JPWO2023017611A1 - - Google Patents

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Publication number
JPWO2023017611A1
JPWO2023017611A1 JP2021572603A JP2021572603A JPWO2023017611A1 JP WO2023017611 A1 JPWO2023017611 A1 JP WO2023017611A1 JP 2021572603 A JP2021572603 A JP 2021572603A JP 2021572603 A JP2021572603 A JP 2021572603A JP WO2023017611 A1 JPWO2023017611 A1 JP WO2023017611A1
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JP
Japan
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Application number
JP2021572603A
Other versions
JP7034529B1 (ja
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Publication of JP7034529B1 publication Critical patent/JP7034529B1/ja
Publication of JPWO2023017611A1 publication Critical patent/JPWO2023017611A1/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2021572603A 2021-08-13 2021-08-13 学習モデルの生成方法、学習モデル、検査装置、検査方法およびコンピュータプログラム Active JP7034529B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/029791 WO2023017611A1 (ja) 2021-08-13 2021-08-13 学習モデルの生成方法、学習モデル、検査装置、検査方法およびコンピュータプログラム

Publications (2)

Publication Number Publication Date
JP7034529B1 JP7034529B1 (ja) 2022-03-14
JPWO2023017611A1 true JPWO2023017611A1 (ja) 2023-02-16

Family

ID=81213486

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021572603A Active JP7034529B1 (ja) 2021-08-13 2021-08-13 学習モデルの生成方法、学習モデル、検査装置、検査方法およびコンピュータプログラム

Country Status (3)

Country Link
JP (1) JP7034529B1 (ja)
CN (1) CN117813492A (ja)
WO (1) WO2023017611A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7517747B1 (ja) 2023-05-24 2024-07-17 株式会社桑原 服飾・雑貨用異物検知装置および異物検知システム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10672588B1 (en) * 2018-11-15 2020-06-02 Kla-Tencor Corporation Using deep learning based defect detection and classification schemes for pixel level image quantification
CN111382762A (zh) * 2018-12-28 2020-07-07 同方威视技术股份有限公司 空箱识别方法及系统
JP6749655B1 (ja) * 2019-03-19 2020-09-02 株式会社 システムスクエア 検査装置、異常検出方法、コンピュータプログラム、学習モデルの生成方法、及び学習モデル
JP6742037B1 (ja) * 2019-03-19 2020-08-19 株式会社 システムスクエア 学習モデルの生成方法、学習モデル、検査装置、異常検出方法、及びコンピュータプログラム
JP7250331B2 (ja) * 2019-07-05 2023-04-03 株式会社イシダ 画像生成装置、検査装置及び学習装置
GB2586858B (en) * 2019-09-06 2023-10-25 Smiths Heimann Sas Image retrieval system

Also Published As

Publication number Publication date
WO2023017611A1 (ja) 2023-02-16
JP7034529B1 (ja) 2022-03-14
CN117813492A (zh) 2024-04-02

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