KR100817851B1 - Method for electronic components error self-diagnostic - Google Patents

Method for electronic components error self-diagnostic Download PDF

Info

Publication number
KR100817851B1
KR100817851B1 KR1020060104842A KR20060104842A KR100817851B1 KR 100817851 B1 KR100817851 B1 KR 100817851B1 KR 1020060104842 A KR1020060104842 A KR 1020060104842A KR 20060104842 A KR20060104842 A KR 20060104842A KR 100817851 B1 KR100817851 B1 KR 100817851B1
Authority
KR
South Korea
Prior art keywords
component
self
abnormality
diagnostic
diagnosis
Prior art date
Application number
KR1020060104842A
Other languages
Korean (ko)
Inventor
김수길
Original Assignee
에드뷰시스템 (주)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 에드뷰시스템 (주) filed Critical 에드뷰시스템 (주)
Priority to KR1020060104842A priority Critical patent/KR100817851B1/en
Application granted granted Critical
Publication of KR100817851B1 publication Critical patent/KR100817851B1/en

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/32—Monitoring with visual or acoustical indication of the functioning of the machine
    • G06F11/324—Display of status information
    • G06F11/325—Display of status information by lamps or LED's

Abstract

A method for self-diagnosing an abnormal electronic component is provided to remove the necessity of disassembling a product and testing electronic components one by one to fine out an abnormal component. An MCU(Micro Controller Unit) sets the number and time duration of blinking of each component(S200). The MCU performs a self-diagnosing mode to diagnose whether or not an operation is normally performed by writing and reading a certain value in a particular register of each component(S210-S230). An erroneous component is displayed on a display unit, and in this case, a time duration and the number of blinking is different according to a diagnosis result of each component(S240).

Description

전자부품 이상 자가진단방법{Method For Electronic Components Error Self-diagnostic}Method for Electronic Components Error Self-diagnostic

도 1은 본 발명의 실시 예를 적용하기 위한 엘씨디 티브이의 구성을 간략하게 보인 블록도.Figure 1 is a block diagram showing a brief configuration of the LCD for applying the embodiment of the present invention.

도 2는 본 발명의 실 시예에 따른 부품 이상 유무의 자가진단 과정을 보인 흐름도.Figure 2 is a flow chart showing a self-diagnosis process of the presence or absence of component failure according to an embodiment of the present invention.

도 3은 본 발명의 실시 예에 따른 부품별 이상여부를 화면에 표시하는 방법을 보인 표.Figure 3 is a table showing a method of displaying on the screen whether or not abnormalities for each part according to an embodiment of the present invention.

도 4는 본 발명의 실시 예에 따른 진단결과를 화면에 표시하는 과정을 보인 예시도.4 is an exemplary view showing a process of displaying a diagnosis result on the screen according to an embodiment of the present invention.

*** 도면의 주요부분에 대한 설명 ****** Description of the main parts of the drawing ***

100 : MCU 110 : 키 패드100: MCU 110: key pad

120 : ADC 130 : 비디오 디코더120: ADC 130: video decoder

140 : TV 튜너 150 : 오디오 프로세서140: TV tuner 150: audio processor

160 : 오디오 앰프 170 : 표시수단160: audio amplifier 170: display means

200 : 전원표시 엘이디(LED)200: power display LED

본 발명은 전자 부품 이상 자가진단방법에 관한 것으로, 특히 엘씨디(LCD) 티브이와 같은 전자제품에서 이상발생 시 자체적으로 부품의 동작 이상 진단하여 확인할 수 있도록 하는 방법에 관한 것이다.The present invention relates to a method for self-diagnosis of an electronic component, and more particularly, to a method for diagnosing and confirming an operation abnormality of a component itself when an abnormality occurs in an electronic product such as an LCD TV.

일반적으로 전자 제품은 출고 전에 내부의 각 부품들이 작동에 이상이 없는가를 검사를 하여 출고한다. 이후에는 고장이 일어나면 보통의 경우에는 A/S센터에서 테스트 장비를 가지고 고장 여부를 검사하게 된다.In general, electronic products are shipped from the factory by inspecting the internal components for proper operation. After that, when a failure occurs, the A / S center usually checks the failure with test equipment.

그러나, 고장난 부분이 어디인지를 알기 위해서는 제품을 전부 분해해서 일일이 테스트해야 하기 때문에 고장 부분을 알아내기에 시간이 많이 소요되며, 비효율적인 등의 문제점이 있었다.However, since it is necessary to disassemble and test all the products in order to know where the broken part is, it takes a lot of time to find out the broken part, and there are problems such as inefficiency.

따라서, 본 발명은 상기와 같은 종래의 문제점을 해결하기 위하여 창안한 것으로, 이상 발생 시 전자제품 내부에서 이상 유무를 자체적으로 진단하도록 하는 방법을 제공함에 그 목적이 있다. Accordingly, the present invention has been made to solve the above-mentioned conventional problems, and an object thereof is to provide a method for self-diagnosing an abnormality in an electronic product when an abnormality occurs.

이와 같은 목적을 달성하기 위한 본 발명 전자 부품 이상 자가진단방법은, 전자제품에 이상 상태 발생 시 자가진단모드로 돌입하여 각 부품별로 순차적인 통신을 통하여 이상 발생 여부를 진단하고, 상기 진단결과에 따라 화면에 해당 부품의 이상여부를 표시하는 것을 특징으로 한다. In order to achieve the above object, the present invention provides a self-diagnosis method for an electronic component, which enters a self-diagnosis mode when an abnormal state occurs in an electronic product, and diagnoses an abnormality through sequential communication for each component, and according to the diagnosis result. It is characterized by displaying whether or not the corresponding parts on the screen.

이하, 본 발명에 따른 실시 예를 첨부한 도면을 참조하여 상세히 설명하면 다음과 같다.Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

도 1은 본 발명의 실시예를 적용하기 위한 엘씨디 티브이의 구성을 간략하게 보인 블록도로서, 이에 도시한 바와 같이 엘씨디 티브이 내의 각 부품(120 ~ 160)에 대해 MCU(100)에서 통신라인(IIC)을 통하여 구동 제어를 수행하는데, 부품에 이상이 발생한 경우에 이상동작 여부를 진단하기 위해 키 패드(110)를 통한 사용자의 명령 또는 자동으로 자가진단모드로 돌입 후 그 결과를 전원표시 엘이디(LED, 200)와 표시수단(170)에 표시를 한다. FIG. 1 is a block diagram briefly showing a configuration of an LCD to apply an embodiment of the present invention. As shown in FIG. 1, a communication line (IIC) in the MCU 100 for each component 120 to 160 in the LCD is shown. In order to diagnose the abnormal operation in case of abnormality in the parts, the drive control is performed through the user's command or automatically enters the self-diagnosis mode and displays the result of the power display LED (LED). , 200 and the display means 170.

이와 같이 구성한 본 발명의 실시예에 따른 동작 과정을 첨부한 도면을 참조하여 설명하면 다음과 같다.Referring to the accompanying drawings, the operation process according to the embodiment of the present invention configured as described above is as follows.

도 2는 본 발명의 실시예에 따른 부품 이상 유무의 자가진단 과정을 보인 흐름도로서, 이에 도시한 바와 같이 먼저 각 부품별 점멸횟수와 시간을 설정한 후 MCU(100)는 이상 여부 발생 시 각 부품내의 특정 레지스터에 일정값을 쓰고 읽음(write/read)으로서 정상동작 여부를 진단하는 자가진단모드를 수행한다(S200 ~ S230). 2 is a flow chart showing a self-diagnosis process of the presence or absence of component failure according to an embodiment of the present invention, as shown in the first after setting the number and time of flashing for each component, MCU (100) each component when abnormality occurs A self-diagnostic mode for diagnosing normal operation is performed by writing and reading a predetermined value to a specific register in the operation (S200 to S230).

이후, 상기 이상여부를 전원표시 LED(200) 및 표시수단(170)에 표시하게 되 는데, 표시하는 방법은 도 3에 도시한 바와 같이 각 부품별 진단결과에 따라 상기 전원표시 엘이디(LED, 200)가 화면에 점멸하는 시간 및 횟수에 차이를 둔다(S240).Thereafter, whether or not the abnormality is displayed on the power display LED 200 and the display means 170, the display method is the power display LED (LED, 200) according to the diagnostic result for each component as shown in FIG. ) And the time and the number of times that the screen blinks (S240).

즉, 상기 엘이디 점멸시간 및 횟수는 각 부품의 진단순서에 따라 시간과 횟수를 증가시켜 설정한다. 따라서 사용자는 점멸횟수와 시간으로 어느 부품에 이상이 발생하였는가를 판단할 수 있으며, 또한 상기 이상여부 표시 시에 진단단계를 모두 수행한 후에 이상 여부가 진단된 해당 부품에 대하여 검사 순서대로 순차적으로 화면에 표시하도록 한다.That is, the LED blinking time and the number of times is set by increasing the time and the number of times according to the diagnostic sequence of each part. Therefore, the user can determine which part has an abnormality by the number of flashes and the time, and after performing all the diagnostic steps at the time of displaying the abnormality, the user sequentially screens the corresponding parts diagnosed with the error in the order of inspection. Mark it.

예를 들어, 도 4에 도시한 바와 같이 아날로그/디지털 변환기(ADC, 120)와 오디오 앰프(AMP, 160)에 이상발생 진단 시 진단순서에 따라 상기 ADC를 먼저 표시하고, 그 후 오디오 앰프에 대한 상태를 표시하게 된다. 즉, 엘이디를 0.5초 온(on)한 후 0.5초 오프(off)하여 ADC에 이상 발생을 알린 다음, 3초의 지연시간이 지난 다음 1초 온, 0.5초 오프 동작을 반복하여 오디오 앰프에도 이상이 있음을 알린 후 다시 3초의 지연시간을 가진다. For example, as shown in FIG. 4, the ADC is first displayed according to a diagnosis sequence when an error occurs in the analog / digital converter (ADC) 120 and the audio amplifier (AMP, 160). The status will be displayed. In other words, the LED is turned on for 0.5 seconds and then turned off for 0.5 seconds to notify the ADC of an abnormality.Then, after 3 seconds of delay time, the 1 second on and 0.5 second off operations are repeated. There is a 3 second delay after the notification.

이후, 다시 ADC에 이상이 진단되었음을 표시하는 동작으로 되돌아가며, 사용자로부터 확인이 있을 때까지 상기의 동작을 반복한다.Thereafter, the process returns to the operation indicating that the ADC has diagnosed an abnormality, and the above operation is repeated until confirmation from the user.

또한, 표시수단(170)이 엘씨디 모니터인 경우에는, 오에스디(On Screen Display, OSD) 형태로 표시한다.In addition, when the display means 170 is an LCD monitor, the display means 170 displays an On Screen Display (OSD).

이상에서 본 발명의 구체적인 실시예를 상세히 설명하였으나, 본 발명은 이에 한정되는 것은 아니며, 실시간으로 진단결과에 따라 화면에 표시하도록 하는 등 이 분야의 통상의 지식을 가진 자라면 본 발명의 기술적 사상을 바탕으로 다양한 변경과 수정이 가능할 것이다.Although specific embodiments of the present invention have been described in detail above, the present invention is not limited thereto, and a person having ordinary skill in the art may display the technical idea of the present invention in such a manner that the screen is displayed according to a diagnosis result in real time. Based on this, various changes and modifications can be made.

이상에서 설명한 바와 같이 본 발명 전자 부품 이상 자가진단방법은, 이상이 발생한 부분이 어디인지를 알기 위해서는 제품을 전부 분해해서 일일이 테스트해야 할 필요가 없기 때문에 효율적으로 짧은 시간에 고장 부분을 알아내는 등의 효과가 있다.As described above, in the electronic component abnormality self-diagnosis method of the present invention, it is not necessary to disassemble all the products and test them in order to know where the abnormality occurs. It works.

Claims (6)

전자제품에 이상 상태 발생 시 자가진단모드로 돌입하여 각 부품별로 순차적인 통신을 통하여 이상 발생 여부를 진단하고, When an abnormal condition occurs in the electronic product, it enters the self-diagnosis mode and diagnoses the abnormality through sequential communication for each part. 상기 진단결과에 따라 화면에 전원 표시 엘이디(LED)가 점멸하는 시간 및 횟수에 차이를 두어 해당 부품의 이상 여부를 표시하는 것을 특징을 하는 전자부품 이상 자가진단방법.The electronic component abnormality self-diagnosis method according to the diagnostic result, characterized in that the display of the abnormality of the corresponding parts by varying the time and the number of times the power display LED (LED) flashes on the screen. 제1항에 있어서, 상기 이상 발생 여부진단 시 The method of claim 1, wherein 각 부품내의 특정 레지스터에 일정값을 쓰고 읽음(write/read)으로서 정상동작 여부를 진단하는 단계를 포함하는 것을 특징으로 하는 전자부품 이상 자가진단방법.And diagnosing the normal operation by writing and reading a predetermined value to a specific register in each component. 삭제delete 제1항에 있어서, 상기 엘이디 점멸시간 및 횟수는 The method of claim 1, wherein the LED blinking time and number 각 부품의 진단순서에 따라 시간과 횟수를 증가시켜 설정하는 것을 특징으로 하는 전자부품 이상 자가진단방법.Self-diagnosis method for electronic parts, characterized in that the time and the number of times set in accordance with the diagnostic sequence of each component. 제1항에 있어서, 상기 이상여부 표시 시 The method of claim 1, wherein 진단단계를 모두 수행한 후에 이상 여부가 진단된 해당 부품에 대하여 검사 순서대로 순차적으로 화면에 표시하는 것을 특징으로 하는 전자부품 이상 자가진단방법.Self-diagnosis method for electronic parts, characterized in that after performing all the diagnostic step, the screen is displayed sequentially in the order of inspection for the parts diagnosed with the abnormality. 삭제delete
KR1020060104842A 2006-10-27 2006-10-27 Method for electronic components error self-diagnostic KR100817851B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020060104842A KR100817851B1 (en) 2006-10-27 2006-10-27 Method for electronic components error self-diagnostic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060104842A KR100817851B1 (en) 2006-10-27 2006-10-27 Method for electronic components error self-diagnostic

Publications (1)

Publication Number Publication Date
KR100817851B1 true KR100817851B1 (en) 2008-03-31

Family

ID=39412073

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020060104842A KR100817851B1 (en) 2006-10-27 2006-10-27 Method for electronic components error self-diagnostic

Country Status (1)

Country Link
KR (1) KR100817851B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111966568A (en) * 2020-09-22 2020-11-20 北京百度网讯科技有限公司 Prompting method and device and electronic equipment

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0879803A (en) * 1994-09-07 1996-03-22 Victor Co Of Japan Ltd Television receiver
KR19990018639A (en) * 1997-08-28 1999-03-15 구자홍 Apparatus and method for transmitting magnetic diagnostic data of electronic device
KR20000004316A (en) * 1998-06-30 2000-01-25 전주범 Method of diagnosing and performing a program at a digital television

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0879803A (en) * 1994-09-07 1996-03-22 Victor Co Of Japan Ltd Television receiver
KR19990018639A (en) * 1997-08-28 1999-03-15 구자홍 Apparatus and method for transmitting magnetic diagnostic data of electronic device
KR20000004316A (en) * 1998-06-30 2000-01-25 전주범 Method of diagnosing and performing a program at a digital television

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111966568A (en) * 2020-09-22 2020-11-20 北京百度网讯科技有限公司 Prompting method and device and electronic equipment

Similar Documents

Publication Publication Date Title
US8788890B2 (en) Devices and methods for bit error rate monitoring of intra-panel data link
CN101526585A (en) Automatic switching test system and method
KR20090046463A (en) A device for testing input output module of distribution control system
KR100817851B1 (en) Method for electronic components error self-diagnostic
JP2009174924A (en) Diagnostic device, diagnostic system, diagnostic method, program, and recording medium
KR101376612B1 (en) System and method for testing control circuit
US8751183B2 (en) Tester having system maintenance compliance tool
JP2003068865A (en) Self-diagnosis method and apparatus of semiconductor device
KR20110029241A (en) Apparatus and method for condition diagnosis of turbine turning gear system
JP2009139313A (en) Inspection device having self-diagnostic function, and program and recording medium for the same
KR100212194B1 (en) Self-diagnosis method of mobile phone
CN210271735U (en) Liquid crystal display working state diagnostic device
JP2004163194A (en) Ic tester and testing module
US20170103007A1 (en) Configurable Input/Output Sub-channels for Optimized Diagnostics
JPH08286703A (en) Digital controller
JP2009066146A (en) Medical apparatus and inspection method of the same
WO2023079615A1 (en) Testing device and testing method
KR200445632Y1 (en) LCD Pannel Test JIG
JP2005039202A (en) Semiconductor process equipment and process diagnostic method
JPH06241948A (en) Monitoring equipment for train condition
JPH11134019A (en) Fault diagnostic system for combustion equipment
KR0137697B1 (en) Parts error search method & device
KR20050113798A (en) A control facilities card inspection device
JPH11118252A (en) Failure diagnostic system for burning appliance
JPH01259278A (en) Self-diagnostic device for printed circuit board

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20130207

Year of fee payment: 6

FPAY Annual fee payment

Payment date: 20140304

Year of fee payment: 7

FPAY Annual fee payment

Payment date: 20150204

Year of fee payment: 8

LAPS Lapse due to unpaid annual fee