KR101395424B1 - Apparatus for measuring three-dimension and Controlling method of the same - Google Patents

Abstract

A three-dimensional measuring device is disclosed. The three-dimensional measuring apparatus includes a reflective three-dimensional measuring unit for obtaining a first interference pattern due to interference between a first reference light and reflected light reflected from an object; A transmission type three-dimensional measurement unit for acquiring a second interference fringe due to interference between the second reference light and the transmitted light passing through the object; And acquiring three-dimensional information of the object using the first interference fringe, acquiring a refractive index distribution of the object using the second interference fringe, reflecting the refractive index distribution of the object to the three-dimensional information of the object .

Description

[0001] The present invention relates to a three-dimensional measuring apparatus and a control method thereof,

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a measuring apparatus, and more particularly , to a three-dimensional measuring apparatus for three-dimensionally measuring an object and a control method thereof.

With the rapid development of IT technology, demand for small-sized video devices is rapidly increasing. Small-sized lenses are indispensable for small-sized imaging devices. Spherical lenses were generally used for small-sized imaging devices.

A spherical lens has been proposed in which a plurality of lenses are combined in order to compensate for the distortion of the spherical lens. However, the method using a multiple lens has a disadvantage in that it is difficult to reduce the size and weight, A method using an aspherical lens has been proposed.

      However, it is important to acquire three-dimensional information of an aspheric lens in the production of an aspheric lens.

      In order to obtain three-dimensional information of an aspheric lens, a technique of irradiating a laser to an object and acquiring three-dimensional information using a laser reflected from the object may be used, as disclosed in Korean Patent Registration No. 10-0798085 will be.

On the other hand, the material of the aspherical lens manufactured by injection is acrylic plastic. This material is more polarized than glass or quartz and is sensitive to heat and pressure. In the aspherical lens injection process, high heat and pressure are applied to the aspherical lens. If the applied heat and pressure are not uniform, the polarization ratio distribution of the entire lens is varied, and the birefringence value varies depending on the position of the lens. Which causes deterioration of performance. For this reason, measurement of the shape is also important in the production of the aspherical lens, but it is also very important to measure the refractive index distribution of the aspherical lens.

However, although the above publication discloses a method of acquiring three-dimensional information, a method of measuring the refractive index of an object is not disclosed.

SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and it is an object of the present invention to provide a three-dimensional measuring device capable of measuring the refractive index of an object and a control method thereof.

According to an aspect of the present invention, there is provided a reflection type three-dimensional measurement device for obtaining a first interference fringe due to interference between a first reference light and reflected light reflected from an object; A transmission type three-dimensional measurement unit for acquiring a second interference fringe due to interference between the second reference light and the transmitted light passing through the object; And acquiring three-dimensional information of the object using the first interference fringe, acquiring a refractive index distribution of the object using the second interference fringe, reflecting the refractive index distribution of the object to the three-dimensional information of the object And a control unit for controlling the three-dimensional measurement device.

According to another aspect of the present invention, there is provided an image processing method including: obtaining three-dimensional information of an object using a reflection type three-dimensional measurement unit; Acquiring a refractive index distribution of the object using a transmission type three-dimensional measurement unit; And reflecting the refractive index distribution of the object to the three-dimensional information of the object.

According to the present invention as described above, it is possible to acquire the three-dimensional information of the object together with the tangential magnification of the object.

1 is a schematic view of a three-dimensional measuring apparatus according to an embodiment of the present invention.
2 is a control block diagram illustrating a 3D measurement apparatus according to an embodiment of the present invention.
3 is a view illustrating an optical path of a reflection type three-dimensional measurement unit according to an embodiment of the present invention.
4 is a view showing a first interference fringe photographed by the photographing unit when the reflection type three-dimensional measuring unit operates according to an embodiment of the present invention.
FIG. 5 is a diagram illustrating three-dimensional information obtained by phase-spreading a first interference fringe photographed by a photographing unit of a three-dimensional measurement apparatus when the reflection type three-dimensional measurement unit according to an embodiment of the present invention operates.
6 is a view illustrating an optical path of a transmission type three-dimensional measurement unit of a three-dimensional measurement apparatus according to an embodiment of the present invention.
7 is a view illustrating a second interference pattern photographed by a photographing unit of a three-dimensional measuring apparatus when the transmission type three-dimensional measuring unit according to an embodiment of the present invention operates.
8 is a view showing a refractive index distribution obtained by using a second interference fringe photographed by a photographing unit of a three-dimensional measuring apparatus when the transmission type three-dimensional measuring unit according to an embodiment of the present invention operates.
9 is a view showing that a three-dimensional measurement apparatus according to an embodiment of the present invention reflects a refractive index distribution on three-dimensional information of an object.
10 is a flowchart illustrating a method of controlling a three-dimensional measurement apparatus according to an embodiment of the present invention.

The present invention is capable of various modifications and various embodiments, and specific embodiments are illustrated and described in the drawings. It should be understood, however, that the invention is not intended to be limited to the particular embodiments, but includes all modifications, equivalents, and alternatives falling within the spirit and scope of the invention.

The terms including ordinal, such as second, first, etc., may be used to describe various elements, but the elements are not limited to these terms. The terms are used only for the purpose of distinguishing one component from another. For example, without departing from the scope of the present invention, the second component may be referred to as a first component, and similarly, the first component may also be referred to as a second component. And / or < / RTI > includes any combination of a plurality of related listed items or any of a plurality of related listed items.

It is to be understood that when an element is referred to as being "connected" or "connected" to another element, it may be directly connected or connected to the other element, . On the other hand, when an element is referred to as being "directly connected" or "directly connected" to another element, it should be understood that there are no other elements in between.

The terminology used in this application is used only to describe a specific embodiment and is not intended to limit the invention. The singular expressions include plural expressions unless the context clearly dictates otherwise. In the present application, the terms "comprises" or "having" and the like are used to specify that there is a feature, a number, a step, an operation, an element, a component or a combination thereof described in the specification, But do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, or combinations thereof.

Unless defined otherwise, all terms used herein, including technical or scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Terms such as those defined in commonly used dictionaries are to be interpreted as having a meaning consistent with the contextual meaning of the related art and are to be interpreted as either ideal or overly formal in the sense of the present application Do not.

Hereinafter, embodiments will be described in detail with reference to the accompanying drawings, wherein like or corresponding elements are denoted by the same reference numerals, and redundant description thereof will be omitted.

FIG. 1 is a schematic view of a three-dimensional measuring apparatus according to an embodiment of the present invention, and FIG. 2 is a control block diagram showing a three-dimensional measuring apparatus according to an embodiment of the present invention.

Referring to FIGS. 1 and 2, a reflection type three-dimensional measurement unit 100 for obtaining three-dimensional information of an object by using a laser reflected from a laser by irradiating the object with a laser, And a control unit 300 for controlling the transmission type three-dimensional measurement unit 200 and the reflection type three-dimensional measurement unit 100 and the transmission type three-dimensional measurement unit 200 as a whole.

The reflection type three-dimensional measurement unit 100 includes a first laser 110, a first optical diffusion unit 120, a first shutter 130, a first optical splitter 140, a first objective lens 150, A second optical splitter 160, a first mirror 170, an eyepiece 180, and a photographing unit 190. A first light diffusion unit 120, a first shutter 130, and a first light splitter 140 are sequentially disposed in front of the first laser 110. The first objective lens 150 and the second optical splitter 160 are sequentially arranged below the line segment connecting the first laser divider 140 and the first laser 110 of the first optical splitter 140 And the eyepiece 180 and the photographing unit 190 are sequentially arranged on the vertical upper side. The first mirror 170 is disposed on the right side of the line segment connecting the first objective lens 150 and the second light splitter 160 of the second light splitter 160.

The transmission type three-dimensional measurement unit 200 includes a second laser 210, a second optical diffusion unit 220, a third optical splitter 215, a second shutter 230, a fourth optical splitter 260, And includes a light splitter 140, a second objective lens 250, a second mirror 270, a second light splitter 160, a first objective lens 150, a eyepiece 180, do. A second optical diffusing unit 220, a third optical splitter 215, and a second mirror 270 are sequentially disposed in front of the second laser 210. The second shutter 230 and the fourth optical splitter 260 are sequentially disposed on the upper side of the line segment connecting the second laser 210 and the third optical splitter 215 of the third optical splitter 215 And the first light splitter 140 is disposed on the right side of the fourth light splitter 260. [ A second objective lens 250, a second optical splitter 160, a first optical splitter 140, an eyepiece 180, and a photographing unit 190 are sequentially disposed on the upper side of the second mirror 270 .

Here, the first optical splitter 140, the first objective lens 150, the second optical splitter 160, the eyepiece 180, and the photographing unit 190 are provided with a reflection type three-dimensional measurement unit 100, (200) are shared with each other.

Hereinafter, the operation of the control unit 300 to acquire three-dimensional information of the object S using the reflective 3D measurement unit 100 will be described with reference to the drawings.

FIG. 3 is a view illustrating an optical path of a reflection type three-dimensional measurement unit of a three-dimensional measurement apparatus according to an embodiment of the present invention, FIG. 4 is a view illustrating an optical path of a reflection type three-dimensional measurement unit according to an exemplary embodiment of the present invention, 5 is a view showing three-dimensional information obtained by phase-spreading a first interference fringe photographed by a photographing unit of a three-dimensional measuring apparatus according to an embodiment of the present invention. FIG. to be.

3 to 5, when the controller 300 turns on the first laser 110 and the first shutter 130, the laser light emitted from the first laser 110 passes through the first path 110 P1 and the second path P2 and is incident on the photographing unit 190. [ Here, the second path P2 includes a first laser 110, a first shutter 130, a first optical splitter 140, a first objective lens 150, a second optical splitter 160, an object S The second optical splitter 160, the first objective lens 150, the first optical splitter 140, the eyepiece 180, and the photographing unit 190 in this order. The first path P1 includes a first laser 110, a first shutter 130, a first optical splitter 140, a first objective lens 150, a second optical splitter 160, a first mirror 170 The second optical splitter 160, the first objective lens 150, the first optical splitter 140, the eyepiece 180, and the photographing unit 190 in this order. Here, the first path P1 is the path through which the first reference light passes, and the second path P2 is the path through which the reflected light passes.

On the other hand, a length difference between the first path P1 and the second path P2 is generated due to the shape of the reflecting surface of the object S. Due to such a length difference, a phase difference of light passing through the first path P1 and the second path P2 is generated.

When the wavelength of the laser beam emitted from the first laser 110 is? 1, the phase difference between the first reference beam passing through the first path P1 and the reflected beam passing through the second path P2 is expressed as Equation 1.

[Equation 1]

?? 1 = 2? * Ps /? 1

Here,? 1 is the phase difference between the first reference light passing through the first path P1 and the reflected light passing through the second path P2, Ps is the length difference between the first path P1 and the second path P2, And is the wavelength of the laser beam emitted from the first laser 110. [

The controller 300 acquires the three-dimensional information of the object S using the phase difference of the light passing through the first path P1 and the second path P2.

That is, the laser light passing through the first path P1 and the laser light passing through the second path P2 due to the phase difference of the laser light passing through the first path P1 and the second path P2, And this first interference fringe is photographed in the photographing section 190 as shown in Fig.

The control unit 300 acquires the three-dimensional information of the object S as shown in Fig. 5 using the first interference fringe captured by the photographing unit 190. Fig. That is, the controller 300 phase-spreads the first interference pattern.

Hereinafter, the operation of the control unit 300 to acquire the refractive index distribution of the object S using the transmission type three-dimensional measurement unit 200 will be described with reference to the drawings.

FIG. 6 is a view illustrating an optical path of a transmission type three-dimensional measurement unit of a three-dimensional measurement apparatus when the transmission type three-dimensional measurement unit operates according to an embodiment of the present invention. FIG. FIG. 8 is a view showing a second interference pattern photographed by the photographing unit of the three-dimensional measuring apparatus according to an embodiment of the present invention. FIG. And FIG.

6 to 8, when the controller 300 turns on the second laser 210 and the second shutter 230, the laser beam emitted from the second laser 210 passes through the third path P3 And the fourth path P4, and is incident on the photographing unit 190. [ The fourth path P4 includes a second optical diffusion unit 220, a third optical splitter 215, a second shutter 230, a fourth optical splitter 260, a first optical splitter 140, And the lens 180 sequentially. The third path P3 includes a second optical diffusion unit 220, a second mirror 270, a second objective lens 250, an object S, a second optical splitter 160, a first objective lens 150 ), The first optical splitter 140, and the eyepiece 180 sequentially. Here, the third path P3 is a path through which transmitted light passes, and the fourth path P4 is a path through which the second reference light passes.

On the other hand, due to the refractive index of the object S, a velocity difference of light passing through the third path P3 and the fourth path P4 is generated, and thereby, the light passing through the third path P3 and the fourth path P4 A phase difference is generated.

That is, the velocity of the laser beam emitted from the second laser 210 is proportional to the ratio of the refractive index of the optical members on the fourth path P4 to the refractive index of the optical members on the third path P3, The phase difference of the transmitted light passing through the second reference light and the third path P3 is generated, and this relationship is expressed by the following equation (2). Here, the refractive index of the object S on the third path P3 is also reflected.

[Equation 2]

Δφ1 α C / V

Here, C is the velocity of the transmitted light passing through the third path P3, and V is the velocity of the second reference light passing through the fourth path P4.

On the other hand, it is preferable that the refractive indexes of the optical members on the fourth path P4 and the optical paths on the third path P3 other than the object S are designed to be substantially equal to each other.

The control unit 300 acquires the refractive index distribution of the object S using the phase difference of the light passing through the third path P3 and the fourth path P4.

That is, the transmitted light passing through the third path P3 and the second reference light passing through the fourth path P4 due to the phase difference of the light passing through the third path P3 and the fourth path P4 make interference patterns, The second interference fringe is photographed in the photographing section 190 as shown in Fig.

The control unit 300 acquires the refractive index distribution of the object S as shown in FIG. 8 using the second interference fringe captured by the photographing unit 190. [

9 is a view showing that a three-dimensional measurement apparatus according to an embodiment of the present invention reflects a refractive index distribution on three-dimensional information of an object. In Fig. 9, the vertical axis indicates the refractive index.

9, the controller 300 controls the first and second shutters 130 and 230 included in the reflection type three-dimensional measurement unit 100 or the transmission type three-dimensional measurement unit 400 and the first and second laser Dimensional information and the refractive index distribution of the object S using the first and second interference fringes photographed by the photographing unit 190 by controlling the first and the second interference fringes 110 and 210. Then, And reflects the refractive index distribution in the three-dimensional information of the light source S.

Hereinafter, a method of controlling a three-dimensional measuring apparatus according to an embodiment of the present invention will be described with reference to the drawings.

10 is a flowchart illustrating a method of controlling a three-dimensional measurement apparatus according to an embodiment of the present invention.

10, a method of controlling a three-dimensional measurement apparatus according to an exemplary embodiment of the present invention includes a step 1010 of acquiring three-dimensional information of an object S using a reflection type three-dimensional measurement unit 100, A step 1020 of obtaining a refractive index distribution of the object S using the transmission type three-dimensional measurement unit 100 and a step 1030 of obtaining three-dimensional information of the object S reflecting the refractive index distribution.

First, the control unit 300 turns on the first laser 110 and the first shutter 130 to perform the step of acquiring the three-dimensional information of the object S using the reflective 3D measurement unit 100, (1011). At the same time, the controller 300 acquires a first interference fringe incident on the photographing unit 130 as shown in FIG. 4 (1012). Using the obtained first interference fringe, the first interference fringe is phase-spreaded Dimensional information on the object S (1013).

The control unit 300 then turns off the first laser 110 and the first shutter 130 to perform the step of acquiring the refractive index distribution of the object S using the transmission type three-dimensional measurement unit 200 And turns on the second laser 210 and the second shutter 260 (1021). At the same time, the control unit 300 obtains a second interference fringe incident on the photographing unit 130 as shown in FIG. 7 (1022) and acquires a refractive index distribution as shown in FIG. 8 using the obtained second interference fringe 1022 ).

Next, the control unit 300 obtains the three-dimensional information of the object S reflecting the refractive index distribution as shown in FIG. 9 by reflecting the refractive index distribution of the object S to the three-dimensional information about the object S (1030).

As used in this embodiment, the term " portion " refers to a hardware component such as software or an FPGA (field-programmable gate array) or ASIC, and 'part' performs certain roles. However, 'part' is not meant to be limited to software or hardware. &Quot; to " may be configured to reside on an addressable storage medium and may be configured to play one or more processors. Thus, by way of example, 'parts' may refer to components such as software components, object-oriented software components, class components and task components, and processes, functions, , Subroutines, segments of program code, drivers, firmware, microcode, circuitry, data, databases, data structures, tables, arrays, and variables. The functions provided in the components and components may be further combined with a smaller number of components and components or further components and components. In addition, the components and components may be implemented to play back one or more CPUs in a device or a secure multimedia card.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the present invention as defined by the following claims It can be understood that

S: Object 100: Reflective 3D measurement part
200: transmission type three-dimensional measuring unit 300:

Claims (7)

A reflection type three-dimensional measurement unit for obtaining a first interference fringe due to interference between a first reference light generated through the laser light emitted from the first laser and a reflection light generated by reflecting the laser light of the first laser from the object, ;
Dimensional measurement unit for acquiring a second interference fringe due to interference between the second reference light generated through the laser light emitted from the second laser and the transmitted light generated by the laser light of the second laser transmitted through the object, ; And
Acquiring three-dimensional information of the object using the first interference fringe, acquiring a refractive index distribution of the object using the second interference fringe, and reflecting the refractive index distribution of the object to the three-dimensional information of the object A three-dimensional measuring device comprising a control part. The method according to claim 1,
Wherein the controller obtains three-dimensional information of the object by spreading the phase of the first interference fringe. The method according to claim 1,
Wherein a length of the first reference light and a length of the reflected light are different depending on the shape of the object. The method according to claim 1,
Wherein the velocity of the second reference light and the transmitted light have a difference corresponding to a refractive index of the object. The first interference light obtained by interference between the first reference light generated through the laser light emitted from the first laser and the reflection light generated by reflecting the laser light of the first laser by the reflection type three- Acquiring three-dimensional information of the object through a pattern;
A second interference light generated by the interference of the second reference light generated through the laser light emitted from the second laser and the transmission light generated by the laser light of the second laser transmitted through the object, Acquiring a refractive index distribution of the object through a pattern; And
And reflecting the refractive index distribution of the object to the three-dimensional information of the object. 6. The method of claim 5,
Wherein the obtaining of the three-dimensional information of the object includes phase-spreading the first interference fringe to obtain three-dimensional information of the object. delete

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