JPWO2022249220A1 - - Google Patents

Info

Publication number
JPWO2022249220A1
JPWO2022249220A1 JP2023523705A JP2023523705A JPWO2022249220A1 JP WO2022249220 A1 JPWO2022249220 A1 JP WO2022249220A1 JP 2023523705 A JP2023523705 A JP 2023523705A JP 2023523705 A JP2023523705 A JP 2023523705A JP WO2022249220 A1 JPWO2022249220 A1 JP WO2022249220A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023523705A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022249220A1 publication Critical patent/JPWO2022249220A1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
JP2023523705A 2021-05-24 2021-05-24 Pending JPWO2022249220A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/019511 WO2022249220A1 (en) 2021-05-24 2021-05-24 Laminated substrate for soft error detection and soft error detection device

Publications (1)

Publication Number Publication Date
JPWO2022249220A1 true JPWO2022249220A1 (en) 2022-12-01

Family

ID=84229593

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023523705A Pending JPWO2022249220A1 (en) 2021-05-24 2021-05-24

Country Status (2)

Country Link
JP (1) JPWO2022249220A1 (en)
WO (1) WO2022249220A1 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59227156A (en) * 1983-06-07 1984-12-20 Sharp Corp Method for evaluation of soft error on semiconductor memory
US8756486B2 (en) * 2008-07-02 2014-06-17 Micron Technology, Inc. Method and apparatus for repairing high capacity/high bandwidth memory devices

Also Published As

Publication number Publication date
WO2022249220A1 (en) 2022-12-01

Similar Documents

Publication Publication Date Title
BR112023005462A2 (en)
BR112021014123A2 (en)
BR112023012656A2 (en)
BR112022024743A2 (en)
BR102021018859A2 (en)
BR112022009896A2 (en)
BR112023011738A2 (en)
BR112023016292A2 (en)
BR112023004146A2 (en)
BR112023011539A2 (en)
BR112023011610A2 (en)
BR112023008976A2 (en)
BR112023009656A2 (en)
BR112023006729A2 (en)
BR102021020147A2 (en)
BR102021018926A2 (en)
BR102021018167A2 (en)
BR102021017576A2 (en)
BR102021016837A2 (en)
BR102021016375A2 (en)
BR102021016200A2 (en)
BR102021016176A2 (en)
BR102021015566A2 (en)
BR102021015450A8 (en)
BR102021015500A2 (en)

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20231023