KR101067166B1 - 상온 주사투과 진동특성 측정방법 - Google Patents
상온 주사투과 진동특성 측정방법 Download PDFInfo
- Publication number
- KR101067166B1 KR101067166B1 KR1020080132878A KR20080132878A KR101067166B1 KR 101067166 B1 KR101067166 B1 KR 101067166B1 KR 1020080132878 A KR1020080132878 A KR 1020080132878A KR 20080132878 A KR20080132878 A KR 20080132878A KR 101067166 B1 KR101067166 B1 KR 101067166B1
- Authority
- KR
- South Korea
- Prior art keywords
- current
- vibration characteristics
- measured
- room temperature
- noise
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000005540 biological transmission Effects 0.000 claims abstract description 17
- 239000000523 sample Substances 0.000 claims description 36
- 238000009499 grossing Methods 0.000 claims description 6
- 238000000691 measurement method Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 14
- 239000007787 solid Substances 0.000 abstract description 9
- 230000003595 spectral effect Effects 0.000 description 6
- 230000007423 decrease Effects 0.000 description 3
- 238000004611 spectroscopical analysis Methods 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 239000007788 liquid Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000005641 tunneling Effects 0.000 description 2
- 238000005094 computer simulation Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000001508 electron transmission spectroscopy Methods 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
- G01Q60/14—STP [Scanning Tunnelling Potentiometry]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
Description
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080132878A KR101067166B1 (ko) | 2008-12-24 | 2008-12-24 | 상온 주사투과 진동특성 측정방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080132878A KR101067166B1 (ko) | 2008-12-24 | 2008-12-24 | 상온 주사투과 진동특성 측정방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20100084199A KR20100084199A (ko) | 2010-07-26 |
KR101067166B1 true KR101067166B1 (ko) | 2011-09-22 |
Family
ID=42643657
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020080132878A Expired - Fee Related KR101067166B1 (ko) | 2008-12-24 | 2008-12-24 | 상온 주사투과 진동특성 측정방법 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR101067166B1 (ko) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07103709A (ja) * | 1993-10-06 | 1995-04-18 | Hitachi Ltd | 走査型トンネル顕微鏡 |
JPH10206434A (ja) | 1997-01-17 | 1998-08-07 | Fujitsu Ltd | 情報検出方法及びその装置としてのスピン偏極走査型トンネル顕微鏡 |
JPH11160331A (ja) | 1997-12-01 | 1999-06-18 | Jeol Ltd | トンネルスペクトロスコピー |
US20050138996A1 (en) | 2003-12-29 | 2005-06-30 | Intel Corporation | Use of arrays of atomic force microscope/scanning tunneling microscope tips to scan nanocodes |
-
2008
- 2008-12-24 KR KR1020080132878A patent/KR101067166B1/ko not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07103709A (ja) * | 1993-10-06 | 1995-04-18 | Hitachi Ltd | 走査型トンネル顕微鏡 |
JPH10206434A (ja) | 1997-01-17 | 1998-08-07 | Fujitsu Ltd | 情報検出方法及びその装置としてのスピン偏極走査型トンネル顕微鏡 |
JPH11160331A (ja) | 1997-12-01 | 1999-06-18 | Jeol Ltd | トンネルスペクトロスコピー |
US20050138996A1 (en) | 2003-12-29 | 2005-06-30 | Intel Corporation | Use of arrays of atomic force microscope/scanning tunneling microscope tips to scan nanocodes |
Also Published As
Publication number | Publication date |
---|---|
KR20100084199A (ko) | 2010-07-26 |
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