JPWO2022113934A1 - - Google Patents

Info

Publication number
JPWO2022113934A1
JPWO2022113934A1 JP2022565322A JP2022565322A JPWO2022113934A1 JP WO2022113934 A1 JPWO2022113934 A1 JP WO2022113934A1 JP 2022565322 A JP2022565322 A JP 2022565322A JP 2022565322 A JP2022565322 A JP 2022565322A JP WO2022113934 A1 JPWO2022113934 A1 JP WO2022113934A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022565322A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2022113934A1 publication Critical patent/JPWO2022113934A1/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2022565322A 2020-11-26 2021-11-22 Pending JPWO2022113934A1 (enrdf_load_stackoverflow)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2020196034 2020-11-26
JP2020196032 2020-11-26
JP2020196033 2020-11-26
PCT/JP2021/042806 WO2022113934A1 (ja) 2020-11-26 2021-11-22 表面粗さ測定装置、及び、表面粗さ測定方法

Publications (1)

Publication Number Publication Date
JPWO2022113934A1 true JPWO2022113934A1 (enrdf_load_stackoverflow) 2022-06-02

Family

ID=81754646

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022565322A Pending JPWO2022113934A1 (enrdf_load_stackoverflow) 2020-11-26 2021-11-22

Country Status (2)

Country Link
JP (1) JPWO2022113934A1 (enrdf_load_stackoverflow)
WO (1) WO2022113934A1 (enrdf_load_stackoverflow)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017101934A (ja) * 2015-11-30 2017-06-08 キヤノン株式会社 処理装置、処理システム、撮像装置、処理方法、処理プログラムおよび記録媒体
JP2018009927A (ja) * 2016-07-15 2018-01-18 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
CN108303045A (zh) * 2018-02-01 2018-07-20 北京科技大学 一种表面粗糙度测量方法与装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017101934A (ja) * 2015-11-30 2017-06-08 キヤノン株式会社 処理装置、処理システム、撮像装置、処理方法、処理プログラムおよび記録媒体
JP2018009927A (ja) * 2016-07-15 2018-01-18 キヤノン株式会社 画像処理装置、画像処理方法及びプログラム
CN108303045A (zh) * 2018-02-01 2018-07-20 北京科技大学 一种表面粗糙度测量方法与装置

Also Published As

Publication number Publication date
WO2022113934A1 (ja) 2022-06-02

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