KR100711426B1 - Acid copper electroplating composition for plating through holes in printed circuit boards - Google Patents

Acid copper electroplating composition for plating through holes in printed circuit boards Download PDF

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KR100711426B1
KR100711426B1 KR1020050082026A KR20050082026A KR100711426B1 KR 100711426 B1 KR100711426 B1 KR 100711426B1 KR 1020050082026 A KR1020050082026 A KR 1020050082026A KR 20050082026 A KR20050082026 A KR 20050082026A KR 100711426 B1 KR100711426 B1 KR 100711426B1
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plating
cysteine
printed circuit
acidic
hole
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KR1020050082026A
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KR20070025643A (en
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김봉철
박영훈
이일희
이상국
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(주)랩솔루션
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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/38Electroplating: Baths therefor from solutions of copper
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/40Forming printed elements for providing electric connections to or between printed circuits
    • H05K3/42Plated through-holes or plated via connections
    • H05K3/423Plated through-holes or plated via connections characterised by electroplating method
    • H05K3/424Plated through-holes or plated via connections characterised by electroplating method by direct electroplating

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Electroplating And Plating Baths Therefor (AREA)

Abstract

본 발명은 인쇄회로기판(PCB : Print circuit board)의 스루홀(through hole) 도금용 산성 동전해 용액의 조성물 및 이를 이용한 도금방법에 관한 것이다. 본 발명의 스루홀 도금용 산성 동전해 용액은 시스테인 유도체 황화합물 및 수용성 머캅토(mercapto) 함유 유기 광택제와 하나 이상의 캐리어 또는 습윤제를 포함하며 다중 하전된 중심을 가진 질소함유 유기화합물을 포함하는 균염제와 미세화제, 안정화제 성분으로 구성되어 기존 전해 용액에 비해 긴 욕 수명을 가지고 광택 및 피막 물성이 우수하며, 특히 PCB 표면 및 스루홀의 균일 전착성이 매우 우수한 도금을 얻을 수 있다. 또한 최종적으로 동도금된 금속이 간섭성 신호(coherent signal)를 발생시키지 않아 신뢰성이 향상된 고밀도화 및 다층화된 인쇄회로기판 소재제품을 얻는데 매우 유용하다.The present invention relates to a composition of an acidic electrolytic solution for through hole plating of a printed circuit board (PCB) and a plating method using the same. The acidic anticorrosive solution for through-hole plating of the present invention includes a microbinder and a fine dye containing a cysteine derivative sulfur compound and a water-soluble mercapto-containing organic brightener and one or more carriers or humectants and a nitrogen-containing organic compound having multiple charged centers. It is composed of an agent and a stabilizer component, and has a long bath life compared to the existing electrolytic solution, and has excellent gloss and film properties, and in particular, plating with excellent uniform electrodeposition of the PCB surface and through holes can be obtained. In addition, the final copper-plated metal does not generate a coherent signal, which is very useful for obtaining high-density and multilayered printed circuit board products with improved reliability.

인쇄회로기판, 산성 동전해 용액, 스루홀(through hole) Printed Circuit Boards, Acid Coin Solution, Through Hole            

Description

인쇄회로기판 스루홀 도금용 산성 동전해 용액의 조성물 { Acid copper electroplating composition for plating through holes in printed circuit boards }Acid copper electroplating composition for plating through holes in printed circuit boards}

본 발명은 인쇄회로기판(PCB : Print circuit board)의 스루홀(through hole) 도금용 산성 동전해 용액의 조성물 및 이를 이용한 도금방법에 관한 것이다. 보다 자세히는 산성 동전해 도금시 사용되는 첨가제로서 시스테인 유도체 물질을 포함하는 동전해 용액 조성을 통하여 피막 물성이 우수하고 PCB 표면 및 스루홀의 균일 전착성이 매우 우수한 PCB 스루홀 도금용 산성 동전해 용액의 조성물 및 이를 이용한 도금방법에 관한 것이다.The present invention relates to a composition of an acidic electrolytic solution for through hole plating of a printed circuit board (PCB) and a plating method using the same. More specifically, as an additive used in plating acidic coins, the composition of acidic solutions for PCB through hole plating has excellent coating properties and excellent electrodeposition properties of PCB surface and through holes through the composition of coins solution containing cysteine derivative material. And it relates to a plating method using the same.

최근 이동통신 단말기, 반도체, 컴퓨터 등 각종 디지털 관련 산업분야는 양적으로 급격한 팽창과 더불어 기술적 진보를 가져왔고 이를 위해서는 고밀도화 및 다층화된 인쇄회로기판이 필수적으로 요구되어진다. 이러한 고정세(HDI:High Density Interconnection) PCB는 단순히 여러층의 PCB를 각각 만든 후 압착하는 기존의 MLB(Multi-Layer Board) 공법으로는 기술적 진보에 대응하기 어렵다는 한계점을 가진다.Recently, various digital-related industries such as mobile communication terminals, semiconductors, computers, etc. have brought rapid technological expansion and quantitative advancement. For this purpose, high density and multilayered printed circuit boards are required. This high density interconnection (HDI) PCB has a limitation in that it is difficult to cope with technological advances by using a conventional multi-layer board (MLB) process, which simply makes and compresses multiple layers of PCB.

인쇄회로기판의 대규모 집적기술이 급속히 발전함에 따라 이에 대응할 수 있는 신속한 회로의 응답속도 등 전반적인 성능 증강이 요구되고 있어 이를 충족하고 제품의 신뢰성을 확보할 수 있는 전기 접속재로서 저항이 낮아 전도율이 우수한 금속인 구리가 보편적으로 사용되어지고 있다. 또한 구리를 이용한 동전해 스루홀 도금 기술은 최근의 고속화, 고집적화, 대용량화 추세에 맞춰 배선을 더욱 고밀도화시킬 수 있고 접속 신뢰도 측면이 매우 우수하여 폭넓게 이용되어지고 있다. 그러나, 종래의 동전해 도금기술에서 사용되는 동전해용 조성물 및 첨가제를 사용하여 스루홀을 도금할 시 홀 내부의 균일 전착성이 떨어지고 제품의 신뢰성을 확보하고 불량률을 최소화하기 위해서는 0.05A/d㎡ 이하의 저전류에서 장시간이 걸린다는 단점을 가지고 있어 실제 생산현장에서 적용하기 어려우며 PCB 표면과 홀 내부의 도금 두께 차이가 커져 효율성이 낮다는 문제점이 있다. 또한 홀 내부의 석출성을 높이기 위해 고전류로 도금하였을 시에는 동의 급속 성장 및 동의 과잉 석출에 의해 PCB 표면의 피막 물성이 떨어지며 홀 내부의 균일 전착성이 저하되어 결국 제품의 신뢰성과 완성도를 확보할 수 없다는 문제점을 가진다.As the large-scale integrated technology of printed circuit boards is rapidly developed, the overall performance improvement such as the response speed of the circuit that can cope with this is required, and it is an electrical connection material that meets this and secures the reliability of the product. Phosphorus copper is commonly used. In addition, copper-coated through-hole plating technology has been widely used due to the recent trend of high speed, high integration, and high capacity, which makes wiring more dense and has excellent connection reliability. However, when plating through-holes using coin-coating compositions and additives used in conventional coin-sealing technology, the uniform electrodeposition inside the holes is reduced, and in order to secure product reliability and minimize the defective rate, it is 0.05 A / dm 2 or less. It has a disadvantage of taking a long time at low current, so it is difficult to apply in actual production sites, and there is a problem of low efficiency due to the large difference in plating thickness between PCB surface and inside of hole. In addition, when plated with high current to increase the precipitation inside the hole, the film property on the PCB surface is degraded due to the rapid growth of copper and the excessive precipitation of copper, and the uniform electrodeposition of the inside of the hole is lowered, thus ensuring the reliability and completeness of the product. There is no problem.

본 발명은 상기와 같은 종래의 문제점을 해결하기 위한 것으로 PCB 표면의 피막 물성이 우수하고 PCB 표면 및 스루홀의 균일 전착성이 매우 우수한 스루홀 도금용 산성 동전해 용액의 조성물 및 첨가제 그리고 이를 이용한 도금방법을 제공하는데 그 목적이 있다.The present invention is to solve the conventional problems as described above, the composition and additives of the acidic anti-corrosive solution for through-hole plating and excellent plating properties of the PCB surface and excellent electrodeposition of the PCB surface and through-holes and plating method using the same The purpose is to provide.

본 발명은 통상적인 산성 동전해액의 조성물인 머캅토 함유 유기 광택제(Brightener), 캐리어 및 습윤제(Carrier and wetting agent), 균염제(Leveller)가 동전해 도금시 홀의 내부를 충진하는데 있어 중요한 인자로써 작용하고 있다는 것에 착안하여 각각의 조성에 해당하는 화학물질을 토대로 광범위한 연구를 실시하여 시스테인 유도체 물질을 포함하는 특정 화합물의 조성에서 스루홀 도금을 위한 동전해 도금시 욕의 수명이 길고 광택 및 피막 물성이 우수하며, 특히 PCB 표면 및 스루홀의 균일 전착성이 매우 우수하다는 장점을 제공하므로 종래의 산성 동전해 용액에서 발생하는 문제점을 해결할 수 있었다.The present invention acts as an important factor in filling the inside of the hole during plating by mercapto-containing organic brightener, carrier and wetting agent, leveler, which are the compositions of conventional acidic anticoagulants. Based on the chemicals corresponding to each composition, extensive research was carried out, and the life of the bath was long and the gloss and film properties were excellent when the coin plating for through-hole plating was carried out in the composition of a specific compound including cysteine derivative material. In particular, since the electrodepositing property of the PCB surface and the through hole is very excellent, the problem occurring in the conventional acidic solution is solved.

상기 목적을 달성한 본 발명의 산성 동전해 용액의 조성물은 산과 구리염, 염소이온 포함한 동전해 용액에 하나 이상의 수용성 머캅토 함유 유기 광택제와 캐리어, 습윤제를 포함하고 다중 하전된 질소함유 유기화합물을 가진 균염제와 미세화제, 안정화제 성분이 추가적으로 첨가되어 구성된다.The composition of the acidic anticorrosive solution of the present invention, which achieves the above object, includes at least one water-soluble mercapto-containing organic brightener, a carrier and a wetting agent, and a multicharged nitrogen-containing organic compound in a coin solution containing acid, copper salt and chlorine ion. It consists of the addition of the leveling agent, the micronizing agent and the stabilizing agent.

산은 황산이 사용되어지는데 황산은 전해질로서 전기분해 전도성에 필요하다. 황산농도가 높을수록 낮은 전류밀도를 제공하여 전기 전도도가 좋으나 황산구리의 석출이 발생하기 쉽고 부족하게 되면 균일 전착성이 떨어지게 된다. 본 발명에 의한 동전해 용액 1리터를 기준으로 황산의 바람직한 사용범위는 50㎖∼200㎖이며 더욱 바람직하게는 65㎖∼120㎖이다.Acid is sulfuric acid, which is required for electrolytic conductivity as electrolyte. The higher the sulfuric acid concentration is, the lower the current density is, the better the electrical conductivity is. The use range of sulfuric acid is preferably 50 ml to 200 ml, more preferably 65 ml to 120 ml, based on 1 liter of the coin solution according to the present invention.

구리염은 구리이온의 원천으로서 황산구리 5수화물이 사용되어진다. 높은 농도는 동도금시 양극에서 황산구리 결정화를 야기시키며 균일 전착성이 떨어지게 된다. 본 발명에 의한 동전해 용액 1리터를 기준으로 황산구리 5수화물의 바람직한 사용범위는 50g∼200g이며 보다 바람직하게는 60g∼110g이다.Copper salts are copper sulfate pentahydrate used as a source of copper ions. High concentrations lead to copper sulfate crystallization at the anode during copper plating, resulting in poor electrodeposition. The use range of the copper sulfate pentahydrate on the basis of 1 liter of the coin solution according to the present invention is 50 g to 200 g, more preferably 60 g to 110 g.

염소이온은 도금의 품질에 큰 영향을 주는 물질로써 염화나트륨 및 염산으로부터 사용되어진다. 염소이온의 농도가 높을 경우 양극에 부동태 피막이 형성되어 양극 용해 및 통전성을 저하시키게 되며 부족하게 되면 석출얼룩이 발생한다. 본 발명에 의한 염소이온의 바람직한 사용범위는 5ppm∼120ppm이며 보다 바람직하게는 10ppm∼80ppm이다.Chlorine ions are used from sodium chloride and hydrochloric acid as materials which greatly affect the quality of plating. When the concentration of chlorine ions is high, a passivation film is formed on the anode, thereby degrading anode dissolution and conduction, and when insufficient, precipitation stain occurs. The preferable use range of chlorine ion by this invention is 5 ppm-120 ppm, More preferably, it is 10 ppm-80 ppm.

수용성 머캅토 유기 광택제는 전석반응을 촉진하는 작용을 가지고 있고 석출입자를 미세화하고 도금 피막에 광택성 및 유연성을 부여한다. 높은 농도로 첨가되었을 경우 홀 내부의 균일 전착성이 떨어지며 적은 농도로 첨가되었을 경우 PCB 표면이 매우 거칠다. 광택제 농도는 도금과정 중에 소모되므로 일정 양의 규칙적인 첨가를 수반하게 되는데 광택제의 첨가되는 양은 순환식 전압전류 스트리핑(CVS) 방법에 의해 쉽게 측정된다. 본 발명에 의한 효과적인 시스테인 유도체 황화합물 및 수용성 머캅토 유기 광택제의 종류와 동전해 용액 1리터를 기준으로 바람직한 사용범위는 N-에틸시스테인 0.001g∼2.0g, N-프로필시스테인 0.001g∼2.0g, N-이소프로필시스테인 0.001g∼3.0g, N-이소부틸시스테인 0.001g∼3.0g, N-시클로헥실시스테인 0.002g∼2.0g, N-(시클로헥실메틸)시스테인 0.001g∼2.0g, S-(터트-부틸티오)시스테인 0.001g∼1.0g, 시스테인 N-카르보디티오산 0.001g∼1.0g 이고 단독 혹은 복합적으로 사용되며 N,N-디메틸-디티오카바밀 프로필 설포닉산 0.001g∼1.0g, 비스-(소듐 설포프로필)-디설파이드 0.001g∼1.0g 이 단독 혹은 복합적으로 시스테인 유도체 황화합물과 함께 사용된다. 상기 언급된 수용성 머캅토 유기 광택제 중 시스테인을 출발물질로 하여 합성되어진 시스테인 유도체 수용성 머캅토 유기 광택제는 N-알킬(C1∼C5), N-디알킬(C1∼C5), N-이소알킬(C1∼C5), N-시클로알킬(C3∼C8)이 함유된 유도체들을 포함한다.The water-soluble mercapto organic brightener has the function of promoting the deposition reaction, miniaturizes the precipitated particles and imparts gloss and flexibility to the plating film. When added at a high concentration, the electrodepositability inside the hole is poor, and when added at a low concentration, the PCB surface is very rough. Since the concentration of the polish is consumed during the plating process, it is accompanied by a constant amount of regular addition. The amount of the polish is added easily by the cyclic voltammogram stripping (CVS) method. Effective cysteine derivatives according to the present invention, based on the type of sulfur compound and water-soluble mercapto organic brightener and 1 liter of coin solution, the preferred range of use is N-ethylcysteine 0.001g to 2.0g, N-propylcysteine 0.001g to 2.0g, N -Isopropyl cysteine 0.001 g to 3.0 g, N-isobutyl cysteine 0.001 g to 3.0 g, N-cyclohexylsteine 0.002 g to 2.0 g, N- (cyclohexylmethyl) cysteine 0.001 g to 2.0 g, S- ( Tert-butylthio) cysteine 0.001g-1.0g, cysteine N-carbodithioic acid 0.001g-1.0g, used alone or in combination, N, N-dimethyl-dithiocarbamyl propyl sulfonic acid 0.001g-1.0g, 0.001 g to 1.0 g of bis- (sodium sulfopropyl) -disulfide, alone or in combination, are used together with cysteine derivative sulfur compounds. Among the above-mentioned water-soluble mercapto organic brighteners, the cysteine derivative water-soluble mercapto organic brighteners synthesized using cysteine as a starting material are N-alkyl (C1-C5), N-dialkyl (C1-C5), and N-isoalkyl (C1). -C5), derivatives containing N-cycloalkyl (C3-C8).

캐리어와 습윤제는 염소이온과의 상호작용에 따라 음극계면에 단분자막을 형성하고 동의 석출을 폭넓게 억제한다. 높은 농도로 첨가되었을 경우 도금입자의 성장속도가 매우 느리며 낮은 농도로 첨가되었을 경우 도금 표면이 거칠며 피막 물성이 저하된다. 광택제의 성분과 농도에 따라 적절하게 조합되어 사용되어질 경우 광택 및 피막 물성이 좋으며 홀 내부 및 PCB 표면의 균일한 도금이 가능하다. 본 발명에 의한 효과적인 캐리어와 습윤제는 크로스링크 폴리아미드(Cross-linked polyamide, Mn=4,000∼40,000) 0.01g∼0.5g, 폴리비닐피롤리돈(Mn=10,000∼55,000) 0.01g∼2.0g, 폴리비닐 알코올(Mn=9,000∼200,000) 0.001g∼2.0g, 폴리에틸렌 글리콜(Mn=400∼45,000) 0.01g∼5.0g, 폴리알킬 베타-나프톨(Mn=10,000∼100,000) 0.001g∼0.1g 이고 단독 혹은 복합적으로 사용된다.Carriers and wetting agents form monomolecular films on the cathode interface as they interact with chlorine ions and broadly inhibit copper precipitation. When added at a high concentration, the growth rate of the plated particles is very slow. When added at a low concentration, the surface of the plating is rough and the film properties are degraded. When used in combination according to the composition and concentration of the varnish, the gloss and film properties are good and uniform plating of the inside of the hole and the PCB surface is possible. Effective carriers and wetting agents according to the invention are 0.01 g to 0.5 g of cross-linked polyamide (Mn = 4,000 to 40,000), 0.01 g to 2.0 g of polyvinylpyrrolidone (Mn = 10,000 to 55,000), poly 0.001 g to 2.0 g of vinyl alcohol (Mn = 9,000 to 200,000), 0.01 g to 5.0 g of polyethylene glycol (Mn = 400 to 45,000), 0.001 g to 0.1 g of polyalkyl beta-naphthol (Mn = 10,000 to 100,000), alone or Used in combination.

균염제와 미세화제는 불규칙한 피도금 물질의 표면 및 스루홀 내부에 균일 전착성을 높여주고 도금 피막의 평활성을 부여하고 광택의 향상을 제공한다. 높은 농도로 사용되었을 경우 PCB 표면에 얼룩이 발생하거나 도금되지 않는 부분 즉 무도금 부분이 생기며 적게 사용하였을 경우 균일 전착성과 PCB 표면의 평활성이 떨어진다. 본 발명에 의한 효과적인 균염제와 미세화제는 아세트아미드 0.01g∼1.0g. 설파닐아미드 0.01g∼1.0g, 디알릴아민 0.01g∼1.0g, 4-톨루엔설폰아미드 0.001g∼0.01g, 세틸트리메틸암모늄 클로라이드 0.001g∼0.3g, (3-클로로-2-히드록시프로필)트리메틸암모늄 클로라이드 0.001g∼0.3g, 옥틸트리메틸암모늄 클로라이드 0.001g∼0.3g, 폴리(디알릴디메틸암모늄 클로라이드) 0.01g∼0.5g, 벤질디메틸(2-히드록시에틸)암모늄 클로라이드 0.001g∼0.3g 이고 단독 혹은 복합적으로 사용된다.The leveling agent and the micronizing agent increase the uniform electrodeposition property on the surface of the irregular plating material and inside the through hole, impart the smoothness of the plating film and improve the gloss. When used in high concentration, the surface of PCB may be stained or unplated, that is, unplated. If used less, uniform electrodeposition and smoothness of PCB surface are reduced. Effective leveling agent and micronizing agent according to the present invention is acetamide 0.01g ~ 1.0g. 0.01 g to 1.0 g of sulfanylamide, 0.01 g to 1.0 g of diallylamine, 0.001 g to 0.01 g of 4-toluenesulfonamide, 0.001 g to 0.3 g of cetyltrimethylammonium chloride, (3-chloro-2-hydroxypropyl) Trimethylammonium chloride 0.001g to 0.3g, octyltrimethylammonium chloride 0.001g to 0.3g, poly (diallyldimethylammonium chloride) 0.01g to 0.5g, benzyldimethyl (2-hydroxyethyl) ammonium chloride 0.001g to 0.3g Used alone or in combination.

상기 전술한 본 발명의 PCB 스루홀 도금용 산성 동전해 용액의 조성물의 도금방법에 있어서는 피도금 물질을 동전해 용액에 침지시킨 후, 1.0A/d㎡∼4.0A/d㎡ 의 전류범위를 사용하고 작업온도는 20℃∼27℃의 온화한 범위에서 도금함으로써 욕의 긴 수명을 확보하고 광택 및 피막 물성이 우수하며, 특히 PCB 표면 및 스루홀의 균일 전착성이 매우 우수한 특성을 갖도록 하는 도금을 가능하게 하였다.In the plating method of the composition of the acidic anti-corrosive solution for PCB through-hole plating of the present invention described above, a current range of 1.0 A / dm 2 to 4.0 A / dm 2 is used after the material to be coated is immersed in the solution. In addition, by plating in the gentle range of 20 ℃ ~ 27 ℃, the long life of the bath is secured and the gloss and film properties are excellent. Especially, the plating is possible to have the excellent electrodeposition property of PCB surface and through hole. It was.

다음 실시예를 들어 본 발명을 좀 더 구체적으로 설명하는 바, 이에 본 발명의 범주가 실시예의 특별한 형태에 한정되는 것은 아니며 명백한 형태 및 변형을 포함하는 것으로 해석되어야 한다.The present invention will be described in more detail with reference to the following examples, which should not be construed as limiting the scope of the present invention to the specific forms of the examples but including obvious forms and modifications.

<실시예 1><Example 1>

아래 성분을 포함하는 동전해 도금액을 1리터 기준으로 제조한 다음, 양극은 0.03%∼0.06% 함인동 가용성 양극을 사용하고 2.0A/d㎡의 전류밀도와 실온(25℃)의 실험조건을 확립한 후 동전해 도금을 실시하여 인쇄회로기판 홀 내부의 도금된 상태 및 피도금 물질의 표면상태를 확인하였다.A 1 liter standard coin-coated solution containing the following components was prepared, and the anode was made of 0.03% to 0.06% copper-containing soluble anode, and the current density of 2.0 A / dm 2 and the experimental conditions of room temperature (25 ° C.) were established. After the coin plating, the plated state and the surface state of the material to be plated were confirmed.

성 분ingredient 함 량content 황산구리 5수화물Copper Sulfate Pentahydrate 75 g/L75 g / L 황산Sulfuric acid 95 ㎖/L95 ml / L 염소이온Chlorine Ion 40 ppm40 ppm N-시클로헥실시스테인N-cyclohexestein 0.01 g/L0.01 g / L S-(터트-부틸티오)시스테인S- (tert-butylthio) cysteine 0.001 g/L0.001 g / L 비스-(소듐 설포프로필)-디설파이드Bis- (sodium sulfopropyl) -disulfide 0.01 g/L0.01 g / L 폴리(디알릴디메틸암모늄 클로라이드)Poly (diallyldimethylammonium chloride) 0.1 g/L0.1 g / L 폴리비닐알코올Polyvinyl alcohol 0.1 g/L0.1 g / L

상기와 같은 조성에서 동전해 도금을 실시하여 PCB 표면의 광택 및 피막 물성이 우수하며 스루홀의 균일 전착성이 우수한 도금을 형성하였다.Coin plating was carried out in the composition as described above to form a plating excellent in the gloss and film properties of the PCB surface and excellent electrodeposition uniformity.

<실시예 2><Example 2>

아래 성분을 포함하는 동전해 도금액을 1리터 기준으로 제조한 후 실험조건을 실시예 1과 동일하게 실시한 다음, 인쇄회로기판 홀 내부의 도금된 상태 및 피도금 물질의 표면상태를 확인하였다.After the coin plating solution containing the following components were prepared on the basis of 1 liter, the experimental conditions were performed in the same manner as in Example 1, and then the plated state and the surface state of the plated material inside the printed circuit board hole were confirmed.

성 분ingredient 함 량content 황산구리 5수화물Copper Sulfate Pentahydrate 75 g/L75 g / L 황산Sulfuric acid 95 ㎖/L95 ml / L 염소이온Chlorine Ion 40 ppm40 ppm N-시클로헥실시스테인N-cyclohexestein 0.005 g/L0.005 g / L N,N-디메틸-디티오카바밀 프로필 설포닉산N, N-dimethyl-dithiocarbamyl propyl sulfonic acid 0.01 g/L0.01 g / L 폴리(디알릴디메틸암모늄 클로라이드)Poly (diallyldimethylammonium chloride) 0.1 g/L0.1 g / L 아세트아미드Acetamide 0.03 g/L0.03 g / L

상기와 같은 조성에서 동전해 도금을 실시하여 PCB 표면의 광택 및 피막 물성이 우수하며 스루홀의 균일 전착성이 우수한 도금을 형성하였다.Coin plating was carried out in the composition as described above to form a plating excellent in the gloss and film properties of the PCB surface and excellent electrodeposition uniformity.

<실시예 3><Example 3>

아래 성분을 포함하는 동전해 도금액을 1리터 기준으로 제조한 후 실험조건을 실시예 1과 동일하게 실시한 다음, 인쇄회로기판 홀 내부의 도금된 상태 및 피도금 물질의 표면상태를 확인하였다.After the coin plating solution containing the following components were prepared on the basis of 1 liter, the experimental conditions were performed in the same manner as in Example 1, and then the plated state and the surface state of the plated material inside the printed circuit board hole were confirmed.

성 분ingredient 함 량content 황산구리 5수화물Copper Sulfate Pentahydrate 85 g/L85 g / L 황산Sulfuric acid 100 ㎖/L100 ml / l 염소이온Chlorine Ion 40 ppm40 ppm N-이소프로필시스테인N-isopropylcysteine 0.005 g/L0.005 g / L 시스테인 N-카르보디티오산Cysteine N-carbodithioic acid 0.01 g/L0.01 g / L 비스-(소듐 설포프로필)-디설파이드Bis- (sodium sulfopropyl) -disulfide 0.01 g/L0.01 g / L 폴리(디알릴디메틸암모늄 클로라이드)Poly (diallyldimethylammonium chloride) 0.2 g/L0.2 g / L 디알릴아민Diallylamine 0.02 g/L0.02 g / L

상기와 같은 조성에서 동전해 도금을 실시하여 PCB 표면의 광택 및 피막 물성이 우수하며 스루홀의 균일 전착성이 우수한 도금을 형성하였다.Coin plating was carried out in the composition as described above to form a plating excellent in the gloss and film properties of the PCB surface and excellent electrodeposition uniformity.

본 발명에 따른 PCB 스루홀 도금용 산성 동전해 용액의 조성은 각각의 첨가제 성분 즉, 상기에 전술한 바와 같이 시스테인 유도체 물질을 포함하는 황화합물과 수용성 머캅토 유기 광택제, 캐리어와 습윤제, 균염제와 미세화제 화합물이 적어도 어느 한가지 이상씩 첨가되어 특정 조합되어 사용되어질 경우 피막 물성이 우수하고 PCB 표면 및 스루홀의 균일 전착성이 매우 우수한 도금특성을 얻을 수 있음을 확인할 수 있었다.The composition of the acidic anticorrosive solution for PCB through-hole plating according to the present invention is a sulfur compound containing a cysteine derivative material, a water-soluble mercapto organic brightener, a carrier and a wetting agent, a leveling agent and a fine agent, each of which contains an additive component, as described above. When the compound is added to at least one or more, and used in a specific combination, it was confirmed that the coating property is excellent and the plating property is excellent in the uniform electrodeposition property of the PCB surface and the through hole.

상기 전술한 바와 같이 본 발명에 의한 PCB 스루홀 도금용 산성 동전해 용액의 조성물은 유기합성에 의한 시스테인 유도체 황화합물 유기 광택제로 구성되어 긴 욕 수명을 가지며 광택 및 피막 물성이 우수하며, 특히 PCB 표면 및 스루홀의 균일 전착성이 매우 우수한 도금특성을 갖도록 함으로써 제품의 품질 및 신뢰성이 향상된 고밀도화 및 다층화된 인쇄회로기판 소재제품을 얻는데 매우 유용하게 사용될 수 있다.As described above, the composition of the acidic anticorrosive solution for PCB through hole plating according to the present invention is composed of a cysteine derivative sulfur compound organic polish agent by organic synthesis, which has a long bath life, and has excellent gloss and film properties. Since the uniform electrodeposition property of the through hole has a very excellent plating property, it can be very useful for obtaining a high density and multilayered printed circuit board material product having improved product quality and reliability.

Claims (3)

산과 구리염 및 염소이온, 시스테인 유도체 황화합물 및 수용성 머캅토 유기 광택제, 캐리어 및 습윤제, 균염제 및 미세화제를 포함하는 동전해 도금액의 조성물로서, 시스테인 유도체 황화합물 및 수용성 머캅토 유기 광택제 화합물군에 해당되는 화합물의 동전해 도금액 1리터 기준으로 함량이 N-에틸시스테인 0.001g∼2.0g, N-프로필시스테인 0.001g∼2.0g, N-이소프로필시스테인 0.001g∼3.0g, N-이소부틸시스테인 0.001g∼3.0g, N-시클로헥실시스테인 0.002g∼2.0g, N-(시클로헥실메틸)시스테인 0.001g∼2.0g, S-(터트-부틸티오)시스테인 0.001g∼1.0g, 시스테인 N-카르보디티오산 0.001g∼1.0g 의 화합물군에서 적어도 한 가지 이상씩 조합되어 첨가되어지는 산성 동전해 도금 조성물.Acid and copper salts and chlorine ions, cysteine derivative sulfur compounds and water-soluble mercapto organic brighteners, carriers and wetting agents, homogenizers and micronizing agents comprising a plating solution comprising a compound corresponding to the cysteine derivative sulfur compounds and water-soluble mercapto organic brightener compounds N-ethylcysteine 0.001g-2.0g, N-propylcysteine 0.001g-2.0g, N-isopropylcysteine 0.001g-3.0g, N-isobutylcysteine 0.001g-3.0 g, N-cyclohexylsteine 0.002g-2.0g, N- (cyclohexylmethyl) cysteine 0.001g-2.0g, S- (tert-butylthio) cysteine 0.001g-1.0g, cysteine N-carbodithioic acid An acidic coin plating composition to be added in combination of at least one or more of 0.001 g to 1.0 g of a compound group. 제 1 항에 있어서, 시스테인 유도체 수용성 머캅토 유기 광택제는 N-알킬(C1∼C5), N-디알킬(C1∼C5), N-이소알킬(C1∼C5), N-시클로알킬(C3∼C8)로 구성되어지는 산성 동전해 도금 조성물.The cysteine derivative water-soluble mercapto organic brightener according to claim 1, wherein the N-alkyl (C1-C5), N-dialkyl (C1-C5), N-isoalkyl (C1-C5), N-cycloalkyl (C3-- C8) an acidic coin plating composition. 제 1 항에 있어서, 균염제 및 미세화제 화합물군에 해당되는 화합물의 동전해 도금액 1리터 기준으로 함량이 아세트아미드 0.01g∼1.0g. 설파닐아미드 0.01g∼1.0g, 디알릴아민 0.01g∼1.0g, 4-톨루엔설폰아미드 0.001g∼0.01g, 세틸트리메틸암모늄 클로라이드 0.001g∼0.3g, (3-클로로-2-히드록시프로필)트리메틸암모늄 클로라이드 0.001g∼0.3g, 옥틸트리메틸암모늄 클로라이드 0.001g∼0.3g, 폴리(디알릴디메틸암모늄 클로라이드) 0.01g∼0.5g, 벤질디메틸(2-히드록시에틸)암모늄 클로라이드 0.001g∼0.3g 으로 구성되는 산성 동전해 도금 조성물.The method according to claim 1, wherein the content of acetamide is 0.01 g to 1.0 g based on 1 liter of the coin plating solution of the compound corresponding to the homogenizing agent and the micronizing agent compound group. 0.01 g to 1.0 g of sulfanylamide, 0.01 g to 1.0 g of diallylamine, 0.001 g to 0.01 g of 4-toluenesulfonamide, 0.001 g to 0.3 g of cetyltrimethylammonium chloride, (3-chloro-2-hydroxypropyl) Trimethylammonium chloride 0.001g to 0.3g, octyltrimethylammonium chloride 0.001g to 0.3g, poly (diallyldimethylammonium chloride) 0.01g to 0.5g, benzyldimethyl (2-hydroxyethyl) ammonium chloride 0.001g to 0.3g An acidic coin plating composition.
KR1020050082026A 2005-09-05 2005-09-05 Acid copper electroplating composition for plating through holes in printed circuit boards KR100711426B1 (en)

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KR20010074915A (en) * 1998-09-03 2001-08-09 마에다 시게루 Method for plating substrate and apparatus
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KR20010074915A (en) * 1998-09-03 2001-08-09 마에다 시게루 Method for plating substrate and apparatus
KR20010111590A (en) * 1999-04-26 2001-12-19 샬크비즈크 피이터 코르넬리스; 페트귄터 Composition comprising mercapto-functional compounds

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