KR100276381B1 - Bad key inspection and processing method of microwave oven - Google Patents

Abstract

The present invention relates to a method for inspecting and processing a bad key of a microwave oven. In the related art, when an arbitrary key is electrically shorted and an arbitrary key signal is continuously input to the microcomputer, the user may select another cooking function key for cooking. Even when pressing, the key signal was not recognized by the microcomputer and thus the function of the microwave could not be performed.

Therefore, the present invention has been made to solve such a problem that if any key is continuously pressed in the key matrix for a predetermined time, it indicates that the current key is in a short error state and induces a quick after-sales service as well as a short time. If the key does not function as a microwave oven, such as a clock adjustment key or a strong / low adjustment key, the microwave can be used through other cooking keys directly related to cooking. There is.

Description

Bad key inspection and processing method of microwave oven

The present invention relates to a method for inspecting and processing a bad key of a microwave oven, and more particularly, if any key is continuously pressed for a predetermined time in a key matrix, the current key is displayed as a short error state, and at this time, the shorted key is The simple function key relates to a method for inspecting and processing a bad key of a microwave oven that allows the microwave to be used through another key.

In general, a microwave oven has a key matrix 71 formed of a membrane switch as shown in FIG. 1, and sets a plurality of keys of the key matrix 71, so that various cooking functions are possible according to food types. And a cooking output and the like, and input a thawing function or automatic cooking function of food having a constant weight.

Here, the key matrix 71 is a key input means generally used for accommodating all cooking functions because there are many functions according to cooking in a microwave oven, as shown in FIG. A, B, C, and D) sequentially output high pulse signals, which allows the key input to be maintained for a certain time in order to accurately check a specific key input. Therefore, a predetermined signal is inputted to each input port (A ', B', C ', D') of the microcomputer 70, so that the microcomputer 70 receives a predetermined control signal according to the input signal. It outputs to the display part 72. Therefore, the display unit 72 displays the state according to the key input in the form of letters and numbers.

That is, when the user presses the switch S1 of the key matrix 71, the pulse signal output from the output port A is input only to the input port A 'via the diode D1. Therefore, since a data signal having a 4-bit form is input to the RAM, the microcomputer 70 recognizes the input key value and performs a control operation according to the corresponding key operation.

When diodes D1, D2, D3, and D4 are respectively provided between the key matrix 71 and the output ports A, B, C, and D of the microcomputer 70, when different keys are simultaneously pressed. It prevents short between grids.

However, such a microwave can prevent a short when a key between different grids is pressed simultaneously by a diode, which only prevents a short caused by a user's key manipulation mistake. If any key signal continues to be input to the microcomputer by pressing the key of, the microcomputer does not recognize the key signal at this time even if the user presses another cooking function key for cooking. There was a problem.

Therefore, the present invention has been made to solve such a problem that if any key is continuously pressed in the key matrix for a predetermined time, it indicates that the current key is in a short error state and induces a quick after-sales service as well as a short time. If the key does not function as a microwave oven, such as a clock adjustment key or a strong / low adjustment key, the microwave can be used through other cooking keys directly related to cooking to increase efficiency. It is an object of the present invention to provide a method for checking and processing a bad key of a microwave oven.

In order to achieve the above object, the present invention provides a bad key recognition step of recognizing a key input input through a key matrix as a bad key, and determining whether any key input is present after recognizing that any key is bad in this bad key recognition step. The key input determination step, and if the key input determination step judges that any key input is depressed, a schottky judgment step of determining whether the pressed key is a value ignored by the short, and the schottky judgment If it is determined in the step that the input value is determined to be a defective key that has already been ignored, the operation execution stop step of not performing an operation according to the key input and the defective key in which the input value has already been ignored as a result of the determination in the schottky determination step are If it is determined that the key is not determined, the key input sustain determination step of determining whether the input value is continuously pressed, and any key in this key input sustain determination step If it is determined that the value of the input RAM and the value of the stored RAM are the same, the key press time determination step of determining whether the predetermined time has elapsed by counting the time and the result of the key press time determination step are determined. If it is determined that the time is exceeded, the error display and the key input disregarding step, ignoring the current key input together with the error display, and the value of the input RAM and the stored RAM are determined by pressing any key as a result of the determination in the key input determining step. If it is determined that it is not the same, it is characterized in that the key operation performed step of newly storing the input key value and performing the corresponding operation.

1 illustrates a typical microwave membrane key matrix operation.

2 is a diagram showing timing for key input generally output from a port of a microcomputer.

3 is a block diagram of a microwave oven according to the present invention.

4 is a flowchart illustrating a method for checking a bad key according to a key scan according to the present invention.

5 is a flowchart illustrating a bad key processing method according to the present invention;

<Explanation of symbols for main parts of drawing>

1: key input 2: microcomputer

3: Display part 4: Power supply part

5: relay driving unit 6: high voltage transformer unit

7: magnetron

Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

Here, the configuration for explaining the bad key inspection and processing method according to the present invention is a key input unit (1) having a key matrix structure of a plurality of membrane switches as shown in Figure 3 and through the key input unit (1) The microcomputer 2 controls the overall operation of the microwave including the operation according to the bad key state by checking the input duration of the input key signal, and includes the bad state of the key input according to the control signal of the microcomputer 2. The display unit 3 for displaying the cooking state in the form of letters and numbers, a drive relay 5 for relay operation according to the control signal of the microcomputer 2, and a high voltage is applied by the contact operation of the drive relay 5. It consists of a high voltage transformer 6 for application to the cron 7.

The microcomputer 2 is connected to a power supply unit 4 for supplying a constant voltage through rectifying and smoothing a predetermined required power.

On the other hand, the operation according to the function key defect inspection and processing method in the microwave oven having such a configuration as follows.

First, the user sets and presses an arbitrary key through the key input unit 1 having a key matrix form in order to perform a cooking operation. For example, when the switch S2 of the key input unit 1 is pressed, the sequential pulse signal output from the output port B of the microcomputer 2 is input to the input port A 'through the diode D2. . Here, the microcomputer 2 stores a key signal inputted with a timer, a 4-bit first RAM 1, a second RAM 2, and the like, and checks the pressing duration of the corresponding key.

Therefore, when it is determined that the key signal input to the microcomputer 2 is a normal key input through the control operation, the microcomputer 2 applies each predetermined control signal to the display unit 3 and the driving relay 5. Therefore, the cooking operation state is displayed through the display unit 3, and the high-voltage voltage induced by the high-voltage transformer 6 by the contact operation of the driving relay 5 is applied to the magnetron 7. Therefore, it is possible to heat or cook the food in the interior by the ultra-high frequency output by the operation of the magnetron (7).

On the other hand, if any key of the key input unit 1 is continuously pressed due to a failure, the corresponding key signal is input to the microcomputer 2. At this time, the microcomputer 2 stores the current bad key in the third RAM RAM3 and ignores it without performing an operation even when the key signal is continuously input.

That is, when the time setting key, the thawing key or the cooking intensity control key except the key related to the minimum cooking operation is in a short state, the microcomputer 2 ignores these key input signals and performs the cooking operation through normal key input. It can be. In addition, in such a state, the normal key is selected through the key input unit 1 for the minimum cooking operation.

However, if the selected key is also pressed for a predetermined time, it is also determined that the key is in a short state, and the microcomputer 2 applies a predetermined control signal to the display unit 3 so that the display unit 3 displays characters for error display. The number is displayed and the input of the currently entered key is ignored.

That is, in the bad key checking method, as illustrated in FIG. 4, in the bad key recognition step S1 that recognizes a bad key input, an input key value storing step S2 is performed while a value corresponding to the bad key is stored in the third RAM. In step S3, the currently input key input signal is stored in the first RAM and the bad key input determination step S3 is performed. In this bad key input determination step (S3), if it is determined that the key input value input to the first ram is already ignored by the bad key previously stored in the third ram, the process proceeds to the operation stop step (S4) and is applied to the currently input key. Terminate this loop to perform the action accordingly.

In the bad key input determination step (S3), if it is determined that the key input value input to the first RAM is not a bad key previously stored in the third RAM (RAM3), the process proceeds to the key input sustain determination step (S5). Therefore, when it is determined in the key input sustain determination step (S5) that it is determined that the key is continuously pressed in the same way as the previously stored key value, the process proceeds to the key input time counter step (S8). Accordingly, in the key input time counter step S8, the count operation of the key signal that is being continuously pressed is performed every second by a timer not shown, and the counter time determination step S9 is performed. Therefore, if it is determined in the counter time determination step S9 that the current counter operation is A seconds or more, the process proceeds to the error display step S10. Here, A second set in the counter time determination step S9 is preferably set to 10 seconds or more as the minimum time for detecting a bad key.

In this error display step S10, it indicates that the currently input key is in an error state and proceeds to a bad key storing step S11. Therefore, in this bad key storing step S11, the bad key value stored in the second RAM is stored in the third RAM, and the process proceeds to the RAM erasing step S12 to erase the value stored in the second RAM and ends the present loop.

On the other hand, if it is determined in the key input sustain determination step (S5) that any key is pressed to determine that the value of the input RAM and the value of the stored RAM is not the same to proceed to the confirmation key storage step (S6). Therefore, in the confirmation key storing step S6, the previous key value determined as an arbitrary value is newly stored as the currently input key value, and the operation proceeds to the corresponding operation performing step S7 to erase the value stored in the first RAM, and the second. Performs the corresponding operation based on the value stored in RAM and ends this loop.

That is, in this operation, when the S4 switch of the key input unit 1 is normally set, a predetermined signal output through the output port D of the microcomputer 2 is input port A 'of the microcomputer 2. Is entered. Accordingly, this signal is stored in the first RAM RAM1 of the microcomputer 2 by the signal output from the output port D, and the 4-bit signal 1,0,0,0 is stored. And the value stored in the first RAM (RAM1) is compared with the value stored in the second RAM (RAM2) and if the two values are not the same value stored in the first RAM (RAM1) to the second RAM (RAM2) Simultaneously with storing, the stored value of the first RAM RAM1 is erased. (In this case, the value of the first RAM RAM1 is deleted to store key values sequentially input.)

On the other hand, if the S4 switch of the key input section 1 is set abnormally, that is, in a short state, the input port A 'of the microcomputer 2 continues to maintain a high state. As a result, the signal output through the output port D of the microcomputer 2 is input to the input port A 'due to the short of the S4 switch. At this time, the microcomputer 2 maintains the time at which the signal currently input to the input port A 'is set, and recognizes it as a defect and stores the value in the third RAM RAM3 of the microcomputer 2. At this time, if the S2 switch of the normal key input unit 1 is set, the microcomputer 2 judges the key signal output from the output port D as a bad key and ignores it, thus performing the cooking operation by the value input by the setting of the S2 switch. It is.

On the other hand, the inspection method according to the normal key input after checking the bad key in this way as follows.

First, the normal key recognition routine S13 proceeds to the bad key determination step S14, and if it is determined that a bad key has already been input, the process proceeds to the first input bad determination step S15. Therefore, when it is determined in the first input failure determination step S15 that the input key value corresponds to the first input, that is, when the input corresponding to the first bit of the first RAM is determined to be bad, the first erasure step ( Proceed to S16).

Therefore, in the first erasing step (S16), the value input as the second bit of the first RAM is cleared to zero, and the process proceeds to the corresponding key operation step (S22) to perform a cooking operation according to the normal key input, and performs this loop. Quit.

On the other hand, if it is determined in the first input failure determination step (S15) that the input key value does not correspond to the first input proceeds to the second input failure determination step (S17). Therefore, if it is determined that the input key value corresponds to the second input as a result of the determination in the second input failure determining step S17, that is, if the input corresponding to the second bit of the first RAM is determined to be defective, the second erasing step ( Proceed to S18).

Therefore, in the second erasing step S18, the value input as the second bit of the first RAM is cleared to zero and the process proceeds to the corresponding key operation step S22.

When it is determined that the input key value does not correspond to the second input, the process proceeds to the third input failure determination step S19. Therefore, the third input failure determination step S17 is performed. If it is determined in S19) that the input key value corresponds to the third input, that is, if the input corresponding to the third bit of the first RAM is determined to be defective, the process proceeds to the third erasing step (S20).

Therefore, in the third erasing step S20, the value input as the third bit of the first RAM is cleared to zero and the process proceeds to the corresponding key operation step S22.

If it is determined that the input key value does not correspond to the third input, the control unit proceeds to the fourth erasing step S21. Therefore, this fourth erasing step S21 clears the value input as the fourth bit of the first RAM to zero and proceeds to the corresponding key operation step S22.

As described above, the present invention determines that the current pressed key is a bad key if the input time exceeds a certain time when the key signal is continuously inputted when a key is continuously inputted in the key input unit consisting of a plurality of key metrics. It ignores and accepts signals from other normal keys to perform basic cooking functions, maximizing the utilization of the product according to the cooking operation, and promptly displaying when a key directly related to the cooking function is shortened so that the user can easily grasp the abnormality of the key matrix. You can receive after-sales service promptly.

Claims (2)

The bad key recognition step of determining whether the key signal input through the key matrix is already ignored, and if the key input in this bad key recognition step is determined to be a normal key, the currently input key value is the same as the previously stored key value. In the key input sustain determination step of determining whether the key is continuously pressed, and if it is determined that the input key value is not continuously pressed in the same way as the previously stored key value as a result of judging in the key input sustain determination step, the input key If it is determined that the key is continuously pressed in the same manner as the previously stored key value and the input key value storage step of newly storing the value as the currently input key value and erasing the previous value, and in the key input duration determination step. A counter time judging step of judging whether the key input duration at this time exceeds the set time; If it is determined that the counter time exceeds the set time, the defective key inspection method of the microwave oven comprising the input key error display and the input key erasing step of displaying the current input key as an error and erasing the stored key value. The first key is determined to be a bad key and the first key is determined to be a bad key, and the first key is determined to be bad. A first key input performing step of erasing a value and storing a normally input value; and a second key determining whether the second key is bad as it is determined that the first key is not bad as determined in the first bad key determination step. A second key input performing step of deleting a key value and storing a normally input value when the second key is determined to be bad as a result of the bad key determination step and the second bad key determination step, and storing the normally input value; As a result of the determination in the judgment step, it is determined that the second key is not bad, and thus, the third bad key judgment step of determining whether the third key is bad, and the third key is determined to be bad as a result of the third bad key judgment step.The third key input performing step of erasing the corresponding key value and storing the normally input value, and if it is determined that the third key is not bad as determined in the third bad key determination step, the fourth key value is erased and is normally input. And a fourth key input performing step of storing a value.