KR100670240B1 - TDX Test Line Interface - Google Patents

Abstract

The present invention relates to a matching device that connects a test channel and a test bench of an electric switchboard to test a line subscribed to a TDX electric switchboard used in a telephone station at the same time by using one channel on several test benches. In this regard, the present invention relates to a TDX test bench matching device that allows multiple test benches to be operated simultaneously by using one test channel drawn out for the test of subscribing lines from an electronic switchboard, and to test a general circuit and an ISDN circuit simultaneously.

Test bench matching device

Description

TDX Test Line Interface             

1 is a block diagram showing the configuration of a TDX test bench matching device according to the present invention.

Figure 2 is a block diagram showing the configuration of the MCB board used in the TDX test bench matching device according to the present invention.

Figure 3 is a block diagram showing the configuration of a KIB card used in the TDX test bench matching device according to the present invention.

4 is a block diagram showing the configuration of a TIB used in a TDX test bench matching device according to the present invention.

<Description of the symbols for the main parts of the drawings>

1: matching device 2: TDX interface board

3: main control board 4: key-pad interface board

5: test bench 6: full interface logic

7,12, 18: control logic 8: post-interface logic

9: reset switch 10: CPU

11: memory 13: SIO

14, 19: interface logic 15: key-pad data processing unit

16: DTMF tone processing unit 17: status display unit

The present invention relates to a test bench for experimenting with lines joined to a TDX (Time Division Exchange, TDX) electronic exchanger and a matching device for connecting the electronic exchanger. The TDX test bench matching device connects the test channel drawn out from the electronic exchanger and the multiple test benches so that one test channel drawn out for the test can be connected to multiple test benches to simultaneously test a plurality of lines joined to the electronic exchanger. It is about.

Currently, there are three types of exchangers operating in Korea, which can be divided into electronic exchanger, inverter exchanger, and domestic TDX exchanger. As a result, the line test bench for maintenance of these devices is according to the type of exchanger installed. It is being used.

The present invention relates to a matching device used for a test bench for testing a subscriber line subscribed to a TDX switch, which is an electronic switch.

In general, a test bench is a device for receiving a failure report of a subscriber who is subscribed to various exchanges of a telephone station, and checking a subscriber's line and an abnormality of a telephone.

In order to connect the test bench to the TDX exchanger, a test equipment is connected to a terminal by connecting a TEC (Test Equipment Control, TEC) line drawn from the electronic switchboard to the test bench, and drawing one channel from the CPU of the electronic switchboard to the terminal. The test results were outputted on the monitor of the terminal or through a printer connected to the terminal.

The test bench was able to test all of the subscribing lines through one TEC line withdrawn from the exchange.

However, the test bench described above was able to test only one subscription line at a time because only one test bench was connected to one TEC line and one channel drawn from the CPU was connected to the terminal. Only information about was displayed. That is, when a large number of failure reports are received at the same time, there is a problem in taking immediate measures by simultaneously testing the faulty access lines.

Therefore, the present invention is to install a matching device that can be connected to a plurality of test benches at the same time to the TEC line and the channel connecting the electronic switch and the test bench in order to solve the above-described problems so as to test the multiple subscriber lines at the same time and confirm the results It aims to do it.

In order to achieve the above object, the present invention provides a matching device that connects a switch to which a plurality of subscribers are subscribed, and a test bench for testing a subscriber line subscribed to the switch, and is connected to one port drawn from the exchange. TDX Interface Board (TIB), which is divided into multiple ports, is connected to the TDX Interface Board, analyzes key data, sends subscriber number to TDX Switch, and analyzes data of TDX Switch. A plurality of main control boards (MCBs) for processing and capturing the resulting data to a terminal, and each of the main control boards and a plurality of test benches are connected one-to-one, and key-pad data ) And DTMF (Dual Tone Multi Frequency (DTMF)) tone data are collected, the subscriber line connection status is displayed, and the test bench is busy. The filter features a TDX test bench matching device that includes multiple Key-Pad Interface Bords (KIBs).

Hereinafter, with reference to the accompanying drawings will be described in detail the present invention.

1 shows a configuration of a TDX matching device according to the present invention, wherein the matching device 1 is a TIB 2 connected to one port of a TDX exchanger and a test table 5 connected to the TIB 2. A plurality of MCBs 3 for analyzing key data of the TDX exchange, sending subscriber numbers to the TDX exchange, analyzing and processing the data of the TDX exchange, and sending the result data captured by the test bench 5 to the terminal; It consists of a number of KIBs (4) that collect key-pad data and DTMF tone data, indicate subscriber line connectivity and indicate that the test bench is in use. That is, the matching device 1 of the present invention is composed of a TIB 2, a plurality of MCBs 3, and a plurality of KIBs 4, and thus, a plurality of test benches on the switchboard by one matching device 1. Multiple lines can be tested simultaneously by connecting (5).

In addition, the TIB (2) is configured as shown in Figure 2, the TIB (2) has a function of connecting the MCB (3) and the TDX exchange, that is, one port drawn from the exchange with a plurality of test benches In order to connect to a plurality of MCB (3). Accordingly, the TIB 2 collects and transmits a plurality of all-interface logics 6 for connecting one-to-one with a plurality of MCBs 3 and data of the plurality of all-interface logics 6. And the interface logic 8 after transmitting the data collected by the control logic 7 to the TDX exchange. The all interface logic 6 determines the data signal transmitted from the SIO unit 13 to the MCB 3, which will be described later, and transmits the data signal to the control logic 7, and determines the data signal transmitted from the control logic 7. To transfer the data to the SIO unit 13 of the MCB 3 described later. In addition, the control logic 7 determines the data signal received from the front and rear interface logic (6, 8) and transmits to the rear interface interface (8, 6). In addition, the post interface logic 8 transmits the data signal received from the control logic 7 to the TDX exchange, and transmits the data signal received from the TDX exchange to the control logic 7.

Next, as shown in FIG. 3, the plurality of MCBs 3 connected to the TIB 2 include the SIO unit 13, the control logic 12, the CPU 10, the memory 11, and a reset switch ( 10) and the interface logic 14, the reset switch 10 is automatically reset when the initial power is turned on to initialize the MCB, if the bad data is captured arbitrarily reset the reset switch 10 It can be initialized by pressing, the CPU 11 determines the signal received from the interface logic 14 connected to the KIB (4) and transmits it to the memory 11, and transmits the signal received from the memory 11 to the control logic ( 12 to the interface logic 14 to command the data to perform the functions of the control logic 12 and the interface logic 14, the memory 11 receives the signal transmitted from the CPU 10 Determine and transfer back to CPU 10 if necessary or control logic Send a signal to (12). In addition, the control logic unit 12 determines a signal received from the CPU 10 and sends a signal to the memory 11, and transmits a signal to the control logic unit 12, the SIO unit 13, and the interface logic unit 14 to each unit. Give a signal command to do the job in The SIO unit 13 determines a signal received from the control logic 12 to transmit a signal to the memory 11, receives a result, and transmits data to the interface logic 14 to perform a task. Data is transmitted, and the data received from each unit is determined and the data is sent to the VFD display. In addition, the interface logic 14 receives data from the KIB 4, transmits the data to the CPU 10 and the SIO unit 13, and transmits the result value back to the KIB 4 as data.

The KIB 4 connected to the interface logic 14 and the test bench 5 of the MCB 3 has an interface logic 19, a control logic 18, and a key pad data processor 15 as shown in FIG. 4. ), A DTMF tone processing unit 16 and a status display unit 17. The key-pad data processor 15 receives the key data provided by the operation of the pushbutton switch of the test bench, combines the data, and transmits the combined data to the interface logic 19. The DTMF tone processor 16 ) Receives data from the DTMF keypad of the test bench, combines the data, and transmits the combined result to the control logic 18. In addition, the interface logic 19 transmits the data received from the key pad data processing unit 15 and the control logic 18 to the MCB 3, the control logic 18 is the DTMF tone processing unit ( The data received from 16 is determined and transmitted to the interface logic 19 and the status display unit 17.

As described above, the present invention provides a test bench matching device composed of one TIB and a plurality of MCBs and KIBs, and is connected to the exchanges simultaneously by connecting a plurality of test benches using one test port withdrawn from the TDX exchanger. Several lines can be tested.

The present invention provides a test bench matching device capable of simultaneously connecting one test port drawn from an exchanger and several test benches as described above. As it can be checked, subscribers can immediately eliminate the difficulty caused by the line breakdown and can manage more lines with less manpower.

In addition, the matching device of the present invention can simultaneously test ISDN lines as well as general telephone lines held by TDX electronic switchboards.

Claims (4)

Claims [1] A test bench matching device for connecting a test platform for testing a subscriber line subscribed to a switch and a subscriber to which a plurality of subscribers are subscribed. A TDX interface board (TIB) connected to one TEC (Test Equipment Control) line drawn out from the exchanger and separated into a plurality of ports; A plurality of main control boards (MCBs) connected to the TDX interface board for analyzing key data, sending subscriber numbers to the TDX exchange, and analyzing and capturing data of the TDX exchange to test results; A plurality of key-pad interface boards (KIB) which connect each main control board and a plurality of test benches in a one-to-one manner and collect key-pad data and DTFM tone data to indicate a subscriber line connection status and a status of use of a test bench. TDX test bench matching device comprising a). The method of claim 1, The TDX interface board, After transmitting a plurality of all interface logic for one-to-one connection with a plurality of main control board, the control logic to collect and transmit the data of the plurality of all interface logic, and the aggregated data transmitted from the control logic to the TDX exchange TDX test bench matching device comprising interface logic. The method of claim 1, The main control board resets automatically when the initial power is turned on, and initializes the main control board. If a bad data is captured, a reset switch for initializing the main control board by arbitrarily operating the controller, and the key pad interface board. A CPU that determines a signal received from the interface logic connected to the memory and transmits the signal received from the memory to the control logic and the interface logic to command data to execute the control logic and the interface logic; Memory to determine the signal and send it back to the CPU or send the signal to the control logic and the signal received from the CPU to determine the signal sent to the memory and the signal to the SIO and interface logic to perform the work in each unit Enable signal instruction Transmits the command data to determine the control logic and the signal received from the control logic, transmits the signal to the memory, receives the result, and transmits the data to the interface logic to perform a job, and judges the data received from each unit. And SIO for transmitting data to the VFD display, and interface logic for receiving data from the key-pad interface logic, transmitting data to the CPU and SIO, and transmitting the result data back to the key-pad interface board. TDX test bench matching device. The method of claim 1, The key-pad interface board includes a key-pad data processing unit for receiving key data provided by an operation of a pushbutton switch of a test bench, combining the data, and transmitting a combined value to interface logic; and a DTMF key of the test bench. DTMF tone processing unit for receiving data from the pad, combining the data, and transmitting the combined result to control logic; interface logic for transmitting data received from the key-pad data processing unit and control logic to MCB; The roro logic includes a control logic for determining the data transmitted from the DTMF tone processing unit and transmitting the data to the interface logic and the status display unit, and a status display unit for receiving data from the control logic and displaying a test bench state. Test bench matching device.

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