KR100731275B1 - Detector for detecting structure vibration using a reflective sensor with non reflective surface - Google Patents

Abstract

A detector for detecting a vibration level of a structure using a reflective unit with a non reflective surface is provided to accurately measure the vibration of the structure without a high sensitive vibration sensing sensor. A detector for detecting a vibration level of a structure using a reflective unit with a non reflective surface includes a reflective unit(110), an optical detection unit(120), a signal processing unit(130), and a control unit(140). The non reflective surface region is formed on a central surface of the reflective unit. The reflective unit is attached to the structure by forming the reflective surface on an external surface of the non reflective surface. The optical detection unit is provided with a light reception unit to detect the light reflected from the reflection surface as a pulse signal. The signal processing unit compares a pulse signal size of the light detected from the light reception unit with a reference value to output the compared value as a vibration signal. The control unit converts the pulse signal of the light inputted from the signal processing unit into a vibration value to output the converted signal.

Description

Detector for detecting structure vibration using a reflective sensor with non reflective surface

1 is a view showing a vibration measuring device of a large structure of the prior art,

2 is a view showing a vibration measuring device for measuring the vibration of the rotating machine,

3 is a view showing a structure vibration level sensing device using a reflector having a non-reflective surface of the present invention,

4 is a circuit diagram illustrating an embodiment of a signal processor of FIG. 3.

5 is a view showing an installation state of the structure vibration level detection device using a reflector having a non-reflective surface according to an embodiment of the present invention,

6 is a view showing a structure vibration detection state below the critical vibration level,

7 is a diagram illustrating a structure vibration detection state of a critical vibration level or more.

Description of the main symbols in the drawings

100: vibration level detection device

110: reflector

111: non-reflective surface 112: reflective surface

120: photodetector

121: light emitting unit 121 ': light emitting diode

122: light receiving portion 122 ': photo TR

130: signal processing unit

131: light emitting signal processing unit 132: data buffer

136: light receiving signal processing unit 137: comparator

138: variable voltage regulator 139: connector

140: control unit 140 ': computer

The present invention relates to a vibration measurement of a structure, and more particularly, to a structure vibration level sensing device using a reflector having a non-reflective surface to detect the vibration and critical vibration level of the structure by non-contact.

In general, the structure, such as bridges, buildings, structures that are operated by the rotational driving force is greatly affected by the safety and performance of the vibration.

In detail, in the case of a bridge used as a road or the like, various large and small impacts are always received from a passing vehicle. These external shocks constantly cause vibrations in the bridge structure, and as the structure ages, the overall durability decreases, resulting in the risk of collapse.

In addition, in the case of a sequential and complicated rotary machine, continuous stress caused by vibration caused by driving of the rotary machine becomes a cause of failure of the rotary machine, and thus, a cost for maintaining a rotary machine facility and the like increases.

Therefore, there is a problem that the efforts to constantly maintain the stability and performance of the structure caused by the vibration by taking appropriate measures by monitoring the vibration of the structure at all times.

In order to solve the above problems as a vibration measuring apparatus for structures such as bridges, buildings, etc., Korean Patent Publication No. 2003-0062811 discloses a plate 21 installed in a large structure 25 as shown in FIG. A laser irradiator 22 for irradiating the laser onto the plate 21, an image acquiring means 23 for photographing a laser spot displayed on the surface of the plate 21 as an image, and the image acquiring means. It is composed of a computer 24 for calculating the vibration of the large structure 25 by image processing the image obtained by being electrically connected to take a laser image image irradiated to the plate 21 and then process the image with the computer 40 The vibration measuring apparatus of the large structure which detects the vibration of a bridge by this is disclosed.

And the Republic of Korea Utility Model Registration No. 20-0131015 has a measuring sensor fixing plate having a plurality of holders for measuring the vibration of the rotating machine as shown in Figure 2, a spring having a hook-shaped ring at one end, and the measuring sensor A housing part having a fixed plate and a spring, a sensor part comprising a plate with a spring hole in the center, a sub-gear gear having a central axis hole and a fixing pin hole, a pinion gear meshed with the sub-gear gear, an indicator needle, To form a space in which the through-hole is formed integrally, part of which is open to form a space, and on the other side to fix the gauge body, the indicator portion (2) fixed with a spring guide nut, and to fix the sensor portion and the indicator portion (2) It consists of a fixed plate (3) and the angle indicators (4, 4 ') attached to the plate and the fixed plate (3), holding the measuring sensor by the pressing force during measurement As the spring loaded on the sensor fixing plate is pushed, the sub-gear gear connected to one end of the spring rotates the pinion gear so that the indicator hand points to the scale marked on the gauge body. Disclosed is a vibration measuring apparatus which can accurately perform a vibration measurement by maintaining a constant pressing force.

However, the vibration measuring apparatus of a large building of the Republic of Korea Patent Publication No. 2003-0062811 of the prior art as described above is to perform the image processing by imaging the image image of the laser beam irradiated on the plate of the large building as an expensive imaging means Since the camera and the image image processing means must be provided with software and a computer, there is a problem that the price becomes high.

In addition, in the case of the vibration measuring device of the Republic of Korea Utility Model No. 20-0131015 mentioned above, it is always attached to the vibration measuring object to measure the vibration, and thus has a problem of having a highly sensitive vibration sensor, and vibrates with the vibration measuring object. There is a problem in that the vibration level of the vibration object with respect to the position cannot be detected accurately.

Accordingly, the present invention is to provide a vibration measuring device having a high precision at a low cost by solving the problems of the prior art described above, attaching a reflecting portion having a non-reflective surface in the center to the structure to be subjected to vibration measurement and non-reflective surface at a remote location Using a reflector having a non-reflective surface that detects the pulse-shaped light reflected from the reflecting surface of the reflecting unit by vibration of the reflecting unit by irradiating light to the structure to detect the vibration and critical vibration level of the structure to be measured. It is an object of the present invention to provide a structure vibration level sensing device.

Structure vibration level detection device using a reflector having a non-reflective surface of the present invention for achieving the above object, the non-reflective surface area is formed on the center surface and the reflecting surface is formed on the external region of the non-reflective surface is attached to the measurement target structure A reflection unit; A light detecting unit including a light emitting unit for irradiating light to a non-reflective surface region of the reflecting unit and a light receiving unit for detecting light reflected from the reflecting surface by vibration of the reflecting unit as a pulse signal; A signal processor for providing light emission power of the light emitting unit and outputting a pulse signal of the light detected by the light receiving unit as a vibration signal when the magnitude of the pulse signal is greater than or equal to the reference value; And a control unit for converting and outputting a pulse signal of light input from the signal processor into a vibration frequency and a vibration value.

In the above configuration, the light emitting unit may include a light emitting diode (LED) that emits light in the infrared or visible light region or a laser diode (LD) that outputs a laser, and the light receiving unit may include a CDS. , PhotoTR, photodiode, or the like. The light output from the light emitting unit described above and detected by the light receiving unit becomes an optical signal such as a laser or an infrared ray.

The signal processor includes a light emitting signal processor for providing square wave pulse power for light emission of the light emitting unit; A light receiving signal processor for comparing the magnitude of the photodetection signal detected by the light receiver with a reference value and outputting a detection signal to a controller when the threshold level is equal to or greater than a threshold value; And a connector operating as an interface between the signal processor and the photodetector.

The light emitting signal processing unit and the data buffer for receiving a square wave signal of the control unit; And a switching circuit switched at an output terminal of the data buffer to provide light emission power to the light emitting unit.

The light receiving signal processor comprises: a comparator for detecting a vibration level of the light receiver; And a variable voltage adjusting unit providing a reference value of the comparator for determining a threshold vibration level.

The control unit generates and outputs a square wave pulse signal for the light emitting unit, receives a vibration detection signal of a threshold vibration level or higher input from the signal processing unit, calculates an amplitude and a frequency, and outputs the amplitude and frequency on a display unit. Is configured to output a warning signal to a central management center using a network interface attached thereto.

Hereinafter, the present invention will be described in more detail with reference to the accompanying drawings.

3 is a view showing a structure vibration level sensing device using a reflector having a non-reflective surface of the present invention.

As shown in FIG. 3, the vibration level detecting apparatus 100 of the present invention includes a reflector 110, a light detector 120, a signal processor 130, and a controller 140.

The reflector 110 has a non-reflective surface 111 region formed on a central surface thereof, and a reflecting surface 112 is formed around the non-reflective surface 111 and attached to the structure to be measured. In this case, the non-reflective surface 111 may have various shapes such as a circle and a regular polygon.

The light detecting unit 120 uses the light reflected from the reflecting surface 112 by the vibration of the light emitting unit 121 and the reflecting unit 110 to irradiate the non-reflective surface 111 of the reflecting unit 110 as a pulse signal. A light receiving unit 122 for detecting is provided. At this time, the light emitting unit 121 is configured to periodically output the light of the square wave.

The signal processor 130 outputs a square wave pulse signal for emitting light to the light emitter 121. After receiving the pulse signal detected by the light receiving unit 122 reflected by the reflecting surface 122 of the reflecting unit 110 attached to the structure to be measured by the vibration measuring object, the vibration is set to a vibration higher than the threshold vibration level. When a signal higher than the level is detected, the pulse signal is output to the controller 140. The detailed configuration of such a signal processing unit 130 will be described in more detail in the description of FIG. 4 below.

Next, the controller 140 provides a square wave pulse to the signal processor 130, detects a vibration signal input from the signal processor 130, calculates and outputs a frequency and an amplitude value, and outputs a warning signal when the threshold level is greater than or equal to a threshold level. If it is configured to output a warning signal is configured to output to the central management center via a network.

4 is a circuit diagram illustrating an example of the signal processor 130.

As shown in FIG. 4, the signal processor 130 outputs a square wave pulse input from the controller 140 to the light emitter 121 of the light detector 120 and the light detector 120. Interface with the light receiving signal processor 136 and the light detector 120 when the electric signal having the reflected light information detected by the light receiving unit 122 has a value equal to or greater than a reference frequency or amplitude value and is output to the controller 140. It may be configured to include a connector 137 to provide. In FIG. 4, the connector 137 may be configured with various communication interfaces such as JTAG, parallel communication, Bluetooth, and USB for serial communication.

Hereinafter, each configuration of the signal processor 130 described above with reference to FIG. 4 will be described in detail.

The light emitting signal processor 131 includes a switching circuit 133 including a data buffer (U2B74HC245) 132 and a resistor R3 (20 K?) Connected to an output terminal of the data buffer, a capacitor C1 (22.2 kV), and a transistor Q1 (2N5551). It consists of. The light emitting signal processing unit 131 having the above-described configuration receives a square wave pulse signal input from the control unit 1140 through the data buffer (U2B74HC245) 132 and supplies the switching circuit 130 to the switching circuit 130 through the resistor R3 and then switches. The circuit 133 is switched according to the square wave pulse to supply the power for emitting light to the light emitting unit 121 by allowing the reference current Vcc to flow through pins 3 and 4 of the connector 139. The light emitting unit 121 outputs a periodic optical pulse signal by a power input by the switching operation of the light emitting signal processing unit 131.

Next, the light receiving signal processing unit 135 is connected to the pins 1 and 2 of the connector 139 when the light receiving unit 122 including the photo TR is energized by the light signal reflected from the reflecting surface. A comparator (U2BLM393) 137 to which a resistor R1 (330Ω) and R4 (15KΩ) and a nonpolar capacitor (C2 0.01 kΩ), a resistor R6 (5KΩ) are connected to the resistor, and a resistor R5 (1KΩ) that determines a critical vibration level. ) And a variable voltage adjusting section 138 composed of a variable resistor VR1 (5KΩ). The light receiving signal processor 135 having the above-described configuration receives an electrical signal of 5Vdc or less through pins 1 and 2 of the connector 139 when the light receiving unit 122 is energized or emitted by the reflected light signal. The signal having a value greater than the vibration level determined by the resistor R5 (1KΩ) and the variable resistor VR1 (5KΩ) is determined by the comparator 137 to which the resistor R6 is connected and operates to output to the controller 140 as a final signal. .

In the above description of FIG. 4, the frequency of the square wave input from the controller 140, the resistance values of the respective resistors and the variable resistors, and the capacitance values of the capacitors are designated as specific values, but for convenience of description, various threshold vibration levels are set. For this purpose, various values may be selected according to the user's selection.

5 is a view showing an installation state of the structure vibration level detection apparatus using a reflector having a non-reflective surface according to an embodiment of the present invention.

In FIG. 5, in the vibration sensing apparatus 100 according to the present invention, the light emitting unit 121, which is a component of the light detecting unit 120, includes a light emitting diode 121 ′, and the light receiving unit 122 is a photo TR 12 ′. It is shown as consisting of. The light emitting unit 121 may be selectively configured as a light emitting diode (LED), a laser diode (LD), and the like. The light receiving unit 122 may include a CDS, a photo TR, a photo diode, or the like. It may be as described above. 3 shows that the signal processor 130 of FIG. 3 is mounted inside the photodetector 120 as an integrated circuit board.

In addition, in FIG. 5, the controller 140 of FIG. 3 is a computer that is driven by software that outputs an amplitude and a frequency and outputs a warning signal after receiving a light detection unit detection signal value greater than or equal to a threshold vibration level input from the signal processor 130. (140 '). The computer 140 ′ may be implemented as a general desktop, a laptop, a control computer implemented with a one-chip microcontroller, or the like, and may be configured to have a specialized function for the vibration sensing device 100 of the present invention.

In this case, the signal processor 120 mounted inside the light detector 120 may be connected to the light detector 120 such that the computer 140 ′ is connected to the light detector 120 by a short range communication method such as parallel, serial, USB, infrared, or Bluetooth. Connected with.

Referring to Figure 5 describes the state of use and operation of the vibration sensing device 100 of the present invention.

In the vibration sensing apparatus 100 of the present invention having the configuration of FIG. 5 described above, the reflector 110 is attached to a vibration measuring structure 200 such as a building, a bridge, a rotating device, and the like. In addition, the light detecting unit 120 measures the vibration as a reference point for measuring the vibration of the structure 200 to be measured so that the light output from the light emitting diode 121 ′ is irradiated onto the non-reflective surface 111 of the reflector 110. It is installed on the fixed structure 300 is installed separately from the structure 200. At this time, the light emitting diodes 121 'are set to output square wave light pulses. This is for the calculation of the next frequency or vibration amplitude. The light emitting diode 121 'may be replaced with a laser diode LD when a measurement requiring precision is required.

Thereafter, the light of the light emitting diode 121 ′ of the photodetector 120 maintains a state of irradiating the non-reflective surface 111 of the reflective surface 110, and when the vibration occurs in the vibration measurement target structure 200, the reflective portion The position of the 130 is moved in accordance with the vibration of the structure 200, so that the light emitted from the light emitting diode 121 'is reflected by the reflecting surface 112 of the reflecting unit 110, and thus the photo TR 122'. Is detected through. At this time, the reflected signal detected by the photo TR 122 'is because the light output from the light emitting diode 121' periodically illuminates the non-reflective surface 111 and the reflective surface 112 in accordance with the vibration of the structure 200 According to the frequency information, that is, the frequency information on the vibration of the structure 200. In addition, since the light emitting diode 121 'is initially output as a square wave light pulse, it is possible to calculate the vibration distance of the non-reflective surface from the pulse period of the detected light detection signal by reflecting the square wave light pulse, thereby forming by detecting the reflected light. The pulse signal to be included includes vibration amplitude information of the structure to be measured 200.

6 is a diagram illustrating a structure vibration detection state below the critical vibration level, and FIG. 7 is a diagram illustrating a structure vibration detection state above the critical vibration level.

In the case of FIG. 6, since the vibration measuring object 200 does not vibrate and the light output from the light emitting unit 121 (or the light emitting diode 121 ′) is absorbed by the non-reflective surface 111, the light receiving unit 122 (or the photo). Since the light cannot be detected by the TR 122 ′, there is no output signal of the light receiver 122.

However, when vibration occurs in the target structure 200, the reflector 110 attached to the structure 200 is moved along the structure 200 so that the light output from the light emitting unit 122 is reflected by the reflecting surface 112. By being reflected, the light receiving unit 122 generates a light detection signal corresponding to the intensity and time of the light reflected by the reflective surface. At this time, the detected light detection signal generates a vibration pulse according to the vibration of the structure 200 within the square wave pulse when the building vibrates faster than the period of the square wave pulse output from the controller 140 (or the computer 140 '). Or, if the period of the square wave pulse is significantly greater than the frequency of the building (e.g., square wave period KHz, the frequency of the building several tens to one hundred Hz), the received photodetection signal does not exist for a certain period region. The non-reflective area is generated periodically as a building vibration period and thus has frequency (period) information on the vibration of the building, in which case the amplitude of the structure can be calculated by converting the vibration amplitude of the structure by knowing the size information of the non-reflective surface 111. Therefore, the detected light pulse signal will contain amplitude and period information about the vibration of the structure.

The vibration level signal by the reflection signal received through the photo TR 122 ′ of the photodetector 120 is input to the signal processor 130 and compared with the reference vibration level value by the light receiving signal processor 136. As shown in FIG. 2, when a light detection signal having a threshold vibration level or more is detected, the signal is output to the controller 140 (or the computer 140 ′).

The controller 140 (or the computer 140 ') calculates and outputs the frequency and the amplitude of the structure 200 using the period, amplitude, and period information in the light emitting unit supplying square wave pulses of the light detection signal input by the reflected light. do. In addition, if necessary, it outputs a warning signal and outputs it to the central management center.

The present invention as described above provides the ease of structure vibration measurement to enable the measurement of the vibration of the structure without the user's skilled process by being able to measure the vibration of the structure in a non-contact manner.

In addition, the present invention described above provides an effect of facilitating the management and maintenance of the structure by reducing the cost of the structure by accurately measuring the vibration of the structure with a simple structure without the implementation of a high-sensitivity vibration sensor, etc. do.

Claims (6)

A reflecting portion formed at a center surface of the non-reflective surface region and having a reflecting surface formed at an outer region of the non-reflective surface and attached to the structure to be measured; A light detecting unit including a light emitting unit for irradiating light to a non-reflective surface region of the reflecting unit and a light receiving unit for detecting light reflected from the reflecting surface by vibration of the reflecting unit as a pulse signal; A signal processor for providing light emission power of the light emitting unit and outputting a pulse signal of the light detected by the light receiving unit as a vibration signal when the magnitude of the pulse signal is greater than or equal to the reference value; And a control unit for converting and outputting a pulse signal of light input from the signal processing unit into a vibration frequency and a vibration value. The apparatus of claim 1, wherein the light emitting unit is any one of a light emitting diode (LED) or a laser diode (LD). The apparatus of claim 1, wherein the light receiving unit is any one of a CDS, a photo TR, and a photodiode. The method of claim 1, wherein the signal processing unit, A light emitting signal processor for providing square wave pulse power for light emission of the light emitting unit; Structure vibration using a reflector having a non-reflective surface, characterized in that it comprises a; a light receiving signal processing unit for outputting a detection signal to the control unit when the magnitude of the light detection signal detected by the light receiving unit is compared with a reference value; Level sensor. The method of claim 4, wherein the light emitting signal processing unit, A data buffer receiving the square wave signal of the controller; And a switching circuit which is switched at an output end of the data buffer to provide light emitting power to a light emitting unit. Structure vibration level sensing apparatus using a reflector having a non-reflective surface, characterized in that it comprises a. The method of claim 4, wherein the light receiving signal processing unit, A comparator for detecting a vibration level of the light receiving unit; And a variable voltage adjusting unit providing a reference value of the comparator for determining a threshold vibration level.

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