JPWO2022224653A1 - - Google Patents

Info

Publication number
JPWO2022224653A1
JPWO2022224653A1 JP2023516348A JP2023516348A JPWO2022224653A1 JP WO2022224653 A1 JPWO2022224653 A1 JP WO2022224653A1 JP 2023516348 A JP2023516348 A JP 2023516348A JP 2023516348 A JP2023516348 A JP 2023516348A JP WO2022224653 A1 JPWO2022224653 A1 JP WO2022224653A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023516348A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022224653A1 publication Critical patent/JPWO2022224653A1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/17Circuit arrangements not adapted to a particular type of detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36Measuring spectral distribution of X-rays or of nuclear radiation spectrometry

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
JP2023516348A 2021-04-19 2022-03-17 Pending JPWO2022224653A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021070605 2021-04-19
PCT/JP2022/012394 WO2022224653A1 (ja) 2021-04-19 2022-03-17 信号処理方法、コンピュータプログラム、信号処理装置、及び放射線検出装置

Publications (1)

Publication Number Publication Date
JPWO2022224653A1 true JPWO2022224653A1 (ja) 2022-10-27

Family

ID=83722885

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023516348A Pending JPWO2022224653A1 (ja) 2021-04-19 2022-03-17

Country Status (2)

Country Link
JP (1) JPWO2022224653A1 (ja)
WO (1) WO2022224653A1 (ja)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4692626A (en) * 1984-06-20 1987-09-08 Westphal Georg P Nuclear and X-ray spectrometry and low-pass filter and filtering method therefor
JPH0715501B2 (ja) * 1988-12-09 1995-02-22 松下電器産業株式会社 放射線測定装置
JP3332596B2 (ja) * 1994-09-02 2002-10-07 株式会社東芝 放射線測定装置
JP3907910B2 (ja) * 2000-03-28 2007-04-18 日本電子株式会社 エネルギー分散型スペクトロメータに用いられるデジタルパルス処理装置
JP4160275B2 (ja) * 2001-05-28 2008-10-01 浜松ホトニクス株式会社 エネルギー測定方法及び測定装置
JP5043728B2 (ja) * 2008-03-19 2012-10-10 日本電子株式会社 放射線計測用パルスプロセッサ
JP6159133B2 (ja) * 2013-04-23 2017-07-05 株式会社堀場製作所 放射線検出器、放射線検出方法及びコンピュータプログラム

Also Published As

Publication number Publication date
WO2022224653A1 (ja) 2022-10-27

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