KR101274528B1 - Magnetic particle testing apparatus - Google Patents

Abstract

The present invention relates to a magnetic particle flaw detector, which is one of nondestructive tests, comprising: a frame; A pair of guide rails provided parallel to the upper surface of the frame; A first electrode part provided at one side of the guide rail and movable along the guide rail, and having a contact head mounted at an inner end thereof and an insulating cradle mounted at the contact head; An elastic body connected to the first electrode part to elastically move the first electrode part along the guide rail; A second electrode part which can be fixed to the guide rail while facing the first electrode part, and has a contact head mounted on an inner end thereof and an insulating cradle mounted on the contact head; And an integrated coil electrode part provided between the first electrode part and the second electrode part and movable along the guide rail and supplied with electricity through both ends of the coil shape. A test may be performed by selectively connecting a probe to the first electrode part and the second electrode part or by connecting the probe to the integrated coil electrode part.

Description

Magnetic Particle Scanning Device {MAGNETIC PARTICLE TESTING APPARATUS}

The present invention relates to a magnetic particle flaw detector, which is one of non-destructive tests, and relates to a new type of magnetic particle flaw detector capable of testing various types of test objects.

Various parts manufactured by processing metal materials often have minute defects invisible.

Defects such as cracks present in and out of parts cause cracks to grow over time, causing vibration and fracture. That is, since a minute crack often becomes a starting point of fracture, a thorough inspection is required.

Overlooked microdefects can have a serious impact on the entire machine, causing downtime, and other factors that can lead to many parts being replaced.

In particular, attention should be paid to such fine defects, particularly in the case of parts that operate at high speed or require precision.

The methods for finding defects on processed products are collectively called nondestructive testing.

Non-destructive Testing (NDT) is a method that detects changes in transmission, absorption, scattering, reflection, penetration, leakage, etc. by giving a certain kind of input without changing the shape or dimensions of the product. It refers to the inspection method that examines the presence or absence of abnormality, its size, and distribution state without destroying the test object by comparison of the present invention.

Non-destructive inspection is used for quality control, quality evaluation, and maintenance inspection because inspection does not cause any damage to outside, unlike destruction inspection, which destroys and inspects an object.

There are six non-destructive testing methods that are widely applied in Korea.

In other words, the types of non-destructive testing are Radiographic Testing (RT), Magnetic Particle Testing (MT), Liquid Penetrant Testing (PT), Ultrasonic Testing (UT), Vortex It is classified into ET (Eddy Current Testing) and Leak Testing (LT).

Various non-destructive testing methods have their strengths and weaknesses. Therefore, the testing method should be selected according to the characteristics of the test objects, and more than one method may be used in combination.

In accordance with the present invention, magnetic particle inspection (MT) is a method of detecting defects using leakage magnetic flux when magnetic particles are sprayed onto the surface of a ferromagnetic material.

The magnetic particle inspection method can visually identify the location of a defect by using a magnetic particle pattern formed in a magnetic powder pattern caused by disturbance of the magnetic force line in the portion when the magnetic force line passes through the defect portion. .

This method detects cracks, inclusions, pores, insufficient penetration, etc., which are relatively close to the surface. Defects inside are less detectable. In addition, it cannot be used for nonmagnetic materials such as austenitic stainless steel.

The magnetic powder is usually a powder of iron or magnetic iron oxide (Fe3 O4), and white, red, and black magnetic powder are used to contrast with the specimen.

Magnetic particle inspection can be roughly classified into axial conduction method and coil method, axial conduction method is to find longitudinal defect of specimen, and coil method is to find transverse defect of specimen. When a current is sent in the longitudinal direction of the coated specimen, the magnetic field is circular due to the current and the right hand rule of the magnetic field.

In a direction perpendicular to the circular magnetic field, a defect (CRACK) is detected.

In the coil method, a right (CRACK) is detected in a direction perpendicular to the linear magnetic field by the linear magnetic field passing through the coil by the right hand law.

In addition, the magnetic particle flaw detection method may be classified into a linear magnetization method and a circular magnetization method according to the magnetization shape of the magnetic powder. The linear magnetization method includes a yoke method, and the circular magnetization method includes a fraud method. The PROD method allows a circular magnetic field to be formed around the test object by directly conducting electricity by contacting the electrode with the test object, or conducting a conduction by placing a conductor inside a hollow test object such as a tube to form a circular magnetic field in the test specimen. To be able to inspect.

The FDR method is very convenient because the two probes can be easily contacted with the test object to check for the presence of defects.

Registered Utility Model No. 20-0414978 of Korea (registered April 20, 2006)

The present invention is to provide a useful magnetic particle inspection apparatus capable of performing a test on various types of test objects by the cylindrical and coil magnetic particle inspection in one magnetic particle inspection device.

In addition, the present invention is to provide a magnetic particle inspection device that is convenient to mount the test object and excellent in safety.

The magnetic particle flaw detection apparatus of the present invention as described above, comprising: a frame; A pair of guide rails provided parallel to the upper surface of the frame; A first electrode part provided at one side of the guide rail and movable along the guide rail, and having a contact head mounted at an inner end thereof and an insulating cradle mounted at the contact head; An elastic body connected to the first electrode part to elastically move the first electrode part along the guide rail; A second electrode part which can be fixed to the guide rail while facing the first electrode part, and has a contact head mounted on an inner end thereof and an insulating cradle mounted on the contact head; And an integrated coil electrode part provided between the first electrode part and the second electrode part and movable along the guide rail and supplied with electricity through both ends of the coil shape. A test may be performed by selectively connecting a probe to the first electrode part and the second electrode part or by connecting the probe to the integrated coil electrode part.

The magnetic particle flaw detection apparatus of the present invention includes a mounting plate placed on the two insulating holders and having a top plate made of an insulator and a current carrying plate coupled to the top plate, wherein the current carrying plate is connected to each of the contact heads to allow electricity to flow. It features.

And in the present invention, the insulating cradle is formed in the concave groove from the top surface to place the test object or the conducting rod on the mounting groove so that the test object or the conducting rod is connected to the contact head so that electricity can pass through. It features.

And the first electrode unit in the present invention; A first bottom plate inserted into the guide rail, a first inner vertical plate coupled vertically to one end of the first bottom plate, a contact head coupled to the first inner vertical plate, and an insulating cradle coupled to the contact head And an outer vertical plate coupled to the other end of the first bottom plate, and a fixing plate fixed to the guide rail end so as to face the outer vertical plate, one end of which is fixed to the fixing plate and the other end penetrates the outer vertical plate, It is made of a guide rod that is formed so as to protrude from the separation prevention jaw; The elastic body surrounds the guide rod, one end of which contacts the fixing plate and the other end of which contacts the outer vertical plate outer surface; The second electrode unit; A second bottom plate inserted into the guide rail, a second inner vertical plate coupled vertically to one end of the second bottom plate, a contact head coupled to the second inner vertical plate, and an insulating cradle coupled to the contact head And a clamp for fixing the second bottom plate to the guide rail.

The present invention has the effect that it is possible to test a variety of test objects by selectively adopting the shaft energization method and the coil method in one device.

In addition, the magnetic particle flaw detector according to the present invention can move elastically in a predetermined range so that the test object can be mounted more conveniently, and the safe use can be achieved.

In addition, the present invention is produced separately from the prod equipment, it is also possible to produce a good portability and low cost because the test only need to connect the prod to the electrode.

1 is a schematic perspective view showing a preferred embodiment of the magnetic particle inspection device according to the present invention.
FIG. 2 is a modified embodiment showing a case where electricity is supplied to the integrated coil electrode part in the magnetic particle flaw detector according to FIG. 1. FIG.
3 to 6 are illustrations of an example of a magnetic particle flaw test using the magnetic particle flaw detector according to the embodiment of the present invention.

DETAILED DESCRIPTION Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art may easily implement the present invention. The present invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. In order to clearly illustrate the present invention in the drawings, portions not related to the description are omitted, and like reference numerals are given to similar portions throughout the specification.

Whenever a component is referred to as "including" an element throughout the specification, it is to be understood that the element may include other elements, not the exclusion of any other element, unless the context clearly dictates otherwise.

1 is a schematic perspective view showing a preferred embodiment of the magnetic particle inspection device according to the present invention, Figure 2 is a modified embodiment showing a case where electricity is supplied to the integral coil electrode in the magnetic particle inspection device according to FIG. . 3 to 6 are exemplary views showing an example of a magnetic particle flaw test using a magnetic particle flaw detector according to an embodiment of the present invention.

As shown, the magnetic particle flaw detector according to the present embodiment is connected to the probe P of the probe equipment 10 so as to be connected to the electrode unit, thereby supplying electricity.

The prod equipment 10 itself is well known and can be used by purchasing an appropriate specification. The magnetic particle flaw detection device is manufactured separately from the prod equipment 10 and may be connected to the prod equipment only during the test.

The magnetic particle flaw detector according to the present embodiment is provided with a frame 100 forming a basic skeleton, and a pair of guide rails 200 are provided on the upper surface of the frame 100. The guide rails 200 are arranged in parallel to each other at a predetermined distance with a long member, and the guide grooves 210 are formed on the inner surface of the guide rails 200.

The first electrode part 300, the second electrode part 400, and the integrated coil electrode part 500 are provided on the guide rail 200, and the first electrode part 300 and the second electrode part 400 are basically provided. And the integrated coil electrode part 500 is fitted into the guide groove 210 of the guide rail 200 to be restrained and move in position as necessary.

The first electrode part 300 is provided from one side of the guide rail 200, is supported by the elastic body 380 and can be moved within a predetermined range along the guide rail 200, and the first electrode part ( The contact head 330 is mounted at the inner end of the 300, and the insulating cradle 370 is formed at the contact head 330.

The contact head 330 is preferably a plate-like body such as a copper plate, the insulating holder 370 is preferably made of a material that does not pass through the use of synthetic resin.

More specifically, the first electrode part 300 includes a first bottom plate 310, a first inner vertical plate 320, a contact head 330, an outer vertical plate 340, a fixing plate 350, and a guide rod 360. ), And includes an insulating cradle 370, and is supported by the elastic body 380 to be movable.

The first bottom plate 310 is a flat plate-like body so that the front and rear edges of the first bottom plate 310 are inserted into the guide groove 210 of the guide rail 200 to move.

The first inner vertical plate 320 is coupled to be perpendicular to the right end of the first bottom plate 310, and the first inner vertical plate 320 is firmly fixed to the first bottom plate 310. A plurality of reinforcing plates 390 are provided on the outside of the left side of the inner vertical plate 320 so that the first bottom plate 310 and the first inner vertical plate 320 may be connected to each other by the reinforcing plate 390. do.

The contact head 330 is coupled to an inner side of the first inner vertical plate 320, and the contact head 330 uses a copper plate having a rectangular plate shape.

The contact head 330 is provided with an insulating cradle 370, preferably the insulating cradle 370 is coupled near the bottom of the contact head 330. The insulating cradle 370 is made of a material such as synthetic resin that does not conduct electricity, and is to protrude more than the right side of the contact head 330.

Preferably, the insulating holder 370 is formed with a recessed groove 371 concave from the upper surface, in the case of the present embodiment is to be formed in the V-shaped mounting groove 371. As shown in FIG. 4 or FIG. 5, one end of the rod-shaped test object 20 or the energizing rod 600 is placed in the mounting groove 371 so that the test object 20 or the energizing rod 600 is connected to the contact head 330. To be possible.

The outer vertical plate 340 is coupled to the left end of the first bottom plate 310. The outer vertical plate 340 is lower in height than the first inner vertical plate 320 and is preferably connected to the reinforcing plate 390.

On the other hand, the fixing plate 350 that is fixed to face the outer vertical plate 340 is provided at the left end of the guide rail (200).

The fixing plate 350 is coupled to the guide rail 200 so as not to move, and the fixing plate 350 and the outer vertical plate 340 are connected to each other through the guide rod 360 and the elastic body 380.

One end of the guide rod 360 is fixedly connected to the fixed plate 350, and the other end of the guide rod 360 passes through the outer vertical plate 340. The other end of the guide rod 360 is formed with a protruding departure prevention jaw so that the outer vertical plate 340 does not leave the guide rod 360.

In addition, the guide rod 360 is to be wrapped by an elastic body 380 such as a coil spring. One end of the elastic body 380 is in contact with the fixing plate 350, the other end of the elastic body 380 is in contact with the outer surface of the left side of the outer vertical plate 340.

The first bottom plate 310, the first inner vertical plate 320, and the outer vertical plate 340 are integrally coupled to each other, and the outer vertical plate 340 is the guide rod 360 and the elastic body with respect to the fixed plate 350. Since the first bottom plate 310, the first inner vertical plate 320, and the outer vertical plate 340 are elastically movable within a predetermined range along the guide rail 200 because they are connected to the 380. do.

The second electrode part 400 may be disposed to face the first electrode part 300, and may be moved along the guide groove 210 of the guide rail 200. When the positioning is made, the guide rail 200 may be disposed. Is fixed to. The contact head 430 is also coupled to the inner end of the second electrode unit 400, and the insulating cradle 440 is mounted to the contact head 430.

The insulating holder 440 is recessed groove (not shown) is formed concave from the upper surface, in the present embodiment is a mounting groove (not shown) in the V shape.

More specifically, in the present embodiment, the second electrode part 400 includes a second bottom plate 410, a second inner vertical plate 420, a contact head 430, an insulating cradle 440, and a clamp 450. Shall be.

The second bottom plate 410 is a rectangular plate-like body that can be moved into the guide groove 210 formed in the front and rear ends of the guide rail 200. The second inner vertical plate 420 is vertically coupled to one end of the second bottom plate 410, and the reinforcing plate 460 is further coupled for firm coupling.

A contact head 430 made of plate-like copper is coupled to the second inner vertical plate 420, and an insulating cradle 440 is coupled to the contact head 430.

Unlike the first electrode 300, the second electrode 400 must be fixed to the guide rail 200 when a predetermined position is determined. Therefore, a clamp 450 is provided to fix the second electrode 400 to the guide rail 200. The clamp 450 is fastened to the second bottom plate 410 by a bolt and is fixed while the clamp 450 is in close contact with the upper surface of the guide rail 200.

In each of the contact heads 330 and 430 in the first electrode part 300 and the second electrode part 400, one insulating cradle 370 and 440 is provided.

As shown in FIG. 3, the mounting plates 700 are installed between the first electrode part 300 and the second electrode part 400 using the insulating holders 370 and 440. The mounting plate 700 is composed of an upper plate 710 and a conductive plate 720 coupled to a lower portion thereof. The upper plate 710 is made of an insulator which is not electrically conductive, and the conductive plate 720 is the same as the copper plate.

Each end of the mounting plate 700 is placed on the insulating cradles 370 and 440 of the first electrode part 300 and the second electrode part 400, and the conduction plate 720 of the mounting plate 700 is formed at each contact head ( 330 and 430 are connected to the electricity flows.

Since the first electrode 300 may move elastically, when the mounting plate 700 is placed on the insulating holders 370 and 440 of the first electrode 300 and the second electrode 400, the first electrode 300 may be moved. ) Is advanced or retracted in accordance with the length of the mounting plate 700, the conductive plate 720 of the mounting plate 700 is in close contact with each contact head (330, 430).

The test object 20 can be placed on the top plate of the mounting plate 700 to proceed with the test. When electricity flows along the energizing plate 720, the test object 20 placed on the top plate is magnetized and placed on the surface of the test object 20. The distribution of embedded magnetic particles can confirm the presence of defects in the test object.

When placing the recessed groove 371 in the center of the insulating holder (370, 440) coupled to the two contact heads (330, 430) can be tested by placing a long test object of the rod on the mounting groove (371), or The test object 20 in the form of a hollow tube that puts the energizing rod 600 on the 371 and surrounds the energizing rod 600 may be tested.

That is, depending on the shape of the test object 20, by placing the test object 20 directly in the mounting groove 371 to allow electricity to flow along the test object 20, in the case of a test object in the form of a hollow tube Place the energizing rod 600 in the mounting groove 371, the test object 20 is in the form of wrapping the energizing rod 600 to proceed with the test.

In addition to the first electrode part 300 and the second electrode part 400, the magnetic particle flaw detector according to the present invention further includes an integrated coil electrode part 500.

The integrated coil electrode part 500 is provided on the guide rail 200 between the first electrode part 300 and the second electrode part 400, and the integrated coil electrode part 500 is also a guide groove of the guide rail 200. To be able to move along 210.

The integral coil electrode part 500 is wound several times like a coil shape, and this is also manufactured using a copper plate. Electricity is supplied through both ends of the unitary coil electrode unit 500. When the test object 20 is disposed along the center of the unitary coil electrode unit 500, and electricity flows through the unitary coil electrode unit 500, therein, It is possible to test whether there are any defects on the placed test object.

The integrated coil electrode part 500 includes a bottom plate 510 fitted into the guide groove 210 of the guide rail 200 and two support plates 520 coupled to the top surface of the bottom plate 510. The coil 530 is disposed between the 520 and fixedly connected to the support plate 520.

Magnetic particle inspection device according to an embodiment of the present invention is provided with a first electrode portion 300, a second electrode portion 400 and the integral coil electrode portion 500, and optionally equipped with a probe object according to the test object 20 The probe P of 10 may be connected to the first electrode part 300 and the second electrode part 400 or may be connected to both ends of the integrated coil electrode part 500 so that electricity may be supplied.

In order to supply electricity to the first electrode 300 and the second electrode 400, or to supply electricity to the integrated coil electrode 500, in this embodiment, one side of the guide rail 200. A probe terminal K which may be connected to the first electrode unit 300 may be placed on the second electrode unit 300, and a probe terminal K may also be placed on the second electrode unit 400. The probe terminal K for the first electrode part 300 allows the probe terminal K to be connected to the contact head 330 using the connection jack L. FIG.

In the case of the second electrode part 400, the probe terminal K is formed to be adjacent to the contact head 430 to directly connect the probe P, and the probe terminal K and the integrated coil electrode part 500 may be formed. The other end is always connected by the connecting jack (L).

On the other hand, when using the integrated coil electrode unit 500 as necessary, by adjusting the connection jack (L) connecting the fed terminal (K) and the contact head 330 of the first electrode portion 300 to the fed terminal (K) And one end of the integrated coil electrode unit 500 are connected by the connection jack (L).

Therefore, only the adjustment of the connection jack (L) of the first electrode portion 300 to supply electricity to the integral coil electrode portion 500 or to supply electricity to the first electrode portion 300 and the second electrode portion 400. Can be.

3 to 6 show an example of a magnetic particle testing test using a magnetic particle testing device according to an embodiment of the present invention.

3 illustrates a case in which electricity is supplied to the first electrode part 300 and the second electrode part 400, and the mounting plate 700 is placed on the insulating holders 370 and 440 for testing.

The test object 20 is placed on the mounting plate 700, and the test object 20 is a long shaft or the like.

When current flows from the first electrode part 300 toward the second electrode part 400, the current flows along the conduction plate 720 of the mounting plate 700. At this time, a circular magnetic force line, which is represented by a dotted line, is formed around the test object 20 placed on the upper plate 710, and it is possible to check whether there is a defect through the distribution of magnetic particles on the surface of the test object 20. That is, when there is a surface defect such as a crack, magnetic field lines are disturbed in the defective portion, and the distribution of magnetic powder is changed. In FIG. 3, the integrated coil electrode part 500 is represented in a omitted form.

4 illustrates a case in which electricity is supplied to the first electrode part 300 and the second electrode part 400, and the test object 20 is placed on the mounting grooves 371 of the insulating holders 370 and 440.

When current flows from the first electrode part 300 to the second electrode part 400, current flows along the test object 20, and at this time, a circular magnetic field is formed around the test object 20. The presence of a defect can be known.

FIG. 5 allows electricity to be supplied to the first electrode part 300 and the second electrode part 400, but has a current carrying rod 600 in the mounting grooves 371 and 441, and a current carrying rod inside the hollow tube that is the test object 20. Let 600 be positioned. A current flows through the energizing rod 600, and a circular magnetic field is formed around the hollow tube, which is the test object 20.

FIG. 6 illustrates a case in which the test object 20 is placed at the center of the test unit while electricity is supplied to the integrated coil electrode unit 500. As shown in the drawing, when a current flows in one direction, a linear magnetic field is formed on the test object 20 inside the integrated coil electrode part 500, and it is possible to determine whether there is a defect through the distribution of magnetic particles.

When the test is performed using the integrated coil electrode unit 500, the test object is placed on the mounting plate 700 when the test object 20 is positioned inside the coil 530, or other supports are not shown. Test objects can be placed inside the coil.

The foregoing description of the present invention is intended for illustration, and it will be understood by those skilled in the art that the present invention may be easily modified in other specific forms without changing the technical spirit or essential features of the present invention. will be.

It is therefore to be understood that the embodiments described above are intended to be illustrative, but not limiting, in all respects. For example, each component described as a single entity may be distributed and implemented, and components described as being distributed may also be implemented in a combined form.

The scope of the present invention is defined by the appended claims rather than the detailed description and all changes or modifications derived from the meaning and scope of the claims and their equivalents are to be construed as being included within the scope of the present invention do.

The magnetic particle flaw detector according to the present invention can be used for checking the presence of defects on various types of products.

100: frame 200: guide rail
210: guide groove 300: first electrode
310: first bottom plate 320: first inner vertical plate
330: contact head 340: outer vertical plate
350: fixed plate 360: guide rod
370: insulating cradle
380: elastomer 390: reinforcing plate
400: second electrode portion 410: second bottom plate
420: second inner vertical plate 430: contact head
440: insulating holder 441: mounting groove
450: clamp 460: reinforcement plate
500: integral coil electrode portion 510: bottom plate
520: support plate 530: coil
600: energization rod 700: mounting plate
710: top plate 720: power plate
10: fred equipment P: fred
K: Fred terminal L: Jack
20 test object

Claims (4)

delete Magnetic particle flaw detector for Frod magnetic particle flaw detector,
frame;
A pair of guide rails provided parallel to the upper surface of the frame;
A first electrode part provided at one side of the guide rail and movable along the guide rail, and having a contact head mounted at an inner end thereof and an insulating cradle mounted at the contact head;
An elastic body connected to the first electrode part to elastically move the first electrode part along the guide rail;
A second electrode part which can be fixed to the guide rail while facing the first electrode part, and has a contact head mounted on an inner end thereof and an insulating cradle mounted on the contact head;
An integrated coil electrode part provided between the first electrode part and the second electrode part and movable along the guide rail and supplied with electricity through both ends of the coil shape;
A mounting plate placed on the two insulating holders, the upper plate comprising an insulator and a conductive plate coupled to the upper plate, wherein the conductive plate is connected to each of the contact heads to allow electricity to flow; And the probe is selectively connected to the first electrode part and the second electrode part, or the probe is connected to the integrated coil electrode part to perform a test. Magnetic particle flaw detector for Frod magnetic particle flaw detector,
frame;
A pair of guide rails provided parallel to the upper surface of the frame;
A first electrode part provided at one side of the guide rail and movable along the guide rail, and having a contact head mounted at an inner end thereof and an insulating cradle mounted at the contact head;
An elastic body connected to the first electrode part to elastically move the first electrode part along the guide rail;
A second electrode part which can be fixed to the guide rail while facing the first electrode part, and has a contact head mounted on an inner end thereof and an insulating cradle mounted on the contact head;
And an integrated coil electrode part provided between the first electrode part and the second electrode part and movable along the guide rail and supplied with electricity through both ends of the coil shape.
The insulating cradle is formed with a concave groove from the top surface to raise the test object or the conducting rod in the mounting groove so that the test object or the conducting rod is connected to the contact head to pass electricity.
And selectively connecting the probe to the first electrode part and the second electrode part, or connecting the probe to the integrated coil electrode part to perform a test. The method of claim 2 or 3 wherein:
The first electrode unit;
A first bottom plate inserted into the guide rail,
A first inner vertical plate coupled vertically to one end of the first bottom plate,
A contact head coupled to the first inner vertical plate,
An insulating cradle coupled to the contact head,
An outer vertical plate coupled to the other end of the first bottom plate,
Fixing plate fixed to the guide rail end facing the outer vertical plate,
One end is fixed to the fixing plate and the other end is made of a guide rod that is formed through the outer vertical plate protruding departure prevention jaw is formed so as not to be separated;
The elastic body surrounds the guide rod, one end of which contacts the fixing plate and the other end of which contacts the outer vertical plate outer surface;
The second electrode unit;
A second bottom plate inserted into the guide rail,
A second inner vertical plate coupled vertically to one end of the second bottom plate;
A contact head coupled to the second inner vertical plate,
An insulating cradle coupled to the contact head,
And a clamp for fixing the second bottom plate to the guide rail.

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