KR101232048B1 - Headlight for vehicles - Google Patents

Abstract

Miniaturization, light weight, power saving and cost reduction.
The present invention provides the semiconductor light sources 2S and 2W, the lenses 3S and 3W, the reflector 16, the light blocking members 13S and 13W, the prism members 14S and 14W, and the switching device 15. Equipped. When the light blocking members 13S and 13 are positioned at the first position in the switching device 15, the low beam light distribution pattern LP having the cutoff lines CL1, CL2 and CL3 is irradiated. Moreover, when the prism members 14S and 14 are positioned in the 1st position in the switching device 15, the light distribution pattern HP for high beams is irradiated. As a result, the present invention can be reduced in size, weight, power saving, and cost reduction.

Description

Headlights for Vehicles {HEADLIGHT FOR VEHICLES}

The present invention uses a semiconductor light source as a light source, and switches a light distribution pattern (a low light distribution pattern, an outgoing light distribution pattern) and a high beam light distribution pattern (a driving light distribution pattern) having a cutoff line to the front of the vehicle. It's about headlights.

This kind of headlamp for a vehicle has been conventionally known (for example, Patent Document 1). Hereinafter, a conventional headlamp for a vehicle will be described. Conventional vehicle headlights comprise a first light source unit for forming a low beam light distribution pattern and a second light source unit for forming a high beam light distribution pattern. The first light source unit is a lamp unit of a projector type and includes a light source, a reflector of an ellipsometer (procedure system), a shade, and a projection lens. The second light source unit is a lamp unit of a projector type and includes a light source, a reflector of an ellipsometer (procedometer) and a projection lens. Hereinafter, the operation of the conventional headlamp for a vehicle will be described. When the light source of the first light source unit is turned on, light from the light source is reflected by the reflector, and a part of the reflected light is cut off in the shade to form a light distribution pattern having a slanted cutoff line and a horizontal cutoff line, that is, a light distribution pattern for low beams, and The light distribution pattern for the beam is irradiated (projected) to the front of the vehicle by inverting up, down, left and right from the projection lens. When the light source of the second light source unit is turned on, the light from the light source is reflected by the reflector, and the reflected light is irradiated (projected) to the front, rear, left, and right of the projection lens as a high-beam light distribution pattern.

By the way, the conventional headlamp for a vehicle is comprised with the 1st light source unit provided with a light source, a reflector, a shade, and a projection lens, and the 2nd light source unit provided with a light source, a reflector, and a projection lens. For this reason, the conventional vehicle headlight requires a large number of parts and requires a second light source unit for a high beam light distribution pattern, and thus, there are problems in miniaturization, light weight, power saving, and cost reduction.

Patent Document 1: Japanese Patent Application Laid-Open No. 2007-109493

The problem to be solved by the present invention is that a conventional vehicle headlamp requires a second light source unit for a high beam light distribution pattern, and therefore has a problem in miniaturization, light weight, power saving, and cost reduction.

The present invention (invention according to claim 1) includes a semiconductor light source having a planar rectangular light emitting chip, a lens for irradiating forward with a part of light emitted from the light emitting chip of the semiconductor light source as a light distribution pattern having a cutoff line; And a reflector having a reflecting surface for reflecting light forward from the light emitting chip of the semiconductor light source and light other than light incident on the lens as spot light including the main light axis of the high beam light distribution pattern, and a first position. And a semiconductor disposed so as to be movable between the second position and the second position so that a part of the light from the light emitting chip of the semiconductor light source does not interfere with the incidence of the lens and tries to enter the reflecting surface. A light blocking member for shielding light outside the lens incident from the light emitting chip of the type light source, and an integral structure with the light blocking member. It is arrange | positioned so that it can move between 2 positions, and when it is located in a 1st position, it does not prevent the light other than incidence of the lens from the light emitting chip of a semiconductor-type light source to inject into a reflection surface, and also virtually makes a reference focal point of a lens. In the state of moving the light source, the prism member for injecting a part of the light from the light emitting chip of the semiconductor light source into the lens, the light blocking member and the prism member forming an integral structure are switched between the first position and the second position, and cut off And a switching device for switching between a light distribution pattern having lines and a light distribution pattern for high beams.

The present invention (invention according to claim 2) is characterized in that the center of the light emitting chip is located at or near the reference focal point of the lens, and the light emitting surface of the light emitting chip is located at or near the reference axis of the lens. The long side of the light emitting chip facing the front direction of the axis is parallel to the horizontal axis orthogonal to the reference axis of the lens or inclined with respect to the horizontal axis, the incident surface of the lens consists of a conical curved surface, and the exit surface of the lens is the lens. In order to prevent the projection image of the light emitting chip emitted from the exit surface of the light emitting chip from protruding upward from the cutoff line of the screen light distribution image of the light distribution pattern, a part of the projection image of the light emitting chip is curved-controlled so as to be almost in contact with the cutoff line. The free curved surface of the exit surface of the lens is made from the vertical axis and the horizontal axis passing through the origin and orthogonal to each other with the reference axis of the lens as the origin when viewed from the front. The first quadrant, the second quadrant, the third quadrant, and the fourth quadrant divided by about 1/3 of the first quadrant when the first quadrant and the second quadrant are compared in a symmetric positional relationship with respect to the vertical axis. When the above portion is higher than the second quadrant in the front direction of the reference axis of the lens, and the first and fourth quadrants are compared in the symmetric positional relationship with respect to the horizontal axis, about one third or more of the first quadrant is the lens. A free curved surface lower than the fourth quadrant in the omnidirectional direction of the reference axis, the output surface of the prism member is a conical curved surface, and the incident surface of the prism member moves the reference focal point of the lens virtually upward or obliquely upward. The free curved surface which is curved-controlled, The free curved surface of the incidence surface of a prism member has the protrusion part which protrudes to the semiconductor light source side, Moreover, A first quadrant, a second quadrant, a third quadrant, and a fourth quadrant whose peaks are viewed from the rear, the reference axis of the lens as the origin, divided by the vertical axis and the horizontal axis passing through the orthogonal to each other and perpendicular to each other; It is characterized by being in a part which spans two quadrants, or a part of a 1st quadrant.

In addition, the present invention (invention according to claim 3) is characterized in that the semiconductor light source and the lens, and the light shielding member and the prism member function to perform spot light distribution of a substantially center portion on the screen light distribution of the light distribution pattern having the cutoff line and the light distribution pattern for the high beam. A semiconductor light source and lens for spot light distribution and a lens and light blocking member and a prism member; And a prism member.

In addition, the present invention (invention according to claim 4) is characterized in that the cutoff line is an inclined cutoff line of an upward gradient from the elbow point to the traveling lane side, and an upper horizontal cutoff line horizontally from the inclined cutoff line to the running lane side, and the elbow point. A horizontal cutoff line horizontally extending from the opposite lane to the opposite lane, wherein the long side of the light emitting chip of the spot light-emitting semiconductor light source is centered on the reference axis of the lens and the traveling lane side is above the opposite lane side with respect to the horizontal axis. The first and fourth quadrants of the light emitting chip of the spot light distribution lens and the diffusion light distribution lens are rotated by about 5 °, inclined with respect to the horizontal axis, and the long side of the light emitting chip of the semiconductor light source for diffusion light distribution is parallel to the horizontal axis. The projection image of the light emitting chip emitted from the light source mainly forms light distribution on the traveling lane side from the elbow point of the screen light distribution image of the light distribution pattern. The projection image of the light emitting chip emitted from the second quadrant and the third quadrant of the exit light distribution lens and the spot light distribution lens and the diffusion light distribution lens mainly forms light distribution on the opposite lane side from the elbow point of the screen light distribution pattern of the light distribution pattern. It features.

Further, the present invention (invention according to claim 5) includes a high beam prism member in which a prism member forms a light distribution pattern for high beams, and a prism for one or a plurality of other light distribution patterns in which one or a plurality of other light distribution patterns are formed. A member, and the switching device alternately switches between the light blocking member and the high beam prism member and the one or a plurality of other light distribution pattern prism members forming an integral structure between the first position and the second position, and the cutoff line It is a switching device which switches to the light distribution pattern which has, the light distribution pattern for high beams, and one or more other light distribution patterns.

The vehicle headlamp of the present invention (invention according to claim 1) is a state in which the light shielding member is switched to the first position and the prism member is alternately shifted to the second position by means for solving the above problem. When the light emitting chip of the semiconductor light source is turned on and emits light, part of the light emitted from the light emitting chip passes through the lens and is irradiated toward the front of the vehicle as a light distribution pattern having a cutoff line. At this time, light other than lens incidence from the light emitting chip of the semiconductor light source to be incident on the reflecting surface is shielded by the light blocking member. In the switching device, when the prism member is switched to the first position and the light blocking member is alternately positioned to the second position, when the light emitting chip of the semiconductor light source is turned on and emits light, a part of the light emitted from the light emitting chip is generated by the prism member and The prism member passes through the lens in a state in which the reference focal point is virtually moved and is irradiated toward the front of the vehicle as a light distribution pattern for high beams. At this time, light other than the incidence of the lens incident from the light emitting chip of the semiconductor light source is incident on the reflecting surface of the reflector without being disturbed by the prism member and is irradiated toward the front of the vehicle as spot light distribution including the main light axis of the light distribution pattern for high beam. As described above, the vehicle headlamp of the present invention (invention according to claim 1) can be irradiated to the front of the vehicle by using a semiconductor light source as a light source and switching a light distribution pattern having a cutoff line and a light distribution pattern for a high beam.

Furthermore, the vehicle headlamp of the present invention (invention according to claim 1) is composed of a light shield member, a prism member, and a switching device having a semiconductor type light source, a lens, and a reflector, and thus a high beam light distribution, as compared with a conventional vehicle headlamp. The number of parts is minimal without requiring the second light source unit for the pattern, and the size can be reduced, the weight can be reduced, and the cost can be reduced.

Furthermore, the vehicle headlamp of the present invention (invention according to claim 1) virtually moves the reference focal point of the lens by the prism member, so that the light distribution pattern exiting from the lens is changed from the light distribution pattern having the cutoff line to the light distribution pattern for the high beam. You can switch reliably. Further, in the vehicular headlight of the present invention (invention according to claim 1), since spot light distribution including the main light axis of the high beam light distribution pattern is obtained by the reflecting surface of the reflector, a high beam light distribution pattern having a sufficient maximum brightness is obtained. Lose.

In the vehicle headlamp of the present invention (invention according to claim 2), when the light blocking member is positioned at the first position by means for solving the above problem, the light emitted from the light emitting chip is removed from the incident surface of the lens. A light distribution pattern having a cutoff line, when it is incident and exits from the exit surface of the lens, exits as a projected image of the light emitting chip that is almost in contact with the cutoff line so as not to protrude upward from the cutoff line of the screen light distribution image of the light distribution pattern having the cutoff line. Can be surely obtained. In the vehicle headlight of the present invention (invention according to claim 2), when the prism member is positioned at the first position by means for solving the above problem, the reference focal point of the lens is virtually upward or obliquely upward. As a result, the portion of the high intensity band of the light distribution pattern having the cutoff line is shifted upward or obliquely to become a portion of the high intensity band of the high beam light distribution pattern, and the portion of the cutoff line of the light distribution pattern is smoothly (smooth) widened upward or obliquely upward. It moves down to become an upper portion of the light distribution pattern for high beams. In this manner, the vehicle headlamp of the present invention (invention according to claim 2) can be obtained by switching between a light distribution pattern having a good cutoff line and a good light distribution pattern for high beams.

In addition, since the light distribution pattern having the cutoff line is obtained by the semiconductor light source and the lens fixed to the vehicle headlight of the present invention (invention according to claim 2), the part of the high intensity band near the cutoff line of the light distribution pattern having the cutoff line That is, the important part (point) does not change. In addition, since the spot light distribution including the main light axis of the high beam light distribution pattern is obtained by the fixed semiconductor light source and the reflecting surface of the reflector, a part of the spot light distribution including the main light axis of the high beam light distribution pattern, that is, an important part (point ) Does not change. As described above, the vehicular headlamp of the present invention (invention according to claim 2) has a desired light distribution characteristic as obtained by the light distribution design.

In addition, the vehicle headlamp of the present invention (invention according to claim 3) has the highest luminous intensity (illuminance, quantity of light) in the central portion by means for solving the above problems, and the luminous intensity is shifted from the central portion to the peripheral portion. Since a light distribution pattern in which (illuminance, light quantity) gradually decreases is obtained, it is suitable for obtaining a light distribution pattern having a cutoff line, for example, a light distribution pattern for low beams and a light distribution pattern for high beams. Furthermore, the vehicle headlamp of the present invention (invention according to claim 3) is a semiconductor light source and a lens and a light shielding member and a prism member. Since the light emitting output of the semiconductor light source is small, a light distribution pattern (a light distribution pattern having a cut-off line, for example, a light distribution pattern for low beams and a light distribution pattern for high beams) is allocated to the light source, the lens, the light blocking member, and the prism member. Light intensity (illuminance, quantity of light), in particular, spot light distribution of sufficient intensity (illuminance, quantity of light) is obtained in the central portion of the light distribution pattern (light distribution pattern having a cut-off line, for example, a low beam light distribution pattern and a high beam light distribution pattern). Lose.

Further, the vehicle headlamp of the present invention (invention according to claim 4) is a horizontal horizontal cutoff line on the traveling lane side, an inclined cutoff line on the traveling lane side and a lower horizontal side on the opposite lane side by means for solving the above problems. It is optimal for obtaining a light distribution pattern having a cutoff line (Z cutoff line) consisting of a cutoff line, for example, a light distribution pattern for low beams. In addition, the vehicle headlamp of the present invention (invention according to claim 4) inclines the long side of the light emitting chip of the spot light distribution semiconductor light source with respect to the horizontal axis, and the long side of the light emitting chip of the semiconductor light source for diffusing light distribution with the horizontal axis. Since it is parallel, the spot light distribution can be made along the oblique cutoff line, and the diffuse light distribution can be made along the upper horizontal cutoff line and the lower horizontal cutoff line, so that the light distribution pattern having the Z cutoff line, for example, the light distribution pattern for the low beam Can be surely obtained.

Further, the vehicle headlamp of the present invention (invention according to claim 5) includes a light distribution pattern for a high beam and a light beam distribution pattern having a cut-off line by using a semiconductor light source as a light source by means for solving the above problems. It is possible to switch the dog or a plurality of different light distribution patterns to irradiate the vehicle forward.

BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a perspective view of an essential part showing Embodiment 1 of a headlamp for a vehicle according to the present invention.
2 is an exploded perspective view showing the main part in a similar manner.
3 is a plan view similarly showing the semiconductor light source and lens for spot light distribution and the semiconductor light source and lens for diffusion light distribution.
4 is a front view similarly showing the lens for spot light distribution and the lens for diffusion light distribution.
5 is a perspective view similarly showing the lens for spot light distribution.
FIG. 6 is a sectional view taken along the line VI-VI in FIG. 4 which shows a lens for spot light distribution similarly.
FIG. 7 is a sectional view taken along the line VII-VII in FIG. 4 which shows a lens for spot light distribution similarly.
FIG. 8 is a sectional view corresponding to FIG. 7, which shows a modification of the lens for spot light distribution similarly.
9 is a sectional view corresponding to FIG. 7, which shows a modification of the lens for spot light distribution in the same manner.
10 is an explanatory view showing a light emitting chip of a semiconductor light source for diffusion light distribution in the same manner.
FIG. 11 is an explanatory view showing a light emitting chip of a semiconductor light source for spot light distribution similarly.
FIG. 12 is an explanatory view showing a projection image of the light emitting chip of the semiconductor light source for spot light distribution emitted from the first and fourth quadrants when the light exit surface of the lens for spot light distribution is in an initial state.
FIG. 13 is an explanatory view showing a projection image of a light emitting chip of a semiconductor light source for spot light distribution emitted from the second and third quadrants when the exit surface of the lens for spot light distribution is in an initial state.
14 is an explanatory view showing a projection image of a light emitting chip of a semiconductor light source for spot light distribution emitted from a first quadrant and a fourth quadrant when the emission surface of the lens for spot light distribution is curved-controlled.
FIG. 15 is an explanatory view showing a projection image of a light emitting chip of a semiconductor light source for spot light distribution emitted from the second and third quadrants when the emission surface of the lens for spot light distribution is curved-controlled.
FIG. 16 is an explanatory diagram similarly showing spot light distribution (projection group of light emitting chips of a semiconductor light source for spot light distribution) obtained by a lamp unit comprising a semiconductor light source for spot light distribution and a lens.
FIG. 17 is an explanatory view showing diffusion light distribution (projection group of light emitting chips of a semiconductor light source for diffusion light distribution) obtained by a lamp unit comprising a semiconductor light source for diffusion light distribution and a lens.
18 is a perspective view similarly to the light shielding member, the prism member, and the switching device which show a state where the light shielding member is located in the first position.
19 is a perspective view similarly to the light shielding member, the prism member, and the switching device which show a state where the prism member is located in the first position.
20 is similarly a front view of the light blocking member, the prism member, and the reflector showing a state where the light blocking member is located at the first position.
21 is a front view of the light-shielding member, the prism member, and the reflector similarly showing the state where the prism member is located in the first position.
FIG. 22 is an explanatory diagram similarly showing the optical path when the light blocking member is located at the first position.
FIG. 23 is an explanatory diagram similarly showing the optical path when the prism member is located at the first position.
FIG. 24 is an explanatory diagram similarly showing the optical path when the lens reference focus is located at the center of the light emitting chip.
25 is an explanatory view showing an optical path when the lens reference focal point is moved upward from the center of the light emitting chip by the prism member.
FIG. 26 is a rear view similarly showing the light blocking member and the prism member when the prism member is located at the first position.
27 is a perspective view similarly showing a light shielding member and a prism member.
28 is an exploded perspective view showing components of the light blocking member, the prism member, and the switching device in the same manner.
29 is a longitudinal cross-sectional view similarly to the principal part of a switching device.
30 is similarly explanatory drawing which shows the state of the deceleration mechanism and stopper mechanism of a switching device, when a light shielding member is located in a 1st position.
FIG. 31 is an explanatory diagram similarly showing the states of the deceleration mechanism and the stopper mechanism of the switching device when the prism member is located at the first position.
FIG. 32 is an explanatory diagram showing a light distribution pattern for low beams obtained by combining the spot light distribution of FIG. 16 and the diffusion light distribution of FIG. 17.
FIG. 33 is an explanatory view showing a state in which the spot light distribution including the main light axis is irradiated to the low beam light distribution pattern of FIG. 32 when there is no light blocking frame of the light blocking member.
FIG. 34 is an explanatory view showing a state in which the low beam light distribution pattern of FIG. 32 is deformed in the same manner as the prism member is replaced with the light blocking member and positioned in the first position.
FIG. 35 is an explanatory diagram similarly showing a light distribution pattern for high beams obtained when the prism member is positioned at the first position.
Fig. 36 is a perspective view of a light shielding member and a prism member and a switching device of Embodiment 2 of a vehicle headlamp according to the present invention.
FIG. 37 is a rear view of the light blocking member and the prism member similarly showing the state in which the light blocking member is located in the first position.
FIG. 38 is an explanatory diagram similarly showing the light distribution pattern for mid beams obtained when the prism member for mid beams is positioned at the first position.

(Best Mode for Carrying Out the Invention)

Hereinafter, two examples of the headlamp for a vehicle according to the present invention will be described in detail with reference to the drawings. The present invention is not limited to these examples. In the figure, reference numeral "VU-VD" denotes a vertical line above and below the screen. The sign "HL-HR" represents horizontal lines on the left and right of the screen. 12-17 is explanatory drawing which shows the projection image (outgoing image) or projection image group (outgoing image group) of the light emitting chip on the screen obtained by computer simulation. In the present specification and claims, "up, down, before, after, left, right" means "up, down, before, after" of the vehicle when the vehicle headlamp according to the present invention is attached to the vehicle (car). , Left, right ”. 6 to 9, hatching is omitted for clarity of explanation.

(Example 1)

1 to 35 show a first embodiment of a headlamp for a vehicle according to the present invention. Hereinafter, the configuration of the vehicle headlamp in the first embodiment will be described. In the figure, reference numeral 1 denotes a vehicle headlight (car headlight) according to the first embodiment. The vehicle headlamp 1 is a vehicle headlamp for a left driving lane. In addition, the vehicle headlights for the right traveling lane are reversed from left to right in the configuration of the vehicle headlight 1 for the left traveling lane. In Fig. 2, X, Y, and Z constitute a rectangular coordinate (X-Y-Z rectangular coordinate system). The X axis is a horizontal axis in the left and right direction, on the opposite lane side, that is, in the first embodiment, the right side R is in the + direction and the left side L is in the-direction. In addition, Y axis | shaft is a vertical axis of an up-down direction, In this Example 1, upper side U is + direction, and lower side D is-direction. In addition, Z axis | shaft is an axis of the front-back direction orthogonal to the said X-axis and the said Y-axis, In this Example 1, the front side F is a + direction and the rear side B is a-direction.

The vehicle headlamp 1 irradiates the light distribution pattern having the cutoff line shown in FIG. 32 and the high beam light distribution pattern (driving light distribution pattern) HP shown in FIG. 35 to the front of the vehicle (not shown). will be. The light distribution pattern having the cutoff line shown in FIG. 32 is horizontal from the elbow point E to the traveling lane side (left side) from the inclined cutoff line CL1 of the rising gradient and from the inclined cutoff line CL1 to the traveling lane side. A light distribution pattern having a cutoff line (Z cutoff line) composed of one upper horizontal cutoff line CL2 and a lower horizontal cutoff line CL3 that is horizontal from the elbow point E to the opposite lane side (right). And a low beam light distribution pattern (optical light distribution pattern) LP. In addition, the angle between the inclined cutoff line CL1 and the horizontal line HL-HR of the screen is about 15 °. Moreover, the said elbow point E is on the up-down vertical line VU-VD, and is below the left-right horizontal line HL-HR, and is an intersection of the said inclination cutoff line CL1 and the said lower horizontal cutoff line CL3. .

As shown in FIG. 2, the vehicle headlamp 1 includes a semiconductor light source 2S and a lens 3S and a light shielding member 13S and a prism member 14S for spot light distribution, and a semiconductor for diffusion light distribution. Type light source 2W and lens 3W and light blocking member 13W and prism member 14W, heat sink member 4, switching device 15, reflector 16, and lamp housing (not shown) And a lamp lens (for example, a transparent outer lens).

The heat sink member 4 is composed of a disk-shaped front portion 5 having a circular fixed surface on the front surface (front face), and a fin-shaped rear portion 6 from the middle portion to the rear portion. The heat sink member 4 is made of, for example, a resin member or a metal member having a high thermal conductivity.

The semiconductor light source 2S for spot light distribution and the semiconductor light source 2W for diffusion light distribution (hereinafter referred to simply as "semiconductor light sources 2S and 2W") are the front of the heat sink member 4. It is fixed to the left and right of the middle part of the up-down direction of the fixing surface of the part 5, respectively. On the other hand, the spot light distribution lens 3S and the diffusion light distribution lens 3W (hereinafter, simply referred to as "lens 3S, 3W") are integrally formed, and the semiconductor light source 2S, 2W) It is arrange | positioned at the front side F, and is being fixed to the side surface of the front part 5 of the said heat sink member 4.

The reflector 16 is disposed to cover the semiconductor light sources 2S and 2W and the lenses 3S and 3W from the outside, and the periphery of the fixed surface of the front part 5 of the heat sink member 4. It is fixed at. In addition, the switching device 15 is fixed to a surface opposite to the fixing surface of the front portion 5 of the heat sink member 4. The light shielding member 13S and the prism member 14S for the spot light distribution, the light shielding member 13W and the prism member 14W for the diffusion light distribution are integrally formed in a cross shape, and the switching device ( 15), it is arrange | positioned so that it may alternately position between a 1st position and a 2nd position. 22 and 23, the first position is a position between the semiconductor light sources 2S and 2W and the lenses 3S and 3W, and the second position is relative to the first position. The position is rotated 90 degrees around the Z axis.

The semiconductor light source 2S and the lens 3S and the light blocking member 13S and the prism member 14S for the spot light distribution, and the semiconductor light source 2W and the lens 3W and the light blocking member 13W for the diffusion light distribution. And the prism member 14W and the heat sink member 4 and the switching device 15 and the reflector 16 constitute a lamp unit. The lamp unit 2S, 3S, 13S, 14S, 2W, 3W, 13W, 14W, 4, 15, 16 is, for example, an optical axis adjusting mechanism in a back chamber partitioned by the lamp housing and the lamp lens. The optical axis is arranged up and down around the horizontal axis and left and right around the vertical axis. In addition, in the lamp room, in addition to the lamp units 2S, 3S, 13S, 14S, 2W, 3W, 13W, 14W, 4, 15, and 16, other lamps such as fog lamps, cornering lamps, clearance lamps, and turn signal lamps may be used. The lamp unit may be arranged.

The semiconductor light source 2S, the lens 3S, the light blocking member 13S, and the prism member 14S for spot light distribution have a low beam light distribution pattern having cutoff lines CL1, CL2, and CL3 shown in FIG. It has a function of forming spot light distribution SP and SP1 at almost the center portion of the screen light distribution of LP and the high beam light distribution pattern HP shown in FIG. Further, the semiconductor light source 2W, the lens 3W, the light blocking member 13W, and the prism member 14W for diffusion light distribution have low beam light distribution having the cutoff lines CL1, CL2, CL3 shown in FIG. It has a function of forming diffuse light distribution WP and WP1 of the entire part of the screen light distribution image of the pattern LP and the high beam light distribution pattern HP shown in FIG.

As shown in FIG. 3, the semiconductor light sources 2S and 2W include light emitting chips 8S and 8W provided on the substrates 7S and 7W, the substrates 7S and 7W, and the light emitting chip ( It consists of thin rectangular parallelepiped sealing resin members (lens members) 9S and 9W which seal 8S and 8W. The surfaces of the sealing resin members 9S and 9W form convex curved surfaces. The semiconductor light sources 2S and 2W are respectively fixed to the fixing surface of the front portion 5 of the heat sink member 4 via a holder or a fixing frame. In FIG. 3, illustrations of the light blocking members 13S and 13W and the prism members 14S and 14W are omitted for clarity of explanation.

The light emitting chips 8S and 8W have a planar rectangular shape (flat rectangular shape) as shown in Figs. 10 and 11. In other words, five square chips are arranged in the X-axis direction (horizontal direction). In addition, you may use one rectangular chip.

Centers OS and OW of the light emitting chips 8S and 8W are located at or near the reference focal points FS and FW of the lenses 3S and 3W, and also the reference axes of the lenses 3S and 3W. Optical axis) (ZS, ZW) or near it. The reference axes ZS and ZW of the lenses 3S and 3W are parallel to the Z axis and are normals passing through the centers OS and OW of the light emitting chips 8S and 8W. The X axis passes through the centers OS and OW of the light emitting chips 8S and 8W. 10 and 11, YS and YW are parallel to the Y axis and vertical axis (Y axis) for spot light distribution passing through the centers OS and OW of the light emitting chips 8S and 8W. Vertical axis (Y-axis) for diffusion light distribution.

The light emitting surfaces of the light emitting chips 8S and 8W face the front side F (forward direction) of the reference axes ZS and ZW of the lenses 3S and 3W. The long side of the light emitting chip 8S of the semiconductor light source 2W for diffusion light distribution has the X axis (orthogonal to the reference axis ZW of the lens 3W), as shown in FIG. Parallel to the horizontal axis). On the other hand, the long side of the light emitting chip 8S of the semiconductor light source 2S for spot light distribution has a traveling lane side with respect to the X axis (in this example, the left side is the opposite lane side). (The light emitting chip 8S of the semiconductor light source 2S for spot light distribution is centered on the reference axis ZS of the lens 3S so as to be above the right side R in this example). It rotates by (degrees about 5 degrees), and inclines with respect to the said X axis.

The long side of the light emitting chip 8S of the semiconductor light source 2S for spot light distribution is the same as the long side of the light emitting chip 8S of the semiconductor light source 2W for diffusion light distribution. You may parallel with an axis. The long side of the light emitting chip 8S of the semiconductor light source 2S for spot light distribution is the same as the long side of the light emitting chip 8S of the semiconductor light source 2S for spot light distribution. You may incline with respect to an axis.

The spot light distribution lens 3S and the diffusion light distribution lens 3W are integrally formed. The fixing part 10 is integrally provided in the left and right both side parts of the said lens 3S, 3W. The fixing portion 10 is fixed to the left and right sides of the front portion 5 of the heat sink member 4 by screws or the like. As a result, the lenses 3S and 3W are fixed to the heat sink member 4.

The fixed lenses 3S and 3W are formed in the incident surfaces 11S and 11W through which light from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W are incident and in the lenses 3S and 3W. Emission surface 12S, 12W which the incident light exits is provided.

Incident surfaces 11S and 11W of the lenses 3S and 3W are conical curved surfaces (for example, ellipses, circles, parabolic curves, hyperbolic curves, or planar secondary surfaces). In this example, the incidence surfaces 11S and 11W of the lenses 3S and 3W are convex surfaces (cylindrical surfaces) in which the central portion protrudes to the rear side B with respect to the periphery in the vertical section (vertical section, longitudinal section). To achieve. The incidence surfaces 11S and 11W of the lenses 3S and 3W are preferably convex, but may form a concave surface in which the central portion is recessed to the front side F with respect to the peripheral portion in the vertical section. It may be flat. On the incidence surfaces 11S and 11W of the lenses 3S and 3W, the centers OS and OW of the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W (of the lenses 3S and 3W), respectively. Light from θ1 ° (for example, about 50 ° or more, about 60 ° in this example) is incident from the reference axes ZS and ZW.

The projection surfaces of the light emitting chips 8S and 8W emitted from the emission surfaces 12S and 12W of the lenses 3S and 3W are the light distribution for the low beam. A part of the projection image of the light emitting chips 8S and 8W is the cutoff lines CL1, CL2 and CL3 so as not to protrude upward from the cutoff lines CL1, CL2 and LC3 on the screen light distribution image of the pattern LP. It is composed of a free surface that is curved to almost contact with.

Hereinafter, the curved surface control of the emission surface 12S of the lens 3S for spot light distribution will be described with reference to FIGS. 4 and 12 to 15.

First, the semiconductor light source 2S and the lens 3S for spot light distribution are arranged as described above. The conical curved surface of the incident surface 11S of the lens 3S is fixed. On the other hand, the free curved surface of the emission surface 12S of the said lens 3S is made into the initial free curved surface.

Next, the light emitting chip 8S of the semiconductor light source 2S is turned on to emit light. Then, the projected image group of the light emitting chip 8S is projected (emitted) on the screen. Here, projection images I1, I2, and I of the light emitting chip 8S emitted from four sample points P1, P2, P3, and P4 of the emission surface 12S of the lens 3S shown in FIG. I3 and I4) will be described. The projection images I1, I2, I3, and I4 of the light emitting chip 8S are projected (outgoed) on the screen as shown in Figs. 12 and 13. At this time, since the free curved surface of the emission surface 12S of the lens 3S is an initial free curved surface, a part (half or more than half) of the projection images I1, I2, I3, I4 projected on the screen It protrudes upward from the cutoff lines CL1, CL2, LC3 on the screen light distribution of the low beam light distribution pattern LP.

From this, the projection images I1, I2, I3, I4 shown in FIG. 12, 13 are designed and corrected by the projection images I10, I20, I30, I40 shown in FIG. 14, FIG. Portions P10, P20, P30, and P40 of the projected images I10, I20, I30, and I40 that are designed and modified are almost at the cutoff lines CL1, CL2, and LC3 of the screen light distribution of the light distribution pattern LP for the low beam. The projected images I10, I20, I30, and I40, which are in contact with each other, do not protrude upward from the cutoff lines CL1, CL2, LC3 of the screen light distribution image of the low beam light distribution pattern LP.

Then, the curved surface of the free curved surface of the exit surface 12S of the lens 3S for spot light distribution is controlled so that the projected images I10, I20, I30, and I40 that have been designed and corrected are obtained. As described above, the free curved surface of the emission surface 12S of the lens 3S for spot light distribution is obtained. Similarly, a free curved surface of the emission surface 12W of the lens 3W for diffusion light distribution is obtained.

As described above, the free curved surfaces of the emission surfaces 12S and 12W of the lenses 3S and 3W that are curved-controlled have the following characteristics. That is, as shown in FIGS. 4 to 7, the free curved surfaces of the emission surfaces 12S and 12W of the lenses 3S and 3W are viewed from the front (state viewed from the front side F). 3W) the first quadrant Q1 and the second quadrant Q2 by reference to the reference axes ZS and ZW as the origin, and the vertical axes YS and YW passing through the origin and orthogonal to each other and the X axis of the horizontal axis. , The third quadrant Q3 and the fourth quadrant Q4. Here, in the spot light distribution lens 3S, when the first quadrant Q1 and the second quadrant Q2 are compared with respect to the vertical axis YS in a symmetric positional relationship. That is, the first quadrant Q1 and the second quadrant Q2 of the lens 3S for spot light distribution pass through the first sample point P1 and the second sample point P2. A cross-sectional curve C12 in the first quadrant Q1 passing through the first sample point P1 and the second sample point P2 obtained when cut in a horizontal plane parallel to the X axis of the horizontal axis, When the inverted cross-section curve (C22) of the second quadrant (Q2) in the first quadrant (Q1) in which the cross-sectional curve in the second quadrant (Q2) is inverted with respect to the vertical axis (YS). A portion of the first quadrant Q1 that is about one third or more (in this example, the whole portion) is the second quadrant in the front direction (front side F) of the reference axis ZS of the lens 3S. It is higher than Q2). For example, as shown in FIG. 6, the first sample point P1 in the first quadrant Q1 and the second quadrant Q2 in the first quadrant Q1. When the inversion points P21 of the two sample points P2 are compared, the first sample point P1 in the first quadrant Q1 is the second quadrant in the first quadrant Q1. It is higher by the dimension T1 to the front side F than the inversion point P21 of the said 2nd sample point P2 of Q2). The portion TH that is higher than the second quadrant Q2 of the first quadrant Q1 is from one third of all (1/3 <TH≤1). As shown in FIG. 8, the rising portion TH may be started from the edge of the lens 3S, or may be started from the center of the lens 3S, as shown in FIG. Although not shown in the drawing, it may start from the middle between the edge and the center of the lens 3S. 8 and 9, TT is a portion having the same height as the second quadrant Q2 of the first quadrant Q1.

In the case of the spot light distribution lens 3S, the first quadrant Q1 and the fourth quadrant Q4 are compared in a symmetrical positional relationship with respect to the X axis of the horizontal axis. That is, the first quadrant Q1 and the fourth quadrant Q4 of the lens 3S for spot light distribution pass the first sample point P1 and the fourth sample point P4. A cross-sectional curve C14 in the fourth quadrant Q4 passing through the first sample point P1 and the fourth sample point P4 obtained when cut into a vertical plane parallel to the vertical axis YS, When the inverted cross section curve (C11) of the first quadrant (Q1) in the fourth quadrant (Q4) in which the cross section curve in the first quadrant (Q1) is inverted with respect to the X axis of the horizontal axis. A portion of the first quadrant Q1 that is about one third or more (in this example, the whole portion) is the fourth quadrant in the front direction (front side F) of the reference axis ZS of the lens 3S. Lower than Q4). For example, as shown in FIG. 7, the fourth sample point P4 in the fourth quadrant Q4 and the first quadrant Q1 in the fourth quadrant Q4. When the inversion point P14 of the first sample point P1 is compared, the inversion point P14 of the first sample point P1 of the first quadrant Q1 in the fourth quadrant Q4 is It is lower by the dimension T2 on the front side F than the fourth sample point P4 in the fourth quadrant Q4. The portion lower than the fourth quadrant Q4 of the first quadrant Q1 is all about one third. The lowering part may be started from the edge of the lens 3S, may be started from the center of the lens 3S, or may be started from the middle between the edge and the center of the lens 3S.

On the other hand, the free curved surface of the exit surface 12W of the lens 3W for diffusion light distribution has the same characteristics as the free curved surface of the exit surface 12S of the lens 3S for spot light distribution. That is, the free curved surface of the exit surface 12W of the lens 3W for diffusion light distribution compares the first quadrant Q1 and the second quadrant Q2 with respect to the vertical axis YW in a symmetrical positional relationship. In this case, a portion of about 1/3 or more of the first quadrant Q1 is higher than the second quadrant Q2 in the front direction of the reference axis ZW of the lens 3W, and the X axis of the horizontal axis. When the first quadrant Q1 and the fourth quadrant Q4 are compared in a symmetric positional relationship with respect to each other, about 1/3 or more of the first quadrant Q1 is the reference axis ZW of the lens 3W. It is made of a free curved surface lower than the fourth quadrant Q4 in the omnidirectional direction.

Here, the projection images of the light emitting chips 8S and 8W emitted from the four sample points P1, P2, P3 and P4 of the curved-controlled exit surfaces 12S and 12W of the lenses 3S and 3W. I10, I20, I30, and I40 are designed and modified from the states of Figs. 12 and 13 to the states of Figs.

As a result, as shown in Fig. 16B, the projected image group of the light emitting chip 8S emitted from the first quadrant Q1 of the emission surface 12S of the spot light distribution lens 3S is Mainly, light distribution on the traveling lane side (left side) is formed from the elbow point E on the screen light distribution of the low beam light distribution pattern LP.

As shown in Fig. 16C, the projected image group of the light emitting chip 8S emitted from the second quadrant Q2 of the emission surface 12S of the spot light distribution lens 3S is mainly used. The light distribution on the opposite lane side (right side) is formed from the elbow point E on the screen light distribution of the low beam light distribution pattern LP.

As shown in Fig. 16D, the projected image group of the light emitting chip 8S emitted from the third quadrant Q3 of the emission surface 12S of the spot light distribution lens 3S is mainly used. The light distribution on the opposite lane side (right side) is formed from the elbow point E on the screen light distribution of the low beam light distribution pattern LP.

Furthermore, as shown in Fig. 16E, the projected image group of the light emitting chip 8S emitted from the fourth quadrant Q4 of the emission surface 12S of the spot light distribution lens 3S is mainly used. Light distribution on the traveling lane side (left side) is formed from the elbow point E on the screen light distribution of the low beam light distribution pattern LP.

Then, the light distribution shown in Fig. 16B, the light distribution shown in Fig. 16C, the light distribution shown in Fig. 16D, and the light distribution shown in Fig. 16E are synthesized. A spot light distribution SP of the low beam light distribution pattern LP shown in (A) is formed.

On the other hand, as shown in Fig. 17B, the projected image group of the light emitting chip 8W emitted from the first quadrant Q1 of the emission surface 12W of the diffusion light distribution lens 3W is mainly used. Light distribution on the traveling lane side (left side) is formed from the elbow point E on the screen light distribution of the low beam light distribution pattern LP.

As shown in Fig. 17C, the projected image group of the light emitting chip 8W emitted from the second quadrant Q2 of the emission surface 12W of the diffusion light distribution lens 3W is mainly used. The light distribution on the opposite lane side (right side) is formed from the elbow point E on the screen light distribution of the low beam light distribution pattern LP.

As shown in Fig. 17D, the projected image group of the light emitting chip 8W emitted from the third quadrant Q3 of the emission surface 12W of the diffusion light distribution lens 3W is mainly used. The light distribution on the opposite lane side (right side) is formed from the elbow point E on the screen light distribution of the low beam light distribution pattern LP.

Furthermore, as shown in Fig. 17E, the projected image group of the light emitting chip 8W emitted from the fourth quadrant Q4 of the emission surface 12W of the diffusion light distribution lens 3W is mainly used. Light distribution on the traveling lane side (left side) is formed from the elbow point E on the screen light distribution of the low beam light distribution pattern LP.

Then, the light distribution shown in Fig. 17B, the light distribution shown in Fig. 17C, the light distribution shown in Fig. 17D, and the light distribution shown in Fig. 17E are synthesized. Diffusion light distribution WP of the low beam light distribution pattern LP shown in (A) is formed.

As shown in FIGS. 2 and 20 to 23, the reflector 16 is fixed to a periphery of the fixing surface on the front side of the front part 5 of the heat sink member 4. In the central portion of the fixed reflector 16, an opening in which the semiconductor light sources 2S and 2W, the lenses 3S and 3W, and the light blocking members 13S and 13W or the prism members 14S and 14W are located ( 17) is installed. Moreover, the reflective surface 18 of the free curved surface is provided in the circumferential edge part of the said fixed reflector 16. As shown in FIG. The reflecting surface 18 is light from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W, and light L1 incident on the lenses 3S and 3W (shown in FIG. 3). From the center (OS, OW) of the light emitting chips (8S, 8W) of the semiconductor light source (2S, 2W) (reference axis (ZS, ZW) of the lens (3S, 3W)) from θ1 ° Spot light distribution SP2 including light L2 other than light) (light L2 other than lens incidence and light of θ1 ° or more) including the main optical axis SZ of the high-beam light distribution pattern HP shown in FIG. 35. ) And a reflecting surface to reflect forward. The main optical axis SZ of the spot light distribution SP2 has a horizontal line HL-HR and a vertical vertical line VU of the screen at an upper side U than the elbow point E of the low beam light distribution pattern LP shown in FIG. 32. It is located at or near the intersection of -VD (refer to main optical axis SZ of spot light distribution SP2 shown by the dotted line of FIG. 33, FIG. 34). The spot light distribution SP2 including the main optical axis SZ is applied to the reflective surfaces 18 of the semiconductor light sources 2S and 2W and the reflector 16, which are respectively fixed to the heat sink member 4. The position of the spot light distribution SP2 including the main optical axis SZ is fixed without departing from the shape.

2, 18-22, and 26-28, the light emitting chip 8S of the said semiconductor light source 2S, 2W is formed in the center part of the movable light shielding members 13S, 13W. Openings 19S and 19W are provided so that a part of the light L1 from 8W does not interfere with the incidence of the lenses 3S and 3W. Further, at the peripheral edges of the light blocking members 13S and 13W, other than the lens incident from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W to be incident on the reflective surface 18. W-shaped light shielding frames 20S and 20W for shielding the light L2 are provided. The light blocking members 13S and 13W are arranged to be able to move between the first position and the second position, and as shown in FIG. 22, when positioned at the first position, the semiconductor light source ( A part L1 of light from the light emitting chips 8S and 8W of 2S and 2W passes through the openings 19S and 19W and enters the incident surfaces 11S and 11W of the lenses 3S and 3W. The light-shielding frame 20S receives light L2 other than the lens incident from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W that do not obstruct and enter the reflective surface 18. , 20W).

Similarly, as shown in FIGS. 2, 18 to 21, 23, and 25 to 28, the movable prism members 14S and 14W have a cross shape with the movable light blocking members 13S and 13W. It forms an integral structure. The movable prism members 14S and 14W include incident surfaces 21S and 21W on which the light L1 from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W are incident. Emitting surfaces 22S and 22W through which light incident upon 14S and 14W is emitted are provided.

The emission surfaces 22S and 22W of the prism members 14S and 14W are formed of conical curved surfaces (for example, curved lines such as ellipses, circles, parabolas and hyperbolas, or secondary curved surfaces such as planes and the like). In this example, the plane is formed.

The incident surface 21S of the spot light distribution prism member 14S is formed of a free curved surface that is curvedly controlled to virtually move the reference focal point FS of the spot light distribution lens 3S to the upper right diagonally. (See the virtual lens reference focus FS1 in FIG. 25). The free curved surface of the incidence surface 21S of the spot light prism member 14S is a projection 23S (small dotted line in FIG. 26 and a raised portion in FIG. 27) projecting toward the semiconductor light source 2S for spot light distribution. Line). As shown in Fig. 26, the peak of the protrusion 23S is viewed from the rear side (as seen from the rear side B) with the reference axis ZS of the lens 3S for spot light distribution as the origin and the origin The first quadrant Q1, the second quadrant Q2, the third quadrant Q3, and the fourth quadrant Q4 divided by the vertical axis YS passing through and perpendicular to each other and the X axis of the horizontal axis, wherein It is in the first quadrant Q1.

On the other hand, the incident surface 21W of the prism member 14W for diffusion light distribution is a free curved surface that is curved-controlled to virtually move the reference focal point FW of the lens 3W for diffusion light distribution to the image side. (See the virtual lens reference focus FW1 in FIG. 25). The free curved surface of the incidence surface 21W of the prism member 14W for diffusion light distribution is a projection 23W (small dotted line in FIG. 26 and a raised portion in FIG. 27) projecting toward the semiconductor light source 2W for diffusion light distribution. Line). As shown in FIG. 26, the peak of the protrusion 23W is viewed from the rear side (as seen from the rear side B) with the reference axis ZW of the lens 3W for diffusion light distribution as the origin, and the origin of the peak. The first quadrant Q1, the second quadrant Q2, the third quadrant Q3, and the fourth quadrant Q4, which are divided by the vertical axis YW that passes and are orthogonal to each other, and the X axis of the horizontal axis. It is in the part which spreads over 1 quadrant Q1 and the said 2nd quadrant Q2.

The prism members 14S and 14W form an integral structure with the light blocking members 13S and 13W, and are arranged to move between the first and second positions alternately with the light blocking members 13S and 13W. . The prism members 14S and 14W are incident on the lens from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W when positioned at the first position, as shown in FIG. The reference focal points FS and FW of the lenses 2S and 2W are virtually prevented from the virtual lens reference focal points FS1 and FW1 without disturbing the incident of the external light L2 on the reflective surface 18. In the shifted state, a portion L1 of the light from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W is incident on the incident surfaces 11S and 11W of the lenses 3S and 3W. .

The light blocking members 13S and 13W and the prism members 14S and 14W are integrally formed in a cross shape. Cross-shaped engaging grooves 24 are provided in the central portions of the light blocking members 13S and 13W and the prism members 14S and 14W. A cross-shaped engaging portion 26 of the shaft 25 of the switching device 15 is engaged with the engaging groove 24. As a result, the light shielding members 13S and 13W and the prism members 14S and 14W are arranged to be alternately moved between the first position and the second position by the switching device 15.

As shown in FIGS. 2, 18, 19, and 28 to 31, the switching device 15 includes the shaft 25, the housings 27 and 28, the motor 29, and the deceleration. A mechanism and a spring 30 for fail safe (returning) are provided.

The housings 27 and 28 are divided into two housings 27 on the front side and 28 on the rear side. The shaft 25 is housed in the housings 27 and 28 and is rotatably supported by the bearings 35 in the housings 27 and 28. The front end of the shaft 25 protrudes forward from the housing 27 on the front side. The engaging portion 26 is provided at the front end of the shaft 25. The engaging portion 26 is engaged with the engaging grooves 24 of the light blocking members 13S and 13W and the prism members 14S and 14W having a unitary structure.

The motor 29 uses a stepping motor in this example. Moreover, you may use motors other than a stepping motor. The motor 29 is attached to the outer surface of the rear housing 28.

The deceleration mechanism is composed of a first gear 31, a second gear 32, a third gear 33, and a fourth gear 34. The first gear 31 is fixed to an output shaft (drive shaft, rotation shaft) of the motor 20. The second gear 32 and the third gear 33 are fixed coaxially and are rotatably supported by the shaft portion 36 of the front housing 27. The fourth gear 34 is fixed to the shaft 25.

The first gear 31 and the second gear 32 are engaged. The third gear 33 and the fourth gear 34 mesh with each other. The number of teeth of the first gear 31 is smaller than the number of teeth of the second gear 32. The number of teeth of the second gear 32 is larger than the number of teeth of the third gear 33. The number of teeth of the third gear 33 is smaller than the number of teeth of the fourth gear 34.

The spring 30 is in this example a coil spring. One end of the spring 30 is engaged with the engagement hole 37 of the front housing 27. The other end of the spring 30 is engaged with the engagement hole 38 of the fourth gear 34. In addition, the spring 30 may be a spring other than the coil spring. In addition, one end of the spring 30 may be engaged with a member on the fixed side other than the housing 27 on the front side. In addition, the other end of the spring 30 may be engaged with a member on the rotation side other than the fourth gear 34.

The 1st stopper step part 39 and the 2nd stopper step part 40 are provided in the said 4th gear 34, respectively. On the other hand, the first stopper convex portion 41 which the first stopper step portion 39 abuts on and the second stopper convex portion 42 where the second stopper step portion 40 abuts on the front housing 27 respectively. It is installed.

As shown in FIG. 30, when the 1st stopper step part 39 of the said 4th gear 34 is in contact with the 1st stopper convex part 41 of the said housing 27 of the front side, FIG. As shown in FIG. 18, FIG. 20, and FIG. 22, the said light shielding member 13S, 13W is located in the 1st position between the said semiconductor light source 2S, 2W and the said lens 3S, 3W. 31, when the second stopper step portion 40 of the fourth gear 34 is in contact with the second stopper convex portion 42 of the housing 27 on the front side. 19, 21, and 23, the prism members 14S and 14W are positioned at a first position between the semiconductor light sources 2S and 2W and the lenses 3S and 3W. .

Hereinafter, the vehicle headlamp 1 in the first embodiment has the above configuration, and the operation thereof will be described below.

In the state in which the motor 29 is not energized, as shown in FIG. 30 by the spring force of the spring 30 of the switching device 15, the 1st stopper step part 39 of the 4th gear 34 is shown. ) Abuts against the first stopper convex portion 41 of the housing 27 on the front side, and as shown in FIGS. 18, 20, and 22, the light blocking members 13S and 13W are formed of a semiconductor light source ( 2S, 2W) and the lens 3S, 3W.

In this state, the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W of the vehicle headlamp 1 are turned on and emit light. Then, light L1 and L2 are radiated from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W. At this time, the light blocking members 13S and 13W are positioned at the first position between the semiconductor light sources 2S and 2W and the lenses 3S and 3W. For this reason, a part L1 of the light from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W passes through the openings 19S and 19W of the light blocking members 13S and 13W and the lenses 3S and 3W. Is incident on the incident surfaces 11S and 11W and is emitted from the emitting surfaces 12S and 12W of the lenses 3S and 3W. At this time, the projection images I10, I20, I30, and I40 of the light emitting chips 8S and 8W do not protrude upward from the cutoff lines CL1, CL2, CL3 of the screen light distribution image of the low beam light distribution pattern LP. It exits so that the cut off lines CL1, CL2, and CL3 may be in close contact.

As a result, the spot light distribution SP of the low beam light distribution pattern LP shown in FIG. 16 and the diffusion light distribution WP of the low beam light distribution pattern LP shown in FIG. 17 are obtained, respectively. It combines and the low light distribution pattern LP shown in FIG. 32 is obtained.

In addition, since the light blocking members 13S and 13W are located at the first position between the semiconductor light sources 2S and 2W and the lenses 3S and 3W, the semiconductor type is about to enter the reflecting surface 18 of the reflector 16. Light L2 other than the lens incident from the light emitting chips 8S and 8W of the light sources 2S and 2W is shielded by the light shielding frames 20S and 20W of the light blocking members 13S and 13W. As a result, the low light distribution pattern LP shown in FIG. 32 is reliably obtained. That is, when there are no light blocking frames 20S and 20W of the light blocking members 13S and 13W, as shown in FIGS. 33 and 34, the spot including the main optical axis SZ in the low beam light distribution pattern LP is shown. Light distribution SP2 (indicated by dotted lines in FIGS. 33 and 34) is irradiated. As shown in FIGS. 33 and 34, the spot light distribution SP2 including the main optical axis SZ includes the elbow point E and the cutoff lines CL1, CL2, and CL3 of the light distribution pattern LP for low beams. Since it protrudes above the upper side U, it is not preferable as the light distribution pattern LP for low beams. By the way, the vehicle headlamp 1 of the first embodiment is a semiconductor light source (3) which is about to enter the reflecting surface 18 of the reflector 16 by the light blocking frames 20S and 20W of the light blocking members 13S and 13W. Since light L2 outside the lens incident from the light emitting chips 8S and 8W of 2S and 2W can be shielded, the low beam light distribution pattern LP shown in FIG. 32 is reliably obtained.

Next, the motor 29 of the switching device 15 is energized. Then, the motor 29 is driven to rotate the first gear 31, the second gear 32, the third gear 33, and the fourth gear 34 in the direction of the arrow shown in FIG. 30. As a result, the shaft 25 fixed to the fourth gear 34 rotates in the clockwise arrow direction in FIG. 30 against the spring force of the spring 30. The rotation of the shaft 25 causes the light blocking members 13S and 13W and the prism members 14S and 14W of the cross-shaped integral structure attached to the shaft 25 to be clockwise in FIGS. 18 and 27. Rotate in the direction of the arrow.

And as shown in FIG. 31, the 2nd stopper step part 40 of the 4th gear 34 of the switching device 15 abuts on the 2nd stopper convex part 42 of the front housing 27. As shown in FIG. . Then, as shown in FIGS. 19, 21, and 23, the prism members 14S, 14W, which have been positioned in the second position, alternately with the light blocking members 13S, 13W, and the semiconductor light sources 2S, 2W. And the first position between the lens 3S, 3W. On the other hand, the light blocking members 13S and 13W, which have been located at the first position between the semiconductor light sources 2S and 2W and the lenses 3S and 3W, are alternately positioned in the second position with the prism members 14S and 14W. do.

When the prism members 14S and 14W are positioned in the first position, as shown in FIG. 23, the semiconductor light source 2S that has been shielded by the light blocking frames 20S and 20W of the light blocking members 13S and 13W so far. , Light L2 other than lens incidence from the light emitting chips 8S and 8W of 2W is incident on and reflected from the reflecting surface 18 of the reflector 16. As a result, as shown in FIG. 35, the spot light distribution SP2 including the main optical axis SZ is irradiated to or near the intersection of the horizontal line HL-HR of the screen and the vertical vertical line VU-VD.

On the other hand, a part L1 of the light from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W is incident on the incident surfaces 21S and 21W of the prism members 14S and 14W and the prism members 14S and 14W. 14W) is emitted from the emission surfaces 22S and 22W. For this reason, part of the light L1 from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W is controlled by the prismatic members 14S and 14W so that the reference focal point of the lenses 2S and 2W is reduced. In the state where the FS and FW are virtually moved to the virtual lens reference focal points FS1 and FW1, the light enters the incident surfaces 11S and 11W of the lenses 3S and 3W and emits the lenses 3S and 3W. It exits from surface 12S and 12W.

As a result, as shown in FIG. 34, the spot light distribution SP of the low beam light distribution pattern LP is located on the opposite lane side (right side R) from the upper side U, that is, the main optical axis of the high beam light distribution pattern HP. Move to the (SZ) side. In addition, the diffusion light distribution WP of the low beam light distribution pattern LP is moved upward. In addition, the elbow point E and the cutoff lines CL1, CL2, and CL3 of the low beam light distribution pattern LP are located on the opposite lane side (right R) from the upper side U, that is, the main portion of the high beam light distribution pattern HP. It spreads smoothly to the optical axis SZ side or the upper side U. Thereby, the spot light distribution SP of the low beam light distribution pattern LP shown in FIG. 32 and the spot light distribution SP1 of the high beam light distribution pattern HP shown in FIG. Switch to (WP).

Here, the energization of the switching device 15 to the motor 29 is interrupted. Then, by the spring force of the spring 30, the first gear 31, the second gear 32, the third gear 33, and the fourth gear 34 rotate in the direction of the arrow shown in FIG. do. As a result, the shaft 25 fixed to the fourth gear 34 rotates in the counterclockwise arrow direction in FIG. 31. The rotation of the shaft 25 causes the light blocking members 13S and 13W and the prism members 14S and 14W of the cross-shaped integral structure attached to the shaft 25 to be clockwise in FIGS. 19 and 27. Rotate in the direction of the arrow.

And as shown in FIG. 30, the 1st stopper step part 39 of the 4th gear 34 of the switching device 15 abuts on the 1st stopper convex part 41 of the front housing 27. As shown in FIG. . 18, 20, and 22, the light blocking members 13S, 13W, which have been positioned in the second position, alternately with the prismatic members 14S, 14W, are provided with the semiconductor light sources 2S, 2W. And the first position between the lens 3S, 3W. On the other hand, the prism members 14S and 14W which have been located in the first position between the semiconductor light sources 2S and 2W and the lenses 3S and 3W so far are alternately positioned in the second position with the light blocking members 13S and 13W. do.

Moreover, when the prism members 14S and 14W are in the state where it is located in a 1st position, or the rotation state from a 2nd position to a 1st position, when electricity supply to the motor 29 of the switching device 15 is interrupted (power supply Is broken), the light blocking members 13S and 13W return to the first position by the spring force of the spring 30. For this reason, it is possible to switch from the high beam light distribution pattern HP shown in FIG. 35 to the low beam light distribution pattern LP shown in FIG. As a result, the fail safe function is activated.

As described above, the low beam light distribution pattern LP shown in FIG. 32 and the high beam light distribution pattern HP shown in FIG. 35 are irradiated to the front of the vehicle.

The vehicle headlamp 1 in the first embodiment has the above-described configuration and operation, and the effects thereof will be described below.

In the vehicle headlamp 1 of the first embodiment, the light shielding members 13S and 13W are switched to the first position and the prism members 14S and 14W are alternately switched to the second position in the switching device 15. When the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W are turned on to emit light, a part of the light L1 emitted from the light emitting chips 8S and 8W passes through the lenses 3S and 3W to cut off the line. It is irradiated to the front of the vehicle as the light distribution pattern LP for the low beam having the CL1, CL2, and CL3. At this time, light L2 other than lens incidence from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W, which are to be incident on the reflecting surface 18 of the reflector 16, is directed to the light blocking members 13S and 13W. Shielded. In the switching device 15, when the prism members 14S and 14W are switched to the first position and the light blocking members 13S and 13W are alternately shifted to the second position, the semiconductor light sources 2S and 2W are turned on. When the light emitting chips 8S and 8W are turned on to emit light, part of the light L1 emitted from the light emitting chips 8S and 8W is applied to the prism members 14S and 14W and the prism members 14S and 14W to provide the reference focal point ( FS and FW pass through the lenses 3S and 3W in a state in which they are virtually moved to the virtual reference focal points FS1 and FW1 and are irradiated to the front of the vehicle as a high light distribution pattern HP. At this time, the light L2 other than the lens incident from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W is not disturbed by the prism members 14S and 14W and is reflected on the reflecting surface 18 of the reflector 16. Incident reflection is irradiated to the front of the vehicle as spot light distribution SP2 including the main optical axis SZ of the high beam light distribution pattern HP. As described above, the vehicle headlamp 1 according to the first embodiment uses the semiconductor light sources 2S and 2W as light sources, and the low beam light distribution pattern LP having the cutoff lines CL1, CL2 and CL3 and the high beam light distribution. The pattern HP can be switched and irradiated to the front of the vehicle.

In addition, the vehicle headlamp 1 in the first embodiment includes the light blocking members 13S and 13W and the prism member 14S having an integral structure with the semiconductor light sources 2S and 2W, the lenses 3S and 3W, and the reflector 16. 14W) and the switching device 15, the second light source unit for the high-beam light distribution pattern is not required as compared to the conventional vehicle headlamp, so that the number of parts is minimal, so that the size, weight, and cost are reduced. Can get angry.

In addition, the vehicular headlight 1 in the first embodiment virtually turns the reference focal points FS and FW of the lenses 3S and 3W into the virtual reference focal points FS1 and FW1 by the prism members 14S and 14W. The light distribution patterns emitted from the lenses 3S and 3W can be reliably switched from the low beam distribution pattern LP having the cutoff lines CL1, CL2 and CL3 to the high beam distribution pattern HP. In the vehicle headlight 1 according to the first embodiment, the spot light distribution SP2 including the main optical axis SZ of the high beam light distribution pattern HP is formed by the reflecting surface 18 of the reflector 16. Since it is obtained, the light distribution pattern HP for high beam which has sufficient highest brightness is obtained.

In addition, the vehicle headlamp 1 according to the first embodiment emits light from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W when the light blocking members 13S and 13W are positioned at the first position. When the light L1 enters from the entrance surfaces 11S and 11W of the lenses 3S and 3W and exits from the exit surfaces 12S and 12W of the lenses 3S and 3W, the cutoff lines CL1, CL2 and CL3 Of the light emitting chips 8S and 8W which are almost in contact with the cutoff lines CL1, CL2 and CL3 so as not to protrude upward from the cutoff lines CL1, CL2 and CL3 on the screen light distribution of the low beam light distribution pattern LP having the Since the light is emitted as the images I10, I20, I30, and I40, it is possible to reliably obtain the low beam light distribution pattern LP having the cutoff lines CL1, CL2, and CL3. In the vehicle headlight 1 according to the first embodiment, when the prism members 14S and 14W are positioned at the first position, the reference focal points FS and FW of the lenses 3S and 3W are the virtual reference focal points. Since the FS1 and FW1 are virtually moved upwardly at the upper side (U) or the right side, the portion of the high luminous intensity of the low beam light distribution pattern LP having the cutoff lines (CL1, CL2, CL3) is at the upper side (U) or at the right obliquely. To a portion of the high light intensity of the high beam light distribution pattern HP, and a part of the cutoff lines CL1, CL2, CL3 of the low beam light distribution pattern LP is smoothly (smoothly smoothly) to the upper side U or to the right side obliquely. ), It is widened and moved to become a portion above the high light distribution pattern HP. In this manner, the vehicle headlamp 1 in the first embodiment can be obtained by switching between the low beam distribution pattern LP having the good cutoff lines CL1, CL2, and CL3 and the good high beam distribution pattern HP.

In addition, the vehicle headlamp 1 according to the first embodiment has the cutoff lines CL1, CL2, CL3 by the semiconductor light sources 2S and 2W and the lenses 3S and 3W fixed to the heat sink member 4. Since the low beam light distribution pattern LP having the () is obtained, the portion of the high light intensity band near the cutoff lines CL1, CL2, CL3 of the low beam light distribution pattern LP having the cutoff lines CL1, CL2, CL3, that is, the important part (Point) does not change. The spot including the main optical axis SZ of the light distribution pattern HP for high beams by the semiconductor light sources 2S and 2W fixed to the heat sink member 4 and the reflecting surface 18 of the reflector 15. Since light distribution SP2 is obtained, the portion of the spot light distribution SP2 including the main optical axis SZ of the high-beam light distribution pattern HP does not change. As described above, the vehicular headlamp 1 of the first embodiment obtains the desired light distribution characteristics according to the light distribution design.

Further, the vehicle headlamp 1 in this embodiment is obtained by the spot light distribution SP by the semiconductor light source 2S and the lens 3S and the light shielding member 13S and the prism member 14S for spot light distribution. Further, the diffused light distribution WP is obtained by the semiconductor light source 2W and the lens 3W and the light blocking member 13W and the prism member 14W for diffusion light distribution. For this reason, the vehicular headlamp 1 according to the first embodiment has the highest luminous intensity (illuminance, quantity of light) in the center portion, and has a light distribution pattern in which the luminous intensity (illuminance, quantity of light) gradually decreases as it moves from the center portion to the peripheral portion. Since it is obtained, it is suitable for obtaining the low beam light distribution pattern LP and the high beam light distribution pattern HP which have cutoff lines CL1, CL2, and CL3. In addition, the vehicle headlamp 1 in the first embodiment includes a semiconductor light source and a lens and a light shielding member and a prism member, and a semiconductor light source 2S and a lens 3S and a light blocking member 13S and a prism member having a spot light distribution function. Since 14S and the semiconductor light source 2W and the light distribution member 13W and the prism member 14W each share a diffused light distribution function, the light emission outputs of the semiconductor light sources 2S and 2W are small. Luminous intensity (illuminance, light quantity) of the low light distribution pattern LP having sufficient light distribution patterns (cutoff lines CL1, CL2, CL3 and high light distribution pattern HP), in particular, the light distribution pattern (cutoff lines CL1, The spot light distribution of sufficient light intensity (illuminance, light quantity) is obtained in the center part of the low beam light distribution pattern LP which has CL2 and CL3, and the high beam light distribution pattern HP.

Further, the vehicle headlamp 1 in this embodiment inclines the long side of the light emitting chip 8S of the semiconductor light source 2S for spot light distribution with respect to the X axis of the horizontal axis, and also the semiconductor light source for diffusion light distribution. Since the long side of the light emitting chip 8W of 2W is made parallel to the X axis of the horizontal axis, the spot light distribution SP is along the oblique cutoff line CL1 and the diffusion light distribution WP is on the upper horizontal cutoff line ( CL2) and the lower horizontal cutoff line CL3. For this reason, the vehicle headlight 1 in this Example 1 opposes the horizontal cutoff line CL2 above the traveling lane side (left side L) and the inclined cutoff line CL1 on the traveling lane side side (left side L). It is most suitable for obtaining the low beam light distribution pattern LP which has a cutoff line (Z cutoff line) which consists of a lane side (right R) lower horizontal cutoff line CL3. In addition, the vehicle headlamp 1 in the first embodiment inclines the long side of the light emitting chip 8S of the spot light distribution semiconductor light source 2S with respect to the X axis of the horizontal axis, and further, the semiconductor light source for diffusion light distribution. Since the long side of the light emitting chip 8W of 2W is made parallel to the X axis of the horizontal axis, the spot light distribution SP is along the oblique cutoff line CL1 and the diffusion light distribution WP is on the upper horizontal cutoff line ( CL2) and the lower horizontal cutoff line CL3 can be followed, so that the light distribution pattern LP for the low beam having the Z cutoff line can be reliably obtained.

(Example 2)

36 to 38 show a second embodiment of the headlamp for a vehicle according to the present invention. Hereinafter, the vehicle headlamp in the second embodiment will be described. In the figure, the same code | symbol as FIG. 1-FIG. 35 shows the same thing.

The vehicle headlamp in the second embodiment uses the low beam light distribution pattern LP shown in FIG. 32, the high beam light distribution pattern HP shown in FIG. 35, and the mid beam light distribution pattern MP shown in FIG. Is to investigate forward. The mid-beam light distribution pattern MP shown in FIG. 38 has a substantially horizontal cutoff line CL. The cutoff line CL of the light distribution pattern MP for mid beam shown in FIG. 38 is located above cutoff lines CL1, CL2, CL3 of the low beam light distribution pattern LP shown in FIG.

The vehicle headlamp in the second embodiment is a high beam prism member that forms the high beam distribution pattern HP, that is, a prism member 14S, 14W of the vehicle headlamp 1 in the first embodiment. And the mid-beam prism members 43S and 43W forming the mid-beam light distribution pattern MP.

The mid-beam prism members 43S and 43W have substantially the same configuration as the high-beam prism members 14S and 14W. The mid-beam prism members 43S and 43W form an integral structure with the high-beam prism members 14S and 14W and the light blocking members 13S and 13W in the form of six petals. The mid-beam prism members 43S and 43W are formed on the incident surface to which the light L1 from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W enter, and the prism members 14S and 14W. An exit surface from which incident light exits is provided.

The emission surface W of the said mid-beam prism members 43S and 43W consists of a conical curved surface (for example, curves of ellipse, circle, parabola, hyperbola, etc., or a secondary curved surface such as a plane or the like). In this example, the plane is formed.

The incident surface of the mid-beam prism member 43S for spot light distribution has the reference focal point FS of the lens 3S for spot light distribution virtually to the right oblique image (virtual lens reference focal point FS1 in FIG. 25). ), And a free curved surface that is curved-controlled to move between the centers OS and OW of the light emitting chips 8S and 8W, and the reference focal points FS and FW of the lenses 3S and 3W. The free curved surface of the incident surface of the mid-beam prism member 43S for spot light distribution has a protrusion projecting toward the semiconductor light source 2S for spot light distribution. The peak of the protruding portion is divided by a vertical axis and a horizontal axis passing through the origin and orthogonal to each other with the reference axis ZS as the origin as viewed from the rear side (as seen from the rear side B) of the spot light distribution lens 3S. The first quadrant, the second quadrant, the third quadrant, and the fourth quadrant are located in the portion of the first quadrant.

On the other hand, the incident surface of the mid-beam prism member 43W for diffusion light distribution virtually makes the reference focal point FW of the lens 3W for diffusion light distribution virtually on the image side (virtual lens reference focus FS1 in FIG. 25). ), And a free curved surface that is curved-controlled to move between the centers OS and OW of the light emitting chips 8S and 8W, and the reference focal points FS and FW of the lenses 3S and 3W. The free curved surface of the incidence surface of the mid-beam prism member 43W for diffusion light distribution has a protrusion projecting toward the semiconductor light source 2W for diffusion light distribution. The peak of the protruding portion is divided by a vertical axis and a horizontal axis passing through the origin and perpendicular to each other with the reference axis ZW as the origin as viewed from the rear side (as seen from the rear side B) of the diffuse light distribution lens 3W. The first quadrant, the second quadrant, the third quadrant, and the fourth quadrant are located in the portion spanning the first quadrant and the second quadrant.

The mid beam prism members 43S and 43W alternate between the first position and the new second position and the third position alternately with the high beam prism members 14S and 14W and the light blocking members 13S and 13W. It is arranged to be mobile. When the mid-beam prism members 43S and 43W are positioned at the first position, the light L2 other than the lens incident from the light emitting chips 8S and 8W of the semiconductor light sources 2S and 2W is The reference focal points FS and FW of the lenses 2S and 2W may be replaced by the virtual lens reference focal point (virtual lens reference focal point FS1 in FIG. The semiconductor light source 2S, while being virtually moved to the center (OS, OW) of the chips 8S, 8W and the virtual lens reference focus between the reference focal points FS, FW of the lenses 3S, 3W). A part L1 of the light from the light emitting chips 8S and 8W of 2W is incident on the incident surfaces 11S and 11W of the lenses 3S and 3W.

The mid-beam prism members 43S and 43W, the high-beam prism members 14S and 14W, and the light shielding members 13S and 13W are alternately arranged in the first position and the second position by the switching device 15. It is arranged to be able to move between 3rd positions. The switching device 15 rotates the mid-beam prism members 43S and 43W, the high-beam prism members 14S and 14W, and the light blocking members 13S and 13W every 60 degrees.

Since the vehicular headlamp in the second embodiment has the above configuration, the switching device 15 allows the mid-beam prism members 43S and 43W, the high-beam prism members 14S and 14W, and the light-shielding member 13S. , 13W, rotated every 60 ° and alternately positioned at the first position, the light distribution pattern MP for mid beams shown in FIG. 38, the light distribution pattern HP for high beams shown in FIG. 35, and FIG. 32. The light distribution pattern LP for low beams shown in Fig. 2 can be irradiated to the front of the vehicle.

The mid-beam light distribution pattern MP shown in FIG. 38 is a diffused light distribution formed by the semiconductor light source 2W and the lens 3W and the light-shielding member 13W and the mid-beam prism member 43W having a diffused light distribution function ( WP2, the spot light distribution SP3 formed by the semiconductor light source 2S having a spot light distribution function, the lens 3S and the light blocking member 13S, and the prism member 43S for the mid beam, and the reflector 16 The high intensity spot light distribution SP4 formed by the slope 18 is synthesized.

In Examples 1 and 2, the low beam light distribution pattern LP, the high beam light distribution pattern HP, and the mid beam light distribution pattern MP are irradiated to the front of the vehicle. By the way, in the present invention, light distribution patterns other than the low beam light distribution pattern LP, the high beam light distribution pattern HP, and the mid beam light distribution pattern MP, for example, light distribution patterns for highways and light distribution patterns for fog lamps, etc. The pattern may also be irradiated to the front of the vehicle.

In Examples 1 and 2 described above, the Z-off cutoff line of the low-beam light distribution pattern LP includes an inclined cutoff line CL1, an upper horizontal cutoff line CL2, and a lower horizontal cutoff line CL3. Line. In the present invention, however, cutoff lines other than the Z cutoff line as cutoff lines, for example, only horizontal cutoff lines, or inclined cutoff lines on the traveling lane side and horizontal cutoff on the opposite lane side on the basis of elbow points. It may be a cutoff line consisting of a line.

In the first and second embodiments described above, the vehicle headlamp 1 for the left traveling lane will be described. By the way, in this invention, it is applicable also to the vehicle headlight for a right traveling lane.

Further, in the above embodiments 1 and 2, the semiconductor light source 2S and lens 3S for spot light distribution and the semiconductor light source 2W and lens 3W for diffusion light distribution are parallel to each other in the X-axis direction. It is arranged. By the way, in the present invention, the semiconductor light source 2S and the lens 3S for spot light distribution and the semiconductor light source 2W and the lens 3W for diffusion light distribution are located in the vertical direction, or the vertical, horizontal, left and right tilt directions It may arrange | position to or may alternately before and after. In this case, the light shielding member 13S and the prism member 14S for the spot light distribution and the prism member 43S for the mid beam, the light shielding member 13W and the prism member 14W for the diffused light distribution and the prism member for the mid beam ( It is necessary to position 43W) separately so as to be able to replace between a 1st position, a 2nd position, and a 3rd position by a switching device.

Furthermore, in Examples 1 and 2 described above, the lamp is composed of a semiconductor light source 2S and a lens 3S for spot light distribution, a light shielding member 13S, a prism member 14S and a mid-beam prism member 43S. And a lamp unit comprising a semiconductor light source 2W and a lens 3W, a light shielding member 13W, a prism member 14W, and a mid-beam prism member 43W for diffusion light distribution. By the way, in this invention, forming the light distribution pattern which has a cutoff line with one lamp unit which consists of one semiconductor type light source, one lens, one light shielding member, one prism member, and one mid beam prism member The light distribution pattern having a cutoff line may be formed by three or more lamp units.

One; Vehicle headlights 2S; Semiconductor light source for spot light distribution
3S; Lens 2W for spot light distribution; Semiconductor type light source for diffusion light distribution
3 W; Lens 4 for diffusion light distribution; Heat sink member
5; Anterior part 6; Rear
7S, 7W; Substrates 8S, 8W; Light emitting chip
9S, 9 W; Sealing resin member 10; [0035]
11S, 11 W; Incident surface 12S, 12W; Exit surface
13S; Light blocking member 14S for spot light distribution; Prism member for spot light distribution
13 W; Light blocking member 14W for diffusion light distribution; Prism member for diffusion light distribution
15; Switching device 16; Reflector
17; Opening 18; Reflective surface
19; Openings 20S, 20W; Shading frame
21S, 21 W; Incident surface 22S, 22W; Exit surface
23S, 23 W; Protrusions 24; Home
25; Shaft 26; Fitting
27; A front housing 28; Rear housing
29; Motor 30; spring
31; First gear 32; Second gear
33; Third gear 34; Fourth gear
35; Bearing 36; Shaft
37; Engaging holes 38; A fastening hole
39; A first stopper step 40; 2nd stopper step part
41; A first stopper convex portion 42; 2nd stopper convex part
43S; Prism member for mid beam for spot light distribution
33 W; Prismatic member for mid beam for diffusion light distribution
VU-VD; Vertical lines above and below the screen
HL-HR; Horizontal lines on the left and right of the screen
X; X axis (horizontal axis) Y; Y axis (vertical axis)
Z; Z axis R; right
L; Left U; Upper side
D; Lower side F; Front
B; Posterior E; Elbow Shop
CL1; Oblique cutoff line CL2; Top horizontal cutoff line
CL3; Lower horizontal cutoff line CL; Cutoff line
LP; Light distribution pattern HP for low beam; Light distribution pattern for high beam
MP; Light distribution patterns SP, SP1, SP2, SP3, SP4 for the mid beam; Spot light distribution
WP, WP1, WP2; Diffuse light distribution OS, OW; Center of light emitting chip
FS, FW; Reference focal points FS1, FW1 of the lens; Virtual Lens Reference Focus
ZS, ZW; Reference axis of the lens
YS, YW; Vertical axis passing through the center of light emitting chip
θ °; Inclination angle of light emitting chip of semiconductor light source for spot light distribution
θ1 °; Angle from the center of the light emitting chip of the semiconductor light source of light incident on the incident surface of the lens
I1, I2, I3, I4; Projection image of the light emitting chip when the exit surface is in the initial state
I10, I20, I30, I40; Projection image of the light emitting chip when the exit surface is curved
Q1; First quadrant Q2; Quadrant
Q3; Third quadrant Q4; Fourth quadrant
P1; First sample point P2; 2nd sample point
P3; Third sample point P4; 4th sample point
C12; Cross-section curve through first sample point and second sample point
C22; Inverted cross-section curve of the second quadrant in the first quadrant
C14; Cross section curve through the first and fourth sample points
C11; Inverted cross-section curve of the first quadrant in the fourth quadrant
T1; High quantity of dimensions T2; Low volume dimensions
TH; Elevated portion TT; Parts of the same height
L1; Light L2 incident on the lens; Light outside the lens incident
SZ; Primary optical axis

Claims (5)

In a headlamp for a vehicle that uses a semiconductor light source as a light source and switches between a light distribution pattern having a cutoff line and a light distribution pattern for high beams, the vehicle headlight being irradiated to the front of the vehicle,
A semiconductor light source having a planar rectangular light emitting chip;
A lens for irradiating forward a portion of the light from the light emitting chip of the semiconductor light source as a light distribution pattern having a cutoff line;
A reflector having light from the light emitting chip of the semiconductor light source and having a reflecting surface reflecting light other than light incident on the lens as spot light including a main light axis of a high beam light distribution pattern;
It is arranged to be able to move between a first position and a second position, and when positioned at the first position, it does not prevent a part of the light from the light emitting chip of the semiconductor light source from entering the lens, A light shielding member for shielding light other than the lens incident from the light emitting chip of the semiconductor light source to be incident on the reflective surface;
It is formed integrally with the light blocking member, and is disposed to be movable between a first position and a second position alternately with the light blocking member, and when positioned at the first position, the semiconductor light source from the light emitting chip A part of the light from the light emitting chip of the semiconductor light source is incident on the lens in a state in which the reference focal point of the lens is virtually shifted without interfering light other than the lens incident on the reflecting surface. With a prism member,
And a switching device for alternately switching between the light blocking member and the prism member, which form a unitary structure, between the first position and the second position, to switch between a light distribution pattern having a cutoff line and a light distribution pattern for high beams. headlight. According to claim 1, wherein the center of the light emitting chip is located at the reference focal point of the lens, and is located on the reference axis of the lens,
The light emitting surface of the light emitting chip is directed toward the reference axis of the lens,
The long side of the light emitting chip is parallel to the horizontal axis orthogonal to the reference axis of the lens or inclined with respect to the horizontal axis,
The incident surface of the lens is made of a conical curved surface,
The exit surface of the lens is a portion of the projection image of the light emitting chip such that the projection image of the light emitting chip emitted from the exit surface of the lens does not protrude upward from the cutoff line of the screen light distribution image of the light distribution pattern. Made of freeform surfaces that are curved to abut the cutoff line,
The free curved surface of the exit surface of the lens is the first quadrant, the second quadrant, the third quadrant, and the first quadrant divided by a vertical axis and a horizontal axis passing through the origin and orthogonal to each other with the reference axis of the lens as an origin when viewed from the front. 4 quadrants, and when the first quadrant and the second quadrant are compared in a symmetric positional relationship with respect to the vertical axis, one third or more of the first quadrant is located in the second direction in the direction of the reference axis of the lens. When the first quadrant and the fourth quadrant are higher than the quadrant and the first quadrant and the fourth quadrant are compared in a symmetric positional relationship with respect to the horizontal axis, a third or more portion of the first quadrant is formed in the front direction of the reference axis of the lens. Consists of freeform surfaces, lower than four quadrants,
The exit surface of the prism member is made of a conical curved surface,
The incidence surface of the prism member is made of a free curved surface that is curvedly controlled to virtually move the reference focal point of the lens upward or obliquely to the image side.
The free curved surface of the incident surface of the prism member has a protrusion projecting toward the semiconductor light source side, and the peak of the protrusion passes through the origin and orthogonal to each other with the reference axis of the lens as the origin when viewed from the rear side. Wherein the first quadrant, the second quadrant, the third quadrant, and the fourth quadrant divided by the vertical axis and the horizontal axis, and are located in a portion of the first quadrant and the second quadrant, or in a portion of the first quadrant; Headlights for cars. The light source according to claim 1 or 2, wherein the semiconductor light source, the lens, the light blocking member, and the prism member are configured to provide a spot light distribution of a central portion on the screen light distribution pattern of the light distribution pattern having the cutoff line and the light distribution pattern for the high beam. A semiconductor light source for functioning spot light distribution and a lens and a light shielding member and a prism member, and a semiconductor light source for diffusion light distribution functioning to diffuse light distribution of the entire light distribution pattern of the light distribution pattern having the cutoff line and the high beam light distribution pattern; A headlamp for a vehicle, comprising a lens, a light blocking member, and a prism member. 4. The cutoff line according to claim 3, wherein the cutoff line comprises an inclined cutoff line of an upward gradient from an elbow point to a traveling lane side, an upper horizontal cutoff line horizontal from an inclined cutoff line to a running lane side, and an opposite lane from an elbow point. Consists of a horizontal cutoff line horizontal across the sides,
The long side of the light emitting chip of the spot light-emitting semiconductor type light source is rotated by 5 ° with respect to the horizontal axis to be inclined with respect to the horizontal axis with respect to the horizontal axis about the reference axis of the lens. and,
The long side of the light emitting chip of the semiconductor light source for diffusion light distribution is parallel to the horizontal axis,
The projection image of the light emitting chip emitted to the first and fourth quadrants of the spot light distribution lens and the emission surface of the diffusion light distribution lens is from the elbow point of the screen light distribution pattern of the light distribution pattern having the cutoff line. Forming light distribution on the driving lane side,
The elbow point of the screen light distribution pattern of the light distribution pattern having the cutoff line is a projection image of the light emitting chip emitted from the second quadrant and the third quadrant of the spot light distribution lens and the emission surface of the diffusion light distribution lens. A headlight for a vehicle, wherein light distribution on the side of the opposing lane is formed. The prism member according to claim 1 or 2, wherein the prism member comprises a high beam prism member for forming the high beam distribution pattern and one or a plurality of other light distribution pattern prisms for forming one or a plurality of different distribution patterns. With a member,
The switching device alternately switches between the light blocking member, the high beam prism member, and the one or a plurality of other light distribution pattern prism members forming an integral structure between a first position and a second position, and having a cutoff line. A headlight for a vehicle, characterized by a switching device for switching between a light distribution pattern, a light distribution pattern for a high beam, and one or a plurality of other light distribution patterns.

Images