JPWO2021241232A1 - - Google Patents

Info

Publication number
JPWO2021241232A1
JPWO2021241232A1 JP2022526867A JP2022526867A JPWO2021241232A1 JP WO2021241232 A1 JPWO2021241232 A1 JP WO2021241232A1 JP 2022526867 A JP2022526867 A JP 2022526867A JP 2022526867 A JP2022526867 A JP 2022526867A JP WO2021241232 A1 JPWO2021241232 A1 JP WO2021241232A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022526867A
Other languages
Japanese (ja)
Other versions
JP7201129B2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021241232A1 publication Critical patent/JPWO2021241232A1/ja
Application granted granted Critical
Publication of JP7201129B2 publication Critical patent/JP7201129B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Measuring Leads Or Probes (AREA)
JP2022526867A 2020-05-28 2021-05-12 Probe and connector inspection device provided with the probe Active JP7201129B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020093583 2020-05-28
JP2020093583 2020-05-28
PCT/JP2021/018076 WO2021241232A1 (en) 2020-05-28 2021-05-12 Probe, and connector inspection device comprising probe

Publications (2)

Publication Number Publication Date
JPWO2021241232A1 true JPWO2021241232A1 (en) 2021-12-02
JP7201129B2 JP7201129B2 (en) 2023-01-10

Family

ID=78723377

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022526867A Active JP7201129B2 (en) 2020-05-28 2021-05-12 Probe and connector inspection device provided with the probe

Country Status (3)

Country Link
JP (1) JP7201129B2 (en)
CN (1) CN215833461U (en)
WO (1) WO2021241232A1 (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5524281A (en) * 1988-03-31 1996-06-04 Wiltron Company Apparatus and method for measuring the phase and magnitude of microwave signals
US20170003317A1 (en) * 2013-11-26 2017-01-05 Tyco Electronics Uk Ltd. Balunless test fixture
JP2018511058A (en) * 2015-04-08 2018-04-19 ギャップウェーブス アーベー Calibration device for microwave analysis equipment or microwave measurement equipment
WO2019069576A1 (en) * 2017-10-06 2019-04-11 株式会社村田製作所 Probe
JP2019138768A (en) * 2018-02-09 2019-08-22 株式会社村田製作所 probe

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5524281A (en) * 1988-03-31 1996-06-04 Wiltron Company Apparatus and method for measuring the phase and magnitude of microwave signals
US20170003317A1 (en) * 2013-11-26 2017-01-05 Tyco Electronics Uk Ltd. Balunless test fixture
JP2018511058A (en) * 2015-04-08 2018-04-19 ギャップウェーブス アーベー Calibration device for microwave analysis equipment or microwave measurement equipment
WO2019069576A1 (en) * 2017-10-06 2019-04-11 株式会社村田製作所 Probe
JP2019138768A (en) * 2018-02-09 2019-08-22 株式会社村田製作所 probe

Also Published As

Publication number Publication date
WO2021241232A1 (en) 2021-12-02
JP7201129B2 (en) 2023-01-10
CN215833461U (en) 2022-02-15

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