KR100229499B1 - Flatness measuring device - Google Patents

Abstract

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a plan view measuring device for accurately measuring a plan view of a base on which a plurality of pins are mounted. The present invention relates to a probe holder fixed in a suitable manner by bolts or welding on a plate, and mounted at one end of the probe holder. A probe head capable of vertically moving to inspect a two-dimensional plan view of the base and an air supply unit provided at the other end of the probe holder to provide air for vertical movement of the probe head can be used to accurately measure the plan view regardless of the thickness of the base. It can reduce the measurement time considerably and at the same time, it can check the whole product and improve the product quality and productivity.

Description

Floor Plan Measuring Device

The present invention relates to a measuring device for measuring a plan view of a base in which a plurality of pins are installed at right angles, and more particularly, to accurately measure a plan view of each base measuring part by mounting a bead on an upper portion of the probe head. A plan view measuring apparatus.

In general, the base of a video tape recorder is a jig of which a top surface is a horizontal plane in order to measure a plan view of a base for mounting a plurality of pins (for example, capstans, guide poles, etc.) at right angles as shown in FIG. jig (not shown) on a flat base, and then using a three-dimensional measuring instrument or other dial gauge to set a reference point on the base 10 plane, and then measure or dial the gauge in two dimensions, i.e., X and Y axes. It was measured while comparing the plan of the desired area while moving the horizontal.

However, it is difficult to accurately set the reference point when measuring the top view of the base 10 seated on the jig, and the measurement time is considerably longer because the reference plane of the base having a different thickness from the top view is measured. Not only full inspection is impossible, but also continuous data management is difficult, as well as the measurement reliability is low.

The present invention was created in order to solve such a conventional problem, and by placing the base on a cylindrical probe and measuring the flatness, precise flatness measurement is possible regardless of the thickness of the base. It is an object of the present invention to provide a planar measuring device capable of improving the quality and productivity of the product.

1 is a perspective view schematically showing the base of a typical video tape recorder.

2 is a side view of a plan view measuring apparatus according to the present invention for measuring a plan view of a base.

3 is an exemplary view showing an example of measuring the planar state of the base connected to the computer using the planar measuring device shown in FIG.

* Explanation of symbols for main parts of the drawings

10: base 20: plate

21: support 22: probe holder

22A: probe head 22B: probe

23: bolt 24A, 24B: air supply

25: lead wire outlet 26: auxiliary cover

30: table 40: frame

50: monitor

In order to achieve the above object, a plan view measuring device according to the present invention, a plan view measuring device for measuring a plan view of a base on which a plurality of pins are mounted, plate-shaped plate; A probe holder fixedly mounted on the plate; A probe probe head mounted at one end of the probe holder and installed to be movable vertically, and having a probe contacting the base at an end thereof; An air supply unit installed at the other end of the probe holder and supplying air to move the probe head vertically; Its features, including that.

Hereinafter, with reference to the accompanying drawings a preferred embodiment of the plan view measuring apparatus according to the present invention will be described in detail.

2 and 3, the support 21 is vertically mounted on the plate 20 by fixing means such as bolts 23 or welding.

On the upper side of the support 21, a probe holder 22 having about 11-17 probe heads 22A for measuring the top view of the base 10 is fixed by bolts 23, and the probe head ( 22A) is mounted with a probe 22B which is in contact with the plane of the base 10 and whose end is cylindrical.

The rear end of the probe holder 22 is provided with air supply parts 24A and 24B for supplying air so that the probe head 22A can be moved forward and backward in the vertical direction, and the base 10 measured by the probe 22B is provided. A lead wire outlet 25 is provided at the rear end of the probe holder 22 to provide a signal for a plan view of the control device, not shown.

The probe head 22A may be moved forward and backward into the probe holder 22, and an outer cover 26 formed of rubber is wrapped outside the probe head 22A to prevent foreign substances from penetrating.

In view of the operation state of the planar measuring device according to the present invention configured as described above, first, the probe head 22A of the planar measuring device shown in FIG. 2 is moved forward and backward to be adjusted to zero by a master gauge (not shown). Then, when the base 10 shown in FIG. 1 is placed on a supporting object (not shown), air is supplied to the air supply units 24A and 24B to provide the reference heads D1-D3 of the probe head 22A at the reference points D1-D3 of the base 10. The probe head 22A is advanced to abut on the top surface of the probe 22B.

At this time, when the probe 22B connected to the end of the probe head 22A is in contact with the plane of the base 10, the measured plane deviation becomes 0 when the plane of the base 10 is completely horizontal. Deviation values appearing when the plane thickness of the base 10 is different are provided to the control device to automatically calculate the degree of deviation.

Referring to FIG. 3, the plan view measuring device mounted on the plate 20 is installed on the table 30, and the monitor displaying the deviation degree of the base 10 on the separate frame 40. 50 is mounted to calculate the degree of deviation according to the thickness of the base 10, and if necessary, the deviation value of the plane of the base 10 read through the probe head 22A can be compared with a computer and output to a line printer. I did it.

Therefore, the base 10 is placed on the probe head 22A on which the probe 22B is mounted to check whether the planar state of the base 10 is constant. The plan view of the base 10 is simultaneously displayed on the monitor 50. It can be displayed.

As described above, according to the plan view measuring apparatus according to the present invention, the plan view of the base can be measured quickly and accurately by seating on 11-17 probe heads for one base plane, thereby improving product quality and productivity. It has an effect.

Claims (1)

A planar measuring device for measuring a planar view of a base on which a plurality of pins are mounted, comprising: a plate plate; A probe holder fixedly mounted on the plate; A probe probe head mounted at one end of the probe holder and installed to be movable vertically, and having a probe contacting the base at an end thereof; An air supply unit installed at the other end of the probe holder and supplying air to move the probe head vertically; Planar measuring apparatus characterized in that it comprises a.