KR100318932B1 - Apparatus for testing subscriber equipment of analog in exchange system - Google Patents

Abstract

end. FIELD OF THE INVENTION The invention described in the claims belongs to: Analog subscriber equipment testing apparatus of a switching system

I. The technical problem to be solved by the present invention is to provide an apparatus for reducing the inaccuracy and the time required for measurement caused by using a chip device suitable for individual tests in the conventional analog subscriber equipment test.

All. Summary of the Solution of the Invention: The In Out Test Module (IOTM) is a PBA belonging to the TEC block, which is a board for performing tests on the analog subscriber circuits and the lines and terminals, and the microprocessor for matching between the upper processor and the internal device chip. Built-in processor includes A / D converters for analog / digital or digital / analog matching, DSP circuits matching with A / D converters to generate analog signals or measuring analog signals, and In test tests It consists of an environmental configuration circuit for the out test, an environmental circuit for the out test test, a power source for the board, and a power supply for the out test.

la. Significant use of the invention: Applied to analog subscriber equipment testing apparatus.

Description

Equipment for testing analog subscriber equipment of exchange system {APPARATUS FOR TESTING SUBSCRIBER EQUIPMENT OF ANALOG IN EXCHANGE SYSTEM}

The present invention relates to a TEC block of an analog subscriber equipment test apparatus of an exchange system. In particular, the generation and measurement of all analog signals used in a TEC block test can be performed with a single DSP more accurately and in real time. It relates to a device for enabling.

In general, a switching system distributes and controls subscriber interfaces, trunk line interfaces, switching, management, and maintenance, and each distributed device performs its function and then transfers the results to other associated devices. Do it and send it. In the switching system using the distributed control scheme as described above, the subscriber interface device performs an interface function with a plurality of subscribers through the subscriber equipment. The switching system provides operator matching to test the transmission characteristics of the subscriber equipment and tests the transmission characteristics of the relay line according to the operator's command.

As a block for testing subscriber equipment in a switching system, the LTTM (Line and Trunk Test Management) block is a block that totally controls and manages operator demand tests for subscriber equipment, that is, analog subscriber test and digital subscriber test. Performs initialization status and state management functions for test equipment such as Test Equipment Control) and TTC (Trunk Test Control). The TEC block will be described above.

1 is a block diagram of a Test Equipment Control (TEC) in a subscriber equipment test apparatus of a conventional exchange system. Referring to FIG. 1, a TEC block includes a CPU 10, a tone generator 12, a tone detector 13, a frequency detector 14, a DTMF detector 15, and an A / D converter 16. Configure.

As described above, a plurality of chip devices, such as the tone generator 12, the tone detector 13, the frequency detector 14, and the DTMF detector 15, were used to meet the individual tests during the TEC block test. As a result, the measured value is not accurate and the system efficiency is lowered.

It is therefore an object of the present invention to provide an apparatus for reducing the inaccuracy of measurements occurring in the use of chip devices suitable for individual individual tests in analog subscriber equipment testing of switching systems.

In order to achieve the above object, the present invention is an IOTM (In Out Test Module) is a PBA belonging to the TEC block, the analog subscriber circuit as a PBA, a board for performing a test for the line and the terminal to match between the upper processor and the internal device chip Microprocessor is built-in, A / D converter for analog / digital or digital / analog matching, DSP circuit matching with A / D converter to generate analog signal or measuring analog signal, In test It consists of an environmental circuit for the test, an environmental circuit for the out test test, a power source for the board and a power supply for the out test.

As a result, during the test, the DSP circuit is used to measure and generate the signal, so that the measurement value is known with high accuracy and the DSP operation characteristic is nearly measured in real time.

1 is a block diagram of a test equipment control (TEC) in the analog subscriber equipment test apparatus of the conventional switching system

2 is a diagram illustrating a TEC block configuration and a test procedure in an analog subscriber equipment test apparatus according to an embodiment of the present invention.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the following description, specific details such as specific components are shown, which are provided to help a more general understanding of the present invention, and it is understood that these specific matters may be changed or modified within the scope of the present invention. It is self-evident to those of ordinary knowledge in

2 is a diagram illustrating a TEC block configuration and a test procedure in the apparatus for testing analog subscriber equipment according to an embodiment of the present invention. Referring to FIG. 2, an IOTM (In Out Test Module) is a PBA belonging to a TEC block, which is used for matching between an analog subscriber circuit, a board for performing tests on wires and terminals, and an upper processor 20 and an internal device chip. Built-in microprocessor for matching analog / digital or digital / analog matching with A / D converters (36, 38) and A / D converters (36, 38) to generate analog signals or to measure analog signals DSP circuit 34, configuration circuitry for in-test testing, configuration circuitry for out-test testing, power source (not shown) for power and out testing on board It is composed.

In FIG. 2 of the present invention, the upper processor 20 receives a test by a timer job of an operator or an upper processor and transfers the content to the CPU 32 through a predetermined path. The CPU 32 is a block for mode setting and measurement value format. The CPU 32 is a block for mode setting and measurement format, and the mode designation and address are set to match the DSP program with the contents provided from the upper processor 20. 34) (e.g. DSP 320C50).

DSP circuit 34 performs DSP program routines for each test mode and generates and measures analog signals. View the mode provided by the CPU 32 and go to the appropriate DSP program routine to measure the PCM data coming from the master and slave A / D converters 36 and 38 or to generate the PCM data and pass the master and slave through a preset path. To the A / D converters 36 and 38.

The master and slave A / D converters 36 and 38 convert this PCM data into an analog signal and send it to an external time slot 40 (Time slot). The signals necessary for the operation of the DSP circuit 34 are provided by the master and slave A / D converters 36 and 38, and the master and slave A / D converters 36 and 38 are interrupt signals and frame sinks and clocks. In addition, PCM data is provided through a previously provided path.

The value measured by the DSP circuit 34 is sent to the CPU 32 through a predetermined path, and the CPU 32 determines whether the upper processor 20 has an abnormality with the measured value provided by the DSP circuit 34. It is formatted so that it can be sent to the upper processor 20 through a predetermined path. The upper processor 20 finally allows the operator to recognize and thus all the tests are terminated.

The above configuration provides an analog subscriber equipment testing apparatus of an exchange according to a feature of the invention.

Meanwhile, in the above description of the present invention, specific embodiments have been described, but various modifications may be made without departing from the scope of the present invention. Therefore, the scope of the present invention should not be defined by the described embodiments, but by the equivalents of the claims and claims.

As described above, the IOTM according to the present invention is a PBA belonging to a TEC block, and a microprocessor is embedded for matching between an analog subscriber circuit, a board for testing wires and terminals, and an upper processor and an internal device chip. A / D converters for analog / digital or digital / analog matching, DSP circuits for generating analog signals or measuring analog signals by matching with A / D converters, and environmental circuits for in-test testing (Out) It consists of the environmental circuit for test test, the power supply in the board and the power supply for the out test, and it makes measurement and signal generation by using DSP circuit during test. Compared to the conventional test, the DSP operation characteristics are measured and generated in near real time. The inaccuracy can be prevented.

Claims (1)

In the analog subscriber equipment test apparatus of the switching system, An upper processor which transmits test contents of an operator or an upper processor to the microprocessor and allows the operator to recognize information provided from the microprocessor; A microprocessor for performing a corresponding test mode designation and address setting according to contents provided from the upper processor, converting information provided from a DS circuit, and providing the converted information to the upper processor; By performing the corresponding program routine according to the designated mode in the microprocessor, P. C. M data is generated, exported through the master and slave converters through a preset path, and P. C. M data input from the converter is measured. A DS circuit provided to the microprocessor, A master for converting the P.C.M data provided from the D.S.circuit into an analog signal and sending it to an external time slot, and converting a signal input from an external time slot to provide to the D.P. Device for testing analog subscriber equipment comprising a slave analog / digital converter.