of the descriptive index, the origin of the descriptive index can be calculated by substituting n2 for n (n2 is a real number smaller than 0 and smaller than n1).

In order to attain the above object, the calculation unit of the process index management apparatus of the present invention is characterized in that when the origin of the descriptive index calculated using the n2 is out of the threshold of the descriptive index, As shown in FIG.

In order to achieve the above object, n1 of the process index management apparatus of the present invention may be 6, and n2 may be 3.

In order to achieve the above object, the technical index of the process index management apparatus of the present invention is a plurality of different kinds of technical indices, and the calculating unit calculates the technical indices of the plurality of technical indices using the same n value for each of the plurality of descriptive indices Can be calculated.

In order to achieve the above object, the calculation unit of the process index management apparatus of the present invention includes a database for storing the data, an origin of the descriptive index based on previously stored technical indices among data stored in the database An origin calculation unit, and an index calculation unit for calculating the process index based on the origin of the technology index and the data.

According to another aspect of the present invention, there is provided a process index management method comprising the steps of inputting data including a technical index, calculating an average and standard deviation of the technical index based on the technical index, Computing an origin of the descriptive indicator based on the standard deviation, calculating a process indicator based on the origin of the descriptive indicator and the data, and displaying the process indicator in the form of a chart or a graph.

The data of the process index management method of the present invention for achieving the other object further includes a target value of the descriptive index,

Figure 112012067130059-pat00003
The process index can be calculated.

The above and other objects, features, aspects and advantages of the present invention will become more apparent from the following detailed description of the present invention when taken in conjunction with the accompanying drawings, in which like reference numerals designate like elements throughout the several views.

Figure 112012067130059-pat00004
The total process index can be calculated in accordance with

According to another aspect of the present invention, there is provided a method for managing a process index, comprising the steps of: determining whether the descriptive index is a map index or a map index; and, if the descriptive index is a map index, Is determined as "average + n x standard deviation" (n is a real number greater than 0), and when the descriptive indicator is a tower indicator, determining the origin of the descriptive indicator as " can do.

The determining of the calculating step of the process index management method of the present invention for achieving the other object includes calculating the origin of the descriptive index by substituting n1 for n1 (n1 is a real number greater than 0) Determining whether the origin of the descriptive index calculated using the n1 is out of the threshold of the descriptive index, and determining whether the origin of the descriptive index calculated using the n1 is out of the threshold of the descriptive index , And recalculating the origin by substituting n2 (n2 is a real number smaller than 0 and n2 is a real number smaller than n1) in the n.

In order to achieve the other object, the determining of the calculating step of the process index management method of the present invention determines whether or not the origin of the descriptive index calculated using the n2 is out of the limit value of the descriptive index And determining the threshold value of the descriptive indicator as the origin of the descriptive indicator when the origin of the descriptive indicator calculated using the n1 is out of the threshold of the descriptive indicator.

In another aspect of the present invention, n1 is 6 and n2 is 3.

According to another aspect of the present invention, there is provided a process index management method for managing a plurality of descriptive indices of a plurality of different types of descriptive indices using the same n for each of a plurality of descriptive indices, Origin points can be calculated.

Therefore, according to the process index management apparatus and method of the present invention, not only is it easy to compare various technical indicators, but also process indexes for the entire process can be easily calculated by combining these various technical indicators. Further, according to the process index management apparatus and method of the present invention, in the case of the index showing the same contents, even if the nature and the measurement method are changed, they appear as the same process index.

Therefore, it is possible to make an objective comparison between the technical indices of different processes, so that it can be judged whether the process efficiency is going to improve or deteriorate, and the appropriateness of how much the established goal can be achieved It is possible to assess the objective effort of how well the current improved technical indicators have worked to reach the target. In addition, it is possible to more easily manage the status of the whole process, and to provide data necessary for future setting of goals and improvement direction, and ultimately, It is possible to suggest a direction to improve the technical ability of the entire process.

1 is a block diagram showing a process index management apparatus according to the present invention.
2 is a block diagram showing a configuration of a calculation unit of the process indicator management apparatus of the present invention shown in Fig.
3 is a flowchart illustrating a process index management method according to the present invention.
4 is an operational flowchart for explaining the origin calculation step of the process index management method of the present invention shown in FIG.

Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings. However, the embodiments of the present invention can be modified into various other forms, and the scope of the present invention is not limited to the embodiments described below. Further, the embodiments of the present invention are provided to more fully explain the present invention to those skilled in the art.

1 is a block diagram showing a process index management apparatus according to the present invention.

The process index management apparatus of the present invention may include an input unit 100, a calculation unit 200, and a display unit 300.

The function of each of the blocks shown in FIG. 1 will be described as follows.

The input unit 100 inputs data including a descriptive index and transmits the input data to the calculation unit 200. [ Technical indicators can be various measures to be managed in the process. For example, a technical indicator may be a defect rate or a production amount. In the case of regenerating electric power through the process facility, the technical indicator may be a power generation amount or a heating value, or may be a specific component included in a product And the like.

The data (data) input by the input unit 100 may include an item of the input descriptive index. For example, before or after inputting the measurement value, which is the descriptive index, the input unit 100 displays information on the value to be input or input (for example, a defect rate, a production amount, a generation amount, Component ratio) can be input.

In addition, the data (data) input by the input unit 100 may include the nature of the technical indicator. That is, when inputting the item of the input technical indices, the input unit 100 can also input the nature of the technical indices. For example, a descriptive indicator is one that is closer to the target value as its value gets larger, that is, a tower indicator that is an indicator that generally wants to have a larger value, and a smaller value that gets closer to the target value, It is possible to distinguish the value of the index as a desirable index. An example of the tower indicator may be the above-mentioned power generation amount and the like, and the example of the tower indicator may be the above-described defective rate. The input unit 100 may input whether the inputted technical index is a tower index or a loose index.

The data (data) input by the input unit 100 may also include a target value of the input descriptive index.

The calculation unit 200 stores the data input through the input unit 100 and calculates the origin using the data stored in the past and uses the origin and the currently input data Calculate the index of management. For example, the calculation unit 200 may calculate the origin using the technical indices stored in the past, and calculate the management index using the origin, the target value, and the currently input technical indices. In this case, the management index (index) may include a management index for each item of the input technical indicators and a comprehensive management index, which is a management index for the entire process including all of the input technical indicators .

A specific method of generating the origin and the management index in the calculation unit 200 will be described later.

The display unit 300 inputs a management index output from the calculation unit 200 and displays the management index in various ways. For example, the display unit 300 may display the management index in tabular form or in a graph form. In this case, when there are a plurality of types of technical indicators, the technical indicators may be displayed so that they can be compared with each other, or the technical indicators may be displayed so as to be able to know the change with time.

2 is a block diagram showing a configuration of the calculation unit 200 of the process index management apparatus of the present invention shown in FIG.

The calculation unit 200 of the process index management apparatus of the present invention may include a database 210, an origin calculation unit 220, and an index calculation unit 230.

Functions of the blocks shown in FIG. 2 will be described as follows.

The database 210 stores data (data) input through the input unit 100. As described in FIG. 1, the data may include a technical index, an item of the inputted technical indicator, a characteristic of the inputted technical indicator, and a target value in the inputted technical indicator.

The origin calculation unit 220 calculates the origin (s_point) using the past data d_past stored in the database 210. The origin (s_point) is calculated for each descriptive indicator.

The origin (s_point) can be calculated by the following equation (1).

[Equation 1]

Figure 112012067130059-pat00005

Where n is a real number greater than 0 and the mean is an average of the technical indicators stored in the database 210 that have been input in the past and the standard deviation is the standard deviation of the technical indicators. That is, the origin calculation unit 220 of the calculation unit 200 of the process index management apparatus of the present invention calculates the origin (s_point) using the past descriptive indices stored in the database. If there are a plurality of kinds of input technical indicators, n has the same value with respect to all technical indicators.

Further, the origin calculation unit 220 may calculate the origin (s_point) according to the nature of the descriptive indicator for each descriptive indicator. In other words, if the technical index is the tower index, the "average-n × standard deviation" is calculated as the origin point (s_point), and if the technical index is the map index, the "average + n × standard deviation" can be calculated as the origin point (s_point).

When calculating the origin (s_point), the origin calculation unit 220 first sets n to n1 and then calculates the origin (s_point). If the calculated origin (s_point) deviates from the threshold of the descriptive index, Is set to n2, which is smaller than n1, so that the origin (s_point) can be recalculated. Here, the threshold value of the descriptive indicator means the maximum value or the minimum value that the descriptive indicator can have. Specifically, if the descriptive indicator is a tower indicator, the threshold value of the descriptive indicator means the minimum value that the descriptive indicator can have, and if the descriptive indicator is a diminutive indicator, the threshold value of the descriptive indicator can be Means the maximum value.

For example, if the descriptive index is about a defect rate, the threshold is 100. (In other words, when the technical index is related to the defective rate, the technical index corresponds to the longevity index and the technical index can not be greater than 100%). In this case, the origin calculation section 220 applies the above- ), And if the calculated origin (s_point) is greater than 100, the origin (s_point) can be calculated again by applying n2 smaller than n1.

Alternatively, if the technical index is related to power generation, etc., the limit value is zero. (In other words, when the technical index is related to power generation amount, etc., the technical index corresponds to the tower index and the technical index can not be less than 0.) In this case, the origin calculation section 220 calculates the reference point (s_point) , And if the calculated origin (s_point) is smaller than 0, the origin (s_point) can be calculated again by applying n2 smaller than n1.

Also, if the origin (s_point) calculated by applying n2 also deviates from the threshold of the descriptive index, the origin calculation unit 220 may determine the limit value of the descriptive index as the origin (s_point). For example, when the descriptive index is related to the defect rate, if the origin (s_point) calculated by applying n2 is also greater than 100, the origin calculation unit 220 can determine 100 as the origin (s_point) The origin calculation unit 220 can determine 0 as the origin (s_point) if the origin (s_point) calculated by applying n2 is also less than zero.

The n1 may be 6, and the n2 may be 3. The calculation of the origin (s_point) using "6 × standard deviation" means statistically seeking the defect rate 0, and the calculation of the origin (s_point) using "3 × standard deviation" Process error (about 0.3%) is allowed.

When the management index is calculated for a plurality of technical indicators, if the origin point (s_point) of any one of the plurality of technical indicators exceeds the limit point, the origin calculation unit 220 calculates the origin (s_point) . That is, the origin calculation unit 220 calculates origin points (s_points) for each of the plurality of descriptive indices by applying n1, and when any one of the calculated plurality of origin points (s_point) deviates from the limit point, n2 is applied The origin points (s_points) for each of the plurality of technical indicators can be recalculated. the origin point calculation unit 220 can determine only the corresponding origin point s_point as a limit point of the corresponding descriptive index if there is an origin point s_point that is out of the limit point among the origin points s_point calculated by applying n2.

The index calculation unit 230 receives the data input from the input unit 100 and the origin point s_point input from the origin calculation unit 220 to calculate a process index.

The index calculation unit 230 may calculate an index for each item according to the following equation (2). That is, the index calculation unit 230 may calculate process indexes for each technology index according to the following equation (2).

&Quot; (2) "

Figure 112012067130059-pat00006

Further, based on the item-by-item management index calculated by the equation (2), the integrated management index may be calculated according to the following equation (3).

&Quot; (3) "

Figure 112012067130059-pat00007

That is, the index calculation unit 230 of the present invention calculates a standardized process index using the origin calculated in consideration of past technical indices. Therefore, the process index calculated by the index calculation unit 230 does not merely represent the results for the current performance (i.e., the current technology index) but the past performance (i.e., the past technical indicators) Is also a reflected value. In addition, as the process index is standardized, a plurality of process indexes can be directly compared, and furthermore, a comprehensive process index indicating an index for the entire process can be calculated by reflecting all the plurality of technical indexes.

3 is a flowchart illustrating a process index management method according to the present invention.

The process index management method of the present invention will be described with reference to FIG.

First, data is input and stored (S100). The data includes descriptive indicators. The technical indicators may be a plurality of different characteristics. Further, the data may further include at least one of the item of the technical indicator, the nature of the technical indicator, and the target value for the technical indicator.

Next, the origin is calculated using the data stored in step S100 (step S200). When there are a plurality of technical indicators, the origin is calculated for each of a plurality of technical indicators. A specific method of calculating the origin will be described later with reference to Fig.

Next, in step S300, an item process index is calculated using the origin calculated in step S200, the technical index, and the target value input in step S100. Item-specific process indexes can be calculated by Equation (2).

Next, the integrated process index is calculated based on the item indexes calculated in step S300 (step S400). The integrated process index can be calculated by Equation (3).

4 is an operational flowchart for explaining the origin calculation step of the process index management method of the present invention shown in FIG.

Referring to FIG. 4, the step of calculating the origin of the process index management method of the present invention will be described below.

First, an average and a standard deviation are calculated for each of a plurality of descriptive indicators (step S210). At this time, the average and standard deviation can be calculated based on the technical indicators stored over the past several months, or based on the technical indicators stored for the previous quarter or half. Alternatively, if the technical indicators are affected by the season, the average and standard deviation may be calculated based on the technical indicators stored for three to five years prior to the previous year.

Next, the origin for each of the plurality of descriptive indices is calculated by applying "n1 × standard deviation" (step S220). N1 is a real number greater than 0, and may be six. In addition, the origin may be calculated as "average + n1 x standard deviation" when the corresponding technical indicator is a longevity indicator and may be calculated as "average-n1 x standard deviation" .

Next, in step S230, it is determined whether or not there is an origin point out of the limit points of the origin points calculated in step S220. Here, the threshold value means the minimum value that the corresponding technical indicator can have if the corresponding technical indicator is the tower indicator, and the maximum value that the corresponding technical indicator can have if the corresponding technical indicator is the weak indicator.

As a result of the determination in step S230, if there is no origin point out of the limit points of the calculated origin points, the origin points calculated in step S220 are finally determined as the origin points of the corresponding technical indicators.

As a result of the determination in step S230, if there is an origin that is out of the limit of the calculated origin, the origin of each item is recalculated by using n2, which is larger than 0 and smaller than n1, in operation S240. The n2 may be 3. In other words, the origin can be calculated as "average + n2 × standard deviation" if the corresponding descriptive indicator is the naked eye indicator and "average-n2 × standard deviation" if the corresponding descriptive indicator is the tower indicator.

Next, the origin calculated in step S240 is adjusted (step S250). More specifically, if there is an origin point out of the limit point among the origin points calculated in step S240, the origin is determined as the limit point.

Hereinafter, the operation of the process index management apparatus and the process index management method of the present invention will be described as follows.

First, the following Tables 1 to 3 are examples for explaining the method of calculating the origin. In the following embodiments, the defect rate and generation amount are described as technical indices. Also, n1 is 6 and n2 is 3 as variables used to calculate the origin.

In the case of the defect rate, it is an indicator of the smallness because it is the indicator which desires to have a small value, and in the case of the generation amount, it is the indicator of the tower which is desired to have a large value.

Therefore, the origin of the defect rate is calculated as "average + n x standard deviation ", and the origin of the generated amount is calculated as" average-n x standard deviation ". In addition, since the defective ratio is the net index as described above and the maximum value it can have is 100 (%), the limit value for the defective rate is 100. [ Similarly, the power generation amount is a tower indicator as described above, and since the minimum value that can be obtained is 0 (kWh), the limit value for the power generation amount becomes zero.

On the basis of the above description, in the process index management method of the present invention, a method of calculating the origin will be described as follows

4, the average of the defective rates calculated in step S210 of FIG. 4 is 3 (%), the standard deviation of the defective rate is 0.3, the average of the power generation amounts calculated in step S210 of FIG. 4 is 10 (kWh) Is a table for explaining a method of calculating the defect rate and the origin of each power generation amount when the deviation is 1.

Item Personality Average Standard deviation (σ) 6σ origin Defective rate(%) Mochi index 3 0.3 4.8 Power generation (kWh) Tower indicator 10 One 4

The "6? Origin point" in Table 1 represents the origin calculated in step S220 of FIG. That is, the origin for the defect rate is calculated as "average + 6 × standard deviation", and the origin for power generation is calculated as "average - 6 × standard deviation".

As shown in Table 1, in the case shown in Table 1, the origin for defective rate calculated in step S220 of FIG. 4 is 4.8, and the origin for power generation amount calculated in step S220 of FIG. That is, the origin for the defect rate is 4.8, which is smaller than the threshold value 100 for the defective rate, and the origin for the power generation amount is 4, which is larger than the limit value 0 for the power generation amount.

Therefore, in the case shown in Table 1, the origin ("6σ origin" in Table 1) calculated in the step S220 of FIG. 4 is determined as the origin for the defect rate and the power generation amount.

4, the average of the defective rate calculated in step S210 of FIG. 4 is 3 (%), the standard deviation of the defective rate is 0.9, the average of the power generation amount calculated in step S210 of FIG. 4 is 10 (kWh) Is a table for explaining a method of calculating the defect rate and the origin of each power generation amount when the deviation is 3.

Item Personality Average Standard deviation (σ) 6σ origin 3σ origin Defective rate(%) Mochi index 3 0.9 8.4 5.7 Power generation (kWh) Tower indicator 10 3 -8 One

The "6? Origin point" in Table 2 represents the origin calculated in step S220 of FIG. As shown in Table 2, in the case shown in Table 2, the origin for defective rate calculated in step S220 of FIG. 4 is 8.4, and the origin for power generation amount calculated in step S220 of FIG. 4 is -8. That is, the origin for the defect rate is 8.4, which is smaller than the limit value 100 for the defective rate, but the origin for the generation amount is -8, which is smaller than the limit value 0 for the generation amount. That is, in the case shown in Table 2, the origin for the power generation amount deviates from the limit value for the power generation amount.

Therefore, in this case, according to the present invention, step S240 of FIG. 4 is performed to recalculate the origin. That is, the origin for the rejection rate is recalculated as "average + 3 × standard deviation" and the origin for power generation is recalculated as "average - 3 × standard deviation".

The "3σ origin" in Table 2 represents the recalculated origin in step S240 of FIG. That is, the origin for the recalculated percent defective is 5.7 and the origin for the recalculated power generation is 1. In the case shown in Table 2, since the recalculated origin points (the "3? Origin points" in Table 2) in the step S240 of FIG. 4 are It is finally determined as the origin for the defect rate and the generation amount.

4, the average of the defective rate calculated in step S210 of FIG. 4 is 3 (%), the standard deviation of the defective rate is 0.9, the average of the power generation amount calculated in step S210 of FIG. 4 is 8 (kWh) Is a table for explaining a method of calculating the defect rate and the origin of each power generation amount when the deviation is 3.

Item Personality Average Standard deviation (σ) 6σ origin 3σ origin Adjustment origin Defective rate(%) Mochi index 3 0.9 8.4 5.7 5.7 Power generation (kWh) Tower indicator 8 3 -10 -One 0

The "6? Origin point" in Table 3 represents the origin calculated in step S220 of FIG. As shown in Table 3, in the case shown in Table 3, the origin of defective rate calculated in step S220 of FIG. 4 is 8.4, and the origin of power generation amount calculated in step S220 of FIG. 4 is -10. That is, the origin for the defect rate is 8.4, which is smaller than the threshold value 100 for the defective rate, but the origin for the power generation amount is -10, which is smaller than the limit value 0 for the power generation amount. That is, even in the case shown in Table 3, the origin for the power generation amount deviates from the limit value for the power generation amount.

Therefore, in this case, according to the present invention, step S240 of FIG. 4 is performed to recalculate the origin. That is, the origin for the rejection rate is recalculated as "average + 3 × standard deviation" and the origin for power generation is recalculated as "average - 3 × standard deviation".

The "3σ origin" in Table 3 represents the recalculated origin in step S240 of FIG. That is, the origin for the recalculated percent defective is 5.7, and the origin for the recalculated power generation is -1. The origin for the recalculated defect rate did not exceed the limit, but the origin for power generation is -1 despite the recalculation.

Therefore, in the case shown in Table 3, step S250 of FIG. 4 is performed.

The "adjustment origin" in Table 3 represents the origin adjusted in step S250 of Fig. That is, through step S250 of FIG. 4, the origin for the power generation amount is adjusted to 0, which is the limit value for the power generation amount. In the case shown in Table 3, the origin (the "adjustment origin" in Table 3) adjusted in the step S250 of FIG. 4 is finally determined as the origin for the defect rate and the origin for the power generation.

The following Table 4 shows the case where the present invention is applied to two indicators having the same contents but different in character from the measurement method. In Table 4, the origin was calculated using "6 × standard deviation".

Item Personality Average Standard Deviation 6σ origin Currently entered
Technical indicators Goal Value By item
Process index Defective rate(%) Mochi index 3 0.3 4.8 4 2.5 0.3478 Yield rate (%) Tower indicator 97 0.3 95.2 96 97.5 0.3478

Table 4 shows process indexes calculated for each of the defect rate and the yield rate.

First, it is assumed that the average of the defect rates calculated in step S210 of FIG. 4 is 3 (%) and the standard deviation is 0.3. Then, in the case of the yield rate, the average of the yield rate will be 97 (%) and the standard deviation will be 0.3 in the same process.

The origin of the defect rate calculated in step S220 of FIG. 4 is 4.8. In the case of the yield rate, since it is a desired value to have a large value, it corresponds to the indicator of the tower, and thus the origin for the yield rate calculated in the step S220 of FIG. 4 is 95.2.

Also, if the target value for the defective rate is 2.5 (%), the target value for the yield rate is 97.5 (%). In addition, if the technology index currently input for the defective rate is 4 (%), if the defective product rate is measured, the currently input technical index becomes 96 (%).

The "process index by item" in Table 4 represents the process index by item calculated in step S300 of FIG. As described with reference to FIG. 3, item indexes may be calculated according to the above-described equation (2). As shown in Table 4, in the case of the technical index showing the same contents, the process indexes according to the present invention have the same value when calculated.

Next, Table 5 shows calculation of item-specific process indexes and comprehensive process indexes for a plurality of technical indexes of different kinds according to the present invention.

Item Personality Average Standard Deviation 6σ origin Currently entered
Technical indicators Goal Value By item
Process index Synthesis
Process index Defective rate
(%) Rut
Indicators 3 0.3 4.8 4 2.5 0.3478

0.7869 Power generation
(kWh) watchtower
Indicators 10 One 4 12 15 0.7273 dissatisfaction
Number Rut
Indicators 4 One 10 One 3 1.2857

In Table 5, "average" and "standard deviation" are values assumed to have been calculated for each item in step S210 of FIG. 4, 3 represents the process index calculated in accordance with the equation (2) in step S300 of FIG. 3, and the "process index" represents the process index calculated in step S400 (3) < / RTI >

According to the process index management apparatus and method of the present invention, even if the items are completely different from each other, the process indexes calculated for each item are standardized values, so that comparison between the items is easy. In other words, referring to Table 5, "Process Indicators by Items", it is easy to see that the portion where the improvement is relatively large in the entire process is a defect rate, and the portion exceeding the target is the number of complaints.

Further, according to the process index management apparatus and method of the present invention, a process index for the entire process can be calculated by integrating a plurality of technical indexes of different kinds (refer to the general process index in Table 5).

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, but, on the contrary, It will be obvious to those of ordinary skill in the art

100: input unit 200: calculation unit
300: display unit 210:
220: origin calculation unit 230: index calculation unit

Claims (17)

An input unit for inputting data including a plurality of technical indices of different kinds and a target value of each of the plurality of technical indices;
Calculating an average and a standard deviation of the descriptive indexes for each of the plurality of descriptive indices based on the descriptive indices; and when the descriptive indices are the subtractive indices, calculating the origin of the descriptive indices as "average + (n is a real number greater than 0) or a limit value of the descriptive indicator, and when the descriptive indicator is a tower indicator, the origin of the descriptive indicator is calculated as "average - n x standard deviation & Calculating the origin of each of the plurality of descriptive indicators using the same n value for the plurality of descriptive indices,
Figure 112015010426463-pat00016
A calculation unit for calculating the process index according to the process index; And
And a display unit for receiving the process index and displaying the process index in the form of a chart or a graph.
delete The method according to claim 1,
The calculation unit calculates
Figure 112015010426463-pat00009
The process index management apparatus further calculates a comprehensive process index according to the process index.
delete The apparatus of claim 1, wherein the calculation unit
The origin of the descriptive index is calculated by substituting n1 (n1 is a real number greater than 0) into the n, and when the origin of the descriptive index calculated using the n1 is out of the limit of the descriptive index, and calculating the origin of the descriptive index by substituting n2 (n2 is a real number larger than 0 and smaller than n1).
6. The apparatus of claim 5, wherein the calculation unit
And the threshold of the descriptive indicator is determined as the origin of the descriptive indicator when the origin of the descriptive indicator calculated using the n2 is out of the threshold of the descriptive indicator.
6. The method of claim 5,
Wherein n1 is 6 and n2 is 3.
delete The apparatus of claim 1, wherein the calculation unit
A database for storing the data;
An origin calculation unit for calculating an origin of the descriptive index based on previously stored technical indices among data stored in the database; And
And an index calculation unit for calculating the process index based on the origin of the technology index and the data.
A process index management method of a process index management apparatus comprising an input unit, a calculation unit, and a display unit,
Inputting data including a plurality of technical indices of different kinds and a target value of each of the plurality of technical indices through the input unit;
Wherein the calculating unit calculates an average and a standard deviation of the technical indicators based on the technical indicators for each of the plurality of technical indicators, and when the technical indicators are the weak indicators, + n x standard deviation "(n is a real number greater than 0) or a limit value of the descriptive indicator, and when the descriptive indicator is a tower indicator, the origin of the descriptive indicator is defined as" Calculating an origin of each of the plurality of descriptive indices using the same n value for the plurality of descriptive indices,
Figure 112015010426463-pat00017
Calculating a process index according to the process index; And
And displaying the process index in the form of a chart or a graph through the display unit.
delete 11. The method of claim 10,
Wherein the calculating step comprises:
Figure 112015010426463-pat00011
A process index management method that calculates additional process indexes in accordance with
delete 11. The method of claim 10, wherein the calculating
Calculating an origin of the descriptive index by substituting n1 for n (n1 is a real number greater than 0);
Determining whether the origin of the descriptive index calculated using the n1 is out of the limit of the descriptive index; And
Calculating n2 (n2 is a real number smaller than 0 and smaller than n1) to n, and recalculating the origin when the origin of the descriptive index calculated using the n1 is out of the threshold of the descriptive index Wherein the process index management method comprises:
15. The method of claim 14, wherein the calculating
Determining whether the origin of the descriptive index calculated using the n2 is out of the limit of the descriptive index; And
And determining the threshold value of the descriptive indicator as the origin of the descriptive indicator when the origin of the descriptive indicator calculated using the n1 is out of the threshold of the descriptive indicator.
15. The method of claim 14,
Wherein n1 is 6 and n2 is 3.
delete
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JP2010225029A (en) 2009-03-25 2010-10-07 Fuji Electric Holdings Co Ltd Manufacture history analysis support device and manufacture history analysis support method

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