JPWO2023282043A1 - - Google Patents

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Publication number
JPWO2023282043A1
JPWO2023282043A1 JP2022552999A JP2022552999A JPWO2023282043A1 JP WO2023282043 A1 JPWO2023282043 A1 JP WO2023282043A1 JP 2022552999 A JP2022552999 A JP 2022552999A JP 2022552999 A JP2022552999 A JP 2022552999A JP WO2023282043 A1 JPWO2023282043 A1 JP WO2023282043A1
Authority
JP
Japan
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Application number
JP2022552999A
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JP7459957B2 (ja
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Publication of JPWO2023282043A1 publication Critical patent/JPWO2023282043A1/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8883—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges involving the calculation of gauges, generating models
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/129—Using chemometrical methods
    • G01N2201/1296—Using chemometrical methods using neural networks

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
  • Signal Processing (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Artificial Intelligence (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
JP2022552999A 2021-07-08 2022-06-20 検査方法、分類方法、管理方法、鋼材の製造方法、学習モデルの生成方法、学習モデル、検査装置及び鋼材の製造設備 Active JP7459957B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021113864 2021-07-08
JP2021113864 2021-07-08
PCT/JP2022/024605 WO2023282043A1 (ja) 2021-07-08 2022-06-20 検査方法、分類方法、管理方法、鋼材の製造方法、学習モデルの生成方法、学習モデル、検査装置及び鋼材の製造設備

Publications (2)

Publication Number Publication Date
JPWO2023282043A1 true JPWO2023282043A1 (ja) 2023-01-12
JP7459957B2 JP7459957B2 (ja) 2024-04-02

Family

ID=84800209

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022552999A Active JP7459957B2 (ja) 2021-07-08 2022-06-20 検査方法、分類方法、管理方法、鋼材の製造方法、学習モデルの生成方法、学習モデル、検査装置及び鋼材の製造設備

Country Status (6)

Country Link
EP (1) EP4361615A1 (ja)
JP (1) JP7459957B2 (ja)
KR (1) KR20240008931A (ja)
CN (1) CN117597579A (ja)
BR (1) BR112023027343A2 (ja)
WO (1) WO2023282043A1 (ja)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010249624A (ja) * 2009-04-15 2010-11-04 Jfe Steel Corp 走行材の表面品質判定装置および表面品質判定方法
JP2011214903A (ja) * 2010-03-31 2011-10-27 Denso It Laboratory Inc 外観検査装置、外観検査用識別器の生成装置及び外観検査用識別器生成方法ならびに外観検査用識別器生成用コンピュータプログラム
KR20150074942A (ko) * 2013-12-24 2015-07-02 주식회사 포스코 스캡 결함 검출 장치 및 방법
WO2020175666A1 (ja) * 2019-02-28 2020-09-03 大日本印刷株式会社 カラーフィルタ検査装置、検査装置、カラーフィルタ検査方法および検査方法
CN111667465A (zh) * 2020-05-22 2020-09-15 广东顺德募优网络科技有限公司 一种基于远红外图像的金属洗手盆缺陷检测方法
JP2020187657A (ja) * 2019-05-16 2020-11-19 株式会社キーエンス 画像検査装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09257723A (ja) 1996-03-26 1997-10-03 Nkk Corp 表面検査装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010249624A (ja) * 2009-04-15 2010-11-04 Jfe Steel Corp 走行材の表面品質判定装置および表面品質判定方法
JP2011214903A (ja) * 2010-03-31 2011-10-27 Denso It Laboratory Inc 外観検査装置、外観検査用識別器の生成装置及び外観検査用識別器生成方法ならびに外観検査用識別器生成用コンピュータプログラム
KR20150074942A (ko) * 2013-12-24 2015-07-02 주식회사 포스코 스캡 결함 검출 장치 및 방법
WO2020175666A1 (ja) * 2019-02-28 2020-09-03 大日本印刷株式会社 カラーフィルタ検査装置、検査装置、カラーフィルタ検査方法および検査方法
JP2020187657A (ja) * 2019-05-16 2020-11-19 株式会社キーエンス 画像検査装置
CN111667465A (zh) * 2020-05-22 2020-09-15 广东顺德募优网络科技有限公司 一种基于远红外图像的金属洗手盆缺陷检测方法

Also Published As

Publication number Publication date
JP7459957B2 (ja) 2024-04-02
EP4361615A1 (en) 2024-05-01
CN117597579A (zh) 2024-02-23
KR20240008931A (ko) 2024-01-19
BR112023027343A2 (pt) 2024-03-12
WO2023282043A1 (ja) 2023-01-12

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