JPWO2021250968A1 - - Google Patents

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Publication number
JPWO2021250968A1
JPWO2021250968A1 JP2022530032A JP2022530032A JPWO2021250968A1 JP WO2021250968 A1 JPWO2021250968 A1 JP WO2021250968A1 JP 2022530032 A JP2022530032 A JP 2022530032A JP 2022530032 A JP2022530032 A JP 2022530032A JP WO2021250968 A1 JPWO2021250968 A1 JP WO2021250968A1
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JP
Japan
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JP2022530032A
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Japanese (ja)
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JP7279860B2 (en
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G01N33/2045—Defects
JP2022530032A 2020-06-08 2021-03-17 Method for evaluating creep life of Ni alloy parts Active JP7279860B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020099195 2020-06-08
JP2020099195 2020-06-08
PCT/JP2021/010799 WO2021250968A1 (en) 2020-06-08 2021-03-17 Creep life evaluation method for nickel alloy component

Publications (2)

Publication Number Publication Date
JPWO2021250968A1 true JPWO2021250968A1 (en) 2021-12-16
JP7279860B2 JP7279860B2 (en) 2023-05-23

Family

ID=78845572

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022530032A Active JP7279860B2 (en) 2020-06-08 2021-03-17 Method for evaluating creep life of Ni alloy parts

Country Status (2)

Country Link
JP (1) JP7279860B2 (en)
WO (1) WO2021250968A1 (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005030846A (en) * 2003-07-10 2005-02-03 Sumitomo Chem Co Ltd Creep void detecting method
JP2011196925A (en) * 2010-03-23 2011-10-06 Ihi Corp Creep life evaluation method and creep life evaluation device
JP2014126442A (en) * 2012-12-26 2014-07-07 Chubu Electric Power Co Inc Nickel-based superalloy degradation diagnosis method
WO2015059815A1 (en) * 2013-10-25 2015-04-30 中国電力株式会社 Method for predicting creep residual life of product degraded by heat and pressure, and method for creating calibration curve used in the prediction method
JP2016045106A (en) * 2014-08-25 2016-04-04 三菱日立パワーシステムズ株式会社 Estimation method of working temperature of member, and estimation device of working temperature of member

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005030846A (en) * 2003-07-10 2005-02-03 Sumitomo Chem Co Ltd Creep void detecting method
JP2011196925A (en) * 2010-03-23 2011-10-06 Ihi Corp Creep life evaluation method and creep life evaluation device
JP2014126442A (en) * 2012-12-26 2014-07-07 Chubu Electric Power Co Inc Nickel-based superalloy degradation diagnosis method
WO2015059815A1 (en) * 2013-10-25 2015-04-30 中国電力株式会社 Method for predicting creep residual life of product degraded by heat and pressure, and method for creating calibration curve used in the prediction method
JP2016045106A (en) * 2014-08-25 2016-04-04 三菱日立パワーシステムズ株式会社 Estimation method of working temperature of member, and estimation device of working temperature of member

Also Published As

Publication number Publication date
WO2021250968A1 (en) 2021-12-16
JP7279860B2 (en) 2023-05-23

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