KR100367843B1 - Small punch creep test device with small specimen - Google Patents

Abstract

The present invention is to study and evaluate the material deterioration of the mechanical properties due to the systematic change of various metals due to high temperature and stress, the micro test piece can be obtained to prevent the oxidation of the micro test piece completely to obtain a more accurate experimental value Provided is a small punch creep test apparatus.

The creep test apparatus includes upper and lower fasteners 10 and 11 for applying a load to micro test pieces; A small punch jig 21 for contacting the upper and lower fasteners 10 and 11 to transfer the load to the micro test piece and to fix the micro test piece; A crystal tube 32 surrounding the small punch jig 21 to block contact with the atmosphere; An inert gas injection steel pipe 36 for injecting an inert gas from which oxygen and moisture have been removed to prevent oxidation of the micro test piece in the crystal tube 32; A high frequency heating device (48) for maintaining the inside of the crystal tube (32) at a constant temperature; And a thermocouple insertion steel tube 34 into which a thermocouple for measuring a temperature around the micro test piece in the crystal tube is inserted. It consists of.

Description

Small punch creep test device with small specimen

The present invention relates to a small punch creep test apparatus using a micro test piece,

More specifically, in studying and evaluating the material deterioration of mechanical properties due to the systematic change of various metals due to high temperature and stress, the micro test piece can be obtained more accurately because the oxidation of the micro test piece can be completely prevented. It relates to a small punch creep test apparatus using.

Generally, when a certain stress or a certain load is applied to a material at a certain temperature, the deformation increases with time. This phenomenon is called 'creep' and is mainly a phenomenon at high temperature. In the study of the properties of the material, the room temperature test is completed in a short time, so that the effect of temperature, atmosphere, and pressure on the specimen can be almost neglected. For example, it is kept under a load of 100 to 200 kg / cm 2 at a temperature of about 500 ° C. for as short as tens of hours to hundreds of hours.

In order to perform such creep test, in general, a tensile tester or a creep tester is generally used. A heating furnace or a high frequency heating apparatus is used as a heating apparatus for fixing a specimen to a specimen fixture that is subjected to a load so that a constant stress or load is applied, and raising and maintaining it at a constant temperature. When the specimen is exposed to high temperature for a long time, oxidation occurs more easily than at room temperature by oxygen and moisture in the atmosphere, and the scale of oxidation is generated on the surface or wavefront of the specimen. This makes it impossible to observe the wavefront or the tissue, and the effect of the experiment is lost. Therefore, in order to prevent such oxidation, a method of sealing the furnace and injecting an inert gas or using a furnace in a vacuum state is adopted.

However, there are various problems with this conventional method. It is very difficult to seal the furnace, and in order to prevent oxidation, inert gas such as argon or nitrogen is injected to prevent contact with the atmosphere, but the inert gas contains moisture except high purity gas, so that oxidation is completely prevented. There is a problem that cannot be prevented.

In addition, in order to maintain the vacuum state, various facilities other than the vacuum pump are required, and thus the cost for the facility increases. Even in the case of using a general heating furnace or a vacuum heating furnace, a small amount of air and moisture are leaked, so that oxidation occurs, which causes a lot of difficulties in observing and analyzing the fracture surface or surface of the specimen.

Accordingly, the present invention has been invented to solve the above-described problems, and an object of the present invention is to prevent the micro test pieces from being exposed to the atmosphere and to contain the minute amount contained in the inert gas introduced into the crystal tube using oxygen and moisture remover. The present invention provides a small punch creep test apparatus using micro test pieces that can remove oxygen and moisture, thereby completely preventing oxidation of micro test pieces.

Another object of the present invention is to provide a small punch creep test apparatus using a micro test piece that can maintain a constant temperature by using a high frequency heating device and a thermocouple, and occupies a minimum space.

1 is a small punch creep test apparatus using a micro test piece according to the present invention

Conceptual diagram

2 is a small punch creep test apparatus using a micro test piece according to the present invention

Full assembly section

3 is a small punch creep test apparatus using a micro test piece according to the present invention

Parts and exploded views

4A to 4D are plan views of sealing and fixing plate parts applied to a small punch creep test apparatus using a micro test piece according to the present invention.

<Explanation of symbols for the main parts of the drawings>

10: upper fixture 11: lower fixture

12: upper sealing plate 13: lower sealing plate

14: upper fixing plate 15: lower fixing plate

16: upper fixing bolt 17: lower fixing bolt

18: upper teflon sealing ring 19: lower teflon sealing ring

20: support 21: small punch jig

22: upper rubber sealing ring 23: lower rubber sealing ring

24: Punch Press 26: Punch

28: micro test piece fixing cover 29: micro test piece fixing stand

30: micro test specimen holder base 32: quartz tube

34: thermocouple insertion steel pipe 36: inert gas injection steel pipe

38 connector 40 inert gas injection tube

42: upper fixing nut 44: height adjustment nut

46: lower adjustment nut 48: high frequency heating device

50: oxygen remover 52: moisture remover

This purpose is to provide a small punch creep test apparatus using micro test pieces to study the material degradation of mechanical properties due to the systematic change of various metals due to high temperature and stress.

Upper and lower fixtures for applying load to the micro test pieces; A small punch jig for contacting the upper and lower fasteners to transfer a load to the micro test piece and to fix the micro test piece; A quartz tube surrounding the small punch jig to block contact with the atmosphere; An inert gas injection steel pipe for injecting an inert gas into the crystal tube to prevent oxidation of the micro test piece; A high frequency heating device for maintaining the inside of the quartz tube at a constant temperature; And a thermocouple insertion steel tube into which a thermocouple for measuring a temperature around the micro test piece in the crystal tube is inserted. It can be achieved by a small punch creep test apparatus using a micro test piece, characterized in that it comprises a.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. Directional terms indicated in the following description are merely terms set when the front view of the accompanying drawings illustrating the present invention by way of example only, it will be apparent to those skilled in the art that the present invention is not limited by such directional terms. Will understand.

First, referring to Figure 1 showing the concept of a small punch creep test apparatus using a micro test piece according to a preferred embodiment of the present invention and Figure 2 showing the entire assembly cross-sectional view, the creep test apparatus according to the present invention is basically a micro test piece Upper and lower fasteners 10 and 11 that apply stress or load are included. A punch presser 24 is fitted to the upper fixture 10 to serve to apply stress or load to the micro test piece.

The micro test piece holder pedestal 30 is firmly installed on the lower fixture 11, and the lower sealing plate 13 communicates with the micro test piece holder pedestal 30 so as to be in contact with the upper surface of the lower fixture 11. . At this time, the lower rubber sealing ring 23 is inserted into the lower sealing plate 13 to serve to prevent leakage of the inert gas together with the micro test piece holder pedestal 30. The lower fixing plate 15 is fitted on the lower sealing plate 13 and fastened to each other by three lower fixing bolts 17.

In addition, in order to install the upper fixing plate 14, three supports 20 are installed in the holes of the three lower fixing plates 15 which are positioned at an angle of 120 °, and these three supports 20 are the lower fixing nuts 46. By the lower fixing plate 15 is fastened. Both sides of the support 20 can be fixed using a nut, and the upper thread is longer than the lower side, so that the gap between the upper fixing plate 14 and the lower fixing plate 15 is adjusted by the height adjusting nut 44. It is adjustable.

The upper sealing plate 12 is inserted into the upper surface of the upper fixing plate 14, which is fastened to each other by the upper fixing bolt (16). The upper sealing plate 12 and the upper fixing plate 14 thus assembled are inserted into the upper rubber sealing ring 22 inside the upper sealing plate 12 before being connected to the upper side of the three supports 20. It serves to prevent the leakage of gas, and the punch presser 24 assembled with the upper fixture 10, the upper sealing plate 12 and the upper fixing plate 14 should be fitted in communication.

On the other hand, the small punch jig 21 is a micro test piece is positioned on the micro test piece holder 29, the micro test piece is fixed with a micro test piece fixing cover 28, and then put a 2.4mm ball and punch 26 It is composed of a structure that is fitted into the groove. The small punch jig 21 configured as described above is fixed to the micro test piece holder pedestal 30.

The thermocouple insert steel pipe 34 is installed in communication with the lower sealing plate 13, and the thermocouple is inserted in close proximity to the micro test piece, and the end of the thermocouple insert steel pipe 34 is sealed with silicon. The thermocouple is connected to the connector 38 to facilitate the release of equipment connected to the thermocouple when the device is released. On the opposite side, an inert gas injection steel pipe 36 is installed in communication with the inert gas injection pipe 40 using the connector 38.

An oxygen remover 50 and a water remover 52 are installed in front of the inert gas injection tube 40 to completely remove oxygen and moisture contained in the argon gas, which is an inert gas, so that all of the oxidizing factors can be removed.

Now, the lower teflon sealing ring 19 is inserted into the lower sealing plate 13 and the quartz tube 32 is covered before covering the quartz tube 32 over the small punch jig 21. The upper teflon sealing ring 18 is inserted into the upper sealing plate 12, and the assembled upper fixture 10, the upper sealing plate 12, and the upper fixing plate 14 are provided with three supports 20 and the upper fixing plate 14. To match the three holes of), slowly lower the punch presser 24 to almost contact the punch 26 so that the quartz tube exactly matches the upper seal plate 12 and then secure the height adjustment nut 44. Tighten the upper fixing nut 42 to fix the whole device. The Teflon sealing rings 18 and 19 and the fertilization tube 32 exert some force to bring the elastic Teflon sealing ring and the fertilization tube into close contact.

The high frequency heating device 48 is located outside the quartz tube 32 as shown in FIG. 1 and the installation of the creep test device using the micro test piece is completed.

Hereinafter will be described in detail the operation and mode of operation of the small punch creep test apparatus using a micro test piece according to the present invention.

The experimenter first prepares a micro test piece of the material to be tested. The size of the micro test piece used for the small punch is 10mm × 10mm × 0.5mm in thickness or 6mm in diameter × 0.5mm in thickness. Place this micro test piece on the micro test piece holder 29 and cover it with the micro test piece fixing cover 28. Thereafter, the installation of the creep test apparatus according to the present invention is completed by the method described above.

Initially, air must exist in the crystal tube 32. In order to blow out the air, argon gas, which is an inert gas, is injected for a certain time to remove all the air before the experiment. Argon gas introduced into the crystal tube 32 is introduced into the crystal tube after the oxygen remover 50 and the water remover 52 throughout the experiment, it is possible to completely prevent the oxidation of the micro test piece even in a long time experiment.

The experimenter now applies the desired load to the micro test pieces in the small punch jig 21 with the upper and lower fixtures 10 and 11, and heats the inside of the quartz tube 32 using the high frequency heating device 48 to the desired experimental temperature. The temperature in the vicinity of the micro test piece in the crystal tube 32 can be determined by a thermocouple installed in close proximity to the micro test piece through the thermocouple insertion steel pipe 34.

In the case of the creep test performed at a very high temperature, a crystal tube 32 that can withstand high temperature is used, and a Teflon packing that can withstand high temperature is also made to seal the crystal tube 32 and the specimen fixture, and installed at the top and bottom to prevent leakage. You can prevent it.

As a result, according to the small punch creep test apparatus using the micro test piece according to the present invention, the micro test piece is sealed so as not to be exposed to the atmosphere, and the amount of the minute amount contained in the inert gas introduced into the crystal tube using the oxygen and water remover is used. Oxygen and water can be removed, which can completely prevent the oxidation of micro test pieces.

In addition, it is possible to maintain a constant temperature by using a high frequency heating device and a thermocouple, and to obtain a small punch creep test device using micro test pieces that occupy a minimum space.

While preferred embodiments of the present invention have been described above, it will be understood by those skilled in the art that various modifications and changes can be made without departing from the scope of the appended claims.

Claims (7)

delete An apparatus for carrying out creep test in which deformation increases with time when a constant load is applied under a constant temperature, the apparatus comprising: upper and lower fixtures 10 and 11 for applying a load to micro test pieces; A small punch jig 21 for contacting the upper and lower fasteners 10 and 11 to transfer the load to the micro test piece and to fix the micro test piece; A crystal tube 32 surrounding the small punch jig 21 to block contact with the atmosphere; An inert gas injection steel pipe 36 for injecting an inert gas from which oxygen and moisture have been removed to prevent oxidation of the micro test piece in the crystal tube 32; A high frequency heating device (48) for maintaining the inside of the crystal tube (32) at a constant temperature; And a thermocouple insertion steel tube 34 to which a thermocouple for measuring a temperature around the micro test piece in the crystal tube is attached and inserted. In the small punch creep test apparatus using a micro test piece comprising: The small punch jig 21 is a micro test piece is placed on the micro test piece holder 29 and the micro test piece is fixed by the micro test piece fixing cover 28, the 2.4mm ball is inserted into the hole 26 to be inserted into the groove. Small punch creep test apparatus using a micro test piece, characterized in that the structure, which is fixed on the micro test piece holder pedestal (30). delete delete delete delete According to claim 2, wherein the upper fixing plate 14, the upper portion of the insemination tube 32 communicates with the lower fixing plate 15, the lower portion of the insemination tube 32 communicates with each other by the height adjustment nuts (42, 44). Small punch creep test apparatus using a micro-test piece, characterized in that interconnected by the support 20 to adjust the spacing.