JPWO2022131336A1 - - Google Patents
Info
- Publication number
- JPWO2022131336A1 JPWO2022131336A1 JP2022570058A JP2022570058A JPWO2022131336A1 JP WO2022131336 A1 JPWO2022131336 A1 JP WO2022131336A1 JP 2022570058 A JP2022570058 A JP 2022570058A JP 2022570058 A JP2022570058 A JP 2022570058A JP WO2022131336 A1 JPWO2022131336 A1 JP WO2022131336A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020209487 | 2020-12-17 | ||
| PCT/JP2021/046543 WO2022131336A1 (en) | 2020-12-17 | 2021-12-16 | Measurement condition search method, computer program, measurement condition search device, and measuring system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2022131336A1 true JPWO2022131336A1 (en) | 2022-06-23 |
Family
ID=82059497
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022570058A Pending JPWO2022131336A1 (en) | 2020-12-17 | 2021-12-16 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPWO2022131336A1 (en) |
| WO (1) | WO2022131336A1 (en) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002068963A1 (en) * | 2001-02-23 | 2002-09-06 | Hitachi, Ltd. | Analyzing system |
| JP4560503B2 (en) * | 2006-09-08 | 2010-10-13 | 株式会社堀場製作所 | Measuring time setting method and fluorescent X-ray analyzer in multi-condition fluorescent X-ray analysis |
| US20210089952A1 (en) * | 2018-06-19 | 2021-03-25 | Shimadzu Corporation | Parameter-searching method, parameter-searching device, and program for parameter search |
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2021
- 2021-12-16 WO PCT/JP2021/046543 patent/WO2022131336A1/en active Application Filing
- 2021-12-16 JP JP2022570058A patent/JPWO2022131336A1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2022131336A1 (en) | 2022-06-23 |