JPWO2023181668A1 - - Google Patents
Info
- Publication number
- JPWO2023181668A1 JPWO2023181668A1 JP2024509824A JP2024509824A JPWO2023181668A1 JP WO2023181668 A1 JPWO2023181668 A1 JP WO2023181668A1 JP 2024509824 A JP2024509824 A JP 2024509824A JP 2024509824 A JP2024509824 A JP 2024509824A JP WO2023181668 A1 JPWO2023181668 A1 JP WO2023181668A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/894—Pinholes
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022048524 | 2022-03-24 | ||
| PCT/JP2023/003797 WO2023181668A1 (ja) | 2022-03-24 | 2023-02-06 | 画像形成装置、画像形成方法、検査方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2023181668A1 true JPWO2023181668A1 (enrdf_load_stackoverflow) | 2023-09-28 |
Family
ID=88101116
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024509824A Pending JPWO2023181668A1 (enrdf_load_stackoverflow) | 2022-03-24 | 2023-02-06 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2023181668A1 (enrdf_load_stackoverflow) |
| WO (1) | WO2023181668A1 (enrdf_load_stackoverflow) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008070273A (ja) * | 2006-09-15 | 2008-03-27 | Ricoh Co Ltd | 表面欠陥検出装置及び表面欠陥検出方法 |
| JP2009098664A (ja) * | 2007-09-28 | 2009-05-07 | Fujifilm Corp | 光学補償フィルム、及びその製造方法、偏光板、並びに、液晶表示装置 |
| JP2010175281A (ja) * | 2009-01-27 | 2010-08-12 | Kokusai Gijutsu Kaihatsu Co Ltd | 外観面画像生成装置 |
| JP6956004B2 (ja) * | 2017-12-28 | 2021-10-27 | タカノ株式会社 | 欠陥検査装置、及び、欠陥検査装置の製造方法 |
-
2023
- 2023-02-06 WO PCT/JP2023/003797 patent/WO2023181668A1/ja active Application Filing
- 2023-02-06 JP JP2024509824A patent/JPWO2023181668A1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2023181668A1 (ja) | 2023-09-28 |