KR100785485B1 - Modulator for electric optical apparatus - Google Patents

Abstract

A modulator for an electro-optical apparatus is provided to form a reflection conductive pattern on a rear surface of an electro-optical layer to make the reflection conductive pattern function as a floating electrode between an electrode layer and a panel electrode so as to be operable even at a low voltage, thereby lowering the power consumption. An electrode layer(120) is formed on a rear surface of a transparent substrate(110). An electro-optical material layer(130) is formed on a rear surface of the electrode layer. The electro-optical material layer passes light therethrough when an electric field is formed. A plurality of reflection conductive patterns(140) is formed on a rear surface of the electro-optical material layer. The reflection conductive patterns receive an induction voltage applied from a panel electrode to reflect the light, which is incident from a front region of the electro-optical material layer, in a front direction.

Description

Modulator for electric optical apparatus

1 is a cross-sectional view showing a conventional modulator for an all-optical device and an all-optical device having the same.

2 is a cross-sectional view showing an all-optical device modulator and an all-optical device having the same according to an embodiment of the present invention.

3 to 4 are diagrams illustrating a process of detecting an abnormality of a panel by a modulator for an all-optical device, and FIG. 3 is a cross-sectional view illustrating a state in which an electric field is formed between the reflective conductor layer and the panel electrode, and FIG. 4 is an electrode layer. It is sectional drawing which shows the state in which the electric field was formed between and the reflecting conductor layer.

<Description of the code | symbol about the principal part of drawing>

110. Transmitting substrate 120. Electrode layer

130. Electroluminescent layer 140. Reflective conductor layer

150.Protective layer 160.Panel

161.Panel Electrode

The present invention relates to a modulator used in an all-optical device, and more particularly, to a modulator for an all-optical device used in array test equipment for detecting an abnormality of an electrode in a panel.

In panels, electrodes are usually formed between the upper and lower substrates. For example, a TFT LCD substrate may include a TFT panel having a TFT formed on a lower substrate, a filter panel in which color filters and a common electrode are formed to face the TFT panel, liquid crystal injected between the TFT panel and the filter panel; It has a backlight.

Here, the defect of the TFT formed on the lower substrate is inspected by the array test equipment. In detail, the electric field is generated between the modulator and the TFT panel by bringing the modulator close to the TFT panel while applying a constant voltage to the modulator and the TFT panel installed in the array test equipment. At this time, the case where the TFT panel cell is defective is smaller in size than the case where there is no defect, thus detecting whether the TFT panel is defective according to the size of the detected electric field.

In this case, the modulator includes an electrode layer for forming an electric field with the TFT panel electrode, and an all-optical material layer that functions to sense the size of the electric field. The all-optical layer is made of polymer dispersed liquid crystal (PDLC). In this case, the liquid crystal contained in the PDLC has polarization so that the light directed to the PDLC passes when the electrode formed on the TFT panel has no defect, and the light directed toward the PDLC does not pass when the electrode formed on the TFT panel has a defect. Do not. As a result, there is a difference in contrast ratio according to light transmittance and light transmittance of each region of the PDLC according to whether the TFT panel is defective or not, and the TFT panel is detected by using this principle.

The conventional all-optical modulator and array test equipment having the same are shown in FIG. 1. Referring to FIG. 1, the all-optical modulator 10 includes a light transmissive substrate 11, an electrode layer 12, an all-optical material 13 layer, and a reflective layer 14.

In order to test the abnormality of the TFT panel 16, the modulator 10 is positioned adjacent to the TFT panel 16. In this case, the gap between the electrode layer 12 and the TFT panel 16 should be narrowed so that a sufficient electric field is generated in the all-optical material layer 13. For this purpose, the modulator 10 should be positioned close to the TFT panel 16. . However, in the case where the modulator 10 is moved close to the TFT panel 16, the electrode 15 of the TFT panel 16 is highly likely to come into contact with the reflective layer 14 covering the electroluminescent layer 13. do. At this time, since the material of the reflective layer 14 uses a film or glass, there is a problem that the reflective layer 14 is damaged by the electrode of the TFT panel 16 formed of a metal.

On the other hand, if the distance between the modulator 10 and the TFT panel 16 is increased so that the reflective layer 14 is not damaged, an electric field is formed between the modulator 10 and the TFT panel 16 with a weak electric field, and thus an all-optical material layer. The contrast ratio according to the light transmittance of each region of (13) does not differ. At this time, the contrast ratio that can be distinguished by the camera embedded in the array test equipment is limited, so that the contrast ratio of the all-optical layer 13 is very low in the process of inspecting the abnormality of the TFT panel 16. Indistinguishable. Therefore, the modulator 10 requires a high driving voltage to detect the abnormality of the TFT panel 16 with high reliability. This is a problem in that a lot of power is used in the process of measuring the defect of the TFT panel 16. In addition, since the reflective layer 14 must be formed on the all-optical material layer 13 during the manufacturing process of the modulator 10, a manufacturing process for forming the reflective layer 14 is added, thereby increasing the cost.

An object of the present invention is to provide a modulator for an all-optical device that can detect an abnormality of a panel by using a modulator even if the distance between the modulator and the panel is not arranged as close as the distance between the conventional modulator and the panel. .

Another object of the present invention is to provide a modulator for an all-optical device having conductors capable of reflecting light while an induced voltage can be applied from the panel electrode.

Therefore, the modulator for an all-optical device according to the embodiment of the present invention includes: a light transmitting substrate; An electrode layer formed on a rear surface of the light transmitting substrate; Is formed on the back of the electrode layer, when the electric field is formed, the molecules are arranged in the electric field direction to pass the light according to the molecular arrangement; And a pattern formed of a plurality of conductors disposed on a rear surface of the all-optical material layer and to which an induced voltage may be applied from an electrode of the panel, and the light incident from the front of the all-optical material layer to the all-optical material layer. A reflective conductor layer for reflecting is provided.

Meanwhile, the conductors of the reflective conductor layer may be made of silver or aluminum.

In addition, the conductors of the reflective conductor layer are preferably disposed at the same position in front and rear with the electrodes of the panel.

In addition, the conductors of the reflective conductor layer are preferably made so that the reflectance is 90% or more at λ = 650 nm.

In addition, the conductors of the reflective conductor layer preferably have a brightness value of 7 or more expressed in a surface cell color system.

Intervals of the conductors of the reflective conductor layer may be 10 μm or less.

The distance between the conductors of the reflective conductor layer may be 5 μm or less.

A protective layer may be further provided on the rear surface of the reflective conductor layer.

The reflective conductor layer may be patterned on the protective layer.

The protective layer may be made of a polymer film.

The all-optical layer may include a polymer dispersed liquid crystal (PDLC) or a liquid crystal or an inorganic EL (EL).

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

2 is a cross-sectional view showing an all-optical device modulator and an all-optical device having the same according to an embodiment of the present invention. Referring to FIG. 2, the all-optical modulator 100 includes a light transmissive substrate 110, an electrode layer 120, an all-optical material layer 130, and a reflective conductor layer 140.

The light transmissive substrate 110 is made of a material that transmits light, and is typically made of a transparent material such as glass (Quartz) or BK-7. On the rear surface of the light-transmitting substrate 110, an electrode layer 120, an all-optical material layer 130, and a reflective conductor layer 140, which will be described later, are provided. Therefore, the transparent substrate 110 is made of a material having rigidity, so that the electrode layer 120, the all-optical material layer 130, the protective layer 150 and the reflective conductor layer 140 which will be described later can be firmly supported.

The electrode layer 120 is formed on the front surface of the light transmissive substrate 110. Since the electrode layer 120 serves as an electrode and serves as a light path, the electrode layer 120 should have good light transmittance and preferably have a sheet resistance of 80 Ω / cm 2 or less. Therefore, the electrode layer 120 may be made of indium tin oxide (ITO) or carbon nanotube (CNT) material.

The electrode layer 120 plays the same role as the common electrode of the panel. The common electrode forms an electric field between the panel electrodes. Similarly, electricity is applied to the electrode layer 120 together with the panel electrode 161 to form an electric field between the electrode layer 120 and the panel electrode 161. Therefore, when testing the presence or absence of abnormality of the panel 160 by using an array test (array check) equipment, it is preferable to arrange the electrode layer 120 and the panel electrode 161 so as to be electrically connected.

Meanwhile, the front surface of the modulator 100 is defined as a surface disposed far from the panel for convenience of description, and the rear surface of the modulator 100 is defined as a surface disposed adjacent to the panel.

The electroluminescent layer 130 is formed on the rear surface of the electrode layer 120. When an electric field is formed between the electrode layer 120 and the panel electrode 161, molecules are arranged in the electric field direction to pass light according to the molecular arrangement. If not formed, the molecules are irregularly arranged so as not to pass the light, thereby selectively passing the light depending on the presence or absence of an electric field so that a predetermined shape is formed in the all-optical layer 130. The all-optical layer 130 for this may include a polymer dispersed liquid crystal (PDLC). PDLC is referred to as a polymer dispersed liquid crystal, PDLC is suitable for use as the all-optical layer 130, characterized in that the transmission of light is controlled according to the scattering intensity of light. However, it is not necessarily limited to the PDLC that forms the all-optical layer 130, and various panels such as inorganic EL (Electro Luminance) and liquid crystal may be used.

On the other hand, the all-optical layer 130 preferably has a thickness of 15㎛ or more. If the thickness of the all-optical layer 130 is smaller than 15 μm, the degree of polarization of the liquid crystal does not increase, and thus the light transmittance and contrast ratio of the case in which the electric field is formed in the all-optical layer 130 and the electric field is not formed. This is because the difference is not large, and it is difficult for the user to distinguish the shape drawn on the electroluminescent material 130.

In addition, it is preferable that the allergen layer 130 has a thickness of 25 μm or less. If the thickness of the allergen layer 130 is greater than 25 μm, the electrode layer 120 of the modulator 100 and the panel to be inspected are provided. The gap between the electrodes 161 becomes larger than necessary, so that the driving voltage required to drive them becomes unnecessarily large, and power consumption is increased.

The reflective conductor layer 140 is disposed on the rear surface of the all-optical material layer 130 and is formed by patterning a plurality of conductors to which an induced voltage can be applied from the panel electrode 161.

The reflective conductor layer 140 is disposed between the panel electrode 161 and the electrode layer 120 by the conductors forming the reflective conductor layer 140, thereby floating between the panel electrode 161 and the electrode layer 120. It serves as an electrode. Accordingly, even if the distance between the panel electrode 161 and the electrode layer 120 is not adjacent, it is possible to easily detect the abnormality of the panel 161.

The conductors of the reflective conductor layer 140 for this purpose are positioned at the same position in the front and rear with the panel electrodes 161 so that an induced voltage can be generated between the panel electrodes 161 and the conductors corresponding to the electrodes 161. It is desirable to allow for placement.

On the other hand, it is also possible to set the spacing of the conductors of the reflective conductor layer 140 to 10 μm or less in particular. Generally, the space | interval between adjacent panel electrodes 161 is 10 micrometers or more.

Therefore, when the gap between the panel electrodes 161 detects an abnormality of various panels 160 such as 10 μm, 20 μm, and 30 μm, the panel electrode 161 is connected to the conductors of the reflective conductor layer 140 and 1. Even if the: 1 does not correspond, a plurality of conductors correspond to one panel electrode 161, so that an induced voltage may be generated from the panel electrode 161 to the conductors of the reflective conductor layer 140. In addition, the shape of the conductors of the reflective conductor layer 140 is formed in the form of dots, and the distance between the conductors of the reflective conductor layer 140 is 5 μm, so that the panel conductors 161 can be disposed. By matching a larger number of conductors of the reflective conductor layer 140 with each other, it is possible to increase the reliability that an induced voltage can be generated from the panel electrode 161 to the conductors of the reflective conductor layer 140.

In addition, the reflective conductor layer 140 serves as a floating electrode between the electrode layer 120 and the panel electrode 161 to form an electric field in the all-optical layer 130 even at a low voltage to operate the modulator 100. Since it can be done, there is an effect that the power consumption can be lowered.

The material of the conductors for this is preferably made of silver or aluminum excellent in conductivity. However, the present invention is not necessarily limited to silver or aluminum, and any metal may be used as long as the induced voltage can be easily generated.

In addition, the reflective conductor layer 140 serves as a floating electrode to reflect the light incident on the all-optical layer 130 from the front of the all-optical layer 130, thereby making it possible for the reflective conductor layer 140 to be transferred. It is not necessary to include a reflective layer 14 for reflecting light incident on the mineral layer 130. This shortens the manufacturing time during the manufacturing process of the modulator 100 and has the effect of lowering the manufacturing cost.

If the reflective conductor layer 140 does not reflect most of the incident light amount, the amount of light is almost lost, making it difficult to detect the abnormality of the panel 160. Therefore, the conductors constituting the reflective conductor layer 140 preferably have a reflectance of 90% or more at λ = 650 nm. λ = 650 nm is a wavelength used in general array check equipment, and is used in the range of λ = 630 to 670 nm.

On the other hand, the reflectance depends not only on the material but also on the color. In an object whose surface is black, the absorption of the object is large and the reflectance is low. For example, black absorbs 95% and reflects only the remaining 5%. Therefore, the conductors constituting the reflective conductor layer 140 should be bright in the color of the reflective conductor layer 140 to sufficiently reflect the light passing through the all-optical material layer 130, and thus the brightness value (V) expressed in the face cell color system. It is preferable that it is 7 or more.

Here, the Munsell color system divides colors into three attributes of hue (H = Hue), lightness (V = value), and saturation (C = chroma) and displays the numbers according to HV / C. Brightness is the brightness of the color, and divides the achromatic brightness from white to black into 10 levels to define white as 10 and black as 0.

An operation process of detecting an abnormality of the panel 160 by using the modulator 100 by the reflective conductor layer 140 will be described in detail with reference to FIGS. 3 and 4 as follows.

3 and 4, one of the panel electrodes 161 is assumed to be a defective electrode 161a.

First, a constant electric field is applied between the modulator 100 and the panel 160 by bringing the modulator 100 close to the panel 160 while applying a constant voltage to the modulator 100 for the all-optical device 100 and the panel 160. ).

The induced voltage is generated in the conductors of the reflective conductor layer 140 by the electric field, and the induced voltage is not generated between the conductors of the reflective conductor layer 140 formed at the same position in the front and rear directions with the defective electrode 161a. Will not.

Therefore, molecules located in front of the defective electrode 161a are difficult to pass light because the molecules are not arranged in the electric field direction, and molecules in the remaining regions of the electroluminescent layer 130 are arranged in the electric field direction to pass the light. It becomes the state that I can. Accordingly, the light transmittance of the all-optical material layer 130 is lowered in the region located in front of the defective electrode 161a. As the light transmittance is thus lowered, the light passing through the modulator 100 is very small compared to the light that is not.

Finally, as the light transmittance of the region located in front of the defective electrode 161a in the all-optical layer 130 decreases, light emitted from the array test equipment does not pass the all-optical layer 130 or only a very small amount. Since the remaining region, which is not located in front of the bad electrode 161a, is high in light transmittance, the light emitted from the array test equipment passes through the photoluminescent layer 130 and is a reflective conductor layer. Reflected on the front of the 140. The reflected light is then passed through the all-optical layer 130 to the array test equipment.

Therefore, the array test equipment photographs the distribution of the reflected light amount using a CCD camera (not shown) to prepare a voltage map of the entire pixel array according to the light amount. In this case, if the panel electrode 161 has a defect, the voltage is also different according to the difference in the amount of light, so that the defect of the panel 160 can be easily found.

That is, the reflective conductor layer 140 reflects the light incident on the all-optical material layer 130, thereby allowing the reflected light to be received by an imaging device such as a CCD camera. Thereafter, the array test equipment may determine whether the panel 160 is abnormal through image processing using the received light.

Meanwhile, the reflective conductor layer 140 may further include a protective layer 150 on the rear surface of the reflective conductor layer 140. The protective layer 150 may be bonded to the all-optical material layer 130 to reflect the conductive layer. It serves to prevent the 140 is broken by external contact or external force.

Meanwhile, in the above-described embodiment, the reflective conductor layer 140 is formed on the rear surface of the all-optical material layer 130 and then the protective layer 150 is formed on the rear surface of the reflective conductor layer 140. The reflective conductor layer 140 may be patterned on the protective layer 150, and the front surface of the protective layer 150 may be bonded to the rear surface of the all-optical material layer 130. In this case, the protective layer 150 may be made of a polymer film that is easy to print a predetermined pattern.

On the other hand, when forming the reflective conductor layer 140 in the protective layer 150, it is preferable to form the pattern so that the conductors constituting the reflective conductor layer 140 are disposed at the same position in front and rear with the panel electrode 161. .

As described above, in the modulator for all-optical devices according to the present invention, as the reflective conductor layer is formed on the rear surface of the all-optical material layer, the conductors act as floating electrodes between the electrode layer and the panel electrode, so that the electric field in the all-optical material layer even at low voltage. Since the modulator can be operated by forming a power consumption, the power consumption can be reduced.

In addition, since the modulator for all-optical devices does not have to be closely adjacent to the panel electrode, there is an effect that the abnormality of the panel can be easily detected while preventing the modulator from being damaged by the panel electrode.

In addition, the modulator for an all-optical device is configured to reflect the light incident on the all-optical material layer from the front of the all-optical material layer while the reflective conductor layer serves as a floating electrode, and thus does not include a reflective layer unlike a conventional modulator. You don't have to. This has the effect of shortening the process time and lowering the manufacturing cost in manufacturing the modulator.

Although the present invention has been described with reference to the embodiments shown in the drawings, this is merely exemplary, and any person skilled in the art to which the present invention pertains may have various modifications and equivalent other embodiments. Will understand. Therefore, the true technical protection scope of the present invention will be defined by the technical spirit of the appended claims.

Claims (11)

In the modulator for all-optical devices disposed in front of the panel formed with electrodes, which is provided in the array test equipment for testing the abnormality of the panel, Light transmitting substrate; An electrode layer formed on a rear surface of the light transmitting substrate; Is formed on the back of the electrode layer, when the electric field is formed, the molecules are arranged in the electric field direction to pass the light according to the molecular arrangement; And A reflective conductor layer disposed on a rear surface of the all-optical material layer and patterned with a plurality of conductors to which an induced voltage may be applied from the panel electrode, may reflect light incident from the front of the all-optical material layer to the front again. Modulator for all-optical equipment, characterized by including; The method of claim 1, And the conductors of the reflective conductor layer are made of silver or aluminum. The method of claim 1, And the conductors of the reflective conductor layer are disposed at the same position in front and rear of the electrodes of the panel. The method of claim 1, And the conductors of the reflective conductor layer have a reflectance of 90% or more at λ = 650 nm. The method of claim 1, And the conductors of the reflective conductor layer have a brightness value of 7 or more expressed in a surface cell color system. The method of claim 1, And an interval of the conductors of the reflective conductor layer is 10 μm or less. The method of claim 1, And a spacing of the conductors of the reflective conductor layer is 5 μm or less. The method of claim 1, And a protective layer disposed on a rear surface of the reflective conductor layer. The method of claim 8, And the reflective conductor layer is patterned on the protective layer. The method of claim 8, And said protective layer is a polymer film. The method of claim 1, The all-optical layer is a modulator for an electro-optical device, characterized in that it comprises a polymer dispersed liquid crystal (PDLC) or a liquid crystal or an inorganic EL (Electro Luminance).

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