KR101158100B1 - X-ray detecting apparatus and x-ray detecting system having the same - Google Patents

Abstract

Disclosed are an x-ray measuring apparatus and an x-ray measuring system having the same that can more accurately measure an internal image of a measurement target. The X-ray measuring apparatus includes a detector panel for sensing the X-ray generated by the X-ray generator, and a detector controller for controlling the detector panel and the X-ray generator. The detector controller provides the X-ray preparation signal for preparing the X-ray output to the X-ray generator in response to the preparation control signal applied from the outside, and after the preparation control signal is applied to the detector panel in response to the emission control signal applied from the outside. Providing a detector preparation signal for preparing the X-ray for sensing, and outputting the image data sensed by the detector panel to the detector panel while providing an X-ray emission signal for the actual output of the X-ray to the X-ray generator in response to the output of the detector preparation signal. The detector capture signal is provided, and the detector ready signal is provided to the detector panel only for a predetermined time after the application of the emission control signal. As such, since the detector preparation signal is provided only for a predetermined time, the internal image of the measurement object may be measured more accurately using the characteristic data of the detector panel.

Description

X-ray measuring apparatus and X-ray measuring system having the same {X-RAY DETECTING APPARATUS AND X-RAY DETECTING SYSTEM HAVING THE SAME}

The present invention relates to an x-ray measuring apparatus and an x-ray measuring system having the same, and more particularly, to an x-ray measuring apparatus for extracting an image of the internal state by sensing the x-ray transmitted through a human body or an object and the like and an x-ray measuring system having the same. .

In general, an X-ray measuring system is a system for measuring the internal state of an object using X-rays, and is mainly used for medical purposes that can examine the state of bones inside the body by photographing a human body.

The X-ray measuring system includes an X-ray generator for emitting X-rays to a measurement object, and an X-ray measurement device for sensing an X-ray passing through the measurement object and extracting an internal image of the measurement object. The X-ray measuring apparatus includes a detector panel configured to sense an X-ray passing through the measurement object to generate an internal image of the measurement object, and a detector controller to control the detector panel.

The detector controller may prepare the detector panel to sense the X-ray, and control the detector panel to output an internal image of the measurement object sensed by the detector panel to the outside. In addition, the detector controller may prepare the X-ray generator and control the X-ray generator so that the X-ray is output.

The detector panel may be electrically connected to gate lines formed in a first direction, data lines formed in a second direction perpendicular to the first direction, and electrically connected to the gate lines and the data lines to sense the X-ray. And a plurality of sensing pixels, and bias wirings for providing various bias voltages to the sensing pixels, each of the sensing pixels including an optical sensing diode capable of directly or indirectly sensing the X-rays.

An image sensed through each of the sensing pixels has a value between a dark image current value and a bright image current value. Here, when the dark image current value is DI, the dark image current value is BI, and the current value sensed by the sensing pixel is SI, the internal image of the measurement target is (SI-DI) / (BI Has a value of DI).

However, the dark image current value in each of the sensing pixels may be changed by various factors such as the ambient temperature and the preparation time of the detector panel. As such, when the dark image current value is changed, a problem may occur in that the internal image of the measurement object is changed according to the dark image current value so that the internal image of the measurement object may not be measured more accurately.

Therefore, the present invention is to solve the above problems, the problem to be solved by the present invention is to provide an X-ray measuring apparatus that can more accurately measure the internal image of the measurement object.

Another object of the present invention is to provide an X-ray measuring system having the X-ray measuring apparatus.

An X-ray measuring apparatus according to an embodiment of the present invention includes a detector panel for sensing the X-ray generated by the X-ray generator, and a detector controller for controlling the detector panel and the X-ray generator.

The detector controller provides an X-ray preparation signal for preparing the output of the X-ray to the X-ray generator in response to a preparation control signal applied from the outside, and after the preparation control signal is applied, an emission control signal applied from the outside. In response, the detector panel provides a detector preparation signal for preparing the X-ray for sensing, and in response to the detection of the detector preparation signal, providing the X-ray generator with an X-ray emission signal for actual emission of the X-ray. And a detector capture signal for outputting image data sensed by the detector panel to the detector panel. In this case, the detector preparation signal is provided to the detector panel only for a predetermined time after the application time of the emission control signal.

The preparation control signal and the emission control signal may be provided to the detector controller from an external system for controlling the detector controller. Alternatively, the X-ray measuring apparatus may further include a detector switch for providing the preparation control signal and the emission control signal to the detector controller.

The X-ray measuring apparatus may further include a capture memory for storing the image data emitted from the detector panel. The X-ray measuring apparatus may further include an external connection terminal electrically connected to the capture memory and connected to an external memory, and the image data stored in the capture memory may pass through the external connection terminal. Can be stored in the external memory.

X-ray measuring system according to an embodiment of the present invention includes an X-ray generator, an X-ray measuring device and an external system. The x-ray generator generates x-rays, and the x-ray measuring apparatus includes a detector panel for sensing the x-ray, and a detector controller for controlling the detector panel and the x-ray generator. The external system exchanges signals with the X-ray measuring apparatus wirelessly or by wire, and controls the X-ray measuring apparatus.

The detector controller provides an X-ray preparation signal for preparing to emit the X-ray to the X-ray generator in response to a preparation control signal applied from the external system, and after the preparation control signal is applied, is applied from the external system. In response to the emission control signal, the detector panel provides a detector preparation signal for preparing the X-ray for sensing, and in response to the emission of the detector preparation signal, an X-ray emission for the actual emission of the X-ray is output to the X-ray generator. While providing a signal, a detector capture signal for outputting image data sensed by the detector panel is provided to the detector panel. In this case, the detector preparation signal is provided to the detector panel only for a predetermined time after the application time of the emission control signal.

The external system may include a system controller and a detector library. The system controller provides the preparation control signal and the emission control signal to the detector controller and performs image processing on the image data output from the detector panel. The detector library stores the characteristic data of the detector panel used for the image processing and provides the system controller.

Alternatively, the external system performs image processing on the image data output from the detector panel, and the X-ray measuring apparatus stores characteristic data of the detector panel used for the image processing. And a characteristic memory configured to provide characteristic data of the detector panel to the external system when a wired or wireless connection is performed.

Meanwhile, the characteristic data of the detector panel may include change characteristic data over time from an initial driving point of the detector panel with respect to a dark image current value that may be measured by the detector panel.

An X-ray measuring system according to another embodiment of the present invention includes an X-ray generator, an X-ray measuring apparatus, and an external system. The x-ray generator generates x-rays, and the x-ray measuring apparatus includes a detector panel for sensing the x-ray, and a detector controller for controlling the detector panel and the x-ray generator. The external system exchanges signals with the X-ray measuring apparatus wirelessly or by wire, controls the X-ray measuring apparatus, and performs image processing on image data sensed and provided by the detector panel using the characteristic data of the detector panel. do. In this case, the characteristic data of the detector panel includes change characteristic data over time from the initial driving time of the detector panel with respect to a dark image current value that can be measured by the detector panel.

The external system may provide the preparation control signal and the emission control signal to the detector controller and perform image processing on the image data output from the detector panel, and the detector panel used for the image processing. It may include a detector library for storing the characteristic data of the provided to the system controller.

Alternatively, the X-ray measuring apparatus stores characteristic data of the detector panel used for the image processing, and provides characteristic data of the detector panel to the external system when a wired or wireless connection with the external system is performed. It may further include a memory.

According to the X-ray measuring apparatus and the X-ray measuring system having the same, the detector is provided when the detector control signal for preparing for sensing the X-ray from the detector controller to the detector panel after the emission control signal is applied to the detector controller, As the preparation signal is provided to the detector panel only for a predetermined time after the application of the emission control signal, the preparation time for X-ray sensing of the detector panel may be constant, and as a result, in the sensing pixels of the detector panel. It is possible to more accurately measure the internal image of the measurement object by suppressing the change of the dark image current value of.

The object to be measured may be performed by performing image processing on image data sensed and provided by the detector panel using the change characteristic data over time from the initial driving time of the detector panel with respect to the dark image current value. The internal image of the can be measured more accurately.

1 is a block diagram illustrating an X-ray measuring system according to a first exemplary embodiment of the present invention.
FIG. 2 is a detailed block diagram illustrating a signal flow in the x-ray measuring system of FIG. 1.
3 is a circuit diagram illustrating in detail a detector panel of the X-ray measuring apparatus of FIG. 2.
4 is a waveform diagram illustrating a relationship between signals in the x-ray measuring system of FIG. 2.
5 is a block diagram illustrating an X-ray measuring system according to a second exemplary embodiment of the present invention.
6 is a block diagram illustrating an X-ray measuring system according to a third exemplary embodiment of the present invention.
FIG. 7 is a graph illustrating a change of a dark image current value over time from the initial driving time of the detector panel of FIG. 6.
8 is a block diagram illustrating an X-ray measuring system according to a fourth exemplary embodiment of the present invention.

As the inventive concept allows for various changes and numerous embodiments, particular embodiments will be illustrated in the drawings and described in detail in the text.

It should be understood, however, that the invention is not intended to be limited to the particular forms disclosed, but includes all modifications, equivalents, and alternatives falling within the spirit and scope of the invention. The terms first, second, etc. may be used to describe various elements, but the elements should not be limited by the terms. The terms are used only for the purpose of distinguishing one component from another. For example, without departing from the scope of the present invention, the first component may be referred to as a second component, and similarly, the second component may also be referred to as a first component.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. Singular expressions include plural expressions unless the context clearly indicates otherwise. In this application, the terms "comprise" or "having" are intended to indicate that there is a feature, number, step, action, component, part, or combination thereof described in the specification, and that one or more other features It should be understood that it does not exclude in advance the possibility of the presence or addition of numbers, steps, actions, components, parts or combinations thereof.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Reference will now be made in detail to the preferred embodiments of the present invention, examples of which are illustrated in the accompanying drawings.

≪ Example 1 >

1 is a block diagram illustrating an X-ray measuring system according to a first exemplary embodiment of the present invention.

Referring to FIG. 1, the X-ray measuring system according to the present embodiment includes an X-ray measuring apparatus 100 capable of sensing X-rays, an X-ray generating apparatus 200 capable of providing X-rays to the X-ray measuring apparatus 100, and the It includes an external system 300 that can exchange signals with the X-ray measuring apparatus 100.

The X-ray measuring apparatus 100 may measure the image data of the measuring object 10 by sensing the X-ray generated by the X-ray generating apparatus 200 and transmitted through the measuring object 10. In this case, the X-ray measuring apparatus 100 may be driven in any one of a still image photographing mode for photographing a still image of the measurement object 10 and a video photographing mode for photographing a video of the measurement object 10. In this case, when the x-ray measuring apparatus 100 is driven in the video recording mode, for example, the video of the measurement target 10 may be captured at a frame frequency of 60 Hz.

The X-ray generator 200 exchanges signals with the X-ray measuring apparatus 100 by wire or wireless communication. The X-ray generator 200 may be controlled by the X-ray measuring apparatus 100 to irradiate the X-rays to the measurement target 10. The X-ray irradiated in this manner is applied to the X-ray measuring apparatus 100 after passing through the measurement object 10.

The external system 100 may be a computer system that can exchange signals with the X-ray measuring apparatus 100 by wire or wireless communication. The external system 100 may control the driving of the X-ray measuring apparatus 100 and receive the image data measured by the X-ray measuring apparatus 100.

On the other hand, the X-ray measuring system is a mobile system that can move freely outside to measure the internal image of the bones of the horse, etc., but is fixed in the room such as a hospital fixed system for measuring the internal image of the patient's body, etc. Can be.

FIG. 2 is a detailed block diagram illustrating a signal flow in the x-ray measuring system of FIG. 1.

Referring to FIG. 2, the external system 300 may be operated by an operator to provide a preparation control signal SR and an emission control signal SE to the X-ray measuring apparatus 100. In this case, the ready control signal SR is a command to perform X-ray measurement preparation in the X-ray measuring system as a software ready signal S / W Ready Signal, and the emission control signal SE is a software exposure signal S / W. W Exposure Signal) is an instruction to actually perform X-ray measurement in the X-ray measuring system.

The X-ray measuring apparatus 100 may include a detector controller 110, a detector panel 120, and a capture memory 130.

The detector controller 110 is a control element capable of controlling the detector panel 120, the capture memory 130, and the like. The detector controller 110 controls the preparation control signal SR and the emission control signal SE to the external system. 300). In this case, the detector controller 110 is connected to the detector panel 120 and the capture memory 130 and the like to control the FPGA device (not shown) and the central processing unit (not shown) for controlling the FPGA device. It may include.

The detector controller 110 provides an X-ray preparation signal GR and an X-ray output signal GE to the X-ray generator 200, and detects a detector preparation signal DR and a detector capture signal to the detector panel 120. CT) and a signal transmission signal TF to the capture memory 130.

The detector panel 120 is controlled by receiving a detector preparation signal DR and a detector capture signal CT from the detector controller 110 and controls the detector 10 in response to the detector capture signal CT. Image data DA is emitted to the capture memory 130. Here, the detector preparation signal DR is a command for the detector panel 120 to perform a preparation operation for sensing an X-ray, and the detector capture signal CT performs scanning of the detector panel 120. The image data DA measured by the detector panel 120 is output to the capture memory 130. On the other hand, a detailed description of the detector panel 120 will be described later using a separate drawing.

The capture memory 130 receives and stores the image data DA from the detector panel 120. The capture memory 140 is controlled by receiving the signal transmission signal TF from the detector controller 110 and transmits the stored image data DA to the external system 300. In this case, the signal transmission signal TF is a command to transmit the image data DA stored in the capture memory 140 to the external system 300, and the image data DA transmitted by such a command. ) May be deleted in the capture memory 140.

The X-ray generating apparatus 200 is controlled by receiving the X-ray preparation signal GR and the X-ray emission signal GE from the detector controller 110. The X-ray preparation signal GR is a generator ready signal, and the X-ray generating apparatus 200 is a command to prepare an X-ray output preparation, and the X-ray output signal GE is a generator exposure signal. X) the x-ray generator 200 is a command to actually perform the emission of the x-rays.

3 is a circuit diagram illustrating in detail a detector panel of the X-ray measuring apparatus of FIG. 2.

Referring to FIG. 3, the detector panel 120 includes a plurality of gate lines GL, a plurality of data lines DL, a plurality of bias lines BL, a plurality of sensing pixels 122, and a scan. The driving unit 124, the signal output unit 126, and the bias unit 128 may be included.

The gate lines GL are formed in a first direction parallel to each other, and the data lines DL are formed in a second direction parallel to each other in the first direction. In this case, the first and second directions preferably cross perpendicular to each other. Meanwhile, the bias lines BL are formed in one of the first direction and the second direction.

The sensing pixels 122 are arranged in a matrix form to correspond to a point where the gate lines GL and the data lines DL intersect each other, and thus, the gate lines GL and the data lines ( DL) is electrically connected to each. In addition, the sensing pixels 122 are electrically connected to the bias lines BL, respectively.

The sensing pixels 122 may directly sense X-rays passing through the measurement object 10 or change the X-rays to other light and then sense them. In this case, when the sensing pixels 122 sense the light formed by changing the X-ray, the X-ray measuring apparatus changes an X-ray to an light that can be sensed by the sensing pixel. The X-ray conversion unit may be further disposed or attached to the detector panel 120 or may be embedded in the detector panel 120.

Each of the sensing pixels 122 includes a light sensing diode DI that directly or indirectly senses the X-ray, a capacitor CP that accumulates charges formed by sensing the light sensing diode DI, and the gate wiring. The thin film transistor TR outputs a charge stored in the capacitor CP, that is, a sensing signal along the data line DL, by the scan signal applied from the GL. Specifically, for example, the gate line GL may include a gate terminal of the thin film transistor TR, the data line DL may include a drain terminal of the thin film transistor TR, and a source of the thin film transistor TR. The terminal may be electrically connected to the first terminal of the capacitor CP and the N side terminal of the light sensing diode DI. In addition, the bias line BL may be electrically connected to the second terminal of the capacitor CP and the P-side terminal of the light sensing diode DI. Meanwhile, each of the sensing pixels 122 may have a circuit of another type in addition to the component circuit shown in FIG. 3.

The scan driver 124 is electrically connected to the gate lines GL to apply the scan signal to each of the gate lines GL. The signal output unit 126 is electrically connected to the data lines DL to receive the sensing signal from each of the sensing pixels 110 and output the sensing signal to the capture memory 140.

The bias unit 128 is electrically connected to the bias lines BL to provide a bias voltage to each of the sensing pixels 110. Specifically, for example, the bias unit 128 may apply a first bias voltage higher than the reference voltage generated from the signal output unit 126 or a second bias voltage lower than the reference voltage. At this time, when the first bias voltage is applied to the P-side terminal of the light sensing diode DI, the light sensing diode DI is subjected to a reverse voltage bias, and the second bias voltage is applied to the light sensing diode DI. When applied to the P-side terminal of), the photosensitive diode DI is subjected to a forward voltage bias. Meanwhile, unlike FIG. 3, the bias unit 128 may be omitted, and the signal output unit 126 may provide the bias voltage as well as the reference voltage.

2 and 3, the detector preparation signal DR controls the scan driver 124, the signal output unit 126, the bias unit 128, and the like to sense X-rays. A preparation operation, for example, the amount of charges charged in the sensing pixels 122 can be made uniform. In addition, the detector capture signal CT controls the scan driver 124, the signal output unit 126, the bias unit 128, and the like to detect the image data sensed by the sensing pixels 122. The signal output unit 126 may be output to the outside.

4 is a waveform diagram illustrating a relationship between signals in the x-ray measuring system of FIG. 2.

2 and 4, first, when the preparation control signal SR is provided from the external system 300 to the detector controller 110 by the operator, the detector controller 110 may prepare the preparation control signal. In response to SR, the X-ray generator 200 outputs the X-ray preparation signal GR. As a result, the X-ray generating apparatus 200 exists in a ready state capable of emitting X-rays by the X-ray preparation signal GR.

Thereafter, when the emission control signal SE is provided from the external system 300 to the detector controller 110 by the operator, the detector controller 110 responds to the emission control signal SE. The detector preparation signal DR is output to the 120. In this case, the detector preparation signal DR is provided to the detector panel 120 only for a predetermined time T after the application time of the emission control signal SE. As described above, the detector preparation signal DR is applied to the detector panel 120 only for the predetermined time T regardless of the operation time of the operator, that is, the emission control signal SE. The detector panel 120 performs a preparation operation for sensing X-rays only during the predetermined time T. As a result, it is possible to suppress the change of the dark image current values measured in the sensing pixels 122 according to the preparation operation time of the detector panel 120.

Subsequently, in response to the emission of the detector preparation signal DR, the detector controller 110 emits the X-ray emission signal GE to the X-ray generator 200, and then, the detector panel 120 outputs the X-ray emission signal GE to the detector panel 120. The detector capture signal CT is emitted. As a result, the X-ray generator 200 emits X-rays to the detector panel 120, and then the detector panel 120 senses the image data DA formed by sensing the X-rays. )

Although not shown in the drawing, after the detector capture signal CT is provided to the detector panel 120, the detector controller 110 transmits the signal transmission signal TF to the capture memory 130 to capture the capture. The image data DA stored in the memory 130 is transmitted to the external system 300.

As described above, after the emission control signal SE is applied to the detector controller 110, the detector controller 110 provides the detector preparation signal DR to the detector panel 120. When the detector preparation signal DR is provided to the detector panel 120 only for a predetermined time after the application of the emission control signal SE, the detector panel 120 is ready for X-ray sensing. The time may be constant, and as a result, the internal image of the measurement target 10 may be measured more accurately by suppressing the change of the dark image current value in the sensing pixels 122 of the detector panel 120. .

<Example 2>

5 is a block diagram illustrating an X-ray measuring system according to a second exemplary embodiment of the present invention.

Referring to FIG. 5, the X-ray measuring system according to the present embodiment includes an X-ray measuring apparatus 100, an X-ray generating apparatus 200, and an external memory 400. In this case, the X-ray generator 200 is substantially the same as the X-ray generator 200 in the first embodiment, a detailed description thereof will be omitted.

The X-ray measuring apparatus 100 includes a detector controller 110, a detector panel, a capture memory 130, a detector switch 140, and an external connection terminal 150.

First, the detector switch 140 is disposed at a position that can be manipulated by an operator and provides the detector controller 110 with a preparation control signal SR and an emission control signal SE. Specifically, the detector switch 140 may include a first switch unit (not shown) for generating the preparation control signal SR and a second switch unit (not shown) for generating the emission control signal SE. It may include.

The detector controller 110, the detector panel 120, and the capture memory 150 are substantially the same as the detector controller 110, the detector panel 120, and the capture memory 130 of the first embodiment. The detailed description will be omitted.

The external connection terminal 150 is a connection terminal for electrically connecting with the external memory 400, and receives the image data stored in the capture memory 130 from the capture memory 130. 400). Here, the external memory 400 may be a universal serial bus (USB) memory, a secure digital (SD) memory, or the like.

Meanwhile, since the relationship between the various signals used in the present embodiment is substantially the same as the relationship between the signals described with reference to FIG. 4, a detailed description thereof will be omitted.

As described above, according to the present exemplary embodiment, since the preparation control signal SR and the emission control signal SE are provided to the detector controller 110 through the detector switch 140, the detector controller 110 is provided. A separate external system for control may be unnecessary. In addition, when the image data is stored through the external memory 400, the external memory 400 may be connected to the external system to implement an internal image of a measurement object, and thus, the X-ray measuring apparatus 100 may be implemented. Mobility can be further improved.

<Example 3>

6 is a block diagram illustrating an X-ray measuring system according to a third exemplary embodiment of the present invention.

Referring to FIG. 6, the X-ray measuring system according to the present embodiment includes an X-ray measuring apparatus 100, an X-ray generating apparatus 200, and an external system 300. Here, since the X-ray measuring apparatus 100 and the X-ray generating apparatus 200 are substantially the same as the X-ray measuring apparatus 100 and the X-ray generating apparatus 200 of Example 1, a detailed description thereof will be omitted. .

The external system 300 is, for example, a computer system that can be manipulated by an operator, and may include a system controller 310 and a detector library 320.

The system controller 310 controls the detector controller 310 by providing a preparation control signal SR and an emission control signal SE to the detector controller 310. In addition, the system controller 310 receives the image data DA from the capture memory 130 and performs image processing on the image data DA, so as to provide a still image or an image of the internal image of the measurement target 10. You can extract the video.

The detector library 320 stores characteristic data of the detector panel 120 used for the image processing in the system controller 310. For example, the detector library 320 may be a hard disk or a memory device that stores the characteristic data of the detector panel 120.

The characteristic data of the detector panel 120 includes data on the characteristic change of the detector panel 120 for various factors that may be changed by the internal image of the measurement target 10. For example, the characteristic data of the detector panel 120 stored in the detector library 320 may be used to initially drive the detector panel 120 to a dark image current value that may be measured by the detector panel 120. It contains data on characteristics of change over time from the point of view.

The dark image current value is a minimum current value that can be measured by the sensing pixels 122 of the detector panel 120, and the X-ray generated by the X-ray generator 200 is a dense portion of the measurement target 10. When it is completely blocked by the sensor panel 120 is not applied to the sensing pixels 122 of the detector panel 120, it means the minimum value of the current that can be measured in each of the sensing pixels 122. On the other hand, the bright image current value is the maximum current value that can be measured by the sensing pixels 122 of the detector panel 120, and the X-ray generated by the X-ray generator 200 senses the sensing panel 120. When applied directly to the pixels 122, it means the maximum value of the current that can be measured in each of the sensing pixels 122. Here, the dark image current value may be changed by an external temperature or an operation time of the detector panel 120.

The system controller 310 receives characteristic data of the detector panel 120 from the detector library 320 and performs image processing on the image data DA based on the characteristic data of the detector panel 120. The internal image of the measurement target 10 can be extracted more accurately. For example, the system controller 310 may accurately measure an internal image of the measurement target 10 by referring to change data of the dark image current value for various factors. Here, when the dark image current value is DI, the dark image current value is BI, and the current value sensed by the sensing pixel 122 is SI, the internal image of the measurement target 10 is ( SI-DI) / (BI-DI).

FIG. 7 is a graph illustrating a change of a dark image current value over time from the initial driving time of the detector panel of FIG. 6.

Referring to FIG. 7, the dark image current values of the sensing pixels 122 of the detector panel 120 gradually increase with time, and then have a substantially constant value after the threshold time Tc.

In detail, for example, the dark image current value changes over time starting from the time point at which the power is applied to the detector panel 120, and initially has a value of about 2100 LSB (least significant bit). It gradually increases to about 2700 LSB, and may be maintained at about 2700 LSB after the threshold time Tc. Here, the characteristic data of FIG. 7 may be data tested based on a specific environment.

Meanwhile, the detector library 320 stores change data of an average value of the dark image current values in the sensing pixels 122, or changes data of the dark image current values in each of the sensing fill cells 122. It may be storing. In addition, when the sensing pixels 122 are divided into a plurality of blocks, the change data of the average value of the dark image current values of the sensing pixels 122 may be stored for each block.

Furthermore, the detector library 320 may store change data of a dark image current value every time a used period of the detector panel 120, for example, a cumulative use time of 1000 hours or every year. have. In addition, the detector library 320 stores change data of a dark image current value according to ambient temperature or humidity. That is, the system controller 310 may determine the driving time, the cumulative usage time, the ambient temperature and the humidity of the detector panel 120, and find a dark image current value corresponding thereto to perform image processing.

As described above, according to the present exemplary embodiment, the detector panel 120 performs image processing on the image data sensed and provided by the detector panel 120 using the change characteristic data of the dark image current value according to the driving time. By doing so, the internal image of the measurement target 10 can be measured more accurately. For example, when the dark image current value is about 2200 LSB when the driving time of the detector panel 120 is 1 hour from the initial driving time, the system controller 310 sets the dark image current value of about 2200 LSB. Based on the image processing performed on the image data sensed by the sensing pixels 122 may be more accurately extract the internal image of the measurement object (10).

<Example 4>

8 is a block diagram illustrating an X-ray measuring system according to a fourth exemplary embodiment of the present invention.

Referring to FIG. 8, the x-ray measuring system according to the present embodiment includes an x-ray measuring apparatus 100, an x-ray generating apparatus 200, and an external system 300. Here, since the X-ray generator 200 and the external system 300 are substantially the same as the X-ray generator 200 and the external system 300 of the first embodiment, a detailed description thereof will be omitted.

The X-ray measuring apparatus 100 includes a detector controller 110, a detector panel 120, a capture memory 130, and a characteristic memory 160. The detector controller 110, the detector panel 120, and the capture memory 130 are substantially the same as the detector controller 110, the detector panel 120, and the capture memory 130 of the first embodiment. Detailed description thereof will be omitted.

The characteristic memory 160 stores characteristic data of the detector panel 120 used for image processing in the external system 300. The characteristic memory 160 may transmit characteristic data of the detector panel 300 to the external system 300 when the X-ray measuring apparatus 100 is connected to the external system 300 by wire or wirelessly. To provide. In this case, the external system 160 performs image processing on the image data DA received from the capture memory 130 based on the characteristic data of the detector panel 120 received from the characteristic memory 160. The internal image of the measurement target 10 can be extracted more accurately.

Meanwhile, since the characteristic data of the detector panel 120 stored in the characteristic memory 160 is substantially the same as the characteristic data of the detector panel 120 described in the third embodiment, a detailed description thereof will be omitted.

As described above, according to the present embodiment, the X-ray measuring apparatus 100 further includes the characteristic memory 160 storing the characteristic data of the detector panel 120 in the X-ray measuring apparatus 100. 6 may also be used in connection with an external system 300 that does not have the detector library 320 as shown in FIG. 6, and thus mobility of the X-ray measuring apparatus 100 may be further improved.

In the detailed description of the present invention described above with reference to the preferred embodiments of the present invention, those skilled in the art or those skilled in the art having ordinary skill in the art will be described in the claims to be described later It will be understood that various modifications and variations can be made in the present invention without departing from the scope of the present invention.

10: measuring object 100: X-ray measuring device
110: detector controller 120: detector panel
122: sensing pixel 130: capture memory
140: detector switch 150: external connection terminal
160: characteristic memory 200: X-ray generator
300: external system 310: system controller
320: detector library 400: external memory
SR: Ready control signal SE: Output control signal
GR: X-ray ready signal GE: X-ray control signal
DR: Detector ready signal CT: Detector capture signal

Claims (12)

A detector panel configured to sense x-rays generated by the x-ray generator; And
A detector controller for controlling the detector panel and the X-ray generator,
The detector controller
In response to a preparation control signal applied from the outside, providing an X-ray preparation signal for preparing to emit the X-ray to the X-ray generator,
After the preparation control signal is applied, in response to an emission control signal applied from the outside, the detector panel provides a detector preparation signal for preparing for sensing of the X-ray,
In response to the detection of the detector preparation signal, a detector capture signal for outputting image data sensed by the detector panel is provided to the detector panel while providing an X-ray emission signal for actual emission of the X-ray to the X-ray generator. and,
The detector preparation signal is provided to the detector panel only for a predetermined time after the application of the emission control signal. The method of claim 1, wherein the ready control signal and the emission control signal is
And an detector provided from the external system for controlling the detector controller to the detector controller. The X-ray measuring apparatus of claim 1, further comprising a detector switch configured to provide the preparation control signal and the emission control signal to the detector controller. The x-ray measuring apparatus of claim 1, further comprising a capture memory configured to store the image data emitted from the detector panel. The apparatus of claim 4, further comprising an external connection terminal electrically connected to the capture memory and connectable to an external memory.
And the image data stored in the capture memory is stored in the external memory via the external connection terminal. An x-ray generator generating x-rays;
An X-ray measuring apparatus including a detector panel for sensing the X-ray, and a detector controller for controlling the detector panel and the X-ray generator; And
And an external system for exchanging a signal with the X-ray measuring apparatus wirelessly or by wire, and controlling the X-ray measuring apparatus.
The detector controller
In response to a preparation control signal applied from the external system, providing an X-ray preparation signal for preparing to emit the X-ray to the X-ray generator,
After the preparation control signal is applied, in response to an emission control signal applied from the external system, a detector preparation signal for preparing for sensing the X-ray is provided to the detector panel.
In response to the detection of the detector preparation signal, a detector capture signal for outputting image data sensed by the detector panel is provided to the detector panel while providing an X-ray emission signal for actual emission of the X-ray to the X-ray generator. and,
The detector preparation signal is provided to the detector panel only for a predetermined time after the application of the emission control signal. The system of claim 6, wherein the external system is
A system controller configured to provide the preparation control signal and the emission control signal to the detector controller and perform image processing on the image data output from the detector panel; And
And a detector library storing characteristic data of the detector panel used for the image processing and providing the detector to the system controller. The system of claim 6, wherein the external system is
Perform image processing on the image data output from the detector panel,
The x-ray measuring device
And a characteristic memory configured to store characteristic data of the detector panel used for the image processing, and to provide characteristic data of the detector panel to the external system when connected to the external system by wire or wirelessly. X-ray measuring system. The method of claim 7 or 8, wherein the characteristic data of the detector panel is
And a change characteristic data over time from the initial driving point of the detector panel for the dark image current value that can be measured by the detector panel. An x-ray generator generating x-rays;
An X-ray measuring apparatus including a detector panel for sensing the X-ray, and a detector controller for controlling the detector panel and the X-ray generator; And
An external system that controls the X-ray measuring apparatus by exchanging signals with the X-ray measuring apparatus wirelessly or by wire, and performs image processing on the image data sensed and provided by the detector panel using the characteristic data of the detector panel. Including,
The characteristic data of the detector panel is
And a change characteristic data over time from the initial driving point of the detector panel for the dark image current value that can be measured by the detector panel. The system of claim 10, wherein the external system is
A system controller providing a control signal to the detector controller and performing image processing on the image data output from the detector panel; And
And a detector library storing characteristic data of the detector panel used for the image processing and providing the detector to the system controller. The method of claim 10, wherein the x-ray measuring device
And a characteristic memory configured to store characteristic data of the detector panel used for the image processing, and to provide characteristic data of the detector panel to the external system when connected to the external system by wire or wirelessly. X-ray measuring system.

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