KR101486193B1

KR101486193B1 - Residual metal detecting apparatus based on electromagnetic induction

Info

Publication number: KR101486193B1
Application number: KR1020140060743A
Authority: KR
Inventors: 이영서
Original assignee: 이영서
Priority date: 2014-05-21
Filing date: 2014-05-21
Publication date: 2015-01-28
Also published as: WO2015178528A1

Abstract

The present invention relates to an electromagnetic induction based metal particle detector. According to the present invention, there are provided an upper and lower magnet stage (110) in which a hard magnet is disposed to magnetize a fine metal corresponding to a metal foreign object; An upper and a lower coil 110 having a structure in which a coil wound around a conductor is disposed and an output of an induced electromotive force is connected to a metal foreign object detection controller 130; A conveyor belt 141 for providing a movement of the fine metal magnetized by the upper and lower magnetic poles 110 to make a magnetic flux density change with respect to the upper and lower coil ends 120 to induce electromagnetic induction phenomenon by Faraday's law; And a metal particle detection control unit 130 for detecting fine metal by amplifying a minute electromotive force when induction electromotive force is generated at upper and lower coil ends 120; .
Thereby, it is possible to secure the stability in production products including sweets, beverages and other foods due to the improvement of the detection power of metal foreign matter.
Further, the present invention provides an effect of expanding the user's supply by lowering the unit price of the product through detection of the micro-metal by the strong magnet, the coil, and the conveyor belt based on the electromagnetic induction.
In addition, the present invention implements a self-checking function to confirm the performance for detecting all metal objects in the UI screen of the touch screen, and facilitates operation such as setting of functions, thereby providing user convenience.

Description

[0001] The present invention relates to an electromagnetic induction-

The present invention relates to an electromagnetic induction-based metal particle detector, and more particularly, to an electromagnetic induction-based metal particle detector for detecting a metal particle which can be introduced into a product for users, And more particularly, to an electromagnetic induction-based metal particle detector.

In the conventional metal detector detection method, a magnetic field is formed by applying a signal or voltage to a sensor portion such as a coil having a transmitting end and a receiving end simultaneously, and a detection signal generated when a metal foreign object passes the magnetic field is amplified have.

However, in the case of such a conventional metal detector, there is a disadvantage in that the signal detected by the sensor unit is amplified together with ambient noise, thereby deteriorating the detection discrimination power.

In addition, since a signal or a voltage must be always applied to the sensor unit for detecting metal particles incidentally, there is a limit to increase the production cost of the product.

[Related Technical Literature]

1. A metal object detecting apparatus and method for detecting a metal object in a food (Patent Application No. 10-2009-0040237)

2. Device for detecting metallic body (Patent Application No. 10-1999-0018420)

SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems and it is an object of the present invention to provide an electromagnetic induction-based metal particle detector for ensuring stability in a product including products of confectionery, beverage, will be.

In order to overcome the limitation of supplying current to the sensor unit for detecting metallic foreign substances such as coils, the present invention detects a metal based on an induced electromotive force generated when a coil passes over a magnetized magnetic body And to provide an electromagnetic induction-based metal particle detector employing a new method.

However, the objects of the present invention are not limited to the above-mentioned objects, and other objects not mentioned can be clearly understood by those skilled in the art from the following description.

According to an aspect of the present invention, there is provided an electromagnetic induction-based metal particle detector comprising: upper and lower magnetic poles (110) arranged to magnetize a fine metal corresponding to a metal foreign object; An upper and a lower coil 110 having a structure in which a coil wound around a conductor is disposed and an output of an induced electromotive force is connected to a metal foreign object detection controller 130; A conveyor belt 141 for providing a movement of the fine metal magnetized by the upper and lower magnetic poles 110 to make a magnetic flux density change with respect to the upper and lower coil ends 120 to induce electromagnetic induction phenomenon by Faraday's law; And a metal particle detection control unit 130 for detecting fine metal by amplifying a minute electromotive force when induction electromotive force is generated at upper and lower coil ends 120; .

At this time, the metal foreign matter detection control unit 130 may control the induced electromotive force generated in the upper and lower coil ends 110 through the first amplification by the first OP AMP 131a and the second amplification by the second OP AMP 131b An OP AMP 131 formed of a low-voltage noise OP AMP for amplifying; .

Also, the metal foreign matter detection control unit 130 includes a T TWIM NOTCH FILTER 132 for removing power supply noise of 50 Hz and 60 Hz at the voltage frequency of the induced electromotive force amplified by the OP AMP 131 in the primary and secondary phases; And an MCU 133 for detecting a fine metal by receiving and analyzing a voltage of an induced electromotive force having a frequency at which the remaining power is removed and a power noise is removed; .

The T TWINCHCH FILTER 132 preferably includes a circuit that can be adjusted to amplify the sensitivity setting according to the size of the fine metal and to avoid external vibration or shock.

Also, the MCU 133 preferably confirms both the upper and lower sides of the waveform through the inversion and non-inversion outputs in order to confirm the end of the waveform with respect to the voltage due to the induced electromotive force.

The metal foreign matter detection control unit 130 outputs a warning message based on the information detected by the MCU 133 or controls the stopping of the motor 152 driving the conveyor belt 141 and the solenoid valve (not shown) A touch screen 134 formed to request the MCU 133 to perform an operation such as an inspection discharge control through the touch screen 134; .

The upper and lower coil ends 110 are disposed in the form of one coil connected to the upper coil end 121 and the lower coil end 122. One of the upper coil ends 121 is connected to the ground GND, One end of the lower coil 122 is connected to the input of the upper coil 121 and the other end of the lower coil 122 is connected to the input of the OP AMP 121. [

The electromagnetic induction-based metal foreign object detector according to the embodiment of the present invention provides an effect of securing stability in a product including confectionery, beverage, and other food according to the improvement of detection ability of metal foreign matter.

In addition, the electromagnetic induction-based metal foreign object detector according to another embodiment of the present invention can detect a minute metal by a strong magnet, a coil, and a conveyor belt on the basis of an electromagnetic induction, Provides an effect.

In addition, the electromagnetic induction-based metal foreign object detector according to another embodiment of the present invention implements a self-checking function to confirm the performance for detecting all metal objects in the UI screen of the touch screen, Thereby providing an effect of facilitating user convenience.

FIG. 1 is a block diagram showing an electromagnetic induction-based metal particle detector 10 according to an embodiment of the present invention.
FIG. 2 is a circuit diagram showing an OP AMP 131 among the electromagnetic induction-based metal foreign object detectors 10 of FIG.
FIG. 3 is a circuit diagram showing a TWIN NOTCH FILTER 132 of the electromagnetic induction-based metal foreign object detector 10 of FIG.
4 is a view showing a PCB board including the MCU 133 among the electromagnetic induction-based metal foreign object detectors 10 according to the embodiment of the present invention.
5 is a circuit diagram showing a circuit for confirming the waveform of the contact voltage by the induced electromotive force by summing the inverting input and the non-inverting input by the PCB board including the MCU 133 of FIG.
FIG. 6 is a diagram showing a general waveform implemented in the touch screen 134 at the time of detecting fine metal by the MCU 133 among the electromagnetic induction-based metal foreign matter detector 10 according to the embodiment of the present invention.
FIG. 7 is a front view (FIG. 7A), a side view (FIG. 7B), and a top view (FIG. 7C) showing the mechanical design structure of the electromagnetic induction based metal foreign object detector 100 according to the embodiment of the present invention.
FIG. 8 is a diagram showing a state in which the electromagnetic induction-based metal foreign object detector 100 of FIG. 7 is actually fabricated.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a detailed description of preferred embodiments of the present invention will be given with reference to the accompanying drawings. In the following description of the present invention, detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear.

FIG. 1 is a block diagram showing an electromagnetic induction-based metal particle detector 10 according to an embodiment of the present invention. Referring to FIG. 1, the electromagnetic induction-based metal foreign object detector 100 includes upper and lower magnetic poles 110, upper and lower coil ends 120, a metal particle detection control unit 130, a mechanical unit 140, .

The upper and lower magnet stages 110 are formed by arranging the strong magnets in the up and down directions to magnetize the fine metal corresponding to the metal foreign object to compensate for the lack of magnetization according to the height. The upper and lower magnetic pole 110 and the upper and lower magnetic pole ends 110 and 120 may be different from each other in the left and right direction or the longitudinal direction based on the horizontal plane of the upper and lower magnetic pole 110 and the upper and lower coil ends 120, The upper and lower coil ends 120 are referred to as the upper and lower coil ends 120, and the scope of the rights is not limited thereto.

Thus, the magnetic flux density is changed with respect to the upper and lower coil ends 120 by the movement of the fine metal magnetized by the upper and lower magnet stages 110 using the conveyor belt 141 of the mechanical part 140, Inducing phenomenon.

That is, the role of the upper and lower magnetic poles 110 is to prevent the magnetization of the fine metal from being induced for the purpose of magnetization of the fine metal, and to have a clear difference in the electromagnetic induction phenomenon, do. On the other hand, when the conveying speed of the conveyor belt 141 is used, the electromagnetic induction voltage is higher at a higher speed than at a lower speed.

The upper and lower coil ends 110 include an upper coil end 121 and a lower coil end 122. A coil having a sufficiently wound wire is arranged vertically so that several millivolts (mV To generate an induced electromotive force.

The upper and lower coil ends 110 are connected to the OP amp 131 for inputting the output of the induced electromotive force to the input terminal of the OP AMP 131 of the metal foreign object detection controller 130 .

1, upper and lower coil ends 110 are arranged in the form of a single coil having an upper coil end 121 and a lower coil end 122 connected to each other and one end of the upper coil end 121 is connected to ground GND And one end of the lower coil 122 is connected to the input of the upper coil 121 and the other end of the lower coil 122 is connected to the input of the OP AMP 121. The upper and lower coil ends 110 are formed in a single coil shape with one directionality as a whole.

On the other hand, since the voltage of the induced electromotive force generated by the upper and lower coil ends 110 having the above-described structure and function is about several millivolts (mV), it corresponds to a state where power supply noise and noise noise are mixed on the frequency, A metal foreign matter detection control unit 130 which performs a function of detecting fine metal by removing noise and noise noise will be described.

The metal foreign matter detection control unit 130 includes an OP amp 131, a TWIN NOTCH FILTER 132, an MCU 133, and a touch screen 134. With this configuration, the metal foreign object detection control unit 130 amplifies the frequency of the voltage of the induced electromotive force generated by the upper and lower coil ends 110 several hundreds of times through the low-noise OP AMP 131 , And T TWIM NOTCH FILTER (132) to eliminate power supply noise at 50 Hz and 60 Hz.

Then, the metal foreign substance detection control unit 130 lowers the induced electromotive force to the input level of the analog-to-digital converter (not shown) of the MCU 133 and the sensitivity to the fine metal piece, Lt; RTI ID = 0.0 > metal. &Lt; / RTI >

Hereinafter, each component of the metallic foreign object detection control unit 130 will be described separately.

Since the induced electromotive force generated in the upper and lower coil ends 110 is several millivolts (mV), the OP AMP 131 can perform the first amplification by the first OP AMP 131a and the second amplification by the second OP AMP 131b. And a low-voltage noise OP AMP for amplifying it by a factor of several hundreds.

2 is a circuit diagram showing the OP AMP 131. Referring to FIG. 2, the OP amp 131 is connected to an AD8676, which is an ultraprecision, 36 V, 2.8 nV / √Hz dual rail-to- Can be amplified by non-inverting about 400 times with amplification through the first and second amplification.

T TWIN NOTCH FILTER 132 removes the power noise corresponding to 50 Hz and 60 Hz at the frequency with respect to the voltage of the induced electromotive force amplified by the OP amp 131 and passes the remaining frequency to the MCU 133 do.

3 is a circuit diagram showing a T TWINCHCHFILTER 132 according to an embodiment of the present invention. Referring to FIG. 3, the formula for frequency removal is Fc = 1 / (2 x PI x R x C) 50 = 1 (2 x PI x 31.8K x 0.1 uF) ", and the second circuit configuration is applied to the first circuit configuration The 60 Hz frequency removal of the second filter 132b is applied as "60 = 1 (2 x PI x 26.4 K x 0.1 uF) ".

In another embodiment of the present invention, the T TWINCHCH FILTER 132 may include a circuit for setting the sensitivity according to the size of the fine metal. The T TWIN FILTER 132 may be amplified according to the size of the fine metal, And can be configured as an adjustable circuit.

4 is a view showing a PCB board including the MCU 133 according to the embodiment of the present invention.

Referring to FIG. 4, the PCB board including the MCU 133 includes a resistance value setting for adjusting the sensitivity of the TW TWIN NOTCH FILTER 132 in eight steps, and a PCB for volume. Since the input to the MCU 133 is 5V, the attenuated induced electromotive force is input. The MCU 133 attenuates the induced electromotive force and raises the position of the reference 0V to the maximum to check the end of the waveform. At this time, the MCU 133 combines the inverting input 2 using the inverting amplifier 130a and the non-inverting input 1 to check the waveform of the voltage due to the induced electromotive force.

5 is a diagram showing a circuit for checking the waveform of the contact voltage by the induced electromotive force by combining the inverting input 2 and the non-inverting input 1 by the PCB board including the MCU 133 of FIG.

In other words, the MCU 133 confirms the end of the waveform of the voltage due to the induced electromotive force, and confirms both of the upper and lower sides through the inversion and non-inversion outputs. In this way, The reason why the confirmation of both the upper and lower sides through the output is important is that the peripheral noise due to the mechanical part including the motor 150 generates regular vibration. When the voltage is in phase with the voltage waveform of the induction voltage finely generated, Because the waveform can be removed.

The MCU 133 has various waveforms according to the relationship of the waveforms of the voltage due to the vibration and the induced electromotive force. In order to handle all the situations, the circuit is configured and the algorithm is implemented.

The MCU 133 processes the case where the waveform is large due to the inversion of the voltage due to the induced electromotive force and the non-inverted output, and the case where the waveform is lost. Therefore, the MCU 133 provides a more accurate detection of the fine metal.

The touch screen 134 outputs a warning message with the information detected by the MCU 133 or controls stopping of the motor 152 driving the conveyor belt 141, inspection discharge control through solenoid valve (not shown) Or the like, through the MCU 133. [0064]

6 is a diagram showing a general waveform implemented on the touch screen 134 at the time of detection of fine metal by the MCU 133. As shown in Fig. In the case of FIG. 6, the waveform is almost always detected in the same phase, and the present invention is not limited to this case, and can be detected by various waveforms.

The mechanism section 140 includes the conveyor belt 141 as described above.

The upper and lower magnet stages 110, the conveyor belts 141, and the upper and lower coil ends 110 correspond to the magnetic field, the motion, and the coil that constitute the electromagnetic induction phenomenon. More specifically, the electromagnetic induction used in the electromagnetic induction-based metal particle detector 100 according to the embodiment of the present invention refers to a phenomenon in which a potential difference (voltage) is generated in a conductor where a magnetic field is changed. The electromagnetic induction is first mathematically explained by Michael Faraday, and the generated voltage is proportional to the rate of change of the magnetic flux, and can be applied when the magnetic flux density changes, or when the conductor moves a space with a magnetic flux density that is not constant. And electric motors such as electric motors.

This Faraday electromagnetic induction law is expressed as a general formula "ε = N (dφ / dt)", ε is the electromotive force in volts (V), N is the number of times the wire is wound, φ is the magnetic flux, (Wb). On the other hand, the sign (direction) of the electromotive force generated by the electromagnetic induction can be known through Lenz's law. More specifically, the electromotive force induced in the circuit corresponds to the direction of canceling the change of the magnetic field generated by the induced current.

The SMPS 153 includes a first SMPS 153a and a second SMPS 153b. The first SMPS 153a and the second SMPS 153b are connected to the switch 150. The switch 150 includes a breaker 151, a motor 152, an SMPS 153, a noise filter 154 and a relay controller 155, 2 SMPS 153b.

Here, the first SMPS 153a is formed to supply power to the metal foreign matter detection control unit 130 driven by + 5V, -15V, and + 15V, and -15V and + 15V are supplied to the amplification stage power source of the OP AMP 131 And the like. The second SMPS 153b is formed to supply power to the motor 152 and the relay controller 155 driven by the +24 V power supply.

FIG. 7 is a front view (FIG. 7A), a side view (FIG. 7B), and a plan view (FIG. 7C) showing the mechanical design structure of the electromagnetic induction- based metal object detector 100 according to the embodiment of the present invention, 7 is a diagram showing a state in which the electromagnetic induction-based metal foreign object detector 100 of FIG. 7 is actually fabricated.

As described above, the electromagnetic induction-based metal foreign object detector 100 according to the present invention magnetizes the fine metal based on the theory that induction electromotive force by electromagnetic induction is generated, moves it to the upper and lower coil ends 120, 120 to generate an induced electromotive force to amplify the small electromotive force and to inspect and detect the input through the input terminal of the MCU 133. [

Thus, the electromagnetic induction-based metal foreign object detector according to the embodiment of the present invention provides an effect of securing stability in a product including confectionery, beverage, and other foods due to the improvement of the detection power of metal foreign matter . At this time, the production products including confectionery, beverages and other foods may be packed with aluminum-based packaging materials. In addition, the aluminum-based packaging material may be formed by a vapor deposition method in which the aluminum-based packaging material is heated to a high temperature and evaporated, and the aluminum packaging material is adhered in a thin film state with the vapor. Particularly, . &Lt; / RTI >

As described above, preferred embodiments of the present invention have been disclosed in the present specification and drawings, and although specific terms have been used, they have been used only in a general sense to easily describe the technical contents of the present invention and to facilitate understanding of the invention , And are not intended to limit the scope of the present invention. It is to be understood by those skilled in the art that other modifications based on the technical idea of the present invention are possible in addition to the embodiments disclosed herein.

110: Upper and lower magnetic stage
120: Upper and lower nose
121: upper coil section
122: lower coil
130: metal foreign matter detection control unit
131: OP AMP
132: T TWIN NOTCH FILTER
133: MCU
134: Touch screen
140:
141: Conveyor belt
150: All books
151: Breaker
152: motor
153: SMPS
153a: 1st SMPS
153b: the second SMPS
154: Noise filter
155: Relay controller

Claims

An upper and lower magnet stage (110) in which a steel magnet is disposed to magnetize a fine metal corresponding to a metal foreign object;
An upper and lower coils 120 having a structure in which a coil wound around a conductor is disposed and an output of an induced electromotive force is connected to a metal foreign matter detection and control unit 130; And
A conveyor belt 141 for providing a movement of the fine metal magnetized by the upper and lower magnetic poles 110 to make a magnetic flux density change with respect to the upper and lower coil ends 120 to induce electromagnetic induction phenomenon by Faraday's law; And
A metal foreign object detection control unit 130 for detecting fine metal by amplifying a minute electromotive force when induction electromotive force is generated in the upper and lower coil ends 120; Lt; / RTI >
The metal foreign matter detection control unit 130,
An OP generated by the low voltage noise OP AMP for amplifying the induced electromotive force generated at the upper and lower coil ends 120 by the first amplification by the first OP AMP 131a and the second amplification by the second OP AMP 131b AMP 131; Wherein the electromagnetic induction-based metal particle detector comprises:

delete

The apparatus according to claim 1, wherein the metal foreign matter detection control unit (130)
A T TWINCHCH FILTER 132 for removing power supply noise of 50 Hz and 60 Hz at the voltage frequency of the induced electromotive force amplified by the OP AMP 131 through the first and second orders; And
An MCU 133 for detecting a fine metal by receiving and analyzing a voltage of an induced electromotive force having a frequency at which the power noise is removed and the remainder is passed; Further comprising an electromagnetic induction-based metal particle detector.

The T TWIN NOTCH FILTER (132) according to claim 3,
And a circuit capable of being amplified according to the sensitivity setting according to the size of the fine metal and adjusting to avoid external vibration or shock.

The method of claim 4, wherein the MCU (133)
Wherein the end of the waveform of the voltage due to the induced electromotive force is checked to confirm both of the upper and lower sides through the inversion and non-inversion outputs.

The apparatus according to claim 4, wherein the metal foreign object detection control unit (130)
A warning message is outputted from the information detected by the MCU 133 or an operation for stopping the motor 152 for driving the conveyor belt 141 and a test object discharge control through a solenoid valve (not shown) 133; < / RTI > Further comprising an electromagnetic induction-based metal particle detector.

An upper and lower magnet stage (110) in which a steel magnet is disposed to magnetize a fine metal corresponding to a metal foreign object;
An upper and lower coils 120 having a structure in which a coil wound around a conductor is disposed and an output of an induced electromotive force is connected to a metal foreign matter detection and control unit 130; And
A conveyor belt 141 for providing a movement of the fine metal magnetized by the upper and lower magnetic poles 110 to make a magnetic flux density change with respect to the upper and lower coil ends 120 to induce electromagnetic induction phenomenon by Faraday's law; And
A metal foreign object detection control unit 130 for detecting fine metal by amplifying a minute electromotive force when induction electromotive force is generated in the upper and lower coil ends 120; Lt; / RTI >
The upper and lower coil ends 120 are arranged in the form of one coil to which the upper coil end 121 and the lower coil end 122 are connected,
One of the upper coil ends 121 is connected to the ground (GND) and the other is connected to the lower coil end 122,
Wherein one of the lower coil ends (122) is formed in a structure connected to an input of an upper coil end (121) and the other of the lower coil end (122) and the OP AMP (121).