KR101466949B1 - Device and Method measuring PIM of Multi-band - Google Patents

Device and Method measuring PIM of Multi-band Download PDF

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Publication number
KR101466949B1
KR101466949B1 KR1020130135748A KR20130135748A KR101466949B1 KR 101466949 B1 KR101466949 B1 KR 101466949B1 KR 1020130135748 A KR1020130135748 A KR 1020130135748A KR 20130135748 A KR20130135748 A KR 20130135748A KR 101466949 B1 KR101466949 B1 KR 101466949B1
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South Korea
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frequency
signal
test signal
multiplexer
classified
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KR1020130135748A
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Korean (ko)
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서수덕
주재현
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주식회사 이너트론
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
    • H04B1/38—Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
    • H04B1/40—Circuits
    • H04B1/50—Circuits using different frequencies for the two directions of communication
    • H04B1/52—Hybrid arrangements, i.e. arrangements for transition from single-path two-direction transmission to single-direction transmission on each of two paths or vice versa
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
    • H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
    • H04B17/0087—Monitoring; Testing using service channels; using auxiliary channels using auxiliary channels or channel simulators
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/15—Performance testing
    • H04B17/19—Self-testing arrangements

Abstract

The present invention relates to a device for measuring PIM of a multi-band and a measuring method thereof. Provided is the device for measuring the PIM of the multi-band comprising a first signal generating device which generates a first frequency signal; a second signal generating device which generates a second frequency signal; a first power amp which generates an amplification first frequency signal by amplifying the first frequency signal; a second power amp which generates an amplification second frequency signal by amplifying the second frequency signal; a combiner which generates one test signal by composing the amplification first frequency signal and the amplification second frequency signal; a switching unit which generates a classified test signal by classifying the test signal according to the frequency and designates the path of the classified test signal; a multiplexer which receives the classified test signal from the switching unit, transmits the classified test signal to a measured device, filters the PIM component of the measured device according to the classified test signal, and removes the same; and a single output port which connects the multiplexer and the measured device.

Description

[0001] The present invention relates to a multi-band PIM measuring apparatus and a measuring method,

The present invention relates to a multi-band PIM measurement apparatus and a measurement method.

IMD (Intermodulation Distortion) refers to a phenomenon in which two or more signal frequencies interfere with each other to generate unwanted parasitic signals. IMD is classified into two types according to the device in which it is generated. What occurs in an active device such as a power amplifier is called a passive IMD (PIMD) that occurs in a passive device such as an active IMD, a filter or a duplexer. Unlike Active IMD, PIMD has been considered only in high-power communication systems such as satellite communication until recently, and has been neglected in commercial mobile communication.

However, as the mobile communication service is expanded, the interference between adjacent base stations increases and the IMD problem increases accordingly, so that not only the active IMD but also the problem of the PIMD are emerging. In the case of Active IMD, there is no big problem since it has been studied continuously for a long time. However, PIMD has not been considered in the construction of communication system until now,

If you look at the problems caused by the PIMD, depending on the power level of the signal, the communication system processes the noise signal as a data signal if the PIMD (ie,> -110 dBm) is above a certain level, A phenomenon of losing occurs. If this phenomenon is severe, the frequency band in which the PIMD is generated is completely blocked. This is a serious waste in terms of frequency resources. In terms of service providers, the frequency band allocated to one user is increased, resulting in a corresponding loss.

For these reasons, telecom operators in developed countries such as Europe offer rigid requirements for PIMD when purchasing products and check whether they meet the requirements and decide whether to purchase. However, SMEs that produce RF parts in Korea do not know the cause of PIMD, how to reduce it, and how to measure it.

In addition, there is not yet a standardized technical standard for PIMD in Korea, so some mobile communication companies are testing parts with internal regulations for several parts. Therefore, in order for domestic RF companies to meet the requirements of advanced telecommunication companies, it is necessary to develop reliable and standardized PIMD measurement system and measurement standard.

Korean Patent Publication No. 1020110002561

An embodiment of the present invention is to provide a multi-band PIM measurement apparatus and a measurement method capable of PIM measurement in multi-band and wide-band.

Another object of the present invention is to provide a multi-band PIM measuring apparatus and method that can solve the inconvenience of using multiple output ports when a conventional duplexer is installed in multiple stages.

Another object of the present invention is to provide a multi-band PIM measuring apparatus and method capable of overcoming the disadvantage that the PIM characteristic due to the switching part is deteriorated when the conventional duplexer is constituted by a single port with multi- Method.

Another problem to be solved by one embodiment of the present invention is to provide a multi-band PIM measuring apparatus which can reduce the size of the apparatus and can reduce the cost compared to a conventional apparatus using multiple apparatuses or a multi-stage duplexer And a measurement method.

In one embodiment of the present invention, there is provided an apparatus for generating a first frequency signal, the apparatus comprising: a first signal generator for generating a first frequency signal; a second signal generator for generating a second frequency signal; A power amplifier, a second power amplifier for amplifying the second frequency signal to generate an amplified second frequency signal, a combiner for combining the amplified first frequency signal and the amplified second frequency signal to generate a test signal, A switching unit for classifying the test signal according to frequency to generate a classified test signal and designating a path of the classified test signal, a control unit for receiving the classified test signal from the switching unit, A multiplexer for filtering the PIM component of the measured device according to the classified test signal and removing the PIM component, And a single output port for connecting the multiplexer and the measured device.

In one embodiment, the switching unit may obtain a frequency of the classified test signal, and may designate a band of the multiplexer corresponding to the frequency as a path of the classified test signal.

In another embodiment, the switching unit may obtain a corresponding frequency of the classified test signal, and exclude a band of the multiplexer corresponding to a frequency different from the corresponding frequency from the path of the classified test signal.

In another embodiment, the multiplexer includes a plurality of bands, wherein the multiplexer is capable of receiving the classified test signal corresponding to any one of the plurality of bands from the weighting section.

In another embodiment, the first signal generator, the second signal generator, the first power amplifier, the second power amplifier, the combiner, the switching unit, the multiplexer, and the single output port The tray may include a tray.

In another embodiment, the single output port connects the multiplexer and the measured device, wherein the multiplexer and the measured device are connected to one port.

One embodiment in accordance with the present invention is a method for generating a first frequency signal, the method comprising: generating a first frequency signal by a first signal generator; generating a second frequency signal by a second signal generator; Generating a first frequency signal; amplifying the second frequency signal by a second power amplifier to generate an amplified second frequency signal; combining the amplified first frequency signal and the amplified second frequency signal; Generating a test signal by classifying the test signal according to a frequency and designating a path of the classified test signal, and the step of designating a path of the classified test signal from the switching unit, Receiving the test signal and transmitting the classified test signal to the device under test, Removing by filtering the PIM component of the blood measuring instrument according to the signals, and the multiplexer device, the object to be measured may provide the PIM measurement method of the multi-band that is connected to a single output port.

In one embodiment, the switching unit may obtain a frequency of the classified test signal, and may designate a band of the multiplexer corresponding to the frequency as a path of the classified test signal.

In another embodiment, the switching unit may obtain a corresponding frequency of the classified test signal, and exclude a band of the multiplexer corresponding to a frequency different from the corresponding frequency from the path of the classified test signal.

In another embodiment, the multiplexer may receive the classified test signal from the portion of the plurality of bands including the plurality of bands, which corresponds to any of the plurality of bands.

In another embodiment, the single output port connects the multiplexer and the measured device, wherein the multiplexer and the measured device are connected to one port.

The multi-band PIM measurement apparatus and measurement method according to an embodiment of the present invention can perform PIM measurement in multi-band and wide-band.

The apparatus and method for measuring multi-band PIM according to an embodiment of the present invention can solve the inconvenience of using a plurality of output ports when a conventional duplexer is installed in multiple stages.

In addition, the multi-band PIM measuring apparatus and method according to an embodiment of the present invention can overcome the disadvantage that the PIM characteristic due to the switching part is deteriorated when the conventional duplexer is constituted by a single port with multiple stages.

The multi-band PIM measuring apparatus and measuring method according to an embodiment of the present invention can reduce the size of the apparatus and reduce the cost compared to the conventional PIM apparatus using multiple apparatuses or a multi-stage duplexer have.

1 is a block diagram illustrating a multi-band PIM measurement apparatus according to an embodiment of the present invention.
2 is a flowchart illustrating a method of measuring a PIM of a multi-band according to an embodiment of the present invention.

BRIEF DESCRIPTION OF THE DRAWINGS The above and other objects, features and advantages of the present invention will be more apparent from the following detailed description taken in conjunction with the accompanying drawings, in which: FIG. In the following description of the present invention, a detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear. The following terms are defined in consideration of the functions of the present invention, and these may be changed according to the intention of the user, the operator, or the like.

The present invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. These embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art to which the present invention pertains. Only. Therefore, the definition should be based on the contents throughout this specification.

Conventionally, there is a problem that measurement is possible only in a single frequency band and it is impossible to apply to various frequencies and broadband. Accordingly, in one embodiment of the present invention, measurement of a wide band is made possible by combining a multiband and a switching module. Accordingly, the embodiment of the present invention can reduce the size of the equipment while reducing the cost while measuring the PIM of the wide band.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1 is a block diagram illustrating a multi-band PIM measurement apparatus according to an embodiment of the present invention.

Referring to FIG. 1, a multi-band PIM measurement apparatus according to an embodiment of the present invention includes a first signal generator 111, a second signal generator 121, a first power amplifier 112, a second power amplifier 122, a combiner 200, a switching unit 300, a multiplexer 400, and a single output port 500.

The first signal generator 111 may generate the first frequency signal f1. Also, the second signal generator 121 may generate the second frequency signal f2.

The first power amplifier 112 may amplify the first frequency signal f1 to generate an amplified first frequency signal f1. Also, the second power amplifier 122 may amplify the second frequency signal f2 to generate an amplified second frequency signal. Here, the first power amplifier 112 and the second power amplifier 122 may include means for amplifying the frequency signal.

The combiner 200 may combine the amplified first frequency signal and the amplified second frequency signal to generate a single test signal.

The switching unit 300 may classify the test signal according to the frequency to generate the classified test signal. In addition, the path of the classified test signal can be designated. In one embodiment, the switching unit 300 may obtain the corresponding frequency of the classified test signal and designate the band of the multiplexer 400 corresponding to the frequency as the path of the classified test signal. In another embodiment, the switching unit 300 acquires the corresponding frequency of the classified test signal, and excludes the band of the multiplexer 400 corresponding to the frequency different from the frequency from the path of the classified test signal . As a result, according to the embodiment of the present invention, the size of the equipment can be reduced and the cost can be reduced as compared with the conventional PIM equipment using various equipment or a multi-stage duplexer.

The multiplexer 400 may receive the classified test signal from the switching unit 300. [ In addition, the classified test signal may be transmitted to the measured device, and the PIM component of the measured device according to the classified test signal may be filtered and removed. In one embodiment, the multiplexer 400 may include a plurality of bands, and the multiplexer 400 may receive the classified test signals corresponding to any of the plurality of bands from the weighting section. Accordingly, an embodiment of the present invention can solve the inconvenience of using multiple output ports when a conventional duplexer is installed in multiple stages.

The single output port 500 may couple the multiplexer 400 to the device under test. Here, the single output port 500 may connect the multiplexer 400 and the measured device, and the multiplexer 400 and the measured device may be connected to one port. Accordingly, an embodiment of the present invention can solve the inconvenience of using multiple output ports when a conventional duplexer is installed in multiple stages.

The multi-band PIM measurement apparatus according to an embodiment of the present invention includes a first signal generator 111, a second signal generator 121, a first power amplifier 112, a second power amplifier 122, A switching unit 200, a switching unit 300, a multiplexer 400, and a single output port 500, as shown in FIG.

2 is a flowchart illustrating a method of measuring a PIM of a multi-band according to an embodiment of the present invention.

Referring to FIG. 2, a method of measuring a multi-band PIM according to an exemplary embodiment of the present invention includes generating a first frequency signal f1 by a first signal generator 111, Generating a first frequency signal f2 by amplifying the first frequency signal f1 in a first power amplifier 112, generating an amplified first frequency signal by amplifying the first frequency amplifier f1, Amplifying the signal f2 to generate an amplified second frequency signal, combining the amplified first frequency signal and the amplified second frequency signal to generate a test signal, The switching unit 300 classifies the test signal according to the frequency to generate a classified test signal and designates the path of the classified test signal. The multiplexer 400 receives the classified signal from the switching unit 300, Receives a test signal, And transmitting the test signal to the device under measurement and the multiplexer 400 filtering and removing the PIM component of the device under test according to the classified test signal.

In step S201, the first signal generator 111 may generate the first frequency signal f1, and in step S202, the second signal generator 121 may generate the second frequency signal f2.

In step S203, the first power amplifier 112 may amplify the first frequency signal f1 to generate an amplified first frequency signal. In step S204, the second power amplifier 122 amplifies the second frequency signal f2 Can be amplified to generate an amplified second frequency signal.

In step S205, the combiner 200 may combine the amplified first frequency signal and the amplified second frequency signal to generate one test signal.

In step S206, the switching unit 300 may classify the test signal according to the frequency, generate the classified test signal, and designate the path of the classified test signal. In one embodiment, the switching unit 300 may obtain the corresponding frequency of the classified test signal and designate the band of the multiplexer 400 corresponding to the frequency as the path of the classified test signal. In another embodiment, the switching unit 300 acquires the corresponding frequency of the classified test signal, and excludes the band of the multiplexer 400 corresponding to the frequency different from the frequency from the path of the classified test signal . As a result, according to the embodiment of the present invention, the size of the equipment can be reduced and the cost can be reduced as compared with the conventional PIM equipment using various equipment or a multi-stage duplexer.

In step S207, the multiplexer 400 receives the classified test signal from the switching unit 300 and transmits the classified test signal to the measured device. In one embodiment, the multiplexer 400 may include a plurality of bands, and the multiplexer 400 may receive the classified test signals corresponding to any of the plurality of bands from the weighting section. Accordingly, an embodiment of the present invention can solve the inconvenience of using multiple output ports when a conventional duplexer is installed in multiple stages.

In step S208, the multiplexer 400 may filter and remove the PIM component of the device under test according to the classified test signal.

The multi-band PIM measurement method according to an embodiment of the present invention can connect the multiplexer 400 and the measured device to a single output port 500. Accordingly, it is possible to solve the inconvenience of using multiple output ports when a conventional duplexer is installed in multiple stages.

The steps of a method or algorithm described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. The software module may reside in RAM memory, flash memory, ROM memory, EPROM memory, EEPROM memory, registers, hard disk, removable disk, CD-ROM, or any other form of storage medium known in the art It will be possible. An exemplary storage medium would be capable of associating with the processor so that the processor could read information from, and write information to, the storage medium. Alternatively, the storage medium may be incorporated into the processor. The processor and the storage medium may reside in an ASIC. The ASIC may be located within the user terminal. Alternatively, the processor and the storage medium may reside as separate components in a user terminal.

All of the processes described above may be implemented within one or more general purpose or special purpose computers or software code modules executed by processors, and may be fully automated via the software code modules. The code modules may be stored on any type of computer-readable medium or on a collection of other computer storage devices or storage devices. Some or all of the above methods may alternatively be implemented within specialized computer hardware.

All of the methods and tasks described herein may be performed by a computer system and be fully automated. The computer system, in some cases, may be a computer system or a plurality of separate computers or computing devices (e.g., physical servers, workstations, , Storage arrays, etc.). Each such computing device typically includes a processor (or a collection of multiple processors or a circuit or a circuit, e.g., a module) that executes program instructions or modules stored in memory or other non-transitory computer- to be. Although some or all of the various functions described herein may be implemented as application-specific circuitry (e.g., ASICs or FPGAs) in a computer system, the various functions described may be implemented with such program instructions . When the computer system includes a plurality of computing devices, the devices may not be deployed in the same location, but may be deployed together. The results of the disclosed methods and tasks may be permanently stored in different states by solid state memory chips and / or by transducing physical storage devices such as magnetic disks.

Hereinafter, the emotion sharing method according to the present invention will be described in detail with practical examples. It should be understood, however, that the specific objects referred to in the respective embodiments are for the purpose of understanding the technical characteristics of the present invention, and the scope of the present invention is not limited to the specific objects.

111: first signal generator
112: First power amplifier
121: second signal generator
122: Second power amplifier
200: Combiner
300:
400: Multiplexer
500: single output port

Claims (11)

A first signal generator for generating a first frequency signal;
A second signal generator for generating a second frequency signal;
A first power amplifier for amplifying the first frequency signal to generate an amplified first frequency signal;
A second power amplifier for amplifying the second frequency signal to generate an amplified second frequency signal;
A combiner for combining the amplified first frequency signal and the amplified second frequency signal to generate a single test signal;
A switching unit for generating a test signal classified according to the frequency of the test signal and designating a path of the classified test signal;
A multiplexer for receiving the classified test signal from the switching unit, transmitting the classified test signal to the measured device, and filtering and removing the PIM component of the measured device according to the classified test signal; And
And a single output port connecting the multiplexer and the measured device,
Wherein the switching unit obtains a corresponding frequency of the classified test signal,
And the frequency band of the multiplexer corresponding to the frequency is designated as the path of the classified test signal.
delete The method according to claim 1,
Wherein the switching unit obtains a corresponding frequency of the classified test signal,
Wherein a band of the multiplexer corresponding to a frequency different from the frequency is excluded from the path of the classified test signal.
The method according to claim 1,
Wherein the multiplexer includes a plurality of bands,
Wherein the multiplexer receives the classified test signal corresponding to any one of the plurality of bands from the switching unit.
The method according to claim 1,
The first signal generator;
The second signal generator;
The first power amplifier;
The second power amplifier;
The combiner;
The switching unit;
The multiplexer; And
A tray capable of engaging the single output port;
Further comprising: a PIM measurement unit for measuring the PIM of the multi-band system.
The method according to claim 1,
Wherein the single output port connects the multiplexer and the measured device,
Wherein the multiplexer and the measured device are connected to one port.
The first signal generator generating a first frequency signal;
Generating a second frequency signal by a second signal generator;
The first power amplifier amplifying the first frequency signal to generate an amplified first frequency signal;
Amplifying the second frequency signal by a second power amplifier to generate an amplified second frequency signal;
A combiner combining the amplified first frequency signal and the amplified second frequency signal to generate a single test signal;
The switching unit classifies the test signal according to the frequency to generate a classified test signal, and designates a path of the classified test signal;
The multiplexer receiving the classified test signal from the switching unit and transmitting the classified test signal to the measured device; And
And a multiplexer filtering and removing the PIM component of the measured device according to the classified test signal,
Wherein the multiplexer and the measured device are connected to a single output port,
Wherein the switching unit obtains a corresponding frequency of the classified test signal,
Wherein the frequency of the multiplexer corresponding to the frequency is designated as the path of the classified test signal.
delete 8. The method of claim 7,
Wherein the switching unit obtains a corresponding frequency of the classified test signal,
Wherein a band of the multiplexer corresponding to a frequency different from the frequency is excluded from the path of the classified test signal.
8. The method of claim 7,
Wherein the multiplexer includes a plurality of bands,
And receiving the classified test signal from the switching unit corresponding to any one of the plurality of bands.
8. The method of claim 7,
Wherein the single output port connects the multiplexer and the measured device,
Wherein the multiplexer and the measured device are connected to one port.
KR1020130135748A 2013-11-08 2013-11-08 Device and Method measuring PIM of Multi-band KR101466949B1 (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016133264A1 (en) * 2015-02-17 2016-08-25 주식회사 감마누 Apparatus for automatically measuring pim
KR101658354B1 (en) 2016-03-30 2016-09-21 주식회사 웨이브트랙 Fmcw radar transceiver having dual signal generator
KR20180092569A (en) 2017-02-10 2018-08-20 주식회사 웨이브트랙 Apparatus for measuring multi-band pimd
KR20230049862A (en) 2021-10-07 2023-04-14 주식회사 이너트론 Slot-expandable PIM measurement apparatus and automatic PIM measurement method using the same
WO2024075881A1 (en) * 2022-10-06 2024-04-11 주식회사 이너트론 Slot-expandable pim measurement apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103368665A (en) * 2012-03-30 2013-10-23 中国联合网络通信有限公司广东省分公司 Multi-signal passive intermodulation test method, equipment and system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103368665A (en) * 2012-03-30 2013-10-23 中国联合网络通信有限公司广东省分公司 Multi-signal passive intermodulation test method, equipment and system

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016133264A1 (en) * 2015-02-17 2016-08-25 주식회사 감마누 Apparatus for automatically measuring pim
KR101658354B1 (en) 2016-03-30 2016-09-21 주식회사 웨이브트랙 Fmcw radar transceiver having dual signal generator
KR20180092569A (en) 2017-02-10 2018-08-20 주식회사 웨이브트랙 Apparatus for measuring multi-band pimd
KR20230049862A (en) 2021-10-07 2023-04-14 주식회사 이너트론 Slot-expandable PIM measurement apparatus and automatic PIM measurement method using the same
WO2024075881A1 (en) * 2022-10-06 2024-04-11 주식회사 이너트론 Slot-expandable pim measurement apparatus
KR20240048152A (en) 2022-10-06 2024-04-15 주식회사 이너트론 Slot-expandable PIM measurement apparatus

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