JPWO2022138716A1 - - Google Patents

Info

Publication number
JPWO2022138716A1
JPWO2022138716A1 JP2022571550A JP2022571550A JPWO2022138716A1 JP WO2022138716 A1 JPWO2022138716 A1 JP WO2022138716A1 JP 2022571550 A JP2022571550 A JP 2022571550A JP 2022571550 A JP2022571550 A JP 2022571550A JP WO2022138716 A1 JPWO2022138716 A1 JP WO2022138716A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022571550A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022138716A1 publication Critical patent/JPWO2022138716A1/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02047—Interferometers characterised by particular imaging or detection techniques using digital holographic imaging, e.g. lensless phase imaging without hologram in the reference path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/021—Interferometers using holographic techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G01N21/453—Holographic interferometry
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/0005—Adaptation of holography to specific applications
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/04—Processes or apparatus for producing holograms
    • G03H1/0443—Digital holography, i.e. recording holograms with digital recording means
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/0005—Adaptation of holography to specific applications
    • G03H2001/0033—Adaptation of holography to specific applications in hologrammetry for measuring or analysing
    • G03H2001/0038—Adaptation of holography to specific applications in hologrammetry for measuring or analysing analogue or digital holobjects
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/04—Processes or apparatus for producing holograms
    • G03H1/0443—Digital holography, i.e. recording holograms with digital recording means
    • G03H2001/0445—Off-axis recording arrangement
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/04—Processes or apparatus for producing holograms
    • G03H1/0443—Digital holography, i.e. recording holograms with digital recording means
    • G03H2001/0447—In-line recording arrangement
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H1/00—Holographic processes or apparatus using light, infrared or ultraviolet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
    • G03H1/04—Processes or apparatus for producing holograms
    • G03H1/0443—Digital holography, i.e. recording holograms with digital recording means
    • G03H2001/045—Fourier or lensless Fourier arrangement
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H2222/00—Light sources or light beam properties
    • G03H2222/50—Geometrical property of the irradiating beam
    • G03H2222/52—Divergent beam
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03H—HOLOGRAPHIC PROCESSES OR APPARATUS
    • G03H2223/00—Optical components
    • G03H2223/12—Amplitude mask, e.g. diaphragm, Louver filter
JP2022571550A 2020-12-25 2021-12-22 Pending JPWO2022138716A1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/JP2020/048942 WO2022137560A1 (ja) 2020-12-25 2020-12-25 光学測定システムおよび光学測定方法
PCT/JP2021/047560 WO2022138716A1 (ja) 2020-12-25 2021-12-22 光学測定システムおよび光学測定方法

Publications (1)

Publication Number Publication Date
JPWO2022138716A1 true JPWO2022138716A1 (ja) 2022-06-30

Family

ID=82157948

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022571550A Pending JPWO2022138716A1 (ja) 2020-12-25 2021-12-22

Country Status (7)

Country Link
US (1) US20240045375A1 (ja)
EP (1) EP4269938A1 (ja)
JP (1) JPWO2022138716A1 (ja)
KR (1) KR20230123956A (ja)
CN (1) CN116685828A (ja)
TW (1) TW202232475A (ja)
WO (2) WO2022137560A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116793257B (zh) * 2023-08-28 2023-10-27 成都量芯集成科技有限公司 一种三维测量系统和方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7616320B2 (en) * 2006-03-15 2009-11-10 Bahram Javidi Method and apparatus for recognition of microorganisms using holographic microscopy
EP2592459B8 (en) 2010-07-07 2017-12-13 University of Hyogo Holographic microscope and method for processing microscopic subject hologram image
JP2012145361A (ja) * 2011-01-07 2012-08-02 Nikon Corp デジタルホログラフィ装置
JP6461601B2 (ja) 2012-10-05 2019-01-30 公立大学法人兵庫県立大学 ホログラフィック断層顕微鏡、ホログラフィック断層画像生成方法、およびホログラフィック断層画像用のデータ取得方法
JP6424313B2 (ja) 2013-10-28 2018-11-21 公立大学法人兵庫県立大学 ホログラフィック顕微鏡および高分解能ホログラム画像用のデータ処理方法
JP6670476B2 (ja) * 2016-08-04 2020-03-25 ウシオ電機株式会社 検出装置
EP3677969B1 (en) 2017-08-30 2023-05-10 University of Hyogo Holographic imaging device and data processing method therefor
KR20210049873A (ko) 2018-08-29 2021-05-06 코우리츠다이가쿠호우징 효고켄리츠다이가쿠 홀로그래픽 촬상 장치 및 홀로그래픽 촬상 방법
KR20210048528A (ko) 2018-08-29 2021-05-03 코우리츠다이가쿠호우징 효고켄리츠다이가쿠 표면 형상 계측 장치 및 표면 형상 계측 방법

Also Published As

Publication number Publication date
CN116685828A (zh) 2023-09-01
US20240045375A1 (en) 2024-02-08
WO2022137560A1 (ja) 2022-06-30
TW202232475A (zh) 2022-08-16
KR20230123956A (ko) 2023-08-24
EP4269938A1 (en) 2023-11-01
WO2022138716A1 (ja) 2022-06-30

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