KR101249240B1 - Spectrometer used for diagnosing plasma of kstar apparatus - Google Patents

Abstract

Disclosed are a spectrometer used for plasma diagnosis of a KSTAR device. The spectrometer according to an embodiment of the present invention is a slit into which electromagnetic waves emitted from a plasma inside a KSTAR apparatus are incident, a first mirror reflecting electromagnetic waves incident through the slit, and converted into parallel light, parallel reflected by the first mirror A diffraction section for dispersing light for each wavelength, a second mirror for reflecting parallel light scattered for each wavelength by the diffraction section, and a two-dimensional photodiode array, wherein the parallel light reflected by the second mirror on the two-dimensional photodiode array And a detection unit for generating a detection signal corresponding to the received parallel light, and a signal processing device for analyzing and diagnosing the state of the plasma by using the detection signal.

Description

SPECTROMETER USED FOR DIAGNOSING PLASMA OF KSTAR APPARATUS

Embodiments of the present invention relate to a spectrometer used for plasma diagnosis of a KSTAR device, and more particularly, to a spectrometer capable of high-speed detection of electromagnetic waves emitted from a plasma in real time using a photodiode array.

When the material is heated to hundreds of millions of degrees, electrons are separated one by one from the molecular gas and separated into negatively charged electrons and positively charged ions. This state is called plasma. In view of the fact that the plasma is composed of charged particles, it is a self-constrained nuclear fusion method applied to the Toka film by applying a strong magnetic field to cause the charged particles to hover around so that the plasma is floated in the air and heated.

Korean tokamak device is a KSTAR (KOREA SUPERCONDUCTING TOKAMAK ADVANCED RESEARCH) device. As with any Tokamak device, plasma diagnostics are important for KSTAR devices. To this end, there are a variety of plasma diagnostic apparatus, one of which may be a spectrometer (spectrometer) using a spectroscopic diagnostic method.

Spectrometer is a device that measures electromagnetic waves of various wavelengths emitted from plasma inside KSTAR device. It is a component that detects electromagnetic waves and charge coupled device (CCD) or complementary metal oxide semiconductor (CMOS). ) In particular, the CCD includes a plurality of pixel regions, and converts a change in the amount of charge in the plurality of pixel regions into an electrical signal. In this process, the CCD shifts electrical signals of pixel regions arranged in the same vertical column through adjacent shift resistors, which are adjacently connected, and then outputs them in rows through horizontal shift registers. That is, in the case of a CCD, since electrical signals for a plurality of pixels are sequentially read, even when electromagnetic waves are generated at the same time point, the time point at which the CCD detects the electromagnetic waves is different for each of the plurality of pixels. In other words, even when the electromagnetic waves emitted at the same time point are photographed, a time difference may occur in the detection of the plurality of pixel regions depending on the positions of the plurality of pixel regions. Therefore, accurate detection of electromagnetic waves may be difficult and, in severe cases, motion blur may occur. To compensate for the time difference in the electromagnetic wave detection process, a separate shutter may be used to prevent the CCD from receiving light after a certain time, or may be accompanied by additional signal processing. However, these methods are not a fundamental solution, and in particular, for further signal processing operations, it is difficult to measure high-speed, electromagnetic waves emitted from the plasma in real time.

SUMMARY OF THE INVENTION The present invention has been made to solve the above-described problems, and an object of the present invention is to provide a spectrometer capable of detecting a high-speed electromagnetic wave emitted from a plasma in real time using a photodiode array.

Spectrometer used in the plasma diagnosis of the KSTAR device according to an embodiment of the present invention is a slit to which electromagnetic waves emitted from the plasma inside the KSTAR device is incident, reflecting the electromagnetic waves incident through the slit to change to parallel light A first mirror, a diffraction unit for dispersing the parallel light reflected by the first mirror for each wavelength, a second mirror for reflecting the parallel light scattered for each wavelength by the diffraction unit, and a two-dimensional photodiode array; When the parallel light reflected by the second mirror is received in the dimensional photodiode array, a detection unit generating a detection signal corresponding to the received parallel light and analyzing and diagnosing the state of the plasma using the detection signal. And a signal processing device.

According to one side, the two-dimensional photodiode array, a circuit board comprising a plurality of first electrodes and a plurality of second electrodes electrically isolated from each other, m (rows) x n (columns) on the circuit board and a plurality of photodiode elements arranged in a matrix form of (m, n is an integer of 2 or more), wherein the plurality of photodiode elements arranged in the matrix form include the plurality of first electrodes and the plurality of second electrodes. Can be individually connected to the

According to embodiments of the present invention, the spectrometer can detect the electromagnetic waves emitted from the plasma at high speed in real time by using the photodiode array as a detection configuration.

1 is a view showing the structure of a spectrometer according to an embodiment of the present invention.
2 is a view showing the structure of a detector according to an embodiment of the present invention.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the following description of the present invention, detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear. Also, terminologies used herein are terms used to properly represent preferred embodiments of the present invention, which may vary depending on the user, intent of the operator, or custom in the field to which the present invention belongs. Therefore, the definitions of these terms should be based on the contents throughout this specification. Like reference symbols in the drawings denote like elements.

1 is a view showing the structure of a spectrometer according to an embodiment of the present invention.

Referring to FIG. 1, a KSTAR (KOREA SUPERCONDUCTING TOKAMAK ADVANCED RESEARCH) device, which is a Korean-type tokamak device, constrains plasma using a magnetic field. However, even with the use of a magnetic field, the plasma tries to remain unstable. Therefore, the plasma must be continuously observed and maintained in a stable state. For this purpose, it is important to arrange or install various plasma diagnostic devices in the KSTAR device to diagnose plasma.

The biggest information that can be obtained from the plasma generated inside the KSTAR device is electromagnetic waves of various wavelengths emitted by themselves. Inside the plasma, particles move and react with each other to gain or lose energy, which in turn sends and receives electromagnetic waves. Some of these electromagnetic waves are emitted to the outside, the electromagnetic waves are important information to know the internal state of the plasma. As such a method of measuring electromagnetic waves of various wavelengths emitted from the plasma, a spectroscopic diagnostic method is used. The spectrometer 100 may detect an electromagnetic wave and generate a detection signal corresponding to the detected electromagnetic wave.

Referring to FIG. 1, the spectrometer 100 according to an exemplary embodiment of the present invention includes a slit 110, a first mirror 120, a diffraction unit 130, a second mirror 140, a detector 150, and a signal. A processing device 160.

Electromagnetic waves emitted from the plasma are conical spread while passing through the slit 110 and are converted into parallel light in the process of being reflected by the first mirror 120. The parallel light proceeds to the diffraction section 130 and is dispersed for each wavelength by the diffraction section 130. As such, the light dispersed for each wavelength passes to the second mirror 140, is reflected by the second mirror 140, and is transmitted to the detector 150.

As described above, the detector 150 detects electromagnetic waves (parallel light) that have undergone the process of "reflection-diffraction-reflection" and generates a detection signal corresponding thereto. This detection signal may be a signal indicating various characteristics of the plasma distribution, temperature, density, and other states of the plasma.

The detector 150 detects parallel lights reflected by the second mirror 140 and is formed of a photodiode array. The detection unit 150 will be described in detail with reference to FIG. 2.

2 is a view showing the structure of a detector according to an embodiment of the present invention.

As described above, the detector 150 is formed of a two-dimensional photodiode array. That is, as shown in FIG. 2, the photodiode array includes a circuit board 151 and a plurality of photodiode elements 152 arranged two-dimensionally on the circuit board 151. On the circuit board 151, the plurality of photodiode elements 152 includes m (rows) x n (columns) (m, n being an integer of 2 or more), which are arranged in a matrix form. One photodiode element 152 may be one pixel, and the number of photodiode elements 152 may be changed as necessary.

In addition, the circuit board 151 includes a plurality of first electrodes 151a and a plurality of second electrodes 151b. The two-dimensionally arranged photodiode device 152 is individually connected to the plurality of first electrodes 151a and the plurality of second electrodes 151b. For example, any one photodiode element 152 may be connected one-to-one to one adjacent first electrode 151a and one second electrode 151b. Accordingly, the circuit board 151 may transmit individual control signals to the photodiode elements 152 connected to each of the plurality of first electrodes 151a and the second electrodes 151b, and vice versa. The generated detection signals may be simultaneously generated and transmitted to the signal processing device 160 as parallel signals. That is, since the plurality of photodiode elements 152 are electrically controlled and operated separately from each other, each of the photodiode elements 152 is generated simultaneously and transmitted to the signal processing device 160 as a parallel signal. There is no time difference in the generation of the detection signal. To this end, the plurality of first electrodes 151a and the plurality of second electrodes 151b included in the circuit board 151 may be connected to the signal processing device 160 in parallel.

Therefore, since the spectrometer 100 does not require a separate signal processing operation in accordance with the occurrence of the time difference with respect to the detection signal, it is possible to quickly detect the electromagnetic wave emitted from the plasma in real time, and generate a detection signal corresponding thereto. .

The signal processing apparatus 160 analyzes / diagnoses the state of the plasma by using the detection signal from the detector 150. Specifically, according to the intensity of the detection signal, it is possible to analyze the plasma distribution, temperature, density, and various other characteristics of knowing the state of the plasma, and to diagnose the state of the plasma based on the analysis result.

As shown in FIG. 1, the signal processing device 160 may be mounted on the spectrometer 100 to be one component of the spectrometer 100, or may be a separate device from the spectrometer 100.

In addition, the signal processing apparatus 160 may include a display screen for displaying an analysis result or a diagnosis result of the state of the plasma based on the detection signal. Therefore, the operator may monitor the analysis result or the diagnosis result of the state of the plasma through the display screen.

As described above, although the present invention has been described with reference to the limited embodiments and the drawings, the present invention is not limited to the above embodiments, and those skilled in the art to which the present invention pertains various modifications and variations from such descriptions. This is possible. Therefore, the scope of the present invention should not be limited to the described embodiments, but should be determined not only by the claims below but also by the equivalents of the claims.

100: spectrometer
110: slit
120: first mirror
130: diffraction section
140: second mirror
150: detector
151: circuit board
151a: first electrode
151b: second electrode
152: photodiode device
160: signal processing device

Claims (2)

delete In the spectrometer used for the plasma diagnosis of the KSTAR device,
A slit into which electromagnetic waves emitted from the plasma inside the KSTAR apparatus are incident;
A first mirror reflecting electromagnetic waves incident through the slit to change into parallel light;
A diffraction unit dispersing the parallel light reflected by the first mirror for each wavelength;
A second mirror reflecting parallel light dispersed for each wavelength by the diffraction unit;
A detector including a 2D photodiode array and generating a detection signal corresponding to the received parallel light when the parallel light reflected by the second mirror is received by the 2D photodiode array; And
A spectrometer comprising a signal processing device for analyzing and diagnosing the state of the plasma using the detection signal,
The two-dimensional photodiode array,
A circuit board including a plurality of first electrodes and a plurality of second electrodes electrically separated from each other;
On the circuit board, a plurality of photodiode elements arranged in a matrix form of m (rows) x n (columns) (m, n is an integer of 2 or more).
Including,
The plurality of photodiode elements arranged in the matrix form simultaneously generate the detection signals generated from the photodiode element 152 and transmit the detected signals to the signal processing device 160 as parallel signals. The spectrometer is connected to a plurality of second electrodes individually.

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