KR100803752B1 - System and method for analyzing pixel - Google Patents

Abstract

An imaging device which sequentially photographs a plurality of pattern images displayed on the screen and generates the same number of captured images, wherein the pattern images are composed of a plurality of one-dimensional image lines, wherein the captured images Consisting of a plurality of imaging pixels; And an image analyzing apparatus which analyzes each captured image and associates the captured pixel with the one-dimensional image line. By allowing various pattern images to be projected on the screen in succession over time and photographing them, it is possible to find out where each pixel is projected on the one-dimensional scanning display device. In addition, a scanning trajectory of each pixel may be obtained to obtain various optical characteristics for each pixel.

Pixel analysis scanning 1d pattern image

Description

System and method for analyzing pixel

1 is an embodiment of a one-dimensional scanning display device, that is, a projection device using a one-dimensional optical modulator to which the MEMS element is applied.

2 to 4 show a one-dimensional optical modulator and a modulation principle.

5 is a schematic block diagram of a pixel analysis apparatus according to an exemplary embodiment of the present invention.

6 to 7 show an embodiment of a pattern image according to the present invention.

8 to 10 are diagrams showing a pattern image analysis method in the image analysis device 520 according to the present invention.

FIG. 11 is a pattern image capable of reducing the effect due to optical cross-talk in forming a pattern image having a binarized pixel identification value. FIG.

FIG. 12 is an enlarged view of a portion C shown in FIG. 11; FIG.

<Description of the symbols for the main parts of the drawings>

100: 1-dimensional scanning display device

500: Pixel Analysis System

510: imaging device

520: image analysis device

The present invention relates to an apparatus and method for pixel analysis, and more particularly, to an apparatus and method for capturing an image displayed by a one-dimension scanning display apparatus and analyzing a pixel.

Recently, with the development of display technology, the demand for the implementation of large images is increasing day by day. Currently, most large image display devices (mainly projectors) use liquid crystals as optical switches. Compared to the CRT projectors of the past, it is used because it is small, inexpensive, and the optical system is simple. However, it is pointed out that a large amount of light loss occurs because light from the light source is transmitted through the liquid crystal plate to the screen. Therefore, a brighter image can be obtained by reducing light loss by utilizing a micromachine such as an optical modulator element using reflection.

Micromachines are extremely small machines that are difficult to discern with the naked eye. Also known as MEMS (Micro Electro Mechanical System), it can be called microelectromechanical system or device. It is mainly made by applying semiconductor manufacturing technology. It is applied to various information equipment parts such as magnetic and optical heads using micro-optics and limit devices, and it is also applied to biomedical field and semiconductor manufacturing process using various micro fluid control technologies. Micromachines can be divided into micro-sensors that function as sensing elements, micro-actuators as driving devices, and miniature machines that serve as energy transfer devices.

MEMS is applied to the optical field as one of various application fields. MEMS technology enables the fabrication of optical components smaller than 1mm, enabling ultra-compact optical systems.

Micro-optical components such as optical modulators and micro lenses, which are miniature optical systems, have been adopted and applied to communication devices, displays, and recording devices due to advantages such as fast response speed, small loss, and ease of integration and digitization.

FIG. 1 shows an embodiment of a one-dimensional scanning display device, that is, a projection device using a one-dimensional optical modulator to which MEMS devices are applied.

The one-dimension scanning display apparatus 100 includes a light source 110, an illumination optical system 120, a one-dimensional optical modulator 130, a relay optical system 140, a scanner 150, and a projection optical system 160. ), A screen 170 and an image control circuit 180.

The beam from the light source 110 is reflected by the illumination optical system 120 at a predetermined angle and irradiated to the one-dimensional light modulator 130. The one-dimensional optical modulator 130 generates an image beam in the form of a one-dimensional line by modulating the incident beam according to the optical modulator control signal received from the image control circuit 180, and passes through the relay optical system 140 to the scanner 150. To pass). The scanner 150 rotates at an angle according to the scanner control signal received from the image control circuit 180 and projects the image beam on the screen 170 using the projection optical system 160.

In the one-dimensional scanning display apparatus 100, it is necessary to analyze various optical characteristics for each pixel of the image projected on the screen 170. Various optical characteristics mean light quantity, maximum brightness, minimum brightness, scanning trajectory, contrast, and the like for grayscale values when each pixel is projected.

The performance of the 1D scanning display apparatus 100 manufactured by analyzing the optical characteristics for each pixel can be known, and appropriate correction can be made according to the image to be displayed later.

Therefore, there is a need for an apparatus and method for acquiring a partial image of each pixel from a scanning trajectory of each pixel or an entire projected image from an image projected on the screen 170. It is insufficient.

Accordingly, in order to solve the above-described problems, the present invention provides a pixel analysis apparatus capable of finding the position where each pixel in a 1D scanning display apparatus is projected by allowing a variety of pattern images to be projected on a screen continuously and photographing them. Provide a method.

In addition, the present invention provides a pixel analysis apparatus and method capable of obtaining various optical characteristics for each pixel by obtaining a scanning trace of each pixel.

Other objects of the present invention will be readily understood through the following description.

In order to achieve the above objects, according to one aspect of the present invention, an imaging device that sequentially photographs a plurality of pattern images displayed on a screen and generates the same number of captured images, wherein the pattern images A one-dimensional image line, wherein the picked-up image consists of a plurality of pick-up pixels; And an image analyzing apparatus that analyzes each captured image and associates the captured pixel with the one-dimensional image line.

In order to achieve the above objects, according to another aspect of the present invention, (a) photographing a plurality of pattern images sequentially displayed on the screen with an imaging device to generate the same number of captured images, wherein The pattern image is composed of a plurality of one-dimensional image lines, and the captured image is composed of a plurality of imaging pixels; (b) analyzing a plurality of the captured images; And (c) mapping each of the imaging pixels to the one-dimensional image line, respectively.

Preferably, the total number of the imaging pixels may be equal to or greater than the total number of pixels constituting the pattern image.

In addition, the captured image may include all of the pattern image.

In addition, the imaging device may be a camera of a CCD or a CMOS system.

Preferably, the pattern image is scanned by a one-dimension scanning display apparatus, and the intensity information of each one-dimensional image line constituting the pattern image is scanned in a predetermined direction to the screen Can be displayed.

Here, the one-dimensional scanning display device, the light source for irradiating a beam; A one-dimensional optical modulator for modulating the beam according to an optical modulator control signal to generate an image beam reflected or diffracted; A scanner for projecting an image beam incident from the one-dimensional light modulator onto the screen to display the pattern image on the screen; And an image control circuit for outputting the optical modulator control signal corresponding to the light intensity information for each one-dimensional image line constituting the pattern image to the one-dimensional optical modulator.

The one-dimensional optical modulator may include a driving integrated circuit configured to generate a driving voltage according to the optical modulator control signal; And a plurality of micromirrors for generating the image beam by modulating the beam incident by a displacement that is changed in accordance with the driving voltage, wherein the plurality of micromirrors respectively correspond one to one to the plurality of one-dimensional image lines. It may include.

The image analyzing apparatus may include a corresponding module that respectively corresponds the plurality of imaging pixels to the plurality of micromirrors.

Here, the plurality of pattern images may be divided into a first region having a gradation value greater than or equal to a first gradation value and a second region having a gradation value less than or equal to the second gradation value (the second gradation value is less than or equal to the first gradation value). The pixel identification value of one region is set differently from the pixel identification value of the second region, and the corresponding module is configured to correspond to the one-dimensional image line corresponding to the plurality of micro mirrors with respect to the plurality of pattern images sequentially displayed. It is possible to serially store the pixel identification value for the serialization.

Here, the pixel identification value of the first region is '1', the pixel identification value of the second region is '0', or the pixel identification value of the first region is '0', and the pixel of the second region is The identification value may be '1'.

Here, the number of the pattern images may be a value obtained by rounding log ₂ (the number of pixels of the vertical scanning line or the number of pixels of the one-dimensional image line) to the first decimal place.

Here, the first region to the second region may include at least four pixels, and in the four pattern images, the first region to the second region may be phase shifted in units of one pixel.

The image analyzing apparatus may include a pattern image output module that sequentially outputs the pattern image to the image control circuit such that the plurality of micro mirrors have different pixel identification values.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. In addition, the one-dimensional scanning display apparatus will be described first before describing the preferred embodiments of the present invention in detail. Here, the following description will focus on a display device that scans using a diffraction type 1D optical modulator shown in FIG. 3, but the present invention also includes a 1D optical modulator such as a reflective or transmissive type. In describing the present invention, when it is determined that the detailed description of the related known technology may unnecessarily obscure the subject matter of the present invention, the detailed description thereof will be omitted. Numbers (eg, first, second, etc.) used in the description of the present specification are merely identification symbols for sequentially distinguishing identical or similar entities.

The one-dimensional scanning display device used in the present invention is shown in FIG. 1, and the one-dimensional optical modulator and the modulation principle are shown in FIGS. A one-dimensional scanning display apparatus 100 will be described in detail with reference to FIG. 1. The 1D scanning display apparatus 100 includes a light source 110, an illumination optical system 120, a 1D optical modulator 130, a relay optical system 140, a scanner 150, a projection optical system 160, a screen 170, and And an image control circuit 180.

The light source 110 irradiates a beam to project an image onto the screen 170. The light source 110 may emit white light, or may emit any one of three primary colors of red, green, and blue light. Preferably, the light source 110 is a laser light. When irradiating white light, a color separation unit (not shown) may be provided to separate white light into red light, green light, and blue light according to a predetermined condition.

The illumination optical system 120 reflects the direction of the beam projected from the light source 110 at a predetermined angle so that the beam is concentrated on the one-dimensional optical modulator element 130. When color separation is performed by a color separation unit (not shown), a function of concentrating the beam may be added.

The one-dimensional optical modulator 130 generates an image beam by modulating the beam irradiated through the illumination optical system 120 according to the optical modulator control signal received from the image control circuit 180. The one-dimensional optical modulator 130 controls the light intensity corresponding to any one of the vertical scanning lines of the image to be displayed or controls the light intensity corresponding to any one of the horizontal scanning lines.

Hereinafter, a description will be given on the assumption that the one-dimensional optical modulator 130 corresponds to any one of the vertical scan lines in the image forming one frame.

The one-dimensional optical modulator 130 includes a plurality of micro mirrors.

Referring to FIG. 2, the micromirror 20 includes a substrate 1, an insulating layer 2, a sacrificial layer 3, a ribbon structure 4, and a piezoelectric body 5.

3 (a) and 3 (b) are sectional views showing an enlarged portion A of FIG. 2. When the wavelength of light is λ, the insulating layer on which the ribbon structure 4 and the lower reflecting layer 2a are formed, in which the micromirror 20 is not deformed (no voltage is applied), and the upper reflective layer 4a is formed. The interval between (2) is equal to λ / 2. Therefore, the total path difference between the light reflected from the ribbon structure 4 and the insulating layer 2 is equal to λ so that the light interferes constructively (see FIG. 3A).

In addition, when a proper voltage is applied to the piezoelectric body 5, the ribbon structure 4 moves toward the insulating layer 2 or vice versa by the pressure generated in the piezoelectric body 5. At this time, the interval between the ribbon structure 4 and the insulating layer 2 on which the lower reflective layer 2a is formed is equal to λ / 4 or 3λ / 4. Therefore, the total path difference between the light reflected from the ribbon structure 4 and the insulating layer 2 is equal to [lambda] / 2 so that light interferes with each other (see FIG. 3 (b)).

By using the result of such interference, the micromirror 20 may load the signal to the light by adjusting the amount of light of the incident beam. A portion of the sacrificial layer 3 is here used to support the ribbon structure 4 without being etched.

The micromirror 20 illustrated in FIG. 2 is responsible for any one pixel among a plurality of pixels constituting the vertical scanning line, and adjusts a gray scale, that is, light intensity.

Referring to FIG. 4, a plurality of micromirrors 20-1, 20-2,..., 20-m illustrated in FIG. 2, which are in charge of one pixel, are gathered (in this case m (natural numbers)) to form a one-dimensional optical modulator. 130 is formed. The one-dimensional optical modulator 130 is a diffraction beam, that is, an image having various signal sizes with respect to a constant incident beam by an interference principle by collecting a plurality of micromirrors 20-1, 20-2, ..., 20-m in parallel. As a device capable of generating a beam and carrying a signal on light, a device that is in charge of a vertical scanning line, which is a one-dimensional image line, as described above, is generally referred to.

Hereinafter, the one-dimensional optical modulator 130 will be described as being in charge of a vertical scan line composed of m pixels (m is a natural number), that is, a one-dimensional image line.

The one-dimensional optical modulator 130 generates a driving voltage for each pixel according to the light intensity information of each pixel constituting the vertical scan line included in the optical modulator control signal and the driving voltage generated in the driving integrated circuit. It consists of a plurality of micromirrors 20-1, 20-2, ..., 20-m generating an image beam of which light intensity is modulated using the interference or diffraction principle of light.

Preferably, the plurality of micro mirrors 20-1, 20-2, ..., 20-m is equal to the number of pixels constituting the vertical scanning line. The modulated diffracted light is light in which image information (ie, light intensity information) of a vertical scan line to be projected on the screen 170 is reflected later.

The relay optical system 140 allows the image beam generated by the 1D optical modulator 130 to be transmitted to the scanner 150. One or more lenses may be included, and the image beam is transmitted by adjusting the magnification as necessary to match the size of the 1D optical modulator 130 and the size of the scanner 150.

The scanner 150 reflects the image beam incident through the relay optical system 140 at a predetermined angle and projects the image beam onto the screen 170. In this case, the predetermined angle is determined by the scanner control signal received from the image control circuit 180. The scanner control signal rotates the scanner 150 at an angle at which the image beam can be projected at the position of the vertical scan line on the screen 170 corresponding to the optical modulator control signal in synchronization with the optical modulator control signal.

The scanner 150 may be a galvano mirror or a polygon mirror. The galvano mirror has a rectangular plank shape and a mirror is attached to one side. It rotates left and right within a predetermined angle range about an axis, and in the present invention, the image is projected on the screen 170 by changing the reflection angle of the incident light when rotating in either the left or right direction or left and right directions. Polygon mirrors have the shape of polygonal columns, with mirrors attached to the sides of the polygonal columns. The mirrors attached to each side surface rotate in one direction about the axis to change the reflection angle of the light incident by the rotation to project an image on the screen 170.

The projection optical system 160 allows the image beam reflected by the scanner 150 to be projected onto the screen 170. Projection lens (not shown).

The image control circuit 180 receives an image signal corresponding to one frame, generates an optical modulator control signal corresponding to the image signal, controls the 1D optical modulator 130, and generates a scanner control signal. To control the scanner 150.

The video signal is divided into a plurality of vertical scanning lines, and in the present invention, it is preferable that all of the plurality of vertical scanning lines corresponding to one frame have the same light intensity information. The optical intensity information is converted into an optical modulator control signal and output to the 1D optical modulator 130, and a vertical scan line is correctly projected on the screen 170 in accordance with the optical modulator control signal output to the 1D optical modulator 130. The scanner control signal for adjusting the rotational angle of the scanner 150 is also output in synchronization. In the present invention, when the plurality of vertical scan lines corresponding to one frame are all the same, the scanner control signal may be a signal that causes the scanner 150 to rotate at a predetermined angular velocity.

Hereinafter, with reference to the accompanying Figures 5 to 12 will be described in detail a preferred embodiment of the present invention.

5 is a schematic block diagram of a pixel analysis apparatus according to an exemplary embodiment of the present invention.

Referring to FIG. 5, the pixel analyzing apparatus 500 includes an imaging apparatus 510 and an image analyzing apparatus 520.

The imaging device 510 photographs an image projected on the screen 170. The imaging device 510 may be a digital camera (CCD) or CMOS (CMOS) type camera.

The resolution of the imaging device 510 should be higher than the resolution of the image projected on the screen 170. For example, when the image projected on the screen 170 has a resolution of 1080 × 1920, that is, 2073600 image pixels, the resolution of the imaging device 510 is 1080 × 1920 or more, that is, 2500 ×, which is about twice as high. It is preferable to have a resolution of 4000, that is, 10 million imaging pixels. Therefore, the captured image is captured by the imaging device 510 to include all of the image image projected on the screen 170.

The imaging device 510 generates a captured image of the captured image and transmits the captured image to the image analyzing apparatus 520.

The image analyzing apparatus 520 receives the captured image from the imaging apparatus 510 and analyzes the projected image on the screen 170. Analysis is to determine the overall contour of the image projected on the screen 170 included in the captured image, and to determine the image of the projected image on the screen 170 corresponding to each captured pixel of the imaging device 510. It means finding the pixel. Each imaging pixel of the scratching device 510 has a higher resolution than the pixel of the image projected on the screen 170 as described above, so that at least one imaging pixel is applied to one pixel of the image projected on the screen 170. Can correspond. That is, the image analyzing apparatus 520 includes a corresponding module which respectively corresponds the imaging pixel to the plurality of micro mirrors of the one-dimensional optical modulator 130.

In order for the image analyzing apparatus 520 to find a pixel of an image corresponding to each image pickup pixel, a pattern image having a predetermined order is required by the user. Each image pixel has different values so that the image pixels can be distinguished from each other through the pattern image.

In addition, the image analyzing apparatus 520 may be configured to cooperate with the image control circuit 180 to display a plurality of micromirrors constituting the one-dimensional optical modulator 130 to display the different one-dimensional image lines, respectively, in terms of time succession. It may include a pattern image output module for outputting an image.

Hereinafter, a pattern image used in the present invention and a pattern image analysis method in the image analyzing apparatus 520 according to the present invention will be described in detail with reference to FIGS. 6 to 10.

6 to 7 are diagrams illustrating an embodiment of a pattern image according to the present invention, and FIGS. 8 to 10 are diagrams illustrating a pattern image analysis method in the image analyzing apparatus 520 according to the present invention. 6 to 10 illustrate that the image projected on the screen 170, that is, the pattern image, is 1080 pixels in the vertical scanning line. However, this does not limit the scope of the present invention, of course.

6, a first embodiment of a pattern image is shown. In (a) of FIG. 6, the vertical scanning line has 1080 pixels (that is, 1080 one-dimensional image lines in the horizontal direction of the image frame), and the first image frame (frame # 1) divides the entire image into two parts of A1. The area allows the gray level above the first gray level BH to be displayed and the area A2 causes the gray level below the second gray level BL to be displayed.

Referring to FIG. 10, it is preferable that the first grayscale BH is greater than or equal to the second grayscale BL, and the pixels (or one-dimensional image lines) 710 and 730 that are greater than or equal to the first grayscale BH are pixels of '1'. As an identification value, an image is set to binarize a pixel (or one-dimensional image line) of an image by setting pixels (or one-dimensional image lines) 720 and 740 that are less than or equal to the second grayscale BL to a pixel identification value of '0'. The analyzer 520 is set. That is, in FIG. 6A, area A1 is pixels (or one-dimensional image lines) having pixel identification values of '1', and area A2 is pixel (or one-dimensional image) having pixel identification values of '0'. Line), the image analysis device 520 detects that the line.

Here, pixels (or one-dimensional image lines) having values between two reference gray scale values are classified as unspecified pixels (or one-dimensional image lines). The unspecified pixel (or one-dimensional image line) is then corrected to have an appropriate value by comparing with the adjacent pixels (or one-dimensional image line) by a pattern image provided continuously in time. In addition, reliability can be ensured by binarizing the first grayscale BH and the second grayscale BL according to the sensitivity of the imaging device 510.

Referring to FIG. 6B, in the second image frame (frame # 2), the area A1 is divided into two areas of the areas (A11 and A12), and pixels (or one-dimensional image lines) of each area are different from each other. It has a pixel identification value of '0'. The A2 region is also divided into two regions of the (A21 and A22) regions so that pixels (or 1D image lines) of each region have different pixel identification values of '1' and '0'.

The image analyzing apparatus 520 has a memory (not shown) therein, and serially restores pixel identification values for pixels (or one-dimensional image lines) of each region. Accordingly, the A11 region has a pixel identification value of '11', the A12 region is '10', the A21 region is '01', and the A22 region is '00'.

Referring to (c) of FIG. 6, in the third image frame (frame # 3), areas A11, A12, A21, and A22 are designated as (A111, A112), (A121, A122), (A211, A212), (A221, A222). The pixel identification values of '1' and '0' are different from each other, and the image analyzing apparatus 520 serially stores the pixel identification values. Therefore, area A111 is '111', area A112 is '110', area A121 is '101', area A122 is '100', area A211 is '011', area A212 is '010', area A221 is '001' , Area A222 has a pixel identification value of '000'.

This is repeatedly performed so that all pixels (or all one-dimensional image lines of the image frame) of the vertical scan line have different pixel identification values.

Referring to (n) of FIG. 6, since the number of pixels (or the number of 1-dimensional image lines of the image frame) of the vertical scanning line is 1080 (2 ¹⁰ or more and 2 ¹¹ or less), in the 11th image frame (frame # 11) By differentiating regions of the pixels, neighboring pixels (or one-dimensional image lines) may have different pixel identification values. Generally, when the number of pixels of the vertical scanning line is 2 ^x or more and 2 ^{x +1} or less (x is a natural number), the pixels (or one-dimensional) neighboring by the (x + 1) th image frame (frame # (x + 1)) Each image line) may have different pixel identification values. The required number of image frames of the pattern image is a value obtained by rounding log ₂ (the number of pixels of the vertical scanning line or the number of pixels of the one-dimensional image line) to one decimal place.

The image analyzing apparatus 520 analyzes the pixel identification value of each imaged pixel in the last image frame to determine whether the imaged pixel is the pixel of the vertical scanning line or the image of the image frame in the image frame. Done.

Referring to FIG. 7, unlike in FIG. 6, the pattern image is different from the first pixel (or the first one-dimensional image line) instead of the (n + 1) th pixel (or the (n + 1) th one-dimensional image line). Starting from (n + 541) th pixel (or (n + 541) th one-dimensional image line). In this case, the pixels (or one-dimensional image lines) adjacent to each other in the last image frame are repeated by dividing the area A1 into the areas (A11 and A12) and the area A2 into the areas (A21 and A22) as described above. Each may have different pixel identification values.

In FIG. 7, it is preferable that the area A2 has a value of '1'. This is to determine the overall outline of the image frame, because when the A2 region has a value of '0', the entire outline of the image frame is not known.

Alternatively, all the image frames of the image projected before the first image frame may be projected to have a value of '1', or may be projected to have a value of '1' only at an edge of the image frame.

In addition, the pattern image may be anything as long as each neighboring pixel or each one-dimensional image line has a different identification value.

8 to 9, the pattern image photographed by the actual imaging device 510 is illustrated. The captured image 800 includes all of the projected pattern images 810a, 810b,..., 810n, and analyzes all the pattern images 810a, 810b,..., 810n to analyze each pixel or image frame of the vertical scanning line. The plurality of imaging pixels 910a, 910b,..., 910z corresponding to each one-dimensional image line 900 are found.

Here, each one-dimensional image line of each pixel or image frame of the vertical scanning line corresponds one-to-one to each micro mirror constituting the one-dimensional optical modulator 130 of the one-dimensional scanning display apparatus 100 as described above. That is, the corresponding imaging pixel is analyzed for each micromirror, and through this, optical characteristics of each micromirror or each one-dimensional image line can be analyzed.

FIG. 11 illustrates a pattern image capable of reducing an effect due to optical cross-talk in forming a pattern image having a binarized pixel identification value, and FIG. 12 illustrates part C of FIG. 11. Will be enlarged.

Referring to FIG. 11, when the total number of image frames of the pattern image is n (n is a natural number), the pattern image from the (n-3) th image frame to the nth image frame does not divide the previous pixel area. Do a phase shift.

When the pixel area falls below 4 pixels, optical crosstalk is difficult to distinguish the neighboring identification values due to the performance of the projection lens included in the projection optical system 160 of the 1D scanning display apparatus 100. There is a risk of occurrence. Therefore, four pixels are determined as the minimum pixel area, and the pixel region consisting of four pixels is phase shifted in units of one pixel from the (n-3) th image frame, which is the time point of becoming four pixels.

Referring to FIG. 12, when the first pixel of the pixel region G1 in the (n-3) th image frame is a k line, in the (n-2) th image frame, the first pixel of the pixel region G2 is (k-3). Line becomes the (k-1) line in the (n-1) th image frame and the first pixel of the pixel region G3 becomes the (k-1) line in the (n) th image frame. Be sure to

In this case, in the image analysis apparatus 520 analyzing the captured image, since the pixel areas having different identification values have an interval of at least 4 pixels or more, the distinction between '1' and '0' becomes clearer.

In addition, since the feature of re-saving different pixel identification values for each one-dimensional image line is satisfied, it is possible to distinguish each pixel of each one-dimensional image line or the vertical scan line.

As described above, the pixel analysis apparatus and method according to the present invention can find the position where each pixel in the 1D scanning display device is projected by allowing various pattern images to be projected on a screen in time successively and photographing them.

In addition, a scanning trajectory of each pixel may be obtained to obtain various optical characteristics for each pixel.

In addition, the minimum value of the pixel group is 4 pixels, and a phase shifted pattern image is used for the optical cross-talk phenomenon of the lens included in the projection optical system of the 1D scanning display device. The error of precision analysis of each pixel can be avoided.

Although the above has been described with reference to a preferred embodiment of the present invention, those skilled in the art to which the present invention pertains without departing from the spirit and scope of the present invention as set forth in the claims below It will be appreciated that modifications and variations can be made.

Claims (24)

An imaging device which sequentially photographs a plurality of pattern images displayed on the screen and generates the same number of captured images, wherein the pattern images are composed of a plurality of one-dimensional image lines, wherein the captured images Consisting of a plurality of imaging pixels; And And an image analyzing apparatus that analyzes each of the captured images and associates the captured pixels with the one-dimensional image line. The one-dimensional image line is a vertical scan line or a horizontal scan line constituting the pattern image. And the total number of the imaging pixels is equal to or greater than the total number of pixels constituting the pattern image. delete An imaging device which sequentially photographs a plurality of pattern images displayed on the screen and generates the same number of captured images, wherein the pattern images are composed of a plurality of one-dimensional image lines, wherein the captured images Consisting of a plurality of imaging pixels; And And an image analyzing apparatus that analyzes each of the captured images and associates the captured pixels with the one-dimensional image line. The one-dimensional image line is a vertical scan line or a horizontal scan line constituting the pattern image. And the captured image includes all of the pattern images. The method of claim 1, The imaging device is a pixel analysis system, characterized in that the camera (CCD) or CMOS (camera) of the camera (camera) method. An imaging device which sequentially photographs a plurality of pattern images displayed on the screen and generates the same number of captured images, wherein the pattern images are composed of a plurality of one-dimensional image lines, wherein the captured images Consisting of a plurality of imaging pixels; And And an image analyzing apparatus that analyzes each of the captured images and associates the captured pixels with the one-dimensional image line. The one-dimensional image line is a vertical scan line or a horizontal scan line constituting the pattern image. The pattern image may be displayed on the screen by scanning the light intensity information for each one-dimensional image line constituting the pattern image by a one-dimension scanning display apparatus in a predetermined direction Pixel analysis system. The method of claim 5, The one-dimensional scanning display device, A light source for irradiating a beam; A one-dimensional optical modulator for modulating the beam according to an optical modulator control signal to generate an image beam reflected or diffracted; A scanner for projecting an image beam incident from the one-dimensional light modulator onto the screen to display the pattern image on the screen; And An image control circuit for outputting the optical modulator control signal corresponding to the light intensity information for each one-dimensional image line constituting the pattern image to the one-dimensional optical modulator Pixel analysis system comprising a. The method of claim 6, The one-dimensional optical modulator, A driving integrated circuit generating a driving voltage according to the optical modulator control signal; And A plurality of micromirrors for generating the image beam by modulating the beam incident by a displacement that is changed in accordance with the driving voltage, wherein the plurality of micromirrors respectively correspond one to one to the plurality of one-dimensional image lines; Pixel analysis system comprising a. The method of claim 7, wherein The image analysis device And a corresponding module for respectively corresponding the imaging pixels to a plurality of the micro mirrors. The method of claim 8, The plurality of pattern images are divided into a first region having a gradation value greater than or equal to a first gradation value and a second region having a gradation value less than or equal to the second gradation value (the second gradation value is less than or equal to the first gradation value), and the first region. Sets a pixel identification value of a different from the pixel identification value of the second area, And the corresponding module serially restores the pixel identification values of the one-dimensional image lines corresponding to the plurality of micromirrors for the plurality of the pattern images sequentially displayed. . The method of claim 9, The pixel identification value of the first region is '1', and the pixel identification value of the second region is '0'. The method of claim 9, The pixel identification value of the first region is '0', and the pixel identification value of the second region is '1'. The method of claim 9, And the number of the pattern images is a value obtained by rounding log ₂ (the number of pixels of the vertical scanning line or the number of pixels of the one-dimensional image line) to the first decimal place. The method of claim 9, The first region to the second region includes at least four pixels, The pixel analysis system of claim 4, wherein the first to second regions are phase shifted in units of one pixel. The method of claim 9, The image analysis device And a pattern image output module for sequentially outputting the pattern image to the image control circuit such that the plurality of micro mirrors have different pixel identification values. (a) photographing a plurality of pattern images sequentially displayed on the screen with an imaging device to generate the same number of captured images, wherein the pattern images are composed of a plurality of one-dimensional image lines; The captured image is composed of a plurality of captured pixels; (b) analyzing a plurality of the captured images; And (c) corresponding to each of the imaging pixels with the one-dimensional image line, The one-dimensional image line is a vertical scan line or a horizontal scan line constituting the pattern image. And the total number of the imaging pixels is equal to or greater than the total number of pixels constituting the pattern image. (a) photographing a plurality of pattern images sequentially displayed on the screen with an imaging device to generate the same number of captured images, wherein the pattern images are composed of a plurality of one-dimensional image lines; The captured image is composed of a plurality of captured pixels; (b) analyzing a plurality of the captured images; And (c) corresponding to each of the imaging pixels with the one-dimensional image line, The one-dimensional image line is a vertical scan line or a horizontal scan line constituting the pattern image. And the light intensity information of each one-dimensional image line constituting the pattern image by the one-dimensional scanning display device is scanned in a predetermined direction and displayed on the screen. The method of claim 16, The one-dimensional scanning display device, A light source for irradiating a beam; A one-dimensional optical modulator for modulating the beam according to an optical modulator control signal to generate an image beam reflected or diffracted; A scanner for projecting an image beam incident from the one-dimensional light modulator onto the screen to display the pattern image on the screen; And And an image control circuit for outputting the optical modulator control signal corresponding to the light intensity information for each one-dimensional image line constituting the pattern image to the one-dimensional optical modulator. The method of claim 17, The one-dimensional optical modulator, A driving integrated circuit generating a driving voltage according to the optical modulator control signal; And A plurality of micromirrors for generating the image beam by modulating the beam incident by a displacement that is changed in accordance with the driving voltage, wherein the plurality of micromirrors respectively correspond one to one to the plurality of one-dimensional image lines; Pixel analysis method comprising a. The method of claim 18, The plurality of pattern images are divided into a first region having a gradation value greater than or equal to a first gradation value and a second region having a gradation value less than or equal to the second gradation value (the second gradation value is less than or equal to the first gradation value), and the first region. The pixel identification value of the region is set to '1', the pixel identification value of the second region is set to '0', and the one-dimensional image corresponding to the plurality of micromirrors for the plurality of pattern images sequentially displayed. And restoring the pixel identification values for the lines in series. The method of claim 19, Wherein the number of the pattern images is a value obtained by rounding log ₂ (the number of pixels of the vertical scanning line or the number of pixels of the one-dimensional image line) to the first decimal place. The method of claim 19, The first region to the second region includes at least four pixels, The last four pattern images, the first region to the second region of the pixel analysis method characterized in that the phase shifted by one pixel unit. delete (a) photographing a plurality of pattern images sequentially displayed on the screen with an imaging device to generate the same number of captured images, wherein the pattern images are composed of a plurality of one-dimensional image lines; The captured image is composed of a plurality of captured pixels; (b) analyzing a plurality of the captured images; And (c) corresponding to each of the imaging pixels with the one-dimensional image line, The one-dimensional image line is a vertical scan line or a horizontal scan line constituting the pattern image. And the captured image includes all of the pattern images. The method of claim 15, The imaging device is a pixel analysis method, characterized in that the camera (CCD) or CMOS (camera) of the camera (camera) method.

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