KR100718434B1 - System and method for measuring turntable height deviation of optical-disc apparatus - Google Patents

Abstract

The present invention is to measure the turntable height deviation of the optical disk device, to this end, the present invention lacks a tool (measurement and management of the turntable height deviation during the manufacturing process of the optical disk device lacking in securing the quality of the optical disk device) Unlike the FOC (Focus Actuator Output) generated voltage of the optical disk device, after detecting and storing the maximum value and the minimum value, it is checked whether there is an S curve detected according to the focus error signal between the detected maximum value and the minimum value. If the S curve does not exist, the detection of the S curve is continuously repeated. If the S curve exists, the asymmetry value is calculated using the maximum and minimum values, and the calculated asymmetry value is the maximum value set according to the management specification. If the value is between and the minimum value, the optical disc device determines that the turntable height deviation of the Turntable height variation of the device is greater than that can automatically improve product yield measurement and management.

Turntable Height, Focal Distance, Focus Actuator

Description

System and method for measuring turntable height deviation of optical disk device {SYSTEM AND METHOD FOR MEASURING TURNTABLE HEIGHT DEVIATION OF OPTICAL-DISC APPARATUS}

1 is a block diagram of a conventional manufacturing process system for an optical disk device;

2 is a block diagram of a turntable height deviation measuring system of an optical disk apparatus suitable for measuring turntable height deviation according to the present invention;

3 is a view showing a maximum value and a minimum value of a Focal Actuator Output (FOO) generation voltage according to the present invention;

FIG. 4 is a flowchart illustrating a process of determining a turn-in height spec by measuring a turntable height deviation according to the present invention. FIG.

<Description of the symbols for the main parts of the drawings>

202: control unit 204: deck assembly assembly

206: process jig unit 208: turntable height deviation measurement unit

210: display unit 212: performance test unit

The present invention relates to a technique for measuring a turntable height deviation of an optical disk device, and more particularly, to a turntable height deviation measuring system and method for an optical disk device suitable for measuring a turntable height deviation of an optical disk device.

As is well known, a process of reading and reproducing information recorded on an optical disc, for example, a CD, a DVD, or the like is described, wherein the optical disc is mounted on a turntable, the optical disc rotates together with the turntable as the spindle motor is driven, and an objective lens is provided. While the optical pickup is subjected to horizontal reciprocating motion in the radial direction of the optical disk, reading and reproducing of the optical disk by the optical pickup is performed.

On the other hand, the distance between the objective lens of the optical pickup and the information recording surface of the optical disk is represented by a focal distance, and in order to accurately read the information recorded on the information recording surface of the optical disk, a process of adjusting such a focal length is necessary. This should be applied differently depending on the type of optical disc.

In particular, the objective lens is configured to be movable vertically (focusing direction) or horizontally (tracking direction) with respect to the surface of the optical disc, and the position of the objective lens with respect to the optical disc is controlled through the control of the tracking servo and the focusing servo. It is necessary to adjust the height of the turntable device to adjust the focal length between the lens and the optical disc.

1 is a block diagram of a conventional manufacturing process system for an optical disk device, and includes a control unit 102, a deck assembly assembly unit 104, a process jig unit 106, and a performance test unit 108.

Referring to FIG. 1, the control unit 102 performs overall operation control of a manufacturing process system, and when a motor assembly component and various assembly components are input, a control signal for assembling such components to the deck assembly assembly unit 104. Providing control signals to the process jig unit 106 for automatically adjusting the tangential skew, the radial skew, and the various device conditions of the assembled optical disc device. It provides a control signal for performing a performance test of the optical disk device to the performance test unit 108, and the like.

In addition, the deck assembly assembly unit 104 assembles the motor assembly component and various assembly components input according to the assembly control signal provided from the controller 102 and provides the optical disk device to the process jig unit 104.

In addition, the process jig unit 106 adjusts device conditions such as tangential skew, radial skew, focusing, tracking, and the like for the optical disk device assembled according to the adjustment control signal provided from the control unit 102, and then performs the performance test unit. Forward to 108.

Next, the performance test unit 108 performs a performance test on the optical disk device in which the adjustment of each device condition (for example, tangential skew, radial skew, focusing, tracking, etc.) is completed. A process of recording arbitrary data or reproducing the recorded data on an optical disk (for example, DVD-ROM, DVD-R, DVD-RW, etc.) mounted in accordance with the function is performed. After this, the optical disk device having completed the performance test is finally shipped.

On the other hand, in the manufacturing process of the optical disk device, the focal length of the pickup detection sensitivity must be present in the linear section, which is the center of the focus actuator, to enhance the stability of the servo, and when the focal length is adjacent to the non-linear section, the servo error is prevented. In order to prevent this problem, the turntable height was designated as a management specification during the manufacturing process, and thus it was adjusted and managed during assembly of the motor assembly.

However, there is a problem in the conventional manufacturing process of the optical disk device in the assembly of the motor assembly, there is a tool to verify the deviation of the turntable height, there is a problem in quantifying and managing the quality of the optical disk device in the manufacturing process Since the process for securing is insufficient, it acts as a factor that causes a claim of a user who uses the optical disk device.

Accordingly, the present invention is to solve the above-described problems of the prior art, the specification in or through the asymmetric value according to the presence of the S curve detected between the maximum value and the minimum value of the FOO generation voltage in the manufacturing process of the optical disk device It is an object of the present invention to provide a system and method for measuring a turntable height deviation of an optical disk device capable of determining spec over.

In order to achieve the above object, the present invention is a system for measuring the height deviation of the turntable for adjusting the focal length between the objective lens and the optical disk of the optical disk device, an arbitrary optical disk using the motor assembly component and various assembly components A deck jig unit for assembling and delivering the device, and a process jig unit for adjusting and delivering device conditions including tangential skew, radial skew, focusing, and tracking for the optical disk device delivered from the deck assembly assembly; Detecting and storing the maximum value and the minimum value according to the FOO generation voltage in the corresponding optical disk device with the device conditions adjusted, and storing the generation voltage of the S curve detected according to the focus error signal between these values, Calculate asymmetry using the maximum and minimum values After determining the spec-in or spec-over of the turntable height deviation through the calculated asymmetric value, the turntable height deviation measuring unit for calculating the actual turntable height deviation in the case of the specover, and the turntable height If the deviation is the specification, it provides a performance test unit that tests random data on the mounted optical disk or reproduces the recorded data according to the function of the optical disk device, and provides assembly control signals for the various assembly parts to be input. And a control unit for providing an adjustment control signal for the device conditions, providing a control signal for measuring the turntable height deviation to the turntable height deviation measuring unit, and providing a performance test control signal for the corresponding optical disk device. Provides turntable height deviation measurement system for optical disc devices The.

In order to achieve the above object, the present invention is a method for measuring the height deviation of the turntable for adjusting the focal length between the objective lens and the optical disk of the optical disk device, by detecting the FOO generated voltage of the optical disk device to determine the maximum value and the minimum value Detecting and storing the S curve according to a focus error signal between the detected maximum value and the minimum value, and detecting and whether the S curve is present if the S curve does not exist. Continuously checking, if the S curve exists, calculating an asymmetry value using the maximum value and the minimum value, and checking whether the calculated asymmetry value is a value between a preset maximum value and a minimum value according to a management specification. And if the asymmetry value is a value between the preset maximum value and minimum value, It provides a turntable height variation measuring method of the optical disk device comprising a turntable height deviation is determined the specification inim.

The above and other objects and various advantages of the present invention will become more apparent from the preferred embodiments of the present invention described below with reference to the accompanying drawings by those skilled in the art.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

The core technical aspect of the present invention is to detect the FOO generated voltage of the optical disk device, detect and store the maximum value and the minimum value, and then check whether the S curve exists through the detected maximum value and the minimum value, and the S curve does not exist. If the S curve is continuously rediscovered, and if the S curve exists, the asymmetry value is calculated using the maximum and minimum values, and the calculated asymmetry value is between the maximum and minimum values set according to the management specifications according to the optical disk device. In this case, it is determined that the turntable height deviation of the optical disk device is the specification, and it is easy to achieve the object of the present invention through such technical means.

2 is a block diagram of a turntable height deviation measuring system of an optical disk apparatus suitable for measuring turntable height deviation according to the present invention, which includes a control unit 202, a deck assembly assembly unit 204, a process jig unit 206, The turntable height deviation measurer 208, the display 210, and the performance tester 212 are included.

Referring to FIG. 2, the controller 202 performs overall operation control of the manufacturing process system. When the motor assembly component and various assembly components are input, a control signal for assembling these components is sent to the deck assembly assembly 204. Providing control signals to the process jig unit 206 for automatically adjusting tangential skew, radial skew and various device conditions of the assembled optical disc device, and measuring turntable height deviations. To provide the control signal for the turntable height deviation measuring unit 208 and to provide the control signal for performing the performance test of the optical disk device to the performance testing unit 212 when the turntable height deviation is Spec-in. And so on.

In addition, when the turntable height deviation is Spec-over, the controller 202 provides a control signal for measuring the actual height deviation to the turntable height deviation measuring unit 208, and the turntable height deviation measuring unit 208. The control unit for receiving the actual turntable height deviation data from the display to provide the control signal for displaying this.

The deck assembly assembly unit 204 assembles the motor assembly component and various assembly components input according to the assembly control signal provided from the controller 202 and provides the optical disk device to the process jig unit 204.

In addition, the process jig unit 206 adjusts device conditions such as tangential skew, radial skew, focusing, tracking, and the like for the corresponding optical disk device assembled according to the adjustment control signal provided from the control unit 202, and then varies the turntable height. Transfer to the measuring unit 208.

Next, the turntable height deviation measuring unit 208 detects the generated voltage of the Focus Actuator Output (FOO) after the swing of the Focus Actuator (FO) in the transmitted optical disk device. As shown in FIG. The value is stored in F1, the minimum FOO value is stored in F2, and after checking whether there is an S-curve signal detected according to the focus error signal between these F1 and F2, the S curve If a signal exists, its FOO generated voltage is stored in Focus Error Zero Crossing (FEZC), and it is checked whether the asymmetry accordingly has a value between a preset maximum value and a minimum value according to the management specification of the optical disk device. Here, the asymmetry value can be calculated through Equation 1 as follows.

Asymmetry = (F1 + F2) / (F1-F2) × 100 [%]

In addition, when the asymmetry value is a value between a preset maximum value and a minimum value, the turntable height deviation measuring unit 208 transmits the performance to the performance test unit 212 for a performance test of the corresponding optical disk device, and the asymmetry value is set to the preset maximum value. If the value is not between the minimum value, the actual turntable height deviation is calculated, and the equation may be expressed by Equation 2 as follows.

Height deviation = (F1 + F2) / 2 × T

Here, T means the height detection sensitivity, which means a preset detection constant for each model of the optical disk device.

The turntable height deviation measurer 208 transmits the calculated data of the actual turntable height deviation to the controller 202.

On the other hand, the display unit 210 generates a menu screen for displaying the display according to the actual turntable height deviation data transmitted from the control unit 202 and displays through a monitor (not shown).

Next, the performance test unit 212 performs a performance test on the optical disk device on which the turntable height deviation measurement is completed, and the optical disk (for example, DVD-ROM, DVD-R, DVD) mounted according to the function of the optical disk device. -RW, etc.) to record arbitrary data or to reproduce the recorded data. After this, the optical disk device having completed the performance test is finally shipped.

Next, the turntable height deviation measuring system of the optical disk device having the above-described configuration detects the generated voltage of FOO, detects and stores the FOO maximum value and the minimum value, and then checks whether the S curve exists, and the S curve exists. When the asymmetry value is calculated according to this, turntable height deviation is judged as spec-in if the value is between the preset maximum and minimum value and judged as spec-over if the value is not between preset maximum and minimum value. Describe the measurement process.

FIG. 4 is a flowchart illustrating a process of determining a turn-in height spec by measuring a turntable height deviation according to the present invention. It will be described with respect to the turntable height deviation measuring method according to the present invention through these drawings.

Referring to FIG. 4, in the turntable height deviation measuring mode according to the control signal from the controller 202 (step 402), the turntable height deviation measuring unit 208 swings the FOO (Focus) after the swing of the focus actuator (FO). The generated voltage of the actuator output) is detected (step 404).

The turntable height deviation measuring unit 208 detects and stores the maximum value at the FOO generation voltage as F1 (step 406), and detects and stores the minimum value at the FOO generation voltage as F2 (step 408).

Accordingly, the turntable height deviation measuring unit 208 checks whether there is an S curve S-curve detected according to the detected focus error signal between F1 and F2 (step 410). As an example, Figure 3 is a view showing the maximum value and the minimum value of the FOO generation voltage in accordance with the present invention.

As a result of the check in step 410, if the S curve does not exist, the detection of the S curve according to the detected focus error signal between F1 and F2 is continuously checked.

On the other hand, if the S curve is present as a result of the check in step 410, the turntable height deviation measuring unit 208 stores the FOO generated voltage of the S curve in Focus Error Zero Crossing (FEZC) (step 412), Asymmetry is calculated according to the FOO generation voltage, and it is checked whether the calculated asymmetry value is between a maximum value and a minimum value preset according to the optical disk device (step 414). Here, the asymmetry value can be calculated through the above equation (1).

As a result of the check in the step 414, the turntable height deviation measuring unit 208 calculates the actual turntable height deviation when the asymmetry value is not a value between the preset maximum value and the minimum value according to the management specification of the optical disk device (step 416). Here, the calculation of the actual turntable height deviation may be performed through Equation 2, wherein it is determined that the turntable height deviation of the corresponding optical disk device is spec over.

Next, the turntable height deviation measuring unit 208 provides the calculated actual turntable height deviation data to the control unit 202, and the control unit 202 displays a control signal for displaying the actual turntable height deviation data. The display unit 210 generates a menu screen displaying such data and displays the same through a monitor (not shown).

On the other hand, as a result of the check in step 414, if the asymmetry value is a value between the preset maximum value and the minimum value according to the management specification of the optical disk device, it is determined that the turntable height deviation of the optical disk device is the specification, and the optical disk device is After passing to the performance test unit 212, a performance test of the optical disk device is performed (step 420).

Therefore, when the maximum and minimum values of the FOO generated voltages of the optical disk device are detected and an S curve exists between them, the turntable height deviation is specified when the asymmetry value of the S curve is a value between the maximum value and the minimum value set according to the optical disk device. If it is determined to be phosphorus and the other values are determined as spec over, the turntable height deviation may be measured and managed.

In the foregoing description, the present invention has been described with reference to preferred embodiments, but the present invention is not necessarily limited thereto. Those skilled in the art will appreciate that the present invention may be modified without departing from the spirit of the present invention. It will be readily appreciated that branch substitutions, modifications and variations are possible.

As described above, according to the present invention, unlike the conventional method, which lacks a tool for measuring and managing turntable height deviations in the manufacturing process of the optical disk device and thus insufficient quality assurance of the optical disk device, the FOO generation voltage of the optical disk device is detected and the maximum value is detected. And after detecting and storing the minimum and minimum values, check whether there is a detected S curve according to the focus error signal between the detected maximum and minimum values, and if the S curve does not exist, continuously redetect the S curve, If there is a curve, the asymmetry value is calculated using the maximum and minimum values.If the calculated asymmetry value is between the maximum and minimum values set according to the management specification, it is determined that the turntable height deviation of the optical disk device is the specification. If the asymmetric value is not between the maximum value and the minimum value, the actual value By measuring the table height deviation and displaying the result thereof, it is possible to automatically measure and manage the turntable height deviation of the optical disc device to improve the product yield.

Claims (8)

A system for measuring a height deviation of a turntable for adjusting a focal length between an objective lens of an optical disk device and an optical disk, A deck assembly assembly for assembling and transferring an arbitrary optical disc device by using the motor assembly parts and various assembly parts to be input, A process jig unit for adjusting and transferring device conditions including tangential skew, radial skew, focusing, and tracking for the optical disk device delivered from the deck assembly assembly; Detecting and storing a maximum value and a minimum value according to a Focus Actuator Oupput (FOO) generation voltage in a corresponding optical disk device having adjusted device conditions, and storing a generation voltage of an S curve detected according to a focus error signal between these values, After calculating the asymmetry value using the maximum value and the minimum value of the FOO generation voltage, and after determining the spec-in or spec-over of the turntable height deviation through the calculated asymmetry value, the spec-over If is a turntable height deviation measuring unit for calculating the actual turntable height deviation, A performance test unit for testing random data or reproducing the recorded data on an optical disk mounted according to the function of the optical disk apparatus when the turntable height deviation is a specification; Providing an assembly control signal for the various assembly components to be input, providing an adjustment control signal for the device conditions, providing a control signal for measuring the turntable height deviation to the turntable height deviation measuring unit, and providing the corresponding optical disc. A control unit that provides a performance test control signal of the device Turntable height deviation measurement system of the optical disk device comprising a. The method of claim 1, The measuring system, A display unit for displaying the actual turntable height deviation calculated when the turntable height deviation is over spec Turntable height deviation measurement system of the optical disk device further comprising. The method of claim 1, The asymmetry value is calculated based on the following equation, Turntable height deviation measurement system of an optical disk device. Asymmetry = (F1 + F2) / (F1-F2) × 100 [%] In the above equation, F1 denotes the maximum value of the FOO generated voltage and F2 denotes the minimum value of the FOO generated voltage. The method according to claim 1 or 2, The actual turntable height deviation is calculated based on the following equation, Turntable height deviation measurement system of the optical disk device. Height deviation = (F1 + F2) / 2 × T In the above equation, F1 denotes the maximum value of the FOO generated voltage, F2 denotes the minimum value of the FOO generated voltage, and T denotes the height detection sensitivity. A method of measuring a height deviation of a turntable for adjusting a focal length between an objective lens of an optical disk device and an optical disk, Detecting and storing maximum and minimum values by detecting a voltage generated by a focus actuator output (FOO) of the optical disk device; Checking whether there is an S curve detected according to a focus error signal between the detected maximum value and the minimum value; Continuously checking the detection and existence of the S curve when the S curve does not exist, and calculating an asymmetry value using the maximum and minimum values when the S curve exists; Checking whether the calculated asymmetry value is between a maximum value and a minimum value preset according to the optical disk device; Determining that the turntable height deviation of the optical disc device is a specification when the asymmetry value is a value between the preset maximum value and the minimum value Turntable height deviation measurement method of the optical disk device comprising a. The method of claim 5, The measuring method, Calculating an actual turntable height deviation of the optical disc device by determining that the tentable height deviation of the optical disc device is spec over when the asymmetry value is not a value between the preset maximum value and the minimum value; Displaying the calculated actual turntable height deviation Turntable height deviation measurement method of the optical disk device further comprising. The method according to claim 5 or 6, The asymmetric value is calculated on the basis of the following equation, characterized in that the turntable height deviation measuring method of the optical disk device. Asymmetry = (F1 + F2) / (F1-F2) × 100 [%] In the above equation, F1 denotes the maximum value of the FOO generated voltage and F2 denotes the minimum value of the FOO generated voltage. The method of claim 6, And the actual turntable height deviation is calculated based on the following equation. Height deviation = (F1 + F2) / 2 × T In the above equation, F1 denotes the maximum value of the FOO generated voltage, F2 denotes the minimum value of the FOO generated voltage, and T denotes the height detection sensitivity.

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