KR100411753B1 - System for observing displacement of structure - Google Patents

System for observing displacement of structure Download PDF

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Publication number
KR100411753B1
KR100411753B1 KR1020030048921A KR20030048921A KR100411753B1 KR 100411753 B1 KR100411753 B1 KR 100411753B1 KR 1020030048921 A KR1020030048921 A KR 1020030048921A KR 20030048921 A KR20030048921 A KR 20030048921A KR 100411753 B1 KR100411753 B1 KR 100411753B1
Authority
KR
South Korea
Prior art keywords
target
coordinate
displacement
photographing
recognizing
Prior art date
Application number
KR1020030048921A
Other languages
Korean (ko)
Inventor
Ok Hwan Kim
Myoung Bae Kim
Jong Ho Park
Original Assignee
Myoung Bae Kim
Ok Hwan Kim
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Myoung Bae Kim, Ok Hwan Kim filed Critical Myoung Bae Kim
Priority to KR1020030048921A priority Critical patent/KR100411753B1/en
Application granted granted Critical
Publication of KR100411753B1 publication Critical patent/KR100411753B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • E—FIXED CONSTRUCTIONS
    • E02—HYDRAULIC ENGINEERING; FOUNDATIONS; SOIL SHIFTING
    • E02D—FOUNDATIONS; EXCAVATIONS; EMBANKMENTS; UNDERGROUND OR UNDERWATER STRUCTURES
    • E02D1/00—Investigation of foundation soil in situ
    • E02D1/08—Investigation of foundation soil in situ after finishing the foundation structure
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/0007—Image acquisition
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2215/00—Indexing scheme for image rendering
    • G06T2215/06—Curved planar reformation of 3D line structures

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Geometry (AREA)
  • Soil Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Mining & Mineral Resources (AREA)
  • Paleontology (AREA)
  • Civil Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Structural Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE: A system for observing the displacement of a structure is provided to remove analytic inconveniences for users by automatically recognizing a measurement point of left and right pictures for measuring the displacement and to use the system for the displacement analysis to a non-accessible region of a photogrammetry. CONSTITUTION: A system for observing the displacement of a photographed structure by photographing the surface of an object(20) to be measured is composed of at least two photographing devices(30) for photographing plural target points installed on the structure in the vertical and inclined directions; a threshold deciding device(41) for deciding a threshold by dividing the image photographed by the photographing device; a target recognizing device(42) for recognizing a target to the luminosity of one target based on the threshold; a coordinate value calculating device(43) for calculating a coordinate vale based on the target recognized by the target recognizing device; a coordinate system converting device(44) for converting the target coordinate value computed by the coordinate value calculating device into a picture coordinate system; and a positioning device(45) for deciding the 3D position of the structure to the coordinate converted by the coordinate system converting device.
KR1020030048921A 2003-07-16 2003-07-16 System for observing displacement of structure KR100411753B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020030048921A KR100411753B1 (en) 2003-07-16 2003-07-16 System for observing displacement of structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020030048921A KR100411753B1 (en) 2003-07-16 2003-07-16 System for observing displacement of structure

Publications (1)

Publication Number Publication Date
KR100411753B1 true KR100411753B1 (en) 2003-12-18

Family

ID=37422916

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020030048921A KR100411753B1 (en) 2003-07-16 2003-07-16 System for observing displacement of structure

Country Status (1)

Country Link
KR (1) KR100411753B1 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100726009B1 (en) 2006-10-13 2007-06-08 최성환 System and method for measuring displacement of structure
KR101007984B1 (en) 2010-12-10 2011-01-19 윤홍식 Apparatus and method for measuring horizontal and vertical vibration and deflection of transmission line
KR101101739B1 (en) 2009-12-22 2012-01-05 (주)이오시스템 Device and method for measuring distance
KR101203810B1 (en) * 2011-12-16 2012-11-22 박찬홍 Nuclear fuel center point measurement Method using Image measurement technology
KR101271688B1 (en) 2011-11-03 2013-06-05 삼성중공업 주식회사 Device and method for measuring motion of floating dock
KR101454846B1 (en) * 2013-03-08 2014-10-30 삼성중공업 주식회사 Apparatus and method for analyzing straightness of structure
KR101796129B1 (en) 2013-07-18 2017-11-10 내셔날 인스티튜트 오브 어드밴스드 인더스트리얼 사이언스 앤드 테크놀로지 Method and device for measuring displacement distribution using regular pattern, and program for such method and device
KR20230094041A (en) 2021-12-20 2023-06-27 (주)한국아이티에스 Structure status diagnosis device using image information and sensors

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100726009B1 (en) 2006-10-13 2007-06-08 최성환 System and method for measuring displacement of structure
KR101101739B1 (en) 2009-12-22 2012-01-05 (주)이오시스템 Device and method for measuring distance
KR101007984B1 (en) 2010-12-10 2011-01-19 윤홍식 Apparatus and method for measuring horizontal and vertical vibration and deflection of transmission line
KR101271688B1 (en) 2011-11-03 2013-06-05 삼성중공업 주식회사 Device and method for measuring motion of floating dock
KR101203810B1 (en) * 2011-12-16 2012-11-22 박찬홍 Nuclear fuel center point measurement Method using Image measurement technology
KR101454846B1 (en) * 2013-03-08 2014-10-30 삼성중공업 주식회사 Apparatus and method for analyzing straightness of structure
KR101796129B1 (en) 2013-07-18 2017-11-10 내셔날 인스티튜트 오브 어드밴스드 인더스트리얼 사이언스 앤드 테크놀로지 Method and device for measuring displacement distribution using regular pattern, and program for such method and device
KR20230094041A (en) 2021-12-20 2023-06-27 (주)한국아이티에스 Structure status diagnosis device using image information and sensors

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