KR100347326B1 - Device and method for testing atm switch using oam cc test cell - Google Patents

Abstract

The present invention can be easily checked whether the ATM switching function and the line card are normally operated by applying the OAM CC function to the ATM switch test apparatus and method using the OMC CC test cell, and more particularly, the OAM CC function in the line-to-card switching test of the ATM switch system. The present invention relates to an ATM exchanger test apparatus and method using an OMC CC test cell, and an ATM exchanger test apparatus and method using an OAM CC test cell according to the present invention provides an OAM switching test for line-to-line switching of an ATM exchange system. By applying the CC function, it is possible to easily check the normal operation of the ATM switching function and the line card, thereby increasing the efficiency and convenience in operating the ATM switch.

Description

Atm exchanger test apparatus and method using an OMC CC test cell {DEVICE AND METHOD FOR TESTING ATM SWITCH USING OAM CC TEST CELL}

In the present invention, OAM (Operations and Maintenance; hereinafter referred to as "OAM") Continual Check (CC) referred to as "CC" AMT (Asynchronous Transfer Mode) using a test cell (hereinafter referred to as "ATM") .) The present invention relates to an apparatus and method for testing an exchange. More specifically, the OAM CC function is applied to a switching test between line cards of an ATM exchange system, and the ATM switching function and the line card are normally operated. The present invention relates to an ATM exchanger testing apparatus and method using an OAM CC test cell.

In general, the ATM switch is referred to as a Main CPU Module Unit (MCMU), which performs overall control functions such as a call processing control function, an operation management control function, and an alarm and status control function as shown in FIG. .)(One); A plurality of line cards 2 for performing a matching function with a plurality of ATM subscribers and other networks; And an ATM switch board 3 connected between the plurality of line cards 2 to perform a switching function of an ATM cell.

At this time, when the call setup process of the conventional ATM switch is described above, the MCMU 1 receives a call setup request from the terminal 4 at the time of call setup, and then a specific VCI / VPI (Virtual Circuit) is applied to the line card 2. Identical / Virtual Path Identical (hereinafter referred to as "VCI / VPI"). Only the data required for Call Setup, such as value, is transmitted to request path setting, and the line card 2 according to the set value. The ATM cell data from the terminal 4 is transmitted to the ATM switch board 3 or the ATM cell is received from the ATM switch board 3 and transmitted to the terminal 4.

However, the conventional ATM exchanger transmits to the terminal without checking whether the actual data area of the cell is damaged by VCI / VPI while passing through the ATM switch board. It was not possible to verify whether ATM cell transmission for a specific call setup was progressing without error, and it was possible to recognize through statistical data whether the ATM cell was discarded in error.

Therefore, it was not possible to easily check the normal operation of the ATM switching function and the line card in the related art. As a result, the efficiency and convenience of the operation of the ATM switch are not reduced, and the call between the specific line cards and the ATM switch board are damaged. There was a problem in that the quality of mobile communication service was deteriorated due to prolonged service interruption.

Accordingly, the present invention has been made to solve the above-mentioned conventional problems, and an object of the present invention is to enable the operator to easily check the normal operation of the ATM switching function and the line card, the efficiency of operating the ATM switch. And an ATM exchanger testing apparatus and method using an OMC CC test cell for increasing convenience.

In order to achieve the above object, the ATM exchanger test apparatus using the OAM CC test cell of the present invention comprises: an MCMU for performing overall control functions such as a call processing control function, an operation management control function, and an alarm and status control function; A plurality of line cards which perform a matching function with a plurality of ATM subscribers and other networks and simultaneously operate as a source line card or a target line card according to a user's selection when testing an ATM switch; And an ATM switch board connected between the plurality of line cards to perform a switching function of an ATM cell.

A dummy terminal configured to transmit an ATM switch test command when the operator inputs the same, while displaying the ATM switch test result to the operator;

Mounted in the MCMU and receiving an ATM switch test command from the dummy terminal, transmitting a call setup signal to the source line card and the target line card to proceed with call setup, and transmitting an ATM switch test request signal, A main processor for transmitting an ATM switch test result message from a line card to the dummy terminal;

Is installed in the source line card of the plurality of line cards, and after receiving the ATM switch test request signal after the call setup is under the control of the main processor to transmit the OAM CC test cell to the target line card through the ATM switch board On the other hand, when the OAM CC test cell retransmitted from the target line card is received through the ATM switch board, the OAM CC test cell passing through the target line card and the first OAM CC test cell are compared and examined to determine whether there is an abnormality. A source embedded processor for transmitting a result message to the main processor; And

A target embedded processor configured to be mounted in a target line card among the plurality of line cards and receive an OAM CC test cell transmitted from the source embedded processor through the ATM switch board, and then loop back to the source embedded processor; do.

In addition, the ATM switching test method using the OMC CC test cell of the present invention, the main processor is a first step of receiving an ATM switch test command including the ID information of the source line card and the target line card from the dummy terminal;

Transmitting, by the main processor, an ATM switch test request signal including call setup information to the source embedded processor after performing the call setup to the source embedded processor and the target embedded processor;

A third step of the source embedded processor receiving an ATM switch test request signal from the main processor and generating an OAM CC test cell including called point information and transmitting the same to an ATM switch board;

A fourth step of the ATM switch board receiving an OAM CC test cell from the source embedded processor and confirming an incoming point and then switching to the target embedded processor corresponding to the called point;

A fifth step of receiving, by the target embedded processor, an OAM CC test cell from the ATM switch board and looping back to the ATM switch board;

A sixth step of the ATM switch board receiving an OAM CC test cell from the target embedded processor and transmitting the received OAM CC test cell to the source embedded processor;

A seventh step of checking, by the source embedded processor, the OAM CC test cell that has passed through the target embedded processor to generate an ATM switch test result and then transmitting the result to the main processor; And

And an eighth step of the main processor receiving the ATM switch test result message from the source embedded processor and displaying the result to the operator through the dummy terminal.

1 is a functional block diagram showing the configuration of a general ATM switch;

2 is a functional block diagram showing the configuration of an ATM exchanger test apparatus using an OAM CC test cell according to an embodiment of the present invention;

3 is an operation flowchart showing an ATM exchanger test method using an OMC CC test cell according to an embodiment of the present invention;

4 is an operation flowchart showing the detailed operation of the second step (S2) in the ATM exchanger test method using the OAM CC test cell according to FIG.

5 is an operation flowchart showing a detailed operation of the third step (S3) in the ATM switch test method using the OAM CC test cell according to FIG.

6 is an operation flowchart showing a detailed operation of the fifth step (S5) in the ATM switch test method using the OAM CC test cell according to FIG.

7 is an operation flowchart showing a detailed operation of the seventh step (S7) in the ATM switch test method using the OAM CC test cell according to FIG.

8 is an operation flowchart showing the detailed operation of the eighth step (S8) in the ATM switch test method using the OAM CC test cell according to FIG.

FIG. 9 is a view illustrating a configuration of an OAM CC test cell generated by a source embedded processor in a third step S3 of an ATM exchanger test method using an OAM CC test cell according to FIG. 2;

FIG. 10 is a signal flowchart for explaining an ATM switch test method using an OAM CC test cell according to FIG. 2.

<Explanation of symbols for the main parts of the drawings>

100: dummy terminal 200: MCMU

210: main processor 300: line card

310: source line card 311: source embedded processor

320: target line card 321: target embedded processor

400: ATM Switch Board

Hereinafter, an ATM exchanger test apparatus and method using an OMC CC test cell according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings.

FIG. 2 is a functional block diagram of an ATM exchanger test apparatus using an OAM CC test cell according to an embodiment of the present invention, wherein the ATM exchanger test apparatus using an OAM CC test cell according to an embodiment of the present invention is a dummy terminal (Dumy). Terminal 100), MCMU 200, a plurality of line card 300, and ATM switch board 400.

The dummy terminal 100 transmits the ATM switch test command to the MCMU 200 when the operator inputs an ATM switch test command, and displays the result to the operator when receiving the ATM switch test result value from the MCMU 200. Do it.

In addition, the MCMU 200 is an apparatus that performs overall control functions of an ATM switch, such as a call processing control function, an operation management control function, and an alarm and state control function, and includes a main processor (MP) 210. Equipped.

In this case, the main processor 210 mounted in the MCMU 200 is a processor that performs the overall control function of the ATM exchanger. When the main switch 210 receives an ATM switch test command from the dummy terminal, the plurality of line cards 300 are used for testing. After the call setup signal is transmitted to the line card 300 to proceed with the call setup, the ATM switch test request signal is transmitted. When the ATM switch test result message is received from the test line card 300, the dummy terminal ( 100).

On the other hand, the plurality of line card 300 serves to perform a matching function with a plurality of ATM subscribers and other networks, and source line card having a source embedded processor 311 according to the operator's selection when testing the ATM switch (Source Line Card) 310, or a target line card (Target Line Card) 320 having a target embedded processor 321.

At this time, the source embedded processor 311 mounted in the source line card 310 receives the OAM CC test cell when the ATM switch test request signal is input after call setup is performed under the control of the main processor 210 during the ATM switch test. When the OAM CC test cell transmitted from the ATM switch board 400 to the target line card 320 and retransmitted from the target line card 320 is received through the ATM switch board 400, the first OAM is transmitted. After comparing the CC test cell and the OAM CC test cell passed through the target line card 320 to determine whether there is an abnormality, the result is to transmit a message to the main processor 210.

In addition, the target embedded processor 321 mounted in the target line card 320 receives an OAM CC test cell transmitted from the source embedded processor 311 through the ATM switch board 400 during an ATM switch test. It loops back to the source embedded processor 311.

On the other hand, the ATM switch board 400 is a board that is connected between the plurality of line cards 300, performs a switching function of the ATM cell.

Next, an ATM exchanger test method using an OMCC test cell according to an embodiment of the present invention using an ATM exchanger test apparatus using an OAM CC test cell having the above configuration will be described with reference to FIG. 10.

3 is an operation flowchart illustrating an ATM exchanger test method using an OMC CC test cell according to an embodiment of the present invention.

First, as shown in FIG. 10, the main processor 210 includes an ATM switch test command including identification information of the source line card 310 and the target line card 320 from the dummy terminal 100. Receive (S1).

Thereafter, the main processor 210 proceeds with call setup to the source embedded processor 311 and the target embedded processor 321, and then the ATM switch test request signal including the call setup information to the source embedded processor 311. Send (S2).

Hereinafter, a detailed operation process of the second step S2 will be described with reference to FIG. 4.

First, as shown in FIG. 10, the main processor 210 transmits a call setup signal to the source embedded processor 311 and the target embedded processor 321 (S2-1).

Thereafter, the main processor 210 determines whether a call setup response signal is received from the source embedded processor 311 and the target embedded processor 321 within a set time (S2-2).

At this time, if the call setup response signal is received within the set time from the source embedded processor 311 and the target embedded processor 321 in the second step (S2-2) as shown in FIG. 10 (YES). As illustrated in FIG. 10, the main processor 210 transmits an ATM switch test request signal including call setup information to the source embedded processor 311 (S2-3).

On the other hand, if the call setup response signal is not received within the set time from the source embedded processor 311 and the target embedded processor 321 in the second step (S2-2) (NO), the main processor 210 ) Outputs a message to the dummy terminal 100 indicating that the ATM test failed. Then, the dummy terminal 100 receives a message indicating that the ATM test failed from the main processor 210 and displays the test result value to the operator (S2-4).

In addition, after the above-described second step S2, the source embedded processor 311 receives an ATM switch test request signal from the main processor 210 and includes call destination information at the same time. After generating the OAM CC test cell and transmits to the ATM switch board 400 (S3). Here, as shown in FIG. 9, the OAM CC test cell 10 includes a destination point field 10a in which ID information of the target embedded processor 321, which is destination information, call setup data for the VC / VP, and the current. The header field 10b stores information indicating that data is an OAM CC test cell, and the data field 10c stores test checksum data.

Hereinafter, a detailed operation process of the third step S3 will be described with reference to FIG. 5.

First, as shown in FIG. 10, the source embedded processor 311 receives an ATM switch test request signal including call setup information from the main processor 210 (S3-1).

Thereafter, the source embedded processor 311 retrieves call setup data for the VC / VP stored in the ATM switch test request signal (S3-2).

Subsequently, the source embedded processor 311 determines whether call setup data for VC / VP exists in the ATM switch test request signal (S3-3).

At this time, if call setup data exists in the ATM switch test request signal (YES) in step 3-3 (S3-3), the source-embedded processor 311 receives the destination information as shown in FIG. After generating the OAM CC test cell 10 that includes the to transmit through the VC / VP channel to the ATM switch board 400 (S3-4).

On the other hand, if there is no call setup data in the ATM switch test request signal (NO) in step 3-3 (S3-3), the source embedded processor 311 informs that the ATM switch test has failed. After transmitting to the main processor 210, the process proceeds to step S8 (S3-5).

On the other hand, after the third step (S3) described above, the ATM switch board 400 receives the OAM CC test cell 10 from the source embedded processor 311 and at the same time confirms the destination, and then in FIG. As shown, the OAM CC test cell 10 is switched to the target embedded processor 321 corresponding to the called point (S4).

Then, the target embedded processor 321 receives the OAM CC test cell 10 from the ATM switch board 400 and simultaneously loops back to the ATM switch board 400 as shown in FIG. S5).

Hereinafter, a detailed operation process of the fifth step S5 will be described with reference to FIG. 6.

First, as shown in FIG. 10, the target embedded processor 321 receives the OAM CC test cell 10 from the ATM switch board 400 (S5-1).

Thereafter, the target embedded processor 321 retrieves call setup data for VC / VP using the information of the header field 10b in the OAM CC test cell 10 (S5-2).

Subsequently, the target embedded processor 321 determines whether call setup data for VC / VP exists in the header field 10b of the OAM CC test cell 10 (S5-3).

In this case, if call setup data for VC / VP exists in the header field 10b of the OAM CC test cell 10 in step S5-3 (YES), the target embedded processor 321 is present. As shown in FIG. 10, the OAM CC test cell 10 received from the ATM switch board 400 loops back to the ATM switch board 400 (S5-4).

On the other hand, if there is no call setup data for VC / VP in the header field 10b of the OAM CC test cell 10 in step S5-3 (NO), the target embedded processor 321 sends a result message to the source embedded processor 311 indicating that the ATM switch test failed. Then, the source embedded processor 311 receives a result message indicating that the ATM switch test failed from the target embedded processor 321 and transmits to the main processor 210, the main processor 210 is the ATM switch A test failure message is transmitted to the dummy terminal 100. The dummy terminal 100 receives a result message indicating that the ATM switch test has failed from the main processor 210 and displays the result message to the operator. Proceed to step 8 (S8) (S5-5).

In addition, after the above-described fifth step S5, the ATM switch board 400 receives the OAM CC test cell 10 from the target embedded processor 321 as shown in FIG. 10, and then embeds the source. The processor 311 transmits to the processor 311 (S6).

Then, the source embedded processor 311 checks the OAM CC test cell 10 that has passed through the target embedded processor 321, creates an ATM switch test result according to the result of the inspection, and as shown in FIG. 10. The main processor 210 transmits the data to the main processor 210 (S7).

Hereinafter, a detailed operation process of the seventh step S7 will be described with reference to FIG. 7.

First, the source embedded processor 311 determines whether the OAM CC test cell 10 looped back from the target embedded processor 321 has been received within a set time (S7-1).

In this case, when the OAM CC test cell 10 looped back from the target embedded processor 321 is received within the set time (YES) in step 7-1, the source embedded processor 311 may perform the operation. It is determined whether the OAM CC test cell 10 looped back from the target embedded processor 321 and the OAM CC test cell 10 before being transmitted are the same (S7-2).

If the OAM CC test cell 10 looped back from the target embedded processor 321 and the OAM CC test cell 10 before being transmitted are the same (YES) in step 7-2, the source. The embedded processor 311 transmits a result indicating that the ATM switch board 400 and each line card 300 is normal to the main processor 210 (S7-3).

However, if the OAM CC test cell 10 looped back from the target embedded processor 321 is not received within the set time (NO) in step 7-1 (S7-1), the source embedded processor 311 After transmitting a result message indicating that the ATM switch test failed to the main processor 210, the process proceeds to step S8 (S7-4).

Meanwhile, if the OAM CC test cell 10 looped back from the target embedded processor 321 and the OAM CC test cell 10 before being transmitted are not identical to each other (NO) in step 7-2 (S7-2). The source embedded processor 311 transmits a result indicating that the ATM switch board 400 and each line card 300 is abnormal to the main processor 210 and then proceeds to an eighth step S8 (S7). -5).

Then, after the above-described seventh step S7, the main processor 210 receives the ATM switch test result message from the source embedded processor 311 and transmits the result to the dummy terminal 100. Subsequently, the dummy terminal 100 receives an ATM switch test result message from the main processor 210 and displays the result to the operator (S8).

Hereinafter, a detailed operation process of the eighth step S8 will be described with reference to FIG. 8.

First, the main processor 210 determines whether an ATM switch test result message is received from the source embedded processor 311 within a set time (S8-1).

At this time, if the ATM switch test result message is received from the source embedded processor 311 within a set time in step 8-1 (S8-1) (YES), the main processor 210 the ATM switch test result message. Is output to the dummy terminal 100 as shown in FIG. Then, the dummy terminal 100 receives the ATM switch test result message from the main processor 210 and displays the result to the operator (S8-2).

On the other hand, if the ATM switch test result message is not received from the source embedded processor 311 within the set time in step 8-1 (S8-1) (NO), the main processor 210 is the ATM switch test is performed. A result message indicating that there is a failure is output to the dummy terminal 100. Then, the dummy terminal 100 receives a result message indicating that the ATM switch test failed from the main processor 210 and displays the result message to the operator (S8-3).

As described above, according to the ATM switch test apparatus and method using the OAM CC test cell according to the present invention, the ATM switching function and the line card are normally operated by applying the OAM CC function to the line card switching test of the ATM switch system. By making it easy to check, it has an excellent effect of increasing the efficiency and convenience of operating an ATM switch.

Claims (14)

An MCMU that performs overall control functions such as call processing control function, operation management control function, and alarm and status control function; A plurality of line cards which perform a matching function with a plurality of ATM subscribers and other networks and simultaneously operate as a source line card or a target line card according to an operator's selection when testing an ATM switch; And an ATM switch board connected between the plurality of line cards to perform a switching function of an ATM cell. A dummy terminal configured to transmit an ATM switch test command when the operator inputs the same, while displaying the ATM switch test result to the operator; Mounted in the MCMU and receiving an ATM switch test command from the dummy terminal, transmitting a call setup signal to the source line card and the target line card to proceed with call setup, and transmitting an ATM switch test request signal, A main processor for transmitting an ATM switch test result message from a line card to the dummy terminal; Is installed in the source line card of the plurality of line cards, and after receiving the ATM switch test request signal after the call setup is under the control of the main processor to transmit the OAM CC test cell to the target line card through the ATM switch board On the other hand, when the OAM CC test cell retransmitted from the target line card is received through the ATM switch board, the first OAM CC test cell is compared with the OAMCC test cell passing through the target line card to determine whether there is an abnormality, and as a result A source embedded processor for sending a message to the main processor; And A target embedded processor configured to be mounted in a target line card among the plurality of line cards and receive an OAM CC test cell transmitted from the source embedded processor through the ATM switch board, and then loop back to the source embedded processor; An ATM exchanger test apparatus using an OMC CC test cell. A first step of the main processor receiving an ATM switch test command including ID information of a source line card and a target line card from a dummy terminal; Transmitting, by the main processor, an ATM switch test request signal including call setup information to the source embedded processor after performing the call setup to the source embedded processor and the target embedded processor; A third step of the source embedded processor receiving an ATM switch test request signal from the main processor and generating an OAM CC test cell including called point information and transmitting the same to an ATM switch board; A fourth step of the ATM switch board receiving an OAM CC test cell from the source embedded processor and confirming an incoming point and then switching to the target embedded processor corresponding to the called point; A fifth step of receiving, by the target embedded processor, an OAM CC test cell from the ATM switch board and looping back to the ATM switch board; A sixth step of the ATM switch board receiving an OAM CC test cell from the target embedded processor and transmitting the received OAM CC test cell to the source embedded processor; A seventh step of checking, by the source embedded processor, the OAM CC test cell that has passed through the target embedded processor to generate an ATM switch test result and then transmitting the result to the main processor; And And an eighth step of displaying, by the main processor, an ATM switch test result message from the source embedded processor and displaying the result to an operator through the dummy terminal. The method of claim 2, The OAM CC test cell generated by the source embedded processor in the third step may include: an incoming point field in which ID information of the target embedded processor, which is called destination information, is stored; A header field in which call setup data for VC / VP and information indicating that current data is an OAM CC test cell; And An ATM exchange test method using an OAM CC test cell, comprising a data field in which test checksum data is stored. The method of claim 2, The second step may include: a second step of the main processor transmitting a call setup signal to the source embedded processor and the target embedded processor; Step 2-2 of the main processor determining whether a call setup response signal has been received from the source embedded processor and the target embedded processor within a set time; And In step 2-2, when the call setup response signal is received from the source embedded processor and the target embedded processor within a set time, the main processor transmits an ATM switch test request signal including call setup information to the source embedded processor. An ATM exchanger test method using an OAM CC test cell, comprising the steps of 2-3. The method of claim 4, wherein In step 2-2, if the call setup response signal is not received from the source embedded processor and the target embedded processor within a predetermined time, the main processor displays a message indicating that the ATM test has failed to the operator through the dummy terminal. An ATM exchanger testing method using an OAM CC test cell, further comprising steps 2-4. The method of claim 2, The third step may include: step 3-1, wherein the source embedded processor receives an ATM switch test request signal including call setup information from a main processor; Step 3-2, wherein the source embedded processor retrieves call setup data for VC / VP stored in an ATM switch test request signal; Step 3-3, wherein the source embedded processor determines whether call setup data for VC / VP exists in an ATM switch test request signal; And If call setup data is present in the ATM switch test request signal in step 3-3, the on-board processor generates an OAM CC test cell including called point information and then sends it to the ATM switch board through the VC / VP channel. An ATM exchanger testing method using an OMC CC test cell, comprising the steps of transmitting 3-4 steps. The method of claim 6, If call setup data does not exist in the ATM switch test request signal in step 3-3, the source-embedded processor transmits a result message indicating that the ATM switch test failed to the main processor, and then proceeds to step 8; An ATM exchange test method using an OMC CC test cell, further comprising steps 3-5. The method of claim 2, The fifth step may include: a fifth step of receiving, by the target embedded processor, an OAM CC test cell from the ATM switch board; Step 5-2 of the target embedded processor retrieving call setup data for VC / VP using information of a header field in the OAM CC test cell; Step 5-3 of the target embedded processor determining whether call setup data for VC / VP exists in a header field of the OAM CC test cell; And If call setup data for VC / VP exists in the header field of the OAM CC test cell in step 5-3, the target embedded processor returns the OAM CC test cell received from the ATM switch board to the ATM switch board. An ATM exchanger test method using an OAM CC test cell, comprising: a 5-4 step of looping back. The method of claim 8, If there is no call setup data for VC / VP in the header field of the OAM CC test cell in step 5-3, the target embedded processor sends a result message indicating that the ATM switch test failed through the source embedded processor. And a 5-5 step of transmitting to the main processor and proceeding to an eighth step. The method of claim 2, The seventh step may include: a seventh step, wherein the source embedded processor determines whether an OAM CC test cell looped back from the target embedded processor is received within a set time; When the OAM CC test cell looped back from the target embedded processor is received within the set time in step 7-1, the OAM CC test cell is transmitted before the source embedded processor is transmitted with the OAM CC test cell looped back from the target embedded processor. 7-2 step of determining whether or not the same; And In step 7-2, if the OAM CC test cell looped back from the target embedded processor and the OAM CC test cell before being transmitted are identical to each other, the source embedded processor returns a result value indicating that the ATM switch board and each line card are normal. An ATM exchanger test method using an OMC CC test cell, characterized in that the step 7-3 of transmitting to the main processor. The method of claim 10, If the OAM CC test cell looped back from the target embedded processor in the step 7-1 is not received within the set time, the source embedded processor sends a result message indicating that the ATM switch test has failed to the main processor and then the first processor. An ATM exchanger testing method using an OMC CC test cell, further comprising steps 7-4, which proceed to step 8. The method of claim 10, In step 7-2, if the OAM CC test cell looped back from the target embedded processor and the OAM CC test cell before being transmitted are not identical to each other, the source embedded processor indicates that the ATM switch board and each line card are abnormal. And a 7-7 step of proceeding to the eighth step after transmitting the to the main processor. The method of claim 2, The eighth step may include: an eighth step of the main processor determining whether an ATM switch test result message has been received from the source embedded processor within a set time; And In step 8-1, when the ATM switch test result message is received from the source embedded processor within the set time, the main processor displays the ATM switch test result message to the operator through the dummy terminal. An ATM exchanger test method using an OAM CC test cell. The method of claim 13, In step 8-1, if the ATM switch test result message is not received from the source embedded processor within a predetermined time period, the main processor displays a result message indicating that the ATM switch test has failed to the operator through the dummy terminal; -ATM exchanger test method using an OMC CC test cell, characterized in that it further comprises -3 steps.