JPWO2023188493A1 - - Google Patents
Info
- Publication number
- JPWO2023188493A1 JPWO2023188493A1 JP2024511186A JP2024511186A JPWO2023188493A1 JP WO2023188493 A1 JPWO2023188493 A1 JP WO2023188493A1 JP 2024511186 A JP2024511186 A JP 2024511186A JP 2024511186 A JP2024511186 A JP 2024511186A JP WO2023188493 A1 JPWO2023188493 A1 JP WO2023188493A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/48—Thermography; Techniques using wholly visual means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q15/00—Automatic control or regulation of feed movement, cutting velocity or position of tool or work
- B23Q15/007—Automatic control or regulation of feed movement, cutting velocity or position of tool or work while the tool acts upon the workpiece
- B23Q15/18—Compensation of tool-deflection due to temperature or force
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Program-control systems
- G05B19/02—Program-control systems electric
- G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form
- G05B19/404—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form characterised by control arrangements for compensation, e.g. for backlash, overshoot, tool offset, tool wear, temperature, machine construction errors, load, inertia
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Program-control systems
- G05B19/02—Program-control systems electric
- G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form
- G05B19/4155—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of program data in numerical form characterised by program execution, i.e. part program or machine function execution, e.g. selection of a program
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
- G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/50—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Artificial Intelligence (AREA)
- Evolutionary Computation (AREA)
- Mathematical Physics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Human Computer Interaction (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022058096 | 2022-03-31 | ||
| PCT/JP2022/039832 WO2023188493A1 (ja) | 2022-03-31 | 2022-10-26 | 誤差解析方法、誤差解析装置およびプログラム |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2023188493A1 true JPWO2023188493A1 (https=) | 2023-10-05 |
Family
ID=88200615
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024511186A Ceased JPWO2023188493A1 (https=) | 2022-03-31 | 2022-10-26 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20250208613A1 (https=) |
| JP (1) | JPWO2023188493A1 (https=) |
| CN (1) | CN118872041A (https=) |
| WO (1) | WO2023188493A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7825793B1 (ja) * | 2024-09-27 | 2026-03-06 | 三菱電機株式会社 | 情報処理装置、産業システム、および工作機械の制御方法 |
| WO2026069990A1 (ja) * | 2024-09-27 | 2026-04-02 | 三菱電機株式会社 | 情報処理装置、産業システム、および工作機械の制御方法 |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006281420A (ja) * | 2005-04-05 | 2006-10-19 | Okuma Corp | Nc工作機械の熱変位補正方法 |
| US20160065901A1 (en) * | 2015-11-06 | 2016-03-03 | Caterpillar Inc. | Thermal pattern monitoring of machine |
| JP2019098439A (ja) * | 2017-11-30 | 2019-06-24 | ファナック株式会社 | 振動抑制装置 |
| JP2019111648A (ja) * | 2019-04-23 | 2019-07-11 | ファナック株式会社 | 機械学習装置及び熱変位補正装置 |
| JP6743238B1 (ja) * | 2019-04-23 | 2020-08-19 | Dmg森精機株式会社 | 工作機械における変動量推定装置、及び補正量算出装置 |
| CN111730602A (zh) * | 2020-07-20 | 2020-10-02 | 季华实验室 | 机械臂安全防护方法、装置、存储介质及电子设备 |
| JP2020187667A (ja) * | 2019-05-17 | 2020-11-19 | トヨタ自動車株式会社 | 情報処理装置及び情報処理方法 |
| US20210043484A1 (en) * | 2019-07-30 | 2021-02-11 | Brooks Automation, Inc. | Robot embedded vision apparatus |
-
2022
- 2022-10-26 JP JP2024511186A patent/JPWO2023188493A1/ja not_active Ceased
- 2022-10-26 WO PCT/JP2022/039832 patent/WO2023188493A1/ja not_active Ceased
- 2022-10-26 US US18/848,423 patent/US20250208613A1/en active Pending
- 2022-10-26 CN CN202280093603.3A patent/CN118872041A/zh active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006281420A (ja) * | 2005-04-05 | 2006-10-19 | Okuma Corp | Nc工作機械の熱変位補正方法 |
| US20160065901A1 (en) * | 2015-11-06 | 2016-03-03 | Caterpillar Inc. | Thermal pattern monitoring of machine |
| JP2019098439A (ja) * | 2017-11-30 | 2019-06-24 | ファナック株式会社 | 振動抑制装置 |
| JP2019111648A (ja) * | 2019-04-23 | 2019-07-11 | ファナック株式会社 | 機械学習装置及び熱変位補正装置 |
| JP6743238B1 (ja) * | 2019-04-23 | 2020-08-19 | Dmg森精機株式会社 | 工作機械における変動量推定装置、及び補正量算出装置 |
| JP2020187667A (ja) * | 2019-05-17 | 2020-11-19 | トヨタ自動車株式会社 | 情報処理装置及び情報処理方法 |
| US20210043484A1 (en) * | 2019-07-30 | 2021-02-11 | Brooks Automation, Inc. | Robot embedded vision apparatus |
| CN111730602A (zh) * | 2020-07-20 | 2020-10-02 | 季华实验室 | 机械臂安全防护方法、装置、存储介质及电子设备 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN118872041A (zh) | 2024-10-29 |
| WO2023188493A1 (ja) | 2023-10-05 |
| US20250208613A1 (en) | 2025-06-26 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20240628 |
|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20250715 |
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| A045 | Written measure of dismissal of application [lapsed due to lack of payment] |
Free format text: JAPANESE INTERMEDIATE CODE: A045 Effective date: 20251125 |